CN217156725U - Multifunctional integrated circuit experiment test equipment - Google Patents

Abstract

The utility model relates to a multi-functional integrated circuit experiment test equipment, this equipment include the host computer, receive the daughter board and connect respectively at the host computer and receive adjustable voltage source module, adjustable electronic load module, waveform generator module, vector test module, serial ports transceiver module, voltage detection module, current detection module, resistance tester module, oscilloscope module, logic analysis module between the daughter board. Compared with the prior art, the utility model discloses have and collect multiple parameter measurement, multiple experiment test in an organic whole, from the experiment all clearly visible to every link of using, make it be applicable to very much the integrated circuit experiment teaching.

Description

Multifunctional integrated circuit experiment test equipment

Technical Field

The utility model belongs to the technical field of the integrated circuit test and specifically relates to a multi-functional integrated circuit experiment test equipment is related to.

Background

The measurement test instrument that uses in the relevant experimentation of colleges and universities' teaching circuit mostly is the measurement of single parameter, can only detect the voltage variation condition if the oscilloscope, also can only measure single physical quantities such as electric current, voltage, resistance such as voltmeter, ampere meter, ohmmeter, and an experiment need use a plurality of instruments usually, and it is complicated to build the circuit, and the test procedure is loaded down with trivial details. Experiment courses generally need to carry paper experiment reports for experiment guidance and experiment data recording, but the paper reports are inconvenient to carry and easy to lose, and the experiment process recorded data are also tedious. After the experiment is finished, the data processing and analysis are time-consuming, and the correction by teachers is not facilitated. Although the integrated circuit industrial tester is efficient, tests are edited in advance according to the flow by using professional software, the test flow is invisible, and is more biased to yes/no logic judgment, so that the test principle and the circuit principle are not convenient to explain.

SUMMERY OF THE UTILITY MODEL

The utility model aims at providing a multifunctional integrated circuit experiment test equipment for overcoming the defects of the prior art.

The purpose of the utility model can be realized through the following technical scheme:

according to the utility model discloses an aspect provides a multifunctional integrated circuit experiment test equipment, and this equipment includes the host computer, receives the daughter board and connects respectively at the host computer and receive adjustable voltage source module, adjustable electronic load module, waveform generator module, vector test module, serial ports transceiver module, voltage detection module, current detection module, resistance tester module, oscilloscope module, logic analysis module between the daughter board.

As a preferred technical scheme, the equipment further comprises a temperature adjusting module, an abnormal alarm module and a data table/graph processing module which are respectively in communication connection with the host.

As a preferable technical scheme, the temperature adjusting module comprises a temperature sensor and a refrigerating and heating unit which are connected with each other;

the abnormity alarm module adopts an acousto-optic alarm;

the data table/graph processing module comprises a processor and a memory which are connected with each other.

As a preferred technical scheme, the device further comprises a chip automatic burning module connected with the tested daughter board.

As a preferred technical solution, the apparatus further comprises an anti-static alarm device for preventing irregular electrostatic operation.

As a preferred technical solution, the adjustable voltage source module includes a voltage source and a current limiting protection circuit connected to each other;

the adjustable electronic load module adopts a voltage load or a current load or a resistance load;

the vector test module comprises a 3.3V logic level output circuit and a 5.0VV logic level output circuit;

the serial port transceiver module adopts a UART communication circuit.

As a preferred technical scheme, the voltage detection module adopts a voltmeter; the current detection module adopts an ammeter; the logic analysis module adopts a logic level conversion circuit.

As a preferred technical solution, the daughter board under test includes:

exciting the lead-in interface;

a signal output interface;

a communication interface for communicating with a host;

the expansion interface is used for being in communication connection with various testing instruments;

the circuit protection module is used for short-circuit protection of the circuit of the tested daughter board;

and the integrated circuit testing module is used for carrying out corresponding experimental tests.

Preferably, one of the daughter boards to be tested includes a plurality of integrated circuit test modules.

As a preferred technical scheme, the host is provided with a visual operation interface.

Compared with the prior art, the utility model has the advantages of it is following:

1) the utility model integrates various test excitation and parameter measurement, and various experimental tests, and each link from the experiment to the application is clearly visible, so that the teaching experiment embodies the essence of the test, and knows that the experiment is true;

2) the utility model discloses a host computer has visual operation interface, but a series of modules such as steerable adjustable voltage source, electronic load, voltage detection, current detection, resistance test, vector test, logic analysis, signal generator, oscilloscope accomplish the integrated circuit experiment test of multinomial complicacy on receiving the daughter board, be furnished with perfect have data processing system for experiment data is preserved and analysis processes, but extends the interface and connect the industrial test board and be used for showing production flow.

Drawings

FIG. 1 is a block diagram of a test apparatus according to an embodiment of the present invention;

FIG. 2 is a block diagram of a first teaching experiment according to an embodiment of the present invention;

FIG. 3 is a block diagram of a second teaching test according to an embodiment of the present invention;

FIG. 4 is a block diagram of a third teaching test according to an embodiment of the present invention;

fig. 5 is a structural diagram of a fourth experimental teaching test introduced in the embodiment of the present invention.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, not all, of the embodiments of the present invention. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts shall fall within the protection scope of the present invention.

The utility model relates to a multi-functional integrated circuit experiment teaching equipment, its integration host computer have visual operation interface, and is steerable including but not limited to following integrated module: the tester comprises an adjustable voltage source, an electronic load, voltage detection, current detection, resistance test, vector test, logic analysis, a signal generator, an oscilloscope and the like, so that the tester can complete multiple complex test experiments on a tested daughter board of a tested integrated circuit; the device is internally provided with a data processing function and is used for storing and analyzing experimental data; and an expansion interface is reserved, and the device can be connected with an industrial testing machine and is used for batch production processes.

As shown in fig. 1, the multifunctional integrated circuit experimental test equipment comprises a host 1, a daughter board 2 to be tested, and an adjustable voltage source module 3, an adjustable electronic load module 4, a waveform generator module 5, a vector test module 6, a serial port transceiver module 7, a voltage detection module 8, a current detection module 9, a resistance tester module 10, an oscilloscope module 11, and a logic analysis module 12 which are respectively connected between the host 1 and the daughter board 2 to be tested;

the adjustable voltage source module 3 comprises a voltage source and a current-limiting protection circuit which are connected with each other and used for outputting high-precision voltage for current-limiting protection;

the adjustable electronic load module 4 is used for detecting constant voltage or current or resistance with high precision;

the waveform generator module 5 is used for outputting various common waveforms with high precision and wide frequency band;

the vector test module 6 is used for outputting logic levels of 3.3V and 5.0V;

the serial port transceiver module 7 is used for UART communication;

the voltage detection module 8 adopts a voltmeter and is used for detecting the voltage change condition in the circuit with high precision;

the current detection module 9 adopts an ammeter and is used for detecting the current change condition in the circuit with high precision;

the resistance tester module 10 is used for measuring the resistance value with high precision;

the oscilloscope module 11 is used for detecting voltage signals with high sampling, high precision and wide frequency band and converting the voltage signals into graphic signals for output;

the logic analysis module 12 is used for detecting a logic level and converting the logic level into graphic data to be output.

The device also comprises a temperature adjusting module 13, an abnormity alarm module 14 and a data table/graph processing module 15 which are respectively in communication connection with the host 1.

The temperature adjusting module 13 comprises a temperature sensor and a refrigerating and heating unit which are connected with each other and is used for adjusting the working temperature of the testing equipment;

the abnormity alarm module 14 adopts an audible and visual alarm and is used for giving an alarm when the abnormal condition of the testing equipment occurs;

the data table/graph processing module 15 is used for storing test data, performing data graph conversion, and analyzing and processing data.

The device also comprises a chip automatic burning module 16 connected with the tested daughter board 2 and used for the automatic burning process of the tested chip.

The host computer can communicate each other with by measuring between the daughter board, and the host computer can pass through the corresponding module of communication control and accomplish experimental operation on measuring the daughter board, and the module can upload the test data on measuring the daughter board to the host computer, and the host computer utilizes data processing module to accomplish data analysis and processing.

Fig. 2 is a structural diagram of a first experimental teaching test introduced by the embodiment of the present invention. The host computer controls the adjustable voltage source module to supply power for the experimental circuit on the tested daughter board, controls the adjustable electronic load module to change the resistance value in the circuit of the tested daughter board, controls the ammeter module and the voltmeter module to test the voltage in the circuit of the tested daughter board, and simultaneously, each module transmits the output and detected data back to the host computer, if the adjustable voltage source module can feed back the output voltage to the host computer in real time, the adjustable electronic load module can feed back the resistance value to the host computer in real time, and the voltmeter module and the ammeter module can feed back the voltage and the current detection value to the host computer. The host sends the test data to the data processing module for data processing and analysis, and a chart is generated and displayed.

Fig. 3 is a structural diagram of a second experimental teaching test introduced by the embodiment of the present invention. The host machine controls a power supply on the daughter board to be tested to supply power to the experimental circuit, controls the adjustable voltage source module to input adjustable voltage from high to low or from low to high to the pin of the chip to be tested on the daughter board, controls the oscilloscope module to detect the level state at the other pin of the chip to be tested, and simultaneously, the voltage source module and the oscilloscope module return the output result and the detection result to the host machine. The host sends the test data to the data processing module for data processing and analysis, and a chart is generated and displayed.

Fig. 4 is a structural diagram of a third experimental teaching test introduced in the embodiment of the present invention. The host machine controls a power supply on the tested daughter board to supply power to the experimental circuit, controls the adjustable voltage source module to input a reference voltage to the VIN + pin of the operational amplification chip on the tested daughter board, controls the oscilloscope module to detect a voltage signal at the VOUT pin of the operational amplification chip, and simultaneously, the voltage source module and the oscilloscope module return an output result and a detection result to the host machine. The host sends the test data to the data processing module for data processing and analysis, and a chart is generated and displayed.

Fig. 5 is a structural diagram of a fourth experimental teaching test introduced in the embodiment of the present invention. The host computer controls the power supply on the daughter board to be tested to supply power to the experimental circuit, the vector testing module is controlled to input digital logic level into an SDA pin and an ALERT pin of an ADC chip on the daughter board to be tested, the adjustable voltage source module is controlled to input voltage to a Vin pin, the ADC chip can send a detection result to the logic analysis module for analysis through an SCL pin, then the logic analysis module uploads the analysis result to the host computer, and meanwhile, the voltage source module and the vector testing module return the output result to the host computer. The host sends the test data to the data processing module for data processing and analysis, and a chart is generated and displayed.

The above description is only for the specific embodiments of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art can easily think of various equivalent modifications or replacements within the technical scope of the present invention, and these modifications or replacements should be covered within the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims (10)

1. The multifunctional integrated circuit experiment test equipment is characterized by comprising a host, a tested daughter board, an adjustable voltage source module, an adjustable electronic load module, a waveform generator module, a vector test module, a serial port transceiving module, a voltage detection module, a current detection module, a resistance tester module, an oscilloscope module and a logic analysis module, wherein the adjustable voltage source module, the adjustable electronic load module, the waveform generator module, the vector test module, the serial port transceiving module, the voltage detection module, the current detection module, the resistance tester module, the oscilloscope module and the logic analysis module are respectively connected between the host and the tested daughter board.

2. The multifunctional integrated circuit experiment testing equipment according to claim 1, further comprising a temperature adjusting module, an abnormality alarming module, and a data table/graph processing module, which are respectively in communication connection with the host.

3. The multifunctional integrated circuit experiment testing equipment as recited in claim 2, wherein the temperature adjusting module comprises a temperature sensor and a cooling and heating unit connected with each other;

the abnormity alarm module adopts an acousto-optic alarm;

the data table/graph processing module comprises a processor and a memory which are connected with each other.

4. The multifunctional integrated circuit testing apparatus of claim 1, further comprising a chip burn-in module connected to the daughter board under test.

5. The multifunctional integrated circuit experimental test equipment as claimed in claim 1, further comprising an anti-static alarm device for preventing irregular electrostatic operation.

6. The multifunctional integrated circuit experimental test equipment of claim 1, wherein the adjustable voltage source module comprises a voltage source and a current limiting protection circuit which are connected with each other;

the adjustable electronic load module adopts a voltage load or a current load or a resistance load;

the vector test module comprises a 3.3V logic level output circuit and a 5.0VV logic level output circuit;

the serial port transceiver module adopts a UART communication circuit.

7. The multifunctional integrated circuit experiment testing equipment of claim 1, wherein the voltage detection module employs a voltmeter; the current detection module adopts an ammeter; the logic analysis module adopts a logic level conversion circuit.

8. The multifunctional integrated circuit experiment test equipment according to claim 1, wherein the daughter board under test comprises:

exciting the lead-in interface;

a signal output interface;

a communication interface for communicating with a host;

the expansion interface is used for being in communication connection with various testing instruments;

the circuit protection module is used for short-circuit protection of the circuit of the tested daughter board;

and the integrated circuit testing module is used for carrying out corresponding experimental tests.

9. A multifunctional ic experimental test apparatus as in claim 8, wherein said daughter board under test contains a plurality of ic test modules.

10. The multifunctional integrated circuit experiment testing equipment of claim 1, wherein the host is provided with a visual operation interface.

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