CZ156893A3 - Scintillation detector - Google Patents

Abstract

The compound scintillation detector (1) with high space and time resolution with scintillation elements (8a - 8e) are created by single crystals of ytrite-aluminium garnet both with ingredient of cerium with polished surface. The input surfaces (9a - 9e) and the bases (10a - 10e) for input of scintillation radiation are created on the opposite ends of scintillation elements (8a - 8e). The level of reflection of dielectric reflecting layers for a light emitted by scintillation elements (8a to 8e), incidenced on the reflecting layers under the angle of incidence within a range 0 to 45 DEG is higher than 50 %. The reflecting layers are created by a deposition and followed chemical-thermal processing. The bases (10a - 10e) for input of scintillation light have anti-reflecting layers on which a light is incidenced under the angle within the range for 0 to 45 DEG . The input surfaces (9a - 9e) of scintillation elements (8a - 8e) are advantageously created by dielectric interference or diffusion reflecting layer with a thickness up to 5 mu m. The effective optical separation of particular scintillation elements (8a - 8e) is advantageously realized by light-tight layer created by metal deposition. The considerably compact variant of the detector (1) is reached by a filler. The optical evaluation equipment (4) connected with the basis (10a - 10e) is created by photomultiplier with high space resolution.

Description

Technical field

The invention relates to a composite scintillation detector for detecting ionizing radiation consisting of a set of longitudinal scintillation elements arranged in a column matrix and having an input surface for the input of detected radiation, a base for output of scintillation radiation, and lateral surfaces formed in their longitudinal axis which are provided with a dielectric reflective layer covered by a light-tight layer.

BACKGROUND OF THE INVENTION

Currently, for detecting ionizing radiation in the energy range of 5 keV to 1 MeV, used in positron emission tomography (PET), computer tomtomography (CTI. Single photon emission tomography (SPECT) and other fields where high spatial and temporal resolution is required capability, using predominantly single-crystal scintillation detectors based on BGO, N'a: I: Tl and Csl - T. The physical and chemical properties of these materials allow the construction of detectors with a cross-section of less than 1 mmA For example, in the frequently used BGO scintillator, the afterglow time is 280 ns, which is also disadvantageous for these applications.In addition, the NabT1 and CsbT1 single crystals are highly hygroscopic and require a housing that does not allow tight crystal alignment. layer and optically separated so that e the minimum distance of two adjacent crystals is greater than 0.5 mm, which in the best cases allows a measurement with a spatial / scaling ability greater than 2 mm.

A composite scintillation detector is known, for example, from DE 41 07 264 A1. The material of the scintillation elements of the known detector are sintered ceramic. rare earth oxides, for example a mixture of GdjOq and EU2O3 with the rest of θ2θ3 ’will be BGdO ,. C.si, CdWO.A, BiGe and the like. Between the individual scintillation elements, diffuse reflective layers of 50 µm thickness are formed in the direction parallel to the direction of the input radiation, based on the Ti-2 O-__, __________________________________

Between adjacent reflective layers, a coaxial layer is provided for the optical and energetic separation of the individual scintillation elements or the scintillation elements. for collimating gamma input. In addition, passive energy filters are provided between the interface surfaces of the scintillation elements in a direction perpendicular to the direction of the input radiation, allowing the input energy to be determined. To ensure filtration efficiency is

- 3 1

I. it is necessary that the filter layers have a thickness greater than 10 µm. The input radiation is incident on the detector perpendicular to the longitudinal dimension of the scintillation elements. It uses a known PN or PIN photodiodes detector or CCD elements as a scintillation radiation detector.

The disadvantage of the known detector is its low spatial resolution capability due to the considerable overall thickness of the diffuse reflection and collimation layers used on one side and the reflection and filter layers on the other. Thus, the known detector is not suitable for use in fields requiring high spatial and temporal resolution. The CCD elements used to sense scintillation light do not allow the time component of the scintillation pulses to be scanned since the signals are evaluated periodically for a certain time. time of integration.

European patent application EP 0 437 051 A2 discloses a scintillation detector whose scintillation elements consist of BGO crystals, partially provided with polished surfaces. These polished surfaces are combined with rough areas showing other light propagation properties so that the scintillation radiation is transferred between adjacent scintillation radiation. elements. The extent of light transmission can be freely changed by changing the structure of the interface.

The detector uses a plurality of photomultipliers assigned to the parts to evaluate the scintillation radiation

- 4 scintillation fields formed by the exit surfaces of the crystals.

As a result of scintillation radiation transfer. between. adjacent scintillation elements which are not light-tightly separated are optical losses, reducing the spatial and temporal resolution of the detector.

The Czechoslovak author 's certificate No. 263 791 finally writes a scintillation detector, low energy beta and electron radiation, consisting of one single crystal of aluminoyltrium, garnet, activated by cerium, or. cerium-activated aluminoyltrium perovskite, in the form of polished on both sides, respectively. a truncated cone having, with the exception of the base used for the light output, a polished surface. On the surface of the detector, a dielectric reflective layer is formed, overlaid on the radiation-receiving surface by an electrically conductive layer.

—P od tat avy n á-1 ez u - ^ ------------------------ The object of the invention is to propose a composite-type scintillation detector, as described in the preamble of this application, with high spatial and temporal resolution, providing collimated scintillation light that can be sensed without. by means of special evaluation devices by devices available on the market without incurring excessively high costs. Material used scintillation. of elements has a report

- 5 excellent workability, chemical resistance and very short afterglow time. The evaluation device used here should enable a separate reading of each pulse of the scintillation radiation, as well as the determination of its amplitude and position while simultaneously scanning the time component of the pulses.

This object is achieved according to the invention in that the scintillation elements consist of cerium doped yttrium-aluminum garnet monocrystals (YAG; Ce resp. Y3Alj50j2: Ce) with a polished surface, the inlet surface and the base for the scintillation output being formed on opposite ends of scintillation elements.

The second solution consists in that the scintillation elements consist of cerium-doped yttrium-aluminum perovskite monocrystals (YAP-Ce or YAlO ^Cei) with a polished surface, wherein the inlet surface and the base for the scintillation output are formed at opposite ends of the scintillation elements .

According to a further preferred embodiment of the invention, the reflectance value of the dielectric reflective layers for the light emitted by the scintillation elements at wavelengths defined by the half-width of their emission incident on the reflective layers at an angle of incidence, in the range 0 to 45 °, is greater than 50X. The reflective layers are formed by multiple evaporation with subsequent chemical-thermal treatment as interference reflective layers.

These measures allow the formation of very thin reflective layers (a few micrometers thick) while maintaining the law of reflection. The chemical-thermal treatment improves the wave dependence of the reflection respectively. integral reflectivity of layers. ......... _ _ by extending the reflection_width ^ (FWHKi) depending on the wavelength. .

... _long. Scintillation lights. In addition, the interference layers exhibit a smaller angular dependence of reflection, i.e., they are not defined only for perpendicular incidence of light.

A further enhancement of the luminescence efficiency is achieved in another important embodiment by providing the scintillation light output bases with antireflective layers of light emitted by scintillation elements of wavelengths. defined by the half-width of their emission and impinging on the antireflective layer at an angle of incidence of 0 to 45 °.

The use of antireflective layers reduces the loss of reflection on the β-ω-1-át o r-γ-kt e -r-ε There are given indices --------------------- YAG and YAP crystals and possibilities of using optical sealants. _

- Thin antireflective layers with the required properties ---- are achieved by multiple steaming with subsequent chemical-thermal treatment.

In this connection, it is particularly advantageous if the inlet surfaces of the scintillation elements are provided with a dielectric interference reflection layer. The thickness of the dielectric interference reflection layers preferably does not exceed 5 [mu] m. However, the entry surfaces can also be provided with a dielectric diffusion reflective layer. In this case, the spatial resolution does not deteriorate and the entry areas of the crystals are effectively protected from mechanical damage.

A very efficient optical separation of the individual scintillation elements is achieved in a further preferred embodiment in that the light-tight layer is formed by a metal vapor of one of the metals Al, W, Mo, Fe, Cr, Ni, Au, Ag, Cu with a thickness in the range 0.05 up to 1 µm, preferably in the range of 0.08 to 0.15 µm.

A particularly compact embodiment of the detector according to the invention is achieved by providing a sealant layer between the lateral surfaces of the individual scintillation elements such that the distance between adjacent scintillation elements does not exceed 0.01 mm and the thickness of the sealant layer does not exceed 5 µm. Size of the input area resp. The scintillation output base is 0.01 to 10 mm ² , preferably 0.06 to 1 mm ² .

With respect to the scintillation light emitted by the scintillation elements, an optical evaluation device converting the scintillation light into electrical signals is connected to the detector according to the invention on the base for the scintillation light output. with a base of optical sealant of refractive index n, the value of which lies in the range of 1.4 - 1.6. Such an arrangement allows the scintillation light to pass to the evaluation device with minimal optical loss.

The optical evaluation device is advantageously made up of a multiplier with a high spatial resolution, which allows a very effective suppression of the system noise by using the time component of the pulses. Another possibility is to use a very low noise photodiode array for scintillation radiation evaluation.

The excellent resolution of the detector according to the invention is achieved, especially when the cerium doped yttrium-aluminum garnet monocrystals consist of a stoichiometric compound of 0.05 to 2.0 moles. % ¢ 6303, 62.5 mol. % Of Al 2 O 3 and the remainder of Y 2 ° 3 and, respectively, cerium-doped yttrium-aluminum monocrystals of stoichiometric alloys consist of a stoichiometric compound -O- _T -0-to-2-O-mol-X-C ^ ^C ^, 5050 , 0_mol. _X. AI2-O3. and izbytku. ¥ 303- The specified range of cerium applications optimizes luminescence efficiency ...... ..... · ..

The physical properties of the aforementioned crystals advantageously make it possible to detect both X-rays as well as beta radiation and gamma radiation, which is particularly advantageous for the use of the detector according to the invention in computed tomography.

- 9 Overview of the drawings

The invention will be explained in more detail below with reference to the accompanying drawings, in which:

Giant. 1 is a composite scintillation detector according to the invention in isometric illustration; ...........

giant; 2 shows a section A-A according to FIG. 1, partially broken, and FIG

FIG. 3 is a graphical representation of the results of measurements made with a detector according to the invention.

The composite scintillation detector 1 shown in FIG. 1 consists of twenty-five longitudinal scintillation elements 8a. 8b, 8c. 8d, 8e arranged in a square 5x5 matrix so that they touch each other with their side faces 11a-1, 11aq2, 11b-1, 11b-2, 11c-1, 11c-2, 11d-1 ... formed in the direction their longitudinal axes. For the sake of simplicity, only the first row of scintillation elements of the matrix are indicated by reference numerals. The individual scintillation elements 8a, 8e are formed of cerium-doped yttrium-aluminum garnet single crystals (YAG: Ce) respectively. cerium-doped yttrium-aluminum perovskite (YAP: Ce) consisting of stoichiometric compounds 0.05 to 2.0 mol. % £ ®2θ3 ’62.5 mol. X Al 1 CH and the remainder Y 2 O 7 respectively. 0.05 to 2.0 mol. X ¢ 82 () 3.50 mol. X Al 2 O 3 and the remainder Y 2 O 3.

10, at the upper end of the individual scintillation elements 8a ... 8e are provided entrance surfaces 9a, 9b, 9c, 9d, 9e for the input of detected ionizing radiation impinging on the detector in the direction of impact shown by the arrow 5. a scintillation light output formed by the bases 10a, 10b, 10c, 10d. 10e at opposite ends of the scintillation elements, an optical sensing device 2 is connected _; - changing, scintillation, v. electrical pulses, schematically shown, with an arrow. 5, 5a, preferably consisting of a position-sensitive, high spatial resolution photomultiplier connected via an A / D-converter to an evaluation device or to an optical converter. the processor 4, the input of which is the electrical pulses of the base 10a. 10b, 10c, 10d, 10e ... of detector V with photomultiplier 2 is. it is preferably carried out with an optical sealant having a refractive index ri of between 1.4 and 1.6.

2, a partial sectional view of FIG. 2, it is evident that Mo Indiv ^- scintigraphy were hungry PRV-alkyl-8a-8d-as-I-K-N a v-Ye-N- -Boc --- nich- 11a-2b, 11b-1b, 9b, 9b, 9b, 9b, 9b, 9b, 9b, 9b, 9b, 9b, 9b, 9d, 9b, 9d, 9b, 9d, 9d, 9d, 9d, 9d, 9d, 9d, Reflective layers 12a-2, 12b-1, 12b-2, 12c-1, 12c-2, 12d-1, respectively. 15a, 15b, 15c, 15d. These reflective layers are formed by several successively deposited layers of suitable dielectrics, for example S1O2, TiOo, Y2Oq, ZrC> 2 and subsequently subjected to a chemical-thermal treatment, which greatly improves the wave dependence of the achieved reflection. Prior to the application of the dielectric reflective layers, the surface of the individual crystals was polished while being coated

- the thickness of the reflective layers does not exceed 5 µm. The reflectance values of the interference reflective layers 12a-2, 12b-1, 12b-2, 12c-1, 12c-2, 12d-1 ... are due to the fact that the monocrystals are spaced. 8a, 8b, 8c, 8d of ^f wavelengths, delimited by their emission width (FWHM) and impinging on. these layers at an angle of incidence in the range of 0 to 45 [deg.], substantially higher than 50 [deg.]. It is hardly conceivable to provide the entrance surfaces 9a, 9b, 9c, 9d with scintillation elements 8a, 8b, -8c, 8d with a diffuse reflective layer.

Optically separating the individual scintillation elements 8a, 8b. 8c, 8d serve the light-tight layers 13a-2, 13b-1, 13b-2, 13c-1, 13c-2, 13d-1, consisting of a metal vapor with a thickness in the range 0.05 to 1 µm, preferably in the range of 0.08 to 0.15 µm. Suitable materials for forming light-tight layers are aluminum, tungsten, molybdenum, iron, chromium, nickel, gold, silver or copper. The primer is preferably a light-tight layer 18a, 18b, 18c. 18d, the entrance surfaces 9a-9b, 9c, 9d of the individual scintillation elements 8a are also provided. 8b, 8c, 8d. The provision of the light-tight layer on the entrance surface of the detection unit allows its use outside the light-tight closed device.

The individual thin layers 17a-b, 17b-c, 17c-12 serve for the interconnection of the individual scintillation elements 8a, 8b, 8c, 8d; sealant ,. the thickness of which does not exceed 5 µm. Total distance between. individual single crystals arranged in a regular matrix does not exceed at the above. as shown above, the choice of individual layer thickness of 0.01 mm. It can further be seen from FIG. 2 that the bases 10a, 10b, 10c, 10d of the individual scintillation elements 8a, 8b, 8c, 8d for outputting the scintillation light are provided with anti-inflammatory and anti-lexical materials. 4-1, 4A, 4A. and 14 d-pr-en-t-15-am-t-swans-pr-8-8-8-d-w wavelengths. pološír.kou. their _; emission .., and :.

impinging on the antireflective layers 14a, 14b, 14c, 14d. pod. an angle of incidence ranging from 0 to 45 °. Similar to the above-mentioned dielectric interference reflection layers, i.

antireflexni. layers 14a, 14b. 14.c, 14d are preferably formed by multiple evaporation of suitable materials. for example SiO ₂ . TiO ₂ . _Y2 ° 3 ^'Zr ° 2' ^{of which} P) ^sum is subjected to chemical-thermal processing. For the connection of the photomultiplier 2 to the detector 1 according to the invention, an optical sealant layer 16 having a refractive index n ranging from 1.4 to 1.6 is used.

• Exemplary-execution-vyn-á-1 e z-u—

Example 1.

The detector according to the invention was subjected to a measurement, the results of which are shown in FIG. 3. The measurement was carried out using a 20 x 17 x 7 mm column matrix consisting of single crystals. yttrium-aluminum perovskite with cerium subsidies (YAP:

- 13 Ce, 1.0 mol. % CegOg) with dimensions 0,6 χίθ, 6 x 7 mm. The HAMAMATSU R 2846 position-sensitive photomultiplier with high spatial resolution was used as the optical scanning device. The detector was irradiated with collimated gamma radiation (®®Tc, 14o keV) at two spaced locations

1.8 mm (four detection elements) through a collimator with a diameter

0.2 and .0.4 mm. Both. the peaks of the curves in Fig. 3 correspond. ......

center-to-center distances of the entrance surfaces of the first and fourth irradiated single crystal equal to 1.8 mm and 1.8 mm, respectively. value of ten channels of evaluation device with sensitivity of one channel

0.18 mm. The spatial resolution of the measured system (FWHM) was therefore 4 x 0.18 mm = 0.72 mm. ,.

.-T « _in : i *. ·;

Example 2. Longitudinal scintillation elements with a 0.5 mm square base and a length of 25 mm were prepared from a yttrium-aluminum garnet monocrystal doped with _AiV cerium (YAG: Ce) and polished. The surfaces of the individual scinti-F fasteners were provided with a dielectric interference reflective layer having a reflectance value of R = 92% for light, emitted by scintillation elements with a maximum wavelength

Λ = 550 nm. The reflective layer was then covered with an aluminum vapor of about 120 nm. The longitudinal scintillation elements prepared in this way were arranged in a square matrix of 5 x elements corresponding to FIG. 1 and interconnected with epoxy sealant so that the total distance between adjacent scintillation elements was approx.

0.008 mm. This configuration resulted in a 2.53 x 2.53 x 5 mm composite detector. The scintillation light output base was polished and then bonded using an optical sealant layer with a high-spatial resolution multiplier of greater than 0.3 mm. Measurements in a collimated X-ray beam with a maximum energy of 145 eV resulted in a spatial resolution of the detector of > 07 > min. ---------------, ----- -----------—

Example 3 ..

Of yttrium aluminum single crystal. Perovskite with cerium doped (YAP: Ce) longitudinal scintillation elements with a 0.3 mm square base and 25 mm long side were prepared and polished. The surfaces of the individual scintillation elements were provided with a dielectric interference reflective layer, subjected to a subsequent chemical-thermal treatment, with a reflectance value R = 93% for the light emitted by the scintillation elements, with a maximum wavelength 37 = 37 0 nm. The reflective layer was then covered with a molybdenum vapor of about 100 nm. The tactile longitudinal scintillation elements were arranged in a 10 x 10 square matrix and bonded together with an epoxy sealant. . This arrangement resulted in a 3.09 x 3.09 x 25 mm composite detector. The base for the scintillation light output was polished, provided with an anti-reflective layer and then flattened ^; This is by means of an optical sealant layer with an index of refraction n = 1.45 s with a photomultiplier with a high spatial resolution, higher than 0.3 mm. Measurements in the collimated gamma-ray beam with energy of 51Ž keV achieved a detector spatial resolution higher than 0.5 mm.

Industrial applicability. .......

The use of the compound-scintillation detector according to the invention is particularly advantageous in nuclear and experimental medicine and non-destructive defectoscopy.

Claims (24)

A scintillation data detector for detecting a brick (44-irirki) ř-ττλ, controlled by a plurality of longitudinal scintillation elements arranged in. a column matrix and having an input surface for the input of the detected radiation, a base for the output of the illumination; A three-layer-reflective layer covered with a light-tight layer, characterized in that the scintillation elements (8a-8e; ...) consist of monocrystals of yttrium-aluminum garnet with a cerium-doped cerium doping. E) with a polished surface, wherein the entrance surface (9a-9e; ...) and the base 11a-10e; scintillation light output means are formed at opposite ends of the scintillation elements (8a-8e; 2. A scintillation detector for the detection of ionizing radiation, consisting of a set of longitudinal scintillation elements arranged in a column matrix and having an entrance area intended for a step ^- scaled radiation step of the infiltration of the basement. A scintillation light output as well as side surfaces formed in the direction of their longitudinal axis which are provided with a dielectric reflective layer covered by a light-tight layer, characterized in that the scintillation elements (8a-8e) are provided. .) consists of monocrystals, yttrium-aluminum perovskite with cerium doping (YAP: Ce and ΥΑΙΌ3: Ce, respectively) with a polished surface, the entrance surface (9a-9e; and the base (10a-10e; ...) for the scintillation light output at opposite ends of the scintillation elements 18a-8e; 3. Scintillation detector according to claim 1 or 2, characterized in that the reflective layers (12a -2, 12b. -1, 12b_r2, 12c? 1, 12c -2, 12d -1) are formed as interference reflective layers by multiple steaming with subsequent chemical-thermal treatment. A scintillation detector according to claim 1 or 2 labeled. in that the reflectance values of the interference reflective layers (12a-2, 12b-1, 12b -2, 12c-1, 12c'-2, 12d-1) are for the light emitted by the scintillation elements (8a-8e; ...) of wavelengths defined by the half-width of their emission and incident on the interference reflective layers (12a-2, 12b -1, 12b -2, 12c-1, 12c-2, 12d -1) at an angle of incidence of between 0 and 45 °, —------------------- _ higher_ than_5Q _.% _______________________________ L · .—.: _______________________ Scintillation detector according to claim 3, characterized in that the reflective layers (12a -2, 12b -1, 12b -2, 12c -1, 12c -2, 12d -1) are formed as interference reflective layers by multiple evaporation with subsequent chemistry by co-heat treatment. Scintillation detector according to one of Claims 1 to 4, characterized in that between the side surfaces (11a-1, 11a-2, 11b-1, 11b-2, 11c-1, 11c-2 ', 11d). -1 ...) of the individual s.cintillation elements (8a, 8b, 8c, 8d), the sealant layer (17a-b, 17b-c, 17c-d) is provided such that the distance between adjacent scintillation elements (8a, 8b) , 8c, 8d) does not exceed 0.01 mm. - 18 Scintillation detector according to one of Claims 1 to 5, characterized in that the bases (10a-10e: ... for scintillation light output) are provided with an anti-reflection layer (14a, 14b, 14c, 14d) for the light emitted scintillation elements (8a, 8b, 8c, 8d) of wavelengths defined by the half-width of their emission and impinging on the antireflective layer (14a, 14b, ----------------- 1-4 No, —14 d) —soil — angler — impact.U - V_r.o2mc.z._0._a ζ__45θ. _________ Scintillation detector according to one of Claims 1 to 6, characterized by: The method according to claim 1, characterized in that the antireflective layers (14a, 14b, 14c, 14d) are formed by multiple steaming with subsequent chemical-thermal treatment. Scintillation detector according to one of Claims 1 to 7, characterized in that the entrance surface ( 9a. 9b, 9c, 9d) of the scintillation elements (8a, 8b, 8c, 8d) is provided with a dielectric interference reflective layer (15a, 15b, 15c, 15d). 977Sčiňťilační aě'ťělčtor ^_ ^ ccording ^- II (Inel & ^_ 2 ^_ ~ l ~ náro'ků to ^- 7 'in the y-_ "- 2-N-A-C-E-N-Y-T-i-m , - that — vs-tu-pni — area - (-9 a .. -9b, -9c-9.dJ.). The elements (8a, 8b, 8c, 8d) are provided with a dielectric diffusion reflective layer. A scintillation detector according to claim 8 or 9, characterized in that the entrance surface (9a, 9b, 9c, 9d) is provided with a light-tight layer (18a, 18b, 18c, 18d). - 19 The scintillation detector according to claim 5, characterized in that the thickness of the sealant layer (17a-b, 17b-c, 17c-d) does not exceed 5 µm. Scintillation detector according to one of Claims 1 to 6 and 7 or 8, characterized in that the thickness of the dielectric interference reflective layers (12a-2, 12h-1, 12b-2, 12c-1). 12c-2, 12d-1, 15a-15d) does not exceed 5'um. Scintillation detector according to one of Claims 1 to 12, characterized in that the light-tight layer (12a-2, 12b-1, 12b-2, 12c-1, 12c-2, 12d-1) is formed by metal vapor. of one of the metals Al, W, Mo, Fe, Cr, Ni, Au, Ag, Cu in the range G; 05- to -1-µm. -----— -— ------------ 14. The scintillation detector according to claim 13, wherein the metal vapor thickness is in the range of 0.08 to 0.15 [mu] m. Scintillation detector according to one of Claims 1 to 14, characterized in that: that the size of the entrance surface (9a-9e; ...) respectively. the base (10a-10e; ...) for scintillation light output is 0.01 to 10 mm 2, A scintillation detector according to claim 15, characterized in that the size of the entrance area (9a-9e; the base (10a-10e;) for scintillation radiation output is 0.06 to 0.10 1 mnA A scintillation detector according to any one of the preceding claims, wherein the scintillation light output base is: -. X * «a, -.« ~ M - .. - —1 »X aJ · ******» ** »» a rí n a anírtí «i í-í 1 η í yiipujciiu VJ ilUUiXUÚ The light in electrical signals, characterized in that the optical evaluation device (2) is connected to the base (30) with an optical sealant (16) having a refractive index n, the value of - lie-i-y-yros-bound-1-a-n-10 A scintillation detector according to claim 17, characterized in that the optical evaluation device (2) is a photomultiplier with high spatial resolution. . 19; The scintillation detector according to claim 17, characterized in that the optical evaluation device (2) is a photodiode array. A scintillation detector according to claim 1, characterized in that the cerium-doped yttrium-aluminum garnet single crystals (YAGiCe) consist of a stoichiometric compound of 0.05 to -2.0-mOl% - ee2O3r6-275-mOlmX-AT2O'3-a-residue. -Y- ₂ -O-3 · 4 21. The scintillation detector according to claim 2, wherein the cerium-doped yttrium aluminum perovskite monocrystals (YAP: Ce) consist of a stoichiometric compound of 0.05 to 2.0 moles. % Ce ₂ O ₃ 50.0 mol. 2 AI2O3 and the remainder Υ ₂ θ3 · - 21 22. Scintillation detector according to one of the preceding claims marked. The ionizing radiation detected is X-rays. Scintillation detector according to one of the preceding claims 1 to 21, characterized in that the detected ionizing radiation is beta radiation. Scintillation detector according to one of the preceding claims 1 to 21, characterized in that: that the detected ionizing radiation is gamma radiation.