CN215894847U - Test piece and test structure - Google Patents
Test piece and test structure Download PDFInfo
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- CN215894847U CN215894847U CN202122081973.0U CN202122081973U CN215894847U CN 215894847 U CN215894847 U CN 215894847U CN 202122081973 U CN202122081973 U CN 202122081973U CN 215894847 U CN215894847 U CN 215894847U
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- 238000012360 testing method Methods 0.000 title claims abstract description 150
- 230000003139 buffering effect Effects 0.000 claims abstract description 5
- 238000005452 bending Methods 0.000 claims description 10
- 238000009434 installation Methods 0.000 claims description 4
- 230000000694 effects Effects 0.000 description 9
- 238000000034 method Methods 0.000 description 7
- 238000001514 detection method Methods 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 3
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
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Abstract
The utility model relates to the technical field of electronic chip testing, in particular to a test piece, which comprises: the testing device comprises a testing part, a first contact part and a second contact part, wherein the end face of one end of the testing part is provided with the first contact part which is used for contacting with a pin of an electronic chip; the elastic part is connected with the other end of the testing part and is used for buffering the hard contact between the pins of the electronic chip and the testing sheet; and the connecting piece comprises a fixing part and a second abutting part, one end of the fixing part is connected with the elastic part, the other end of the fixing part is connected with the second abutting part, the second abutting part is used for electrically abutting against the PCB, and the test piece is fixed on the test structure through the fixing part and is connected with the test structure. The test piece can realize the test of the electronic chip and has high test stability.
Description
Technical Field
The utility model relates to an electronic chip tests technical field, in particular to test piece and test structure.
Background
Along with the rapid development of modern electronic products, an electronic chip is taken as an important composition core, quality detection control becomes stricter in the production and processing processes, in the actual detection process, the electronic chip is placed in a limiting frame by a test fixture through an automatic production line and is pressed by applying force, and the electronic chip is communicated with a detection circuit through a test piece, so that the performance detection of the electronic chip is realized.
Among the prior art, adopt metal shrapnel to connect electronic chip and detection circuitry more, with this realization to electronic chip, however, prior art's metal shrapnel receives the restriction of self material or the restriction of structure, it has many defects in life, can't guarantee effectively going on for a long time of chip test, especially when needing to set up too big electric current's electronic chip, the structure of sheetmetal often designs very complicatedly, in addition, the elasticity of current sheetmetal is not good, can not guarantee with electronic chip's completion contact, influence the effect that detects.
Therefore, how to design a test strip with simple structure, stable test and high cost performance becomes a technical problem which needs to be solved urgently.
SUMMERY OF THE UTILITY MODEL
In order to overcome the above-mentioned drawbacks of the prior art, the present invention provides a test strip and a test structure, so as to solve the above-mentioned problems in the background art.
The technical scheme adopted by the utility model for solving the problems in the prior art is as follows: a test strip, comprising:
the testing device comprises a testing part, a first contact part and a second contact part, wherein the end face of one end of the testing part is provided with the first contact part which is used for contacting with a pin of an electronic chip;
the elastic part is connected with the other end of the testing part and is used for buffering the hard contact between the pins of the electronic chip and the testing sheet; and
the connecting piece comprises a fixing part and a second abutting part, one end of the fixing part is connected with the elastic part, the other end of the fixing part is connected with the second abutting part, the second abutting part is used for electrically abutting against the PCB, and the test piece is fixed on the test structure through the fixing part and connected with the test structure.
Compared with the prior art, the utility model has the following technical effects:
the application provides a test piece, through set up first butt portion in test section one end be used for with electronic chip's pin butt, set up second butt portion and PCB board butt and realize the test to electronic chip on the connecting piece. In addition, the test piece of this application still is provided with the elasticity portion between test portion and connection, and this elasticity portion makes first butt portion keep in contact with the pin of electronic chip all the time in the effect of its elastic buffer of the in-process of first butt portion and electronic chip's pin butt, improves the stability of test piece test.
As a preferable aspect of the present invention, the elastic portion at least includes a first arc portion and a second arc portion, the first arc portion and the second arc portion are disposed opposite to each other, one end of the first arc portion and one end of the second arc portion are connected to form at least one S-shaped structure, the other end of the first arc portion is connected to the testing portion, and the other end of the second arc portion is connected to the fixing portion.
In a preferred embodiment of the present invention, the test portion, the elastic portion, and the connecting member are integrally formed.
In a preferred embodiment of the present invention, the first abutting portion and the second abutting portion have a wavy structure, a V-shaped structure, or a planar structure.
As the preferred scheme of the utility model, one side of the fixing part is also provided with at least one limiting groove so as to facilitate the installation and the positioning of the test piece.
As a preferable aspect of the present invention, one end of the fixing portion, which is away from the connecting portion, is further extended with a bending portion, the bending portion is bent towards one end, which is away from the fixing portion, and the end of the bending portion is provided with the second abutting portion.
As a preferable aspect of the present invention, the second abutting portion is provided at an end of the bent portion in a vertical direction.
A test structure comprises the test piece, the test structure comprises a test seat, an accommodating part for accommodating the test piece is arranged on the test seat, a limiting block is arranged on the area, corresponding to the limiting groove, of the accommodating part, and when the test piece is installed on the accommodating part, the limiting groove is just clamped on the limiting block.
As a preferred embodiment of the present invention, the accommodating portion includes a first accommodating through groove penetrating the first accommodating through groove and matching with the structure of the testing portion, a second accommodating through groove matching with the structure of the elastic portion, and a third accommodating through groove matching with the structure of the connecting member, the elastic portion can move in the second accommodating through groove in a vertical direction, the pins of the electronic chip are abutted to the testing portion through the first accommodating through groove, and the connecting member is electrically abutted to the PCB through the third accommodating through groove.
Compared with the prior art, the utility model has the following technical effects:
the utility model provides a test structure is used for installing the test piece through set up holding portion in the test seat, and still is provided with the stopper on the holding portion for the mounted position of restriction test piece, simple structure.
Drawings
FIG. 1 is a structural view of a test strip of the present invention;
FIG. 2 is a block diagram of a test structure of the present invention.
Reference numbers in the figures:
10. testing the sheet; 11. a test section; 12. an elastic portion; 13. a connecting member; 111. a first abutting portion; 121. a first arcuate portion; 122. a second arcuate portion; 131. a fixed part; 132. a second abutting portion; 133. a limiting groove; 134. a bending section;
20. a test seat; 21. a first accommodating through groove; 22. a second accommodating through groove; 23. a third accommodating through groove; 24. a limiting block; 30. a pin.
Detailed Description
In order to make the technical problems, technical solutions and advantageous effects to be solved by the present application clearer, the present application is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
It will be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or be indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or be indirectly connected to the other element.
It will be understood that the terms "length," "width," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like, refer to an orientation or positional relationship illustrated in the drawings for convenience in describing the present application and to simplify description, and do not indicate or imply that the referenced device or element must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be construed as limiting the present application.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present application, "a plurality" means two or more unless specifically limited otherwise.
In the test strip 10 and the test structure provided by the application, the test strip 10 can be used for testing a chip, and it should be noted that the test strip can be used for testing an electronic connector or other electronic components besides the chip, and the type of the electronic components is not limited herein.
As shown in figure 1: a test strip 10 comprising: a test part 11, an elastic part 12, and a connector 13; the testing part 11 is used for abutting against pins of an electronic chip and testing the electronic chip; the connecting piece 13 is used for installing the test piece 10 on the test structure and abutting against the PCB; the elastic part 12 is respectively connected with the testing part 11 and the connecting part 13, and is used for buffering the hard contact between the pins of the electronic chip and the testing sheet 10, and simultaneously enabling the testing part 11 in the testing sheet 10 to be always in contact with the pins.
Further, the connecting member 13 further includes a fixing portion 131, and the test strip 10 can be mounted on the testing structure through the fixing portion 131, so as to improve the convenience of mounting the test strip 10 and improve the stability of the test strip 10 during testing the electronic chip.
The end face, used for abutting against the pins of the electronic chip, of the test part 11 is provided with a first abutting part 111 in a wave structure, a V-shaped structure or a plane structure, and the first abutting part 111 can improve the abutting effect of the test part 11 against the pins of the electronic chip and ensure the contact area of the first abutting part 111 and the pins.
The end face, used for abutting with the PCB, of the connecting piece 13 is provided with a second abutting portion 132 with a wave structure, a V-shaped structure or a plane structure, the second abutting portion 132 is connected with the fixing portion 131, the second abutting portion 132 can improve the abutting effect of the connecting piece 13 and the PCB, and the contact area of the second abutting portion 132 and the PCB is ensured.
In the test piece 10 having the above-described structure, the first abutting portion 111 is provided at one end of the test portion 11 for abutting against the pin 30 of the electronic chip, and the second abutting portion 132 is provided on the connector 13 for abutting against the PCB board, thereby testing the electronic chip. In addition, the test piece 10 of the present application is further provided with an elastic portion 12 between the test portion 11 and the connection, and the elastic portion 12 has an elastic buffer function in the process of abutting the first abutting portion 111 against the pins 30 of the electronic chip, so that the first abutting portion 111 is always kept in contact with the pins 30 of the electronic chip, and the test stability of the test piece 10 is improved.
In addition, the test piece 10 in the present embodiment may be made of a copper sheet, an iron sheet, an alloy sheet, or the like.
As a preferred embodiment of the present invention, the test portion 11, the elastic portion 12, and the connecting member 13 are integrally formed, which not only facilitates the production and processing of the test strip 10, but also improves the ductility, toughness, and conductivity of the entire test strip 10, thereby prolonging the service life of the test strip 10. In another embodiment, the test portion 11, the elastic portion 12, and the connecting member 13 may be assembled, and the test portion 11, the elastic portion 12, and the connecting member 13 may be welded together by welding or the like.
As a preferable aspect of the present invention, the elastic part 12 includes a first arc-shaped part 121 and a second arc-shaped part 122, wherein the first arc-shaped part 121 and the second arc-shaped part 122 are disposed opposite to each other, one end of the first arc-shaped part 121 and one end of the second arc-shaped part 122 are connected to form an S-shaped structure, the other end of the first arc-shaped part 121 is connected to the test part 11, and the other end of the second arc-shaped part 122 is connected to the connection part 13.
The elastic part 12 of above-mentioned structure can promote the elasticity effect through setting up two arc portions, can make this test portion 11 contact with the pin all the time to the 12 toughness of elastic part of this structure are better, difficult fracture.
It is understood that in other embodiments, the elastic portion 12 is not limited to include the first arc-shaped portion 121 and the second arc-shaped portion 122, and a plurality of arc-shaped portions may be provided as needed to form a plurality of S-shaped structures.
As a preferred embodiment of the present invention, at least one position-limiting groove 133 is further disposed on one side of the fixing portion 131 to facilitate the installation and positioning of the test strip 10.
In the present embodiment, one stopper groove 133 is provided. In other embodiments, two, three or more limiting grooves 133 may be provided.
In a preferred embodiment of the present invention, a bent portion 134 is further extended from one end of the fixing portion 131 away from the connecting portion, the bent portion 134 is bent towards one end away from the fixing portion 131, and the second abutting portion 132 is disposed at an end of the bent portion 134. When the second abutting portion 132 abuts against the PCB, the bending portion 134 plays a role of buffering the hard contact between the second abutting portion 132 and the PCB, and meanwhile, the second abutting portion 132 can be always kept in contact with the PCB under the effect of the bending portion 134, so as to increase the stability of the test strip 10 during operation.
Further, the second abutting portion 132 is disposed at an end of the bent portion 134 along the vertical direction, so that an end surface of the second abutting portion 132 can be completely contacted with the PCB, and the stability during abutting is maintained.
In addition, referring to fig. 2, the present invention further discloses a testing structure, which includes a testing base 20, wherein the testing base 20 is provided with an accommodating portion for accommodating the testing sheet 10, the accommodating portion is provided with a limiting block 24 on an area corresponding to the limiting groove 133, and when the testing sheet 10 is mounted on the accommodating portion, the limiting groove 133 is just clamped on the limiting block 24.
In the present embodiment, a set of test strips 10 is described as an example.
During the testing process of the electronic chip, the pins 30 of the electronic chip can be inserted into the receiving portions to abut against the first abutting portions 111 on the receiving portions, and the second abutting portions 132 of the test strip 10 can be electrically abutted against the PCB through the receiving portions.
It can be seen that, in the above-mentioned test structure, the accommodating portion is provided in the test socket 20 for installing the test strip 10, and the accommodating portion is further provided with the limiting block 24 for limiting the installation position of the test strip 10, so that the structure is simple.
As a preferred embodiment of the present invention, the accommodating portion includes a first accommodating through groove 21 which is communicated with the testing portion 11 and structurally matches therewith, a second accommodating through groove 22 which is structurally matches with the elastic portion 12, and a third accommodating through groove 23 which is structurally matches with the connecting member 13, and the elastic portion 12 can move in the second accommodating through groove 22 in a vertical direction, the pins of the electronic chip are abutted to the testing portion 11 through the first accommodating through groove 21, and the connecting member 13 is electrically abutted to the PCB through the third accommodating through groove 23.
The third accommodating through groove 23 is provided with the limiting block 24, and when the test piece 10 is mounted in the accommodating portion, the limiting groove 133 is just clamped on the limiting block 24.
It can be understood that, in the process that the pins of the electronic chip are abutted to the testing part 11 through the first accommodating through groove 21, the first accommodating through groove 21 can also guide the pins of the electronic chip, and the pins can also be limited in the testing process, so that the stability during testing is improved.
Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that changes may be made in the embodiments and/or equivalents thereof without departing from the spirit and scope of the utility model. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (9)
1. A test strip, comprising:
the testing device comprises a testing part, a first contact part and a second contact part, wherein the end face of one end of the testing part is provided with the first contact part which is used for contacting with a pin of an electronic chip;
the elastic part is connected with the other end of the testing part and is used for buffering the hard contact between the pins of the electronic chip and the testing sheet; and
the connecting piece comprises a fixing part and a second abutting part, one end of the fixing part is connected with the elastic part, the other end of the fixing part is connected with the second abutting part, the second abutting part is used for electrically abutting against the PCB, and the test piece is fixed on the test structure through the fixing part.
2. A test strip according to claim 1, wherein: the elastic part at least comprises a first arc-shaped part and a second arc-shaped part, the first arc-shaped part and the second arc-shaped part are arranged oppositely, one end of the first arc-shaped part and one end of the second arc-shaped part are connected to form an S-shaped structure at least, the other end of the first arc-shaped part is connected with the testing part, and the other end of the second arc-shaped part is connected with the fixing part.
3. A test strip according to claim 1, wherein: the testing part, the elastic part and the connecting piece are of an integrally formed structure.
4. A test strip according to claim 1, wherein: the structure of the first abutting part and the second abutting part is a wave structure, a V-shaped structure or a plane structure.
5. A test strip according to claim 1, wherein: one side of the fixing part is also provided with at least one limiting groove so as to facilitate the installation and the positioning of the test piece.
6. A test strip according to claim 1, wherein: the end of the fixing part, which is far away from the connecting part, is also provided with a bending part in an extending manner, the bending part bends towards the end far away from the fixing part, and the end part of the bending part is provided with the second abutting part.
7. The test strip of claim 6, wherein: the second abutting portion is arranged at the end portion of the bending portion along the vertical direction.
8. A test structure comprising a test strip as claimed in any one of claims 5 to 7, wherein the test structure comprises a test socket, the test socket is provided with a receiving portion for receiving the test strip, the receiving portion is provided with a limiting block at a region corresponding to the limiting groove, and when the test strip is mounted on the receiving portion, the limiting groove is just clamped on the limiting block.
9. A test structure according to claim 8, wherein: the accommodating part comprises a first accommodating through groove communicated with the testing part structure, a second accommodating through groove matched with the elastic part structure and a third accommodating through groove matched with the connecting part structure, the elastic part can move in the second accommodating through groove along the vertical direction, pins of the electronic chip are abutted to the testing part through the first accommodating through groove, and the connecting part is abutted to the PCB electrically through the third accommodating through groove.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122081973.0U CN215894847U (en) | 2021-08-31 | 2021-08-31 | Test piece and test structure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202122081973.0U CN215894847U (en) | 2021-08-31 | 2021-08-31 | Test piece and test structure |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN215894847U true CN215894847U (en) | 2022-02-22 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202122081973.0U Active CN215894847U (en) | 2021-08-31 | 2021-08-31 | Test piece and test structure |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN215894847U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115980411A (en) * | 2022-11-22 | 2023-04-18 | 深圳顺络电子股份有限公司 | Measuring probe |
| CN116953483A (en) * | 2023-07-31 | 2023-10-27 | 深圳市瑞芯辉科技有限公司 | A kind of test shrapnel and test device |
-
2021
- 2021-08-31 CN CN202122081973.0U patent/CN215894847U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115980411A (en) * | 2022-11-22 | 2023-04-18 | 深圳顺络电子股份有限公司 | Measuring probe |
| CN116953483A (en) * | 2023-07-31 | 2023-10-27 | 深圳市瑞芯辉科技有限公司 | A kind of test shrapnel and test device |
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