CN217954638U - PCB testing arrangement - Google Patents
PCB testing arrangement Download PDFInfo
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- CN217954638U CN217954638U CN202123428082.4U CN202123428082U CN217954638U CN 217954638 U CN217954638 U CN 217954638U CN 202123428082 U CN202123428082 U CN 202123428082U CN 217954638 U CN217954638 U CN 217954638U
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- bottom plate
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- 238000012360 testing method Methods 0.000 title claims abstract description 72
- 239000000523 sample Substances 0.000 claims abstract description 33
- 238000001514 detection method Methods 0.000 claims abstract description 11
- 238000009434 installation Methods 0.000 claims description 17
- 230000006835 compression Effects 0.000 claims description 4
- 238000007906 compression Methods 0.000 claims description 4
- 230000002093 peripheral effect Effects 0.000 claims description 2
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000000149 penetrating effect Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
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Abstract
A PCB testing device comprises a base, a testing platform, a plurality of limiting pieces, a bottom plate and a plurality of probes, wherein the testing platform is arranged on the base, the limiting pieces are arranged on the outer edge of the testing platform, the bottom plate is arranged on the inner side of the middle part of the testing platform, and the probes are arranged on the bottom plate; the base is also provided with a main control device and a control panel electrically connected with the main control device, the control panel is arranged on the outer side of the base, and the main control device is arranged in the base; one end of the probe is connected with an electric terminal of the main control device, and the other end of the probe extends on the bottom plate to be in electric contact with the test point; the control panel can display and alarm the test condition of the detection points of the probes, the top surface of the bottom plate is detachably arranged on a cover plate, the cover plate is provided with a plurality of mounting columns, and the test platform is arranged on the top surfaces of the mounting columns. The utility model discloses a flexibility ratio is high, and the suitability is strong, has stronger popularization meaning.
Description
Technical Field
The utility model relates to a testing arrangement especially relates to a PCB testing arrangement.
Background
Circuit boards are essential components of various electronic devices, and when manufacturing the circuit boards, electrical performance tests are usually performed on electrical contacts on the circuit boards. However, when testing or debugging the PCB, the circuit board is prone to shift, so that the position of the test point also moves, which affects the stability and accuracy of the test or debugging result.
SUMMERY OF THE UTILITY MODEL
For this reason, to prior art's not enough, the utility model aims to provide a PCB testing arrangement.
A PCB testing device comprises a base, a testing platform, a plurality of limiting parts, a bottom plate and a plurality of probes, wherein the testing platform is arranged on the base, the plurality of limiting parts are arranged on the peripheral edge of the testing platform, the bottom plate is arranged on the inner side of the middle part of the testing platform, and the probes are arranged on the bottom plate; the base is also provided with a main control device and a control panel electrically connected with the main control device, the control panel is arranged on the outer side of the base, and the main control device is arranged in the base; one end of the probe is connected with an electric terminal of the main control device, and the other end of the probe extends on the bottom plate to be in electric contact with the test point; the control panel can display and alarm the test condition of the detection points of the probes, the top surface of the bottom plate is detachably arranged on a cover plate, the cover plate is provided with a plurality of mounting columns, and the test platform is arranged on the top surfaces of the mounting columns.
Furthermore, a through hole which penetrates through the cover plate up and down is further formed in the cover plate, the probe is connected to the main control device through an electric wire, and the electric wire extends into the base through the through hole.
Furthermore, the test platform comprises a plate edge fixing part and a limiting groove arranged on the inner side of the plate edge fixing part, and the limiting parts are uniformly distributed on the plate edge fixing part.
Furthermore, a plurality of position adjusting long holes are formed in the plate edge fixing portion, and the limiting piece is mounted in the position adjusting long holes and can move inside and outside along the position adjusting long holes.
Further, the locating part includes spacing base, stopper and installation piece, be provided with the draw-in groove that extends along its length direction on the spacing base, be provided with the bellying on the bottom surface of stopper and installation piece, the bellying card is located in the draw-in groove, the installation piece locks on spacing base.
Further, a connecting rod is arranged on the inner side face of the mounting block, the other end of the connecting rod is movably mounted on the limiting block, and a compression spring is sleeved on the outer side of the connecting rod.
Further, be provided with the extension piece on the lateral surface of installation piece, be provided with the fixed orifices on the extension piece, the fixed orifices passes through the fastener and locks down on spacing base through the testboard.
Furthermore, the bottom surface of the limiting groove extends inwards to form a limiting flange, and the inner side of the limiting flange is enclosed to form a through hole; the bottom plate is arranged in the limiting groove, and the limiting flange limits the bottom plate.
Furthermore, a plurality of mounting holes penetrating up and down are formed in the bottom plate, a lead-in groove and a limiting groove are formed in the inner side wall surface of each mounting hole, the lead-in groove extends vertically, the limiting groove extends horizontally, and the inner side end of the lead-in groove is communicated with the limiting groove.
Furthermore, the probe comprises a contact part and an outer shell part, wherein a buckling part is further arranged at the inner side end of the shell part, and the buckling part is clamped into the limiting groove from the guide groove.
In summary, the testing device of the utility model has high flexibility, and each detachable component makes the testing device suitable for the product detection of various different sizes and specifications and various different testing positions, and the detection result can be displayed through the display screen; meanwhile, the detected bad test position can alarm through numerical value display and display the position of the bad test position on the PCB; the method is particularly suitable for the production of small-batch products with various sizes and specifications in small enterprises. The utility model discloses a practicality is strong, has stronger popularization meaning.
Drawings
Fig. 1 is a schematic structural diagram of a PCB testing apparatus of the present invention;
FIG. 2 is a schematic structural diagram of the position limiting member shown in the figure;
fig. 3 is a schematic view of an installation structure of the probe in fig. 1.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments.
As shown in fig. 1 to 3, the utility model provides a PCB testing device, PCB testing device includes base 10, test platform 20, a plurality of locating part 30, bottom plate 40 and a plurality of probe 50, test platform 20 installs on base 10, and a plurality of locating parts 30 install on test platform 20's periphery border, bottom plate 40 installs at test platform 20 middle part inboard, probe 50 installs on bottom plate 40.
The base 10 is further provided with a main control device (not shown) and a control panel 11 electrically connected to the main control device, the control panel 11 is disposed outside the base 10, and the main control device is disposed in the base 10. One end of the probe 50 is connected to an electrical terminal of the main control device, and the other end of the probe extends on the bottom plate 40 to be electrically contacted with the test point; the control panel 11 can display and alarm the test condition of the detection point of each probe. The top surface of the base 10 is further provided with a cover plate 12, the cover plate 12 is detachably mounted on the base 10 through a fastener, and can be freely detached according to requirements, for example, when the inner wiring end condition of the probe 50 needs to be detached for maintenance and detection, the cover plate can be detached, so that the inner wiring condition can be visually checked. In addition, the cover plate 12 is further provided with a through hole 13 penetrating vertically, and the electric wire on the probe 50 extends out of the base 10 through the through hole 13.
The cover plate 12 is provided with a plurality of mounting columns 14, and the test platform 20 is detachably mounted on the mounting columns 14 through fasteners; the testing platform 20 is installed on the top end surfaces of the mounting posts 14, and the structural arrangement not only enables the testing platform 20 to be disassembled and replaced according to requirements, but also enables the probe 50 to be more conveniently disassembled and assembled. The testing platform 20 includes a board edge fixing portion 21 and a limiting groove (not shown) disposed inside the board edge fixing portion 21, and the limiting members 30 are uniformly distributed on the board edge fixing portion 21. The plate edge fixing portion 21 is provided with a plurality of position adjusting long holes 22, and the limiting member 30 is installed in the position adjusting long holes 22 and can move inside and outside along the position adjusting long holes 22. The plate edge fixing portion 21 outside the position-adjusting long hole 22 is provided with a plurality of positioning holes 23, and the position of the position-limiting member 30 can be adjusted by installing the side edge thereof in different positioning holes 23.
The limiting part 30 comprises a limiting base 31, a limiting block 32, a connecting rod 33, an expansion spring 34 and an installation block 35, wherein a clamping groove 34 extending along the length direction of the limiting base 31 is formed in the limiting base 31, and limiting grooves are formed in two opposite side faces of the clamping groove 34. The bottom surface of the limiting block 32 is provided with a protruding portion 321, and two opposite outer side surfaces of the protruding portion 321 are provided with protruding blocks. During installation, the limiting block 32 is arranged on the limiting base, the protruding portion 321 is clamped in the clamping groove, and the protruding block is clamped in the limiting groove. The bottom end of the mounting block 35 is also movably mounted in the clamping groove 34, an extending block 351 is arranged on the outer side surface of the mounting block 35, a fixing hole is formed in the extending block 351, and the fixing hole is downwards locked on the limiting base 31 through a fixing piece through the positioning hole 23. One end of the connecting rod 33 is fixed on the mounting block 35, the other end of the connecting rod is movably mounted on the limiting block 32, and the compression spring is mounted on the connecting rod 33. During installation, the limiting base 35 is installed in the positioning slot hole 22 from the lower side of the test platform 20, the installation conductor 35 and the limiting block 32 are clamped onto the limiting base 35 from the upper side along the clamping groove 34, then the installation block 35 and the limiting base 35 are locked through the fastener, and the limiting block 32 can still move along the connecting rod 33 and the clamping groove 34. In addition, the top surface of the limiting bottom plate 35 is also provided with an alignment line, and the alignment line corresponds to the positioning hole 23, so that the installation and alignment are convenient.
The bottom surface of the limiting groove extends inwards to form a limiting flange, and the inner side of the limiting flange is enclosed to form a through hole. The bottom plate 40 is arranged in the limiting groove, and the limiting flange limits the bottom plate 40. The base plate 40 is provided with a plurality of mounting holes 41 penetrating vertically, and the probes 50 are mounted in the mounting holes 41. The probe 50 includes an inner contact portion 51 and an outer housing portion 52, and a compression spring (not shown) is disposed between the inner contact portion 51 and the inner bottom surface of the housing portion 52, so that the contact portion 51 can elastically expand and contract inside and outside. The inner side end of the housing 52 is further provided with a buckling part 53, the inner side wall surface of the mounting hole 41 is provided with an introduction groove 42 and a limiting groove 43, the introduction groove 42 extends vertically, the limiting groove 43 extends horizontally, and the inner side end of the introduction groove 42 is communicated with one end of the limiting groove 43. The buckling part 53 is clamped into the guide groove 42 and then is rotationally clamped into the limiting groove 43, so that when the probe is in contact with the detection point of the PCB, the probe cannot be displaced due to the pressure of the PCB, and poor contact can be avoided. The test points on different base plates 40 are located differently, so that different base plates 40 can be replaced or probes 50 can be inserted into different mounting holes 41 on the base plates 40 according to the requirements.
During testing, firstly, according to the size of the PCB, a suitable testing platform 20 is selected to be installed on the cover plate 12, and then the limiting member 30 is adjusted to a suitable position. Then, according to the point location to be detected of the PCB, a proper bottom plate 40 is installed, and according to the point location to be detected, a corresponding probe 50 is inserted into the required installation hole 41. After the plugging is completed, the detection is started, the wiring condition of each test point and the electrical connection and disconnection condition of each test point are displayed on the control panel 11, an alarm is given out at an abnormal position, and the alarm is displayed on the corresponding test point position on the control panel.
In summary, the testing device of the utility model has high flexibility, and each detachable component makes the testing device suitable for the product detection of various different sizes and specifications and various different testing positions, and the detection result can be displayed through the display screen; meanwhile, the detected bad test position can alarm through numerical value display and display the position of the bad test position on the PCB; the method is particularly suitable for the production of small-batch products with various sizes and specifications in small enterprises. The utility model discloses a practicality is strong, has stronger popularization meaning.
The above-mentioned embodiments only represent one embodiment of the present invention, and the description is more specific and detailed, but not understood as the limitation of the scope of the invention, it should be noted that, for those skilled in the art, without departing from the concept of the present invention, several modifications and improvements can be made, which all belong to the protection scope of the present invention, therefore, the protection scope of the present invention should be subject to the appended claims.
Claims (10)
1. A PCB testing arrangement which characterized in that: the testing platform is arranged on the base, the limiting parts are arranged on the peripheral edge of the testing platform, the bottom plate is arranged on the inner side of the middle part of the testing platform, and the probes are arranged on the bottom plate; the base is also provided with a main control device and a control panel electrically connected with the main control device, the control panel is arranged on the outer side of the base, and the main control device is arranged in the base; one end of the probe is connected with an electric terminal of the main control device, and the other end of the probe extends on the bottom plate to be in electric contact with the test point; the control panel can display and alarm the test condition of the detection points of the probes, the top surface of the bottom plate is detachably arranged on a cover plate, the cover plate is provided with a plurality of mounting columns, and the test platform is arranged on the top surfaces of the mounting columns.
2. A PCB testing apparatus as claimed in claim 1, wherein: the cover plate is further provided with a through hole which penetrates through the cover plate from top to bottom, the probe is connected to the main control device through an electric wire, and the electric wire extends into the base through the through hole.
3. A PCB testing apparatus as claimed in claim 1, wherein: the test platform comprises a plate edge fixing part and a limiting groove arranged on the inner side of the plate edge fixing part, and the limiting parts are uniformly distributed on the plate edge fixing part.
4. A PCB testing apparatus as claimed in claim 3, wherein: the plate edge fixing part is provided with a plurality of position adjusting long holes, and the limiting part is arranged in the position adjusting long holes and can move inside and outside along the position adjusting long holes.
5. A PCB testing apparatus as claimed in claim 1, wherein: the locating part includes spacing base, stopper and installation piece, be provided with the draw-in groove that extends along its length direction on the spacing base, be provided with the bellying on the bottom surface of stopper and installation piece, the bellying card is located in the draw-in groove, the installation piece locks on spacing base.
6. A PCB testing apparatus as claimed in claim 5, wherein: the side in the installation piece is equipped with the connecting rod, the other end movable mounting of connecting rod in on the stopper, the connecting rod outside cover is equipped with compression spring.
7. The PCB testing apparatus of claim 5, wherein: be provided with the extension piece on the lateral surface of installation piece, be provided with the fixed orifices on the extension piece, the fixed orifices passes through the fastener and locks down on spacing base through the testboard.
8. A PCB testing apparatus as claimed in claim 3, wherein: the bottom surface of the limiting groove extends inwards to form a limiting flange, and the inner side of the limiting flange is enclosed to form a through hole; the bottom plate is arranged in the limiting groove, and the limiting flange limits the bottom plate.
9. A PCB testing apparatus as claimed in claim 1, wherein: the bottom plate is provided with a plurality of vertically-penetrating mounting holes, the inner side wall surface of each mounting hole is provided with a guide-in groove and a limiting groove, the guide-in grooves vertically extend, the limiting grooves horizontally extend, and the inner side ends of the guide-in grooves are communicated with the limiting grooves.
10. A PCB testing apparatus as defined in claim 9, wherein: the probe comprises a contact part and an outer shell part, wherein a buckling part is further arranged at the inner side end of the shell part, and the buckling part is clamped into the limiting groove from the guide groove.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123428082.4U CN217954638U (en) | 2021-12-31 | 2021-12-31 | PCB testing arrangement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202123428082.4U CN217954638U (en) | 2021-12-31 | 2021-12-31 | PCB testing arrangement |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN217954638U true CN217954638U (en) | 2022-12-02 |
Family
ID=84209610
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202123428082.4U Active CN217954638U (en) | 2021-12-31 | 2021-12-31 | PCB testing arrangement |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN217954638U (en) |
-
2021
- 2021-12-31 CN CN202123428082.4U patent/CN217954638U/en active Active
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