CN215494995U - ID chip inspection device - Google Patents
ID chip inspection device Download PDFInfo
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- CN215494995U CN215494995U CN202121856846.7U CN202121856846U CN215494995U CN 215494995 U CN215494995 U CN 215494995U CN 202121856846 U CN202121856846 U CN 202121856846U CN 215494995 U CN215494995 U CN 215494995U
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- 238000011156 evaluation Methods 0.000 claims abstract description 50
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- 238000000034 method Methods 0.000 abstract description 4
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Abstract
The utility model discloses an ID chip inspection device, which belongs to the technical field of chip testing and comprises a box body and a top plate, wherein the box body comprises at least one side surface and a bottom surface, and the side surface of the box body is provided with a communication interface; the top plate is detachably connected with the box body, an ID chip socket is arranged on the top plate, and the ID chip socket comprises a base provided with a chip clamping groove; the box body and the top plate are encircled to form an accommodating cavity, the ID chip socket is positioned outside the accommodating cavity, and an evaluation system circuit board is arranged in the accommodating cavity and is electrically connected with the ID chip socket through a connector; the evaluation system circuit board is electrically connected with the communication interface. The scheme has high system integration level, and the box body plays a good role in protecting the circuit board of the evaluation system; the operation mode is single, be convenient for producers to operate, and the ID chip makes the inspection result more directly perceived in cooperation with host computer software, compares with the impedance measurement method, and the defective products screening rate is higher.
Description
Technical Field
The utility model relates to the technical field of chip testing, in particular to an ID chip inspection device.
Background
The item confocal endoscope is a brand new endoscopic technique, which is also called optical biopsy. By means of the confocal principle, the technology realizes optical section of tissues, can amplify the tissues by 1000 times, and helps clinicians to directly view cell structures in endoscopy, so that early-stage tiny lesions, particularly tumor lesions, are diagnosed, the biopsy accuracy is improved, and the missed diagnosis rate is reduced.
When the confocal host works, the confocal host can normally work only through the probe, and clearly displays the tissue cells of a human body in the matching software of the upper computer. An ID (identification card) chip which can communicate with a host is implanted in the probe, so that the host can correctly identify a series of key parameters such as the type and the model of the probe, and the like, thereby ensuring that the information of the probe can be read and written through the software of an upper computer. At present, in the production process of the probe, the probe cannot normally communicate with an upper computer after the ID chip is implanted. Therefore, before the process of implanting the ID chip, it is necessary to check whether the chip to be implanted is normal or not to avoid a failure caused by a failure of the ID chip, to prevent the failure from being discovered after the implantation and then to be checked, and to save time and labor costs.
In the production process of the current probe, no relevant inspection tool is used for matching inspection, the resistance value of the ID chip is measured only by a universal meter, the quality of a sample is roughly evaluated, and a defective product cannot be effectively screened.
SUMMERY OF THE UTILITY MODEL
This application embodiment has realized that a set of operation is simple and easy, the high frock of screening rate supplies the producer to inspect the ID chip through providing an ID chip verifying attachment.
The embodiment of the application provides an ID chip inspection device, which comprises a box body and a top plate, wherein the box body comprises at least one side surface and a bottom surface, and the side surface of the box body is provided with a communication interface; the top plate is detachably connected with the box body, an ID chip socket is arranged on the top plate, and the ID chip socket comprises a base provided with a chip clamping groove; the box body and the top plate enclose an accommodating cavity, the ID chip socket is positioned outside the accommodating cavity, an evaluation system circuit board is arranged in the accommodating cavity, and the evaluation system circuit board is electrically connected with the ID chip socket through a connector; the evaluation system circuit board is electrically connected with the communication interface.
Further, the evaluation system circuit board comprises an adapter, a first evaluation board and a second evaluation board which are electrically connected in sequence, wherein the adapter is connected with an upper computer through the communication interface, and the second evaluation board is electrically connected with the ID chip socket through the connector.
Further, the first evaluation board and the second evaluation board are respectively fixed on the positioning columns at the bottom of the box body by using hot melt adhesives, and the first evaluation board and the second evaluation board are connected through RJ11 cables.
Further, the ID chip socket further comprises a clamping block and a movable handle, the clamping block is arranged in the base in a sliding mode, the movable handle can be switched between a first position and a second position, when the movable handle is located at the first position, the movable handle drives the clamping block to be located outside the chip clamping groove, so that the chip clamping groove has enough space to accommodate the ID chip, and when the movable handle is located at the second position, the movable handle drives at least one part of the clamping block to be located in the chip clamping groove, so that the ID chip in the chip clamping groove is clamped.
Furthermore, the ID chip socket further comprises a clamp cover plate, the clamp cover plate is fixed on one surface of the base, which contains the chip clamping groove, and prompt information is sprayed and drawn on the clamp cover plate.
Further, the ID chip socket and the clamper cover plate, and the ID chip socket and the top plate are fixed by strong glue.
Further, the box body and the top plate are both made of insulating materials.
The bottom surface of the box body further comprises a supporting part, the supporting part is located on the outer side of the box body, and a magnet block is arranged in the supporting part.
One or more technical solutions provided in the embodiments of the present application have at least the following technical effects or advantages:
the ID chip inspection device comprises a box body and a top plate, wherein the box body comprises at least one side surface and a bottom surface, and the side surface of the box body is provided with a communication interface; the top plate is detachably connected with the box body, an ID chip socket is arranged on the top plate, and the ID chip socket comprises a base provided with a chip clamping groove; the box body and the top plate enclose an accommodating cavity, the ID chip socket is positioned outside the accommodating cavity, an evaluation system circuit board is arranged in the accommodating cavity, and the evaluation system circuit board is electrically connected with the ID chip socket through a connector; the evaluation system circuit board is electrically connected with the communication interface. The scheme has high system integration level, and the box body plays a good role in protecting the circuit board of the evaluation system; the operation mode is single, be convenient for producers to operate, and the ID chip makes the inspection result more directly perceived in cooperation with host computer software, compares with the impedance measurement method, and the defective products screening rate is higher.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
FIG. 1 is a diagram of an ID chip inspection apparatus according to an embodiment of the present invention;
FIG. 2 is a side view of an ID chip inspection apparatus according to an embodiment of the present invention;
FIG. 3 is a cross-sectional view of an ID chip inspection apparatus according to an embodiment of the present invention;
FIG. 4 is a structural diagram of another ID chip inspection apparatus according to an embodiment of the present invention;
FIG. 5 is a top view of an ID chip inspection apparatus according to an embodiment of the present invention;
fig. 6 is a partial sectional view of an ID chip inspection apparatus according to an embodiment of the present invention.
Description of the drawings:
the device comprises a box body 1, a top plate 2, an adapter 3, a first evaluation plate 4, a second evaluation plate 5, an ID chip socket 6, a chip card slot 7, a clamp cover plate 8, a movable handle 9, a magnet block 10, a communication interface 11 and an ID chip 100
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, embodiments of the present invention will be described in detail with reference to the accompanying drawings.
Fig. 1 and 2 are a structural diagram and a side view of an ID chip testing device according to an embodiment of the present invention, and referring to fig. 1 and 2, an embodiment of the present invention provides an ID chip testing device, where the ID chip testing device includes a box 1 and a top plate 2, the box 1 includes at least one side surface and a bottom surface, the side surface of the box is provided with a communication interface 11, and the communication interface 11 is used for connecting with an upper computer. The top plate 2 is detachably connected with the box body 1, an ID chip socket 6 is arranged on the top plate 2, and the ID chip socket 6 comprises a base provided with a chip clamping groove 7; the box body 1 and the top plate 2 enclose an accommodating cavity, the ID chip socket 6 is positioned outside the accommodating cavity, and an evaluation system circuit board is arranged in the accommodating cavity and is electrically connected with the ID chip socket 6 through a connector; the evaluation system circuit board is electrically connected with the communication interface.
The scheme has high system integration level, and the box body 1 plays a good role in protecting the circuit board of the evaluation system; the operation mode is single, the operation of production personnel is convenient for, the ID chip is matched with the upper computer software, so that the inspection result is more visual, and compared with an impedance measurement method, the defective product screening rate is higher.
The top plate 2 is detachably connected to the case 1, and the evaluation system circuit board is electrically connected to the ID chip socket 6 through a connector, so that when the device needs to be repaired, the detachable connection and the connector in the circuit are disconnected, and the top plate 2 and the case 1 can be separated.
Fig. 3 is a cross-sectional view of an ID chip inspection apparatus according to an embodiment of the present invention. As shown in fig. 3, further, the evaluation system circuit board includes an adapter 3, a first evaluation board 4 and a second evaluation board 5 which are electrically connected in sequence, the adapter 3 is connected with the upper computer through a communication interface 11, and the second evaluation board 5 is electrically connected with the ID chip socket 6 through a connector.
Specifically, the adapter 3, the first evaluation Board 4 and the second evaluation Board 5 are standard components, belong to an ID chip evaluation system, and need to be used in combination, the specific model of the first evaluation Board 4 is DS246EVKIT # evaluation Board, the specific model of the second evaluation Board 5 is DS9120Q + EV Board, and the specific model of the adapter 3 is DS 9400# USB-to-I2C PC adapter.
Further, the first evaluation board 4 and the second evaluation board 5 are fixed on the positioning posts of the cabinet 1 using hot melt adhesive, respectively, and the first evaluation board 4 and the second evaluation board 5 are connected by RJ11 cables.
Further, the ID chip socket 6 further includes a clamping block slidably disposed in the base, and a movable handle 9, the movable handle 9 being switchable between a first position and a second position. For example, the movable handle 9 can be switched between a first position perpendicular to the top plate 2 (as shown in fig. 1) and a second position parallel to the top plate 2 (as shown in fig. 4), in which a slide groove is provided in the base, in which the clamping block can move. Referring to fig. 1, when the movable handle 9 is located at the first position, the movable handle 9 drives the clamping block to be located outside the chip card slot 7, so that the chip card slot 7 has a sufficient space to accommodate the ID chip, and when the movable handle 9 is located at the second position, the movable handle 9 drives at least a part of the clamping block to be located in the chip card slot 7, so that the ID chip 100 in the chip card slot 7 is clamped, and the stability of the ID chip 100 in the test is ensured.
Fig. 5 is a top view of an ID chip inspection apparatus according to an embodiment of the present invention. As shown in fig. 5, further, the ID chip socket 6 further includes a clamp cover plate 8, the clamp cover plate 8 is fixed on a surface of the base including the chip card slot 7, and the clamp cover plate 8 is painted with a prompt message. The prompt message may be a text or a pattern, such as "please insert in the direction shown in the figure", and a polygon with a black solid is provided to show the top view of the ID chip when it is inserted. The prompt message can play a role of fool-proofing, and misoperation of workers in use is avoided.
In some embodiments, if the universal ID chip socket 6 is used, the excessive chip card slots 7 can be blocked by the cover plate 8 of the clamping device, so as to leave the proper chip card slots 7, thereby avoiding inaccurate detection caused by inserting the wrong chip card slots 7.
Further, the ID chip socket 6 and the clamper cover plate 8, and the ID chip socket 6 and the top plate 2 are fixed by strong glue.
Further, the box body 1 and the top plate 2 are both made of insulating materials. For example, modified polystyrene (ABS) is used.
Fig. 6 is a cross-sectional view of an ID chip testing apparatus according to an embodiment of the present invention, as shown in fig. 6, further, the bottom surface of the box 1 further includes a supporting portion, the supporting portion is located outside the box 1, and a magnet 10 is disposed in the supporting portion so as to be attached to the worktable, so as to prevent the ID chip testing apparatus from falling down due to human touch and damaging the adapter 3, the first evaluation plate 4 and the second evaluation plate 5 of the ID chip evaluation system. Specifically, the magnet block 10 may be an annular magnet block 10, which is fixed on the support portion by a fixing member through a center hole of the annular magnet block 10.
When the ID chip needs to be inspected, arrange ID chip verifying attachment in earlier and level the plane to pass through USBType A with the communication interface 11 of device and host computer and change Type B cable connection, then insert ID chip socket 6 with the ID chip according to the figure of the drawing orientation on the binding clasp apron 8, rotatory movable handle 9, locking ID chip makes both fully connected. And (4) opening the matched test software in the upper computer, communicating with the ID chip, and testing whether data can be normally written and read. After the test is completed, the movable handle 9 is rotated, and the ID chip is removed.
The present invention is not limited to the above preferred embodiments, and any modifications, equivalent replacements, improvements, etc. within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (8)
1. An ID chip inspection device, characterized by comprising:
the box body comprises at least one side surface and a bottom surface, and the side surface of the box body is provided with a communication interface;
the top plate is detachably connected with the box body, an ID chip socket is arranged on the top plate, and the ID chip socket comprises a base provided with a chip clamping groove;
the box body and the top plate enclose an accommodating cavity, the ID chip socket is positioned outside the accommodating cavity, an evaluation system circuit board is arranged in the accommodating cavity, and the evaluation system circuit board is electrically connected with the ID chip socket through a connector; the evaluation system circuit board is electrically connected with the communication interface.
2. The ID chip inspection device according to claim 1, wherein the evaluation system circuit board includes an adapter, a first evaluation board, and a second evaluation board electrically connected in this order, the adapter being connected to the upper computer through the communication interface, the second evaluation board being electrically connected to the ID chip socket through the connector.
3. The ID chip inspection device of claim 2, wherein said first and second evaluation boards are respectively fixed to positioning posts on the bottom of said case using hot melt adhesive, and said first and second evaluation boards are connected by RJ11 cable.
4. The ID chip testing device of claim 1, wherein said ID chip socket further comprises a clamping block and a movable handle, said clamping block is slidably disposed in said base, said movable handle is switchable between a first position and a second position, when said movable handle is located at said first position, said movable handle drives said clamping block to be located outside said chip card slot, so that said chip card slot has enough space to accommodate an ID chip, when said movable handle is located at said second position, said movable handle drives at least a portion of said clamping block to be located inside said chip card slot, so that said ID chip in said chip card slot is clamped.
5. The ID chip testing device as claimed in claim 1, wherein said ID chip socket further comprises a clamper cover plate fixed to a side of said base containing said chip card slot, said clamper cover plate having a prompt message painted thereon.
6. The ID chip inspection device of claim 5, wherein the ID chip socket and the clamper cover plate, and the ID chip socket and the top plate are fixed by a super glue.
7. The ID chip inspection device according to any one of claims 1 to 6, wherein said case and said top plate are made of an insulating material.
8. The ID chip inspection device according to any one of claims 1 to 6, wherein the bottom surface of the case further comprises a support portion located outside the case, the support portion having a magnet block disposed therein.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121856846.7U CN215494995U (en) | 2021-08-10 | 2021-08-10 | ID chip inspection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202121856846.7U CN215494995U (en) | 2021-08-10 | 2021-08-10 | ID chip inspection device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN215494995U true CN215494995U (en) | 2022-01-11 |
Family
ID=79757745
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202121856846.7U Active CN215494995U (en) | 2021-08-10 | 2021-08-10 | ID chip inspection device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN215494995U (en) |
-
2021
- 2021-08-10 CN CN202121856846.7U patent/CN215494995U/en active Active
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address |
Address after: Room 804 and Room 805, Building 1, No. 188, Fuchunjiang Road, Suzhou, Jiangsu Province, 215163 Patentee after: Jingwei Shida Medical Technology (Suzhou) Co.,Ltd. Address before: 436000, the third floor, Phoenix Avenue, special area No. 1, Wutong Lake New District, Liangzi Lake, Ezhou, Hubei Patentee before: JINGWEI SHIDA MEDICAL TECHNOLOGY (WUHAN) CO.,LTD. |
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| CP03 | Change of name, title or address |