DE2410354A1 - - Google Patents

Info

Publication number: DE2410354A1
Authority: DE; Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Granted

Application number

DE19742410354

Other languages

German (de)

Other versions

DE2410354B1 (de

DE2410354C2 (de

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1974-03-05

Filing date

1974-03-05

Publication date

1975-06-19

1974-03-05 Application filed filed Critical

1974-03-05 Priority to DE19742410354 priority Critical patent/DE2410354C2/de

1974-03-05 Priority claimed from DE19742410354 external-priority patent/DE2410354C2/de

1975-06-19 Publication of DE2410354B1 publication Critical patent/DE2410354B1/de

1975-06-19 Publication of DE2410354A1 publication Critical patent/DE2410354A1/de

1976-02-12 Application granted granted Critical

1976-02-12 Publication of DE2410354C2 publication Critical patent/DE2410354C2/de

Status Expired legal-status Critical Current

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2608—Circuits therefor for testing bipolar transistors

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Engineering & Computer Science (AREA)
Microelectronics & Electronic Packaging (AREA)
Tests Of Electronic Circuits (AREA)
Testing Of Individual Semiconductor Devices (AREA)

DE19742410354 1974-03-05 Prüfgerät für bipolare Transistoren und Feldeffekttransistoren Expired DE2410354C2 (de)

Priority Applications (1)

Application Number	Priority Date	Filing Date	Title
DE19742410354 DE2410354C2 (de)		1974-03-05	Prüfgerät für bipolare Transistoren und Feldeffekttransistoren

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
DE19742410354 DE2410354C2 (de)		1974-03-05	Prüfgerät für bipolare Transistoren und Feldeffekttransistoren

Publications (3)

Publication Number	Publication Date
DE2410354B1 DE2410354B1 (de)	1975-06-19
DE2410354A1 true DE2410354A1 (xx)	1975-06-19
DE2410354C2 DE2410354C2 (de)	1976-02-12

Family

ID=

Also Published As

Publication number	Publication date
DE2410354B1 (de)	1975-06-19

Publication	Publication Date	Title
FR2258065B1 (xx)	1978-07-13
DK463875A (xx)	1976-04-17
FI750041A (xx)	1975-07-10
AU495883B2 (xx)	1977-03-03
FR2265854B1 (xx)	1978-09-29
AR198563A1 (xx)	1974-06-28
FR2270537B1 (xx)	1977-10-07
FI740299A0 (xx)	1975-08-05
AU7463174A (xx)	1976-04-29
CS172140B1 (xx)	1976-12-29
DD118274A5 (xx)	1976-02-20
BG20454A1 (xx)	1975-12-05
BG20186A1 (xx)	1975-11-05
BG20166A1 (xx)	1975-11-05
BG20159A1 (xx)	1975-11-05
BG20049A1 (xx)	1975-10-30
BG19990A1 (xx)	1977-05-20
BG19987A1 (xx)	1975-10-30
BG19962A1 (xx)	1975-10-30
BG19774A1 (xx)	1975-10-10
BG19739A1 (xx)	1975-10-10
DD121122A5 (xx)	1976-07-12
BG19690A1 (xx)	1975-10-10
BG19680A1 (xx)	1975-10-10
BG20451A1 (xx)	1975-12-05

Legal Events

Date	Code	Title	Description
1975-06-19	B1	Publication of the examined application without previous publication of unexamined application
1976-02-12	C2	Grant after previous publication (2nd publication)