CN212658211U - Optical quartz piece warpage check out test set - Google Patents
Optical quartz piece warpage check out test set Download PDFInfo
- Publication number
- CN212658211U CN212658211U CN202021505332.2U CN202021505332U CN212658211U CN 212658211 U CN212658211 U CN 212658211U CN 202021505332 U CN202021505332 U CN 202021505332U CN 212658211 U CN212658211 U CN 212658211U
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- measuring
- warpage
- quartz plate
- scale
- test board
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Abstract
The utility model discloses an optical quartz plate warpage detection device, which comprises a test board, wherein two opposite side walls of the test board are fixedly provided with length measurement mechanisms, the two length measurement mechanisms comprise fixed plates and measurement plates, and the two fixed plates are respectively and fixedly arranged on the two opposite side walls of the test board; the utility model has the advantages that: the utility model relates to an optics quartz plate warpage check out test set can fix through two measuring boards and wait to detect the projection length of detecting optics quartz plate and calculating this quartz plate, can measure the warpage volume of quartz plate through the measuring needle, when the warpage volume is too little be difficult for seeing out the registration, through the height of laser pen and scale and laser pen, the distance between measuring needle and the scale can calculate the warpage volume of higher accuracy, the warpage volume is divided with the projection height and is the higher advantage of this quartz glass piece, the utility model has the advantages of low in manufacturing cost and detection precision.
Description
Technical Field
The utility model relates to a warpage check out test set, in particular to optics quartz plate warpage check out test set belongs to warpage check out test set technical field.
Background
The warpage is used for expressing the bending degree of a plane in space, and is defined as the distance between two points with the farthest distance of the warpage plane in the height direction in a numerical value, the warpage of an absolute plane is 0, the warpage is one of important indexes for evaluating the quality of a product, in the existing evaluation system, the warpage evaluation is carried out by using warpage, the maximum warpage or the warpage of a specific part is generally used for evaluation, common optical quartz plate warpage detection equipment is generally measured by only using a ruler, when a quartz plate with a smaller size is detected, the data is difficult to read directly, and the detection precision is lower.
SUMMERY OF THE UTILITY MODEL
An object of the utility model is to provide an optics quartz plate warpage check out test set to detect the lower problem of precision when solving the common optics quartz plate warpage check out test set that proposes among the above-mentioned background art and detecting the quartz plate that the size is than littleer.
In order to achieve the above object, the utility model provides a following technical scheme: the optical quartz plate warping degree detection equipment comprises a test bench, wherein two opposite side walls of the test bench are fixedly provided with length measuring mechanisms respectively, each length measuring mechanism comprises a fixed plate and a measuring plate, the two fixed plates are fixedly arranged on the two opposite side walls of the test bench respectively, the two measuring plates are arranged on two sides of the top end of the test bench in a sliding mode respectively, the two fixed plates penetrate through the two opposite side walls and are provided with screw rods in a threaded mode, one ends of the two screw rods are connected with the two measuring plates in a rotating mode respectively, the other ends of the two screw rods are fixedly provided with knobs, the front side wall of the test bench is provided with a sliding groove, the inner end of the sliding groove is provided with three sliding blocks in a sliding mode, the top ends of the two sliding blocks are fixedly provided with scale rods, and the outer walls, another the top fixed mounting of slider has the scale, first measuring mechanism includes first solid fixed ring, first solid fixed ring slidable mounting is in the outer wall of scale rod, first solid fixed ring runs through the rampart screw thread and installs first knob bolt, first solid fixed ring outer wall rotates and installs the spliced pole, spliced pole one end fixed mounting has the laser pen, second measuring mechanism includes the solid fixed ring of second, the solid fixed ring slidable mounting of second is in the outer wall of scale rod, the solid fixed ring of second runs through the rampart screw thread and installs second knob bolt, the solid fixed ring of second is two relative outer walls respectively fixed mounting have measuring needle and collar, the inner fixed mounting of collar has the film piece.
As an optimized technical scheme of the utility model, the through-hole has been seted up at the middle part of pellicle piece.
As a preferred technical scheme of the utility model, measurement needle one end extends to the top at testboard up end middle part.
As a preferred technical scheme of the utility model, second measuring mechanism is located between first measuring mechanism and the scale.
As an optimized technical scheme of the utility model, the up end of testboard is close to slider one side and is provided with the scale mark.
Compared with the prior art, the beneficial effects of the utility model are that: the utility model relates to an optics quartz plate warpage check out test set can fix through two measuring boards and wait to detect the projection length of detecting optics quartz plate and calculating this quartz plate, can measure the warpage volume of quartz plate through the measuring needle, when the warpage volume is too little be difficult for seeing out the registration, through the height of laser pen and scale and laser pen, the distance between measuring needle and the scale can calculate the warpage volume of higher accuracy, the warpage volume is divided with the projection height and is the higher advantage of this quartz glass piece, the utility model has the advantages of low in manufacturing cost and detection precision.
Drawings
Fig. 1 is a schematic structural view of the present invention;
fig. 2 is a schematic structural diagram of a first measuring mechanism of the present invention;
fig. 3 is a schematic structural diagram of a second measuring mechanism of the present invention.
In the figure: 1. a test bench; 2. a length measuring mechanism; 3. a slider; 4. a graduated rod; 5. a graduated scale; 6. a first measuring mechanism; 7. a second measuring mechanism; 11. a chute; 12. scale lines; 21. a fixing plate; 22. a screw; 23. a knob; 24. measuring a plate; 61. a first retaining ring; 62. a first knob bolt; 63. connecting columns; 64. a laser pen; 71. a second retaining ring; 72. a second knob bolt; 73. a measuring tip; 74. a mounting ring; 75. a film sheet; 751. and a through hole.
Detailed Description
The technical solutions in the embodiments of the present invention will be described clearly and completely with reference to the accompanying drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative work belong to the protection scope of the present invention.
Referring to fig. 1-3, an optical quartz plate warpage detection apparatus includes a test board 1, two opposite sidewalls of the test board 1 are fixedly mounted with length measurement mechanisms 2 for measuring lengths of quartz plates, each of the two length measurement mechanisms 2 includes a fixing plate 21 and a measurement plate 24, the two fixing plates 21 are respectively fixedly mounted on the two opposite sidewalls of the test board 1, the two measurement plates 24 are respectively slidably mounted on two sides of a top end of the test board 1, the two fixing plates 21 are respectively mounted with a screw 22 through threads of the two opposite sidewalls, one end of each of the two screws 22 is rotatably connected with the two measurement plates 24, the other end of each of the two screws 22 is fixedly mounted with a knob 23, the measurement plate 24 can be moved by rotating the knob 23, the quartz plate to be detected can be fixed by the two measurement plates 24, a slide groove 11 is formed on a front wall of the test board 1, three sliders 3 are slidably, wherein, the top ends of two sliders 3 are fixedly provided with graduated scale rods 4 with graduated outer walls, the outer walls of the two scale rods 4 are respectively provided with a first measuring mechanism 6 and a second measuring mechanism 7 in a sliding manner, the top end of the other slider 3 is fixedly provided with a graduated scale 5 for receiving light rays projected by a laser pen 64, the first measuring mechanism 6 comprises a first fixing ring 61, the first fixing ring 61 is slidably arranged on the outer wall of the scale rod 4, the first fixing ring 61 is provided with a first knob bolt 62 through a ring wall thread, the first knob bolt 62 is used for fixing the first fixing ring 61, the outer wall of the first fixing ring 61 is rotatably provided with a connecting column 63, one end of the connecting column 63 is fixedly provided with the laser pen 64, the laser pen 64 is used for projecting light rays to improve the measuring precision, the second measuring mechanism 7 comprises a second fixing ring 71, the second fixing ring 71 is slidably arranged on the outer wall of the scale rod 4, the second fixing ring 71 is, the second knob bolt 72 is used for fixing the second fixing ring 71, the two opposite outer walls of the second fixing ring 71 are respectively fixedly provided with a measuring needle 73 and a mounting ring 74, and the inner end of the mounting ring 74 is fixedly provided with a thin film sheet 75 convenient for light to pass through.
Preferably, the through hole 751 is opened at the middle part of the thin film piece 75, the through hole 751 is used for the light of the laser pen 64 to pass through and project on the surface of the graduated scale 5, one end of the measuring needle 73 extends to the upper part of the middle part of the upper end surface of the test bench 1, the measuring needle 73 is inserted below the quartz piece to be detected during detection to measure the warping amount of the quartz piece, the second measuring mechanism 7 is positioned between the first measuring mechanism 6 and the graduated scale 5, the upper end surface of the test bench 1 is provided with the scale mark 12 on the side close to the sliding block 3, the distance between the two measuring plates 24 can be calculated according to the scale mark 12, and the distance between the three sliding blocks 3 can also.
When in specific use, the utility model relates to an optics quartz plate warpage check out test set, at first will wait to examine optical quartz plate concave surface and place down on testboard 1, can make through rotating knob 23 and measure board 24 and remove, and can fix through two measurement boards 24 and wait to detect the quartz plate, scale mark 12 according to testboard 1 top one side can calculate the projection length who waits to detect the quartz plate, then insert measuring needle 73 and wait to detect the quartz plate below, it makes measuring needle 73 be located the peak of concave surface to move the solid fixed ring 71 of second, the height of this point is the warpage volume of this quartz plate promptly, can read out the height of changing the point according to the registration on the scale rod 4, if the registration is too little to see out, can remove laser pen 64 and scale 5 and make light pass through the through-hole 751 that film piece 75 is inner shine on scale laser 5, according to the height of laser pen 64 and scale 5 and pen 64, The warp amount can be calculated by measuring the distance between the needle 73 and the graduated scale 5, and the warp amount is divided by the projection height to obtain the warp degree of the quartz glass sheet.
In the description of the present invention, it should be understood that the indicated orientation or positional relationship is based on the orientation or positional relationship shown in the drawings, and is only for convenience of description and simplification of description, and does not indicate or imply that the indicated device or element must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be construed as limiting the present invention.
In the present invention, unless otherwise explicitly specified or limited, for example, it may be fixedly connected, detachably connected, or integrated; can be mechanically or electrically connected; they may be directly connected or indirectly connected through an intermediate medium, and may be connected through the inside of two elements or in an interaction relationship between two elements, unless otherwise specifically defined, and the specific meaning of the above terms in the present invention will be understood by those skilled in the art according to specific situations.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (5)
1. The equipment for detecting the warping degree of the optical quartz plate comprises a test board (1) and is characterized in that two opposite side walls of the test board (1) are fixedly provided with length measuring mechanisms (2), each of the two length measuring mechanisms (2) comprises a fixing plate (21) and a measuring plate (24), the two fixing plates (21) are fixedly arranged on the two opposite side walls of the test board (1) respectively, the two measuring plates (24) are arranged on two sides of the top end of the test board (1) in a sliding mode respectively, the two fixing plates (21) penetrate through the two opposite side walls and are provided with screw rods (22) in a threaded mode, one ends of the two screw rods (22) are connected with the two measuring plates (24) in a rotating mode respectively, the other ends of the two screw rods (22) are fixedly provided with knobs (23), the front side wall of the test board (1) is provided with a sliding groove (11), and the inner end, wherein the top of two slider (3) is fixed with scale rod (4), the outer wall of two scale rod (4) is respectively sliding mounted with first measuring mechanism (6) and second measuring mechanism (7), another top fixed mounting of slider (3) has scale (5), first measuring mechanism (6) includes first solid fixed ring (61), first solid fixed ring (61) sliding mounting is in the outer wall of scale rod (4), first solid fixed ring (61) runs through the rampart screw thread and installs first knob bolt (62), first solid fixed ring (61) outer wall is rotated and is installed spliced pole (63), spliced pole (63) one end fixed mounting has laser pen (64), second measuring mechanism (7) includes solid fixed ring of second (71), solid fixed ring of second (71) sliding mounting is in the outer wall of scale rod (4), the second fixing ring (71) penetrates through the ring wall and is provided with a second knob bolt (72) in a threaded mode, two opposite outer walls of the second fixing ring (71) are respectively and fixedly provided with a measuring needle (73) and a mounting ring (74), and the inner end of the mounting ring (74) is fixedly provided with a thin film piece (75).
2. The apparatus for detecting warpage in an optical quartz plate as claimed in claim 1, wherein: the middle part of the thin film sheet (75) is provided with a through hole (751).
3. The apparatus for detecting warpage in an optical quartz plate as claimed in claim 1, wherein: one end of the measuring needle (73) extends to the upper part of the middle part of the upper end surface of the test bench (1).
4. The apparatus for detecting warpage in an optical quartz plate as claimed in claim 1, wherein: the second measuring mechanism (7) is positioned between the first measuring mechanism (6) and the graduated scale (5).
5. The apparatus for detecting warpage in an optical quartz plate as claimed in claim 1, wherein: and scale marks (12) are arranged on one side, close to the sliding block (3), of the upper end face of the test board (1).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN202021505332.2U CN212658211U (en) | 2020-07-27 | 2020-07-27 | Optical quartz piece warpage check out test set |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN202021505332.2U CN212658211U (en) | 2020-07-27 | 2020-07-27 | Optical quartz piece warpage check out test set |
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CN212658211U true CN212658211U (en) | 2021-03-05 |
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CN202021505332.2U Expired - Fee Related CN212658211U (en) | 2020-07-27 | 2020-07-27 | Optical quartz piece warpage check out test set |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113340224A (en) * | 2021-06-08 | 2021-09-03 | 彩虹(合肥)液晶玻璃有限公司 | Panel warpage deformation on-line measuring device based on vertical scanning |
-
2020
- 2020-07-27 CN CN202021505332.2U patent/CN212658211U/en not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113340224A (en) * | 2021-06-08 | 2021-09-03 | 彩虹(合肥)液晶玻璃有限公司 | Panel warpage deformation on-line measuring device based on vertical scanning |
CN113340224B (en) * | 2021-06-08 | 2023-01-03 | 彩虹(合肥)液晶玻璃有限公司 | Panel warpage deformation on-line measuring device based on vertical scanning |
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GR01 | Patent grant | ||
GR01 | Patent grant | ||
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20210305 Termination date: 20210727 |