CN217007388U - Test piece - Google Patents
Test piece Download PDFInfo
- Publication number
- CN217007388U CN217007388U CN202121690293.2U CN202121690293U CN217007388U CN 217007388 U CN217007388 U CN 217007388U CN 202121690293 U CN202121690293 U CN 202121690293U CN 217007388 U CN217007388 U CN 217007388U
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- Prior art keywords
- test
- conductive part
- conductive
- elastic
- component
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- 238000012360 testing method Methods 0.000 title claims abstract description 90
- 239000000758 substrate Substances 0.000 claims abstract description 11
- 238000009434 installation Methods 0.000 claims abstract description 9
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 7
- 239000010931 gold Substances 0.000 claims description 6
- 229910052737 gold Inorganic materials 0.000 claims description 6
- 238000007747 plating Methods 0.000 claims description 6
- 239000000853 adhesive Substances 0.000 abstract description 13
- 230000001070 adhesive effect Effects 0.000 abstract description 13
- 230000000694 effects Effects 0.000 abstract description 5
- 230000002349 favourable effect Effects 0.000 abstract description 3
- 238000004519 manufacturing process Methods 0.000 abstract description 3
- 230000003014 reinforcing effect Effects 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 238000000034 method Methods 0.000 description 2
- 241001391944 Commicarpus scandens Species 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 230000003203 everyday effect Effects 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model discloses a test piece, which is arranged between a circuit board and pins of a test component, the test piece comprises an elastic test piece substrate and an insulating elastic piece, the test piece substrate comprises an installation part and a plurality of conductive parts, the installation part is fixed on the circuit board, the conductive parts comprise a first conductive part and a second conductive part, the first conductive part is electrically connected with the circuit board, the second conductive part is contacted with the pins of the test component, the elastic piece is positioned below the second conductive part, and the upper end of the elastic piece is abutted against the lower end of the second conductive part. Because the second conductive part department with the pin contact of test components and parts is provided with the elastic component, the elastic component not only provides a support for second conductive part and test components and parts, can also pass through the cushioning effect of elastic component, be favorable to the pin of test components and parts and second conductive part to keep inseparable contact, the stability of reinforcing test, compare in conductive adhesive, the test piece in this application has high stability and longer life, thereby reduction in production cost and the stability of assurance test.
Description
Technical Field
The utility model relates to the technical field of passive component testing, in particular to a test piece.
Background
With the popularization of electronic products, the application amount of passive components is larger and larger, and the test of the passive components is an indispensable process in order to ensure the reliability and performance of the passive components. The filter is one of common passive components, and the current test mode process of the filter is usually to add conductive adhesive on a PCB test board. However, if the toughness of the traditional conductive adhesive is too strong, the conductive adhesive is extremely easy to break, an inelastic probe is arranged inside the conductive adhesive, and the conductive adhesive is cracked after being used for many times, so that the problems of poor stability and short service life of the conductive adhesive are caused, the conductive adhesive needs to be replaced frequently, and the position of the conductive adhesive can be replaced only after the test is stopped, so that the test efficiency is influenced, and the problem of low test efficiency is caused; in addition, as the cost of the conductive adhesive is high, the cost of one conductive adhesive is about 2000 yuan, and for large and medium-sized enterprises, a plurality of test devices are required to be operated simultaneously, so that the high cost is required to be lost every day.
SUMMERY OF THE UTILITY MODEL
The technical problem to be solved by the present invention is to provide a test strip, which replaces the existing conductive adhesive to solve the problems proposed in the background art.
A test piece is arranged between a circuit board and a pin of a test component and comprises a test piece substrate with elasticity and an insulating elastic piece, wherein the test piece substrate comprises an installation part and a plurality of conductive parts, the installation part is fixed on the circuit board, the conductive parts comprise a first conductive part and a second conductive part, the first conductive part is electrically connected with the circuit board, the second conductive part is in contact with the pin of the test component, the elastic piece is positioned below the second conductive part, and the upper end of the elastic piece is abutted to the lower end of the second conductive part.
Further, the elastic piece is an elastic rubber mat.
Further, the shore a hardness of the elastic member is 10 degrees or more.
Further, the size of one end of the second conductive part, which is in contact with the test component, is larger than the size of the pin of the test component.
Furthermore, one end of the second conductive part, which is in contact with the pins of the test component, is provided with a tilting part.
Furthermore, a gold plating layer is arranged at one end of the second conductive part, which is in contact with the pin of the test component.
Compared with the prior art, the utility model has the beneficial effects that: because second conductive part department with the pin contact of test components and parts is provided with the elastic component, elastic component butt in second conductive part, not only provide a support for second conductive part and test components and parts, can also pass through the cushioning effect of elastic component, be favorable to the pin of test components and parts and second conductive part to keep inseparable contact, strengthen the stability of test, compare in the conducting resin among the prior art, the test piece in this application has high stability and long service life's advantage, thereby production cost has been reduced and the stability of test has been guaranteed.
Drawings
Fig. 1 is a schematic structural diagram of a test strip provided in embodiment 1 of the present invention.
Fig. 2 is a schematic structural diagram of a test strip provided in embodiment 2 of the present invention.
Description of the reference numerals: 1. testing the components; 2. a test piece substrate; 3. an elastic member; 4. an installation part; 5. a first conductive portion; 6. a second conductive portion; 7. a raised part.
Detailed Description
The present invention will now be described in further detail with reference to the accompanying drawings. These drawings are simplified schematic diagrams each illustrating the basic structure of the present invention only in a schematic manner, and thus show only the constitution related to the present invention.
In the present invention, it should be noted that the terms "upper", "lower", "inner", "outer", etc. indicate orientations or positional relationships based on those shown in the drawings, which are merely for convenience of describing the present invention and simplifying the description, but do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and be operated, and thus should not be construed as limiting the present invention; the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance; furthermore, unless expressly stated or limited otherwise, the terms "mounted," "connected," and "connected" are to be construed broadly, as they may be fixedly connected, detachably connected, or integrally connected, for example; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in a specific case to those of ordinary skill in the art.
Example 1
Referring to fig. 1, a test strip is disposed between a circuit board and pins of a test device 1, and the test strip includes a test strip substrate 2 having elasticity and an insulating elastic member 3, for example, the test strip substrate 2 is made of a base material having a spring sheet with a certain thickness, and the certain thickness effectively improves the elastic performance of the test strip substrate 2. Test piece base plate 2 includes installation department 4 and a plurality of conductive part, installation department 4 is fixed in the circuit board, wherein, the quantity of conductive part depends on the quantity of the pin of test components and parts 1, the conductive part includes first conductive part 5 and second conductive part 6, first conductive part 5 is configured to be used for being connected with the circuit board electricity, second conductive part 6 is configured to be used for contacting with the pin of test components and parts 1, elastic component 3 is located 6 below the second conductive part, and 3 upper end butt of elastic component in 6 lower extremes of second conductive part.
Preferably, the appearance of the test piece needs to be consistent with the gold wire layout drawing of the circuit board, one end of the second conductive part 6 of the test piece, which is in contact with the pins of the test component 1, is arranged according to the position and the size of the pins of each test component 1 and is consistent with the position and the size of the pins of the test component 1, and through the arrangement, the test effect of the test piece can be improved.
In order to ensure that the pins of the test component 1 are completely attached to the second conductive part 6, the size of the second conductive part 6 is larger than that of the pins of the test component 1, so that the pins of the test component 1 and the second conductive part 6 are in a surface contact mode, the test component 1 can be in good contact with the second conductive part 6 conveniently, and the contact loss is reduced.
Further, the end of the second conductive part 6 that contacts the pin of the test component 1 is provided with a gold plating layer (not shown). For example, the surface of the second conductive part 6 is subjected to gold plating treatment to form the gold plating layer, and by performing the gold plating treatment on the surface of the second conductive part 6, good contact with the product can be enhanced, and impedance loss during transmission can be reduced.
In this embodiment, the elastic member 3 is an elastic rubber pad, and the shore a hardness of the elastic member 3 is 10 degrees or more.
In conclusion, the test piece that this embodiment provided, because second conductive part 6 department with the pin contact of test components and parts 1 is provided with elastic component 3, elastic component 3 butt in second conductive part 6, not only provide a support for second conductive part 6 and test components and parts 1, can also pass through the cushioning effect of elastic component 3, be favorable to pin and the second conductive part 6 of test components and parts 1 to keep inseparable contact, strengthen the stability of test, compare in the conductive adhesive among the prior art, the test piece in this application has high stability and long service life's advantage, thereby manufacturing cost has been reduced and the stability of test has been guaranteed.
Example 2
Referring to fig. 2, based on embodiment 1, the end of the second conductive part 6 provided in this embodiment, which is in contact with the pins of the testing component 1, has a raised part 7, and the raised part 7 is arranged to further improve the elastic performance of the testing sheet, so that the elastic performance of the testing sheet substrate is directly adopted to make the second conductive part 6 in contact with the pins of the testing component 1, thereby achieving the stability of the testing effect.
In the description of the present specification, reference to the description of "one embodiment", "certain embodiments", "illustrative embodiments", "examples", "specific examples", or "some examples" or the like means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the utility model. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
While there have been shown and described what are at present considered to be the basic principles and essential features of the utility model and advantages thereof, it will be apparent to those skilled in the art that the utility model is not limited to the details of the foregoing illustrative embodiments, but is capable of other specific forms without departing from the spirit or essential characteristics thereof. The present embodiments are therefore to be considered in all respects as illustrative and not restrictive, the scope of the utility model being indicated by the appended claims rather than by the foregoing description, and all changes which come within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference sign in a claim should not be construed as limiting the claim concerned.
Furthermore, it should be understood that although the present description refers to embodiments, not every embodiment may contain only a single embodiment, and such description is for clarity only, and those skilled in the art should integrate the description, and the embodiments may be combined as appropriate to form other embodiments understood by those skilled in the art.
Claims (6)
1. A test piece is arranged between a circuit board and a pin of a test component and is characterized by comprising a test piece substrate with elasticity and an insulating elastic piece, wherein the test piece substrate comprises an installation part and a plurality of conductive parts, the installation part is fixed on the circuit board, the conductive parts comprise a first conductive part and a second conductive part, the first conductive part is electrically connected with the circuit board, the second conductive part is in contact with the pin of the test component, the elastic piece is positioned below the second conductive part, and the upper end of the elastic piece is abutted to the lower end of the second conductive part.
2. The test strip of claim 1, wherein the elastic member is an elastic rubber pad.
3. The test strip of claim 2, wherein the Shore A hardness of the elastic member is greater than 10 degrees.
4. The test strip of claim 1, wherein a size of an end of the second conductive portion contacting the test component is larger than a pin size of the test component.
5. The test strip of claim 1, wherein an end of the second conductive portion contacting the leads of the test component has a raised portion.
6. The test strip according to claim 1, wherein an end of the second conductive portion contacting the lead of the test component is provided with a gold plating layer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121690293.2U CN217007388U (en) | 2021-07-23 | 2021-07-23 | Test piece |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121690293.2U CN217007388U (en) | 2021-07-23 | 2021-07-23 | Test piece |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN217007388U true CN217007388U (en) | 2022-07-19 |
Family
ID=82366892
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202121690293.2U Active CN217007388U (en) | 2021-07-23 | 2021-07-23 | Test piece |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN217007388U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113625009A (en) * | 2021-07-23 | 2021-11-09 | 金动力智能科技（深圳）有限公司 | Test piece |
-
2021
- 2021-07-23 CN CN202121690293.2U patent/CN217007388U/en active Active
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113625009A (en) * | 2021-07-23 | 2021-11-09 | 金动力智能科技（深圳）有限公司 | Test piece |
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| GR01 | Patent grant | ||
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