CN216954935U - Variable amplification factor optical lever photoelectric measurer - Google Patents

Abstract

The utility model provides a variable amplification factor optical lever photoelectric measuring device, which is used for measuring the impulse generated by the thruster during operation, and comprises an optical platform, a laser, a mounting bracket, an impulse measuring device for detecting the impulse of a miniature power device, a first plane Reflector, rotating bracket, plane reflector group and photoelectric position sensor; the plane reflector group includes a displacement mechanism for adjusting the size of the optical path and two or more second plane reflectors arranged oppositely, and the second plane mirrors are relatively arranged on the displacement mechanism On the upper side, the displacement mechanism is used to adjust the distance between the second plane mirrors in the X-axis direction and the distance in the Y-axis direction; the first photoelectric position sensor and the second photoelectric position sensor are used for receiving the light signal reflected by the plane mirror group; The utility model can enable the impulse measuring device to realize the measurement of micro-impulse in a large range spanning multiple orders of magnitude, and can adjust the range of the impulse measuring device by automatically adjusting the optical path.

Description

A variable amplification factor optical lever photoelectric measuring instrument

technical field

The utility model relates to the technical field of photoelectric measuring devices, in particular to a variable amplification factor optical lever photoelectric measuring device.

Background technique

At present, micro air-conditioning propulsion system, micro chemical propulsion system and micro electric propulsion system have become the emerging technology fields of energy system and propulsion power research due to their outstanding characteristics and excellent performance.

In the process of ground experiments, it is necessary to use a vacuum chamber to provide a simulated space working environment for the propulsion system, and install the propulsion system on torsion pendulum, inverted pendulum and other types of micro-thrust and micro-impulse measurement equipment to measure its output thrust or impulse. In the process of use, the vacuum chamber needs to be closed and evacuated after the measurement equipment is balanced and adjusted; when the air is drawn out, the airflow will cause a certain disturbance to the components of the measurement equipment, and due to the disappearance of air buoyancy, the structural components of the measurement equipment are If an action occurs, the balance of the measurement equipment is unbalanced, and the measurement optical path has a certain deviation; The optical path design of the micro-impulse measurement system is fixed, and it does not have the ability to automatically adjust the optical path, which greatly increases the trouble for researchers to use.

In order to solve the above technical problems, the patent number in China is 202122244859.5, and the announcement date is 2022.02.18. This patent document discloses a laser light path adjustment device for a micro thrust measurement device. The technical solution provides a laser optical path adjustment device for the micro thrust measurement device. The device, through the laser fine-tuning stage and the position sensor fine-tuning stage, can perform micron-level calibration on the laser spot and the photoelectric position sensor PSD, and both are adjusted by motor drive, so they can be remotely operated outside the vacuum chamber.

According to the technical solution disclosed in this patent document, although the problem of repeatedly opening the vacuum chamber to calibrate the pipeline can be solved, the range cannot be changed. Moreover, the laser optical path in this technical solution is fixed and cannot be adjusted, so it can only meet the measurement of micro-impulse in a certain order of magnitude, while the measurement range of the existing torsion pendulum can generally meet the measurement of impulse across two orders of magnitude. For the impulse measurement of aerospace micro-thrusters with the smallest nano-micron-second level and the largest milli-Nu-second level, the range is not enough, the minimum resolution capability is not high, and the measurement accuracy is low. Under the action of this magnitude of impulse, the mechanical response output of the measuring platform is extremely small (the torsion angle is extremely small), while under the action of a large order of magnitude impulse (such as the millisecond-order impulse), the mechanical response output of the measuring platform is large (the torsion angle is at this time). It is relatively large), limited by the measurement range of the sensor used, it is difficult to meet the measurement requirements of the measurement platform mechanics across a large range of mechanical response output under the action of different orders of magnitude impulse. The measurement requires adjustment or replacement of the measurement optics or the device structure, which is costly and complicated to use.

SUMMARY OF THE INVENTION

The utility model provides a variable amplification factor optical lever photoelectric measuring device. Using the structure of the utility model, the impulse measuring device can realize the measurement of a large range of micro impulses spanning multiple orders of magnitude, and the impulse measuring device can be adjusted by adjusting the optical path. range, the structure is simple.

In order to achieve the above-mentioned purpose, the technical scheme of the present utility model is: a variable amplification factor optical lever photoelectric measuring device for measuring the impulse generated when the thruster works, including an optical platform; the optical platform is provided with a laser, a mounting bracket, An impulse measuring device, a first plane mirror, a rotating bracket, a plane mirror group, a first photoelectric position sensor, a second photoelectric position sensor, a signal processing circuit and a controller for detecting the impulse of a micro power device.

The laser is used to emit light signals, and the laser is set on the optical table through the mounting bracket.

The first plane mirror is used to reflect and adjust the reflection angle of the optical signal emitted by the laser, and reflect the optical signal emitted by the laser into the plane mirror group. The first plane mirror is rotated and coupled to the impulse measuring device, and the first plane reflects The mirror and the impulse measuring device are rotated and arranged on the optical platform through the rotating bracket, the rotation axis of the first plane mirror is parallel to the reflection surface of the first plane mirror, and the first plane mirror is located in the irradiation range of the laser; the thruster is coupled On the swing arm of the impulse measuring device, under the action of the thruster, the swing arm rotates around the rotation axis of the swing arm, and at the same time drives the first plane mirror to rotate around the rotation axis of the first plane mirror, and the rotation angle of the swing arm is the same as that of the first plane The mirror rotation angle is the same.

The plane reflection mirror group is used to receive and amplify the optical path of the light signal reflected by the first plane reflection mirror, the plane reflection mirror group is arranged on the optical platform, and the light incident end of the plane reflection mirror group is located relative to the first plane reflection mirror. the other side of the laser.

The first photoelectric position sensor and the second photoelectric position sensor are used to receive the light signal reflected by the plane mirror group, and the first photoelectric position sensor and the second photoelectric position sensor are respectively arranged on the side of the optical platform at the light-emitting end of the plane mirror group, And the second photoelectric position sensor is located on the side of the first photoelectric position sensor away from the plane mirror group.

The plane mirror group includes a displacement mechanism for adjusting the size of the optical path and two sets of second plane mirrors arranged oppositely. The two groups of second plane mirrors are relatively arranged on the displacement mechanism, and the displacement mechanism is used to adjust the reflection of the second plane The distance between the mirrors in the X-axis direction and the distance in the Y-axis direction.

One end of the signal processing circuit is electrically connected to the first photoelectric position sensor and the second photoelectric position sensor respectively, and the other end of the signal processing circuit is electrically connected to the controller; the controller is electrically connected to the displacement mechanism.

With the above settings, the laser emits an optical signal, and the optical signal is reflected by the first plane mirror and two or more second plane mirrors in turn and then irradiated onto the first photoelectric position sensor or the second photoelectric position sensor; when impulse measurement is performed , the impulse measuring device rotates under the action of the micro power device. Since the impulse measuring device is fixedly connected with the first plane mirror and is rotated on the same axis of rotation, the first plane mirror rotates with the rotation of the impulse measuring device, and the first plane reflects The mirror rotates at the same angle as the impulse measuring device. After the first plane mirror rotates, the angle of reflection changes. The optical signal is reflected into the plane mirror group by the first plane mirror after changing the angle, and then the optical signal passes through the first plane mirror in turn. The plane mirror and two or more second plane mirrors reflect and illuminate the detection range of the first photoelectric position sensor or the second photoelectric position sensor; the signal processing circuit illuminates the first photoelectric position sensor or the second photoelectric position sensor twice before and after. The light signal sensed by the photoelectric position sensor is processed and then sent to the controller. According to the information fed back by the controller, the user can use the controller to control the displacement mechanism to control the displacement mechanism to adjust the positional relationship between the second plane mirrors, changing more The optical path formed by the reflection between the two second plane mirrors further enlarges or reduces the optical path size of the optical signal, so as to realize the adjustment of the optical path by adjusting the optical path. Due to the different types and initial energy levels of the micro-power device, when the output impulse of the micro-power device is in the range of 100nN•s～1N•s spanning many orders of magnitude, when the output impulse of the micro-power device is very small, the corresponding mechanical output of the micro-impulse measuring bench is extremely weak. , the rotation angle is extremely small, and it is extremely difficult to achieve high-precision and accurate measurement of such a small impulse. However, the optical path is enlarged by the displacement mechanism, so as to improve the measurement accuracy when the impulse is small, until the optical signal spot is in the The displacement of the first photoelectric position sensor is the largest. At this time, the first photoelectric position sensor outputs the maximum voltage signal, and the second photoelectric position sensor does not receive the light signal irradiation, that is to say, there is no signal output. At this time, it can reach the impulse of this magnitude. , which can measure and measure the best resolution at the same time. When the output impulse generated by the micro power device is large, the displacement of the optical signal is too large, which exceeds the detection range of the first photoelectric position sensor. At this time, there will be a signal output on the second photoelectric position sensor, and the user can use the controller to control the displacement. Mechanism control The displacement mechanism adjusts the positional relationship between the second plane mirrors, changes the optical path formed by reflection between multiple second plane mirrors, and reduces the optical path size of the optical signal until the laser spot has the largest displacement in the first photoelectric position sensor , at this time, the first photoelectric position sensor outputs the maximum voltage signal, and the second photoelectric position sensor does not receive the light signal irradiation. At this time, it can reach the impulse of this magnitude, which can not only measure, but also has the best measurement resolution. Through the above method, the impulse measurement device can realize the measurement of micro-impulse in a large range spanning multiple orders of magnitude, and by adjusting the appropriate range according to actual needs, the influence of measurement error is reduced, the measurement accuracy is improved, and the resolution is further improved; On the one hand, the structure and composition of adjusting the optical path of the plane mirror group is simple, and the optical path of the optical path is adjusted by the plane reflector group, which overcomes the problems of complicated optical path setting and high system cost of the measuring equipment in the prior art.

Further, the displacement mechanism includes two or more X-axis moving mechanisms, two or more X-axis driving mechanisms, two Y-axis moving mechanisms and two or more Y-axis driving mechanisms, and the controller is respectively connected with the X-axis driving mechanism and the Y-axis driving mechanism. The shaft driving mechanism is electrically connected; two Y-axis moving mechanisms are arranged in parallel on the optical table, and each Y-axis moving mechanism is movably provided with more than one X-axis moving mechanism; each X-axis moving mechanism is correspondingly provided with an X-axis Drive mechanism and Y-axis drive mechanism; the Y-axis drive mechanism is used to drive the X-axis moving mechanism to move along the length direction of the Y-axis moving mechanism; the X-axis drive mechanism is used to drive the second plane mirror to move in the X-axis direction, thereby adjusting The distance between the second plane mirrors in the X-axis direction; the above settings, when adjusting in the X-axis direction, the X-axis moving mechanism can be driven by driving the X-axis drive mechanism, so as to adjust the second plane in the X-axis direction. The distance between the mirrors; when adjusting in the Y-axis direction, the Y-axis moving mechanism can be driven by driving the Y-axis drive mechanism to adjust the distance between the second plane mirrors in the Y-axis direction; in this way, the controller The relative distance between the second plane mirrors can be adjusted by controlling the X-axis driving mechanism and the Y-axis driving mechanism.

Further, each Y-axis moving mechanism is provided with more than two X-axis moving mechanisms, and each X-axis moving mechanism is correspondingly provided with an X-axis driving mechanism; each group of second plane mirrors includes more than two second planes Reflector, each X-axis moving mechanism is provided with a second plane mirror; Y-axis moving mechanism is arranged along the Y-axis direction on the optical platform, and each Y-axis moving mechanism is provided with two X-axis moving mechanisms The axis moving mechanism is arranged along the X-axis direction of the optical table; the X-axis moving mechanism on one Y-axis moving mechanism and the X-axis moving mechanism on the other Y-axis moving mechanism are arranged oppositely; by adjusting the distance between the second plane mirrors , so that the optical signal is reflected once on each second plane mirror; in the above setting, since the optical signal is only reflected once on the same second plane mirror, the position of each second plane mirror can be controlled independently by controlling, thereby The position of each reflection of the optical signal is controlled, so that the optical path can be controlled and adjusted according to actual needs, making the design of the optical path more flexible and controllable, and making the design of the optical path more refined.

Further, each Y-axis moving mechanism is provided with an X-axis moving mechanism, and each X-axis moving mechanism is correspondingly provided with an X-axis driving mechanism; each group of second plane mirrors includes a second plane mirror, each Each X-axis moving mechanism is provided with a second plane mirror; the Y-axis moving mechanism is arranged on the optical platform along the Y-axis direction, and each Y-axis moving mechanism is provided with an X-axis moving mechanism, and the X-axis moving mechanism is along the optical axis. The X-axis direction of the platform is set; the X-axis moving mechanism on one Y-axis moving mechanism is set relative to the X-axis moving mechanism on the other Y-axis moving mechanism; by adjusting the distance between the second plane mirrors, the optical signal is Each second plane mirror is reflected more than twice; with the above settings, since the optical signal is reflected on the same second plane mirror more than twice, the movement of the second plane mirror on one side can be controlled to complete the reflection of multiple reflection points. The adjustment can quickly adjust the optical path, so that the adjustment of the range can be quickly completed. In this setting, multiple reflections can be realized only by using two second plane mirrors, and the structure is simple.

Further, the second plane mirror is fixedly arranged on one end of the X-axis moving mechanism, and the X-axis driving mechanism drives the X-axis moving mechanism to move relative to the Y-moving mechanism in the X-axis direction to adjust the distance between the second plane mirrors. The distance in the X-axis direction; the above setting, the second plane mirror is fixed on one end of the X-axis moving mechanism, and then the X moving mechanism is relative to the Y moving mechanism to adjust the movement of the second plane mirror, and the structure is simple.

Further, the X-axis moving mechanism is provided with a lens fixture, the second plane mirror is mounted on the X-axis moving mechanism through the lens fixture, and the distance between the second plane reflector and the optical platform can be adjusted through the lens fixture, and the above Setting, the adjustment of the second plane mirror in the Z-axis direction is adjusted by the lens fixture, so as to further meet the reflection requirements of the laser light between the second plane mirrors.

Further, the second plane reflection mirrors are arranged in parallel with each other, and the above arrangement enables the second plane reflection mirror to better receive the reflected light.

Description of drawings

FIG. 1 is a principle block diagram of Embodiment 1 of the present invention.

FIG. 2 is a principle block diagram of Embodiment 2 of the present invention.

Fig. 3 is the measuring principle diagram of the light lever in the utility model.

FIG. 4 is a schematic diagram of optical lever measurement in the prior art.

Reference signs: 1. Optical table; 2. Laser; 21. Mounting bracket; 3. Impulse measuring device; 31. First plane mirror; 4. Plane mirror group; 411, X-axis moving mechanism; 412, X-axis Driving mechanism; 421, Y-axis moving mechanism; 422, Y-axis driving mechanism; 43, second plane mirror; 51, first photoelectric position sensor; 52, second photoelectric position sensor; 61, signal processing circuit; 62, control 7. Optical path.

Detailed ways

The present utility model will be further described in detail below with reference to the accompanying drawings and specific embodiments.

As shown in Figure 1-Figure 3, a variable amplification factor optical lever photoelectric measuring device is used to measure the impulse generated when the thruster works, including an optical platform 1 (refer to Figure 1-Figure 2); There are a laser 2, a mounting bracket 21, an impulse measuring device 3 for detecting the impulse of a micro power device, a first plane mirror 31, a rotating bracket (not shown in the figure) plane mirror group 4, a first photoelectric position sensor 51, The second photoelectric position sensor 52 , the signal processing circuit 61 and the controller 62 .

The laser 2 is used to emit light signals, and the laser 2 is arranged on the optical table 1 through the mounting bracket 21 ; the impulse measuring device is arranged on the optical table and is located on one side of the laser 2 .

The first plane reflection mirror 31 is used to reflect and adjust the reflection angle of the optical signal emitted by the laser 2, to reflect the optical signal emitted by the laser 2 into the plane reflection mirror group 4, and the first plane reflection mirror 31 is rotatably coupled to the impulse measuring device, The rotation axis of the first plane mirror 31 is parallel to the reflection surface of the first plane mirror 31, and the first plane mirror 31 is located within the irradiation range of the laser 2; the thruster is coupled to the swing arm of the impulse measuring device 3, and is The thruster acts to rotate the lower swing arm around the rotation axis of the swing arm, and drives the first plane mirror to rotate around the rotation axis of the first plane mirror at the same time.

The impulse measuring device can be an impulse measuring device of various structure types such as inverted pendulum type, torsion pendulum type, twisted wire structure, multi-pendulum, etc. in the prior art. The utility model can install the first plane mirror in the prior art. In the various impulse measuring devices in , the swing arm rotates around the rotation axis of the swing arm under the action of the thruster, and at the same time drives the first plane mirror to rotate around the rotation axis of the first plane mirror, so that the first plane mirror can obtain With the same rotation angle as the swing arm, the thrust can be calculated from the difference in spot displacement.

The plane reflection mirror group 4 is used to receive the optical signal reflected by the first plane reflection mirror 31, adjust the optical path of the optical signal (that is, the path that light travels through the medium), and amplify or reduce the optical path of the optical signal. The mirror group 4 is arranged on the optical table 1 , and the light incident end of the plane mirror group 4 is located on the other side of the first plane mirror 31 relative to the laser 2 .

The first photoelectric position sensor 51 and the second photoelectric position sensor 52 are used to receive the light signal reflected by the plane mirror group 4. The first photoelectric position sensor 51 and the second photoelectric position sensor 52 are respectively arranged on the optical platform 1 and located at the plane mirror. The second photoelectric position sensor 52 is located on the side of the first photoelectric position sensor 51 away from the plane mirror group 4 .

The plane mirror group 4 includes a displacement mechanism for adjusting the size of the optical path and more than two groups of second plane mirrors 43 arranged oppositely. The second plane mirrors are relatively arranged on the displacement mechanism, and the displacement mechanism is used to adjust the second plane. The distance between the mirrors in the X-axis direction and the distance in the Y-axis direction.

One end of the signal processing circuit 61 is electrically connected to the first photoelectric position sensor 51 and the second photoelectric position sensor 52, respectively, and the other end of the signal processing circuit 61 is electrically connected to the controller 62. The signal processing circuit 61 is used for converting the first photoelectric position The analog signal received by the sensor 51 and the second photoelectric position sensor 52 is converted into a digital signal and transmitted to the controller 62 for providing the basic data of the corresponding relationship between the impulse and the displacement of the micro-impulse measuring device; the controller 62 is electrically connected with the displacement mechanism, according to the The controller 62 receives the digital signal from the signal processing circuit 61 and uses the controller to control the movement of the displacement mechanism, thereby adjusting the distance between the second plane mirrors in the X-axis direction and the distance in the Y-axis direction.

In this embodiment, before use, since the first plane reflection mirror 31 is rotated and set by the rotating bracket, the first plane reflection mirror 31 is a parallelogram, and the light exit angle of the laser 2 needs to be adjusted in advance, so that the optical signal emitted by the laser 2 It is irradiated on the center line of the first plane mirror 31, and the center line of the first plane mirror 31 is parallel to the rotation center axis of the rotating bracket. The lasers 2 are arranged in parallel, so that the optical signal emitted by the laser 2 and reflected by the plane mirror group 4 is vertically irradiated on the photosensitive surface of the first photoelectric position sensor 51 or the second photoelectric position sensor 52 .

With the above settings, the laser 2 emits an optical signal, and the optical signal is reflected by the first plane mirror 31 and two or more second plane mirrors 43 in turn and then irradiated on the first photoelectric position sensor 51 or the second photoelectric position sensor 52, The optical path 7 is formed; when the impulse measurement is performed, the impulse measuring device rotates under the action of the micro power device. Since the impulse measuring device 3 is fixedly connected with the first plane mirror 31 and is rotated on the same rotation axis, the first plane mirror 31 As the impulse measuring device 3 rotates and rotates, the first plane mirror 31 rotates at the same angle as the impulse measuring device 3. After the first plane mirror 31 rotates, the angle of reflection changes, and the optical signal passes through the first plane with the changed angle. The reflector 31 is reflected into the plane reflector group 4 , and then the optical signal is reflected by the first plane reflector 31 and two or more second plane reflectors 43 in turn and then irradiated to the first photoelectric position sensor 51 or the second photoelectric position sensor 52 The signal processing circuit 61 processes the sensed light signals irradiated on the first photoelectric position sensor 51 or the second photoelectric position sensor 52 twice before and after, and then transmits them to the controller 62, according to the information fed back by the controller 62. , the user uses the controller 62 to control the displacement mechanism to adjust the positional relationship between the second plane mirrors 43, change the optical path 7 formed by reflection between the plurality of second plane mirrors 43, and then enlarge or reduce the optical path size of the optical signal , so that the optical path can be adjusted by adjusting the optical path 7 . Due to the different types and initial energy levels of the micro power device, when the output impulse of the micro power device is in the range of 100nN·s～1N·s across many orders of magnitude, when the output impulse of the micro power device 3 is very small (for example, it is in the order of micron seconds), at this time The mechanical corresponding output of the micro-impulse measurement bench is extremely weak, and the rotation angle is extremely small. It is extremely difficult to achieve high-precision and accurate measurement of such a small impulse. However, the optical path is enlarged by the displacement mechanism. Improve the measurement accuracy until the optical signal spot has the largest displacement in the first photoelectric position sensor 51. At this time, the first photoelectric position sensor 51 outputs the maximum voltage signal, and the second photoelectric position sensor 52 does not receive the light signal irradiation, that is to say, there is no signal. At this time, the output can be reached under the action of impulse of this magnitude, which can not only be measured, but also has the best measurement resolution. However, when the output impulse generated by the micro-power device is relatively large (for example, in the order of milli-N seconds), the displacement of the optical signal is too large and exceeds the detection range of the first photoelectric position sensor 51 . Signal output, the user can use the controller 62 to control the displacement mechanism to control the displacement mechanism to adjust the positional relationship between the second plane mirrors 43, change the optical path formed by the reflections between the plurality of second plane mirrors 43, and reduce the light of the optical signal. until the laser spot has the largest displacement at the first photoelectric position sensor, at this time the first photoelectric position sensor outputs the maximum voltage signal, and the second photoelectric position sensor 52 does not receive the light signal irradiation, at this time, the impulse effect of this magnitude can be achieved. It can not only measure, but also has the best measurement resolution. Through the above method, the impulse measurement device 3 can realize the measurement of a large range of micro-impulse spanning multiple orders of magnitude, and by adjusting the appropriate range according to the actual needs, the influence of the measurement error is reduced, the measurement accuracy is improved, and the resolution is improved; On the one hand, the plane mirror group has a simple structure for adjusting the optical path, and the optical path of the optical path is adjusted by the plane mirror group, which overcomes the problems of complicated optical path settings and high system cost in the prior art.

In this embodiment, the signal processing circuit 61 is a digital-to-analog converter in the prior art, and the first photoelectric position sensor 51 and the second photoelectric position sensor 52 are PSDs (ie, laser spot displacement sensors). The converter converts the analog signal obtained by the PSD into a digital signal and sends it to the controller 62. The controller 62 displays the obtained digital signal and drives the displacement mechanism to move under the control of the user; the controller 62 is a PLC or MCU.

The reflected light signal from the optical plane mirror group 4 is irradiated on the photosensitive surface of the first photoelectric position sensor 51 or the second photoelectric position sensor 52, and the photosensitive surface of the first photoelectric position sensor 51 or the second photoelectric position sensor 52 is related to the incident light signal. Vertical; the photoelectric position sensor is a photoelectric displacement sensor based on the lateral photoelectric effect. It senses the light spot displacement of the optical signal and outputs a photocurrent signal. The current signal generated when the light signal is irradiated on the photoelectric displacement sensor for the first time is _I1 . The current signal generated when the light signal is irradiated on the photoelectric displacement sensor is I ₂ , and the displacement length of the light signal on the photosensitive surface of the photoelectric displacement sensor is LA (not shown in the figure). Taking the center of the photosensitive surface of the photoelectric position sensor as the origin, the light spot The relationship between the position difference and the photocurrent is: X _A =LA*(I ₂ -I ₁ )/(I ₂ +I ₁ ); this is the measurement principle of the PSD displacement signal photoelectric sensor in the prior art, and this relationship can be obtained It is known that the displacement of the optical signal is proportional to the output current signal. The farther the light spot deviates from the center of the photosensitive surface of the photoelectric position sensor, the greater the output electrical signal amplitude.

The optical lever measurement principle in the prior art is shown in Figure 4. A beam of spot laser generated by the laser is reflected by the first plane mirror 31 fixed on the rotating bracket (not shown in the figure), and is irradiated at the photoelectric potential position. The light spot B is formed on the sensor 8; when the deflection angle of the rotating bracket is θ, the corresponding normal angle before and after the rotation is different by θ, and the reflected light is also deflected. The angle of the two reflected light signals before and after the deflection is 2θ, and The light spot B formed by the original irradiation on the photoelectric position sensor 8 has moved, and the light spot C formed on the photoelectric position sensor 8, and since the incident angle and the reflection angle are equal, it is not difficult to see that θ has the following relationship with the light spot moving distance BC:

θ=1/2arctan(BC/AB)=1/2 arctan[(BC*cota)/AD];

Among them, AD is the vertical distance from the first plane mirror 31 to the photoelectric position sensor 8, a is the angle between the incident laser light and the normal line; the dotted line in FIG. 4 is the position of the first plane mirror 31 after the deflection of the rotating bracket , E is the normal line of the first plane mirror 31 after the rotating bracket is deflected.

Since the spot moving distance BC is a parameter that can be directly measured, and from the relationship between the spot position difference and the photocurrent, the larger the spot moving distance BC, the greater the photocurrent generated by the first photoelectric position sensor. Therefore, when the deflection angle θ of the rotating bracket is too small, the value of the spot moving distance BC is small at this time, which is greatly affected by the measurement error. By adjusting the optical path to enlarge the optical path, the spot moving distance BC can be enlarged until BC is in the first The maximum value within the range that the photoelectric position sensor can detect. At this time, the voltage signal generated by the spot moving distance BC is the largest, and is least affected by the measurement error. It provides the basic data of the impulse conversion of the micro-impulse measuring device. The influence of measurement error is small, thus improving the measurement resolution.

As shown in FIG. 3, FIG. 3 is a measurement system of the present invention that applies the above-mentioned optical lever measurement principle (see FIG. 4), including a laser 2, a first plane mirror 31, and two parallel opposite plane reflections The mirror 43 and the photoelectric position sensor 8, assuming the initial static state, the total length of the optical path 7 from the first flat mirror 31 to the first photoelectric position sensor 51 or the second photoelectric position sensor 52 is L ₀ (not shown in the figure, that is, from the The total path length from the incident point to the receiving point light on the photoelectric position sensor), the impulse measuring device 3 (refer to Fig. 1) is twisted by the angle θ under the action of the output impulse of the micro power device (not shown in Fig. 3), the dotted line in Fig. 3 is The position of the first plane mirror 31 after being rotated by the output impulse of the micro power device, since the first plane mirror 31 rotates with the micro power device, the rotation angle of the first plane mirror 31 is also θ. The displacement of the light signal spot on the photoelectric position sensor 8 is s (equivalent to the moving distance BC of the light spot in FIG. 4 ) during the process of being stationary to moving. When the displacement s of the light signal spot on the first photoelectric position sensor 51 is too small, Or the second photoelectric position sensor 52 outputs a photocurrent signal, at this time, the controller controls the displacement mechanism to move to realize the adjustment of the optical path L ₀ , on the premise of ensuring that the two optical signal spots fall on the first photoelectric position sensor 51 , so that the optical path L ₀ is at a larger value.

It can be seen from Fig. 4 and the optical lever measurement principle that the optical path L ₀ in Fig. 3 is directly related to the light spot displacement s of the optical signal. On the premise that the light spot displacement is within the detection range of the photoelectric position sensor, the larger the light spot displacement s, The larger the electrical signal output by the photoelectric position sensor, the smaller the influence of the measurement error. Therefore, the light spot displacement s of the optical signal directly affects the resolution of the measurement system. It is actually necessary to adjust the optical path, which can be adjusted to the optical path with a large spot displacement s within the detection range of the photoelectric position sensor. At this time, the spot displacement s is large, and the influence of the measurement error is small, thus improving the measurement system. resolution.

In this embodiment, the plane where the optical table 1 is located is the plane formed by the X axis and the Y axis, and the directions of the X axis and the Y axis are marked in FIG. 1 and FIG. 2 .

The displacement mechanism includes two or more X-axis moving mechanisms 411, two or more X-axis driving mechanisms 412, two Y-axis moving mechanisms 421, and two or more Y-axis driving mechanisms 422. The controller 62 is connected to the X-axis driving mechanism respectively. 412 and the Y-axis driving mechanism 422 are electrically connected; the two Y-axis moving mechanisms 421 are parallel and oppositely arranged on the optical table 1, and each Y-axis moving mechanism 421 is movably provided with more than one X-axis moving mechanism 411; The X-axis moving mechanism 411 is correspondingly provided with an X-axis driving mechanism 412 and a Y-axis driving mechanism 422; the Y-axis driving mechanism 422 is used to drive the X-axis moving mechanism 411 to move along the length direction of the Y-axis moving mechanism 421; the X-axis driving mechanism 412 It is used to drive the second plane mirror 43 to move in the X-axis direction, so as to adjust the distance between the second plane mirrors 43 in the X-axis direction; the above settings, when adjusting in the X-axis direction, can be adjusted by driving The X-axis driving mechanism 412 drives the X-axis moving mechanism 411 to adjust the distance between the second plane mirrors 43 in the X-axis direction; when adjusting in the Y-axis direction, the Y-axis driving mechanism 422 can be driven to drive the Y-axis The moving mechanism 421 adjusts the distance between the second plane mirrors 43 in the Y-axis direction; in this way, the controller 62 can adjust the distance between the second plane mirrors 43 by controlling the X-axis driving mechanism 412 and the Y-axis driving mechanism 422 relative distance.

As shown in FIG. 1, in Embodiment 1, each Y-axis moving mechanism 421 is provided with more than two X-axis moving mechanisms 411, and each X-axis moving mechanism 411 is correspondingly provided with an X-axis driving mechanism 412; The group of second plane mirrors 43 includes two second plane mirrors 43, and each X-axis moving mechanism 411 is provided with a second plane mirror 43; the Y-axis moving mechanism 421 is arranged on the optical table 1 along the Y-axis direction , each Y-axis moving mechanism 421 is provided with two X-axis moving mechanisms 411, and the X-axis moving mechanism 411 is arranged along the X-axis direction of the optical table 1; the X-axis moving mechanism 411 on one Y-axis moving mechanism 421 and the other The X-axis moving mechanisms 411 on the Y-axis moving mechanism 421 are arranged at relative intervals; by adjusting the distance between the second plane mirrors 43, the optical signal is reflected once on each second plane mirror 43; The signal is only reflected once on the same second plane mirror 43, and the position of each second plane mirror 43 can be individually controlled by control, thereby controlling the position of each reflection of the optical signal. In this way, the optical path can be controlled and adjusted according to actual needs. 7. The design of the optical path 7 is made more flexible and controllable, and the design of the optical path 7 can be made more refined.

In Embodiment 1, the current and last two optical signals do not fall on the first photoelectric position sensor 51 or the second photoelectric position sensor 52 at the same time and output an electrical signal. At this time, the digital signal of the signal processing circuit cannot be displayed normally, and the user When seeing this information, it is determined that the optical path needs to be shortened, and the X-axis driving mechanism 412 and the Y-axis driving mechanism 422 are controlled by the controller to adjust the relative positions between the two groups of second plane mirrors 43, so that the optical signal only falls in each group On one second plane mirror 43 of the second plane mirrors 43 , that is, the optical signal is only reflected once on each group of the second plane mirrors 43 , and at the same time, the two groups of second plane mirrors 43 that form the reflection are shortened. The distance between the second plane mirrors 43 in the direction of the X axis can shorten the optical path; in this way, by changing the optical paths in the two groups of second plane mirrors 43, the optical path is shortened, thereby shortening the front and rear two The displacement difference of the secondary optical signal makes the two optical signals before and after both fall on the first photoelectric position sensor 51 or the second photoelectric position sensor 52 .

If the first and last two optical signals fall on the first photoelectric position sensor 51 at the same time, but the digital signal of the signal processing circuit is very small, when the user sees this information, it is determined that the displacement of the light spot is within the detection range of the first photoelectric position sensor 51 However, the displacement of the light spot is too small, it is determined that the optical path needs to be expanded, and the X-axis driving mechanism 412 and the Y-axis driving mechanism 422 are controlled by the controller to adjust the relative position between the two groups of second plane mirrors 43, so that the optical signal falls within On the two second plane mirrors 43 of each group of second plane mirrors 43 , that is, the optical signal forms two reflections on each group of second plane mirrors 43 , and at the same time expands the two groups of second plane mirrors 43 to form reflections The distance of the opposite second plane mirrors 43 in the direction of the X axis can thus expand the optical path; in this way, by changing the optical paths in the two groups of second plane mirrors 43, the optical path is enlarged, thereby expanding the The difference in displacement between the two optical signals before and after enables the two optical signals before and after to be displayed on the first photoelectric position sensor 51 or the second photoelectric position sensor 52 in an enlarged manner, thereby improving the measurement accuracy.

As shown in FIG. 2, in Embodiment 2, the displacement mechanism includes an X-axis moving mechanism 411 provided on each Y-axis moving mechanism 421, and each X-axis moving mechanism 411 is correspondingly provided with an X-axis driving mechanism 412; Each group of second plane mirrors 43 includes a second plane mirror 43, and each X-axis moving mechanism 411 is provided with a second plane mirror 43; the Y-axis moving mechanism 421 is arranged on the optical table 1 along the Y-axis direction , each Y-axis moving mechanism 421 is provided with an X-axis moving mechanism 411, and the X-axis moving mechanism 411 is arranged along the X-axis direction of the optical table 1; The X-axis moving mechanisms 411 on the axis moving mechanism 421 are arranged opposite to each other; and the second plane mirror 43 on one X-axis moving mechanism 411 and the second plane mirror 43 on the other X-axis moving mechanism 411 have overlapping opposites area, by adjusting the distance between the second plane mirrors 43, so that the optical signal is reflected on each second plane mirror 43 more than twice; The adjustment of multiple reflection points can be completed by controlling the movement of the second plane mirror 43 on one side, and the optical path can be adjusted quickly, so that the adjustment of the range can be completed quickly.

In the second embodiment, the current and last two optical signals do not fall on the first photoelectric position sensor 51 or the second photoelectric position sensor 52 at the same time and output electrical signals. At this time, the digital signals of the signal processing circuit cannot be displayed normally, and the user When seeing this information, it is determined that the optical path needs to be shortened, and the X-axis drive mechanism 412 and the Y-axis drive mechanism 422 are controlled by the controller to adjust the relative positions between the two groups of second plane mirrors 43, that is, to reduce the two groups of second plane reflections The size of the overlapping position between the mirrors 43 is such that the optical signal is only reflected once on each group of the second plane mirrors 43, and at the same time, the two second plane mirrors 43 forming the reflection in the two groups of the second plane mirrors 43 are shortened at X The distance in the direction of the axis can thus shorten the optical path; in this way, by changing the optical path in the two sets of second plane mirrors 43, the optical path is shortened, thereby shortening the displacement difference of the two optical signals before and after, so that the front and rear Both optical signals fall on the first photoelectric position sensor 51 or the second photoelectric position sensor 52 .

If the current and last two optical signals fall on the first photoelectric position sensor 51 or the second photoelectric position sensor 52 at the same time, but the digital signal of the signal processing circuit is very small, the user determines that the optical path needs to be expanded when he sees this information, The X-axis drive mechanism 412 and the Y-axis drive mechanism 422 are controlled by the controller to adjust the relative positions between the two groups of second plane mirrors 43 , that is, to increase the overlapping area of the two groups of second plane mirrors 43 , so that the optical signal in each group Multiple reflections are formed on the second plane reflection mirror 43, and the distance of the two groups of second plane reflection mirrors 43 in the direction of the X axis can be enlarged at the same time, so that the optical path can be enlarged; The optical path in 43 expands the optical path, thereby expanding the displacement difference between the two optical signals before and after, so that the two optical signals before and after can be amplified and displayed on the first photoelectric position sensor 51 or the second photoelectric position sensor 52, improving the measurement precision. The X-axis moving mechanism 411 and the Y-axis moving mechanism 421 may be screw or slide rail chute structures.

Regarding the connection relationship between the second plane mirror 43 and the X-axis moving mechanism 411 , in this embodiment, the X-axis moving mechanism 411 and the Y-axis moving mechanism 421 are both slide rail chute structures (not shown in the figure), and Y The sliding rail of the axis moving mechanism 421 is fixedly arranged on the optical table 1, the sliding rail of the Y-axis moving mechanism 421 is slidably arranged in the sliding groove of the Y-axis moving mechanism 421, and the Y-axis driving mechanism 422 is used to drive the Y-axis moving mechanism 421. The sliding rail slides in the chute of the Y-axis moving mechanism 421 ; the sliding groove of the X-axis moving mechanism 411 is fixedly arranged on the sliding rail of the Y-axis moving mechanism 421 , and the sliding rail of the X-axis moving mechanism 411 is slidably arranged on the X-axis moving mechanism 411 In the chute, the X-axis moving mechanism 411 is used to drive the slide rail of the X-axis moving mechanism 411 to slide in the chute of the X-axis moving mechanism 411 . The second plane mirror 43 is arranged on the slide rail of the X-axis moving mechanism 411, and the X-axis driving mechanism 412 drives the slide rail of the X-axis moving mechanism 411 to slide in the slide groove of the X-axis moving mechanism 411, so that the X-axis moving mechanism 411 slides on the slide rail. The direction moves relative to the Y moving mechanism, so as to adjust the distance between the second plane mirrors 43 in the X-axis direction.

The X-axis moving mechanism 411 is provided with a lens fixture, and the lens fixture can be realized by using a fixture in the prior art. The second plane mirror 43 is mounted on the X-axis moving mechanism 411 through the lens fixture, and the second plane mirror 43 can be adjusted through the lens fixture. The distance between the two plane mirrors 43 and the optical table 1, that is, the second plane mirror 43 can be adjusted on the Z axis; the above settings, on the one hand, the second plane mirror 43 can be adjusted by the displacement mechanism on the X axis and the Y axis. Adjustment in the direction; on the other hand, the adjustment of the second plane mirror 43 in the Z-axis direction can be adjusted by the lens holder, so as to further meet the reflection requirements of the laser light between the second plane mirrors 43 .

The second plane mirrors 43 are arranged parallel to each other.

Claims (7)

1. a variable amplification factor optical lever photoelectric measuring device, for measuring the impulse that thruster produces when working, it is characterized in that: comprise optical platform; Be provided with laser, mounting bracket on the optical platform, be used to detect the impulse of miniature power unit The impulse measuring device, the first plane mirror, the rotating support, the plane mirror group, the first photoelectric position sensor, the second photoelectric position sensor, the signal processing circuit and the controller; The laser is used to emit light signals, and the laser is arranged on the optical platform through the mounting bracket; the impulse measuring device is arranged on the optical platform and is located on one side of the laser; The first plane mirror is used to reflect and adjust the reflection angle of the optical signal emitted by the laser, and reflect the optical signal emitted by the laser into the plane mirror group. The first plane mirror is rotated and coupled to the impulse measuring device. The first plane mirror The axis of rotation is parallel to the reflection surface of the first plane mirror, and the first plane mirror is located within the irradiation range of the laser; the thruster is coupled to the swing arm of the impulse measuring device, and the swing arm rotates around the swing arm under the action of the thruster The axis rotates, and at the same time, the first plane mirror is driven to rotate around the rotation axis of the first plane mirror, and the rotation angle of the swing arm is the same as the rotation angle of the first plane mirror; The plane reflection mirror group is used to receive and amplify the optical path of the light signal reflected by the first plane reflection mirror, the plane reflection mirror group is arranged on the optical platform, and the light incident end of the plane reflection mirror group is located relative to the first plane reflection mirror. the other side of the laser; The first photoelectric position sensor and the second photoelectric position sensor are used to receive the light signal reflected by the plane mirror group, and the first photoelectric position sensor and the second photoelectric position sensor are respectively arranged on the side of the optical platform at the light-emitting end of the plane mirror group, and the second photoelectric position sensor is located on the side of the first photoelectric position sensor away from the plane mirror group; The plane mirror group includes a displacement mechanism for adjusting the size of the optical path and two sets of second plane mirrors arranged oppositely. The two groups of second plane mirrors are relatively arranged on the displacement mechanism, and the displacement mechanism is used to adjust the reflection of the second plane The distance between the mirrors in the X-axis direction and the distance in the Y-axis direction; One end of the signal processing circuit is electrically connected to the first photoelectric position sensor and the second photoelectric position sensor respectively, and the other end of the signal processing circuit is electrically connected to the controller; the controller is electrically connected to the displacement mechanism. 2. a kind of variable amplification factor optical lever photoelectric measuring device according to claim 1 is characterized in that: displacement mechanism comprises more than two X-axis moving mechanisms, more than two X-axis drive mechanisms, two Y-axis The moving mechanism and two or more Y-axis drive mechanisms, the controller is electrically connected with the X-axis drive mechanism and the Y-axis drive mechanism respectively; Two Y-axis moving mechanisms are arranged in parallel on the optical table, and each Y-axis moving mechanism is movably provided with more than one X-axis moving mechanism; each X-axis moving mechanism is correspondingly provided with an X-axis driving mechanism and a Y-axis driving mechanism ; The Y-axis driving mechanism is used to drive the X-axis moving mechanism to move along the length direction of the Y-axis moving mechanism; the X-axis driving mechanism is used to drive the second plane mirror to move in the X-axis direction, so as to adjust the distance between the second plane mirrors Distance in the X-axis direction. 3. a kind of variable amplification factor optical lever photoelectric measuring device according to claim 1 is characterized in that: each Y-axis moving mechanism is provided with more than two X-axis moving mechanisms, and each X-axis moving mechanism corresponds to There is an X-axis drive mechanism; each group of second plane mirrors includes more than two second plane mirrors, and each X-axis moving mechanism is provided with a second plane mirror; the Y-axis moving mechanism is located along the optical table. Set in the Y-axis direction, each Y-axis moving mechanism is provided with two X-axis moving mechanisms, and the X-axis moving mechanisms are arranged along the X-axis direction of the optical table; the X-axis moving mechanism on one Y-axis moving mechanism is connected to the other Y-axis moving mechanism. The X-axis moving mechanisms on the moving mechanism are relatively arranged; by adjusting the distance between the second plane mirrors, the optical signal is reflected once on each of the second plane mirrors. 4. a kind of variable amplification factor optical lever photoelectric measuring device according to claim 1 is characterized in that: each Y-axis moving mechanism is provided with an X-axis moving mechanism, and each X-axis moving mechanism is correspondingly provided with An X-axis drive mechanism; each group of second plane mirrors includes a second plane mirror, and each X-axis moving mechanism is provided with a second plane mirror; the Y-axis moving mechanism is arranged on the optical platform along the Y-axis direction , each Y-axis moving mechanism is provided with an X-axis moving mechanism, and the X-axis moving mechanism is arranged along the X-axis direction of the optical table; the X-axis moving mechanism on one Y-axis moving mechanism and the X-axis moving mechanism on the other Y-axis moving mechanism The shaft moving mechanisms are relatively arranged; by adjusting the distance between the second plane mirrors, the optical signal is reflected more than twice on each of the second plane mirrors. 5. a kind of variable magnification factor optical lever photoelectric measuring device according to claim 2 is characterized in that: the second plane mirror is fixedly arranged on one end of the X-axis moving mechanism, and the X-axis driving mechanism drives the X-axis moving mechanism Moving in the X-axis direction relative to the Y moving mechanism realizes adjusting the distance between the second plane mirrors in the X-axis direction. 6. A variable magnification optical lever photoelectric measuring device according to claim 2, characterized in that: the X-axis moving mechanism is provided with a lens fixture, and the second plane mirror is installed on the X-axis to move through the lens fixture. Mechanically, the distance between the second plane mirror and the optical table can be adjusted through the lens holder. 7 . The variable magnification optical lever photoelectric measuring device according to claim 1 , wherein the second plane mirrors are arranged in parallel with each other. 8 .

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