[go: up one dir, main page]

DE19705406A1 - A=D conversion method with self-test function - Google Patents

A=D conversion method with self-test function

Info

Publication number
DE19705406A1
DE19705406A1 DE1997105406 DE19705406A DE19705406A1 DE 19705406 A1 DE19705406 A1 DE 19705406A1 DE 1997105406 DE1997105406 DE 1997105406 DE 19705406 A DE19705406 A DE 19705406A DE 19705406 A1 DE19705406 A1 DE 19705406A1
Authority
DE
Germany
Prior art keywords
converter
reference signal
signal
self
analog input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
DE1997105406
Other languages
German (de)
Inventor
Guenter Dipl Ing Fendt
Johann Dipl Ing Steinberger
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Conti Temic Microelectronic GmbH
Original Assignee
Temic Telefunken Microelectronic GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Temic Telefunken Microelectronic GmbH filed Critical Temic Telefunken Microelectronic GmbH
Priority to DE1997105406 priority Critical patent/DE19705406A1/en
Publication of DE19705406A1 publication Critical patent/DE19705406A1/en
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1071—Measuring or testing
    • H03M1/1076—Detection or location of converter hardware failure, e.g. power supply failure, open or short circuit
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)

Abstract

The method involves supplying a reference signal at the analogous input of the A/D converter for the implementation of a test cycle, comparing the digitized reference signal with a nominal signal and recognizing the A/D converter as defective at a deviation.

Description

Die Erfindung betrifft ein Verfahren zur Umwandlung analoger in digitale Signale (A/D-Wandlung) gemäß dem Oberbegriff des Patentanspruchs 1 sowie eine Schaltungsanordnung zur Durchführung des Verfahrens.The invention relates to a method for converting analog to digital Signals (A / D conversion) according to the preamble of claim 1 and a circuit arrangement for performing the method.

Die Umwandlung analoger in digitale Signale ist im Stand der Technik allgemein bekannt und durch eine Vielzahl unterschiedlicher Schaltungs­ anordnungen zu realisieren. Für umfassende Meß- und Steuerungsaufgaben werden dabei immer häufiger A/D-Wandler eingesetzt. Insbesondere bei sicherheitsrelevanten Anwendungen von A/D-Wandlern ist die korrekte Funktion dieser von besonderer Bedeutung. Eine möglichst permanente bzw. zyklische Überwachung der korrekten Funktionsweise des A/D-Wandlers war jedoch bisher nicht möglich.The conversion of analog to digital signals is state of the art generally known and by a variety of different circuit to implement arrangements. For comprehensive measurement and control tasks A / D converters are being used more and more frequently. Especially at safety-relevant applications of A / D converters is the correct one Function of this is of particular importance. As permanent as possible or cyclical monitoring of the correct functioning of the A / D converter has not yet been possible.

Aufgabe der Erfindung ist es daher, ein Verfahren sowie eine Schaltungs­ anordnung anzugeben, die eine Überprüfung des A/D-Wandlers ermöglicht.The object of the invention is therefore a method and a circuit specify an arrangement that enables a check of the A / D converter.

Die Aufgabe wird durch die Merkmale des Patentanspruchs 1 gelöst.The object is achieved by the features of patent claim 1.

In überraschend einfacher Weise wird durch das Beaufschlagen des A/D-Wandlers mittels eines bekannten Referenzsignals und nachfolgen dem Vergleich mit einem dem Referenzsignal entsprechenden Ausgangs-Soll-Wert eine Prüfung des A/D-Wandlers erreicht.In a surprisingly simple way, by applying the A / D converter using a known reference signal and follow the Comparison with an output target value corresponding to the reference signal A test of the A / D converter has been achieved.

Patentanspruch 2 lehrt eine Schaltungsanordnung zur Durchführung des Verfahrens. Besonderer Vorteil ist, daß für die Prüfung keine externen Meßgeräte benötigt werden und die erfindungsgemäßen Schaltungs­ anordnungen in Gesamtschaltungen integrierbar sind. Damit kann die Überprüfung des A/D-Wandlers zyklisch und auch nach dem Einbau in Geräte erfolgen. Gerade im Bereich sicherheitsrelevanter Systeme ist diese Funktionsprobe entscheidend, um die Sicherheit des Gesamtsystems zu gewährleisten und Ausfälle umgehend zu erkennen, wie zum Beispiel bei Insassenschutzsystemen in Kraftfahrzeugen, bei denen die analogen Signale eines Beschleunigungssensors zur Verarbeitung in einem Mikroprozessor digitalisiert werden, so daß ein Ausfall des A/D-Wandlers die Sicherheit bzw. die Funktionsfähigkeit des Gesamtsystems gefährdet.Claim 2 teaches a circuit arrangement for performing the Procedure. A particular advantage is that there are no external exams Measuring devices are required and the circuit according to the invention arrangements can be integrated into overall circuits. So that Check the A / D converter cyclically and also after installation in devices respectively. This is particularly in the area of safety-relevant systems Functional test is crucial to ensure the security of the overall system guarantee and immediately recognize failures, such as at  Occupant protection systems in motor vehicles, in which the analog signals an acceleration sensor for processing in a microprocessor be digitized so that a failure of the A / D converter increases safety or the functionality of the overall system is endangered.

Die Erfindung wird nachfolgend anhand von Ausführungsbeispielen und Fig. näher erläutert. Kurze Beschreibung der Figuren:The invention is explained in more detail below on the basis of exemplary embodiments and FIGS . Brief description of the figures:

Fig. 1 Blockschaltbild eines A/D-Wandlers mit Prüfeinrichtungen Fig. 1 block diagram of an A / D converter with test equipment

Fig. 2 A/D-Wandler mit Multiplex-Eingang. Fig. 2 A / D converter with multiplex input.

Die Fig. 1 zeigt das Blockschaltbild eines prüfbaren A/D-Wandlers (A/D). Das analoge Eingangssignal eanalog wird im Normalbetrieb über das Schaltmittel S, hier als Schalter symbolisch dargestellt, an den Eingang des A/D-Wandlers geleitet, dort A/D-gewandelt und das Ergebnis an den ausgangsseitigen Anschluß (Out) geleitet. Das Schaltmittel S ist dabei ansteuerbar von der Steuereinheit (1). Löst die Steuereinheit (1) einen Prüfzyklus aus, so wird das Schaltmittel S auf den Eingang des Referenzsignals eref geschaltet, so daß dieses nun vom A/D-Wandler verarbeitet wird. Das dem Referenzsignal entsprechende Ausgangs-Istsignal wird in einem Vergleicher 2 mit einem Soll-Signal verglichen und bei Abweichungen über eine gewisse Toleranz­ schwelle hinaus ein Fehlersignal (Error) gesetzt. Die Aufgaben der Steuer­ einheit können auch durch bereits in der Gesamtschaltung vorhandene Steuerungseinrichtungen realisiert werden. Entscheidend ist, daß einerseits die Schaltmittel angesteuert werden und andererseits während der Über­ prüfung der Vergleicher 2 aktiviert und das ebenfalls am ausgangsseitigen Anschluß (Out) an liegende Signal von nachfolgenden Einheiten nicht verarbeitet wird. Erforderlichenfalls sind auch ausgangsseitig ent­ sprechende Schaltmittel vorzusehen. Fig. 1 shows the block diagram of a verifiable A / D converter (A / D). In normal operation, the analog input signal e analog is routed via the switching means S, here symbolically represented as a switch, to the input of the A / D converter, there A / D converted and the result is passed to the output connection (Out). The switching means S can be controlled by the control unit ( 1 ). If the control unit ( 1 ) triggers a test cycle, the switching means S is switched to the input of the reference signal e ref , so that this is now processed by the A / D converter. The output actual signal corresponding to the reference signal is compared in a comparator 2 with a desired signal and an error signal (error) is set in the event of deviations beyond a certain tolerance threshold. The tasks of the control unit can also be implemented by control devices already present in the overall circuit. It is crucial that on the one hand the switching means are activated and, on the other hand, the comparator 2 is activated during the test and the signal at the output-side connection (Out) to subsequent signals is not processed by subsequent units. If necessary, appropriate switching means must also be provided on the output side.

Fig. 2 zeigt als Schaltmittel einen Zeitmultiplexer (MUX), der die analogen Eingangssignale eanalog1 bis eanalogn und darüber hinaus das Referenzsignal eref zeitlich hintereinander an den Eingang des A/D-Wandlers schaltet. Die Steuereinheit 1 steuert wiederum den ausgangsseitgien Vergleicher 2 im Zeitpunkt des Anliegens des Referenzsignals an. Fig. 2 shows as switching means a time division multiplexer (MUX), the analogn the analog input signals e analog1 to e and, moreover, the reference signal e ref one after the other to the input of A / D converter on. The control unit 1 in turn controls the comparator 2 on the output side when the reference signal is present.

Claims (2)

1. Verfahren zur Umwandlung analoger in digitale Signale (A/D-Wandlung), dadurch gekennzeichnet, daß zur Durchführung eines Prüfzykluses am analogen Eingang des A/D-Wandlers ein Referenzsignal angelegt wird, das di­ gitalisierte Referenzsignal mit einem Sollsignal verglichen und bei einer Ab­ weichung der A/D-Wandler als defekt erkannt wird.1. A method for converting analog to digital signals (A / D conversion), characterized in that a reference signal is applied to carry out a test cycle at the analog input of the A / D converter, the di gitalized reference signal compared with a target signal and at a Deviation of the A / D converter is recognized as defective. 2. Schaltungsanordnung zur Durchführung des Verfahrens nach Patentan­ spruch 1, dadurch gekennzeichnet, daß
  • a) im analogen Eingangsbereich der Schaltungsanordnung durch eine Steu­ ereinheit ansteurbare Schaltmittel derart vorgesehen sind, daß an den A/D-Wandler wahlweise das analoge Eingangssignal oder ein Referenzsignal angelegt werden kann,
  • b) im digitalen Ausgangsbereich Mittel zum Vergleich des digitalisierten Re­ ferenzsignals mit einem Sollsignal vorgesehen sind.
2. Circuit arrangement for performing the method according to patent claim 1, characterized in that
  • a) switching means which can be controlled by a control unit are provided in the analog input region of the circuit arrangement in such a way that the analog input signal or a reference signal can be applied to the A / D converter,
  • b) means for comparing the digitized reference signal with a desired signal are provided in the digital output area.
DE1997105406 1997-02-13 1997-02-13 A=D conversion method with self-test function Ceased DE19705406A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE1997105406 DE19705406A1 (en) 1997-02-13 1997-02-13 A=D conversion method with self-test function

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE1997105406 DE19705406A1 (en) 1997-02-13 1997-02-13 A=D conversion method with self-test function

Publications (1)

Publication Number Publication Date
DE19705406A1 true DE19705406A1 (en) 1998-08-27

Family

ID=7820061

Family Applications (1)

Application Number Title Priority Date Filing Date
DE1997105406 Ceased DE19705406A1 (en) 1997-02-13 1997-02-13 A=D conversion method with self-test function

Country Status (1)

Country Link
DE (1) DE19705406A1 (en)

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2003096540A1 (en) * 2002-05-08 2003-11-20 Continental Teves Ag & Co. Ohg Electronic circuit arrangement for error-free analog/digital conversion of signals
WO2004077083A1 (en) * 2003-02-21 2004-09-10 Infineon Technologies Ag Device and method for the tolerance analysis of digital and/or digitalised measuring values
DE10320717A1 (en) * 2003-05-08 2004-12-09 Siemens Ag Plausibility testing circuit for testing for the correct operation of an analogue to digital converter in a safety-relevant application, by comparison of ADC inputs and outputs with reference signals
EP1777824A1 (en) * 2005-10-24 2007-04-25 Robert Bosch Gmbh Parametric ADC-test
EP2088043A1 (en) * 2008-02-08 2009-08-12 Kelsey-Hayes Company Fail safe test for motion sensors
WO2013139533A1 (en) * 2012-03-20 2013-09-26 Robert Bosch Gmbh Acceleration sensor having at least one micromechanical sensor element for an occupant protection system in a vehicle
US8650930B2 (en) 2008-08-08 2014-02-18 Kelsey-Hayes Company Fail safe self test for motion sensor modules
FR3021738A1 (en) * 2014-06-03 2015-12-04 Thales Sa ACQUISITION CHAIN OF AT LEAST ONE PHYSICAL SIZE, IN PARTICULAR FOR A CRITICAL AIRBORNE AVIONIC SYSTEM, AND METHOD OF ACQUIRING THE SAME
FR3021737A1 (en) * 2014-06-03 2015-12-04 Thales Sa ACQUISITION CHAIN OF AT LEAST ONE PHYSICAL SIZE FOR A CRITICALLY ADVANCED AVIONIC SYSTEM AND METHOD OF ACQUIRING THE SAME
DE102004058749B4 (en) * 2003-12-16 2016-11-10 Denso Corporation Apparatus for detecting an A / D converter abnormality

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4337517A (en) * 1976-09-16 1982-06-29 Systron Donner Corporation Method of automatically calibrating a microprocessor controlled digital multimeter

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4337517A (en) * 1976-09-16 1982-06-29 Systron Donner Corporation Method of automatically calibrating a microprocessor controlled digital multimeter

Cited By (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7135998B2 (en) 2002-05-08 2006-11-14 Continental Teves Ag & Co. Ohg Electronic circuit arrangement for error-free analog/digital conversion of signals
WO2003096540A1 (en) * 2002-05-08 2003-11-20 Continental Teves Ag & Co. Ohg Electronic circuit arrangement for error-free analog/digital conversion of signals
WO2004077083A1 (en) * 2003-02-21 2004-09-10 Infineon Technologies Ag Device and method for the tolerance analysis of digital and/or digitalised measuring values
US7487060B2 (en) 2003-02-21 2009-02-03 Infineon Technologies Ag Apparatus and method for tolerance analysis for digital and/or digitized measure values
DE10320717A1 (en) * 2003-05-08 2004-12-09 Siemens Ag Plausibility testing circuit for testing for the correct operation of an analogue to digital converter in a safety-relevant application, by comparison of ADC inputs and outputs with reference signals
DE10320717B4 (en) * 2003-05-08 2006-02-16 Siemens Ag Plausibility of the function of an analog-to-digital converter
DE102004058749B4 (en) * 2003-12-16 2016-11-10 Denso Corporation Apparatus for detecting an A / D converter abnormality
EP1777824A1 (en) * 2005-10-24 2007-04-25 Robert Bosch Gmbh Parametric ADC-test
EP2088043A1 (en) * 2008-02-08 2009-08-12 Kelsey-Hayes Company Fail safe test for motion sensors
US8650930B2 (en) 2008-08-08 2014-02-18 Kelsey-Hayes Company Fail safe self test for motion sensor modules
WO2013139533A1 (en) * 2012-03-20 2013-09-26 Robert Bosch Gmbh Acceleration sensor having at least one micromechanical sensor element for an occupant protection system in a vehicle
US9476904B2 (en) 2012-03-20 2016-10-25 Robert Bosch Gmbh Acceleration sensor having at least one micromechanical sensor element for an occupant protection system in a vehicle
CN104204816A (en) * 2012-03-20 2014-12-10 罗伯特·博世有限公司 Acceleration sensor having at least one micromechanical sensor element for an occupant protection system in a vehicle
CN104204816B (en) * 2012-03-20 2017-04-26 罗伯特·博世有限公司 Acceleration sensor having at least one micromechanical sensor element for an occupant protection system in a vehicle
FR3021738A1 (en) * 2014-06-03 2015-12-04 Thales Sa ACQUISITION CHAIN OF AT LEAST ONE PHYSICAL SIZE, IN PARTICULAR FOR A CRITICAL AIRBORNE AVIONIC SYSTEM, AND METHOD OF ACQUIRING THE SAME
FR3021737A1 (en) * 2014-06-03 2015-12-04 Thales Sa ACQUISITION CHAIN OF AT LEAST ONE PHYSICAL SIZE FOR A CRITICALLY ADVANCED AVIONIC SYSTEM AND METHOD OF ACQUIRING THE SAME
WO2015185638A1 (en) * 2014-06-03 2015-12-10 Thales Chain for acquiring at least one physical quantity for a critical on-board avionics system and associated acquisition method
WO2015185637A1 (en) * 2014-06-03 2015-12-10 Thales System for acquisition of at least one physical variable, in particular for a critical on-board avionics system, and associated acquisition method
US10317244B2 (en) 2014-06-03 2019-06-11 Thales System for acquisition of at least one physical variable, in particular for a critical on-board avionics system, and associated acquisition method

Similar Documents

Publication Publication Date Title
EP1427086B1 (en) Electrical apparatus and method for operating it
EP2089892A1 (en) Safety switch device
EP2378663B1 (en) Secure input circuit with single channel peripheral connection for the input of a bus participant
DE102006030448B4 (en) Safe output circuit with a single-channel peripheral connection for the output of a bus participant
DE19705406A1 (en) A=D conversion method with self-test function
EP2182605A1 (en) Switch assembly for protecting electronic devices against faulty logic voltages
EP2608375A2 (en) Circuit arrangement with an inverter and method for testing the functionality of electromechanical switches
DE10392545B4 (en) Electronic circuitry for error-proof analog-to-digital conversion of signals
EP2163911B1 (en) Method for testing a protective device and correspondingly equipped protective device and testing device
DE102014014309B4 (en) Method for testing a signal path
EP1355163B1 (en) Process and apparatus for testing a converter
DE10054745B4 (en) Method for the safe transmission of sensor signals and apparatus for carrying out the method
EP2810399A1 (en) Reception arrangement for a control device in a vehicle and method for generating a synchronisation pulse
DE102006047469B4 (en) Method and device for checking a switch arrangement
WO2020114696A1 (en) Device and method for discharging a dc link capacitor
WO1988005570A1 (en) Process and device for monitoring computer-controlled final control elements
DE10109864A1 (en) Safety switching device
WO2013170987A1 (en) Monitoring of a capacitor for supplying electrical power
DE19906932B4 (en) Binary
DE102015215847B3 (en) Device and method for increasing the functional safety in a vehicle.
DE102007062974B4 (en) Signal processing device
EP2709226A1 (en) Circuit arrangement, and level converter and comparator circuit for the circuit arrangement
DE10323908A1 (en) Method and arrangement for monitoring a power output stage
DE3515962A1 (en) Arrangement for controlling and monitoring for failure, in a fashion which is reliable in terms of signalling technology, alternating current-fed double element lamps of a light signal, in particular a warning signal in railway signalling systems
DE19813952C1 (en) Signaling output stage for generating digital voltage signals on a bus system

Legal Events

Date Code Title Description
OP8 Request for examination as to paragraph 44 patent law
8127 New person/name/address of the applicant

Owner name: TEMIC TELEFUNKEN MICROELECTRONIC GMBH, 90411 NUERN

8127 New person/name/address of the applicant

Owner name: CONTI TEMIC MICROELECTRONIC GMBH, 90411 NUERNBERG,

8131 Rejection