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DE3775993D1 - Geraet zum bestrahlen von elektronischen schaltungen. - Google Patents

Geraet zum bestrahlen von elektronischen schaltungen.

Info

Publication number
DE3775993D1
DE3775993D1 DE8787401161T DE3775993T DE3775993D1 DE 3775993 D1 DE3775993 D1 DE 3775993D1 DE 8787401161 T DE8787401161 T DE 8787401161T DE 3775993 T DE3775993 T DE 3775993T DE 3775993 D1 DE3775993 D1 DE 3775993D1
Authority
DE
Germany
Prior art keywords
electronic circuits
irradiating electronic
irradiating
circuits
electronic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8787401161T
Other languages
English (en)
Inventor
Olivier Musseau
Gerard Deschazeaux
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commissariat a lEnergie Atomique et aux Energies Alternatives CEA
Original Assignee
Commissariat a lEnergie Atomique CEA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Commissariat a lEnergie Atomique CEA filed Critical Commissariat a lEnergie Atomique CEA
Application granted granted Critical
Publication of DE3775993D1 publication Critical patent/DE3775993D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Radiation (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
DE8787401161T 1986-05-27 1987-05-22 Geraet zum bestrahlen von elektronischen schaltungen. Expired - Lifetime DE3775993D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8607568A FR2599544B1 (fr) 1986-05-27 1986-05-27 Appareil d'irradiation pour circuits electroniques

Publications (1)

Publication Number Publication Date
DE3775993D1 true DE3775993D1 (de) 1992-02-27

Family

ID=9335685

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8787401161T Expired - Lifetime DE3775993D1 (de) 1986-05-27 1987-05-22 Geraet zum bestrahlen von elektronischen schaltungen.

Country Status (5)

Country Link
US (1) US4839586A (de)
EP (1) EP0248705B1 (de)
JP (1) JPS62296530A (de)
DE (1) DE3775993D1 (de)
FR (1) FR2599544B1 (de)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2622730B1 (fr) * 1987-10-29 1990-01-12 Commissariat Energie Atomique Conteneur de source radioactive de faible activite
US5032788A (en) * 1989-06-26 1991-07-16 Digital Equipment Corp. Test cell for non-contact opens/shorts testing of electrical circuits
US5414345A (en) * 1991-04-29 1995-05-09 Electronic Development, Inc. Apparatus and method for low cost electromagnetic field susceptibility testing
US6969253B2 (en) * 1999-09-24 2005-11-29 Cao Group, Inc. Light for use in activating light-activated materials, the light having at least one light emitting semiconductor chip, the chip being attached to a primary heat sink that is attached to a secondary heat sink using heat conductive and electrically insulative adhesive
US6456084B1 (en) * 2001-03-28 2002-09-24 Chung-Shan Institute Of Science And Technology Radiation test system
US6930488B1 (en) * 2003-12-17 2005-08-16 Sun Microsystems, Inc. Method and apparatus for accelerated SER testing of circuitry
US10551423B1 (en) 2015-01-13 2020-02-04 The United States Of America As Represented By The Secretary Of The Army System and method for simultaneous testing of radiation, environmental and electrical reliability of multiple semiconductor electrical devices

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4575676A (en) * 1983-04-04 1986-03-11 Advanced Research And Applications Corporation Method and apparatus for radiation testing of electron devices

Also Published As

Publication number Publication date
FR2599544A1 (fr) 1987-12-04
EP0248705B1 (de) 1992-01-15
US4839586A (en) 1989-06-13
FR2599544B1 (fr) 1993-09-10
JPS62296530A (ja) 1987-12-23
EP0248705A1 (de) 1987-12-09

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee