DE3688946D1 - Röntgenstrahlungsquelle. - Google Patents
Röntgenstrahlungsquelle.Info
- Publication number
- DE3688946D1 DE3688946D1 DE86105914T DE3688946T DE3688946D1 DE 3688946 D1 DE3688946 D1 DE 3688946D1 DE 86105914 T DE86105914 T DE 86105914T DE 3688946 T DE3688946 T DE 3688946T DE 3688946 D1 DE3688946 D1 DE 3688946D1
- Authority
- DE
- Germany
- Prior art keywords
- ray source
- ray
- source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G2/00—Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of a plasma
- H05G2/001—Production of X-ray radiation generated from plasma
- H05G2/003—Production of X-ray radiation generated from plasma the plasma being generated from a material in a liquid or gas state
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70008—Production of exposure light, i.e. light sources
- G03F7/70033—Production of exposure light, i.e. light sources by plasma extreme ultraviolet [EUV] sources
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70808—Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Plasma & Fusion (AREA)
- General Physics & Mathematics (AREA)
- Nanotechnology (AREA)
- Health & Medical Sciences (AREA)
- Public Health (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Epidemiology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Environmental & Geological Engineering (AREA)
- Optics & Photonics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60091227A JPH0638391B2 (ja) | 1985-04-30 | 1985-04-30 | X線露光装置 |
JP61012105A JPS62172648A (ja) | 1986-01-24 | 1986-01-24 | X線発生装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3688946D1 true DE3688946D1 (de) | 1993-10-07 |
DE3688946T2 DE3688946T2 (de) | 1994-01-13 |
Family
ID=26347673
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE86105914T Expired - Fee Related DE3688946T2 (de) | 1985-04-30 | 1986-04-29 | Röntgenstrahlungsquelle. |
Country Status (3)
Country | Link |
---|---|
US (1) | US4771447A (de) |
EP (1) | EP0201034B1 (de) |
DE (1) | DE3688946T2 (de) |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6415920A (en) * | 1987-07-10 | 1989-01-19 | Hitachi Ltd | X-ray aligner |
US4860328A (en) * | 1987-08-25 | 1989-08-22 | Hampshire Instruments, Inc. | Target positioning for minimum debris |
US5102776A (en) * | 1989-11-09 | 1992-04-07 | Cornell Research Foundation, Inc. | Method and apparatus for microlithography using x-pinch x-ray source |
US5243638A (en) * | 1992-03-10 | 1993-09-07 | Hui Wang | Apparatus and method for generating a plasma x-ray source |
USH1962H1 (en) | 1996-09-09 | 2001-06-05 | The United States Of America As Represented By The Secretary Of The Navy | Fast acting double puff valve |
DE19753696A1 (de) * | 1997-12-03 | 1999-06-17 | Fraunhofer Ges Forschung | Vorrichtung und Verfahren zur Erzeugung von Extrem-Ultraviolettstrahlung und weicher Röntgenstrahlung aus einer Gasentladung |
WO2000025322A1 (en) * | 1998-10-27 | 2000-05-04 | Jmar Technology Co. | Shaped source of soft x-ray, extreme ultraviolet and ultraviolet radiation |
DE19962160C2 (de) * | 1999-06-29 | 2003-11-13 | Fraunhofer Ges Forschung | Vorrichtungen zur Erzeugung von Extrem-Ultraviolett- und weicher Röntgenstrahlung aus einer Gasentladung |
TWI246872B (en) | 1999-12-17 | 2006-01-01 | Asml Netherlands Bv | Radiation source for use in lithographic projection apparatus |
US6469310B1 (en) | 1999-12-17 | 2002-10-22 | Asml Netherlands B.V. | Radiation source for extreme ultraviolet radiation, e.g. for use in lithographic projection apparatus |
US6408052B1 (en) * | 2000-04-06 | 2002-06-18 | Mcgeoch Malcolm W. | Z-pinch plasma X-ray source using surface discharge preionization |
US6765987B2 (en) | 2001-03-15 | 2004-07-20 | Safe Food Technologies, Inc. | Resonant plasma x-ray source |
DE10238096B3 (de) * | 2002-08-21 | 2004-02-19 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Gasentladungslampe |
US7022937B2 (en) * | 2003-01-06 | 2006-04-04 | Matsushita Electric Industrial Co., Ltd. | Plasma processing method and apparatus for performing uniform plasma processing on a linear portion of an object |
US7466799B2 (en) * | 2003-04-09 | 2008-12-16 | Varian Medical Systems, Inc. | X-ray tube having an internal radiation shield |
DE10325151B4 (de) * | 2003-05-30 | 2006-11-30 | Infineon Technologies Ag | Vorrichtung für die Erzeugung und/oder Beeinflussung elektromagnetischer Strahlung eines Plasmas |
US7688948B2 (en) * | 2004-11-29 | 2010-03-30 | Koninklijke Philips Electronics N.V. | Method and apparatus for generating radiation in the wavelength range from about 1 nm to about 30 nm, and use in a lithography device or in metrology |
DE102004058500A1 (de) * | 2004-12-04 | 2006-06-08 | Philips Intellectual Property & Standards Gmbh | Verfahren und Vorrichtung zum Betreiben einer elektrischen Entladevorrichtung |
ITVE20050037A1 (it) * | 2005-08-04 | 2007-02-05 | Marco Sumini | Apparecchiatura per trattamenti di radioterapia interstiziale ed intraoperatoria. |
KR101044698B1 (ko) | 2009-12-01 | 2011-06-28 | 한국기초과학지원연구원 | 전자 맴돌이 공명 이온원 장치를 이용한 엑스선 발생 장치 및 방법 |
RU2459393C1 (ru) * | 2010-12-27 | 2012-08-20 | Учреждение Российской Академии Наук Институт Сильноточной Электроники Сибирского Отделения Ран (Исэ Со Ран) | Способ и устройство для генерации мягкого рентгеновского излучения из плазмы газового разряда лайнерного типа |
CN108957026B (zh) * | 2018-05-23 | 2020-07-03 | 安徽工业大学 | 一种热态飞灰颗粒的临界反弹速度测量装置和方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2379397A (en) * | 1942-11-16 | 1945-06-26 | Gen Electric X Ray Corp | Anode structure |
BE725683A (de) * | 1968-12-18 | 1969-05-29 | ||
US3835330A (en) * | 1972-09-15 | 1974-09-10 | Us Air Force | Electromagnetic implosion x-ray source |
SU1051616A1 (ru) * | 1981-06-22 | 1983-10-30 | Институт сильноточной электроники СО АН СССР | Импульсный рентгеновский источник с холодным катодом |
US4494043A (en) * | 1981-07-02 | 1985-01-15 | Physics International Company | Imploding plasma device |
DE3278737D1 (en) * | 1982-04-14 | 1988-08-11 | Battelle Development Corp | Providing x-rays |
JPS60175351A (ja) | 1984-02-14 | 1985-09-09 | Nippon Telegr & Teleph Corp <Ntt> | X線発生装置およびx線露光法 |
US4644576A (en) * | 1985-04-26 | 1987-02-17 | At&T Technologies, Inc. | Method and apparatus for producing x-ray pulses |
-
1986
- 1986-04-29 US US06/857,112 patent/US4771447A/en not_active Expired - Fee Related
- 1986-04-29 DE DE86105914T patent/DE3688946T2/de not_active Expired - Fee Related
- 1986-04-29 EP EP86105914A patent/EP0201034B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0201034B1 (de) | 1993-09-01 |
EP0201034A3 (en) | 1988-09-21 |
US4771447A (en) | 1988-09-13 |
EP0201034A2 (de) | 1986-11-12 |
DE3688946T2 (de) | 1994-01-13 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |