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DE19983947T1 - Riesenmagnetwiderstandssensor mit Festhalteschicht - Google Patents

Riesenmagnetwiderstandssensor mit Festhalteschicht

Info

Publication number
DE19983947T1
DE19983947T1 DE19983947T DE19983947T DE19983947T1 DE 19983947 T1 DE19983947 T1 DE 19983947T1 DE 19983947 T DE19983947 T DE 19983947T DE 19983947 T DE19983947 T DE 19983947T DE 19983947 T1 DE19983947 T1 DE 19983947T1
Authority
DE
Germany
Prior art keywords
magnetic resistance
holding layer
resistance sensor
giant magnetic
giant
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE19983947T
Other languages
English (en)
Inventor
Sining Mao
Zheng Gao
Seok Hae Cho
Stephen C Cool
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seagate Technology LLC
Original Assignee
Seagate Technology LLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seagate Technology LLC filed Critical Seagate Technology LLC
Publication of DE19983947T1 publication Critical patent/DE19983947T1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/09—Magnetoresistive devices
    • G01R33/093—Magnetoresistive devices using multilayer structures, e.g. giant magnetoresistance sensors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127—Structure or manufacture of heads, e.g. inductive
    • G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
    • G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
    • G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F10/00—Thin magnetic films, e.g. of one-domain structure
    • H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
    • H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
    • H01F10/3268—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer the exchange coupling being asymmetric, e.g. by use of additional pinning, by using antiferromagnetic or ferromagnetic coupling interface, i.e. so-called spin-valve [SV] structure, e.g. NiFe/Cu/NiFe/FeMn
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F10/00—Thin magnetic films, e.g. of one-domain structure
    • H01F10/32—Spin-exchange-coupled multilayers, e.g. nanostructured superlattices
    • H01F10/324—Exchange coupling of magnetic film pairs via a very thin non-magnetic spacer, e.g. by exchange with conduction electrons of the spacer
    • H01F10/3295—Spin-exchange coupled multilayers wherein the magnetic pinned or free layers are laminated without anti-parallel coupling within the pinned and free layers
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127—Structure or manufacture of heads, e.g. inductive
    • G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
    • G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
    • G11B2005/3996—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects large or giant magnetoresistive effects [GMR], e.g. as generated in spin-valve [SV] devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127—Structure or manufacture of heads, e.g. inductive
    • G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
    • G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
    • G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
    • G11B5/3906—Details related to the use of magnetic thin film layers or to their effects
    • G11B5/3929—Disposition of magnetic thin films not used for directly coupling magnetic flux from the track to the MR film or for shielding
    • G11B5/3932—Magnetic biasing films

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Nanotechnology (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Theoretical Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Hall/Mr Elements (AREA)
  • Magnetic Heads (AREA)
  • Thin Magnetic Films (AREA)
  • Measuring Magnetic Variables (AREA)
DE19983947T 1999-04-28 1999-09-01 Riesenmagnetwiderstandssensor mit Festhalteschicht Withdrawn DE19983947T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13156799P 1999-04-28 1999-04-28
PCT/US1999/020004 WO2000065578A1 (en) 1999-04-28 1999-09-01 Giant magnetoresistive sensor with pinning layer

Publications (1)

Publication Number Publication Date
DE19983947T1 true DE19983947T1 (de) 2002-03-28

Family

ID=22450022

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19983947T Withdrawn DE19983947T1 (de) 1999-04-28 1999-09-01 Riesenmagnetwiderstandssensor mit Festhalteschicht

Country Status (7)

Country Link
US (1) US6433972B1 (de)
JP (2) JP2003520378A (de)
KR (1) KR20020021089A (de)
DE (1) DE19983947T1 (de)
GB (1) GB2363671B (de)
HK (1) HK1039999A1 (de)
WO (1) WO2000065578A1 (de)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6738236B1 (en) * 1998-05-07 2004-05-18 Seagate Technology Llc Spin valve/GMR sensor using synthetic antiferromagnetic layer pinned by Mn-alloy having a high blocking temperature
KR100563521B1 (ko) * 1999-04-20 2006-03-27 시게이트 테크놀로지 엘엘씨 ＣｒＭｎＰｔ 피닝층과 ＮｉＦｅＣｒ 시드층을 갖는 거대자기저항 센서
US6650512B1 (en) * 2000-03-21 2003-11-18 International Business Machines Corporation GMR coefficient enhancement of a spin valve structure
JP3686572B2 (ja) 2000-04-12 2005-08-24 アルプス電気株式会社 交換結合膜の製造方法と、前記交換結合膜を用いた磁気抵抗効果素子の製造方法、ならびに前記磁気抵抗効果素子を用いた薄膜磁気ヘッドの製造方法
JP3670928B2 (ja) 2000-04-12 2005-07-13 アルプス電気株式会社 交換結合膜と、この交換結合膜を用いた磁気抵抗効果素子、ならびに前記磁気抵抗効果素子を用いた薄膜磁気ヘッド
US6790541B2 (en) 2000-04-12 2004-09-14 Alps Electric Co., Ltd. Exchange coupling film and electroresistive sensor using the same
JP3694440B2 (ja) * 2000-04-12 2005-09-14 アルプス電気株式会社 交換結合膜の製造方法、及び前記交換結合膜を用いた磁気抵抗効果素子の製造方法、ならびに前記磁気抵抗効果素子を用いた薄膜磁気ヘッドの製造方法
US6521098B1 (en) 2000-08-31 2003-02-18 International Business Machines Corporation Fabrication method for spin valve sensor with insulating and conducting seed layers
JP2002299729A (ja) * 2001-03-30 2002-10-11 Fujitsu Ltd 磁気抵抗効果読み取り素子の製造方法
US6954342B2 (en) * 2001-04-30 2005-10-11 Hitachi Global Storage Technologies Netherlands B.V. Underlayer for high amplitude spin valve sensors
US6898112B2 (en) * 2002-12-18 2005-05-24 Freescale Semiconductor, Inc. Synthetic antiferromagnetic structure for magnetoelectronic devices
US7072154B2 (en) 2003-07-29 2006-07-04 Hitachi Global Storage Technologies Netherlands B.V. Method and apparatus for providing a self-pinned bias layer that extends beyond the ends of the free layer
US7099123B2 (en) * 2003-07-29 2006-08-29 Hitachi Global Storage Technologies Self-pinned abutted junction heads having an arrangement of a second hard bias layer and a free layer for providing a net net longitudinal bias on the free layer
US7092220B2 (en) * 2003-07-29 2006-08-15 Hitachi Global Storage Technologies Apparatus for enhancing thermal stability, improving biasing and reducing damage from electrostatic discharge in self-pinned abutted junction heads having a first self-pinned layer extending under the hard bias layers
US7050277B2 (en) * 2003-07-29 2006-05-23 Hitachi Global Storage Technologies Netherlands B.V. Apparatus having a self-pinned abutted junction magnetic read sensor with hard bias layers formed over ends of a self-pinned layer and extending under a hard bias layer
JP2006128410A (ja) * 2004-10-28 2006-05-18 Alps Electric Co Ltd 磁気検出素子及びその製造方法
US7367109B2 (en) 2005-01-31 2008-05-06 Hitachi Global Storage Technologies Netherlands B.V. Method of fabricating magnetic sensors with pinned layers with zero net magnetic moment
US7554775B2 (en) 2005-02-28 2009-06-30 Hitachi Global Storage Technologies Netherlands B.V. GMR sensors with strongly pinning and pinned layers

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SG46731A1 (en) * 1995-06-30 1998-02-20 Ibm Spin valve magnetoresistive sensor with antiparallel pinned layer and improved exchange bias layer and magnetic recording system using the senor
JP2849354B2 (ja) 1995-07-28 1999-01-20 ティーディーケイ株式会社 磁気変換素子及び薄膜磁気ヘッド
JP3181512B2 (ja) * 1996-09-12 2001-07-03 アルプス電気株式会社 デュアルスピンバルブ型素子および薄膜磁気ヘッド
JP3181525B2 (ja) * 1996-12-13 2001-07-03 アルプス電気株式会社 スピンバルブ型薄膜素子及び前記スピンバルブ型薄膜素子を用いた薄膜磁気ヘッド
US5731936A (en) * 1996-09-26 1998-03-24 International Business Machines Corporation Magnetoresistive (MR) sensor with coefficient enhancing that promotes thermal stability
JPH10154311A (ja) * 1996-11-21 1998-06-09 Nec Corp 磁気抵抗効果素子およびシールド型磁気抵抗効果センサ
JP3255872B2 (ja) * 1997-04-17 2002-02-12 アルプス電気株式会社 スピンバルブ型薄膜素子及びその製造方法
JP3225496B2 (ja) * 1997-06-05 2001-11-05 ティーディーケイ株式会社 磁気抵抗効果膜および磁気抵抗効果型ヘッド
JPH1186235A (ja) * 1997-09-04 1999-03-30 Hitachi Ltd 磁気記録再生装置
JPH1186237A (ja) * 1997-09-08 1999-03-30 Toshiba Corp 磁気抵抗効果ヘッドおよび磁気記憶装置
JP3227116B2 (ja) * 1997-09-24 2001-11-12 アルプス電気株式会社 スピンバルブ型薄膜素子およびその製造方法
JPH11112052A (ja) * 1997-09-30 1999-04-23 Hitachi Ltd 磁気抵抗センサ及びこれを用いた磁気記録再生装置
JP3833362B2 (ja) * 1997-10-01 2006-10-11 富士通株式会社 磁気抵抗効果型ヘッド
JP3263016B2 (ja) * 1997-10-20 2002-03-04 アルプス電気株式会社 スピンバルブ型薄膜素子
GB9800109D0 (en) * 1998-01-06 1998-03-04 Ncr Int Inc Device for detecting the acceptability of a data-bearing card
JP3982596B2 (ja) * 1998-03-20 2007-09-26 ローム株式会社 電子部品用基板のベルト又はチエン式搬送装置
US6258468B1 (en) * 1998-12-22 2001-07-10 Read-Rite Corporation AMR read sensor structure and method with high magnetoresistive coefficient
US6222707B1 (en) * 1998-12-28 2001-04-24 Read-Rite Corporation Bottom or dual spin valve having a seed layer that results in an improved antiferromagnetic layer
KR100563521B1 (ko) * 1999-04-20 2006-03-27 시게이트 테크놀로지 엘엘씨 ＣｒＭｎＰｔ 피닝층과 ＮｉＦｅＣｒ 시드층을 갖는 거대자기저항 센서
US6278592B1 (en) * 1999-08-17 2001-08-21 Seagate Technology Llc GMR spin valve having a bilayer TaN/NiFeCr seedlayer to improve GMR response and exchange pinning field

Also Published As

Publication number Publication date
JP2009283126A (ja) 2009-12-03
GB2363671A (en) 2002-01-02
GB0124153D0 (en) 2001-11-28
GB2363671B (en) 2003-12-24
KR20020021089A (ko) 2002-03-18
US6433972B1 (en) 2002-08-13
JP2003520378A (ja) 2003-07-02
HK1039999A1 (zh) 2002-05-17
WO2000065578A1 (en) 2000-11-02

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Legal Events

Date Code Title Description
8139 Disposal/non-payment of the annual fee