CN210074109U - Negative coupling structure and dielectric filter - Google Patents
Negative coupling structure and dielectric filter Download PDFInfo
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- CN210074109U CN210074109U CN201921096679.3U CN201921096679U CN210074109U CN 210074109 U CN210074109 U CN 210074109U CN 201921096679 U CN201921096679 U CN 201921096679U CN 210074109 U CN210074109 U CN 210074109U
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Abstract
The utility model discloses a negative coupling structure, which comprises two dielectric resonators, wherein each dielectric resonator comprises a body made of solid dielectric material and a debugging hole positioned on the surface of the body; the negative coupling hole is positioned on the first surface of the body at the connecting position of the two dielectric resonators, and the depth of the negative coupling hole is smaller than that of the debugging holes of the two dielectric resonators; the negative coupling groove is positioned on the second surface of the body at the connecting position of the two dielectric resonators; a negative coupling amount adjustment unit which is connected to the two dielectric resonators; and a metallized conductive layer covering the surface of the dielectric resonator body, the surface of the debugging hole, the surface of the negative coupling groove and the surface of the negative coupling amount debugging part; the negative coupling hole and the negative coupling groove are matched to realize negative coupling between the two dielectric resonators; the negative coupling amount adjusting unit adjusts the amount of negative coupling. The utility model discloses a problem of negative coupling debugging negative coupling volume difficulty between the solid dielectric resonator has been solved to negative coupling structure and dielectric filter.
Description
Technical Field
The utility model relates to a communication equipment subassembly, concretely relates to negative coupling structure and dielectric filter.
Background
At present, there is a miniaturized filter, which uses a body made of solid dielectric material and a resonator (referred to as "solid dielectric resonator" for short) formed by metallizing (e.g. silver plating) the surface of the body, and a plurality of resonators and coupling between the resonators form a filter (referred to as "solid dielectric filter" for short). The coupling between the resonators can be classified into positive coupling (also referred to as "inductive coupling") and negative coupling (also referred to as "capacitive coupling") according to polarity, and a transmission zero can be formed based on the coupling polarity between the resonators. The transmission zero is a frequency point outside the passband of the filter, the signal rejection of the filter to the frequency point at the frequency point is theoretically infinite, and the transmission zero is increased, so that the near-end rejection capability of the filter (namely the rejection capability of the frequency point closer to the passband) can be effectively enhanced. For example, in a three-cavity filter, the coupling between resonators 1 and 2, 2 and 3, and 1 and 3 is positive coupling, and the transmission zero is formed on the right side of the passband, whereas if the coupling between resonators 1 and 2, 2 and 3 is positive coupling and the coupling between resonators 1 and 3 is negative coupling, the transmission zero is on the left side of the passband.
In order to realize negative coupling, a structure shown in fig. 1 is currently adopted in a solid dielectric filter, a negative coupling hole is designed between two connected solid dielectric resonators, both the two solid dielectric resonators are provided with debugging holes, the depth of the negative coupling hole is greater than that of the debugging holes on both sides of the negative coupling hole, and is usually twice or more than twice the depth of the debugging holes on both sides of the negative coupling hole, so that the resonance frequency of the resonator can be lower than that of the resonators on both sides of the negative coupling hole, and is usually half or less than half of the resonance frequency of the resonators on both sides of the negative coupling hole, and negative coupling can be formed between the two solid dielectric resonators. The design can not only generate negative coupling, but also adjust the coupling amount of the negative coupling, the adjusting mode is to change the area of the surface of the negative coupling hole covered by the conducting layer, generally, in order to facilitate debugging, the conducting layer is completely covered on the surface of the designed negative coupling hole (the coupling amount of the negative coupling is larger at the moment), and then the grinding head is used for deep grinding the bottom of the negative coupling hole to reduce the area covered by the conducting layer, so as to reduce the coupling amount of the negative coupling. Because the depth of the negative coupling hole is far greater than that of the debugging hole, and the depth of the debugging hole is related to the resonant frequency of the resonator, in order to meet the requirements of certain resonant frequencies, the depth of the debugging hole is relatively deep, and the depth of the negative coupling hole is at least twice of that of the debugging hole, so that the realization process for subsequently adjusting the negative coupling quantity is quite difficult.
Disclosure of Invention
An embodiment of the utility model provides a negative coupling structure has solved the problem of the negative coupling debugging negative coupling volume difficulty between the current solid dielectric resonator.
In order to solve the above technical problems, the present invention provides a negative coupling structure, which comprises,
each dielectric resonator comprises a body made of a solid dielectric material and debugging holes positioned on the surface of the body, wherein the debugging holes are blind holes and used for debugging the resonance frequency of the dielectric resonator;
the negative coupling hole is positioned on the first surface of the body at the connecting position of the two dielectric resonators, the negative coupling hole is connected with the two dielectric resonators, and the depth of the negative coupling hole is smaller than that of the debugging holes of the two dielectric resonators;
the negative coupling groove is positioned on the second surface of the body at the connecting position of the two dielectric resonators and is connected with the two dielectric resonators; the negative coupling grooves are blind grooves in the depth direction of the body and through grooves in the width direction of the body; the first surface and the second surface of the body are two surfaces which are oppositely arranged along the depth direction of the body respectively;
a negative coupling amount adjustment unit which is located in a position in contact with the two dielectric resonators;
and a metallized conductive layer covering the surface of the dielectric resonator body, the surface of the debugging hole, the surface of the negative coupling groove and the surface of the negative coupling amount debugging part;
the negative coupling hole and the negative coupling groove are matched to realize negative coupling between the two dielectric resonators;
the negative coupling amount debugging part is used for adjusting the coupling amount of the negative coupling.
In a preferred embodiment of the present invention, the negative coupling amount debugging part is a negative coupling amount debugging hole disposed on the first surface of the main body at the connecting position of the two dielectric resonators; the negative coupling quantity debugging holes are blind holes, and the depth of the negative coupling quantity debugging holes is smaller than the depth of the debugging holes of the two dielectric resonators.
In a preferred embodiment of the present invention, the negative coupling amount debugging part is a negative coupling amount debugging groove disposed on the third surface of the main body or/and the fourth surface of the main body at the connecting position of the two dielectric resonators, and the negative coupling amount debugging groove is a blind groove in the width direction of the main body; the third surface of the body and the fourth surface of the body are two surfaces which are oppositely arranged along the width direction of the body respectively.
In a preferred embodiment of the present invention, the solid dielectric material is ceramic.
In order to solve the above technical problems, the present invention provides a dielectric filter, including,
each dielectric resonator comprises a body made of a solid dielectric material and debugging holes positioned on the surface of the body, wherein the debugging holes are blind holes and used for debugging the resonance frequency of the dielectric resonator in which the debugging holes are positioned; the bodies of all the dielectric resonators included in the dielectric filter constitute the body of the dielectric filter;
each negative coupling hole is positioned on the first surface of the body at the connecting position of the two dielectric resonators, the negative coupling hole is connected with the two dielectric resonators, and the depth of the negative coupling hole is smaller than that of the debugging holes of the two dielectric resonators connected with each other at the position of the negative coupling hole;
each negative coupling groove is positioned on the second surface of the body at the connecting position of the two dielectric resonators and is connected with the two dielectric resonators, and the negative coupling grooves are blind grooves in the depth direction of the body and through grooves in the width direction of the body; the first surface and the second surface of the body are two surfaces which are oppositely arranged along the depth direction of the body respectively;
at least one negative coupling amount adjustment unit located in a position in contact with the two dielectric resonators;
and a metallized conductive layer covering the surface of the dielectric filter body, the surface of the debugging hole, the surface of the negative coupling hole, the negative coupling groove and the surface of the negative coupling amount debugging part;
the negative coupling hole and the negative coupling groove are matched to realize negative coupling between the two dielectric resonators;
the negative coupling amount debugging part is used for adjusting the coupling amount of the negative coupling.
In a preferred embodiment of the present invention, the negative coupling amount debugging part is a negative coupling amount debugging hole disposed on the first surface of the main body at the connecting position of the two dielectric resonators; the negative coupling quantity debugging holes are blind holes, and the depth of the negative coupling quantity debugging holes is smaller than the depth of the debugging holes of the two dielectric resonators.
In a preferred embodiment of the present invention, the negative coupling amount debugging part is a negative coupling amount debugging groove disposed on the third surface of the main body or/and the fourth surface of the main body at the connecting position of the two dielectric resonators, and the negative coupling amount debugging groove is a blind groove in the width direction of the main body; the third surface of the body and the fourth surface of the body are two surfaces which are oppositely arranged along the width direction of the body respectively.
In a preferred embodiment of the present invention, it further includes that two dielectric resonators connected to the position of the negative coupling hole or the negative coupling slot are related to the frequency of the transmission zero point of the dielectric filter.
The utility model discloses a preferred embodiment, further include the number of negative coupling groove, the number in negative coupling hole and the number of negative coupling volume debugging portion all with the number of dielectric filter transmission zero is the same.
In a preferred embodiment of the present invention, the solid dielectric material is ceramic.
The utility model has the advantages that:
the embodiment of the utility model provides a negative coupling structure, dielectric filter realize the negative coupling through the mode of processing blind groove cooperation negative coupling hole on the body made by solid-state dielectric material for the degree of depth in negative coupling hole is less than the degree of depth in debugging hole, has simplified the debugging technology of adjusting the negative coupling volume between two solid dielectric syntonizers.
On the other hand, the embodiment of the utility model provides a negative coupling structure, dielectric filter through processing negative coupling volume debugging portion on the body of being made by solid-state dielectric material, realize the coupling volume fine tuning of the negative coupling between two solid dielectric resonators (be short for small metering and adjust for short), debug the coupling volume coarse tuning of the negative coupling between two solid dielectric resonators (be short for large metering and adjust for short) of negative coupling hole realization for the control range of the coupling volume of the negative coupling between two solid dielectric resonators is wideer, more meticulous.
Drawings
Fig. 1 is a schematic cross-sectional view of a solid dielectric resonator provided in the prior art to implement a negative coupling structure;
fig. 2 is a perspective view of a first view angle of a negative coupling structure according to a first embodiment of the present invention;
fig. 3 is a perspective view of a second view angle of the negative coupling structure in the first embodiment of the present invention;
fig. 4 is a schematic perspective view of a negative coupling structure in a second embodiment of the present invention;
fig. 5 is a schematic perspective view of a dielectric filter according to a third embodiment of the present invention, showing a first viewing angle for implementing a negative coupling structure;
fig. 6 is a schematic perspective view of a dielectric filter according to a third embodiment of the present invention, showing a second viewing angle for implementing a negative coupling structure;
fig. 7 is a schematic perspective view of a dielectric filter according to a fourth embodiment of the present invention for implementing a negative coupling structure.
The reference numbers in the figures illustrate:
first to second embodiments: 11, 12-dielectric resonator, 13, 14-debugging hole, 15-negative coupling hole, 16-body first surface, 17-body second surface, 18-negative coupling groove, 19-body, 20-conducting layer, 21-negative coupling quantity debugging hole, 22-negative coupling quantity debugging groove, 23-body third surface and 24-body fourth surface.
Third to fourth embodiments: 31, 32-dielectric resonator, 33, 34-debugging hole, 35-negative coupling hole, 36-body first surface, 37-body second surface, 38-negative coupling groove, 39-body, 40-conducting layer, 41-negative coupling quantity debugging hole, 42-negative coupling quantity debugging groove, 43-body third surface and 44-body fourth surface.
Detailed Description
The present invention is further described with reference to the following drawings and specific embodiments so that those skilled in the art can better understand the present invention and can implement the present invention, but the embodiments are not to be construed as limiting the present invention.
Example one
The present embodiment provides a negative coupling structure, as shown in fig. 2 to 3, the negative coupling structure includes two dielectric resonators (11, 12), each dielectric resonator (11, 12) includes a body 19 made of a solid dielectric material and a blind hole (called a debugging hole (13, 14) for short) located on a surface of the body for debugging a resonant frequency;
the negative coupling structure also comprises a negative coupling hole 15 and a negative coupling groove 18 which are used for realizing negative coupling (or capacitive coupling) between the dielectric resonator 11 and the dielectric resonator 12 in a matching way, wherein the negative coupling hole 15 is positioned on the first surface 16 of the body at the connecting position of the two dielectric resonators (11, 12) and is positioned to be connected with the two dielectric resonators (11, 12); a second surface 17 of the body where the negative coupling groove 18 is located at a position where the two dielectric resonators (11, 12) are connected, the negative coupling groove being located at a position where the negative coupling groove meets the two dielectric resonators (11, 12); the negative coupling groove 18 is a blind groove in the depth direction of the body and a through groove in the width direction of the body. The first body surface 16 and the second body surface 17 are two surfaces oppositely arranged along the depth direction of the body;
the negative coupling structure further includes a negative coupling amount adjustment unit for adjusting the amount of negative coupling between the dielectric resonator 11 and the dielectric resonator 12, and the negative coupling amount adjustment unit is located in contact with the dielectric resonator 11 and the dielectric resonator 12. In the present embodiment, the negative coupling amount adjustment unit is a blind via (referred to as a negative coupling amount adjustment hole 21) disposed on the first surface 16 of the main body at the connection position between the dielectric resonator 11 and the dielectric resonator 12; the depth of the negative coupling amount tuning hole 21 is smaller than the depth of the tuning holes of the dielectric resonator 11 and the dielectric resonator 12;
the negative coupling structure further comprises a metalized conductive layer 20 covering the surface of the dielectric resonator body, the surface of the debugging hole, the surface of the negative coupling groove and the surface of the negative coupling debugging hole.
Typically, the negative coupling aperture 15 is located at the first surface 16 of the body intermediate the two tuning apertures, the negative coupling aperture and the body at its periphery forming a structure similar to a resonator, the negative coupling aperture 16 being similar to the tuning aperture of the resonator. The negative coupling groove 18 is located on the second surface 17 of the body between the two debugging holes, and is a groove structure formed by the second surface 17 of the body sinking towards the inside of the body, namely the negative coupling groove 18 extends towards the negative coupling hole 15, so that the distance between the negative coupling hole 15 and the second surface of the body can be reduced, the distance is reduced to increase the equivalent capacitance, and therefore under the condition that the depth of the negative coupling hole 15 is smaller than the depths of the debugging holes on the two sides, the resonant frequency of the resonator where the negative coupling hole 15 is located is lower than that of the resonators where the debugging holes on the two sides, and therefore negative coupling (or capacitive coupling) is formed between the dielectric resonator 11 and the dielectric resonator 12.
In general, the negative coupling amount debugging holes 21 are located on the first surface 16 of the body between the two debugging holes, and in the width direction of the body, the negative coupling amount debugging holes 21 are located on one side or two sides of the negative coupling hole 15 and are respectively configured in one group. The area of the conductive layer covered by the surface of the negative coupling hole 15 is correlated with the amount of negative coupling between the dielectric resonator 11 and the dielectric resonator 12. Usually, in order to facilitate debugging, the surface of the designed negative coupling hole 15 is completely covered with a conductive layer (at this time, the coupling amount of negative coupling is large), and then a grinding head is used to go deep into the bottom of the negative coupling hole 15 to grind and reduce the area covered by the conductive layer, so as to reduce the coupling amount of negative coupling. Similarly, the area of the conducting layer covered on the surface of the negative coupling amount debugging hole 21 is related to the coupling amount of negative coupling between the dielectric resonator 11 and the dielectric resonator 12, for convenience of debugging, the conducting layer is completely covered on the surface of the designed initial negative coupling hole (at this time, the coupling amount of negative coupling is large), and the grinding head is used for grinding deeply into the bottom of the negative coupling amount debugging hole 21 to reduce the area covered by the conducting layer, so that the coupling amount of negative coupling is reduced. The area of the conducting layer covered on the surface of the negative coupling hole 15 is reduced by polishing, so that the coupling amount of negative coupling can be adjusted in a large measurement mode, and coarse adjustment of the coupling amount is realized; the area of the conducting layer covered on the surface of the negative coupling amount debugging hole 21 is reduced by polishing, the negative coupling amount can be regulated in a small amount, the fine regulation of the coupling amount is realized, and the regulating range of the negative coupling amount between the two solid dielectric resonators is wider and finer.
The conductive layer 20 may be a metalized layer, and may be formed by plating a metal on the surface of the body, where the metal may be silver, or may be other metals meeting practical requirements, such as gold and copper.
The dielectric material shown in the negative coupling structure provided in the above embodiment is preferably ceramic, which has a high dielectric constant (dielectric constant of 36), and good hardness and high temperature resistance. Of course, other materials known to those skilled in the art, such as glass, electrically insulating polymers, etc., may be used as the dielectric material.
Example two
The present embodiment provides a negative coupling structure, and as shown in fig. 4, the present embodiment is different from the first embodiment only in that the second implementation solution of the negative coupling amount adjustment portion:
the negative coupling amount adjustment part is a negative coupling amount adjustment groove 22 arranged on a third surface 23 of the main body at the connecting position of the dielectric resonator 11 and the dielectric resonator 12;
alternatively, the negative coupling amount adjustment section is a negative coupling amount adjustment groove 22 disposed on a fourth surface 24 of the main body at a position where the dielectric resonator 11 and the dielectric resonator 12 are connected;
alternatively, the negative coupling amount adjustment section is a negative coupling amount adjustment groove 22 disposed on the third surface 23 and the fourth surface 24 of the main body at the connection position between the dielectric resonator 11 and the dielectric resonator 12.
The negative coupling amount debugging grooves 22 related to the above three schemes are all blind grooves in the width direction of the body. The body third surface 23 and the body fourth surface 24 are two surfaces oppositely arranged in the body width direction, respectively.
The way of adjusting the coupling amount of the negative coupling between the dielectric resonator 11 and the dielectric resonator 12 by the negative coupling amount adjusting groove 22 is the same as the negative coupling amount adjusting hole, and is not described herein again.
EXAMPLE III
The present embodiment provides a dielectric filter, as shown in fig. 5 to 6, the dielectric filter includes at least two dielectric resonators (31, 32), each dielectric resonator (31, 32) includes a body 39 made of a solid dielectric material and a blind hole (tuning hole (33, 34)) located on a surface of the body for tuning a resonant frequency, the bodies of all the dielectric resonators included in the dielectric filter constitute the body of the dielectric filter;
the dielectric filter also comprises at least one negative coupling hole 35 and at least one blind slot (called negative coupling slot 38 for short) which are used for realizing negative coupling between two connected dielectric resonators in a matching way; the negative coupling hole 35 is located on the first surface 36 of the body at the connecting position of the two dielectric resonators, and is located at a position where the negative coupling hole is connected with the two dielectric resonators; the negative coupling slot 38 is located on the second surface 37 of the body at the connecting position of the two dielectric resonators, and the second surface 36 of the body and the second surface 37 of the body are respectively two surfaces oppositely arranged along the depth direction of the body;
the negative coupling structure also comprises at least one negative coupling quantity debugging part for adjusting the coupling quantity of the negative coupling between the two connected dielectric resonators, and the position of the negative coupling quantity debugging part is connected with the two dielectric resonators. In the technical solution of this embodiment, the negative coupling amount debugging portion is a blind via (called as a negative coupling amount debugging via 21 for short) disposed on the first surface 16 of the main body at the connecting position of the two dielectric resonators; the depth of the negative coupling amount tuning hole 21 is smaller than the depth of the tuning holes of the dielectric resonator 11 and the dielectric resonator 12;
the dielectric filter further comprises a metalized conductive layer 40 covering the surface of the dielectric filter body, the surface of the debugging hole, the surface of the negative coupling groove and the surface of the negative coupling amount debugging hole 21.
Typically, the negative coupling hole 35 is located at the body first surface 36 in the middle of the two tuning holes, and the negative coupling hole 35 and its surrounding body form a structure similar to a resonator, which is similar to the tuning hole of the resonator. The negative coupling groove 38 is located on the second surface 37 of the body between the two debugging holes, and is a groove structure formed by recessing the second surface 37 of the body towards the inside of the body, that is, the negative coupling groove 38 extends towards the direction of the negative coupling hole 35, so that the distance between the negative coupling hole 35 and the second surface of the body can be reduced, and the distance is reduced to increase the equivalent capacitance, so that under the condition that the depth of the negative coupling hole 35 is smaller than the depths of the debugging holes on the two sides, the resonant frequency of the resonator where the negative coupling hole 35 is located is lower than the resonant frequency of the resonators where the debugging holes on the two sides are located, and therefore the negative coupling (or capacitive coupling) is formed between the connected dielectric resonator 31 and the dielectric.
The depth of the negative coupling hole 35 and the depth of the negative coupling groove 38 are both related to the frequency of the transmission zero of the dielectric filter. Specifically, the depth of the negative coupling hole may be designed according to practical requirements, such as the frequency of the transmission zero, and is not limited herein. Usually, the number of the negative coupling holes between two adjacent dielectric resonators is 1, and the number of the negative coupling slots is 1, so that one transmission zero point is realized. The number of the negative coupling holes and the negative coupling grooves on the dielectric filter can be one or more, and the number and the positions of the negative coupling holes and the negative coupling grooves (which means the positions between two connected resonators) can be determined according to the number and the frequency of transmission zeros actually required. Specifically, the number of the negative coupling holes and the number of the negative coupling grooves are equal to the number of transmission zeros of the dielectric filter, and the two dielectric resonators connected with each other at the positions of the negative coupling holes and the negative coupling grooves are determined according to the frequency of the transmission zeros of the dielectric filter. It should be noted here that the negative coupling hole and the negative coupling groove forming the negative coupling structure are always present together, and cooperate to form the negative coupling structure.
In general, the negative coupling amount debugging holes 41 are located on the first surface 36 of the body between the two debugging holes, and in the width direction of the body, the negative coupling amount debugging holes 41 are located on one side or both sides of the negative coupling hole 35 and are respectively configured in one group. The area of the conductive layer covered by the surface of the negative coupling hole 35 is related to the amount of negative coupling between the dielectric resonator 31 and the dielectric resonator 32. Usually, in order to facilitate debugging, the surface of the designed negative coupling hole 35 is completely covered with a conductive layer (at this time, the coupling amount of negative coupling is large), and then a grinding head is used to go deep into the bottom of the negative coupling hole 35 to grind and reduce the area covered by the conductive layer, so as to reduce the coupling amount of negative coupling. Similarly, the area of the conductive layer covered on the surface of the negative coupling amount debugging hole 31 is related to the coupling amount of the negative coupling between the dielectric resonator 31 and the dielectric resonator 32, for convenience of debugging, the conductive layer is completely covered on the surface of the designed initial negative coupling hole (at this time, the coupling amount of the negative coupling is large), and the grinding head is used for grinding deeply into the bottom of the negative coupling amount debugging hole 41 to reduce the area covered by the conductive layer, so that the coupling amount of the negative coupling is reduced. Here, polishing reduces the area of the conductive layer covered on the surface of the negative coupling hole 35, so that the coupling amount of the negative coupling can be adjusted in a large amount, and coarse adjustment of the coupling amount is realized; the area of the conducting layer covered on the surface of the negative coupling amount debugging hole 41 is reduced by polishing, so that the coupling amount of negative coupling can be regulated in a small amount, the fine regulation of the coupling amount is realized, and the regulating range of the coupling amount of negative coupling between the two solid dielectric resonators is wider and finer.
The conductive layer 40 may be a metalized layer, and may be formed by plating a metal on the surface of the body, where the metal may be silver, or may be other metals meeting the actual requirement, such as gold and copper.
The dielectric material shown in the negative coupling structure provided in the above embodiment is preferably ceramic, which has a high dielectric constant (dielectric constant of 36), and good hardness and high temperature resistance. Of course, other materials known to those skilled in the art, such as glass, electrically insulating polymers, etc., may be used as the dielectric material.
During specific manufacturing, the body with the debugging hole, the negative coupling groove, the negative coupling quantity debugging hole and the negative coupling quantity debugging groove can be obtained through integrated molding, and then the surface metallization is carried out on the body to obtain the dielectric filter. In this way, the body of the dielectric resonator comprised by the dielectric filter is continuous. The dielectric filter is obtained by adopting an integrated molding mode, so that the processing technology is simpler.
Example four
This embodiment provides a dielectric filter, as shown in fig. 7, which is different from the third embodiment only in that the second implementation of the negative coupling amount adjustment unit:
the negative coupling amount adjustment part is a negative coupling amount adjustment groove 42 arranged on the third surface 43 of the main body at the connecting position of the dielectric resonator 31 and the dielectric resonator 32;
alternatively, the negative coupling amount adjustment section is a negative coupling amount adjustment groove 42 disposed on the fourth main body surface 44 at the connection position between the dielectric resonator 31 and the dielectric resonator 32;
alternatively, the negative coupling amount adjustment portion is a negative coupling amount adjustment groove 42 disposed on the third main body surface 43 and the fourth main body surface 44 at the connection position between the dielectric resonator 31 and the dielectric resonator 32.
The negative coupling amount debugging grooves 42 related to the three schemes are all blind grooves in the width direction of the body. The body third surface 43 and the body fourth surface 44 are two surfaces oppositely disposed in the body width direction, respectively.
The way of adjusting the coupling amount of the negative coupling between the dielectric resonator 31 and the dielectric resonator 32 by the negative coupling amount adjusting groove 42 is the same as that of the negative coupling amount adjusting hole, and is not described herein again.
The above-mentioned embodiments are merely preferred embodiments for fully illustrating the present invention, and the scope of the present invention is not limited thereto. Equivalent substitutes or changes made by the technical personnel in the technical field on the basis of the utility model are all within the protection scope of the utility model. The protection scope of the present invention is subject to the claims.
Claims (10)
1. A negative coupling structure, characterized by: comprises the steps of (a) preparing a mixture of a plurality of raw materials,
each dielectric resonator comprises a body made of a solid dielectric material and debugging holes positioned on the surface of the body, wherein the debugging holes are blind holes and used for debugging the resonance frequency of the dielectric resonator;
the negative coupling hole is positioned on the first surface of the body at the connecting position of the two dielectric resonators, the negative coupling hole is connected with the two dielectric resonators, and the depth of the negative coupling hole is smaller than that of the debugging holes of the two dielectric resonators;
the negative coupling groove is positioned on the second surface of the body at the connecting position of the two dielectric resonators and is connected with the two dielectric resonators; the negative coupling grooves are blind grooves in the depth direction of the body and through grooves in the width direction of the body; the first surface and the second surface of the body are two surfaces which are oppositely arranged along the depth direction of the body respectively;
a negative coupling amount adjustment unit which is located in a position in contact with the two dielectric resonators;
and a metallized conductive layer covering the surface of the dielectric resonator body, the surface of the debugging hole, the surface of the negative coupling groove and the surface of the negative coupling amount debugging part;
the negative coupling hole and the negative coupling groove are matched to realize negative coupling between the two dielectric resonators;
the negative coupling amount debugging part is used for adjusting the coupling amount of the negative coupling.
2. The negative coupling structure of claim 1, wherein: the negative coupling quantity debugging part is a negative coupling quantity debugging hole which is arranged on the first surface of the body at the connecting position of the two dielectric resonators; the negative coupling quantity debugging holes are blind holes, and the depth of the negative coupling quantity debugging holes is smaller than the depth of the debugging holes of the two dielectric resonators.
3. The negative coupling structure of claim 1, wherein: the negative coupling quantity debugging part is a negative coupling quantity debugging groove which is arranged on the third surface of the body or/and the fourth surface of the body at the connecting position of the two dielectric resonators, and the negative coupling quantity debugging groove is a blind groove in the width direction of the body; the third surface of the body and the fourth surface of the body are two surfaces which are oppositely arranged along the width direction of the body respectively.
4. The negative coupling structure of any of claims 1-3, wherein: the solid dielectric material is ceramic.
5. A dielectric filter, characterized by: comprises the steps of (a) preparing a mixture of a plurality of raw materials,
each dielectric resonator comprises a body made of a solid dielectric material and debugging holes positioned on the surface of the body, wherein the debugging holes are blind holes and used for debugging the resonance frequency of the dielectric resonator in which the debugging holes are positioned; the bodies of all the dielectric resonators included in the dielectric filter constitute the body of the dielectric filter;
each negative coupling hole is positioned on the first surface of the body at the connecting position of the two dielectric resonators, the negative coupling hole is connected with the two dielectric resonators, and the depth of the negative coupling hole is smaller than that of the debugging holes of the two dielectric resonators connected with each other at the position of the negative coupling hole;
each negative coupling groove is positioned on the second surface of the body at the connecting position of the two dielectric resonators and is connected with the two dielectric resonators; the negative coupling grooves are blind grooves in the depth direction of the body and through grooves in the width direction of the body; the first surface and the second surface of the body are two surfaces which are oppositely arranged along the depth direction of the body respectively;
at least one negative coupling amount adjustment unit located in a position in contact with the two dielectric resonators;
and a metallized conductive layer covering the surface of the dielectric filter body, the surface of the debugging hole, the surface of the negative coupling hole, the negative coupling groove and the surface of the negative coupling amount debugging part;
the negative coupling hole and the negative coupling groove are matched to realize negative coupling between the two dielectric resonators;
the negative coupling amount debugging part is used for adjusting the coupling amount of the negative coupling.
6. A dielectric filter as recited in claim 5, wherein: the negative coupling quantity debugging part is a negative coupling quantity debugging hole which is arranged on the first surface of the body at the connecting position of the two dielectric resonators; the negative coupling quantity debugging holes are blind holes, and the depth of the negative coupling quantity debugging holes is smaller than the depth of the debugging holes of the two dielectric resonators.
7. A dielectric filter as recited in claim 5, wherein: the negative coupling quantity debugging part is a negative coupling quantity debugging groove which is arranged on the third surface of the body or/and the fourth surface of the body at the connecting position of the two dielectric resonators, and the negative coupling quantity debugging groove is a blind groove in the width direction of the body; the third surface of the body and the fourth surface of the body are two surfaces which are oppositely arranged along the width direction of the body respectively.
8. A dielectric filter as recited in claim 5, wherein: and the two dielectric resonators connected with each other at the positions of the negative coupling holes or the negative coupling grooves are related to the frequency of the transmission zero point of the dielectric filter.
9. A dielectric filter as recited in claim 5, wherein: the number of the negative coupling grooves, the number of the negative coupling holes and the number of the negative coupling debugging parts are the same as the number of transmission zeros of the dielectric filter.
10. A dielectric filter as claimed in any one of claims 5 to 9, wherein: the solid dielectric material is ceramic.
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111244590A (en) * | 2019-12-31 | 2020-06-05 | 江苏灿勤科技股份有限公司 | Dielectric filters and radio transceivers |
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| WO2021043099A1 (en) * | 2019-09-02 | 2021-03-11 | 深圳顺络电子股份有限公司 | Capacitance coupling structure, dielectric filter, communication antenna, and base station |
| CN114188682A (en) * | 2021-12-28 | 2022-03-15 | 苏州艾福电子通讯股份有限公司 | Ceramic waveguide dual-mode negative coupling structure |
| CN111244590B (en) * | 2019-12-31 | 2025-04-04 | 江苏灿勤科技股份有限公司 | Dielectric filters and radio transceiver equipment |
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2019
- 2019-07-12 CN CN201921096679.3U patent/CN210074109U/en not_active Expired - Fee Related
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| WO2021043099A1 (en) * | 2019-09-02 | 2021-03-11 | 深圳顺络电子股份有限公司 | Capacitance coupling structure, dielectric filter, communication antenna, and base station |
| CN111244590A (en) * | 2019-12-31 | 2020-06-05 | 江苏灿勤科技股份有限公司 | Dielectric filters and radio transceivers |
| CN111244590B (en) * | 2019-12-31 | 2025-04-04 | 江苏灿勤科技股份有限公司 | Dielectric filters and radio transceiver equipment |
| CN111313137A (en) * | 2020-02-25 | 2020-06-19 | 重庆思睿创瓷电科技有限公司 | Capacitive coupling design method for harmonic-adjustable filter |
| CN111342177A (en) * | 2020-03-06 | 2020-06-26 | 广东国华新材料科技股份有限公司 | Dielectric waveguide ceramic filter and preparation method thereof |
| CN111342177B (en) * | 2020-03-06 | 2022-05-03 | 广东国华新材料科技股份有限公司 | Dielectric waveguide ceramic filter and preparation method thereof |
| CN112038738A (en) * | 2020-08-26 | 2020-12-04 | 江苏灿勤科技股份有限公司 | Filter and manufacturing method thereof |
| CN112038738B (en) * | 2020-08-26 | 2024-04-26 | 江苏灿勤科技股份有限公司 | Filter and manufacturing method thereof |
| CN114188682A (en) * | 2021-12-28 | 2022-03-15 | 苏州艾福电子通讯股份有限公司 | Ceramic waveguide dual-mode negative coupling structure |
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