CN218647306U - Focusing and leveling device and photoetching equipment - Google Patents
Focusing and leveling device and photoetching equipment Download PDFInfo
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Abstract
本实用新型涉及半导体技术领域,提供了一种调焦调平装置及光刻设备,所述调焦调平装置包括:基座、调节组件和锁紧件;所述调节组件可沿第一方向移动的设置于所述基座上,所述调节组件包括一支撑平面,所述支撑平面可转动调节方位以适形与所述主基板贴合;所述锁紧件包括一锁紧曲面,所述锁紧曲面用于与所述主基板点接触,并沿所述第一方向将所述主基板压于所述支撑平面上。如此配置,在锁紧时主基板不会存在装配应力,提升调焦调平的稳定性,在满足集成电路工艺中对调焦调平越来越高的调整精度要求的同时,也改善了调整过程中存在装配应力导致的焦面漂移或者反复调整的现象。
The utility model relates to the technical field of semiconductors, and provides a focusing and leveling device and photolithographic equipment. The focusing and leveling device includes: a base, an adjusting component and a locking piece; the adjusting component can be moved along a first direction It is movable and arranged on the base, the adjustment component includes a support plane, and the support plane can be rotated to adjust its orientation to conform to the main substrate; the locking member includes a locking curved surface, so that The locking curved surface is used for point contact with the main substrate, and presses the main substrate on the supporting plane along the first direction. With such a configuration, there will be no assembly stress on the main substrate during locking, which improves the stability of focusing and leveling. While meeting the increasingly higher adjustment accuracy requirements for focusing and leveling in integrated circuit technology, it also improves the adjustment During the process, there is a phenomenon of focal plane drift or repeated adjustment caused by assembly stress.
Description
技术领域technical field
本实用新型涉及半导体技术领域,特别涉及一种调焦调平装置及光刻设备。The utility model relates to the technical field of semiconductors, in particular to a focusing and leveling device and photoetching equipment.
背景技术Background technique
调焦调平传感器广泛的应用在半导体加工工艺中,例如在超大集成电路制造的投影光刻技术中,通常使用调焦调平传感器减少硅片表面形貌对投影物镜焦平面的影响,以保证光刻效果。Focusing and leveling sensors are widely used in semiconductor processing technology. For example, in the projection lithography technology of VLSI manufacturing, focusing and leveling sensors are usually used to reduce the influence of the surface topography of the silicon wafer on the focal plane of the projection objective lens to ensure Photolithography effect.
现有技术中,调焦调平传感器通常安装在承载投影物镜的主基板下面,为保证调焦调平传感器的焦面和投影物镜焦面的重合度,需要通过调焦调平装置调节主基板的方位。In the prior art, the focusing and leveling sensor is usually installed under the main substrate carrying the projection objective lens. In order to ensure the coincidence of the focal plane of the focusing and leveling sensor with the focal plane of the projection objective lens, it is necessary to adjust the main substrate through the focusing and leveling device. orientation.
现有的调节方式通常是通过螺纹副调整机构调节主基板的方位,其主要有两种方式,一种为差分调整机构,另一种为单螺纹调整机构。其中,差分调整机构在调整完成后只能靠调焦调平主基板自身重力自然支撑在辅助连接机构上,会导致垂向无法锁紧,该种方案在调焦调平稳定性要求不高时尚可使用,无法满足集成电路工艺中对调焦调平越来越高的调整精度要求;单螺纹调整机构通过螺纹调整主基板的垂向位置,且通过螺母对主基板实现垂向锁紧,调整完成后螺母压紧在主基板上,而主基板的平面与整机框架面间不可能做到绝对平行,故在使用螺母锁紧时,由于螺母的锁紧面与主基板的平面之间存在一定夹角,调整机构与主基板连接处存在装配应力,导致在使用过程中出现焦面漂移现象。而且当夹角足够大时,导致锁紧时焦面变化,致使焦面调整工作反复,影响工作效率。The existing adjustment method is usually to adjust the orientation of the main substrate through a threaded auxiliary adjustment mechanism. There are two main methods, one is a differential adjustment mechanism, and the other is a single thread adjustment mechanism. Among them, after the adjustment is completed, the differential adjustment mechanism can only be naturally supported on the auxiliary connection mechanism by the gravity of the main substrate for focusing and leveling, which will cause the vertical lock to fail. It can be used, but cannot meet the increasingly higher adjustment accuracy requirements for focusing and leveling in integrated circuit technology; the single-thread adjustment mechanism adjusts the vertical position of the main substrate through threads, and realizes vertical locking of the main substrate through nuts, adjusting After the completion, the nut is pressed on the main base plate, and the plane of the main base plate and the frame surface of the whole machine cannot be absolutely parallel, so when the nut is used for locking, due to the existence of At a certain included angle, assembly stress exists at the connection between the adjustment mechanism and the main substrate, resulting in focal plane drift during use. Moreover, when the included angle is large enough, the focal plane changes during locking, resulting in repeated adjustment of the focal plane, which affects work efficiency.
因此,亟需一种调焦调平装置及光刻设备,以保证在满足调焦调平精度要求的同时,改善调整过程中存在装配应力导致的焦面漂移或者反复调整的现象。Therefore, there is an urgent need for a focusing and leveling device and lithographic equipment to ensure that while meeting the requirements of focusing and leveling precision, it can improve the phenomenon of focal plane drift or repeated adjustment caused by assembly stress during the adjustment process.
实用新型内容Utility model content
实用新型提供了一种调焦调平装置及光刻设备,该调焦调平装置通过可适形与主基板贴合支撑的支撑平面以及与主基板点接触的锁紧曲面的配合实现对主基板的调平调焦,在满足集成电路工艺中对调焦调平越来越高的调整精度要求的同时,也改善了调整过程中存在装配应力导致的焦面漂移或者反复调整的现象。The utility model provides a focusing and leveling device and a lithographic equipment. The focusing and leveling device realizes the alignment of the main substrate through the cooperation of a support plane conformable to the main substrate and a locking curved surface in point contact with the main substrate. The leveling and focusing of the substrate not only meets the increasingly higher adjustment accuracy requirements for focusing and leveling in the integrated circuit process, but also improves the phenomenon of focal plane drift or repeated adjustment caused by assembly stress during the adjustment process.
所述调焦调平装置包括:基座、调节组件和锁紧件;The focusing and leveling device includes: a base, an adjusting assembly and a locking member;
所述调节组件可沿第一方向移动的设置于所述基座上,所述调节组件包括一支撑平面,所述支撑平面用于支撑于主基板上,所述支撑平面可转动调节方位以适形与所述主基板贴合;The adjustment assembly is arranged on the base movable along the first direction, the adjustment assembly includes a support plane, the support plane is used to be supported on the main substrate, and the support plane can be rotatably adjusted to suit The shape is attached to the main substrate;
所述锁紧件可沿第一方向移动的设置于所述基座上,所述锁紧件包括一锁紧曲面,所述锁紧曲面用于与所述主基板点接触,并沿所述第一方向将所述主基板压于所述支撑平面上。The locking member is arranged on the base movable along the first direction, and the locking member includes a locking curved surface, the locking curved surface is used for point contact with the main substrate, and along the The first direction presses the main substrate on the support plane.
可选地,所述锁紧件还包括锁紧轴,所述锁紧轴的轴线沿所述第一方向延伸,所述锁紧曲面设置于所述锁紧轴的一端。Optionally, the locking member further includes a locking shaft, the axis of the locking shaft extends along the first direction, and the locking curved surface is arranged at one end of the locking shaft.
可选地,所述锁紧轴与所述基座螺纹配合。Optionally, the locking shaft is threadedly engaged with the base.
可选地,所述调节组件包括调节主体和支撑件,所述支撑件可沿第一方向移动的设置于所述调节主体上,所述支撑平面设置于所述支撑件上。Optionally, the adjustment assembly includes an adjustment main body and a support member, the support member is provided on the adjustment main body so as to be movable along a first direction, and the support plane is provided on the support member.
可选地,所述调节主体沿第一方向移动的设置于所述基座上。Optionally, the adjusting body is disposed on the base so as to move along the first direction.
可选地,所述调节组件还包括定位件,所述定位件设置于所述调节主体和/或所述基座上用于锁定所述调节主体相对所述基座沿所述第一方向的位置。Optionally, the adjusting assembly further includes a locating piece, the locating piece is arranged on the adjusting main body and/or the base for locking the adjusting main body relative to the base along the first direction. Location.
可选地,所述调节主体为轴状结构,所述调节主体的轴线沿第一方向延伸,所述调节主体与所述基座螺纹配合。Optionally, the adjustment body is a shaft-shaped structure, the axis of the adjustment body extends along the first direction, and the adjustment body is screwed into the base.
可选地,所述调节组件还包括调节件,所述支撑件可沿所述调节主体的轴向滑动的外套于所述调节主体上,所述调节件与所述调节主体螺纹配合用于调节所述支撑件沿第一方向的位置。Optionally, the adjustment assembly further includes an adjustment member, the support member is slidable along the axial direction of the adjustment main body and is overlaid on the adjustment main body, and the adjustment member is threadedly engaged with the adjustment main body for adjusting The position of the support along the first direction.
可选地,所述支撑件包括第一支撑件和第二支撑件,所述第一支撑件沿第一方向可移动的设置于所述调节主体上,所述第二支撑件与所述第一支撑件万向转动配合,所述支撑平面设置于所述第二支撑件上。Optionally, the support includes a first support and a second support, the first support is movably arranged on the adjustment main body along the first direction, the second support and the first support A support member is universally rotatable, and the support plane is arranged on the second support member.
本实用新型还提供了一种光刻设备,所述光刻设备安装有由上述所述的调焦调平装置。The utility model also provides a lithography equipment, which is equipped with the above-mentioned focusing and leveling device.
综上所述,所述调焦调平装置包括:基座、调节组件和锁紧件;所述调节组件可沿第一方向移动的设置于所述基座上,所述调节组件包括一支撑平面,所述支撑平面用于支撑于主基板上,所述支撑平面可转动调节方位以适形与所述主基板贴合;所述锁紧件可沿第一方向移动的设置于所述基座上,所述锁紧件包括一锁紧曲面,所述锁紧曲面用于与所述主基板点接触,并沿所述第一方向将所述主基板压于所述支撑平面上。In summary, the focusing and leveling device includes: a base, an adjustment assembly and a locking member; the adjustment assembly is arranged on the base so that it can move along a first direction, and the adjustment assembly includes a support plane, the support plane is used to be supported on the main substrate, and the orientation of the support plane can be rotatable and adjusted so as to conform to the main substrate; On the seat, the locking member includes a locking curved surface, the locking curved surface is used for point contact with the main substrate, and presses the main substrate on the supporting plane along the first direction.
如此配置,支撑平面可转动调节方位与所述主基板适形紧密贴合,支撑平面与主基板之间不会存在夹角;支撑平面的转动调节可实现对主基板以绕X轴和Y轴的转动自由度的调整,其中X轴、Y轴以及第一方向两两分别垂直;另外,支撑平面可随着调节组件沿着第一方向运动,进而可调节主基板沿第一方向的自由度,综合可实现主基板的柔性调整。另外支撑平面配合锁紧曲面实现对主基板沿第一方向锁紧,锁紧曲面与主基板在点接触,在锁紧时主基板不会存在装配应力,提升调焦调平的稳定性,在满足集成电路工艺中对调焦调平越来越高的调整精度要求的同时,也改善了调整过程中存在装配应力导致的焦面漂移或者反复调整的现象,缩短了调焦调平的检测时间,提高调节效率,进而提高产品的产率。With such a configuration, the support plane can be rotatably adjusted to conform to the shape of the main substrate, and there will be no angle between the support plane and the main substrate; the rotation and adjustment of the support plane can realize the rotation of the main substrate around the X-axis and the Y-axis The adjustment of the degree of freedom of rotation, wherein the X-axis, Y-axis and the first direction are perpendicular to each other; in addition, the support plane can move along the first direction with the adjustment component, and then the degree of freedom of the main substrate along the first direction can be adjusted , and comprehensively realize the flexible adjustment of the main substrate. In addition, the support plane cooperates with the locking curved surface to lock the main substrate along the first direction. The locking curved surface is in point contact with the main substrate. When locking, there will be no assembly stress on the main substrate, which improves the stability of focusing and leveling. While meeting the higher and higher adjustment accuracy requirements for focusing and leveling in the integrated circuit process, it also improves the phenomenon of focal plane drift or repeated adjustment caused by assembly stress during the adjustment process, and shortens the detection time for focusing and leveling , improve the adjustment efficiency, and then increase the product yield.
附图说明Description of drawings
图1为现有的调焦调平装置的结构示意图1;Fig. 1 is the structural representation 1 of existing focusing and leveling device;
图2为现有的调焦调平装置的结构示意图2;Fig. 2 is the structural representation 2 of existing focusing and leveling device;
图3为本实用新型的实施例一的调焦调平装置的结构示意图;Fig. 3 is a schematic structural view of the focusing and leveling device of Embodiment 1 of the present invention;
图4为本实用新型的实施例一的调焦调平装置的应用结构示意图;Fig. 4 is a schematic diagram of the application structure of the focusing and leveling device of Embodiment 1 of the present utility model;
图5为本实用新型的实施例二的调焦调平装置的结构示意图;Fig. 5 is a schematic structural diagram of the focusing and leveling device of the second embodiment of the present invention;
图6为本实用新型的实施例二的调焦调平装置的应用结构示意图;Fig. 6 is a schematic diagram of the application structure of the focusing and leveling device of the second embodiment of the present invention;
其中,附图标记如下:Wherein, the reference signs are as follows:
10-基座;10 - base;
20-调节组件;21-调节主体;22-支撑件;221-第一支撑件;222-第二支撑件;223-外圈;23-调节件;24-定位件;25-支撑平面;26-衬套;20-adjustment assembly; 21-adjustment body; 22-support; 221-first support; 222-second support; 223-outer ring; 23-adjustment; 24-positioning; 25-support plane; 26 -bushing;
30-锁紧件;31-锁紧曲面;32-锁紧轴;30-locking piece; 31-locking curved surface; 32-locking shaft;
40-主基板;41-装配孔;40-main substrate; 41-assembly hole;
50-框架板;51-安装孔;50-frame board; 51-installation hole;
100-辅助连接机构;100-auxiliary connection mechanism;
200-螺母;200-nut;
300-下调节件;300-lower adjustment parts;
a-第一方向。a - first direction.
具体实施方式Detailed ways
如在实用新型中所使用的,单数形式“一”、“一个”以及“该”包括复数对象,术语“或”通常是以包括“和/或”的含义而进行使用的,术语“若干”通常是以包括“至少一个”的含义而进行使用的,术语“至少两个”通常是以包括“两个或两个以上”的含义而进行使用的,此外,术语“第一”、“第二”、“第三”仅用于描述目的,而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。由此,限定有“第一”、“第二”、“第三”的特征可以明示或者隐含地包括一个或者至少两个该特征。此外,如在实用新型中所使用的,“安装”、“相连”、“连接”,一元件“设置”于另一元件,应做广义理解,通常仅表示两元件之间存在连接、耦合、配合或传动关系,且两元件之间可以是直接的或通过中间元件间接的连接、耦合、配合或传动,而不能理解为指示或暗示两元件之间的空间位置关系,即一元件可以在另一元件的内部、外部、上方、下方或一侧等任意方位,除非内容另外明确指出外。对于本领域的普通技术人员而言,可以根据具体情况理解上述术语在实用新型中的具体含义。此外,诸如上方、下方、上、下、向上、向下、左、右等的方向术语相对于示例性实施方案如它们在图中所示进行使用,向上或上方向朝向对应附图的顶部,向下或下方向朝向对应附图的底部。As used in the utility model, the singular forms "a", "an" and "the" include plural objects, the term "or" is usually used in the sense of including "and/or", and the term "several" Usually, the term "at least one" is used in the meaning of "at least one", and the term "at least two" is usually used in the meaning of "two or more". In addition, the terms "first", "second "Two" and "third" are used for descriptive purposes only, and should not be understood as indicating or implying relative importance or implicitly indicating the quantity of the indicated technical features. Thus, a feature defined as "first", "second" and "third" may explicitly or implicitly include one or at least two of these features. In addition, as used in the utility model, "mounting", "connecting", "connecting", and "setting" of one element on another element should be interpreted in a broad sense, usually only means that there is connection, coupling, Fitting or transmission relationship, and the connection, coupling, cooperation or transmission between two elements may be direct or indirect through intermediate elements, but shall not be understood as indicating or implying a spatial positional relationship between two elements, that is, one element may be in another Any orientation of the inside, outside, top, bottom, or side of an element, unless the content clearly indicates otherwise. Those of ordinary skill in the art can understand the specific meanings of the above terms in the utility model according to specific situations. Furthermore, directional terms such as above, below, up, down, up, down, left, right, etc. are used with respect to the exemplary embodiments as they are shown in the figures, with an upward or upward direction toward the top of the corresponding figure, The downward or downward direction is towards the bottom of the corresponding drawing.
现有的调节方式通常是通过螺纹副调整机构调节主基板的方位,其主要有两种方式,一种为差分调整机构,另一种为单螺纹调整机构;The existing adjustment method is usually to adjust the orientation of the main substrate through the thread pair adjustment mechanism. There are two main methods, one is a differential adjustment mechanism, and the other is a single thread adjustment mechanism;
请参考图1所示,为差分调整机构的结构图,该结构调整完成后只能靠调焦调平主基板40自身重力自然支撑在辅助连接机构100上,此时主主基板40在垂向位置处于自然状态,垂向无法锁紧,该种方案在调焦调平稳定性要求不高时尚可使用,无法满足集成电路工艺中对调焦调平越来越高的调整精度要求。Please refer to FIG. 1, which is a structural diagram of the differential adjustment mechanism. After the structural adjustment is completed, the
请参考图2所示,为单螺纹调整机构的结构图,该结构通过螺母200和下调节件300对主基板40实现垂向锁紧,调整完成后螺母200压紧在主基板40上,而主基板40的平面与整机框架面间不可能做到绝对平行,故在使用螺母200锁紧时,由于螺母200的锁紧面与主基板40的平面之间存在一定夹角,故螺母200锁紧主基板40的同时,会导致主基板40形变,因此调整机构与主基板40连接处存在装配应力,导致在使用过程中出现焦面漂移现象。当夹角足够大时,导致锁紧时焦面变化致使焦面调整工作反复,影响工作效率。Please refer to FIG. 2, which is a structural diagram of a single-thread adjustment mechanism. This structure realizes vertical locking of the
本实施例提供了一种调焦调平装置,该调焦调平装置通过可适形与主基板40贴合支撑的支撑平面25以及与主基板40点接触的锁紧曲面31的配合实现对主基板40的调平调焦,在满足集成电路工艺中对调焦调平越来越高的调整精度要求的同时,也改善调整过程中存在装配应力导致的焦面漂移或者反复调整的情况。This embodiment provides a focusing and leveling device. The focusing and leveling device achieves alignment through the cooperation of the
实施例一:Embodiment one:
所述调焦调平装置,包括:基座10、调节组件20和锁紧件30;The focusing and leveling device includes: a base 10, an adjusting
所述调节组件20可沿第一方向a移动的设置于所述基座10上,所述调节组件20包括一支撑平面25,所述支撑平面25用于支撑于主基板40上,所述支撑平面25可转动调节方位以适形与所述主基板贴合;The
所述锁紧件30可沿第一方向a移动的设置于所述基座10上,所述锁紧件30包括一锁紧曲面31,所述锁紧曲面31用于与所述主基板40点接触,并沿所述第一方向a将所述主基板40压于所述支撑平面25上。The locking
请参考图3和图4所示,基座10安装于框架板50上,使得整个调焦调平装置安装于框架板50上,其中框架板50上安装有多个调焦调平装置,多个调焦调平装置配合使用,用于调节主基板40的方位。3 and 4, the
此处对基座10的具体结构不做限定,例如图3中基座10呈板式结构并通过螺栓固定在框架板50的底部,在其他的可替换的实施例中,基座10可以设置为块状结构、框架结构或者其他已知的结构,基座的具体结构可基于实际的使用需求适应性的调整,此处不再赘述。The specific structure of the
调节组件20可沿第一方向a移动的设置于所述基座10,当调焦调平装置安装于框架板50上且与主基板40配合后,第一方向a对应于竖向,则调节组件20可沿着竖向方向相对基座10移动以调节支撑平面25的位置,进而调节主基板40的局部位置。The
此处对调节组件20沿基座10的移动方式不做限定,例如可通过螺纹配合、滑轨与滑块的滑动配合方式实现沿设定方向的移动。Here, there is no limitation on the movement of the
支撑平面25可转动调节方向和位置,在调节组件20在沿第一方向a移动过程中,始终保持支撑平面25与主基板40的底部贴合形成面接触,保证支撑平面25与主基板40贴合面的位置处不存在夹角。此处对支撑平面25的转动调节方式不做限定,例如可通过万向轴承、十字万向节等结构实现支撑平面25的任意角度的转动调节。请参考图4所示,三个调焦调平装置中的三个支撑平面均可以适应于主基板40的方位而转动,以使得三个支撑平面始终与主基板40面接触,而不会使得其中一个或多个支撑平面与主基板40之间产生夹角。The
请继续参考图3和图4所示,锁紧件30在第一方向a与所述调节组件20相对设置,锁紧件30用于压于主基板40的上方,且通过锁紧曲面31与主基板40形成点接触,则在调整过程中,支撑和锁紧均可与主基板适形配合,而不会产生装配应力。Please continue to refer to FIG. 3 and FIG. 4 , the locking
此处对锁紧件30的具体结构以及与基座10的配合方式不做限定,例如锁紧件30可以设置为滑块结构,锁紧件30可与基座10上的滑轨沿第一方向a滑动配合,锁紧件30还可以采用其他的已知结构,此处不再一一赘述。Here, the specific structure of the locking
另外,此处对锁紧曲面31的具体形状也不做限定,例如锁紧曲面31可以为球面或者椭球面或者其他形状的曲面结构,锁紧件30沿第一方向a移动压于主基板40上时,只需要保证锁紧曲面31与主基板40之间点接触即可。此处对点接触应广义的理解,现实中几乎不存在绝对的微观状态下的点接触现象,故此处的点接触应该为在宏观的接触状态,保证锁紧曲面31与主基板40不存在大面积接触的情况即可。In addition, the specific shape of the locking
本实用新型中,支撑平面25可转动调节方位与所述主基板适形紧密贴合,支撑平面25与主基板之间不会存在夹角;支撑平面的转动调节可实现对主基板40以绕X轴和Y轴的转动自由度的调整,其中X轴、Y轴以及第一方向a两两分别垂直,此时第一方向a与Z轴方向一致;另外,支撑平面可随着调节组件20沿着第一方向a运动,进而可调节主基板40沿第一方向a的自由度,综合可实现主基板40的柔性调整。另外支撑平面25配合锁紧曲面31实现对主基板40沿第一方向a锁紧,锁紧曲面31与主基板40在点接触,在锁紧时主基板40不会存在装配应力,提升调焦调平的稳定性,在满足集成电路工艺中对调焦调平越来越高的调整精度要求的同时,也改善调整过程中存在装配应力导致的焦面漂移或者反复调整的情况,缩短了调焦调平的检测时间,提高调节效率,进而提高产品的产率。In the present utility model, the supporting
请参考图3所示,本实施例中,所述锁紧件30还包括锁紧轴32,所述锁紧轴31的轴线沿所述第一方向a延伸,所述锁紧曲面31设置于所述锁紧轴32的一端。所述锁紧轴32与所述基座10螺纹配合。Please refer to FIG. 3 , in this embodiment, the locking
锁紧轴32设置为球头螺柱结构,其一端与基座10的底部螺纹配合,则通过转动锁紧轴32可精确的调节锁紧轴32沿第一方向a的位置,锁紧轴32的另一端为球头结构,该球头的球面作为锁紧曲面31。该球头结构沿第一方向a正对主基板40的上表面,通过转动锁紧轴32使得锁紧曲面31压于主基板40的上表面并与主基板40之间点接触,则通过锁紧曲面31配合支撑平面25实现对主基板40的垂向锁定。The locking
进一步的,所述调节组件20包括调节主体21和支撑件22,所述调节主体21为轴状结构,所述调节主体21的轴线沿第一方向a延伸,所述支撑件22可沿第一方向a移动的设置于所述调节主体21上,所述支撑平面25设置于所述支撑件22上。Further, the
请参考图3所示,将调节主体21设置为轴状结构,利于与主基板40以及调节组件20的配合,其中主基板40上开设有装配孔41,调节主体21穿过该装配孔41,调节组件20外套于调节主体21上实现对主基板40的调节和支撑。Please refer to FIG. 3 , the adjustment
请参考图3所示,调节主体21与基座10固定连接,二者可通过螺栓、焊接等方式连接,或者也可以一体成型设置。此时调节主体21相对基座10以及框架板50固定,主基板40沿第一方向的调整均依靠支撑件22相对调节主体21沿第一方向a移动实现。Please refer to FIG. 3 , the adjusting
基于调节主体21为轴状结构,则支撑件22外套于调节主体21上沿第一方向a相对运动,以对主基板40沿第一方向a调节。Since the adjustment
进一步的,所述支撑件22包括第一支撑件221和第二支撑件222,所述第一支撑件221沿第一方向a可移动的设置于所述调节主体21上,所述第二支撑件222与所述第一支撑件221万向转动配合,所述支撑平面25设置于所述第二支撑件222上。Further, the
请参考图3所示,本实施例中直接采用现有的万向关节轴承以实现支撑平面25的万向转动调节,其中万向关节轴承的内圈作为第一支撑件221,万向关节轴承的外圈223与其内圈万向转动配合,第二支撑件222外套于外圈223上并与外圈223过盈配合,故第二支撑件222通过外圈223与第一支撑件221万向转动配合。第二支撑件222的上端面作为支撑平面25,当第二支撑件222随着外圈223相对第一支撑件221万向转动时,支撑平面25适应性的转动调节方向和位置以与主基板40适形贴合。Please refer to Fig. 3, in this embodiment, the existing universal joint bearing is directly used to realize the universal rotation adjustment of the
本实施例中对第一支撑件221与调节主体21的配合方式不做限定,如图3所示,第一支撑件221外套于调节主体21上,第一支撑件221与调节主体21之间还设置有衬套26,衬套26与第一支撑件221过盈配合,衬套26可与调节主体21螺纹配合,则通过转动衬套26可调节第一支撑件221沿第一方向a的位置,进而调节外圈223和第二支撑件222的位置,此时支撑件22自身螺纹配合可实现自身位置的锁定。In this embodiment, there is no limitation on the cooperation mode between the
进一步的,所述调节组件20还包括调节件23,所述支撑件22可沿所述调节主体21的轴向滑动的外套于所述调节主体21上,所述调节件23与所述调节主体21螺纹配合用于调节所述支撑件22沿第一方向a的位置。Further, the
请参考图3所示,调节件23为锁紧螺母,其支撑在衬套26的底部用于锁定支撑件22的位置,防止衬套26与调节主体21的螺纹配合松动,以提高支撑平面25的稳定性。Please refer to FIG. 3 , the adjusting
在其他可替代的实施例中,衬套26可与调节主体21轴向滑动配合,此时支撑件22自身的不可实现位置锁定,故此时需要配合调节件23实现对支撑件22的位置调整以及位置锁定。In other alternative embodiments, the
实施例二Embodiment two
该实施例与实施例一的不同之处在于基座10与框架板50的安装方式,以及基座10与调节主体21的安装方式。The difference between this embodiment and the first embodiment lies in the installation manner of the
请参考图5所示,其中框架板50上开设有阶梯状的安装孔51,基座10呈与该安装孔51适配的阶梯结构,且基座10穿过安装孔51后通过螺栓固定,此时基座10并不是悬吊在框架板50的底部,其稳定性较好。Please refer to FIG. 5, wherein the
所述调节主体21沿第一方向a移动的设置于所述基座10上。,所述调节主体21与所述基座10螺纹配合。The adjusting
请参考图5和图6所示,调节主体21通过与所述基座10的螺纹配合可进行位置调节,以实现支撑平面25的位置粗调,然后通过调节件23的配合实现支撑平面25的位置精调,有助于缩短调焦调平的检测时间,提高调节效率,进而提高产品的产率。Please refer to FIG. 5 and FIG. 6 , the position of the
进一步的,所述调节组件20还包括定位件24,所述定位件24设置于所述调节主体21和/或所述基座10上用于锁定所述调节主体21相对所述基座10沿所述第一方向a的位置。Further, the
此处对定位件24的具体结构不做限定,例如定位件24可以设置为销钉或者其他已知的定位结构。基于调节主体21为轴状结构,则本实施例中定位件24适应性的设置为螺母结构,定位件24螺纹连接于调节主体21上,定位件24旋紧贴合于基座10上时,可锁定调节主体21相对基座10的转动,进而锁定调节主体21的位置。The specific structure of the positioning
在其他的可替代的实施例中,可基于调节主体21和基座10的装配关系,可选择定位件24的安装位置,例如当定位件24为销钉结构时,可安装于调节主体21或基座10上,通过销钉和销孔的配合实现调节主体21的位置锁定,此处不再一一赘述。In other alternative embodiments, the installation position of the positioning
上述调焦调平装置可实现三自由度的柔性调整,请结合图6所示,三组调焦调平装置配合调整以保证调焦调平传感器的焦面位置。由于主基板40和框架板50的安装面一般存在夹角而不平行,并且由于加工精度的原因,不同台份间的主基板40和框架板50的安装面夹角各不相同,因此,通过三组调焦调平装置可实现对主基板40沿第一方向a的直线调整以及沿X轴和Y轴的转动自由度的调整,并通过支撑平面25和锁紧曲面31的配合实现对主基板40的柔性调整,消除装配应力并实现对主基板40沿第一方向a的锁紧。The above-mentioned focusing and leveling device can realize the flexible adjustment of three degrees of freedom. Please combine the three groups of focusing and leveling devices as shown in Fig. 6 to coordinate and adjust to ensure the focal plane position of the focusing and leveling sensor. Since the mounting surfaces of the
以图6为例,其中调焦调平装置的安装及调整过程如下:Taking Figure 6 as an example, the installation and adjustment process of the focusing and leveling device is as follows:
将各组调焦调平装置的基座10安装到整机框架50上,且使得各组调焦调平装置与主基板40配合;Install the
安装后的要求是保证安装在主基板40上的调焦调平传感器的调整焦面和投影物镜焦面的重合度;The requirement after installation is to ensure the degree of coincidence between the adjustment focal plane of the focusing and leveling sensor installed on the
调焦调平装置调整前需调整锁紧轴32的位置,使得锁紧曲面31与主基板40保持一定距离;Before adjusting the focusing and leveling device, the position of the locking
旋转各组调焦调平装置中的调节主体21实现位置粗调;Rotate the adjustment
调节各组调焦调平装置中的调节件23实现位置精调,使调焦调平传感器的焦面和投影物镜焦面的重合;Adjust the
此时各支撑平面25与主基板40均为稳定的面面接触;At this time, each supporting
调节锁紧轴32位置,使得紧曲面31与主基板40上表面为点面接触,三组调焦调平装置保证三个紧曲面31与主基板40上表面接触并稳定形成三点支撑平面,以消除实际焦面与理论焦面的偏差,并且主基板40上不会存在装配应力,使光机获得更好的调焦调平效果。Adjust the position of the locking
另外,多个调焦调平装置中的第二支撑件222上的支撑平面25与主基板40面接触,可实现对主基板40角度的调节,而为保证在使用过程中主基板40的稳定性。另外还可以将第二支撑件222通过螺栓与主基板40固定连接,以限制主基板40的自由度,保证主基板的稳定性。In addition, the
本实施例还提供了一种光刻设备,所述光刻设备安装有上述所述的调焦调平装置。光刻设备可以为光刻机、光学测量系统等装置。This embodiment also provides a lithography equipment, the lithography equipment is equipped with the above-mentioned focusing and leveling device. The photolithography equipment may be a photolithography machine, an optical measurement system and other devices.
综上所述,所述调焦调平装置包括:基座10、调节组件20和锁紧件30;所述调节组件20可沿第一方向a移动的设置于所述基座10上,所述调节组件20包括一支撑平面25,所述支撑平面25用于支撑于主基板40上,所述支撑平面25可转动调节方位以适形与所述主基板贴合;所述锁紧件30可沿第一方向a移动的设置于所述基座10上,所述锁紧件30包括一锁紧曲面31,所述锁紧曲面31用于与所述主基板40点接触,并沿所述第一方向a将所述主基板40压于所述支撑平面25上。In summary, the focusing and leveling device includes: a base 10, an
如此配置,支撑平面25可转动调节方位与所述主基板适形紧密贴合,支撑平面25与主基板之间不会存在夹角;支撑平面的转动调节可实现对主基板40以绕X轴和Y轴的转动自由度的调整,其中X轴、Y轴以及第一方向a两两分别垂直,此时第一方向a与Z轴方向一致;另外,支撑平面可随着调节组件20沿着第一方向a运动,进而可调节主基板40沿第一方向a的自由度,综合可实现主基板40的柔性调整。另外支撑平面25配合锁紧曲面31实现对主基板40沿第一方向a锁紧,锁紧曲面31与主基板40在点接触,在锁紧时主基板40不会存在装配应力,提升调焦调平的稳定性,在满足集成电路工艺中对调焦调平越来越高的调整精度要求的同时,也改善调整过程中存在装配应力导致的焦面漂移或者反复调整的情况,缩短了调焦调平的检测时间,提高调节效率,进而提高产品的产率。With such a configuration, the
本说明书中各个实施例采用递进的方式描述,每个实施例重点说明的都是与其他实施例的不同之处,各个实施例之间相同相似部分互相参见即可。Each embodiment in this specification is described in a progressive manner, each embodiment focuses on the difference from other embodiments, and the same and similar parts of each embodiment can be referred to each other.
上述描述仅是对实用新型较佳实施例的描述,并非对实用新型范围的任何限定,实用新型领域的普通技术人员根据上述揭示内容做的任何变更、修饰,均属于权利要求书的保护范围。The above description is only a description of the preferred embodiments of the utility model, not any limitation to the scope of the utility model. Any changes and modifications made by those of ordinary skill in the field of utility model based on the above disclosure shall fall within the scope of protection of the claims.
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