DE3853327D1 - Testmethode für elektronische Schaltungen. - Google Patents

Testmethode für elektronische Schaltungen.

Info

Publication number: DE3853327D1
Authority: DE; Germany
Prior art keywords: test method; electronic circuits; circuits; electronic; test
Prior art date: 1987-09-21
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Expired - Fee Related

Application number

DE3853327T

Other languages

English (en)

Other versions

DE3853327T2 (de

Inventor

Joseph Michael Moran

Thomas Cutler Russell

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

AT&T Corp

Original Assignee

AT&T Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1987-09-21

Filing date

1988-09-02

Publication date

1995-04-20

1988-09-02 Application filed by AT&T Corp filed Critical AT&T Corp

1995-04-20 Application granted granted Critical

1995-04-20 Publication of DE3853327D1 publication Critical patent/DE3853327D1/de

1995-08-24 Publication of DE3853327T2 publication Critical patent/DE3853327T2/de

2008-09-03 Anticipated expiration legal-status Critical

Status Expired - Fee Related legal-status Critical Current

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06705—Apparatus for holding or moving single probes

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Testing Or Measuring Of Semiconductors Or The Like (AREA)
Tests Of Electronic Circuits (AREA)
Measuring Leads Or Probes (AREA)

DE3853327T 1987-09-21 1988-09-02 Testmethode für elektronische Schaltungen. Expired - Fee Related DE3853327T2 (de)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
US9919687A	1987-09-21	1987-09-21

Publications (2)

Publication Number	Publication Date
DE3853327D1 true DE3853327D1 (de)	1995-04-20
DE3853327T2 DE3853327T2 (de)	1995-08-24

Family

ID=22273479

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
DE3853327T Expired - Fee Related DE3853327T2 (de)	1987-09-21	1988-09-02	Testmethode für elektronische Schaltungen.

Country Status (6)

Country	Link
EP (1)	EP0309109B1 (de)
JP (1)	JPH0660923B2 (de)
KR (1)	KR890005531A (de)
CA (1)	CA1308816C (de)
DE (1)	DE3853327T2 (de)
ES (1)	ES2068831T3 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JP2005311009A (ja) *	2004-04-21	2005-11-04	Kokusai Electric Alhpa Co Ltd	半導体ウェーハ抵抗率測定装置
JP2008191064A (ja) *	2007-02-07	2008-08-21	Produce:Kk	アクティブプローブを備えた電気特性検査装置
JP5752466B2 (ja) *	2011-04-06	2015-07-22	日置電機株式会社	基板検査装置
CN109848075B (zh) *	2018-12-25	2024-06-18	东莞市奥海科技股份有限公司	带机械手的ate测试设备及其控制方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
CA944435A (en) *	1970-12-25	1974-03-26	Tadashi Kubota	Inspection apparatus for printed circuit boards
US4242751A (en) *	1978-08-28	1980-12-30	Genrad, Inc.	Automatic fault-probing method and apparatus for checking electrical circuits and the like
JPS5788369A (en) *	1980-11-25	1982-06-02	Hitachi Ltd	Automatic probing device
US4471298A (en) *	1981-12-11	1984-09-11	Cirdyne, Inc.	Apparatus for automatically electrically testing printed circuit boards
US4565966A (en) *	1983-03-07	1986-01-21	Kollmorgen Technologies Corporation	Method and apparatus for testing of electrical interconnection networks
US4709366A (en) *	1985-07-29	1987-11-24	John Fluke Mfg. Co., Inc.	Computer assisted fault isolation in circuit board testing

1988
- 1988-09-02 DE DE3853327T patent/DE3853327T2/de not_active Expired - Fee Related
- 1988-09-02 ES ES88308151T patent/ES2068831T3/es not_active Expired - Lifetime
- 1988-09-02 EP EP88308151A patent/EP0309109B1/de not_active Expired - Lifetime
- 1988-09-20 KR KR1019880012124A patent/KR890005531A/ko not_active Application Discontinuation
- 1988-09-20 CA CA000577863A patent/CA1308816C/en not_active Expired - Fee Related
- 1988-09-21 JP JP63235153A patent/JPH0660923B2/ja not_active Expired - Fee Related

Also Published As

Publication number	Publication date
ES2068831T3 (es)	1995-05-01
JPH0660923B2 (ja)	1994-08-10
CA1308816C (en)	1992-10-13
EP0309109A2 (de)	1989-03-29
KR890005531A (ko)	1989-05-15
DE3853327T2 (de)	1995-08-24
EP0309109B1 (de)	1995-03-15
JPH0290071A (ja)	1990-03-29
EP0309109A3 (de)	1991-02-27

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Legal Events

Date	Code	Title	Description
1996-04-11	8364	No opposition during term of opposition
2004-07-08	8339	Ceased/non-payment of the annual fee