CN217278490U - Carrier device for chip test carrier - Google Patents

Abstract

The utility model discloses a bear device for chip testing support plate, its support microscope carrier that mainly lies in bearing group is the backward extension setting of cavity form, thereby support in the bottom periphery of chip testing support plate, so not only increase the area of contact between this support microscope carrier and this chip testing support plate by a wide margin, in order to make things convenient for this chip testing support plate of this firm support of this support microscope carrier, avoid this chip testing support plate to produce crooked more effectively, the perk or can't keep the condition of horizontality, so that it is quick with this chip testing support plate, accurate location is in the tram, and then outside promoting the test stability, and this support microscope carrier also can reach and effectively destroy efficiency such as pins of avoiding losing the chip.

Description

Carrier device for chip test carrier

technical field

The utility model relates to a bearing device, in particular to a bearing device for a chip test carrier.

Background technique

With the development of the semiconductor industry, the design of integrated circuit chips has become more complex, and the size of integrated circuit chips has also been reduced. From design, wafer manufacturing to packaging, any production process may cause integrated circuit chips to fail. Therefore, , In order to find unstable factors in time and improve the production pass rate, the testing equipment of integrated circuit chips is even more indispensable, and in order to adapt to the testing operations of various integrated circuit chips, chip test carriers are generally used for the integrated circuit chips to be tested. The medium between the test equipment and the test equipment is responsible for the transmission of power and signals, and then cooperates with the carrier device of the test equipment to carry the chip test carrier, and the reading device for reading and testing, so as to complete the test operation of the integrated circuit chip.

Referring to FIG. 1 and FIG. 2 , the conventional carrier device 1 includes an adjustment group 11 , and a carrier group 12 disposed on the adjustment group 11 and capable of being placed on a chip test carrier 2 , and the adjustment group 11 It can be adjusted along the X-axis and the Y-axis; wherein, the bearing group 12 has a support rod 121 and a positioning rod 122 corresponding to the support rod 121, and the support rod 121 and the positioning rod 122 The distance can be adjusted. As shown in FIG. 2, when the carrier device 1 is in use, the end of the chip test carrier 2 with the test socket 21 is placed on the carrier group 12, so that the support rod 121 and the positioning rod can be used. 122 is supported on the bottom of the chip test carrier 2 .

However, after actual use, it is found that the support rod 121 and the positioning rod 122 respectively support the chip test carrier 2 in a point contact manner, so that the contact area between the carrier group 12 and the chip test carrier 2 is too small. When the reading device A presses down on the test socket 21 of the chip test carrier 2 , because the force application point of the reading device A is suspended in the air, no effective supporting force and reaction force can be generated. At the same time, the chip test carrier 2 It is easy to be skewed, tilted or unable to maintain a horizontal state due to the lack of stable support, which not only affects the test stability, but also the operator must continuously adjust the chip test carrier 2 to the correct position, which also causes the test operation to be inefficient. , needs to be improved.

In addition, since the support rod 121 and the positioning rod 122 are supported on the bottom of the chip test carrier 2 in a point-contact manner, in order to maintain the balance of the chip test carrier 2, the support rod 121 and the positioning rod 122 It must be set close to the center line of the chip test carrier 2. However, the support rod 121 and the positioning rod 122 may incorrectly support the pins of the chip (not shown in the figure), causing the pins of the chip to be damaged. There is also room for improvement.

Utility model content

Therefore, the purpose of the present invention is to provide a carrier device for a chip test carrier, which can effectively increase the contact area with the chip test carrier by supporting the carrier, and stably support the chip test carrier. At the same time, the chip test carrier can be prevented from being skewed, lifted, damaged or cannot be kept in a horizontal state, so that the chip test carrier can be quickly positioned and the test stability can be improved.

Therefore, the present invention provides a carrier device for a chip test carrier, which is installed in a chip tester and used. The carrier device includes an adjustment group, and a carrier mounted on the adjustment group and placed on the chip test carrier. A bearing group, and the adjustment group can be adjusted along the X axis and the Y axis; the bearing group has an adjustment rod, a bearing seat that can be displaced along the Z axis by the action of the adjustment rod, and a bearing seat arranged on the bearing seat A support stage, wherein the support stage extends from the bearing seat toward the opposite direction of the adjusting rod, and the support stage is hollow, so that the support stage is supported on the bottom of the chip test carrier by the support stage The peripheral edge not only greatly increases the contact area with the chip test carrier, thereby stably supporting the chip test carrier, and the support carrier will not damage the chip pins, and effectively prevent the chip test carrier from skewing, warping or In the case where the horizontal state cannot be maintained, the chip test carrier can be quickly and accurately positioned to the correct position, and the test stability can be greatly improved.

Further, the support platform is arranged in a horseshoe shape.

Further, the supporting stage is arranged in an arc shape.

Description of drawings

1 is a schematic diagram of a conventional carrying device;

Fig. 2 is the action schematic diagram of the conventional carrying device;

3 is a schematic diagram of a preferred embodiment of the present invention;

Fig. 4 is the use schematic diagram of this preferred embodiment;

Figure 5 is a schematic side view of the preferred embodiment in use.

Symbol Description:

(acquaintance)

1: Bearing device

11: Adjustment group

12: Bearer Group

121: Support rod

122: Positioning rod

2: Chip test carrier board

21: Test socket

A: Reader

(this utility model)

3: Bearing device

31 Adjustment groups

32: Bearer Group

311: The first adjustment seat

312: First adjustment lever

313: Second adjustment seat

314: Second adjustment lever

321: Adjustment lever

322: Carrier

323: Support stage

4: Chip test carrier board

41: Test socket

42: Chip

B: Reading device.

Detailed ways

The foregoing and other technical contents, features and effects of the present invention will be clearly understood in the following detailed description of the preferred embodiments with reference to the drawings.

Referring to FIG. 3 , a preferred embodiment of the carrier device 3 used for the chip test carrier 4 of the present invention, the carrier device 3 is installed on a chip tester (not shown in the figure) for use when in use, The carrier device 3 includes an adjustment group 31 and a carrier group 32 disposed on the adjustment group 31 and capable of being placed on a chip test carrier 4. In this embodiment, the adjustment group 31 has a first The adjusting seat 311 has a first adjusting rod 312 disposed on the first adjusting seat 311 and can control the displacement of the first adjusting seat 311 along the Y axis, and a second adjusting seat 313 disposed on the first adjusting seat 311 , and a second adjusting rod 314 disposed on the second adjusting seat 313 and capable of controlling the displacement of the second adjusting seat 313 along the X axis.

Referring to FIG. 3 and FIG. 4 , the bearing group 32 has an adjustment rod 321 , a bearing base 322 which is displaced along the Z-axis by the adjustment rod 321 , and a support bearing set on the bearing base 322 stage 323 , the support stage 323 extends from the bearing seat 322 toward the opposite direction of the adjustment rod 321 , and the support stage 323 is hollow. The shape is adjusted, such as being arranged in an arc shape or a horseshoe shape, so that the support stage 323 can be attached to the periphery of the bottom of the chip test carrier 4, and in this embodiment, the support stage 323 is arranged in a horseshoe shape as As an example, when the chip test carrier 4 is placed on the carrier group 32, the support carrier 323 can be supported on the periphery of the chip test carrier 4, which not only greatly increases the size of the support carrier 323 and the chip The contact area between the test carriers 4 is used to stably support the chip test carrier 4 and effectively maintain the horizontal state of the chip test carrier 4 , thereby improving the efficiency of subsequent testing operations.

Referring to FIGS. 3 , 4 and 5 , when the carrier device 3 is in use, a chip test carrier 4 is first placed on the carrier group 32 , and a test socket 41 is pre-configured on the chip test carrier 4 . And at least one chip 42 to be tested is inserted, and the end of the chip test carrier 4 with the test socket 41 is placed on the support stage 323, so that the support stage 323 supports the chip test The bottom peripheral edge of the carrier board 4 can effectively prevent the support stage 323 from contacting or damaging the pins of the chip 42 , and then the operator adjusts the position of the first adjusting seat 311 by the first adjusting rod 312 so that the The first adjusting seat 311 is displaced along the Y axis, and the second adjusting seat 313 is adjusted by the second adjusting rod 314 so that the second adjusting seat 313 is displaced along the X axis, and then the adjusting rod 321 is used to adjust the position of the second adjusting seat 313 The position of the bearing seat 322 is such that the bearing seat 322 is displaced along the Z axis, so that the supporting platform 323 can be adjusted to a position corresponding to a reading device B. When the reading device B presses down on the chip When testing the test socket 41 of the carrier board 4 , the support stage 323 can generate effective supporting force and reaction force, so as to prevent the chip test carrier board 4 from being skewed, tilted or unable to maintain a horizontal state, so that the chip testing The carrier board 4 can be quickly and accurately positioned at the correct position, which further improves the test stability and facilitates subsequent test operations.

Summarizing the above, the present invention is used for a carrier device for a chip test carrier, which effectively increases the contact area with the chip test carrier by the support carrier, so as to be favorable for stably supporting the chip test carrier, and the support carrier The board only contacts the bottom edge of the chip test carrier, which can effectively avoid damage to the pins of the chip, and avoid the chip test carrier from being skewed, tilted or unable to maintain a horizontal state, which is more conducive to the chip. The test carrier board is quickly and accurately positioned in the correct position, which further improves the test stability.

Only the above-mentioned are only to illustrate the preferred embodiments of the present utility model, and should not limit the scope of implementation of the present utility model, that is, any simple equivalents made according to the scope of the present utility model patent application and the contents of the description of the utility model. Changes and modifications should still fall within the scope of the present invention patent.

Claims (3)

1. A carrying device for a chip test carrier, which is installed in a chip testing machine for use, the carrying device comprises an adjustment group, and a carrier group arranged on the adjustment group and for the chip test carrier to be placed, and The adjustment group can be adjusted along the X-axis and Y-axis displacement; it is characterized by: The carrying group has an adjusting rod, a carrying base that can be displaced along the Z-axis by the adjusting rod, and a support stage arranged on the carrying base, wherein the supporting stage is directed from the carrying base to the adjusting rod Extending in opposite directions, and the supporting stage is hollow, so as to be supported on the periphery of the chip test carrier. 2 . The bearing device for a chip test carrier according to claim 1 , wherein the support carrier is arranged in a horseshoe shape. 3 . 3 . The carrier device for a chip test carrier according to claim 1 , wherein the support carrier is arranged in an arc shape. 4 .

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