DE3861319D1 - Impulsformerschaltung. - Google Patents

Impulsformerschaltung.

Info

Publication number: DE3861319D1
Authority: DE; Germany
Prior art keywords: pulse shifting; shifting; pulse
Prior art date: 1988-01-28
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Lifetime

Application number

DE8888101210T

Other languages

English (en)

Inventor

Holger Engelhard

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Verigy Singapore Pte Ltd

Original Assignee

Hewlett Packard GmbH Germany

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1988-01-28

Filing date

1988-01-28

Publication date

1991-01-31

1988-01-28 Application filed by Hewlett Packard GmbH Germany filed Critical Hewlett Packard GmbH Germany

1991-01-31 Application granted granted Critical

1991-01-31 Publication of DE3861319D1 publication Critical patent/DE3861319D1/de

2008-01-29 Anticipated expiration legal-status Critical

Status Expired - Lifetime legal-status Critical Current

Classifications

- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
- H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
- H03K3/037—Bistable circuits
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31922—Timing generation or clock distribution
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31928—Formatter

Landscapes

Engineering & Computer Science (AREA)
General Engineering & Computer Science (AREA)
Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Manipulation Of Pulses (AREA)

DE8888101210T 1988-01-28 1988-01-28 Impulsformerschaltung. Expired - Lifetime DE3861319D1 (de)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
EP88101210A EP0329798B1 (de)	1988-01-28	1988-01-28	Impulsformerschaltung

Publications (1)

Publication Number	Publication Date
DE3861319D1 true DE3861319D1 (de)	1991-01-31

Family

ID=8198682

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
DE8888101210T Expired - Lifetime DE3861319D1 (de)	1988-01-28	1988-01-28	Impulsformerschaltung.

Country Status (4)

Country	Link
US (1)	US5003194A (de)
EP (1)	EP0329798B1 (de)
JP (1)	JP2993969B2 (de)
DE (1)	DE3861319D1 (de)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP2692415B2 (ja) *	1991-05-15	1997-12-17	日本電気株式会社	パルス除去回路
FI88837C (fi) *	1991-08-15	1993-07-12	Nokia Mobile Phones Ltd	Frekvensdividering med udda tal och decimaltal
WO1993014412A1 (en) *	1992-01-21	1993-07-22	Advantest Corporation	Waveform shaping circuit for semiconductor testing device
DE4305442C2 (de) *	1993-02-23	1999-08-05	Hewlett Packard Gmbh	Verfahren und Vorrichtung zum Erzeugen eines Testvektors
JP2590738Y2 (ja) *	1993-09-21	1999-02-17	株式会社アドバンテスト	半導体試験装置用波形整形回路
US5583461A (en) *	1994-09-19	1996-12-10	Advanced Micro Devices, Inc.	Internal clock signal generation circuit having external clock detection and a selectable internal clock pulse
US5579356A (en) *	1995-07-28	1996-11-26	Micron Quantum Devices, Inc.	Timer circuit with programmable decode circuitry
US5629644A (en) *	1995-07-28	1997-05-13	Micron Quantum Devices, Inc.	Adjustable timer circuit
US5668489A (en) *	1996-01-02	1997-09-16	Samsung Electronics, Co., Ltd.	Dead-time generating circuit
US5982827A (en) *	1997-05-14	1999-11-09	Hewlett-Packard Co.	Means for virtual deskewing of high/intermediate/low DUT data
US6075398A (en) *	1998-06-01	2000-06-13	S3 Incorporated	Tunable digital oscillator circuit and method for producing clock signals of different frequencies
US6374376B1 (en)	1998-09-03	2002-04-16	Micron Technology, Inc.	Circuit, system and method for arranging data output by semiconductor testers to packet-based devices under test
US6338103B1 (en)	1999-03-24	2002-01-08	International Business Machines Corporation	System for high-speed data transfer using a sequence of overlapped global pointer signals for generating corresponding sequence of non-overlapped local pointer signals
US6140855A (en) *	1999-03-30	2000-10-31	International Business Machines Corporation	Dynamic-latch-receiver with self-reset pointer
US6291981B1 (en) *	2000-07-26	2001-09-18	Teradyne, Inc.	Automatic test equipment with narrow output pulses
US6661269B2 (en) *	2001-02-23	2003-12-09	Intel Corporation	Selectively combining signals to produce desired output signal
US6771061B2 (en) *	2002-09-17	2004-08-03	Teradyne, Inc.	High speed tester with narrow output pulses
JP2006245977A (ja) *	2005-03-03	2006-09-14	Fuji Xerox Co Ltd	パルス信号再生装置
US7375570B2 (en) *	2005-06-15	2008-05-20	Lsi Logic Corporation	High-speed TDF testing on low cost testers using on-chip pulse generators and dual ATE references for rapidchip and ASIC devices
US7856578B2 (en) *	2005-09-23	2010-12-21	Teradyne, Inc.	Strobe technique for test of digital signal timing
US7573957B2 (en)	2005-09-23	2009-08-11	Teradyne, Inc.	Strobe technique for recovering a clock in a digital signal
US7574632B2 (en) *	2005-09-23	2009-08-11	Teradyne, Inc.	Strobe technique for time stamping a digital signal
US7378854B2 (en) *	2005-10-28	2008-05-27	Teradyne, Inc.	Dual sine-wave time stamp method and apparatus
US7593497B2 (en) *	2005-10-31	2009-09-22	Teradyne, Inc.	Method and apparatus for adjustment of synchronous clock signals
US7636806B2 (en) *	2007-09-07	2009-12-22	Infineon Technologies Ag	Electronic system and method for sending or receiving a signal
US7592851B2 (en) *	2008-01-29	2009-09-22	International Business Machines Corporation	High performance pseudo dynamic pulse controllable multiplexer
JP5305134B2 (ja) *	2008-06-10	2013-10-02	横河電機株式会社	波形生成回路

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
US4051387A (en) *	1976-07-01	1977-09-27	Motorola, Inc.	High speed ecl one-shot multivibrator
US4314164A (en) *	1979-11-05	1982-02-02	Gte Automatic Electric Labs Inc.	Computer channel access circuit for multiple input-output devices
US4607173A (en) *	1984-03-14	1986-08-19	At&T Bell Laboratories	Dual-clock edge triggered flip-flop circuits
JPS6330034A (ja) *	1986-07-23	1988-02-08	Nec Corp	多重化回路

1988
- 1988-01-28 DE DE8888101210T patent/DE3861319D1/de not_active Expired - Lifetime
- 1988-01-28 EP EP88101210A patent/EP0329798B1/de not_active Expired
1989
- 1989-01-27 JP JP1019397A patent/JP2993969B2/ja not_active Expired - Fee Related
1990
- 1990-09-04 US US07/579,203 patent/US5003194A/en not_active Expired - Lifetime

Also Published As

Publication number	Publication date
JP2993969B2 (ja)	1999-12-27
US5003194A (en)	1991-03-26
JPH01225216A (ja)	1989-09-08
EP0329798B1 (de)	1990-12-19
EP0329798A1 (de)	1989-08-30

Publication	Publication Date	Title
DE3861319D1 (de)	1991-01-31	Impulsformerschaltung.
DE58900785D1 (de)	1992-03-12	Ausgleichsgetriebe.
FI890234L (fi)	1989-07-19	Individuellt justerbart kuddsystem.
DE58904326D1 (de)	1993-06-17	Rakelfarbwerk.
DE58904437D1 (de)	1993-06-24	Rakelfarbwerk.
DE69100176D1 (de)	1993-08-19	Impulsformerschaltung.
DE68922930D1 (de)	1995-07-13	Impulseinblendungsanordnung.
FI893541A0 (fi)	1989-07-24	Nytt uttryckningssystem.
DE68909215D1 (de)	1993-10-21	Laseroszillator.
FI881549A7 (fi)	1989-10-01	Saekerhetslaos.
DE58903112D1 (de)	1993-02-04	Kannenstock.
DE58901444D1 (de)	1992-06-25	Zahnrad.
DE3577248D1 (de)	1990-05-23	Impulsformerschaltung.
FI890892A0 (fi)	1989-02-24	B-amylasgen.
NO882253D0 (no)	1988-05-24	Sammenfollbar stige.
ES1005648Y (es)	1989-05-16	Portaflor individual.
FI881117A7 (fi)	1989-09-11	Linjepaole.
DE68907005D1 (de)	1993-07-15	Octafluorbiphenyle.
ES1006543Y (es)	1989-07-16	Muneco equilibrista.
DE58901271D1 (de)	1992-06-04	Slalomtor.
FI880254A7 (fi)	1989-07-22	Matthaollare.
FI880756A0 (fi)	1988-02-18	Faestningsanordning.
FI880052A0 (fi)	1988-01-07	Haengande laveduk.
FI880072A7 (fi)	1989-07-09	Treaxlat terraengfordons belastningsfoerskjutningssystem.
FI880011A0 (fi)	1988-01-04	Skruvinmatare.

Legal Events

Date	Code	Title	Description
1992-01-23	8364	No opposition during term of opposition
2001-06-28	8327	Change in the person/name/address of the patent owner	Owner name: AGILENT TECHNOLOGIES DEUTSCHLAND GMBH, 71034 BOEBL
2007-06-21	8327	Change in the person/name/address of the patent owner	Owner name: VERIGY (SINGAPORE) PTE. LTD., SINGAPORE, SG