CN218556555U - Destructive physical analysis sample holder and sample grinding and polishing equipment - Google Patents

Abstract

The utility model discloses a destructive physical analysis sample holder, it includes hand-held piece, support piece and locking device, and support piece's first end is installed in the hand-held piece, and the hand-held piece is mutually perpendicular with support piece and arranges, and support piece's second end is kept away from in the hand-held piece, is equipped with in the support piece to supply the sample to place and the opening in the fixed orifices of support piece's second end, and locking device installs in support piece's second end and is used for binding off the fixed orifices. The utility model discloses a destructive physical analysis sample holder has the advantage of being convenient for to exert oneself during safe in utilization, operation. Additionally, the utility model also discloses a sample grinds throws equipment.

Description

Destructive physical analysis sample holder and sample grinding and polishing equipment

Technical Field

The utility model relates to a test field especially relates to destructive physical analysis sample holder and sample grinding and polishing equipment.

Background

Destructive physical analysis (abbreviated DPA) refers to the whole process of taking samples, by production lot, for dissection and, before and after dissection, a series of tests and analyses, in order to verify whether the design, structure, material and manufacturing quality of the samples meet the requirements of the predetermined specifications for use or related.

The conventional simple method comprises the steps of installing abrasive paper on a grinding disc of a grinding and polishing machine, controlling the grinding disc to rotate, holding a sample by an operator, pressing a surface of the sample needing to be ground and polished on the abrasive paper, putting the sample under a display mirror after grinding and polishing to a certain degree, observing whether the position needing to be analyzed is ground, and repeating the operation until the sample is ground and polished to the approximate position needing to be analyzed. However, for some small-sized samples, the samples are not easy to generate force by holding the samples, and the operation takes a long time and consumes a great deal of physical force. Moreover, because the sample size is little, handheld difficult assurance sample keeps the level and keeps having an effect balanced with the contact of abrasive paper, leads to the sample to polish crooked easily, when the partial structure of sample polished surface appears polishing excessively, other parts probably not polished in place yet, influence follow-up analysis to the sample. In addition, because of the small size of the sample, the fingers and palms of the hand holding the sample are easily touched by the sand paper and the abrasive disc to cause scratch and abrasion, which is dangerous for the health and safety of operators.

Therefore, there is a need for a sample holder and sample polishing apparatus for destructive physical analysis that is safe and easy to use and apply force during operation to overcome the above-mentioned drawbacks.

SUMMERY OF THE UTILITY MODEL

An object of the utility model is to provide a destructive physical analysis sample holder of being convenient for exert oneself during safe in utilization, operation.

The utility model also aims to provide a sample grinding and polishing device with high safety and convenient control of processing quality,

in order to achieve the above object, the utility model discloses a destructive physical analysis sample holder includes handheld piece, support piece and locking device, and support piece's first end is installed in the handheld piece, and the handheld piece is perpendicular to be arranged mutually with support piece, and support piece's second end is kept away from in the handheld piece, is equipped with in the support piece to supply the sample to place and the opening in the fixed orifices of support piece's second end, and locking device installs in support piece's second end and is used for binding off the fixed orifices.

Preferably, the fixing holes are arranged in a telescopic manner.

Preferably, the side wall of the supporting member is provided with a notch extending along the length direction of the supporting member, and the notch is communicated with the fixing hole and extends to the end part of the second end of the supporting member.

Preferably, a supporting structure is installed in the fixing hole, the supporting structure is arranged at the second end far away from the supporting piece, and the supporting structure supports against the sample placed in the fixing hole.

Preferably, the support structure is a rod-like structure, a planar structure or a cross-bar structure.

Preferably, the hand piece comprises holding parts which are symmetrically arranged at two sides of the supporting part.

Preferably, the hand piece is in a strip structure, the hand piece protrudes outwards from a position of the hand piece close to the support piece, the comparison part and the hand piece are in the same plane, and the comparison part is perpendicular to the hand piece.

Preferably, the locking device comprises a ferrule, a locking screw and an operating handle, the ferrule is sleeved on the second end of the support member, the locking screw is screwed on the open end of the ferrule, the operating handle is arranged on the locking screw, and the operating handle is operable to drive the locking screw to rotate so as to drive the ferrule to close the fixing hole.

Preferably, a level is mounted in the middle of the handpiece.

In order to achieve the above another object, the sample polishing device of the present invention comprises a polishing machine and the above destructive physical analysis sample holder.

Because the second end of the supporting piece is separated from the handheld piece, the second end of the supporting piece is close to the grinding disc when grinding and polishing, the handheld piece is far away from the grinding disc, and both the palm and the fingers are far away from the grinding disc, so that the palm and the fingers are prevented from being scratched and scratched, and the operation safety is improved. And the sample is fixed at the second end of the supporting piece, and the operator holds the handheld piece, so that the sample is not directly and fixedly held, and the force is more easily exerted. Through the angle and the position of adjustment destructive physical analysis sample holder, can quick adjustment reach the grinding angle and the grinding position to the sample, change in the level of control sample and keep having an effect balanced, avoid the sample to appear polishing crooked.

Understandably, because the utility model discloses a sample grinds throws equipment includes foretell destructive physical analysis sample holder, so the sample grinds throws the corresponding safety in utilization that has of equipment, is convenient for control processingquality's advantage.

Drawings

Fig. 1 is a perspective view of a sample polishing apparatus.

FIG. 2 is a perspective view of a destructive physical analysis sample holder holding a sample.

FIG. 3 is a perspective view of the destructive physical analysis sample holder of FIG. 2 from another viewing angle.

FIG. 4 is a perspective view of the destructive physical analysis sample holder of FIG. 3 after removal of a sample.

FIG. 5 is a perspective view of the destructive physical analysis sample holder of FIG. 4 after concealing the locking means.

Fig. 6 is a right side view of the destructive physical analysis sample holder shown in fig. 5.

Fig. 7 isbase:Sub>A sectional view taken along the linebase:Sub>A-base:Sub>A in fig. 6.

Detailed Description

In order to explain technical contents and structural features of the present invention in detail, the following description is made with reference to the embodiments and the accompanying drawings.

As shown in fig. 1, the sample polishing apparatus 1000 includes a polishing machine 300 and a destructive physical analysis sample holder 100. The polishing machine 300 is used for polishing the sample 200, and has a polishing disc 310. And destructive physical analysis sample holder 100 is used for fixing sample 200, replaces two hands to position sample 200, greatly reduces the operation risk. The polishing machine 300 may be a machine structure, which is well known to those skilled in the art and will not be described herein.

As shown in fig. 2 to 7, the destructive physical analysis sample holder 100 of the present invention includes a hand piece 10, a support member 20, and a locking device 30. The first end of the supporting member 20 is installed on the handheld member 10, the handheld member 10 is perpendicular to the supporting member 20, the second end of the supporting member 20 is far away from the handheld member 10, a fixing hole 21 for placing the sample 200 and opening to the second end of the supporting member 20 is formed in the supporting member 20, and the locking device 30 is installed at the second end of the supporting member 20 and is used for closing the fixing hole 21.

In operation, the sample 200 is loaded into the fixing hole 21, such that the surface of the sample 200 to be polished is exposed at the second end of the supporting member 20, and then the locking device 30 is operated to close the fixing hole 21, so that the sample 200 is locked at the second end of the supporting member 20. After holding the hand piece 10, the destructive physical analysis sample holder 100 is lifted, and the sample 200 is pressed against the abrasive disc 310, and the abrasive paper mounted on the abrasive disc 310 polishes the sample 200. Because the second end of the supporting element 20 is separated from the hand-held element 10, the second end of the supporting element 20 is close to the grinding disc 310 during grinding and polishing, the hand-held element 10 is far away from the grinding disc 310, and the palm and fingers are far away from the grinding disc 310, thereby avoiding being scratched and improving the operation safety. And the sample 200 is fixed at the second end of the support 20, and the operator holds the hand piece 10 without directly fixing and holding the sample 200, so that the force can be exerted more easily. By adjusting the angle and the orientation of the destructive physical analysis sample holder 100, the grinding angle and the grinding position of the sample 200 can be quickly adjusted, the level of the sample 200 can be controlled more easily, the force balance can be kept, and the sample 200 is prevented from being polished and inclined.

Preferably, the supporting member 20 is a circular tube structure, and the supporting member 20 can be a square tube or other structures according to actual requirements, so that the invention is not limited thereto. Further, the supporter 20 is made of a stainless steel pipe, but is not limited thereto.

The fixing hole 21 is arranged in a telescopic manner, and when the sample 200 is loaded, the fixing hole 21 can be slightly enlarged, so that the sample 200 can be conveniently loaded into the fixing hole 21. After the loading, the locking device 30 is operated to close the fixing hole 21, and the sample 200 is fixed. Specifically, the side wall of the supporting member 20 is opened with a notch 22 extending along the length direction of the supporting member 20, and the notch 22 is communicated with the fixing hole 21 and extends to the end of the second end of the supporting member 20. After the gap 22 is opened, the supporting member 20 can be slightly deformed, and the fixing hole 21 can be arranged in an expanding and contracting manner. The support member 20 has an axial direction, and the gap 22 is elongated.

As shown in fig. 2 to 7, a supporting structure 23 is installed in the fixing hole 21, the supporting structure 23 is disposed away from the second end of the supporting member 20, and the supporting structure 23 is against the sample 200 placed in the fixing hole 21. During processing, the support structure 23 is held against the sample 200 without the sample 200 collapsing. For example, in the present embodiment, the supporting structure 23 is a rod-shaped structure, and specifically, the supporting structure 23 is a round rod. However, the supporting structure 23 may be a planar structure or a cross-bar structure according to actual requirements, and the sample 200 may be effectively supported at this time.

As shown in fig. 2 to 7, the hand piece 10 includes holding portions 11 symmetrically disposed on both sides of the supporting member 20, so that when the hand piece is operated, the holding portions 11 are grasped by both hands, the destructive physical analysis sample holder 100 can be conveniently handled and controlled, and the force applied by both hands is more even, so as to better control the operation balance. The hand piece 10 is an elongated structure, but is not limited thereto, and is designed to be held by both hands. The hand piece 10 is provided with a contrast part 12 protruding outwards at the position close to the support part 20, the contrast part 12 is in the same plane with the hand piece 10, and the contrast part 12 is perpendicular to the hand piece 10. In operation, after holding the grip 11 with both hands, the sample 200 is pressed against the grinding table 310, and at this time, it is possible to determine whether or not the sample 200 is flat by 2 grips 11 and the check portion 12. Preferably, there are 2 contrasting portions 12, and 2 contrasting portions 12 are arranged to be centered on the support member 20.

At this time, as shown in fig. 2, if the direction indicated by the arrow X is defined as the left-right direction, the direction indicated by the arrow Y is defined as the front-rear direction, the direction indicated by the arrow Z is defined as the up-down direction, the hand piece 10 is arranged to extend in the left-right direction, the matching section 12 is arranged to extend in the front-rear direction, and the support piece 20 is arranged to extend in the up-down direction.

Further, in order to observe the destructive physical analysis sample holder 100 conveniently, a level meter (not shown) is installed in the middle of the hand piece 10, the level meter adopts an existing common structure, and whether the destructive physical analysis sample holder 100 is placed horizontally or not is judged by observing bubbles, so that the level of the sample 200 is controlled conveniently.

As shown in fig. 2 to 7, the locking device 30 includes a ferrule 31, a locking screw 32, and an operating handle 33. The ferrule 31 is sleeved on the second end of the support member 20, the locking screw 32 is screwed on the open end of the ferrule 31, the operating handle 33 is installed on the locking screw 32, and the operating handle 33 is operable to drive the locking screw 32 to rotate so as to drive the ferrule 31 to close the fixing hole 21. The locking device 30 has a simple structure, and the locking device 30 can be operated conveniently to close the fixing hole 21. Of course, the locking device 30 may be embodied in other forms of locking devices such as a loose band, a quick release locking structure, etc. according to actual needs.

The operation of the sample polishing apparatus 1000 is described as follows: firstly, a sample 200 is loaded into the fixing hole 21, the supporting structure 23 is pressed against the sample 200, the surface of the sample 200 to be polished is exposed at the second end of the supporting member 20, then the operating handle 33 is rotated to drive the locking screw 32 to rotate, the hoop 31 is contracted to drive the second end of the supporting member 20 to contract, the closing of the fixing hole 21 is controlled, and the sample 200 is locked and fixed on the supporting member 20. Then, the grip 11 is grasped by both hands, the destructive physical analysis sample holder 100 is lifted to the polishing machine 300, the polishing machine 300 is started, the sample 200 is pressed on the grinding disc 310, and the sample 200 is polished until the sample 200 is polished to a position where observation and evaluation are required.

In the grinding and polishing process, 2 holding parts 11 and 2 comparison parts 12 are compared, the destructive physical analysis sample holder 100 is judged to be flatly placed after the accident, and the destructive physical analysis sample holder 100 is adjusted to be flatly placed when the destructive physical analysis sample holder is not flatly placed, so that uneven height of the plane of the sample 200 needing grinding and polishing is avoided. Of course, it is also possible to determine whether the destructive physical analysis sample holder 100 is laid flat by observing the level gauge.

The utility model discloses the sample 200 of processing is the resin solidification body, and sample 200 is short cylindricly, but is not limited to this, according to the processing demand of difference, the sample of workable other shapes, material.

The above disclosure is only a preferred embodiment of the present invention, and the scope of the claims of the present invention should not be limited thereby, and all the equivalent changes made in the claims of the present invention are intended to be covered by the present invention.

Claims (10)

1. Destructive physical analysis sample holder, its characterized in that: including handheld piece, support piece and locking device, the first end of support piece is installed in handheld piece, handheld piece with support piece is looks perpendicular arrangement, support piece's second end keep away from in handheld piece, be equipped with in the support piece and supply the sample to place and the opening in the fixed orifices of support piece's second end, locking device install in support piece's second end just is used for binding off the fixed orifices.

2. The destructive physical analysis sample holder of claim 1, wherein said securing holes are in a collapsible arrangement.

3. The destructive physical analysis sample holder of claim 1, wherein the side wall of the support member defines a notch extending along a length direction of the support member, the notch being in communication with the securing hole and extending to an end of the second end of the support member.

4. The destructive physical analysis sample holder of claim 1, wherein a support structure is mounted within said holding cavity, said support structure being disposed away from said second end of said support member, said support structure being adapted to support a sample placed in said holding cavity.

5. The destructive physical analysis sample holder of claim 4, wherein said support structure is a rod-like structure, a planar structure, or a cross-bar structure.

6. The destructive physical analysis sample holder of claim 1, wherein said hand piece comprises gripping portions symmetrically disposed on both sides of said support member.

7. The destructive physical analysis sample holder of claim 1, wherein said hand piece is an elongated structure, said hand piece has a control portion protruding outwardly at a location adjacent to said support member, said control portion is coplanar with said hand piece, and said control portion is perpendicular to said hand piece.

8. The destructive physical analysis sample holder of claim 1, wherein said locking device comprises a ferrule, a locking screw, and an operating handle, said ferrule is sleeved on the second end of said support member, said locking screw is screwed on the open end of said ferrule, said operating handle is mounted on said locking screw, said operating handle is operable to drive said locking screw to rotate to drive said ferrule to close said fixing hole.

9. The destructive physical analysis sample holder of claim 1, wherein a level is mounted in the middle of said hand piece.

10. A sample polishing apparatus comprising a polishing machine and a destructive physical analysis sample holder according to any of claims 1 to 9.

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