CN214408697U - Dual-wavelength Raman test probe - Google Patents
Dual-wavelength Raman test probe Download PDFInfo
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- CN214408697U CN214408697U CN202023255514.1U CN202023255514U CN214408697U CN 214408697 U CN214408697 U CN 214408697U CN 202023255514 U CN202023255514 U CN 202023255514U CN 214408697 U CN214408697 U CN 214408697U
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Abstract
The utility model relates to a dual wavelength raman test probe, which comprises four lines of lightwave paths. The first line is provided with a first narrow linewidth optical filter and a first laser reflector; a second line is provided with a second narrow linewidth optical filter and a second laser reflector; the third line is provided with a third narrow-linewidth optical filter and a first dichroic mirror; and the fourth line is provided with a fourth narrow-linewidth optical filter, a second dichroic mirror and a third dichroic mirror. And the short wave is emitted from the third line through the third dichroic mirror, the second dichroic mirror and the first dichroic mirror. And the long wave is emitted from the second line, is reflected to the object to be detected through the second laser reflector, the first dichroic mirror, the second dichroic mirror and the third dichroic mirror, and the excitation wave is emitted from the fourth line through the third dichroic mirror, the second dichroic mirror and the second dichroic mirror. The design integrates two probes with different excitation wavelengths, and two channels with different excitation wavelengths are shared.
Description
Technical Field
The utility model relates to a raman test field, concretely relates to raman test probe, this raman test probe have two kinds of wavelength test passageways.
Background
Raman detection is a technique in which light is irradiated on a substance to cause scattering, and the scattered light contains not only an elastic component (rayleigh line) having the same frequency as that of excitation light but also a component having a different frequency from that of excitation light, and the latter is collectively called a raman line. Inelastic scattering generated by molecular vibration, optical phonon excitation in a solid and the like and the interaction with excitation light is called Raman scattering, and a spectrum formed by combining Rayleigh scattering and Raman scattering is generally called Raman spectrum, while Raman scattering is called anti-Stokes line with the wavelength shorter than that of incident light, and is called Stokes line with the wavelength longer, and the anti-Stokes line is a Raman signal which needs to be captured by people.
The Raman probe is a key point for collecting Raman signals, and a dichroic mirror and an optical filter in the Raman probe form an important part for screening anti-Stokes lines. At present, the raman probes on the market are mainly single-wavelength raman probes, but do not have raman probes common to integrated dual-wavelength or multi-wavelength, and when the existing raman probes are used for realizing raman detection under different excitation wavelengths, two raman probes corresponding to the wavelengths need to be used respectively, so that the operation is complicated, and the existing raman probes cannot be used in product equipment with high integration level. There is a need in the market interest for a wide range of dual wavelength raman probes.
SUMMERY OF THE UTILITY MODEL
The utility model aims to solve the technical problem that the raman probe on the market at present need use two raman probes that correspond the wavelength respectively when realizing the raman detection under the different excitation wavelength, makes the operation become loaded down with trivial details, and can't use in the product equipment as the integrated level height.
In order to solve the technical problem, the utility model provides a dual wavelength raman test probe, arouse the return circuit including shortwave excitation return circuit and long wave, shortwave excitation return circuit and long wave arouse the return circuit and include four lines light wave path altogether. A first narrow line width optical filter and a first laser mirror are arranged on the first row of optical wave paths from left to right; a second narrow line width optical filter and a second laser mirror are arranged on the second row of the optical wave channel from left to right; a third narrow-linewidth optical filter and a first dichroic mirror are arranged on the third row of the optical wave paths from left to right; and a fourth narrow-line-width optical filter, a second dichroic mirror and a third dichroic mirror are arranged on the fourth row light wave channel from left to right.
Short waves are emitted from the first row of light wave paths, penetrate through the first narrow-line-width light filter, are reflected to the third dichroic mirror through the first laser reflector, and are reflected to an object to be detected, returned excitation light rays are transmitted through the third dichroic mirror, are emitted to the second dichroic mirror, are reflected to the first dichroic mirror, are reflected to the third narrow-line-width light filter, are transmitted through the third narrow-line-width light filter, and are emitted from the third row of light wave paths.
The long wave is emitted from the second line light wave path, penetrates through the second narrow-line-width filter, is reflected by the second laser reflector, is transmitted through the first dichroic mirror, is directly emitted to the second dichroic mirror, is reflected to the third dichroic mirror, is transmitted through the third dichroic mirror and is emitted to an object to be detected, and the returned excitation light is transmitted through the third dichroic mirror, is emitted to the second dichroic mirror, is transmitted through the second dichroic mirror and is emitted from the fourth line light wave path.
The design integrates two probes with different excitation wavelengths, and two channels with different excitation wavelengths are shared.
As a further improvement of the dual wavelength raman test probe of the present invention, the filtering wavelength of the first narrow line width optical filter is the filtering wavelength of the second narrow line width optical filter, the cut-off wavelength of the third dichroic mirror is less than the cut-off wavelength of the first dichroic mirror is less than the cut-off wavelength of the second dichroic mirror.
As the utility model discloses a first mode of dual wavelength raman test probe's further improvement, first narrow linewidth light filter is 532nm narrow linewidth light filter, third dichroic mirror is 532nm dichroic mirror, first dichroic mirror is 757nm dichroic mirror, second dichroic mirror is 785nm dichroic mirror, second narrow linewidth light filter is 785nm narrow linewidth light filter.
As the utility model discloses a second mode of dual wavelength raman test probe's further improvement, first narrow linewidth light filter is 532nm narrow linewidth light filter, third dichroic mirror is 532nm dichroic mirror, first dichroic mirror is 757nm dichroic mirror, second dichroic mirror is 1064nm dichroic mirror, second narrow linewidth light filter is 1064nm narrow linewidth light filter.
As the utility model discloses a dual wavelength raman test probe's further improved third mode, first narrow linewidth light filter is 785nm narrow linewidth light filter, third dichroic mirror is 785nm dichroic mirror, first dichroic mirror is 980nm dichroic mirror, second dichroic mirror is 1064nm dichroic mirror, second narrow linewidth light filter is 1064nm narrow linewidth light filter.
As the utility model discloses a dual wavelength raman test probe's further improvement, first laser mirror, second laser mirror, first dichroic mirror, second dichroic mirror and third dichroic mirror are parallel to each other, all are 45 contained angles with incident light, can also be other angles. When the included angle is 45 degrees, light rays horizontally enter from the left side, penetrate through the vertical first narrow-line-width optical filter and irradiate on the first laser reflecting mirror inclined by 45 degrees, wherein the first laser reflecting mirror is arranged right above the third dichroic mirror, the second laser reflecting mirror is arranged right above the first dichroic mirror, the first dichroic mirror is arranged right above the second dichroic mirror, the second dichroic mirror is arranged on the left side of the third dichroic mirror, and light waves advance according to the short wave excitation loop and the long wave excitation loop. When first laser reflector, second laser reflector, first dichroic mirror, second dichroic mirror and third dichroic mirror are parallel to each other, but when being not 45 contained angles with incident light, can translate the above five mirror bodies as required for the light wave still advances on shortwave excitation return circuit and long wave excitation return circuit, can carry out dual wavelength raman test equally.
As a further improvement of the dual-wavelength Raman test probe of the utility model, the Raman test probe also comprises a shell, the shell comprises a main shell and a cylinder protruding out of the main shell, and the axial direction of the cylinder is parallel to the direction of incident light waves; the column body comprises a hollow column and a hollow cap which are matched with each other and used for loading an object to be tested; all narrow linewidth filters, all laser mirrors and all dichroic mirrors are fixedly arranged in the main shell, and all light path channels are also arranged in the main shell.
As a further improvement of the dual-wavelength raman test probe of the present invention, the raman test probe further includes four laser collimating mirrors, one laser collimating mirror is respectively disposed outside each narrow-line-width optical filter; on the light wave incident paths of the first line and the second line, incident light waves firstly pass through the laser collimating lens and then enter the narrow-linewidth optical filter; and on the light wave emitting paths of the third row and the fourth row, the light waves are emitted from the laser collimating mirror after passing through the narrow-line-width optical filter.
As a further improvement of the first mode of the dual-wavelength raman test probe of the present invention, the raman test probe further includes a 532nm narrow-linewidth laser, a 532nm raman signal receiving terminal, a 785nm narrow-linewidth laser, a 785nm raman signal receiving terminal, and a plurality of optical fibers; a 532nm narrow-line-width laser inputs light waves to the laser collimating lens in the first row through optical fibers, and a 532nm Raman signal receiving end receives Raman signals returned by the laser collimating lens in the third row through the optical fibers; the 785nm narrow-line-width laser inputs light waves to the laser collimating lens in the second row through optical fibers, and the 785nm Raman signal receiving end receives Raman signals returned by the laser collimating lens (12) in the fourth row through the optical fibers.
As the utility model discloses a further improvement of dual wavelength raman test probe's first mode, the optic fibre that 532nm narrow linewidth laser instrument is connected and the optic fibre that 532nm raman signal receiving terminal is connected are tied in a bundle intraductally, and the optic fibre that 785nm narrow linewidth laser instrument is connected and the optic fibre that 785nm raman signal receiving terminal is connected are tied in a bundle intraductally in another.
The utility model has the advantages that: under the condition that light energy is not influenced, optical axes of two wavelengths are fused to the same channel, reflection and transmission of light with specified wavelengths are controlled by using dichroic mirrors with 3 different wavelengths, so that lasers with two different wavelengths are on the same optical axis to acquire Raman signals of an object to be detected, and dual-wavelength Raman detection is efficiently realized.
Drawings
Fig. 1 is the short wave excitation circuit schematic diagram of the dual wavelength raman test probe of the present invention.
Fig. 2 is the schematic diagram of the long-wavelength excitation loop of the dual-wavelength raman test probe of the present invention.
Fig. 3 is the external structure schematic diagram of the dual wavelength raman test probe of the present invention.
Reference numerals: the device comprises a first narrow linewidth optical filter 1, a second narrow linewidth optical filter 2, a third narrow linewidth optical filter 3, a fourth narrow linewidth optical filter 4, a first laser reflector 5, a second laser reflector 6, a first dichroic mirror 7, a second dichroic mirror 8, a third dichroic mirror 9, an object to be detected 10, a shell 11, a main shell 111, a hollow column 112, a hollow cap 113, a laser collimating mirror 12 and an optical fiber 13.
Detailed Description
Embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
Referring to fig. 1 and 2, the present invention provides a dual wavelength raman test probe, which includes a short wave excitation circuit (as shown in fig. 1) and a long wave excitation circuit (as shown in fig. 2), wherein the short wave excitation circuit and the long wave excitation circuit include four light wave paths. A first narrow linewidth optical filter 1 and a first laser reflector 5 are arranged on the first row of optical wave paths from left to right; a second narrow linewidth optical filter 2 and a second laser mirror 6 are arranged on the second row of the optical wave channel from left to right; a third narrow-linewidth optical filter 3 and a first dichroic mirror 7 are arranged on the third row of the optical wave path from left to right; and a fourth narrow-line-width optical filter 4, a second dichroic mirror 8 and a third dichroic mirror 9 are arranged on the fourth row light wave channel from left to right. Wherein, four narrow linewidth light filters all set up upright, and first laser mirror 5, second laser mirror 6, first dichroic mirror 7, second dichroic mirror 8 and third dichroic mirror 9 are parallel to each other, and all are 45 contained angles with incident light.
Owing to the dichroic mirror principle, the dichroic mirror is to being greater than the nearly complete transmission of dichroic mirror cut-off wavelength light, and the dichroic mirror is the nearly complete reflection of light that is less than its cut-off wavelength, therefore in order to realize the utility model discloses a light path design sets up the cut-off wavelength of first narrow linewidth light filter 1 ═ the cut-off wavelength of third dichroic mirror 9 ═ the cut-off wavelength of first dichroic mirror 7 < the cut-off wavelength of second dichroic mirror 8 ═ the filter wavelength of second narrow linewidth light filter 2. In the first embodiment of the present invention, the first narrow linewidth filter 1 is a 532nm narrow linewidth filter, the third dichroic mirror 9 is a 532nm dichroic mirror, the first dichroic mirror 7 is a 757nm dichroic mirror, the second dichroic mirror 8 is a 785nm dichroic mirror, and the second narrow linewidth filter 2 is a 785nm narrow linewidth filter.
The Raman test probe further comprises four laser collimating lenses 12, and one laser collimating lens 12 is arranged outside each narrow linewidth optical filter. Transmissive collimators are used in the beam delivery system to maintain collimation of the beam between the laser resonator and the focusing optics. On the light wave incident paths of the first row and the second row, incident light waves firstly pass through the laser collimating mirror 12 and then enter the narrow linewidth optical filter; in the light wave emitting paths of the third row and the fourth row, the light waves are emitted from the laser collimating mirror 12 after passing through the narrow-line-width optical filter.
The Raman test probe further comprises a 532nm narrow line width laser, a 532nm Raman signal receiving end, a 785nm narrow line width laser, a 785nm Raman signal receiving end and a plurality of optical fibers 13. The 532nm narrow-linewidth laser inputs light waves to the laser collimating lens 12 in the first row through optical fibers, and the 532nm Raman signal receiving end receives Raman signals returned by the laser collimating lens 12 in the third row through the optical fibers. The optical fiber connected with the 532nm narrow-linewidth laser and the optical fiber connected with the 532nm Raman signal receiving end are bundled in a tube. The 785nm narrow-linewidth laser inputs light waves to the laser collimating lens 12 in the second row through optical fibers, and the 785nm Raman signal receiving end receives Raman signals returned by the laser collimating lens 12 in the fourth row through the optical fibers. The optical fiber connected with the 785nm narrow-linewidth laser and the optical fiber connected with the 785nm Raman signal receiving end are bundled in the other tube.
As shown in fig. 1, in the first row of lightwave paths, a 532nm narrow-linewidth laser inputs lightwaves through an optical fiber 13, the lightwaves pass through a laser collimating mirror 12 and then transmit through a 532nm first narrow-linewidth optical filter 1, and the 532nm laser can effectively reduce stray light after passing through the 532nm narrow-linewidth optical filter. The light wave is emitted to the first laser reflector 5, and is reflected to the third dichroic mirror 9 through the first laser reflector 5, and the third dichroic mirror 9 is a 532nm dichroic mirror. Due to the principle of the dichroic mirror, the third dichroic mirror 9 almost completely transmits the light with the wavelength of more than 532nm, almost completely reflects the light with the wavelength of less than 532nm, and the 532nm light wave is almost completely reflected to the object 10 to be measured at the third dichroic mirror 9. The excitation light is scattered on the object to be measured 10, the third dichroic mirror 9 can receive the stokes line and the anti-stokes line, only the anti-stokes line can almost completely penetrate through the 532nm third dichroic mirror 9 due to the principle of the dichroic mirror, and the excitation light which is transmitted through the third dichroic mirror 9 is emitted to the second dichroic mirror 8. Because the second dichroic mirror 8 is a 785nm dichroic mirror, and because the wavelength of a raman signal with an excitation wavelength of 532nm is greater than 532nm and less than 785nm, the raman signal is almost completely reflected to the first dichroic mirror 7 on the 785nm second dichroic mirror 8, the first dichroic mirror 7 is a 757nm dichroic mirror, and is reflected to the third narrow-line-width optical filter 3 through the dichroic mirror principle again, transmits through the third narrow-line-width optical filter 3, and is emitted from the third row light wave passage; the 532nm Raman signal receiving end receives the Raman signal of 532nm excitation wave, and the spectral analysis is carried out by the analysis system.
As shown in fig. 2, in the second row of optical wave path, the 785nm narrow-linewidth laser inputs 785nm long wave through the optical fiber, transmits through the 785nm second narrow-linewidth optical filter 2, and is reflected to the first dichroic mirror 7 by the second laser reflector 6, because the incident wavelength 785nm is greater than 757nm, almost all of the incident light can transmit through the 757nm first dichroic mirror 7 and strike on the second dichroic mirror 8, the same 785nm laser cannot transmit through the 785nm second dichroic mirror 8, and is reflected again and transmits through the 532nm third dichroic mirror 9 and strikes on the object to be measured 10. The anti-stokes lines that are raman scattered back transmit through the third dichroic mirror 9 and are directed to the second dichroic mirror 8. Because the wavelength of the raman signal with the excitation wavelength of 785nm is greater than 785nm, the raman wave transmits through the second dichroic mirror 8 and is emitted from the fourth line optical wave path, and the raman signal with the excitation wavelength of 785nm is received by the receiving end of the raman signal with the wavelength of 785nm and is delivered to the analysis system for spectral analysis.
As shown in fig. 3, the raman test probe further includes a housing 11, where the housing 11 includes a main housing 111 and a cylinder protruding from the main housing, and an axial direction of the cylinder is parallel to a direction of an incident light wave; the column comprises a hollow column 112 and a hollow cap 113 which are matched with each other for loading the object 10 to be measured; all narrow linewidth filters, all laser mirrors and all dichroic mirrors are fixedly arranged in the main shell 111, and all light path channels are further arranged in the main shell.
The excitation circuit of above shortwave and long wave shares the dichroscope of three different cut-off wavelength, and the system only used an acquisition channel promptly, utilizes the dichroscope of 3 different wavelength to control the reflection and the transmission of appointed wavelength light, under the condition that does not influence light energy, makes the laser fusion of two kinds of different wavelength on same optical axis, carries out the acquisition to the determinand raman signal, has overcome prior art and need two more raman probe even when the multi-wavelength test, all very unfavorable problem in integrating and convenient. The utility model discloses an optical structure designs, designs coaxial raman probe and can effectively fuse two or a plurality of different excitation wavelength's raman probe.
The dual wavelength raman test probe of the present invention is suitable for raman detection of any two wavelengths, for example, in addition to the first embodiment described above, there can be the following embodiments.
The utility model discloses a dual wavelength raman test probe's second kind implementation mode, the only difference with first implementation mode is, first narrow line width light filter 1 is 532nm narrow line width light filter, third dichroic mirror 9 is 532nm dichroic mirror, first dichroic mirror 7 is 757nm dichroic mirror (get 532nm and 1064nm between the arbitrary value do), second dichroic mirror 8 is 1064nm dichroic mirror, second narrow line width light filter 2 is 1064nm narrow line width light filter, and is corresponding, 532nm narrow line width laser in addition, 532nm raman signal receiving terminal, 1064nm narrow line width laser, 1064nm raman signal receiving terminal.
The utility model discloses a dual wavelength raman test probe's third implementation mode, the only difference with first implementation mode is, first narrow line width light filter 1 is 785nm narrow line width light filter, third dichroic mirror 9 is 785nm dichroic mirror, first dichroic mirror 7 is 980nm dichroic mirror (get the arbitrary value between 785nm and 1064nm and do), second dichroic mirror 8 is 1064nm dichroic mirror, second narrow line width light filter 2 is 1064nm narrow line width light filter, and is corresponding, also 785nm narrow line width laser instrument, 785nm raman signal receiving terminal, 1064nm narrow line width laser instrument, 1064nm raman signal receiving terminal.
Claims (10)
1. A dual wavelength Raman test probe, characterized in that: the device comprises a short wave excitation circuit and a long wave excitation circuit, wherein the short wave excitation circuit and the long wave excitation circuit comprise four light wave paths in total; a first narrow linewidth optical filter (1) and a first laser reflector (5) are arranged on the first row of optical wave paths from left to right; a second narrow linewidth optical filter (2) and a second laser mirror (6) are arranged on the second row of the optical wave channel from left to right; a third narrow-linewidth optical filter (3) and a first dichroic mirror (7) are arranged on the third row of the optical wave paths from left to right; a fourth narrow-linewidth optical filter (4), a second dichroic mirror (8) and a third dichroic mirror (9) are arranged on the fourth row light-wave channel from left to right;
short waves are emitted from the first row of light wave paths, penetrate through the first narrow line width light filter (1), are reflected to the third dichroic mirror (9) through the first laser reflector (5), and then are reflected to an object to be measured (10), returned excitation light rays are transmitted through the third dichroic mirror (9), are emitted to the second dichroic mirror (8), are reflected to the first dichroic mirror (7), are reflected to the third narrow line width light filter (3), are transmitted through the third narrow line width light filter (3), and are emitted from the third row of light wave paths;
the long wave is emitted from the second line light wave path, is transmitted through the second narrow-line-width optical filter (2), is reflected to the first dichroic mirror (7) through the second laser reflector (6), is transmitted through the first dichroic mirror (7), is directly emitted to the second dichroic mirror (8), is reflected to the third dichroic mirror (9), is transmitted through the third dichroic mirror (9) and is emitted to an object to be detected (10), and the returned excitation light is transmitted through the third dichroic mirror (9), is emitted to the second dichroic mirror (8), is transmitted through the second dichroic mirror (8), and is emitted from the fourth line light wave path.
2. The dual wavelength raman test probe of claim 1, wherein: the filtering wavelength of the first narrow-line-width filter (1) is less than the cutoff wavelength of the third dichroic mirror (9) and less than the cutoff wavelength of the first dichroic mirror (7) and less than the cutoff wavelength of the second dichroic mirror (8) is less than the filtering wavelength of the second narrow-line-width filter (2).
3. The dual wavelength raman test probe of claim 2, wherein: the first narrow linewidth optical filter (1) is a 532nm narrow linewidth optical filter, the third dichroic mirror (9) is a 532nm dichroic mirror, the first dichroic mirror (7) is a 757nm dichroic mirror, the second dichroic mirror (8) is a 785nm dichroic mirror, and the second narrow linewidth optical filter (2) is a 785nm narrow linewidth optical filter.
4. The dual wavelength raman test probe of claim 2, wherein: the first narrow linewidth optical filter (1) is a 532nm narrow linewidth optical filter, the third dichroic mirror (9) is a 532nm dichroic mirror, the first dichroic mirror (7) is a 757nm dichroic mirror, the second dichroic mirror (8) is a 1064nm dichroic mirror, and the second narrow linewidth optical filter (2) is a 1064nm narrow linewidth optical filter.
5. The dual wavelength raman test probe of claim 2, wherein: the first narrow linewidth optical filter (1) is a 785nm narrow linewidth optical filter, the third dichroic mirror (9) is a 785nm dichroic mirror, the first dichroic mirror (7) is a 980nm dichroic mirror, the second dichroic mirror (8) is a 1064nm dichroic mirror, and the second narrow linewidth optical filter (2) is a 1064nm narrow linewidth optical filter.
6. The dual wavelength raman test probe of claim 1, wherein: the first laser reflector (5), the second laser reflector (6), the first dichroic mirror (7), the second dichroic mirror (8) and the third dichroic mirror (9) are parallel to each other and form an included angle of 45 degrees with incident light.
7. The dual wavelength raman test probe of claim 1, wherein: the Raman test probe further comprises a shell (11), wherein the shell (11) comprises a main shell (111) and a cylinder protruding out of the main shell, and the axial direction of the cylinder is parallel to the direction of incident light waves; the column comprises a hollow column (112) and a hollow cap (113) which are matched with each other for loading an object to be measured (10); all narrow linewidth filters (1, 2, 3, 4), all laser mirrors (5, 6) and all dichroic mirrors (7, 8, 9) are all fixedly arranged in a main shell (111), and all light path channels are further arranged in the main shell.
8. The dual wavelength raman test probe of claim 3, wherein: the Raman test probe also comprises four laser collimating mirrors (12), and one laser collimating mirror (12) is arranged outside each narrow linewidth optical filter (1, 2, 3, 4); on the light wave incident paths of the first line and the second line, incident light waves firstly pass through a laser collimating mirror (12) and then enter a narrow-linewidth optical filter; in the light wave emitting paths of the third row and the fourth row, light waves penetrate through the narrow-line-width optical filter and then are emitted from the laser collimating mirror (12).
9. The dual wavelength raman test probe of claim 8, wherein: the Raman test probe also comprises a 532nm narrow line width laser, a 532nm Raman signal receiving end, a 785nm narrow line width laser, a 785nm Raman signal receiving end and a plurality of optical fibers (13); a 532nm narrow-linewidth laser inputs light waves to the laser collimating lens (12) in the first row through optical fibers, and a 532nm Raman signal receiving end receives Raman signals returned by the laser collimating lens (12) in the third row through the optical fibers; the 785nm narrow-line-width laser inputs light waves to the laser collimating lens (12) in the second row through optical fibers, and the 785nm Raman signal receiving end receives Raman signals returned by the laser collimating lens (12) in the fourth row through the optical fibers.
10. The dual wavelength raman test probe of claim 9, wherein: the optical fiber connected with the 532nm narrow-linewidth laser and the optical fiber connected with the 532nm Raman signal receiving end are bundled in one tube, and the optical fiber connected with the 785nm narrow-linewidth laser and the optical fiber connected with the 785nm Raman signal receiving end are bundled in the other tube.
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| CN112505018A (en) * | 2020-12-29 | 2021-03-16 | 奥谱天成（厦门）光电有限公司 | Dual-wavelength Raman test probe |
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