CN219247476U - Bidirectional clamp protection circuit and ATE equipment - Google Patents
Bidirectional clamp protection circuit and ATE equipment Download PDFInfo
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- CN219247476U CN219247476U CN202223613473.8U CN202223613473U CN219247476U CN 219247476 U CN219247476 U CN 219247476U CN 202223613473 U CN202223613473 U CN 202223613473U CN 219247476 U CN219247476 U CN 219247476U
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Abstract
The utility model provides a bidirectional clamping protection circuit and ATE equipment, and relates to the technical field of automatic test equipment. The bidirectional clamp protection circuit includes: the device comprises a main control unit, a clamp setting unit, a clamp unit and a discharge unit; the clamping setting unit is used for receiving the control of the main control unit and configuring a corresponding clamping voltage threshold value for the clamping unit; the clamping unit comprises a forward clamping module and a reverse clamping module, wherein the forward clamping module and the reverse clamping module are respectively used for detecting the power supply voltage output by the power supply unit and/or the power supply voltage received by the tested unit, and when any one power supply voltage reaches a corresponding clamping voltage threshold value, the discharging unit is informed of current discharge; and the discharging unit is used for discharging until the current reaches a saturated state, so that the power supply voltage between the power supply unit and the tested unit is clamped to the clamping voltage threshold value. The utility model solves the problems that the related technology can not realize large current clamping and the clamping voltage is fixed.
Description
Technical Field
The utility model relates to the technical field of automatic test equipment, in particular to a bidirectional clamping protection circuit and ATE equipment.
Background
In semiconductor automated test equipment (ATE equipment), a test board typically leads out many test channels to connect with external chips under test. These channels are generally directly from the pin output of the test chip on the test board of the ATE equipment, and because the external tested chip is tested with points, the quality is unknown, if the voltage on the tested pin is uncertain or is in misoperation, it is possible that an abnormal voltage is applied to the test channel, and the abnormal voltage exceeds the maximum rated withstand voltage range of the test channel on the board, and at this time, protection clamping is not performed, so that it is very likely that breakdown of the pin of the test chip on the board is generated, and the tested equipment is damaged.
However, most of the prior art uses diodes as clamping circuits, the current that can be clamped is small, generally in milliamp level, the clamping voltage is fixed, the clamping voltage cannot be flexibly set, the use requirement of semiconductor automatic test equipment cannot be met, the current source is used for adding current to perform a test, which is called an added current (Forcecurrent) test mode, namely an FI measurement mode, and the existing clampable circuit cannot support the FI measurement mode which can be flexibly matched.
Therefore, there is an urgent need for a bidirectional clamp protection circuit capable of implementing high current clamp and with a settable clamp voltage.
Disclosure of Invention
The utility model provides a bidirectional clamping protection circuit and ATE equipment, which can solve the problems that large-current clamping cannot be realized and clamping voltage is fixed in the related technology. The technical scheme is as follows:
according to an aspect of an embodiment of the present utility model, a bidirectional clamp protection circuit connected between a power supply unit and a unit under test, the circuit includes: a main control unit; the clamping setting unit is connected with the main control unit and used for receiving the control of the main control unit and configuring a corresponding clamping voltage threshold value for the clamping unit; the clamping unit is connected with the clamping setting unit and comprises a forward clamping module and a reverse clamping module, wherein the forward clamping module and the reverse clamping module are used for respectively detecting the power supply voltage output by the power supply unit and/or the power supply voltage received by the tested unit, and notifying the discharging unit to carry out current discharge when any one power supply voltage reaches a corresponding clamping voltage threshold value; and the discharging unit is connected between the power supply unit and the tested unit, and is used for discharging the current output by the power supply unit or the current received by the tested unit until the current reaches a saturated state, so that the power supply voltage between the power supply unit and the tested unit is clamped to the clamping voltage threshold value.
Optionally, the range of the clamp voltage threshold configured by the clamp setting unit is-15V to +15v.
Optionally, the clamping unit further includes: a level jump module for controlling corresponding pins in the clamping unit to jump from a first level to a second level and outputting a level jump signal to the discharging unit so that the discharging unit responds to the level jump signal to carry out current leakage; the level jump module is respectively connected with the forward clamping module and the reverse clamping module.
Optionally, the discharge unit includes: when the clamping unit detects that any one power supply voltage reaches a corresponding clamping voltage threshold, the current output by the power supply unit or the current received by the tested unit is discharged, so that the current reaches a saturated state; the discharging module is connected with the clamping unit.
Optionally, the discharge unit further includes: generating a control signal when receiving a level jump signal output by a level jump module, and outputting the control signal to a control module of the discharging module; the control module is connected with the discharging module.
Optionally, the discharge unit further includes: the adjusting module is used for receiving the control of the main control unit and adjusting the switching frequency of the discharging module so as to adjust the discharging speed of the discharging module; the adjusting module is connected with the discharging module.
Optionally, the discharge cell has an adjustable discharge rate in the range of 0 to 500KHz.
Optionally, the regulation module comprises a PWM circuit.
Optionally, the circuit supports a current-up test mode.
According to one aspect of an embodiment of the utility model, an ATE device includes a bi-directional clamp protection circuit as described above.
The technical scheme provided by the utility model has the beneficial effects that:
the utility model provides a bidirectional clamping protection circuit, which realizes flexible configuration of clamping voltage by configuring a corresponding clamping voltage threshold value for a clamping unit through a clamping setting unit, can meet the use requirement of semiconductor automatic test equipment, realizes release of large current through a discharging unit, supports a large-current FI measurement mode, and solves the problems that large-current clamping cannot be realized and clamping voltage is fixed in the related art.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the utility model as claimed.
Drawings
In order to more clearly illustrate the technical solutions of the present utility model, the drawings that are required to be used in the description of the present utility model will be briefly described.
FIG. 1 is a schematic diagram of a clamp circuit with clamp diodes according to an exemplary embodiment;
FIG. 2 is a schematic diagram illustrating a bi-directional clamp protection circuit in accordance with an exemplary embodiment;
fig. 3 is a circuit diagram of an application scenario according to the corresponding embodiment of fig. 2;
fig. 4 is a flowchart of the embodiment corresponding to fig. 2 in the application scenario corresponding to fig. 3.
There has been shown in the drawings, and will hereinafter be described, specific embodiments of the utility model with the understanding that the present disclosure is to be considered in all respects as illustrative, and not restrictive, the scope of the inventive concepts being indicated by the appended claims.
Detailed Description
Embodiments of the present utility model are described in detail below, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to like or similar elements or elements having like or similar functions throughout. The embodiments described below by referring to the drawings are illustrative only and are not to be construed as limiting the utility model.
As used herein, the singular forms "a", "an", "the" and "the" are intended to include the plural forms as well, unless expressly stated otherwise, as understood by those skilled in the art. It will be further understood that the terms "comprises" and/or "comprising," when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof. It will be understood that when an element is referred to as being "connected" or "coupled" to another element, it can be directly connected or coupled to the other element or intervening elements may also be present. Further, "connected" or "coupled" as used herein may include wirelessly connected or wirelessly coupled. The term "and/or" as used herein includes all or any element and all combination of one or more of the associated listed items.
As described above, the prior art cannot implement heavy current clamping, the clamping voltage is fixed, for example, the prior art uses the clamping diode to make the clamping circuit, the clampable current is small and is in milliamp level, the FI measurement mode of heavy current is not supported, and the clamping voltage is fixed and not settable, so that the use requirement of the semiconductor automatic test equipment cannot be met.
Specifically, fig. 1 provides a schematic circuit diagram of a clamp circuit using a clamp diode. The clamping circuit in the figure consists of two diodes which are connected in series in opposite directions, one diode can be opened at a time, the other diode is in a closed state, the forward voltage drop and the reverse voltage drop of the circuit are clamped to the forward conduction of the diode, the voltage drop is lower than a certain threshold value, and the circuit is protected.
As described above, the related art still has the defect that the high current clamp cannot be realized and the clamp voltage is fixed.
Therefore, the bidirectional clamping protection circuit provided by the utility model can realize large-current clamping, clamping voltage can be flexibly set, and accordingly, the circuit is suitable for a large-current FI measurement mode and can meet the use requirement of the automatic semiconductor test equipment ATE.
For the purpose of making the objects, technical solutions and advantages of the present utility model more apparent, the embodiments of the present utility model will be described in further detail with reference to the accompanying drawings.
Referring to fig. 2, an embodiment of the present utility model provides a schematic structure diagram of a bidirectional clamp protection circuit. The bi-directional clamp protection circuit 300 is connected between a power supply unit and a unit under test, and the bi-directional clamp protection circuit 300 includes a main control unit 310, a clamp setting unit 330, a clamp unit 350, and a discharge unit 370.
The clamping unit 350 includes a forward clamping module 351, a reverse clamping module 353, and a level jump module 357, and the discharging unit 370 includes a discharging module 371, a control module 373, and an adjusting module 375.
Specifically, the main control unit 310 is configured to control the clamp setting unit 330 to configure a responsive clamp voltage threshold for the clamp unit, and to control the adjustment module 375 to adjust the discharge speed of the discharge module 371. Wherein, the range of the clamping voltage threshold is-15V to +15V, and the discharge speed is 0 to 500KHz.
The clamp setting unit 330 is connected to the main control unit 310, and is configured to accept control of the main control unit 310 to configure a corresponding clamp voltage threshold for the clamp unit 350. In one possible implementation, the clamp voltage thresholds configured by the forward clamp module 351 and the reverse clamp module 353 are-15V to +15v, respectively.
The forward clamping module 351 and the reverse clamping module 353 in the clamping unit 350 are connected to the clamping setting unit 330, and are respectively configured to detect a power supply voltage output by the power supply unit and/or a power supply voltage received by the unit under test, and notify the discharging unit 370 to perform current discharging when any one of the power supply voltages reaches a corresponding clamping voltage threshold.
The discharging unit 370 is connected between the power supply unit and the unit under test, and is configured to discharge the current output by the power supply unit or the current received by the unit under test until the current reaches a saturated state, so that the power supply voltage between the power supply unit and the unit under test is clamped to a clamping voltage threshold.
The discharging unit 370 performs a current discharging process, which specifically includes: when the clamping unit 350 detects that any one of the power supply voltages reaches the corresponding clamping voltage threshold, the corresponding pin in the clamping unit 350 is controlled to jump from the first level to the second level and generate a level jump signal, the level jump module 357 outputs the level jump signal to the control module 373 in the discharging unit 370, and the control module 373 is configured to generate a control signal when receiving the level jump signal and output the control signal to the discharging module 371 in the discharging unit 370, so that the discharging module 371 starts current discharging in response to the control signal. The adjusting module 375 in the discharging unit 370 is configured to receive control of the main control unit 310 to adjust the switching frequency of the discharging module 371, thereby adjusting the discharging speed of the discharging module 371, and achieving the purpose of dynamic balance. It should be noted that the level forms of the first level and the second level are not particularly limited herein, for example, the first level may refer to a low level, and the second level may be a high level.
The control module 373 may be an or gate control circuit, the adjustment module 375 may be a PWM circuit, the clamp setting unit 330 may be a digital-to-analog converter DAC, the main control unit may be a micro control unit MCU, the unit under test refers to a chip under test, for example, in a wafer test CP stage, the unit under test refers to a wafer, in a final test FT stage, the unit under test refers to a packaged chip, which is not specifically limited herein.
Through the circuit, on the premise of realizing bidirectional clamping, the clamping voltage threshold can be dynamically adjusted, the requirement of dynamic adjustment is met, and the purpose of clamping large current is achieved by discharging current through the large current discharging module.
Referring to fig. 3, an embodiment of the present utility model provides a circuit diagram of an application scenario of a bidirectional clamp protection circuit. In this application scenario, the bi-directional clamp protection circuit is deployed in an electronic device, which may be an integrated circuit/semiconductor automated test device ATE (Automatic Test Equipment), or the like. That is, in an exemplary embodiment, the ATE device includes a bi-directional clamp protection circuit as described above.
A bidirectional clamp protection circuit is connected between the power supply unit 510 and the device under test 520, and includes a main control unit 530, a clamp setting unit 540, a clamp unit, and a discharge unit; the clamping unit further includes a forward clamping module 551, a reverse clamping module 553, and a level skip module 557; the discharge unit further includes a control module 571, a discharge module 573, and a regulation module 575.
The main control unit 530 includes two output terminals, one output terminal is connected to the input terminal of the clamp setting unit 540, and is used for controlling the clamp setting unit 540 to configure the clamp voltage threshold; the other output end is connected with the input end of the adjusting module 575 and is used for controlling the adjusting module 575 to adjust the discharging speed of the discharging module 573.
The clamp setting unit 540 further includes two output terminals, one output terminal is connected to the input terminal of the forward clamp module 551, and is configured to accept the control of the main control unit 530 to configure the corresponding clamp voltage threshold of the forward clamp module 551; similarly, the other output terminal is connected to the input terminal of the reverse clamping module 553, and is configured to receive the control of the main control unit 530 to configure the corresponding clamping voltage threshold of the reverse clamping module 553.
The forward clamping module 551 and the reverse clamping module 553 each further include an output end respectively connected to the first input end and the second input end of the level jump module 557, through which the level jump module 557 is notified to perform level jump when detecting that the power supply voltage output by the power supply unit 510 and/or the power supply voltage received by the tested unit 520 reaches the corresponding clamping voltage threshold.
The level jump module 557 further includes an output terminal connected to the input terminal of the control module 557, and when the clamping unit detects that any one of the power voltages reaches the corresponding clamping voltage threshold, the corresponding pin in the clamping unit is controlled to jump from the first level to the second level, and the level jump signal is output to the control module 557 through the output terminal.
The control module 557 further includes an output terminal connected to the first input terminal of the discharging module 573, and generates a control signal when receiving the level jump signal output by the level jump module 557, and outputs the control signal to the discharging module 573 through the output terminal.
The discharging module 573 further includes a second input terminal connected between the power supply unit 510 and the unit under test 520, and discharges the current output by the power supply unit 510 or the current received by the unit under test 520 until the current reaches a saturated state.
Specifically, the main control unit 530 controls the clamp setting unit 540 to configure a clamp voltage threshold, the forward clamp module 551 and the reverse clamp module 553 are respectively configured to detect a power supply voltage output by the power supply unit 510 and/or a power supply voltage received by the unit under test 520, when any one of the power supply voltages reaches the corresponding clamp voltage threshold, a corresponding pin in the clamp unit is controlled to jump from a first level to a second level, and a level jump signal is generated by the level jump module 557, the level jump module 557 is configured to output the level jump signal to the control module 571, the control module 571 is configured to receive the level jump signal and generate the control signal and output the control signal to the discharge module 573, the discharge module 573 discharges a current output by the power supply unit 510 or a current received by the unit under test 520 until the current reaches a saturated state, so that the power supply voltage between the power supply unit 510 and the unit under test 520 is clamped to the clamp voltage threshold, and the control module 573 is configured to receive control of the main control unit 530 to adjust a switching frequency of the discharge module 573, thereby adjusting a discharge speed. Wherein data is transmitted between each unit and the circuit through signals.
Referring to fig. 4, an embodiment of the present utility model provides a flowchart of a bidirectional clamp protection circuit in an application scenario. The method comprises the following steps:
In step 720, the power supply voltage is bi-directionally detected by the forward clamping module and the reverse clamping module.
The bidirectional detection refers to detecting the power supply voltage output by the power supply unit or the power supply voltage received by the tested unit.
Specifically, when any one power supply voltage reaches a corresponding clamping voltage threshold, the level jump module is informed to control corresponding pins in the clamping unit to carry out level jump, and then a level jump signal is output.
In step 740, the level jump module outputs a level jump signal to the control module.
Specifically, the control module generates a control signal when receiving the level jump signal output by the level jump module, and outputs the control signal to the discharge module.
In step 750, the control signal controls the discharge module to start current discharge.
Specifically, for the discharging module, if a control signal output by the control signal is received, the current output by the power supply unit or the current received by the unit under test is discharged until the current reaches a saturated state, so that the power supply voltage between the power supply unit and the unit under test is clamped to a clamping voltage threshold.
In step 760, the main control unit controls the adjustment module to adjust the discharge speed of the discharge module.
Through the process, the high-current clamp is realized, the support circuit is normally used in a high-current FI measurement mode, the bidirectional clamp is realized, the current filling and current drawing are supported, the clamp voltage is settable, the requirements of different equipment and scenes are met, and the discharge speed is adjustable.
Compared with the related art, the bidirectional clamp protection circuit realizes that the large current clamp (1A-2A) and the clamp voltage can be set (-15V to +15V), and meets the requirements of various scenes and equipment.
It should be understood that, although the steps in the flowcharts of the figures are shown in order as indicated by the arrows, these steps are not necessarily performed in order as indicated by the arrows. The steps are not strictly limited in order and may be performed in other orders, unless explicitly stated herein. Moreover, at least some of the steps in the flowcharts of the figures may include a plurality of sub-steps or stages that are not necessarily performed at the same time, but may be performed at different times, the order of their execution not necessarily being sequential, but may be performed in turn or alternately with other steps or at least a portion of the other steps or stages.
The foregoing is only a partial embodiment of the present utility model, and it should be noted that it will be apparent to those skilled in the art that modifications and adaptations can be made without departing from the principles of the present utility model, and such modifications and adaptations are intended to be comprehended within the scope of the present utility model.
Claims (10)
1. A bi-directional clamp protection circuit connected between a power supply unit and a unit under test, the circuit comprising:
a main control unit;
the clamping setting unit is connected with the main control unit and used for receiving the control of the main control unit and configuring a corresponding clamping voltage threshold value for the clamping unit;
the clamping unit is connected with the clamping setting unit and comprises a forward clamping module and a reverse clamping module, wherein the forward clamping module and the reverse clamping module are used for respectively detecting the power supply voltage output by the power supply unit and/or the power supply voltage received by the tested unit, and notifying the discharging unit to carry out current discharge when any one power supply voltage reaches a corresponding clamping voltage threshold value;
and the discharging unit is connected between the power supply unit and the tested unit, and is used for discharging the current output by the power supply unit or the current received by the tested unit until the current reaches a saturated state, so that the power supply voltage between the power supply unit and the tested unit is clamped to the clamping voltage threshold value.
2. The bidirectional clamp protection circuit of claim 1, wherein the clamp setting unit configures the range of clamp voltage thresholds to be-15V to +15v.
3. The bi-directional clamp protection circuit of claim 1, wherein said clamp unit further comprises:
a level jump module for controlling corresponding pins in the clamping unit to jump from a first level to a second level and outputting a level jump signal to the discharging unit so that the discharging unit responds to the level jump signal to carry out current leakage;
the level jump module is respectively connected with the forward clamping module and the reverse clamping module.
4. The bi-directional clamp protection circuit of claim 1, wherein said discharge cell comprises:
when the clamping unit detects that any one power supply voltage reaches a corresponding clamping voltage threshold, the current output by the power supply unit or the current received by the tested unit is discharged, so that the current reaches a saturated state;
the discharging module is connected with the clamping unit.
5. The bi-directional clamp protection circuit of claim 4, wherein said discharge cell further comprises:
generating a control signal when receiving a level jump signal output by a level jump module, and outputting the control signal to a control module of the discharging module;
the control module is connected with the discharging module.
6. The bi-directional clamp protection circuit of claim 4, wherein said discharge cell further comprises:
the adjusting module is used for receiving the control of the main control unit and adjusting the switching frequency of the discharging module so as to adjust the discharging speed of the discharging module;
the adjusting module is connected with the discharging module.
7. The bi-directional clamp protection circuit of claim 6, wherein said discharge cell has an adjustable discharge rate in the range of 0 to 500KHz.
8. The bi-directional clamp protection circuit of claim 6, wherein said regulation module comprises a pulse width modulation PWM circuit.
9. A circuit as claimed in any one of claims 1 to 8, wherein the circuit supports a current-up test mode.
10. An ATE device comprising the bi-directional clamp protection circuit of any one of claims 1 to 9.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223613473.8U CN219247476U (en) | 2022-12-30 | 2022-12-30 | Bidirectional clamp protection circuit and ATE equipment |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202223613473.8U CN219247476U (en) | 2022-12-30 | 2022-12-30 | Bidirectional clamp protection circuit and ATE equipment |
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| Publication Number | Publication Date |
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| CN219247476U true CN219247476U (en) | 2023-06-23 |
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| CN202223613473.8U Active CN219247476U (en) | 2022-12-30 | 2022-12-30 | Bidirectional clamp protection circuit and ATE equipment |
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- 2022-12-30 CN CN202223613473.8U patent/CN219247476U/en active Active
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