CN211826543U - Double-energy spectrum and double-resolution X-ray detector and detection system - Google Patents

Abstract

The utility model discloses a dual-energy spectrum and dual-resolution X-ray detector and a detection system. The detector comprises a stacked first visible light sensor, a first fluorescent material layer, a packaging material interlayer, a second fluorescent material layer and a The second visible light sensor, the first visible light sensor is closer to the X-ray source than the second visible light sensor, and the resolution of the first visible light sensor is greater than that of the second visible light sensor; the first visible light sensor absorbs X-ray excitation by the first fluorescent material layer. The visible photons generated; the second visible light sensor absorbs the visible photons generated by the X-ray excitation of the second fluorescent material layer; the encapsulation material interlayer is used to isolate the visible photons generated by the X-ray excitation of the first fluorescent material layer from the visible photons. Visible photons generated when the second fluorescent material layer is excited by X-rays. The upper and lower detectors of the system can output high-resolution images and high-energy absorption images respectively, and can also obtain images of interest through image algorithms.

Description

Dual energy spectrum and double resolution X-ray detector and detection system

technical field

The utility model relates to the field of X-ray detector imaging, in particular to an X-ray detector with dual energy spectrum and double resolution and a detection system.

Background technique

The detector in the X-ray imaging system plays a decisive role in the imaging of the system. In the imaging system, it is hoped that X-rays of different energies can be displayed at the same time, and in order to display tissues of different densities, it is hoped that the imaging system can have different The need for dual energy and dual resolution for angiography of DSA function in large C systems is becoming clearer.

At present, the principle of using dual-energy imaging in CT system is to use different energy sources to realize dual-energy imaging. However, it takes a certain amount of time to switch energy sources during the switching process, which affects the efficiency of the system, and there is a possibility that the measured object moves. Possibly, movement artifacts are formed.

In actual use, different resolutions are required, and different tissues need to be distinguished in the use of different parts, and the detector needs to have a high resolution capability at the same time.

Such application scenarios place high demands on the system, requiring both high and low energy spectrum detection capabilities and high resolution. Different resolutions can be provided, and the detection systems in the prior art cannot well meet such high performance requirements.

Utility model content

In order to solve the problems existing in the prior art, the utility model provides an X-ray detector and a detection system with dual energy spectrum and dual resolution. The upper and lower detectors can output high-resolution images and high-energy absorption images respectively. Images of interest can be obtained by image algorithms. The technical solution is as follows:

In one aspect, the present invention provides a dual-energy spectrum and dual-resolution X-ray detector, comprising a first visible light sensor, a first fluorescent material layer, a packaging material interlayer, a second fluorescent material layer and a second visible light sensor, the first visible light sensor is closer to the X-ray source than the second visible light sensor, and the resolution of the first visible light sensor is greater than that of the second visible light sensor;

The first visible light sensor is used for absorbing visible photons generated by the X-ray excitation of the first fluorescent material layer; the second visible light sensor is used for absorbing the visible photons generated by the X-ray excitation of the second fluorescent material layer The encapsulation material spacer is used to isolate the visible photons generated by the X-ray excitation of the first fluorescent material layer and the visible photons generated by the X-ray excitation of the second fluorescent material layer.

Further, the thickness of the second fluorescent material layer is greater than the thickness of the first fluorescent material layer.

Further, the dual-energy spectrum and double-resolution X-ray detector further includes a packaging material wall layer arranged along the sides of the first fluorescent material layer and the second fluorescent material layer, and the packaging material wall layer is One edge is in contact with the first visible light sensor, and the other edge is in contact with the second visible light sensor.

Further, the shape and size of the first visible light sensor and the second visible light sensor are the same, the shape and size of the first fluorescent material layer and the second fluorescent material layer are the same, and the area of the first visible light sensor is larger than that of the first visible light sensor. The fluorescent material layer and the packaging material wall layer are in a recessed structure relative to the first visible light sensor and the second visible light sensor.

Further, the encapsulation material interlayer and the encapsulation material wall layer are both made of X-fluorescence encapsulation materials, and the encapsulation materials are aluminum film and hot melt adhesive.

Further, the X-ray-to-visible light conversion material contained in the first fluorescent material layer and the second fluorescent material layer is cesium iodide or other scintillators.

On the other hand, the present invention provides a dual-energy spectrum dual-resolution X-ray detection system, comprising an X-ray source, a first image acquisition device, a second image acquisition device, and the above-mentioned dual-energy spectrum dual A high-resolution X-ray detector, the first image capture device is electrically connected to the first visible light sensor to capture a first image, and the second image capture device is electrically connected to the second visible light sensor to capture a second image.

Further, the dual-energy spectrum and dual-resolution X-ray detection system further includes a processor, the processor is electrically connected to the first image acquisition device and the second image acquisition device, and the processor can The first image collected by the first image collection device and the second image collected by the second image collection device are subjected to image arithmetic processing.

The beneficial effects brought by the technical scheme provided by the utility model are as follows:

a. Using visible light sensors with different resolutions in the upper and lower layers, the high-resolution visible light sensor outputs high-resolution images;

b. The two fluorescent material layers are separated by encapsulation materials, and the X-rays passing through one fluorescent material layer and the X-rays passing through the two fluorescent material layers form two different energy spectra, wherein the X-rays passing through the second fluorescent material layer - The rays are high-energy spectrum, correspondingly obtain high-energy absorption images;

c. By applying different image algorithms, the image of interest can be obtained, and the combined image of interest can be output after balancing the resolution and quantum detection efficiency.

Description of drawings

In order to illustrate the technical solutions in the embodiments of the present invention more clearly, the following briefly introduces the accompanying drawings used in the description of the embodiments. Obviously, the drawings in the following description are only some implementations of the present invention. For example, for those of ordinary skill in the art, other drawings can also be obtained from these drawings without any creative effort.

1 is a schematic structural diagram of an X-ray detector with dual energy spectrum and double resolution provided by an embodiment of the present invention;

FIG. 2 is a schematic structural diagram of a dual-energy spectrum and dual-resolution X-ray detection system provided by an embodiment of the present invention.

Wherein, the reference signs include: 1-first visible light sensor, 2-second visible light sensor, 3-first fluorescent material layer, 4-second fluorescent material layer, 5-encapsulation material spacer layer, 6-encapsulation material wall layer .

Detailed ways

In order to enable those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be described clearly and completely below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described The embodiments are only some of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.

The present invention provides a dual-energy spectrum and dual-resolution X-ray detector, referring to FIG. 1 , which includes a first visible light sensor 1 , a first fluorescent material layer 3 , a packaging material interlayer 5 , a first visible light sensor 1 , a first fluorescent material layer 3 , a packaging material interlayer 5 , and a Two fluorescent material layers 4 and a second visible light sensor 2, wherein the first visible light sensor 1 and the second visible light sensor 2 are two TFT flat panels with different resolutions. Specifically, for example, as shown in FIG. If a visible light sensor 1 is closer to the X-ray source than the second visible light sensor 2 , the resolution of the first visible light sensor 1 is set to be greater than that of the second visible light sensor 2 .

The first visible light sensor 1 is used for absorbing visible photons generated by the X-ray excitation of the first fluorescent material layer 3; the second visible light sensor 2 is used for absorbing the X-ray excitation by the second fluorescent material layer 4. Visible photons produced by ray excitation.

As shown in FIG. 1 , the dual-energy spectrum and dual-resolution X-ray detector further includes a packaging material wall layer 6 disposed along the sides of the first fluorescent material layer 3 and the second fluorescent material layer 4 for a circumference, and One edge of the packaging material wall layer 6 is in contact with the first visible light sensor 1 , and the other edge is in contact with the second visible light sensor 2 . The encapsulation material spacer 5 and the encapsulation material wall layer 6 are jointly used to isolate the visible photons generated by the X-ray excitation of the first fluorescent material layer 3 from the visible photons generated by the X-ray excitation of the second fluorescent material layer 4. Visible photons. In an embodiment of the present invention, the encapsulation material spacer 5 and the encapsulation material wall layer 6 are both made of X-fluorescence encapsulation materials, and the encapsulation materials are preferably aluminum films and hot melt adhesives.

In a preferred embodiment of the present invention, the thickness of the second fluorescent material layer 4 is greater than the thickness of the first fluorescent material layer 3 . Optionally, the X-ray-to-visible light conversion material contained in the first fluorescent material layer 3 and the second fluorescent material layer 4 is cesium iodide (CsI) or other scintillators. The X-ray to visible light material of the material layer 3 and the second fluorescent material layer 4 can be the same or different. The other scintillators can be modified high-density Cherenkov crystal materials to make them into scintillator crystals, such as PbF ₂ , Crystals such as NaBi(WO ₄ ) ₂ ; also NaI:Tl or CsI:Tl crystals and the like. The reason why the second fluorescent material layer 4 is thick is that the X-ray energy spectrum that passes through the first fluorescent material layer 3 and enters the second fluorescent material layer 4 is narrowed and the rays are hardened, that is, entering the second fluorescent material layer 4 The intensity of the X-rays of the fluorescent material layer 4 becomes higher. In order to ensure that the second fluorescent material layer 4 can absorb the high-intensity X-rays, it is assumed that the photons absorbed by the first visible light sensor 1 and the photons absorbed by the second visible light sensor 2 If the number is close to or the same, the thickness of the second fluorescent material layer 4 is greater than that of the first fluorescent material layer 3, otherwise, most of the X-rays will be absorbed in the first fluorescent material layer 3, which will affect the second visible light The photon absorption of sensor 2 and the imaging quality of the underlying detector in which it is located.

Referring to FIG. 1 , the first visible light sensor 1 and the second visible light sensor 2 have the same shape and size, that is, the first image formed by the first visible light sensor 1 and the second image formed by the second visible light sensor 2 are collected for the same object The two images obtained by imaging, the imaging size and angle of the object in the two images are the same, which provides the possibility to apply various image algorithms to the two images; the shape of the first fluorescent material layer 3 and the second fluorescent material layer 4 The area of the first visible light sensor 1 is larger than that of the first fluorescent material layer 3 and the encapsulation material wall layer 6 is in a recessed structure relative to the first visible light sensor 1 and the second visible light sensor 2, It is ensured that the visible photons generated by the X-ray excitation of the first fluorescent material layer 3 can be efficiently absorbed by the first visible light sensor 1, and the visible photons generated by the X-ray excitation of the second fluorescent material layer 4 can be ensured. It is efficiently absorbed by the second visible light sensor 2 .

In an embodiment of the present invention, a dual-energy spectrum and dual-resolution X-ray detection system is provided, as shown in FIG. 2 , the X-ray detection system includes an X-ray source, a first image acquisition system device, a second image acquisition device and the above-mentioned dual-energy spectrum and double-resolution X-ray detector, the first image acquisition device is electrically connected with the first visible light sensor 1 to acquire a first image, the second image acquisition device is The image acquisition device is electrically connected to the second visible light sensor 2 to acquire a second image. This X-ray detection system can output two forms of images in one exposure. The first fluorescent material layer 3 absorbs low-energy X-rays, which are converted into visible photons and absorbed by the high-resolution first visible light sensor 1. Correspondingly, The first image acquisition device collects a high-resolution image, which has a good imaging effect on low-density tissue, and can obtain a very clear image; X-rays that are not absorbed by the first fluorescent material layer 3 penetrate In the second fluorescent material layer 4, the energy spectrum is changed (narrowed) to be hardened, and the intensity of the rays becomes higher, which is absorbed in the second fluorescent material layer 4, converted into visible photons and absorbed by the low-resolution second visible light sensor 2, Correspondingly, the second image acquisition device acquires a high-energy absorption image, and high-energy X-ray imaging is suitable for imaging high-density tissues, such as breast. It should be noted that the low resolution of the second visible light sensor 2 here is relative to the high resolution of the first visible light sensor 1. If the resolution of the second visible light sensor 2 is too high, the pixel If the size is too small, the absorption of visible photons by the second visible light sensor 2 will be unfavorable. Therefore, the second visible light sensor 2 with too high resolution may not be able to image because the visible photon absorption efficiency is too low.

In a preferred embodiment, the dual-energy spectrum and dual-resolution X-ray detection system further includes a processor, the processor is electrically connected to the first image acquisition device and the second image acquisition device, the The processor can perform image arithmetic processing on the first image collected by the first image collection device and the second image collected by the second image collection device. In this embodiment, the X-ray detection system can output images of three forms in one exposure. In addition to the high-resolution image and the high-energy absorption image above, a combined image can also be output, and the combined image can be an image of the first image. Perform image addition or subtraction or other more image processing operations with the second image.

The operation process of using the dual-energy spectrum and dual-resolution X-ray detection system in the embodiment of the present invention to perform imaging is as follows:

Turn on the X-ray source so that it emits X-rays to the first visible light sensor of the X-ray detection system;

If the target obtains a high-resolution image, the first image x1 collected by the first image acquisition device is output, for example, X-ray films are currently being taken of an orthopedic patient, the first image x1 is selected to be output;

If the target obtains a high-energy absorption image, the second image x2 collected by the second image acquisition device is output. For example, X-ray films are currently being taken of a breast patient, the second image x2 is selected to be output.

In addition to this, a processor may also be used to perform image arithmetic processing on the first image x1 and the second image x2 to obtain a combined combined image f(x1)+f(x2). For example, currently imaging thick but low-density tissues, such as hip joints, it is necessary to perform subtraction processing on the first image and the second image. After balancing the resolution and quantum detection efficiency, the synthesis of interest can be output. image. The image algorithm f(x1)+f(x2) performed by the present invention for the first image and the second image can be any image synthesis algorithm in the prior art, which will not be repeated here.

The above are only preferred embodiments of the present invention, and are not intended to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention shall be included in the present invention. within the scope of protection of the utility model.

Claims (8)

1. The double-energy-spectrum and double-resolution X-ray detector is characterized by comprising a first visible light sensor (1), a first fluorescent material layer (3), an encapsulating material interlayer (5), a second fluorescent material layer (4) and a second visible light sensor (2) which are sequentially stacked, wherein the first visible light sensor (1) is closer to an X-ray source than the second visible light sensor (2), and the resolution of the first visible light sensor (1) is greater than that of the second visible light sensor (2);

the first visible light sensor (1) is used for absorbing the visible photons generated by the X-ray excitation of the first fluorescent material layer (3); the second visible light sensor (2) is used for absorbing the visible photons generated by the second fluorescent material layer (4) excited by X-rays; the packaging material interlayer (5) is used for separating the visible photons generated by the X-ray excitation of the first fluorescent material layer (3) from the visible photons generated by the X-ray excitation of the second fluorescent material layer (4).

2. The dual-spectral dual-resolution X-ray detector according to claim 1, characterized in that the thickness of the second layer of phosphor material (4) is greater than the thickness of the first layer of phosphor material (3).

3. The dual-spectrum dual-resolution X-ray detector according to claim 1, further comprising a peripheral wall layer (6) of packaging material disposed along the sides of the first and second layers of phosphor materials (3, 4), wherein one edge of the wall layer (6) of packaging material abuts against the first visible light sensor (1) and the other edge abuts against the second visible light sensor (2).

4. The dual-spectral dual-resolution X-ray detector according to claim 3, wherein the first visible light sensor (1) and the second visible light sensor (2) are identical in shape and size, the first layer of phosphor material (3) and the second layer of phosphor material (4) are identical in shape and size, the first visible light sensor (1) has a larger area than the first layer of phosphor material (3) and the wall layer of encapsulant material (6) is in a recessed configuration with respect to the first visible light sensor (1) and the second visible light sensor (2).

5. The dual-spectral dual-resolution X-ray detector according to claim 4, wherein the barrier layer (5) of encapsulating material and the wall layer (6) of encapsulating material are both made of X-ray fluorescent encapsulating material, and the encapsulating material is an aluminum film and a hot melt adhesive.

6. The dual-spectral dual-resolution X-ray detector according to claim 1, wherein the first (3) and second (4) layers of phosphor material comprise an X-ray to visible material that is cesium iodide.

7. A dual-spectrum dual-resolution X-ray detection system comprising an X-ray source, a first image acquisition device electrically connected to a first visible light sensor (1) for acquiring a first image, a second image acquisition device electrically connected to a second visible light sensor (2) for acquiring a second image, and a dual-spectrum dual-resolution X-ray detector according to any one of claims 1 to 6.

8. The dual-spectrum dual-resolution X-ray detection system of claim 7, further comprising a processor electrically connected to the first image acquisition device and the second image acquisition device, wherein the processor is capable of performing image operation on the first image acquired by the first image acquisition device and the second image acquired by the second image acquisition device.

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