CN214669178U

CN214669178U - Electron original paper test fixture

Info

Publication number: CN214669178U
Application number: CN202120297179.7U
Authority: CN
Inventors: 朱运波
Original assignee: Dongguan Nuoer Detection Technology Co ltd
Current assignee: Dongguan Nuoer Detection Technology Co ltd
Priority date: 2021-02-03
Filing date: 2021-02-03
Publication date: 2021-11-09
Anticipated expiration: 2031-02-03

Abstract

The utility model discloses an electronic original test tool, which comprises a base, a test groove is formed on the upper surface of the base, a T-shaped chute is symmetrically opened on the upper surface of the base, and a T-shaped chute is slidably connected in the T-shaped chute. A first slider, a support frame is fixedly connected to the upper surface of the first slider, a crossbar is fixedly connected between the two support frames, and a sliding block is sleeved on the outer surface of the crossbar, so A telescopic rod is fixedly connected to the lower surface of the sliding block. In the utility model, the probe can test the electronic original, and the telescopic rod can move the probe to the position where the electronic original needs to be tested, the operation is convenient, and the position of the probe can be fixed, so that the realization data can be measured at the same time. For recording, the sliding block and the support frame can drive the telescopic rod to move, so that the probe can reach the position where the electronic original needs to be tested, which increases the practicability of the tooling.

Description

Electron original paper test fixture

Technical Field

The utility model relates to a frock clamp technical field especially relates to an electron original paper test fixture.

Background

Currently, after various electronic devices are manufactured, the electronic devices are usually required to be tested. In the testing process, the testing points arranged on the circuit board of the electronic device need to be connected with debugging equipment, and the electronic device is tested by the debugging equipment to determine whether the electronic device can reach the specified quality index. When the electronic device is detected by the debugging equipment, the probe can be connected with the debugging equipment, so that the electronic device can be debugged by the debugging equipment;

the existing test tool is specially made for a certain electronic device, the position of a probe of the test tool is fixed, the use range is small, only a certain electronic element can be clamped, and the universality is poor.

Disclosure of Invention

The utility model aims at solving the shortcoming that exists among the prior art, and the electron original paper test fixture that proposes.

In order to achieve the above purpose, the utility model adopts the following technical scheme: an electronic element testing tool comprises a base, wherein a testing groove is formed in the upper surface of the base, T-shaped sliding grooves are symmetrically formed in the upper surface of the base, a first sliding block is connected in the T-shaped sliding grooves in a sliding mode, supporting frames are fixedly connected to the upper surface of the first sliding block, a cross rod is fixedly connected between the two supporting frames, the sliding block is sleeved and connected on the outer surface of the cross rod in a sliding mode, a telescopic rod is fixedly connected to the lower surface of the sliding block, a first sliding groove is formed in the position, located below the T-shaped sliding grooves, in the base and communicated with the testing groove, a threaded rod penetrates through the first sliding groove and is rotatably connected with the first sliding groove, a second sliding block is rotatably sleeved on the outer surface of the threaded rod in a symmetrical mode, a second sliding groove is formed in the position, opposite to the first sliding groove, in the base and communicated with the testing groove, a guide rod penetrates through and is rotatably connected in the second sliding groove, the outer surface of the guide rod is symmetrically sleeved with a third sliding block in a rotating mode, a fixing rod is fixedly connected between the third sliding block and the second sliding block, and a supporting plate is fixedly connected to the lower surface of the fixing rod.

As a further description of the above technical solution:

the lower surface of the telescopic rod is fixedly connected with a probe.

As a further description of the above technical solution:

the screw thread of threaded rod both ends is revolved to the opposite direction, the threaded rod extends to the outside one end fixedly connected with knob of base.

As a further description of the above technical solution:

the fixing rod, the supporting plate and the telescopic rod are all made of non-conductive materials.

As a further description of the above technical solution:

the outer surfaces of the fixing rods and the supporting plate are respectively provided with a spongy cushion.

As a further description of the above technical solution:

the threaded rod and the guide rod are equal in diameter.

The utility model discloses following beneficial effect has:

1. this electronic component test fixture, through the knob that sets up, the threaded rod, first slider, dead lever and backup pad, the electronic component can be placed to the backup pad, and the dead lever can drive the backup pad and remove to can carry out the clamping to the electronic component of various models, increased test fixture's application range and commonality, the knob can drive the threaded rod and rotate, thereby drive dead lever relative movement, the clamping of the electronic component of being convenient for has increased the efficiency of work to a certain extent.

2. This electron original paper test fixture, through the probe that sets up, the telescopic link, sliding block and support frame, the probe can be tested the electron original paper, the telescopic link can make the probe move the position that the electron original paper needs to test, high durability and convenient operation, and the position that can fix the probe, then can record realization data in the measuring, sliding block and support frame can drive the telescopic link and move, can make the probe reach the position that the electron original paper needs to test, the practicality of this frock has been increased.

Drawings

Fig. 1 is a schematic view of the overall structure of the present invention;

fig. 2 is a schematic structural view of the base of the present invention;

fig. 3 is a top view of the present invention.

Illustration of the drawings:

1. a base; 2. a test slot; 3. a T-shaped chute; 4. a first slider; 5. a support frame; 6. a cross bar; 7. a slider; 8. a telescopic rod; 9. a first chute; 10. a threaded rod; 11. a second slider; 12. a second chute; 13. a guide bar; 14. a third slider; 15. fixing the rod; 16. a support plate; 17. a probe; 18. a knob.

Detailed Description

The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.

In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience of description and simplification of description, but do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention; the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance, and furthermore, unless otherwise explicitly stated or limited, the terms "mounted," "connected," and "connected" are to be construed broadly and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the present invention can be understood in specific cases to those skilled in the art.

Referring to fig. 1-3, the present invention provides an embodiment: an electronic element testing tool comprises a base 1, wherein a testing groove 2 is formed in the upper surface of the base 1, T-shaped sliding grooves 3 are symmetrically formed in the upper surface of the base 1, a first sliding block 4 is connected in the T-shaped sliding grooves 3 in a sliding mode, supporting frames 5 are fixedly connected to the upper surface of the first sliding block 4, a cross rod 6 is fixedly connected between the two supporting frames 5, a sliding block 7 is connected to the outer surface of the cross rod 6 in a sleeved mode, a telescopic rod 8 is fixedly connected to the lower surface of the sliding block 7, a first sliding groove 9 is formed in the base 1 and located below the T-shaped sliding grooves 3 and communicated with the testing groove 2, a threaded rod 10 penetrates through the first sliding groove 9 and is rotatably connected with the first sliding groove 9, a second sliding block 11 is rotatably connected to the outer surface of the threaded rod 10 in a sleeved mode, a second sliding groove 12 is formed in the base 1 and located opposite to the first sliding groove 9 and communicated with the testing groove 2, and a guide rod 13 penetrates through the second sliding groove 12 and is rotatably connected with the second sliding groove, the outer surface of the guide rod 13 is symmetrically sleeved with a third sliding block 14 in a rotating mode, a fixing rod 15 is fixedly connected between the third sliding block 14 and the second sliding block 11, and a supporting plate 16 is fixedly connected to the lower surface of the fixing rod 15.

The lower surface of the telescopic rod 8 is fixedly connected with a probe 17, and the probe 17 tests an electronic component; the thread turning directions of two ends of the threaded rod 10 are opposite, one end of the threaded rod 10 extending to the outside of the base 1 is fixedly connected with a knob 18, the thread turning directions are opposite, so that the second sliding blocks 11 can move oppositely when the threaded rod 10 rotates, and the knob 18 can drive the threaded rod 10 to rotate; the fixing rod 15, the supporting plate 16 and the telescopic rod 8 are all made of non-conductive materials, and the non-conductive materials can avoid the short circuit condition caused by a clamp in the test process; sponge pads are arranged on the outer surfaces of the fixing rod 15 and the supporting plate 16, and have a certain protection effect on electronic elements; the threaded rod 10 and the guide rod 13 have the same diameter, and the threaded rod 10 and the guide rod 13 have the same diameter so that the fixing rod 15 is in a horizontal state.

The working principle is as follows: when using electronic component test fixture, arrange the electronic component in backup pad 16 on, rotate knob 18, knob 18 rotates and drives threaded rod 10 and rotate, threaded rod 10 rotates and drives first slider 4 and remove, first slider 4 removes and drives dead lever 15 and remove, dead lever 15 removes and drives backup pad 16 and remove, thereby press from both sides tight electronic component, remove support frame 5, support frame 5 removes and drives horizontal pole 6 and remove, horizontal pole 6 removes and drives sliding block 7 and remove, sliding block 7 removes and drives telescopic link 8 and remove, telescopic link 8 removes and drives probe 17 and remove to the test point and test.

Finally, it should be noted that: although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that modifications and variations can be made in the embodiments or in part of the technical features of the embodiments without departing from the spirit and the scope of the invention.

Claims

1. An electronic component testing tool, comprising a base (1), characterized in that: a test slot (2) is provided on the upper surface of the base (1), and a T-shaped symmetrically is provided on the upper surface of the base (1). A chute (3), a first slider (4) is slidably connected in the T-shaped chute (3), a support frame (5) is fixedly connected to the upper surface of the first slider (4), two A cross bar (6) is fixedly connected between the support frames (5), and a sliding block (7) is sleeved and slidably connected to the outer surface of the cross bar (6), and the lower surface of the sliding block (7) is fixed A telescopic rod (8) is connected, and a first chute (9) is opened in the base (1) and located below the T-shaped chute (3) and communicated with the test slot (2). A threaded rod (10) is rotatably connected through the chute (9), the outer surface of the threaded rod (10) is symmetrically sleeved and rotatably connected with a second sliding block (11). A second chute (12) is opened at the opposite position of the chute (9) and communicated with the test slot (2). A guide rod (13) is rotatably connected through the second chute (12). The outer surface of the rod (13) is symmetrically sleeved and rotatably connected with a third sliding block (14), and a fixing rod (15) is fixedly connected between the third sliding block (14) and the second sliding block (11), so A support plate (16) is fixedly connected to the lower surface of the fixing rod (15).

2 . The electronic component testing tool according to claim 1 , wherein a probe ( 17 ) is fixedly connected to the lower surface of the telescopic rod ( 8 ). 3 .

3. An electronic component testing tool according to claim 1, characterized in that the threads at both ends of the threaded rod (10) have opposite directions of rotation, and the threaded rod (10) extends to one end outside the base (1). A knob (18) is fixedly connected.

4 . The electronic component testing tool according to claim 1 , wherein the materials of the fixing rod ( 15 ), the support plate ( 16 ) and the telescopic rod ( 8 ) are all non-conductive materials. 5 .

5 . The electronic component testing tool according to claim 1 , wherein the outer surfaces of the fixing rod ( 15 ) and the support plate ( 16 ) are provided with sponge pads. 6 .

6 . The electronic component testing tool according to claim 1 , wherein the diameter of the threaded rod ( 10 ) and the guide rod ( 13 ) are equal. 7 .