CN220356970U - Diffraction detection device, inspection apparatus, and inspection system - Google Patents
Diffraction detection device, inspection apparatus, and inspection system Download PDFInfo
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Abstract
本实用新型提供一种衍射检测装置、检查设备及检查系统。衍射检测装置包括支架;衍射辐射源;和衍射辐射检测器,衍射辐射检测器与辐射源限定沿第一方向延伸的检查通道,衍射辐射检测器配置成接收来自检查通道上的被检查对象的经衍射的辐射以便确定导致衍射的物质的特性。支架配置成允许辐射源和衍射辐射检测器能够在支架上跨检查通道沿第二方向移动,第二方向是第一方向的横向。
The utility model provides a diffraction detection device, inspection equipment and inspection system. The diffraction detection device includes a bracket; a diffraction radiation source; and a diffraction radiation detector. The diffraction radiation detector and the radiation source define an inspection channel extending along the first direction, and the diffraction radiation detector is configured to receive the radiation from the inspected object on the inspection channel. Diffracted radiation in order to determine the properties of the substance causing the diffraction. The support is configured to allow movement of the radiation source and the diffracted radiation detector on the support in a second direction across the examination channel, the second direction being transverse to the first direction.
Description
技术领域Technical field
本实用新型涉及检测技术领域。具体地,涉及一种衍射检测装置、检查设备以及检查系统。The utility model relates to the field of detection technology. Specifically, it relates to a diffraction detection device, inspection equipment and inspection system.
背景技术Background technique
目前的安检设备满足不开包或开箱也能够快速检查物品。The current security inspection equipment can quickly inspect items without opening the bag or box.
现有的安检设备一般是射线透射成像的方式,较为先进的例如CT检查设备;然后,这类设备仍然存在可以观察大体形状而不能完全确定嫌疑物是否违禁的问题。Existing security inspection equipment generally uses radiographic transmission imaging, and the more advanced ones include CT inspection equipment; however, this type of equipment still has the problem of being able to observe the general shape but not completely determine whether a suspect object is prohibited.
需要更加完善的设备,能够更加确定地判断被检查对象中是否包含违禁物。More complete equipment is needed to determine more definitely whether the object being inspected contains prohibited items.
实用新型内容Utility model content
本实用新型的一种衍射检测装置,包括:A diffraction detection device of the present invention includes:
支架;stand;
衍射辐射源;和sources of diffracted radiation; and
衍射辐射检测器,所述衍射辐射检测器与所述衍射辐射源限定沿第一方向延伸的检查通道,所述衍射辐射检测器配置成接收来自所述检查通道上的被检查对象的经衍射的辐射以便确定导致衍射的物质的特性;A diffractive radiation detector defining an inspection channel extending along a first direction with the diffractive radiation source, the diffractive radiation detector configured to receive diffracted radiation from an inspected object on the inspection channel Radiation in order to determine the properties of substances causing diffraction;
其中,所述支架配置成允许所述衍射辐射源和所述衍射辐射检测器能够在所述支架上跨所述检查通道沿第二方向移动,第二方向是第一方向的横向。Wherein, the bracket is configured to allow the diffraction radiation source and the diffraction radiation detector to move on the bracket across the inspection channel in a second direction, the second direction being transverse to the first direction.
在一个实施例中,所述衍射辐射源和所述衍射辐射检测器能够相对于彼此静止地在所述支架上跨所述检查通道沿第二方向移动;或In one embodiment, the diffractive radiation source and the diffractive radiation detector are movable in a second direction across the examination channel on the support stationary relative to each other; or
所述衍射辐射源和所述衍射辐射检测器能够分别各自在所述支架上跨所述检查通道沿第二方向移动到特定位置。The diffraction radiation source and the diffraction radiation detector are respectively movable on the support to a specific position in a second direction across the examination channel.
在一个实施例中,支架包括:In one embodiment, the stent includes:
第一轨道,用以支撑所述衍射辐射源并允许所述衍射辐射源沿所述第一轨道移动;和a first track to support the diffractive radiation source and allow movement of the diffractive radiation source along the first track; and
第二轨道,用以支撑所述衍射辐射检测器并允许所述衍射辐射检测器沿所述第二轨道移动。A second track is used to support the diffraction radiation detector and allow the diffraction radiation detector to move along the second track.
在一个实施例中,所述支架还包括:In one embodiment, the stent further includes:
第一驱动电机和第一丝杠,所述第一驱动电机驱动所述第一丝杠旋转一定量,从而丝杠能够旋转以驱动所述衍射辐射源沿所述第一轨道移动一距离;和/或A first drive motor and a first lead screw, the first drive motor drives the first lead screw to rotate a certain amount, so that the lead screw can rotate to drive the diffraction radiation source to move a distance along the first track; and /or
第二驱动电机和第二丝杠,所述第二驱动电机驱动所述第二丝杠旋转所述一定量,从而丝杠能够旋转以驱动所述衍射辐射检测器沿所述第二轨道移动所述距离。A second drive motor and a second screw, the second drive motor drives the second screw to rotate a certain amount, so that the screw can rotate to drive the diffraction radiation detector to move along the second track. Describe the distance.
在一个实施例中,第一轨道包括第一上轨和第一下轨,所述第一丝杠布置在第一上轨和第一下轨之间;In one embodiment, the first track includes a first upper rail and a first lower rail, and the first screw is arranged between the first upper rail and the first lower rail;
第二轨道包括第二上轨和第二下轨,所述第二丝杠布置在第二上轨和第二下轨之间。The second rail includes a second upper rail and a second lower rail, and the second screw is arranged between the second upper rail and the second lower rail.
在一个实施例中,衍射检测装置还包括传送装置,配置在所述检查通道内用以传送被检查对象通过所述检查通道。In one embodiment, the diffraction detection device further includes a transport device configured in the inspection channel to transport the inspected object through the inspection channel.
在一个实施例中,衍射辐射源和衍射辐射检测器的连线通过被检查对象的需要执行衍射检测的部分。In one embodiment, the connection between the diffraction radiation source and the diffraction radiation detector passes through the portion of the object being inspected where diffraction detection is to be performed.
在一个实施例中,提供一种检查设备,包括:In one embodiment, an inspection device is provided, including:
透射成像装置,配置成朝向被检查对象照射辐射并通过检查透射辐射而构建被检查对象的透射图像;和a transmission imaging device configured to irradiate radiation toward the object being inspected and to construct a transmission image of the object being inspected by examining the transmitted radiation; and
上述的衍射检测装置,配置成朝向被检查对象照射辐射并通过检查从被检查对象衍射的辐射而检测被检查对象的至少一部分的特性,the above-mentioned diffraction detection device configured to irradiate radiation toward the object to be inspected and to detect characteristics of at least a portion of the object to be inspected by examining the radiation diffracted from the object to be inspected,
其中,透射成像装置配置成对所述检查通道上的被检查对象扫描。Wherein, the transmission imaging device is configured to scan the object to be inspected on the inspection channel.
在一个实施例中,透射成像装置包括:透射辐射源,配置成发射辐射;和透射辐射检测器,所述透射辐射检测器配置成接收透射通过被检查对象的辐射。In one embodiment, a transmission imaging device includes a transmission radiation source configured to emit radiation; and a transmission radiation detector configured to receive radiation transmitted through an object under examination.
在一个实施例中,基于透射成像装置构建的被检查对象的透射图像确定嫌疑物的位置,所述衍射检测装置跨所述检查通道和第二方向移动至被检查对象的嫌疑物沿竖直方向在检查通道上的投影上的位置。In one embodiment, the position of the suspect is determined based on the transmission image of the inspected object constructed by the transmission imaging device, and the diffraction detection device moves across the inspection channel and the second direction until the suspect of the inspected object is along a vertical direction. Position on the projection on the inspection channel.
在一个实施例中,在所述衍射辐射源和所述衍射辐射检测器移动至用于检测被检查对象的嫌疑物的位置之前,所述被检查对象沿第一方向移动以便嫌疑物沿竖直方向在检查通道上的投影上位于第一轨道和/或第二轨道上的所述衍射辐射检测器。In one embodiment, before the diffraction radiation source and the diffraction radiation detector are moved to a position for detecting the suspect object of the object being inspected, the object being inspected is moved in the first direction such that the suspect object is moved along a vertical direction. The direction of said diffracted radiation detector is located on the first orbit and/or the second orbit in projection onto the examination channel.
本实用新型的一方面提供一种检查系统,包括:One aspect of the utility model provides an inspection system, including:
CT检查部,包括CT机,用于检查被检查对象是否包含嫌疑物;和CT inspection department, including CT machine, used to check whether the object being inspected contains suspects; and
复检部,包括上述的检查设备,用于确定所述嫌疑物的特性。The re-inspection section includes the above-mentioned inspection equipment and is used to determine the characteristics of the suspect object.
附图说明Description of the drawings
附图用于更好地理解本方案,不构成对本实用新型的限定,其中:The accompanying drawings are used to better understand the present solution and do not constitute a limitation of the present utility model, in which:
图1示出了根据本实用新型的实施例的衍射检测装置的示意图,左图为正面示意图,右图为侧面示意图。Figure 1 shows a schematic diagram of a diffraction detection device according to an embodiment of the present invention. The left picture is a front schematic diagram, and the right picture is a side schematic diagram.
具体实施方式Detailed ways
为更清楚地阐述本实用新型的目的、技术方案及优点,以下将结合附图对本实用新型的实施例进行详细的说明。应当理解,下文对于实施例的描述旨在对本实用新型的总体构思进行解释和说明,而不应当理解为是对本实用新型的限制。在说明书和附图中,相同或相似的附图标记指代相同或相似的部件或构件。为了清晰起见,附图不一定按比例绘制,并且附图中可能省略了一些公知部件和结构。In order to more clearly explain the purpose, technical solutions and advantages of the present invention, the embodiments of the present invention will be described in detail below with reference to the accompanying drawings. It should be understood that the following description of the embodiments is intended to explain and illustrate the general concept of the present invention, but should not be understood as limiting the present invention. In the specification and drawings, the same or similar reference numbers refer to the same or similar parts or components. For the sake of clarity, the drawings are not necessarily to scale and some well-known components and structures may be omitted from the drawings.
除非另外定义,本实用新型使用的技术术语或者科学术语应当为本实用新型所属领域内具有一般技能的人士所理解的通常意义。本实用新型中使用的“第一”、“第二”以及类似的词语并不表示任何顺序、数量或者重要性,而只是用来区分不同的组成部分。措词“一”或“一个”不排除多个。“包括”或者“包含”等类似的词语意指出现该词前面的元件或者物件涵盖出现在该词后面列举的元件或者物件及其等同,而不排除其他元件或者物件。“连接”或者“相连”等类似的词语并非限定于物理的或者机械的连接,而是可以包括电性的连接,不管是直接的还是间接的。“上”、“下”、“左”、“右”“顶”或“底”等等仅用于表示相对位置关系,当被描述对象的绝对位置改变后,则该相对位置关系也可能相应地改变。当诸如层、膜、区域或衬底基板之类的元件被称作位于另一元件“上”或“下”时,该元件可以“直接”位于另一元件“上”或“下”,或者可以存在中间元件。Unless otherwise defined, the technical terms or scientific terms used in the present invention shall have the usual meanings understood by those with ordinary skills in the field to which the present invention belongs. "First", "second" and similar words used in the present invention do not indicate any order, quantity or importance, but are only used to distinguish different components. The wording "a" or "an" does not exclude a plurality. Words such as "include" or "comprising" mean that the elements or things appearing before the word include the elements or things listed after the word and their equivalents, without excluding other elements or things. Words such as "connected" or "connected" are not limited to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "Top", "bottom", "left", "right", "top" or "bottom" are only used to express relative position relationships. When the absolute position of the described object changes, the relative position relationship may also correspond. ground changes. When an element such as a layer, film, region, or substrate is referred to as being "on" or "under" another element, it can be "directly on" or "under" the other element, or Intermediate elements may be present.
图1示出根据本实用新型的实施例的衍射检测装置。衍射检测装置包括:支架11、衍射辐射源1和衍射辐射检测器7。衍射辐射源1和衍射辐射检测器7通过支架11支撑。衍射辐射检测器7与所述衍射辐射源1限定沿第一方向延伸的检查通道5,衍射辐射检测器7配置成接收来自检查通道5上的被检查对象6的经衍射的辐射以便确定使辐射衍射的物质的特性。此处,使辐射衍射的物质可以是违禁物品等嫌疑物,例如箱包行李中的嫌疑物,由于肉眼并不能看到嫌疑物,并且箱包等不方便打开,因而需要衍射检测装置辨认嫌疑物是否属于违禁物品。检查通道5可以是空间,在这此空间中,被检查对象可以接收检查。检查通道5中可以提供传送带、或传送盒等用于传送的容器或装置等。Figure 1 shows a diffraction detection device according to an embodiment of the present invention. The diffraction detection device includes: a bracket 11, a diffraction radiation source 1 and a diffraction radiation detector 7. The diffraction radiation source 1 and the diffraction radiation detector 7 are supported by a bracket 11 . A diffractive radiation detector 7 defines an inspection channel 5 extending along a first direction with said diffractive radiation source 1 , and the diffractive radiation detector 7 is configured to receive diffracted radiation from the inspected object 6 on the inspection channel 5 in order to determine whether the radiation Diffraction properties of matter. Here, the substances that diffract radiation can be suspected objects such as prohibited items, such as suspect objects in luggage. Since the suspect objects cannot be seen with the naked eye, and the bags are inconvenient to open, a diffraction detection device is needed to identify whether the suspect objects are Prohibited items. Inspection channel 5 can be a space in which the inspected object can receive inspection. The inspection channel 5 may be provided with a conveyor belt, a conveyor box or other containers or devices for conveying.
在本实用新型的本实施例中,支架11配置成允许所述衍射辐射源1和所述衍射辐射检测器7能够在所述支架11上跨所述检查通道5沿第二方向移动,第二方向是第一方向的横向。In this embodiment of the invention, the bracket 11 is configured to allow the diffraction radiation source 1 and the diffraction radiation detector 7 to move in a second direction across the inspection channel 5 on the bracket 11 , a second The direction is transverse to the first direction.
在本实用新型的一个实施例中,支架2配置成允许所述衍射辐射源1和所述衍射辐射检测器7能够相对于彼此静止地在所述支架2上跨所述检查通道5沿第二方向移动。此处“相对于彼此静止”表示所述衍射辐射源1和所述衍射辐射检测器7的移动是同步的。In one embodiment of the invention, the support 2 is configured to allow the diffraction radiation source 1 and the diffraction radiation detector 7 to be stationary relative to each other on the support 2 across the inspection channel 5 along a second direction movement. Here "stationary relative to each other" means that the movements of the diffraction radiation source 1 and the diffraction radiation detector 7 are synchronized.
在本实用新型的另一个实施例中,支架2配置成允许所述衍射辐射源1和所述衍射辐射检测器7能够各自在所述支架2上跨所述检查通道5沿第二方向移动,此处指的是,衍射辐射源1与衍射辐射检测器7不用同时移动,或者不用以相同的速度移动,或者不用从相同的起点开始移动,或者不用相对彼此保持固定的位置关系移动,只需要分别移动到特定位置允许完成衍射检测即可。根据本实用新型的实施例,此处特定位置指的是,衍射辐射源1和衍射辐射检测器7的连线大体通过被检查对象6的需要执行衍射检测的部分即可以完成衍射检测,需要说明的是并不需要衍射辐射源1和衍射辐射检测器7的连线严格通过被检查对象6的需要执行衍射检测的部分。本实用新型的一个实施例中,衍射辐射源1和衍射辐射检测器7被配置成沿竖直方向对准,以此布置方式配置衍射辐射检测器中的晶体,此时特定位置表示,衍射辐射检测器7位于被检查对象6的需要执行衍射检测的部分沿竖直方向在检查通道的投影的位置。应该知道,在本实用新型的其他实施例中,衍射辐射源1和衍射辐射检测器7可以不沿竖直方向对准也可以实现衍射检测。因而在本实用新型中,特定位置也表示,当衍射辐射源1和衍射辐射检测器7位于特定位置,衍射辐射源1照射被检查对象6的需要执行衍射检测的部分后的衍射辐射将被衍射辐射检测器接收。In another embodiment of the present invention, the bracket 2 is configured to allow the diffraction radiation source 1 and the diffraction radiation detector 7 to each be able to move in the second direction across the inspection channel 5 on the bracket 2, What this means here is that the diffraction radiation source 1 and the diffraction radiation detector 7 do not need to move at the same time, or do not need to move at the same speed, or do not need to start from the same starting point, or do not need to move with a fixed positional relationship relative to each other, they only need to Just move them to specific positions to allow diffraction detection to be completed. According to the embodiment of the present invention, the specific position here means that the connection line between the diffraction radiation source 1 and the diffraction radiation detector 7 generally passes through the part of the inspected object 6 that needs to perform diffraction detection, and the diffraction detection can be completed. It needs to be explained. It is not necessary that the connection between the diffraction radiation source 1 and the diffraction radiation detector 7 strictly passes through the part of the inspected object 6 where diffraction detection needs to be performed. In one embodiment of the present invention, the diffraction radiation source 1 and the diffraction radiation detector 7 are configured to be aligned in the vertical direction, and the crystal in the diffraction radiation detector is configured in this arrangement. At this time, the specific position indicates that the diffraction radiation The detector 7 is located at a position along the vertical direction of the projection of the inspection channel of the portion of the inspected object 6 that needs to perform diffraction detection. It should be understood that in other embodiments of the present invention, the diffraction radiation source 1 and the diffraction radiation detector 7 may not be aligned in the vertical direction to achieve diffraction detection. Therefore, in the present invention, a specific position also means that when the diffraction radiation source 1 and the diffraction radiation detector 7 are located at a specific position, the diffraction radiation after the diffraction radiation source 1 irradiates the part of the inspected object 6 that needs to perform diffraction detection will be diffracted. Radiation detector receives.
在exist
在一个实施例中,支架11包括第一轨道2,用以支撑所述衍射辐射源1并允许所述衍射辐射源1沿所述第一轨道2移动;和第二轨道,用以支撑所述衍射辐射检测器7并允许所述衍射辐射检测器7沿所述第二轨道移动。In one embodiment, the support 11 includes a first track 2 to support the diffraction radiation source 1 and allow the diffraction radiation source 1 to move along the first track 2; and a second track to support the diffraction radiation source 1. diffracted radiation detector 7 and allowing said diffracted radiation detector 7 to move along said second track.
第一轨道2和第二轨道10沿第二方向跨检查通道5,在如图1所示的实施例中,第一轨道2设置在支架11的上部,第二轨道10设置在支架11的下部。第一轨道2可以是双轨结构,即包括第一上轨和第一下轨,衍射辐射源1被支撑在第一上轨和第一下轨上,这样的配置可以更加稳定地支撑衍射辐射辐射源;然而,第一轨道2可以是单轨道设置。第二轨道10可以是双轨结构,即包括第二上轨和第二下轨,衍射辐射检测器7被支撑在第二上轨和第二下轨上,这样的配置可以更加稳定地支撑衍射辐射检测器7;然而,第二轨道10可以是单轨道设置。The first rail 2 and the second rail 10 span the inspection channel 5 along the second direction. In the embodiment shown in FIG. 1 , the first rail 2 is disposed on the upper part of the bracket 11 and the second rail 10 is disposed on the lower part of the bracket 11 . The first track 2 may be a dual-track structure, that is, it includes a first upper track and a first lower track, and the diffraction radiation source 1 is supported on the first upper track and the first lower track. Such a configuration can support the diffraction radiation more stably. source; however, the first track 2 can be a single track setup. The second track 10 may be a dual-track structure, that is, it includes a second upper track and a second lower track, and the diffraction radiation detector 7 is supported on the second upper track and the second lower track. Such a configuration can support diffraction radiation more stably. Detector 7; however, the second track 10 may be a single track arrangement.
衍射检测装置还可以包括第一驱动电机4和第一丝杠3,第一驱动电机4驱动所述第一丝杠3旋转一定量,从而丝杠能够旋转以驱动衍射辐射源1沿所述第一轨道2移动一距离。The diffraction detection device may also include a first drive motor 4 and a first lead screw 3. The first drive motor 4 drives the first lead screw 3 to rotate a certain amount, so that the lead screw can rotate to drive the diffraction radiation source 1 along the first lead screw 3. One track 2 moves one distance.
衍射检测装置还可以包括第二驱动电机9和第二丝杠7,第二驱动电机9驱动第二丝杠7旋转一定量,从而丝杠能够旋转以驱动衍射辐射检测器7沿第二轨道10移动所述距离。The diffraction detection device may also include a second drive motor 9 and a second lead screw 7 . The second drive motor 9 drives the second lead screw 7 to rotate a certain amount, so that the lead screw can rotate to drive the diffraction radiation detector 7 along the second track 10 Move the distance stated.
衍射辐射源1可以包括衍射辐射源1支架11用于支撑衍射辐射源1。衍射辐射源1支架11的上端支撑在第一上轨上,下端支撑在第一下轨上,衍射辐射源1支架11还包括第一套筒,第一套筒可以位于衍射辐射源1支架11的下部并套接第一丝杠3(如图1所示,第一丝杠3被示出为位于第一上轨和第一下轨之间,但这并不是必须的),第一套筒根据第一丝杠3的旋转方向由左向右或由右向左移动;第一驱动电机4基于嫌疑物的位置旋转第一丝杠3的特定圈数,第一丝杠3的旋转圈数决定了第一套筒的移动距离,第一套筒的移动也就是衍射辐射源1支架11的移动。此处,第一驱动电机4的旋转圈数与嫌疑物在检查通道5的横向方向上的位置具有线性对应关系。The diffractive radiation source 1 may comprise a diffractive radiation source 1 holder 11 for supporting the diffractive radiation source 1 . The upper end of the diffraction radiation source 1 bracket 11 is supported on the first upper rail, and the lower end is supported on the first lower rail. The diffraction radiation source 1 bracket 11 also includes a first sleeve. The first sleeve can be located on the diffraction radiation source 1 bracket 11 The lower part is sleeved with the first screw 3 (as shown in Figure 1, the first screw 3 is shown to be located between the first upper rail and the first lower rail, but this is not necessary), the first set The cylinder moves from left to right or from right to left according to the rotation direction of the first screw 3; the first drive motor 4 rotates the first screw 3 for a specific number of turns based on the position of the suspect, and the rotation of the first screw 3 The number determines the moving distance of the first sleeve, and the movement of the first sleeve is also the movement of the diffraction radiation source 1 bracket 11. Here, the number of rotations of the first drive motor 4 has a linear corresponding relationship with the position of the suspect object in the transverse direction of the inspection channel 5 .
衍射辐射源1可以包括衍射检测器支架11用于支撑衍射检测器。衍射检测器支架11的上端支撑在第二上轨上,下端支撑在第二下轨上,类似地,衍射检测器支架11可以包括第二套筒,第二套筒套接第二丝杠7(如图1所示,第二丝杠7被示出为位于第二上轨和第二下轨之间,但这并不是必须的),当第二丝杠7旋转时,第二套筒根据第二丝杠7的旋转方向由左向右或由右向左移动;第二驱动电机9基于嫌疑物的位置旋转第二丝杠7的特定圈数,第二丝杠7的旋转圈数决定了第二套筒的移动距离,第二套筒的移动也就是衍射检测器支架11的移动。类似地,第二驱动电机9的旋转圈数与嫌疑物在检查通道5的横向方向上的位置具有线性对应关系The diffraction radiation source 1 may comprise a diffraction detector holder 11 for supporting the diffraction detector. The upper end of the diffraction detector bracket 11 is supported on the second upper rail, and the lower end is supported on the second lower rail. Similarly, the diffraction detector bracket 11 may include a second sleeve, and the second sleeve is sleeved with the second lead screw 7 (As shown in Figure 1, the second screw 7 is shown to be located between the second upper rail and the second lower rail, but this is not necessary), when the second screw 7 rotates, the second sleeve Move from left to right or from right to left according to the rotation direction of the second screw 7; the second drive motor 9 rotates the second screw 7 a specific number of turns based on the position of the suspect, and the number of rotations of the second screw 7 The movement distance of the second sleeve is determined, and the movement of the second sleeve is also the movement of the diffraction detector bracket 11 . Similarly, the number of rotations of the second drive motor 9 has a linear corresponding relationship with the position of the suspect in the lateral direction of the inspection channel 5
本实用新型的实施例中,第一轨道2和第二轨道10可以是滑轨,也可以是具有齿的齿条,也可以是丝杠。衍射辐射源1支架11和衍射检测器支架11可以通过套筒被丝杠驱动,也可以配备有齿轮分别与第一轨道2和第二轨道10上的齿啮合,通过第一驱动电机4和第二驱动电机9驱动齿轮旋转可以实现衍射辐射源1支架11和衍射检测器支架11分别在第一轨道2和第二轨道10上移动。本实用新型的其他实施例中还包括其他装置驱动衍射辐射源1和衍射检测器跨检查通道5移动,只需要衍射辐射源1和衍射检测器两者能够被移动就可以。In the embodiment of the present invention, the first track 2 and the second track 10 may be slide rails, racks with teeth, or lead screws. The diffraction radiation source 1 bracket 11 and the diffraction detector bracket 11 can be driven by a screw through a sleeve, or can be equipped with gears that mesh with the teeth on the first rail 2 and the second rail 10 respectively, and are driven by the first drive motor 4 and the second rail 10. The two drive motors 9 drive the gears to rotate so that the diffraction radiation source 1 bracket 11 and the diffraction detector bracket 11 can move on the first track 2 and the second track 10 respectively. Other embodiments of the present invention also include other devices to drive the diffraction radiation source 1 and the diffraction detector to move across the inspection channel 5 , as long as both the diffraction radiation source 1 and the diffraction detector can be moved.
在图1示出的实施例中,检查通道5给示出为沿第一方向穿过衍射检测装置的横截面为矩形的空间,其意图表示,被检查对象6可以位于该空间内,并且可以在第一方向上自由地移动,然而并不是意指存在这样的矩形的部件。此外,在图1示出的检查通道5内,可以提供传送带12、传送框(未示出)等用于传送被检查对象6的装置。In the embodiment shown in FIG. 1 , the inspection channel 5 is shown as a rectangular space with a cross-section passing through the diffraction detection device along the first direction, which is intended to indicate that the inspected object 6 can be located in this space, and can Free to move in the first direction, however, does not imply the presence of such a rectangular component. In addition, in the inspection channel 5 shown in FIG. 1 , a conveyor belt 12 , a conveyor frame (not shown) and other devices for conveying the inspected object 6 may be provided.
本实用新型公开一种检查设备,包括透射成像装置和上述的衍射检测装置。透射成像装置和衍射检测装置可以通过支架11支撑。在如图1所示的衍射检测装置中,透射成像装置可以在第一方向上靠近衍射检测装置设置,也可以间隔开预定的确定的距离。透射成像装置配置成朝向被检查对象6照射辐射并通过检查透射辐射而构建被检查对象6的透射图像。衍射检测装置配置成朝向被检查对象6照射辐射并通过检查从被检查对象6衍射的辐射而检测被检查对象6的至少一部分(例如嫌疑物)的特性。在本实施例中,所述衍射辐射检测器7与所述衍射辐射源1限定沿第一方向延伸的检查通道5;然而,也可以认为检查通道5由透射成像装置限定;换句话说,透射成像装置和衍射检测装置可以共同限定检查通道5。The utility model discloses an inspection equipment, which includes a transmission imaging device and the above-mentioned diffraction detection device. The transmission imaging device and the diffraction detection device can be supported by the bracket 11 . In the diffraction detection device as shown in FIG. 1 , the transmission imaging device can be disposed close to the diffraction detection device in the first direction, or can be separated by a predetermined distance. The transmission imaging device is configured to irradiate radiation toward the object 6 to be inspected and to construct a transmission image of the object 6 to be inspected by examining the transmitted radiation. The diffraction detection device is configured to irradiate radiation toward the inspection object 6 and detect characteristics of at least a portion of the inspection object 6 (eg, a suspect) by examining the radiation diffracted from the inspection object 6 . In this embodiment, the diffraction radiation detector 7 and the diffraction radiation source 1 define an inspection channel 5 extending along the first direction; however, it can also be considered that the inspection channel 5 is defined by a transmission imaging device; in other words, transmission The imaging device and the diffraction detection device may together define an inspection channel 5 .
被检查对象6可以在检查通道5上被移动,从而使得被检查对象6可以被透射成像装置扫描。在本实施例中,透射成像装置可以是固定在支架11上的。在一个实施例中,透射成像装置包括透射辐射源和透射辐射检测器,配置成透射辐射源朝向被检查对象6照射辐射,透射辐射检测器接收透射通过被检查对象6的辐射以便能够构建被检查对象6的透射图像。透射辐射源和透射辐射检测器可以固定在支架11上,例如透射辐射源固定在支架11的顶部,而透射辐射检测器固定在支架11的底部;在另一实施例中,反过来配置,透射辐射源固定在支架11的底部,而透射辐射检测器固定在支架11的顶部。在一个实施例中,透射成像装置可以共用衍射检测装置的衍射辐射源,这样可以减少辐射源,降低设备成本,简化结构。衍射辐射源可以在支架11上自由移动,可以用作透射成像装置的辐射源,此时透射辐射检测器可以固定,而衍射辐射源可以移动,透射成像装置可以与衍射检测装置在一个辐射束照射(被检查对象6的)断面内完成成像操作。这是有利的,可以在透射成像装置扫描出嫌疑物时,原位执行衍射检测,即停止运送被检查对象6,而将衍射检测装置移动至嫌疑物附近执行衍射检测。The inspected object 6 can be moved on the inspection channel 5 so that the inspected object 6 can be scanned by the transmission imaging device. In this embodiment, the transmission imaging device may be fixed on the bracket 11 . In one embodiment, the transmission imaging device includes a transmission radiation source and a transmission radiation detector, configured such that the transmission radiation source irradiates radiation toward the object to be inspected 6 , and the transmission radiation detector receives the radiation transmitted through the object to be inspected 6 so as to be able to construct the object to be inspected Transmission image of object 6. The transmission radiation source and the transmission radiation detector can be fixed on the bracket 11 , for example, the transmission radiation source is fixed on the top of the bracket 11 , and the transmission radiation detector is fixed on the bottom of the bracket 11 ; in another embodiment, the configuration is reversed, and the transmission radiation detector is fixed on the bracket 11 . The radiation source is fixed on the bottom of the bracket 11 and the transmitted radiation detector is fixed on the top of the bracket 11 . In one embodiment, the transmission imaging device can share the diffraction radiation source of the diffraction detection device, which can reduce radiation sources, reduce equipment costs, and simplify the structure. The diffraction radiation source can move freely on the bracket 11 and can be used as the radiation source of the transmission imaging device. At this time, the transmission radiation detector can be fixed and the diffraction radiation source can move. The transmission imaging device can be irradiated with the same radiation beam as the diffraction detection device. The imaging operation is completed within the section (of the inspected object 6 ). This is advantageous. When the transmission imaging device scans out the suspect object, the diffraction detection can be performed in situ, that is, the transportation of the object 6 to be inspected is stopped, and the diffraction detection device is moved to the vicinity of the suspect object to perform the diffraction detection.
在本实用新型的实施例中,衍射检测装置可以移动,例如沿检查通道5的横向移动至特定位置检测衍射辐射。在本实用新型中,衍射检测装置可以移动到一个特定位置处完成衍射辐射的测量,因而不需要(沿横向)跨检查通道5布置一排衍射检测探测器,这大大减小设备的成本。特定位置指的是,衍射辐射源和衍射辐射监测器之间的连线通过需要进行衍射检测的部分。In embodiments of the present invention, the diffraction detection device can move, for example, move laterally along the inspection channel 5 to a specific position to detect diffracted radiation. In the present utility model, the diffraction detection device can be moved to a specific position to complete the measurement of diffraction radiation, so there is no need to arrange a row of diffraction detection detectors across the inspection channel 5 (in the transverse direction), which greatly reduces the cost of the equipment. The specific position refers to the part where the connection between the diffraction radiation source and the diffraction radiation monitor passes through the part where diffraction detection is required.
在本实用新型的一个实施例中,第一方向的位置通过X轴的坐标表示,第二方向上的位置通过Y轴的坐标表示,当确定一个(0,0)的位置(例如图1左侧图中检查通道5左下角部的位置为原点)后,图1所示的检查通道5内第一方向和第二方向确定的二维平面的位置可以通过二维坐标表示。透射成像装置扫描在检查通道5上被移动的被检查对象6,构建了被检查对象6的透射图像。通过观察扫描的透射图像(此处可以是人工观察,也可以使用软件使用计算机自动检测),找出透射图像中嫌疑物的部分,确定嫌疑物部分的x,y坐标。由于一些嫌疑物可能具有不规则的形状,或者嫌疑物的成分导致图像并不清楚,单纯从透射图像不能够判断嫌疑物部分是何种物品,需要进一步检测。此时,根据嫌疑物的x,y坐标,移动被检查对象6,使得嫌疑物的坐标变成(0,y)(位于第一轨道2和第二轨道10沿竖直方向在检查通道5上的投影上),随后将x坐标值为0的衍射检测装置至(0,y)位置,使用衍射辐射源1照射嫌疑物部分,衍射检测器接收被嫌疑物衍射的辐射,从而检测嫌疑物的特性,例如嫌疑物的原子系数,嫌疑物的成分,构成等,由此实现不用开包也可以再次确认被检查对象6是否包含违禁物品。In one embodiment of the present invention, the position in the first direction is represented by the coordinates of the X-axis, and the position in the second direction is represented by the coordinates of the Y-axis. After the position of the lower left corner of the inspection channel 5 in the side view is the origin), the position of the two-dimensional plane determined in the first direction and the second direction in the inspection channel 5 shown in Figure 1 can be expressed by two-dimensional coordinates. The transmission imaging device scans the inspection object 6 moving on the inspection channel 5 and constructs a transmission image of the inspection object 6 . By observing the scanned transmission image (this can be manual observation, or you can use software and computer to automatically detect), find the suspect part in the transmission image, and determine the x, y coordinates of the suspect part. Since some suspects may have irregular shapes, or the composition of the suspects causes the image to be unclear, it is not possible to determine what kind of object the suspect part is simply from the transmission image, and further testing is required. At this time, according to the x, y coordinates of the suspect, the inspected object 6 is moved so that the coordinates of the suspect become (0, y) (located on the first track 2 and the second track 10 along the vertical direction on the inspection channel 5 (on the projection), then move the diffraction detection device with the x coordinate value 0 to the (0, y) position, use the diffraction radiation source 1 to illuminate the suspect part, and the diffraction detector receives the radiation diffracted by the suspect, thereby detecting the Characteristics, such as the atomic coefficient of the suspect, the composition and composition of the suspect, etc., thereby enabling the inspection object 6 to be reconfirmed whether it contains prohibited items without opening the package.
在本实用新型的实施例中,透射成像装置和衍射检测装置可以各自具有辐射源,例如衍射检测装置具有衍射辐射源1,透射成像装置具有透射辐射源,两个辐射源可以具有相同的型号,也可以根据需要配置不同的型号。透射成像装置的辐射源和透射辐射检测器配合完成透射扫描,衍射检测装置的辐射源和衍射辐射检测器7配合完成衍射检测。In embodiments of the present invention, the transmission imaging device and the diffraction detection device may each have a radiation source. For example, the diffraction detection device has a diffraction radiation source 1, and the transmission imaging device has a transmission radiation source. The two radiation sources may have the same model, Different models can also be configured as needed. The radiation source of the transmission imaging device and the transmission radiation detector cooperate to complete the transmission scanning, and the radiation source of the diffraction detection device and the diffraction radiation detector 7 cooperate to complete the diffraction detection.
在本实用新型的另一个实施例中,透射成像装置和衍射检测装置可以具有一个共同的辐射源。在本实施例中,如图1所示的衍射辐射源1朝向被检查对象6照射辐射束,透射辐射检测器检测透射辐射,从而实现对运动的被检查对象6的扫描;在被检查对象6中发现嫌疑物时,停止被检查对象6,此时嫌疑物的x值为0,因而不用移动被检查对象6,直接移动衍射检测器完成衍射检测。在本实施例中,透射辐射检测器可以与衍射辐射检测器7一起位于辐射源的投射范围内。图1未示出本实施例的配置方式。In another embodiment of the present invention, the transmission imaging device and the diffraction detection device may have a common radiation source. In this embodiment, the diffraction radiation source 1 shown in Figure 1 irradiates a radiation beam toward the object to be inspected 6, and the transmitted radiation detector detects the transmitted radiation, thereby realizing scanning of the moving object to be inspected 6; When a suspect is found, the inspected object 6 is stopped. At this time, the x value of the suspect is 0, so there is no need to move the inspected object 6, and the diffraction detector is directly moved to complete the diffraction detection. In this embodiment, the transmitted radiation detector may be located together with the diffracted radiation detector 7 within the projection range of the radiation source. Figure 1 does not show the configuration of this embodiment.
本文中“特性”包括物质的原子系数、结构构成或其他属性,其与物质的本征特征相对应。基于被物质衍射的辐射检测物质的特性的技术是已知的,此处不做过多的描述,本实用新型的衍射辐射检测器7可利用已有的衍射检测原理工作。"Characteristics" as used herein include the atomic coefficients, structural composition or other properties of a substance, which correspond to the intrinsic characteristics of the substance. The technology of detecting the characteristics of a substance based on the radiation diffracted by the substance is known and will not be described too much here. The diffraction radiation detector 7 of the present invention can work using the existing diffraction detection principle.
在本实用新型的实施例中,特定位置可以允许衍射辐射源1照射嫌疑物,并且衍射辐射检测器7能够检测经衍射的辐射以确定嫌疑物的特性。衍射辐射源1发射的辐射照射嫌疑物,经过嫌疑物衍射后,大体继续沿照射嫌疑物部分的方向传播,衍射辐射检测器7的辐射接收面接收经衍射的辐射。此处,经衍射的辐射沿辐射接收面的法线方向入射,满足衍射检查装置的检测要求(涉及本领域技术人员熟知的衍射角等条件,此处不做讨论)。在如图1所示的实施例中,衍射辐射源1和衍射辐射检测器7可以大体沿竖直方向配置,并且配置成跨检查通道5沿横向移动。在本实用新型一个实施例中,当衍射辐射源1和衍射辐射检测器7沿竖直方向对准时,事先已经调整好衍射辐射检测器7中晶体的辐射接收面,因而只要衍射辐射源1和衍射辐射检测器7沿竖直方向配置时,衍射辐射检测器7不需要任何调整就可以实现检测。本领域技术人员了解衍射辐射检测器7中的晶体需要满足一定的衍射角才能够完成检测,然而本实用新型的实施例事先已经调整好衍射角,甚至完成特定的校正,因而在衍射检测过程中不需要调整衍射辐射检测器7的朝向,不需要校正操作,使得检测设备便利性得到极大的提高。In embodiments of the present invention, a specific position may allow the diffractive radiation source 1 to illuminate the suspect, and the diffractive radiation detector 7 can detect the diffracted radiation to determine the characteristics of the suspect. The radiation emitted by the diffractive radiation source 1 irradiates the suspect. After being diffracted by the suspect, it generally continues to propagate in the direction of the portion of the suspect that is irradiated. The radiation receiving surface of the diffractive radiation detector 7 receives the diffracted radiation. Here, the diffracted radiation is incident along the normal direction of the radiation receiving surface, meeting the detection requirements of the diffraction inspection device (diffraction angle and other conditions that are well known to those skilled in the art are not discussed here). In the embodiment shown in FIG. 1 , the diffractive radiation source 1 and the diffractive radiation detector 7 may be arranged generally in a vertical direction and configured to move laterally across the inspection channel 5 . In one embodiment of the present invention, when the diffraction radiation source 1 and the diffraction radiation detector 7 are aligned in the vertical direction, the radiation receiving surface of the crystal in the diffraction radiation detector 7 has been adjusted in advance, so as long as the diffraction radiation source 1 and When the diffraction radiation detector 7 is arranged in the vertical direction, the diffraction radiation detector 7 can achieve detection without any adjustment. Persons skilled in the art understand that the crystal in the diffraction radiation detector 7 needs to meet a certain diffraction angle to complete the detection. However, the embodiments of the present utility model have adjusted the diffraction angle in advance and even completed specific corrections. Therefore, during the diffraction detection process There is no need to adjust the orientation of the diffraction radiation detector 7 and no calibration operation, which greatly improves the convenience of the detection equipment.
此外,由于在衍射检测过程中衍射辐射源1和衍射辐射检测器7均作直线平移的运动,因而衍射辐射源1和衍射辐射检测器7之间的距离保持不变,经衍射的辐射的强度大体相当,有利于提高检测过程中判断嫌疑物的特性的准确性。In addition, since both the diffraction radiation source 1 and the diffraction radiation detector 7 make linear translational movements during the diffraction detection process, the distance between the diffraction radiation source 1 and the diffraction radiation detector 7 remains unchanged, and the intensity of the diffracted radiation It is roughly equivalent, which is helpful to improve the accuracy of judging the characteristics of suspects during the detection process.
在本实用新型的实施例中,所述透射辐射检测器未示出,然而,应该知道透射辐射检测器可以具有期望的布置和形状,例如具有“L”形,或者由多个小的透射辐射检测单元一起构成,透射辐射检测器布置在支架11上透射辐射源的相对一侧,其不与衍射辐射检测器7相冲突。In embodiments of the present invention, the transmitted radiation detector is not shown, however, it should be understood that the transmitted radiation detector may have a desired arrangement and shape, such as having an "L" shape, or may be composed of multiple small transmitted radiation detectors. The detection unit is constructed together, with the transmitted radiation detector being arranged on the support 11 on the opposite side of the transmitted radiation source, which does not conflict with the diffracted radiation detector 7 .
在本实用新型的实施例中,透射辐射源意图包含准直器,因而透射辐射源能够发射辐射束,例如扇形面束。透射辐射检测器意图包含后准直器,用于排除杂散辐射的干扰。In an embodiment of the invention, the transmitted radiation source is intended to include a collimator, so that the transmitted radiation source can emit a radiation beam, such as a sector beam. Transmitted radiation detectors are intended to contain post-collimators to exclude interference from stray radiation.
本实用新型的一个方面提供一种检查方法,方法可以使用上述实施例中的检查设备实现。方法包括:One aspect of the present invention provides an inspection method, which can be implemented using the inspection equipment in the above embodiment. Methods include:
使用辐射照射被检查对象6;Use radiation to irradiate the object being examined 6;
通过检测透射通过被检查对象6的透射辐射构建被检查对象6的透射图像;constructing a transmission image of the object 6 being examined by detecting the transmitted radiation transmitted through the object 6 being examined;
识别透射图像中与嫌疑物对应的嫌疑物图像部分;Identify the portion of the suspect image in the transmission image that corresponds to the suspect;
基于嫌疑物图像部分在透射图像中的位置,确定嫌疑物部分在被检查对象6中的位置;以及determining the position of the suspect portion in the inspected object 6 based on the position of the suspect image portion in the transmission image; and
将衍射检测装置移动至特定位置,检测来自嫌疑物的衍射辐射,以便确定嫌疑物部分的特性。The diffraction detection device is moved to a specific position to detect the diffracted radiation from the suspect object in order to determine the characteristics of the suspect part.
本实用新型的一方面提供一种检查系统,包括:One aspect of the utility model provides an inspection system, including:
CT检查部,包括CT机,用于检查被检查对象6是否包含嫌疑物;和The CT inspection unit, including a CT machine, is used to check whether the inspected object 6 contains a suspect; and
复检部,包括前面实施例任一个所述的检查设备,用于确定所述嫌疑物的特性,例如原子系数、成分等。The re-inspection part includes the inspection equipment described in any of the previous embodiments, and is used to determine the characteristics of the suspect, such as atomic coefficients, composition, etc.
在一个实施例中,复检部限定的检查通道5可以接续CT检查部的检查通道5;在另一实施例中,复检部限定的检查通道5可以不接续CT检查部限定的检查通道5。In one embodiment, the inspection channel 5 defined by the re-examination part may be connected to the inspection channel 5 defined by the CT inspection part; in another embodiment, the inspection channel 5 defined by the re-examination part may not be connected to the inspection channel 5 defined by the CT inspection part. .
在一个实施例中,经所述CT检查部检查后,不包含嫌疑物的被检查对象6被放行,包含嫌疑物的被检查对象6被传送至所述复检部。In one embodiment, after being inspected by the CT inspection unit, the inspected objects 6 that do not contain suspects are released, and the inspected objects 6 that contain suspects are sent to the re-inspection unit.
在一个实施例中,所述检查设备沿第一方向移动通过所述透射成像装置扫描包含嫌疑物的被检查对象6,并且基于透射图像确定的嫌疑物位置,使用所述衍射检测装置进一步检测嫌疑物的特性。In one embodiment, the inspection equipment moves in a first direction through the transmission imaging device to scan the inspected object 6 containing the suspect, and based on the position of the suspect determined by the transmission image, the diffraction detection device is used to further detect the suspect. characteristics of things.
当被检查对象6通过CT检查部时,CT检查部可以获得被检查对象6的三位图像,从而可以在不开包的情况下实现对被检查对象6是否包含违禁物品的检查。当被检查对象6不包含违禁物品,被检查对象6被放行;当被检查对象6的三维图像显示可能包含违禁物品,即图像中一部分被确定为嫌疑物(还不能确认就是违禁物品)的图像,被检查对象6将被传送至复检部。在复检部,被检查对象6被透射检测装置扫描,从而确定嫌疑物在被检查对象6的位置,继而衍射检测装置可以移动至上述特定位置对嫌疑物进行检测,确定嫌疑物的特性,例如是炸药、枪支、毒品或其他。在本实施例中,由于设置透射检测装置,因而可以对被检查对象6重新检测一遍,提高检查准确性,并且同时能够确定嫌疑物在被检查对象6的位置;进一步,本实施例中的衍射检测装置能够移动,因而不用跨检查通道5布设衍射检测单元或检测器,从而可以减少衍射检测器或传感器,降低了整个设备和系统的造价,同时能够实现不开包的复检,提高准确性和效率。When the inspected object 6 passes through the CT inspection unit, the CT inspection unit can obtain a three-dimensional image of the inspected object 6 , thereby inspecting whether the inspected object 6 contains prohibited items without opening the package. When the inspected object 6 does not contain prohibited items, the inspected object 6 is released; when the three-dimensional image of the inspected object 6 shows that it may contain prohibited items, that is, a part of the image is determined to be a suspect object (it cannot be confirmed that it is a prohibited item). , the inspected object 6 will be sent to the re-inspection department. In the re-inspection part, the inspected object 6 is scanned by the transmission detection device to determine the position of the suspect object on the inspected object 6, and then the diffraction detection device can move to the above-mentioned specific position to detect the suspect object and determine the characteristics of the suspect object, for example Be it explosives, guns, drugs or whatever. In this embodiment, since the transmission detection device is provided, the object 6 to be inspected can be re-detected, thereby improving the accuracy of the inspection, and at the same time, the position of the suspect in the object 6 to be inspected can be determined; further, the diffraction in this embodiment The detection device can be moved, so there is no need to arrange diffraction detection units or detectors across the inspection channel 5, thereby reducing the number of diffraction detectors or sensors, reducing the cost of the entire equipment and system, and at the same time enabling re-inspection without opening the package, improving accuracy. and efficiency.
以上描述了本实用新型的多个实施例,然而,应该理解这些实施例仅作为示例,而不是本实用新型的全部实施例,并且仅为了显示本实用新型的原理而不是为了限制本实用新型;以上实施例的描述可能有侧重,然而不同的实施例可以根据以上对本实用新型的描述进行组合,得出本实用新型的其他实施例。Multiple embodiments of the present utility model have been described above. However, it should be understood that these embodiments are only examples, not all embodiments of the present utility model, and are only used to illustrate the principles of the present utility model and not to limit the present utility model; The description of the above embodiments may have emphasis, but different embodiments can be combined according to the above description of the present utility model to obtain other embodiments of the present utility model.
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