Scanning electron microscope sample stage for analyzing cross section of corrosion product on surface of sample
Technical Field
The utility model relates to a scanning electron microscope sample platform for analyzing sample surface corrosion product cross-section belongs to material corrosion product analytical equipment field.
Background
The analysis of cross section of corrosion products is an important analysis means in the field of material corrosion. The type of material corrosion, such as pitting corrosion, local corrosion and the like, can be determined through the analysis of the cross section morphology and the thickness of the corrosion product, and the degree of the material corrosion can also be judged.
A scanning electron microscope (scanning electron microscope for short) is an advanced electronic device for analyzing the cross-sectional morphology and the thickness of a corrosion product layer. The distribution condition of each element in the corrosion product layer can be determined by combining a scanning electron microscope and an energy spectrometer, and the corrosion mechanism of the material can be favorably researched.
At present, sample preparation is needed before cross section analysis of a corrosion product layer, generally, a detected sample is in a sheet shape, in the prior art, a sample pasting part of a scanning electron microscope sample stage is in a plane structure, and when the cross section of the detected sample is observed, the sheet-shaped detected sample needs to be observed in a vertical state and is not easy to fix, so that the sheet-shaped detected sample needs to be subjected to a complicated sample preparation process before detection, namely, the corroded sheet-shaped metal sample is sealed by epoxy resin for sample inlaying, and the inlaying is beneficial to fixing of the detected sample; however, the cross section of the tested sample can be affected by sample inlaying, which is not beneficial to observation, so that the cross section is polished after sample inlaying is finished, and then the epoxy resin sealed sample is adhered to a self-carrying sample table of a scanning electron microscope by using conductive adhesive; the preparation process of the detected sample is complicated, the working efficiency is low, and the sample can not be subjected to other detection. The existing sample tables specially used for section analysis are complex in structural design and complex to process and prepare. Therefore, the technical problem which needs to be solved urgently at present is to improve the detection efficiency and design, prepare and process the simple and convenient sample platform at the same time.
Disclosure of Invention
In view of this, the utility model aims at providing a scanning electron microscope sample platform for analyzing sample surface corrosion product cross-section, sample platform simple structure, the sample analysis that awaits measuring need not to inlay the appearance, has simplified the loaded down with trivial details preparation process of corrosion product layer cross-section sample, has solved the problem that the analysis efficiency is low, convenient high efficiency during the use.
In order to realize the purpose of the utility model, the following technical scheme is provided.
A scanning electron microscope sample stage for analyzing the cross section of a corrosion product on the surface of a sample consists of a sample seat and a base;
the sample seat consists of a sample seat sample adhering part, a sample seat clamping part and a sample seat fixing head; the sample seat clamping part is positioned below the sample seat sample adhering part; the sample seat fixing head is positioned below the sample seat clamping part.
The sample seat is of an integrated structure, namely, the sample seat does not need to be attached to a sample part, clamped by the sample seat and assembled by the sample seat fixing head when in use.
The sample seat sample pasting part is provided with 4 vertical surfaces for pasting the sample to be tested.
Preferably, the sample seat sample application part is a cuboid.
The sample holder clamping part is used for clamping the sample holder.
Preferably, the sample holder clamping part is a cylinder with an annular groove in the middle.
The sample seat fixing head is matched with fixing holes distributed on the base platform for use so as to connect the sample seat with the base.
Preferably, the bottom end of the sample holder fixing head is conical.
The base is composed of a base platform and a base fixing head.
A plurality of fixing holes are distributed in the base platform, and the fixing holes are formed in the base platform, so that sample seats can be placed in all the fixing holes simultaneously.
Preferably, a central fixing hole is formed in the base platform, a plurality of fixing holes are formed in the periphery of the central fixing hole, the distance between every two adjacent peripheral fixing holes is equal, and the distance between every two peripheral fixing holes is equal to the distance between every two peripheral fixing holes.
The fixing holes are through holes with the same diameter.
The base fixing head is positioned below the base table.
Base fixed head be used for with sample platform fixed mounting in scanning electron microscope sample storehouse.
Advantageous effects
The utility model provides a scanning electron microscope sample platform for analyzing sample surface corrosion product cross-section, simple structure, because the sample seat pastes a kind position and has the perpendicular, the sample under test can directly paste and observe the analysis on the perpendicular, need not to fix the sample under test through inlaying the appearance, so the utility model discloses a sample platform when observing the sample under test cross-section, has reduced the process of inlaying the appearance, the simple operation; in addition, because the sample-sticking part of the sample seat is provided with 4 vertical surfaces, each sample seat can be simultaneously used for placing a plurality of samples for analysis, and the efficiency of the scanning electron microscope for analyzing the cross section of the corrosion product layer is improved; the sample seat of sample platform is integral structure, compares with prior art, and its processing preparation is fairly simple.
Drawings
FIG. 1 is a schematic view of the structure of a sample holder according to example 1.
Fig. 2 is a schematic structural view of a base in embodiment 1.
Fig. 3 is a schematic structural diagram of a sample stage in example 1.
Wherein: 1-sample seat sample-sticking part; 2-the sample holder clamping part; 3-sample holder fixing head; 4-fixing holes; 5-a base station; 6-base fixing head.
Detailed Description
The technical solution of the present invention will be described below with reference to the accompanying drawings and specific embodiments of the present invention.
Example 1
As shown in fig. 1 to 3, the present embodiment provides a scanning electron microscope sample stage for analyzing the cross section of corrosion products on the surface of a sample, and the sample stage is composed of a sample holder and a base.
Wherein, the sample seat is composed of a sample seat sample adhering part 1, a sample seat clamping part 2 and a sample seat fixing head 3; the sample seat clamping part 2 is positioned below the sample seat sample adhering part 1; the sample holder fixing head 3 is positioned below the sample holder clamping part 2.
The sample holder is of an integrated structure, namely, the sample holder does not need to be assembled with the sample holder sample adhering part 1, the sample holder clamping part 2 and the sample holder fixing head 3 when in use.
Sample seat pastes appearance position 1 and is the cuboid, and 4 perpendiculars of this cuboid are used for pasting the sample that awaits measuring.
The sample holder clamping part 2 is a cylinder with an annular groove in the middle and is used for clamping a sample holder.
The bottom end of the sample holder fixing head 3 is conical, and the sample holder fixing head can be matched with fixing holes 4 distributed on a base table 5 for use so as to connect the sample holder with the base.
The base consists of a base table 5 and a base fixing head 6.
A plurality of fixing holes 4 are distributed on the base table 5, and the fixing holes 4 are arranged to enable all the fixing holes on the base table 5 to be capable of containing sample seats at the same time.
The fixing holes 4 are through holes with the same diameter.
The distribution mode of the fixing holes 4 is as follows: a fixing hole is arranged at the center of the base table 5; a plurality of fixing holes are arranged in the circumferential direction of the fixing hole by taking the fixing hole at the center as the circle center; the distances between adjacent fixing holes in the circumferential direction are equal.
The base fixing head 6 is located below the base table 5.
Base fixed head 6 is used for inciting somebody to action the utility model discloses a sample platform fixed mounting is in scanning electron mirror.
The size of sample seat and base can be adjusted according to the size in scanning electron microscope sample storehouse.
The application method of the scanning electron microscope sample stage for analyzing the cross section of the corrosion product on the surface of the sample, provided by the embodiment 1, comprises the following steps:
grinding the cross section of the corrosion product on the surface of the test sample by using sand paper to prepare a test sample; then, a test sample is stuck on the vertical surface of the sample sticking part 1 of the sample seat by using conductive adhesive; the sample holder is inserted into the base table 5, and the sample table loaded with the test sample is fixedly arranged in the sample bin of the scanning electron microscope through the base fixing head 6. Due to the arrangement of the vertical surface of the sample seat sample sticking part 1, the sample sticking process of corrosion products on the surface of the sample is reduced, and the operation is convenient.
In summary, the above is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.