CN209098182U - Microfluidic actuator - Google Patents
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Abstract
Description
【技术领域】【Technical field】
本案关于一种致动器,尤指一种使用微机电半导体薄膜制作的微流体致动器。This case is about an actuator, especially a microfluidic actuator made of a microelectromechanical semiconductor thin film.
【背景技术】【Background technique】
目前于各领域中无论是医药、电脑科技、打印、能源等工业,产品均朝精致化及微小化方向发展,其中微泵、喷雾器、喷墨头、工业打印装置等产品所包含的流体致动器为其关键技术。At present, in various fields, whether it is medicine, computer technology, printing, energy and other industries, products are developing in the direction of refinement and miniaturization. Among them, the fluid actuation contained in micropumps, sprayers, inkjet heads, industrial printing devices and other products device is its key technology.
随着科技的日新月异,流体输送结构的应用上亦愈来愈多元化,举凡工业应用、生医应用、医疗保健、电子散热等等,甚至近来热门的穿戴式装置皆可见它的踨影,可见传统的流体致动器已渐渐有朝向装置微小化、流量极大化的趋势。With the rapid development of science and technology, the application of fluid conveying structures has become more and more diversified, such as industrial applications, biomedical applications, medical care, electronic cooling, etc., and even the recent popular wearable devices can be seen. Traditional fluid actuators have gradually tended to miniaturize devices and maximize flow.
于现有技术中,虽已有利用微机电制程制出的微流体致动器,但由于已知的微流体致动器在作动时,压电层的位移量过小导致所传输的流量不足,是以,如何借创新结构突破其技术瓶颈,为发展的重要内容。In the prior art, although there are microfluidic actuators manufactured by MEMS process, when the known microfluidic actuator is actuated, the displacement of the piezoelectric layer is too small, resulting in the transmitted flow rate. Inadequate, therefore, how to break through its technical bottleneck through innovative structure is an important content of development.
【实用新型内容】【Content of utility model】
本案的主要目的是提供一种微流体致动器,使用微机电半导体制程制作,可传输流体。本案的微流体致动器使用半导体薄膜制作,其储流腔室的深度可设计的非常浅,借以增加作动时的流体压缩比,来弥补压电层位移量过小的缺点。The main purpose of this case is to provide a microfluidic actuator, fabricated using a microelectromechanical semiconductor process, that can transmit fluids. The microfluidic actuator in this case is made of a semiconductor thin film, and the depth of the fluid storage chamber can be designed to be very shallow, so as to increase the fluid compression ratio during actuation to make up for the shortcoming that the displacement of the piezoelectric layer is too small.
本案的一广义实施态样为一种微流体致动器,包含一基板、一腔体层、一振动层、一下电极层、一压电致动层、一上电极层、一孔板层以及一流道层。基板具有一第一表面及一第二表面,通过蚀刻制程形成一出口沟槽、二进口沟槽、一出流孔洞、多个第一进流孔洞以及二第二进流孔洞。出口沟槽与出流孔洞相连通。每一个进口沟槽与部分的多个第一进流孔洞以及相对应的第二进流孔洞相连通。进口沟槽分别对称设置在出口沟槽的两侧。多个第一进流孔洞对称设置在出流孔洞的两侧。第二进流孔洞分别对称设置在出流孔洞的两侧,且于多个第一进流孔洞的一端。腔体层通过沉积制程形成于基板的第一表面上,且通过蚀刻制程形成一储流腔室。储流腔室与出流孔洞、多个第一进流孔洞以及第二进流孔洞相连通。振动层通过沉积制程形成于腔体层上。下电极层通过沉积制程及蚀刻制程形成于振动层上。压电致动层通过沉积制程及蚀刻制程形成于下电极层上。上电极层通过沉积制程及蚀刻制程形成于压电致动层上。孔板层通过蚀刻制程形成一出流口以及二进流口。进流口分别对称设置在出流口的两侧。流道层通过一干膜材料滚压制程形成于孔板层之上、通过光刻制程形成一出流通道、二进流通道以及多个柱状结构、以及通过覆晶对位制程与热压制程接合于基板的第二表面。进流通道分别对称设置在出流通道的两侧。多个柱状结构对称设置在出流通道的两侧。孔板层的出流口借由出流通道与基板的出口沟槽相连通。孔板层的进流口分别借由进流通道与基板的进口沟槽相连通。提供具有不同相位电荷的驱动电源至上电极层以及下电极层,以驱动并控制振动层产生上下位移,使流体自进流口吸入,通过多个第一进流孔洞以及第二进流孔洞流至储流腔室,最后受挤压经由出流孔洞后自出流口排出以完成流体传输。A broad implementation aspect of the present case is a microfluidic actuator, comprising a substrate, a cavity layer, a vibration layer, a lower electrode layer, a piezoelectric actuation layer, an upper electrode layer, an orifice layer, and First-class layer. The substrate has a first surface and a second surface, and an outlet groove, two inlet grooves, an outflow hole, a plurality of first inflow holes and two second inflow holes are formed through an etching process. The outlet groove communicates with the outflow hole. Each inlet groove communicates with a portion of the plurality of first inlet holes and the corresponding second inlet holes. The inlet grooves are symmetrically arranged on both sides of the outlet grooves. The plurality of first inflow holes are symmetrically arranged on both sides of the outflow holes. The second inflow holes are symmetrically arranged on both sides of the outflow holes, and at one end of the plurality of first inflow holes. The cavity layer is formed on the first surface of the substrate through a deposition process, and a reservoir chamber is formed through an etching process. The fluid storage chamber is communicated with the outflow holes, the plurality of first inflow holes and the second inflow holes. The vibration layer is formed on the cavity layer through a deposition process. The lower electrode layer is formed on the vibration layer through a deposition process and an etching process. The piezoelectric actuating layer is formed on the lower electrode layer through a deposition process and an etching process. The upper electrode layer is formed on the piezoelectric actuating layer through a deposition process and an etching process. An outflow port and two inflow ports are formed on the orifice plate layer through an etching process. The inlets are symmetrically arranged on both sides of the outlet. The flow channel layer is formed on the orifice plate layer by a dry film material rolling process, an outflow channel, a binary flow channel and a plurality of column structures are formed by a photolithography process, and the flip chip alignment process is used to form a hot pressing process. on the second surface of the substrate. The inflow channels are respectively arranged symmetrically on both sides of the outflow channel. A plurality of columnar structures are symmetrically arranged on both sides of the outflow channel. The outflow port of the orifice plate layer is communicated with the outlet groove of the base plate through an outflow channel. The inflow ports of the orifice plate layer are respectively communicated with the inlet grooves of the base plate through the inflow channels. Provide driving power with different phase charges to the upper electrode layer and the lower electrode layer to drive and control the vibration layer to generate up and down displacement, so that the fluid is sucked in from the inlet, and flows to the first inlet hole and the second inlet hole through the plurality of first inlet holes. The fluid storage chamber is finally squeezed through the outflow hole and then discharged from the outflow port to complete the fluid transfer.
【附图说明】【Description of drawings】
图1为本案微流体致动器的第一实施例的剖面示意图。FIG. 1 is a schematic cross-sectional view of the first embodiment of the microfluidic actuator of the present invention.
图2A至第2K图为本案第一实施例的制造步骤分解示意图。2A to 2K are exploded schematic views of the manufacturing steps of the first embodiment of the present invention.
图3为本案第一实施例的俯视示意图。FIG. 3 is a schematic top view of the first embodiment of the present invention.
图4为本案第一实施例的仰视示意图。FIG. 4 is a schematic bottom view of the first embodiment of the present invention.
图5A至图5C为本案第一实施例的进流孔洞的蚀刻步骤分解示意图。5A to 5C are exploded schematic views of the etching steps of the inflow holes according to the first embodiment of the present invention.
图6A至图6B为本案第一实施例的作动示意图。6A to 6B are schematic diagrams of the operation of the first embodiment of the present invention.
图7为本案微流体致动器的第二实施例的剖面示意图。FIG. 7 is a schematic cross-sectional view of the second embodiment of the microfluidic actuator of the present invention.
图8为本案其他实施例的仰视示意图。FIG. 8 is a schematic bottom view of another embodiment of the present invention.
【具体实施方式】【Detailed ways】
体现本案特征与优点的一些典型实施例将在后段的说明中详细叙述。应理解的是本案能够在不同的态样上具有各种的变化,其皆不脱离本案的范围,且其中的说明及图示在本质上当作说明之用,而非用以限制本案。Some typical embodiments embodying the features and advantages of the present case will be described in detail in the description of the latter paragraph. It should be understood that this case can have various changes in different aspects, all of which do not depart from the scope of this case, and the descriptions and diagrams therein are essentially used for illustration rather than limiting this case.
本案的微流体致动器用于输送流体,请参阅图1,于本案实施例中,微流体致动器100包含:一基板1a、一腔体层1b、一振动层1c、一下电极层1d、一压电致动层1e、一上电极层1f、一孔板层1h以及一流道层1i。流道层1i、孔板层1h、基板1a、腔体层1b、振动层1c、下电极层1d、压电致动层1e以及上电极层1f依序堆叠结合后形成为一体,其构成如下说明。于本案第一实施例中,微流体致动器100包含一致动单元10。The microfluidic actuator of the present case is used for transporting fluids. Please refer to FIG. 1 . In the embodiment of the present case, the microfluidic actuator 100 includes: a substrate 1a, a cavity layer 1b, a vibration layer 1c, a lower electrode layer 1d, A piezoelectric actuating layer 1e, an upper electrode layer 1f, an orifice plate layer 1h, and a flow channel layer 1i. The flow channel layer 1i, the orifice layer 1h, the substrate 1a, the cavity layer 1b, the vibration layer 1c, the lower electrode layer 1d, the piezoelectric actuation layer 1e and the upper electrode layer 1f are stacked and combined in sequence to form a whole, and the composition is as follows illustrate. In the first embodiment of the present application, the microfluidic actuator 100 includes an actuating unit 10 .
请参阅图2A,于本案第一实施例中,基板1a为一种硅基材。基板1a 具有一第一表面11a以及一相对于第一表面11a的第二表面12a。于本案第一实施例中,腔体层1b通过一二氧化硅材料沉积制程形成于基板1a的第一表面11a之上,沉积制程可为一物理气相沉积制程 (PVD)、一化学气相沉积制程(CVD)或两者的组合,但不以此为限。于本案第一实施例中,振动层1c通过一氮化硅材料沉积制程形成于腔体层1b之上。于本案第一实施例中,下电极层1d通过一金属材料沉积制程形成于振动层1c之上,下电极层1d为一铂金属材料或一钛金属材料,但不以此为限。于本案第一实施例中,压电致动层1e通过一压电材料沉积制程形成于下电极层1d之上。于本案第一实施例中,上电极层1f通过一金属材料沉积制程形成于压电致动层1e之上,上电极层1f为一金金属材料或一铝金属材料,但不以此为限。值得注意的是,图2A所示的结构,为现有代工技术可制作的结构,故具有低成本的优点。Please refer to FIG. 2A , in the first embodiment of the present application, the substrate 1 a is a silicon substrate. The substrate 1a has a first surface 11a and a second surface 12a opposite to the first surface 11a. In the first embodiment of the present application, the cavity layer 1b is formed on the first surface 11a of the substrate 1a through a deposition process of silicon dioxide material, and the deposition process may be a physical vapor deposition process (PVD), a chemical vapor deposition process ( CVD) or a combination of the two, but not limited thereto. In the first embodiment of the present application, the vibration layer 1c is formed on the cavity layer 1b by a silicon nitride material deposition process. In the first embodiment of the present application, the lower electrode layer 1d is formed on the vibration layer 1c through a metal material deposition process, and the lower electrode layer 1d is a platinum metal material or a titanium metal material, but not limited thereto. In the first embodiment of the present application, the piezoelectric actuating layer 1e is formed on the lower electrode layer 1d through a piezoelectric material deposition process. In the first embodiment of the present application, the upper electrode layer 1f is formed on the piezoelectric actuating layer 1e by a metal material deposition process, and the upper electrode layer 1f is made of a gold metal material or an aluminum metal material, but not limited to this. . It is worth noting that the structure shown in FIG. 2A is a structure that can be fabricated by the existing foundry technology, so it has the advantage of low cost.
请参阅图2B,于本案第一实施例中,下电极层1d、压电致动层1e以及上电极层1f通过光刻蚀刻制程蚀刻定义出一作动区M。值得注意的是,于本案第一实施例中,蚀刻制程可为一湿式蚀刻制程、一干式蚀刻制程或两者的组合,但不以此为限。Referring to FIG. 2B , in the first embodiment of the present application, the lower electrode layer 1 d , the piezoelectric actuating layer 1 e and the upper electrode layer 1 f are etched to define an active region M through a photolithography etching process. It should be noted that, in the first embodiment of the present application, the etching process may be a wet etching process, a dry etching process or a combination of the two, but not limited thereto.
请参阅图2C,于本案第一实施例中,通过干式蚀刻制程蚀刻基板1a 的第二表面12a以形成一出口沟槽13a以及二进口沟槽14a。出口沟槽13a以及进口沟槽14a具有相同的蚀刻深度,且蚀刻深度为蚀刻至第一表面11a以及第二表面12a之间且不与腔体层1b接触。进口沟槽14a分别对称设置在进口沟槽13a的两侧。Referring to FIG. 2C , in the first embodiment of the present invention, the second surface 12 a of the substrate 1 a is etched through a dry etching process to form an outlet trench 13 a and two inlet trenches 14 a. The outlet trench 13a and the inlet trench 14a have the same etching depth, and the etching depth is etched between the first surface 11a and the second surface 12a without contacting the cavity layer 1b. The inlet grooves 14a are symmetrically arranged on both sides of the inlet groove 13a, respectively.
请参阅图2D及图2E,于本案第一实施例中,一遮罩层1g通过一二氧化硅材料沉积制程形成于基板1a的第二表面12a上、以及出口沟槽13a与进口沟槽14a内。遮罩层1g再通过一精密穿孔制程于出口沟槽13a内形成一第一流通孔11g,分别于进口沟槽14a内形成多个第二流通孔12g以及一第三流通孔13g。于本案第一实施例中,第一流通孔11g的孔径大于第三流通孔13g的孔径、第三流通孔13g的孔径大于每一个第二流通孔12g的孔径,但不以此为限。第一流通孔11g、多个第二流通孔12g以及第三流通孔13g的穿孔深度为至与基板1a 接触为止,使得基板1a得以露出。于本案第一实施例中,精密穿孔制程为一准分子激光加工制程,但不以此为限。Please refer to FIGS. 2D and 2E. In the first embodiment of the present invention, a mask layer 1g is formed on the second surface 12a of the substrate 1a, and the outlet trenches 13a and the inlet trenches 14a are formed by a silicon dioxide material deposition process. Inside. The mask layer 1g then undergoes a precision perforation process to form a first flow hole 11g in the outlet groove 13a, and a plurality of second flow holes 12g and a third flow hole 13g are respectively formed in the inlet groove 14a. In the first embodiment of the present application, the diameter of the first flow hole 11g is larger than that of the third flow hole 13g, and the diameter of the third flow hole 13g is larger than that of each second flow hole 12g, but not limited thereto. The perforation depths of the first flow hole 11g, the plurality of second flow holes 12g, and the third flow hole 13g are until they come into contact with the substrate 1a, so that the substrate 1a is exposed. In the first embodiment of the present application, the precision perforation process is an excimer laser processing process, but it is not limited thereto.
请参阅图2E、图2F及图3,于本案第一实施例中,基板1a通过一低温深蚀刻制程蚀刻基板1a对应于第一流通孔11g、多个第二流通孔 12g以及第三流通孔13g的部分,借以形成基板1a的一出流孔洞15a、多个第一进流孔洞16a以及二第二进流孔洞17a。出流孔洞15a为沿第一流通孔11g蚀刻至与腔体层1b接触为止所构成,多个第一进流孔洞16a为分别沿多个第二流通孔12g蚀刻至与腔体层1b接触为止所构成,以及第二进流孔洞17a为分别沿第三流通孔13g蚀刻至与腔体层1b接触为止所构成。多个第一进流孔洞16a对称设置在出流孔洞15a的两侧。第二进流孔洞17a分别对称设置在出流孔洞15a的两侧,且于多个第一进流孔洞16a的一端。于本案第一实施例中,低温深蚀刻制程为一深反应性离子蚀刻制程(BOSCHProcess),但不以此为限。请参阅图2E及图5A,于本案第一实施例中,遮罩层1g利用准分子激光加工制程形成第一流通孔11g、多个第二流通孔12g以及第三流通孔13g时,为了避免穿孔位置或穿孔角度的偏差,于出口沟槽13a及进口沟槽14a的侧壁特予保留一缓冲距离e。此外,采用深反应性离子蚀刻制程(BOSCH Process)只对于基板1a的硅基材做蚀刻,因此利用准分子激光加工制程在基板1a上留有一过蚀深度t,有利于基板1a能确实且容易从过蚀深度t去蚀刻形成出流孔洞15a、多个第一进流孔洞16a以及第二进流孔洞17a。于本案第一实施例中,出流孔洞15a、多个第一进流孔洞16a以及第二进流孔洞17a的最小孔径为5~50微米(μm),并且孔径大小视流体性质而定。接着请参阅图2F及图5B,出流孔洞15a、每一个第一进流孔洞16a以及每一个第二进流孔洞17a具有一穿孔深度d以及一穿孔孔径s,所形成的孔洞的深宽比d/s可达40,在实施此加工制程中考量适当孔洞的深宽比 d/s,可避免加工所产生的高温,影响后端压电材料的极性分布,造成退极化反应。Please refer to FIG. 2E , FIG. 2F and FIG. 3 , in the first embodiment of the present application, the substrate 1 a is etched through a low-temperature deep etching process to etch the substrate 1 a corresponding to the first through holes 11 g , the plurality of second through holes 12 g and the third through holes The portion 13g is used to form an outflow hole 15a, a plurality of first inflow holes 16a and two second inflow holes 17a of the substrate 1a. The outflow holes 15a are formed by etching along the first flow holes 11g until they contact the cavity layer 1b, and the plurality of first inflow holes 16a are respectively etched along the plurality of second flow holes 12g until they contact the cavity layer 1b. and the second inflow holes 17a are formed by etching along the third flow holes 13g until they are in contact with the cavity layer 1b. The plurality of first inflow holes 16a are symmetrically arranged on both sides of the outflow holes 15a. The second inflow holes 17a are symmetrically disposed on both sides of the outflow holes 15a, and at one end of the plurality of first inflow holes 16a. In the first embodiment of the present application, the low-temperature deep etching process is a deep reactive ion etching process (BOSCH Process), but it is not limited thereto. Please refer to FIG. 2E and FIG. 5A , in the first embodiment of the present application, when the mask layer 1g uses an excimer laser processing process to form the first flow hole 11g, the plurality of second flow holes 12g and the third flow hole 13g, in order to avoid For the deviation of the perforation position or the perforation angle, a buffer distance e is reserved in the sidewalls of the outlet groove 13a and the inlet groove 14a. In addition, the deep reactive ion etching process (BOSCH Process) is used to etch only the silicon substrate of the substrate 1a, so the excimer laser processing process is used to leave an overetching depth t on the substrate 1a, which is beneficial for the substrate 1a to be reliable and easy. The outflow hole 15a, the plurality of first inflow holes 16a and the second inflow holes 17a are formed by etching from the overetching depth t. In the first embodiment of the present application, the minimum pore diameters of the outflow holes 15a, the plurality of first inflow holes 16a and the second inflow holes 17a are 5-50 micrometers (μm), and the pore size depends on the properties of the fluid. 2F and 5B, the outflow holes 15a, each of the first inflow holes 16a and each of the second inflow holes 17a have a perforation depth d and a perforation aperture s, and the aspect ratio of the formed holes The d/s can reach 40. In the implementation of this process, the aspect ratio d/s of the appropriate hole is considered, which can avoid the high temperature generated by the processing, which will affect the polarity distribution of the back-end piezoelectric material and cause a depolarization reaction.
请参阅图2E及第2G图,于本案第一实施例中,腔体层1b再经一湿蚀刻制程于内部蚀刻出一储流腔室11b。意即,通过蚀刻液由第一流通孔11g、多个第二流通孔12g以及第三流通孔13g流入,经由出流孔洞15a、多个第一进流孔洞16a以及第二进流孔洞17a流至腔体层 1b,进而蚀刻并释放移除腔体层1b的部分,借以定义出一储流腔室 11b。借此,储流腔室11b与出流孔洞15a、多个第一进流孔洞16a以及第二进流孔洞17a相连通。于本案第一实施例中,湿蚀刻制程利用氢氟酸(HF)蚀刻液蚀刻腔体层1b,但不以此为限。于本案第一实施例中,腔体层1b厚度为1~5微米(μm),但不以此为限。值得注意的是,通过湿蚀刻制程成形储流腔室11b的同时,遮罩层1g亦会被一并移除。完成储流腔室11b成形与移除遮罩层1g后,基板1a的出口沟槽13a与出流孔洞15a相连通、进口沟槽14a分别与多个第一进流孔洞16a以及第二进流孔洞17a相连通。再请参阅第2G图及图5C,于本案第一实施例中,湿蚀刻制程通常为等向性蚀刻,于本案第一实施例中,在蚀刻储液腔室11b时,储液腔室11b具有一腔体深度r,其等同于腔体层1b的厚度,而湿蚀刻所产生的侧蚀距离为r',因此腔体深度r与侧蚀距离r'相等,即为一等向性蚀刻。又由于出流孔洞15a、每一个第一进流孔洞16a以及每一个第二进流孔洞17a的孔径仅介于 5~50微米(μm)之间,而腔体深度r仅介于1~5微米(μm)之间,因此在蚀刻储液腔室11b时需要一过度蚀刻,以加长蚀刻时间才能将未被蚀刻的余料移除干净。于本案第一实施例中,以此进行湿蚀刻制程形成储液腔室11b时,会产生一过蚀距离L,并且过蚀距离L大于侧蚀距离为r',才能使储液腔室11b范围内的二氧化硅材料完全被移除。Please refer to FIG. 2E and FIG. 2G , in the first embodiment of the present application, the cavity layer 1b is further etched to form a reservoir chamber 11b inside the cavity layer 1b through a wet etching process. That is, the etching solution flows into the first flow hole 11g, the plurality of second flow holes 12g and the third flow hole 13g, and flows through the outflow hole 15a, the plurality of first inflow holes 16a and the second inflow hole 17a. to the cavity layer 1b, and then etching and releasing the part of the cavity layer 1b to define a storage chamber 11b. Thereby, the storage chamber 11b is communicated with the outflow hole 15a, the plurality of first inflow holes 16a and the second inflow holes 17a. In the first embodiment of the present application, the wet etching process uses a hydrofluoric acid (HF) etchant to etch the cavity layer 1b, but it is not limited thereto. In the first embodiment of the present application, the thickness of the cavity layer 1b is 1-5 micrometers (μm), but not limited thereto. It is worth noting that, when the reservoir chamber 11b is formed by the wet etching process, the mask layer 1g is also removed together. After the formation of the storage chamber 11b and the removal of the mask layer 1g, the outlet groove 13a of the substrate 1a is communicated with the outflow hole 15a, and the inlet groove 14a is respectively connected with a plurality of first inflow holes 16a and a second inflow hole 15a. The holes 17a communicate with each other. Please refer to FIGS. 2G and 5C again. In the first embodiment of the present application, the wet etching process is usually isotropic etching. In the first embodiment of the present application, when the liquid storage chamber 11b is etched, the liquid storage chamber 11b There is a cavity depth r, which is equal to the thickness of the cavity layer 1b, and the undercut distance generated by wet etching is r', so the cavity depth r is equal to the undercut distance r', which is an isotropic etching . Furthermore, since the diameters of the outflow holes 15a, each of the first inflow holes 16a and each of the second inflow holes 17a are only between 5-50 micrometers (μm), and the cavity depth r is only between 1-5 Therefore, when etching the liquid storage chamber 11b, an over-etching is required, so as to prolong the etching time, the unetched residues can be removed. In the first embodiment of the present application, when the wet etching process is performed to form the liquid storage chamber 11b, an over-etching distance L will be generated, and the over-etching distance L is greater than the under-etching distance by r', so that the liquid storage chamber 11b can be formed. The silica material in the range is completely removed.
请参阅第2H图及第2I图,于本案第一实施例中,提供孔板层1h,通过蚀刻制程于孔板层1h蚀刻出一出流口11h以及二进流口12h。进流口12h分别对称设置于出流口11h的两侧。于本案第一实施例中,孔板层1h的蚀刻制程可为一湿蚀刻制程、一干蚀刻制程或二者的组合,但不以此为限。于本案第一实施例中,孔板层1h为一不锈钢材料或一玻璃材料,但不以此为限。Referring to FIGS. 2H and 2I, in the first embodiment of the present application, an orifice layer 1h is provided, and an outlet 11h and two inlets 12h are etched in the orifice layer 1h through an etching process. The inlet ports 12h are symmetrically arranged on both sides of the outlet port 11h, respectively. In the first embodiment of the present application, the etching process of the orifice layer 1h may be a wet etching process, a dry etching process or a combination of the two, but not limited thereto. In the first embodiment of the present application, the orifice plate layer 1h is made of a stainless steel material or a glass material, but it is not limited thereto.
请参阅第2J图、第2K图及图4,于本案第一实施例中,流道层1i 通过一干膜材料滚压制程形成于孔板层1h之上,并通过光刻制程于流道层1i上形成一出流通道11i、二个进流通道12i以及多个柱状结构13i,且构成出流通道11i与孔板层1h的出流口11h相连通,以及构成进流通道12i分别与孔板层1h的进流口12h相连通。进流通道 12i分别对称设置在出流通道11i的两侧。于本案第一实施例中,多个柱状结构13i交错排列形成于进流通道12i内(如图4),用以过滤流体中的杂质。于本案第一实施例中,干膜材料为一感光型高分子干膜,但不以此为限。Please refer to FIGS. 2J, 2K and 4. In the first embodiment of the present application, the flow channel layer 1i is formed on the orifice plate layer 1h through a dry film material rolling process, and is formed on the flow channel layer through a photolithography process. One outflow channel 11i, two inflow channels 12i and a plurality of columnar structures 13i are formed on 1i, and the outflow channel 11i is formed to communicate with the outflow port 11h of the orifice plate layer 1h, and the inflow channel 12i is formed with the holes respectively. The inlet 12h of the board layer 1h is connected. The inflow passages 12i are symmetrically arranged on both sides of the outflow passage 11i, respectively. In the first embodiment of the present application, a plurality of columnar structures 13i are staggered and formed in the inflow channel 12i (as shown in FIG. 4 ) to filter impurities in the fluid. In the first embodiment of the present application, the dry film material is a photosensitive polymer dry film, but not limited thereto.
请回到图1,流道层1i最后通过一覆晶对位以及一热压合制程接合于基板1a的第二表面12a,形成本案微流体致动器100的致动单元10。借此,孔板层1h的出流口11h借由流道层1i的出流通道11i与基板 1a的出口沟槽13a相连通;以及孔板层1h的进流口12h分别借由流道层1i的进流通道12i与基板1a的进口沟槽14a相连通。Returning to FIG. 1 , the flow channel layer 1i is finally bonded to the second surface 12a of the substrate 1a through a flip-chip alignment and a thermocompression bonding process to form the actuating unit 10 of the microfluidic actuator 100 of the present invention. Thereby, the outflow port 11h of the orifice plate layer 1h communicates with the outlet groove 13a of the substrate 1a through the outflow channel 11i of the flow channel layer 1i; The inlet channel 12i of 1i communicates with the inlet groove 14a of the substrate 1a.
请参阅图6A及图6B,于本案第一实施例中,微流体致动器100的具体作动方式,提供具有相反相位电荷的驱动电源至上电极层1f以及下电极层1d,以驱动并控制振动层1c产生上下位移。如图6A所示,当施加正电压给上电极层1f以及负电压给下电极层1d时,压电致动层1e带动振动层1c朝向远离基板1a的方向位移,借此,外部流体由孔板层1h的进流口12h被吸入至微流体致动器100内,而进入微流体致动器100内的流体接着依序通过流道层1i的进流通道12i、基板1a的进口沟槽14a以及基板1a的多个第一进流孔洞16a与第二进流孔洞17a,最后汇集于腔体层1b的储流腔室11b内。如图6B所示,接着转换上电极层1f以及下电极层1d的电性,施加负电压给上电极层1f以及正电压给下电极层1d,如此振动层1c朝向靠近基板1a的方向位移,使储流腔室11b内体积受振动层1c压缩,致使汇集于储流腔室11b内的流体得以依序通过基板1a的出流孔洞15a、基板1a 的出口沟槽13a以及流道层1i的出流通道11i后,自孔板层1h的出流口11h排出于微流体致动器100外,完成流体的传输。Please refer to FIG. 6A and FIG. 6B , in the first embodiment of the present application, the specific operation mode of the microfluidic actuator 100 is to provide driving power with opposite phase charges to the upper electrode layer 1f and the lower electrode layer 1d to drive and control The vibration layer 1c is displaced up and down. As shown in FIG. 6A, when a positive voltage is applied to the upper electrode layer 1f and a negative voltage is applied to the lower electrode layer 1d, the piezoelectric actuating layer 1e drives the vibration layer 1c to move away from the substrate 1a, whereby the external fluid flows through the holes The inflow port 12h of the plate layer 1h is sucked into the microfluidic actuator 100, and the fluid entering the microfluidic actuator 100 then sequentially passes through the inflow channel 12i of the flow channel layer 1i and the inlet groove of the substrate 1a 14a and the plurality of first inflow holes 16a and second inflow holes 17a of the substrate 1a are finally collected into the fluid storage chamber 11b of the cavity layer 1b. As shown in FIG. 6B, the electrical properties of the upper electrode layer 1f and the lower electrode layer 1d are then converted, and a negative voltage is applied to the upper electrode layer 1f and a positive voltage to the lower electrode layer 1d, so that the vibration layer 1c is displaced toward the direction close to the substrate 1a, The volume in the storage chamber 11b is compressed by the vibration layer 1c, so that the fluid collected in the storage chamber 11b can pass through the outflow holes 15a of the substrate 1a, the outlet grooves 13a of the substrate 1a and the flow channel layer 1i in sequence. After exiting the outflow channel 11i, the fluid is discharged out of the microfluidic actuator 100 from the outflow port 11h of the orifice plate layer 1h to complete the fluid transmission.
值得注意的是,当微流体致动器100吸入外部流体时,部分外部流体会由孔板层1h的出流口11h被吸入微流体致动器100内,但由于孔板层1h的出流道口11h的孔径较入流道口12h的孔径小,所以外部流体自出流口11h被吸入的量相对较少。当微流体致动器100排出流体时,流道层1i的多个柱状结构13i对于回流的流体会产生阻尼效果,此外,基板1a的第二进流孔洞17a对应到压电致动层1c位移量最小的边缘位置。所以流体自进流口12h被排出的量相对较少。It is worth noting that when the microfluidic actuator 100 sucks the external fluid, part of the external fluid will be sucked into the microfluidic actuator 100 through the outflow port 11h of the orifice plate layer 1h, but due to the outflow of the orifice plate layer 1h The hole diameter of the passage opening 11h is smaller than that of the inflow passage opening 12h, so that the amount of external fluid sucked from the outflow opening 11h is relatively small. When the microfluidic actuator 100 discharges fluid, the plurality of columnar structures 13i of the flow channel layer 1i will have a damping effect on the backflowing fluid. In addition, the second inflow hole 17a of the substrate 1a corresponds to the displacement of the piezoelectric actuating layer 1c The smallest edge position. Therefore, the amount of fluid discharged from the inlet port 12h is relatively small.
再者,值得注意的是,基板1a的多个第一进流孔洞16a流通阻力过大的问题,可借由调整电压波形或拉长微流体致动器100吸入外部流体的作动时间而改善。Furthermore, it is worth noting that the problem that the flow resistance of the plurality of first inflow holes 16a of the substrate 1a is too large can be improved by adjusting the voltage waveform or lengthening the actuation time of the microfluidic actuator 100 for sucking the external fluid .
请参阅图7,本案第二实施例与第一实施例大致相同,不同之处在于微流体致动器100'包含二致动单元10,借以增加流量输出。Referring to FIG. 7 , the second embodiment of the present application is substantially the same as the first embodiment, except that the microfluidic actuator 100 ′ includes two actuating units 10 to increase the flow output.
请参阅图8,于本案其他实施例中,微流体致动器100"包含多个致动单元10。多个致动单元10可借串联、并联或串并联方式设置,借以增加流量输出,多个致动单元10的设置方式可依照使用需求而设计,不以此为限。Referring to FIG. 8, in other embodiments of the present application, the microfluidic actuator 100" includes a plurality of actuating units 10. The plurality of actuating units 10 can be arranged in series, in parallel, or in series-parallel, so as to increase the flow output. The arrangement of each of the actuating units 10 can be designed according to usage requirements, but is not limited thereto.
值得注意的是,于本案第一实施例以及第二实施例中,每一个致动单元10具有一对称性结构,于本案其他实施例中,每一个致动单元10 的结构设置方式可以依照使用需求而设计,不以此为限。It should be noted that, in the first and second embodiments of this application, each actuating unit 10 has a symmetrical structure. In other embodiments of this application, the structural arrangement of each actuating unit 10 can be used according to Design according to needs, not limited to this.
本案提供一微流体致动器,主要以微机电半导体制程来完成的微流体致动器,并且借由施加不同相位电荷的驱动电源于上电极层以及下电极层,使得振动层产生上下位移,进而达到流体传输。如此,微流体致动器能够在作动时增加流体压缩比来弥补压电层位移量过小的缺点,达到传输流体的实施可行性及在极微型化结构中产生极大的传输效率,极具产业的利用价值,爰依法提出申请。This application provides a microfluidic actuator, which is mainly completed by a microelectromechanical semiconductor process, and by applying driving power sources of different phase charges to the upper electrode layer and the lower electrode layer, the vibration layer is displaced up and down, to achieve fluid transfer. In this way, the microfluidic actuator can increase the fluid compression ratio during actuation to compensate for the small displacement of the piezoelectric layer, so as to achieve the feasibility of transmitting fluids and generate great transmission efficiency in an extremely miniaturized structure. If it has industrial use value, the application shall be filed in accordance with the law.
本案得由熟知此技术的人士任施匠思而为诸般修饰,然皆不脱如附申请专利范围所欲保护者。This case can be modified by Shi Jiangsi, a person who is familiar with this technology, but all of them do not deviate from the protection of the scope of the patent application attached.
【符号说明】【Symbol Description】
100、100'、100":微流体致动器100, 100', 100": Microfluidic Actuators
10:致动单元10: Actuating unit
1a:基板1a: Substrate
11a:第一表面11a: first surface
12a:第二表面12a: Second surface
13a:出口沟槽13a: Outlet groove
14a:进口沟槽14a: Inlet groove
15a:出流孔洞15a: Outflow holes
16a:第一进流孔洞16a: The first inlet hole
17a:第二进流孔洞17a: Second inlet hole
1b:腔体层1b: Cavity layer
11b:储流腔室11b: Reservoir chamber
1c:振动层1c: Vibration layer
1d:下电极层1d: lower electrode layer
1e:压电致动层1e: Piezoelectric Actuation Layer
1f:上电极层1f: upper electrode layer
1g:遮罩层1g: mask layer
11g:第一流通孔11g: first flow hole
12g:第二流通孔12g: Second flow hole
13g:第三流通孔13g: Third flow hole
1h:孔板层1h: Orifice layer
11h:出流口11h: Outlet
12h:进流口12h: Inlet
1i:流道层1i: runner layer
11i:出流通道11i: Outflow channel
12i:进流通道12i: Inflow channel
13i:柱状结构13i: Columnar structure
e:缓冲距离e: buffer distance
t:过蚀深度t: overetching depth
d:穿孔深度d: perforation depth
s:穿孔孔径s: perforation aperture
r:腔体深度r: cavity depth
r':侧蚀距离r': side erosion distance
L:过蚀距离L: Overetch distance
M:作动区。M: Action area.
Claims (18)
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111252727A (en) * | 2018-11-30 | 2020-06-09 | 研能科技股份有限公司 | Microfluidic actuator |
CN112808330A (en) * | 2019-11-18 | 2021-05-18 | 研能科技股份有限公司 | Method for manufacturing micro-fluid actuator |
US11905168B2 (en) | 2019-11-18 | 2024-02-20 | Microjet Technology Co., Ltd. | Manufacturing method of miniature fluid actuator |
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2018
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111252727A (en) * | 2018-11-30 | 2020-06-09 | 研能科技股份有限公司 | Microfluidic actuator |
CN112808330A (en) * | 2019-11-18 | 2021-05-18 | 研能科技股份有限公司 | Method for manufacturing micro-fluid actuator |
CN112808330B (en) * | 2019-11-18 | 2022-06-24 | 研能科技股份有限公司 | Fabrication method of microfluidic actuator |
US11905168B2 (en) | 2019-11-18 | 2024-02-20 | Microjet Technology Co., Ltd. | Manufacturing method of miniature fluid actuator |
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