CN220064188U - Integrated high-pressure-resistant test probe - Google Patents
Integrated high-pressure-resistant test probe Download PDFInfo
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- CN220064188U CN220064188U CN202321360238.6U CN202321360238U CN220064188U CN 220064188 U CN220064188 U CN 220064188U CN 202321360238 U CN202321360238 U CN 202321360238U CN 220064188 U CN220064188 U CN 220064188U
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- needle head
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- 239000000523 sample Substances 0.000 title claims abstract description 55
- 238000012360 testing method Methods 0.000 title claims abstract description 42
- 238000005452 bending Methods 0.000 claims abstract description 40
- 238000000034 method Methods 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 6
- 238000010030 laminating Methods 0.000 description 5
- 238000007493 shaping process Methods 0.000 description 3
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical group [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
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Abstract
The utility model relates to an integrated high-pressure-resistant test probe, which comprises a first needle head, a second needle head and a connecting spring coaxially arranged between the first needle head and the second needle head; the probe also comprises a first connecting bridge and a second connecting bridge which are arranged in the connecting spring, the first connecting bridge and the second connecting bridge are axially and slidably attached, one ends of the first connecting bridge and the second connecting bridge, which are away from each other, are respectively provided with a bending section, the bending sections are bent along the radial direction of the connecting spring, and the two bending sections are respectively and eccentrically connected with the first needle head and the second needle head; the first needle head and the first connecting bridge are integrally punched and formed, and the second needle head and the second connecting bridge are integrally punched and formed; when the connecting spring is assembled in place, the axle center of the connecting spring is positioned in the joint surface of the first connecting bridge and the second connecting bridge; the first connecting bridge and the second connecting bridge axially slide and are attached to bear large current to pass through, so that the condition that the connecting spring is burnt out is effectively prevented, and meanwhile, the processing difficulty is greatly reduced through an integrally arranged mode.
Description
Technical Field
The utility model relates to the technical field of test probes, in particular to an integrated high-pressure-resistant test probe.
Background
The test probe is a high-end precise link device, is widely applied to testing a PCB circuit board and an FPC printed circuit, is mainly used as a precise probe with a connecting function, is widely applied to the technical fields of mobile phones, automobiles, medical treatment, aerospace and the like at present, is installed on a test fixture when the probe is actually tested and used, one end of the test probe is connected with an output end (the output end refers to voltage, frequency and the like), and the other end of the test probe is connected with a tested element, so that the test can be performed.
The existing test probes are composed of two small tubes which are coaxially and telescopically arranged and springs arranged in the small tubes, and contact heads are arranged at two ends of the two small tubes; in addition, because the volume of the test probe is very small, the processing difficulty of the current tubular telescopic probe is relatively high, and the cost cannot be further reduced, so that a probe which has a simple structure, is easy to manufacture, can bear large current to pass through, has lower cost and effectively prevents the spring from being burnt out is needed to be designed.
Disclosure of Invention
The utility model aims to overcome the defects of the prior art and provide an integrated high-voltage-resistant test probe which can well solve the problems.
The technical scheme adopted by the utility model for solving the technical problems is as follows:
the integrated high-pressure-resistant test probe comprises a first needle head and a second needle head which are axially arranged, and a connecting spring coaxially arranged between the first needle head and the second needle head; the probe also comprises a first connecting bridge and a second connecting bridge which are arranged in the connecting spring, wherein the first connecting bridge and the second connecting bridge are axially and slidably attached, one end, which is away from each other, of the first connecting bridge and the second connecting bridge is provided with a bending section, the bending section is bent along the radial direction of the connecting spring, and the two bending sections are respectively and eccentrically connected with the first needle head and the second needle head; the first needle head and the first connecting bridge are integrally punched and formed, and the second needle head and the second connecting bridge are integrally punched and formed; when assembled in place, the axle center of the connecting spring is positioned in the joint surface of the first connecting bridge and the second connecting bridge.
The utility model discloses an integrated high-pressure-resistant test probe, wherein one end of a first needle head and one end of a second needle head, which are away from each other, are provided with contact protrusions, and the end faces of the tail ends of the contact protrusions are arc-shaped surfaces.
The utility model discloses an integrated high-pressure-resistant test probe, wherein the first needle head and the second needle head comprise needle head plates connected with bending sections and bending parts respectively arranged at two sides of the needle head plates; when bending in place, the needle head plate and the two corresponding bending parts enclose together to form a hollow cylinder structure, and the contact protrusion is arranged on the end face of one end of the extending part, which is away from the connecting spring.
The integrated high-voltage resistant test probe provided by the utility model is characterized in that the needle head plate, the bending parts on two sides of the needle head plate and the contact protrusions on the bending parts on two sides of the needle head plate are integrally punched and formed.
The integrated high-voltage-resistant test probe comprises a probe body, wherein the bending parts positioned on two sides of the probe head plate are respectively provided with a contact protrusion, and when the integrated high-voltage-resistant test probe is assembled in place, the tail ends of two adjacent contact protrusions are bent in opposite directions and are fixedly welded.
The utility model discloses an integrated high-voltage resistant test probe, wherein the probe further comprises a holding assembly for holding the first connecting bridge and the second connecting bridge in fit.
The utility model discloses an integrated high-voltage-resistant test probe, wherein a holding assembly comprises a first arc-shaped limiting arm and a second arc-shaped limiting arm, the first arc-shaped limiting arm and the second arc-shaped limiting arm are oppositely arranged on two side walls of a first connecting bridge, the tail ends of the first arc-shaped limiting arm and the second arc-shaped limiting arm face the same side of the first connecting bridge, and a movable cavity for axially sliding the second connecting bridge is formed by the first arc-shaped limiting arm, the second arc-shaped limiting arm and a cavity between the first connecting bridge.
The integrated high-voltage-resistant test probe comprises a first arc-shaped limiting arm, a second arc-shaped limiting arm, a first connecting bridge, a second connecting bridge, a first connecting bridge and a second connecting bridge, wherein the first connecting bridge is connected with the first connecting bridge, the second connecting bridge is connected with the second connecting bridge, and the first connecting bridge is connected with the second connecting bridge.
The utility model discloses an integrated high-voltage-resistant test probe, wherein radial extension parts are arranged on two sides of one end, which is away from each other, of a first connecting bridge and a second connecting bridge, and clamping grooves for clamping connecting springs are formed in the extension parts.
The integrated high-pressure-resistant test probe provided by the utility model, wherein the bending section is positioned outside the connecting spring when the integrated high-pressure-resistant test probe is assembled in place.
The utility model has the beneficial effects that: during the test, through first connecting bridge and second connecting bridge axial slip laminating, and then can bear the weight of the heavy current and pass through, effectively prevent that connecting spring from being burnt out the condition and taking place, simultaneously, first syringe needle and first connecting bridge and second syringe needle and second connecting bridge are die-cut shaping respectively in an organic whole, but the greatly reduced processing degree of difficulty has guaranteed can further reduce manufacturing cost under the circumstances that does not lose the normal function of current probe, more is favorable to the enterprise to produce and makes.
Drawings
In order to more clearly illustrate the embodiments of the present utility model or the technical solutions in the prior art, the present utility model will be further described with reference to the accompanying drawings and embodiments, in which the drawings in the following description are only some embodiments of the present utility model, and other drawings may be obtained by those skilled in the art without inventive effort:
FIG. 1 is a top view of the overall structure of an integrated high pressure resistant test probe of the present utility model.
Fig. 2 is an enlarged view of a partial structure in fig. 1.
Fig. 3 is a side view of fig. 2.
Fig. 4 is an expanded schematic view of the integrated high pressure resistant test probe of the present utility model prior to bending.
FIG. 5 is a schematic diagram of the movable cavity structure of the integrated high pressure resistant test probe of the present utility model.
Detailed Description
The terms "first," "second," "third," and "fourth" and the like in the description and in the claims and drawings are used for distinguishing between different objects and not necessarily for describing a particular sequential or chronological order. Furthermore, the terms "comprise" and "have," as well as any variations thereof, are intended to cover a non-exclusive inclusion. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those listed steps or elements but may include other steps or elements not listed or inherent to such process, method, article, or apparatus.
Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment may be included in at least one embodiment of the utility model. The appearances of such phrases in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. Those of skill in the art will explicitly and implicitly appreciate that the embodiments described herein may be combined with other embodiments.
"plurality" means two or more. "and/or", describes an association relationship of an association object, and indicates that there may be three relationships, for example, a and/or B, and may indicate: a exists alone, A and B exist together, and B exists alone. The character "/" generally indicates that the context-dependent object is an "or" relationship.
Moreover, the terms "upper, lower, left, right, upper end, lower end, longitudinal" and the like that represent the orientation are all referred to with reference to the attitude position of the apparatus or device described in this scheme when in normal use.
In order to make the objects, technical solutions and advantages of the embodiments of the present utility model more apparent, the following description will be made in detail with reference to the technical solutions in the embodiments of the present utility model, and it is apparent that the described embodiments are some embodiments of the present utility model, but not all embodiments. All other embodiments, which can be made by a person skilled in the art without any inventive effort, are intended to be within the scope of the present utility model, based on the embodiments of the present utility model.
The integrated high pressure resistant test probe of the preferred embodiment of the utility model, as shown in fig. 1-5, comprises a first needle head 1 and a second needle head 2 which are axially arranged, and a connecting spring 3 coaxially arranged between the first needle head 1 and the second needle head 2; the probe also comprises a first connecting bridge 4 and a second connecting bridge 5 which are arranged in the connecting spring 3, wherein the widths of the first connecting bridge 4 and the second connecting bridge 5 are smaller than the diameter of the connecting spring 3, the first connecting bridge 4 and the second connecting bridge 5 axially joint and slide so as to ensure that current can pass in the process of telescoping the probe, the connecting spring 3 is prevented from being walked by the current, the bending sections 6 are arranged at the ends, deviating from the first connecting bridge 4 and the second connecting bridge 5, of the first connecting bridge 4 and the second connecting bridge 5, the bending sections 6 are bent along the radial direction of the connecting spring 3, the two bending sections 6 are respectively and eccentrically connected with the first needle head 1 and the second needle head 2, the elastic force which is propped against each other can be provided for the joint of the first connecting bridge 4 and the second connecting bridge 5 by the bending sections 6, and the joint of the first connecting bridge 4 and the second connecting bridge 5 can be kept constantly after the probe is used for a plurality of times; the first needle head 1 and the first connecting bridge 4 are integrally punched and formed, and the second needle head 2 and the second connecting bridge 5 are integrally punched and formed, so that the processing difficulty can be greatly reduced, the manufacturing cost can be further reduced under the condition that the normal function of the existing probe is not lost, and the manufacturing is more facilitated for enterprises; when assembling in place, the axle center of connecting spring 3 is located the laminating face of first connecting bridge 4 and second connecting bridge 5 to guarantee that the friction force that first connecting bridge 4 and second connecting bridge 5 received each other when laminating is slided is coaxial with connecting spring 3 and first syringe needle 1 and second syringe needle 2, prevents that the probe from taking place radial deformation in the test process.
Preferably, one end of the first needle head 1 and one end of the second needle head 2, which are away from each other, are provided with contact protrusions 7, and the end faces of the tail ends of the contact protrusions 7 are arc-shaped surfaces so as to be convenient for contact and conduction with copper rings on a detected plate, and the contact stability is ensured.
Preferably, the first needle head 1 and the second needle head 2 comprise a needle head plate 1a connected with the bending section 6 and bending parts 1b respectively arranged at two sides of the needle head plate 1 a; through bending two bending parts 1b in opposite directions, when bending is in place, the needle plate 1a and the two bending parts 1b corresponding to the needle plate 1a enclose together to form a hollow cylinder structure, the contact protrusions 7 are arranged on one end face of the extending part, which faces away from the connecting spring 3, specifically, the first connecting bridge 4, the needle plate 1a connected with the first connecting bridge 4, the bending parts 1b on two sides of the needle plate 1a, and the contact protrusions 7 arranged on the bending parts 1b on two sides of the needle plate 1a are integrally punched and formed through the same sheet metal part, the second connecting bridge 5, the needle plate 1a connected with the second connecting bridge 5, the bending parts 1b on two sides of the needle plate 1a, and the contact protrusions 7 arranged on the bending parts 1b on two sides of the needle plate 1a are integrally punched and formed through another sheet metal part, wherein when bending is assembled in place, the tail ends of two adjacent contact protrusions 7 are axially symmetrically cut and fixedly welded to form a conical structure, so that the bending structure is improved, the bending structure is designed, the manufacturing cost of the integrated structure is greatly reduced, and the manufacturing and the pipe fitting is realized.
Preferably, this probe still includes the retaining component 8 that keeps laminating with first connecting bridge 4 and second connecting bridge 5, specifically, retaining component 8 includes first arc spacing arm 81 and the spacing arm 82 of second arc, first arc spacing arm 81 and the spacing arm 82 of second arc set up relatively on the both sides wall of first connecting bridge 4, for further convenient shaping processing in proper order, two first arc spacing arms 81 and the spacing arm 82 of second arc are all in first connecting bridge 4 integrative die-cut shaping, the terminal of first arc spacing arm 81 and the spacing arm 82 of second arc is all towards the same side of first connecting bridge 4, the cavity between first arc spacing arm 81 and the spacing arm 82 of second arc and the first connecting bridge 4 forms the movable chamber 9 that supplies second connecting bridge 5 axial to slide jointly, when assembling in place, the terminal of first arc spacing arm 81 and the spacing arm 82 of second arc is supported the second connecting plate jointly on first connecting bridge 4, and then realize that first connecting bridge 4 and second connecting bridge 5 can slide the laminating all the time in the first connecting bridge 4, can effectively avoid first connecting bridge 4 to take place the bad contact condition with second connecting bridge 5 to separate.
Preferably, when assembling in place, the second connecting bridge 5 is propped against the first connecting bridge 4 by the tail ends of the first arc limiting arm 81 and the second arc limiting arm 82, and the opposite ends of the first arc limiting arm 81 and the second arc limiting arm 82 are provided with deformable elastic sections 10, so that the tightness degree of the axial sliding process of the first connecting bridge 4 and the second connecting bridge 5 is adjusted.
Preferably, radial extension parts 11 are arranged on two sides of one end, which is away from the second connection bridge 5, of the first connection bridge 4, and clamping grooves 12 for clamping the connection springs 3 are formed in the extension parts so as to facilitate quick assembly and disassembly of the connection springs 3.
Preferably, the bent section 6 is located outside the connecting spring 3 when assembled in place to facilitate the installation of the connecting spring 3.
It will be understood that modifications and variations will be apparent to those skilled in the art from the foregoing description, and it is intended that all such modifications and variations be included within the scope of the following claims.
Claims (10)
1. The integrated high-pressure-resistant test probe is characterized by comprising a first needle head and a second needle head which are axially arranged, and a connecting spring coaxially arranged between the first needle head and the second needle head; the probe is characterized by further comprising a first connecting bridge and a second connecting bridge which are arranged in the connecting spring, wherein the first connecting bridge and the second connecting bridge are axially and slidably attached, one end, which is away from each other, of the first connecting bridge and the second connecting bridge is provided with a bending section, the bending section is bent along the radial direction of the connecting spring, and the two bending sections are respectively and eccentrically connected with the first needle head and the second needle head; the first needle head and the first connecting bridge are integrally punched and formed, and the second needle head and the second connecting bridge are integrally punched and formed; when assembled in place, the axle center of the connecting spring is positioned in the joint surface of the first connecting bridge and the second connecting bridge.
2. The integrated high pressure resistant test probe according to claim 1, wherein the first needle and the second needle are provided with contact protrusions at the opposite ends, and the end faces of the contact protrusions are arc-shaped.
3. The integrated high pressure resistant test probe of claim 2, wherein the first needle and the second needle each comprise a needle plate connected with the bending section, and bending parts respectively arranged at two sides of the needle plate; when bending in place, the needle head plate and the two corresponding bending parts enclose together to form a hollow cylinder structure, and the contact bulge is arranged on the end face of one end of the extending part, which is away from the connecting spring.
4. The integrated high voltage tolerant test probe of claim 3 wherein said tip plate, said folds on both sides of said tip plate, and said contact bumps on said folds on both sides of said tip plate are integrally die cut.
5. The integrated high voltage resistant test probe according to claim 4, wherein one contact protrusion is provided on each of the bending portions on both sides of the tip plate, and when the probe is assembled in place, the ends of two adjacent contact protrusions are bent toward each other and fixedly welded.
6. The integrated high voltage tolerant test probe of claim 1 further comprising a retaining assembly that retains said first connection bridge and said second connection bridge in place.
7. The integrated high voltage resistant test probe according to claim 6, wherein the holding assembly comprises a first arc-shaped limiting arm and a second arc-shaped limiting arm, the first arc-shaped limiting arm and the second arc-shaped limiting arm are oppositely arranged on two side walls of the first connecting bridge, the tail ends of the first arc-shaped limiting arm and the second arc-shaped limiting arm face the same side of the first connecting bridge, and a movable cavity for axially sliding the second connecting bridge is formed by the first arc-shaped limiting arm, the second arc-shaped limiting arm and the cavity between the first connecting bridge.
8. The integrated high voltage tolerant test probe of claim 7 wherein when assembled in place, the ends of said first and second arcuate stop arms abut a second connecting bridge against said first connecting bridge, the opposite ends of said first and second arcuate stop arms each having a deformable resilient section.
9. The integrated high-voltage resistant test probe according to claim 1, wherein radial extension parts are arranged on two sides of one end, which is away from the first connecting bridge, of the second connecting bridge, and clamping grooves for clamping the connecting springs are formed in the extension parts.
10. The integrated high pressure resistant test probe of claim 9, wherein the bent section is located outside the connecting spring when assembled in place.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321360238.6U CN220064188U (en) | 2023-05-31 | 2023-05-31 | Integrated high-pressure-resistant test probe |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321360238.6U CN220064188U (en) | 2023-05-31 | 2023-05-31 | Integrated high-pressure-resistant test probe |
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| Publication Number | Publication Date |
|---|---|
| CN220064188U true CN220064188U (en) | 2023-11-21 |
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| CN202321360238.6U Active CN220064188U (en) | 2023-05-31 | 2023-05-31 | Integrated high-pressure-resistant test probe |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN118209762A (en) * | 2024-05-21 | 2024-06-18 | 四川斯艾普电子科技有限公司 | Slide type high-power microwave module testing device and method |
-
2023
- 2023-05-31 CN CN202321360238.6U patent/CN220064188U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN118209762A (en) * | 2024-05-21 | 2024-06-18 | 四川斯艾普电子科技有限公司 | Slide type high-power microwave module testing device and method |
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