CN208239201U - A kind of material microstructure mechanical property characterization experimental provision - Google Patents
A kind of material microstructure mechanical property characterization experimental provision Download PDFInfo
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- 239000000463 material Substances 0.000 title claims abstract description 27
- 238000012512 characterization method Methods 0.000 title abstract description 6
- 238000012360 testing method Methods 0.000 claims abstract description 34
- 239000003638 chemical reducing agent Substances 0.000 claims description 34
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 21
- 238000006073 displacement reaction Methods 0.000 claims description 16
- 238000005057 refrigeration Methods 0.000 claims description 16
- 238000001816 cooling Methods 0.000 claims description 15
- 230000003287 optical effect Effects 0.000 claims description 14
- 238000010438 heat treatment Methods 0.000 claims description 11
- 229910052697 platinum Inorganic materials 0.000 claims description 11
- 238000000034 method Methods 0.000 abstract description 22
- 230000008569 process Effects 0.000 abstract description 11
- 230000007246 mechanism Effects 0.000 abstract description 4
- 239000013078 crystal Substances 0.000 abstract 1
- 238000005516 engineering process Methods 0.000 description 10
- 238000004458 analytical method Methods 0.000 description 9
- 238000010586 diagram Methods 0.000 description 8
- 239000007789 gas Substances 0.000 description 7
- 230000008859 change Effects 0.000 description 6
- 238000002474 experimental method Methods 0.000 description 5
- 238000011160 research Methods 0.000 description 5
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 4
- 230000009471 action Effects 0.000 description 4
- 239000007769 metal material Substances 0.000 description 4
- 238000003860 storage Methods 0.000 description 4
- 230000033001 locomotion Effects 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 239000003507 refrigerant Substances 0.000 description 3
- 238000004088 simulation Methods 0.000 description 3
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 2
- 235000011089 carbon dioxide Nutrition 0.000 description 2
- 125000004122 cyclic group Chemical group 0.000 description 2
- 238000010191 image analysis Methods 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000004452 microanalysis Methods 0.000 description 2
- 229910052757 nitrogen Inorganic materials 0.000 description 2
- 229910001369 Brass Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 239000010951 brass Substances 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 238000007405 data analysis Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000007431 microscopic evaluation Methods 0.000 description 1
- 238000000386 microscopy Methods 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
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Abstract
本实用新型公开一种材料显微组织性能表征高通量实验装置,属于材料性能测试领域。本实用新型所述装置包括底座、拉伸装置、显微测试系统、十字滑台、低温测试系统、高温测试系统、控制计算机、上位机,底座上设有十字滑台,十字滑台上设有拉伸支架,拉伸装置安装在拉伸支架上,显微测试系统位于试样的正上方;控制计算机通过数据接口与上位机连接;本实用新型能连续观察材料在各种气氛、温度环境中形变过程中微观组织变化规律,同时获得试样在各种气氛、温度环境中应力——应变曲线及曲线上各点所对应金相结构,通过观察分析材料微结构形变及断裂机理,对晶内、晶界、栾晶、位错、第二相等力学性能影响因素进行观察研究。
The utility model discloses a high-throughput experimental device for characterization of material microstructure performance, which belongs to the field of material performance testing. The device described in the utility model includes a base, a stretching device, a microscopic test system, a cross slide, a low temperature test system, a high temperature test system, a control computer, and a host computer. The base is provided with a cross slide, and the cross slide is provided with Stretching bracket, the stretching device is installed on the stretching bracket, and the microscopic testing system is located directly above the sample; the control computer is connected with the host computer through the data interface; the utility model can continuously observe the material in various atmospheres and temperature environments During the deformation process, the microstructure changes, and at the same time, the stress-strain curve of the sample in various atmospheres and temperature environments and the metallographic structure corresponding to each point on the curve are obtained. By observing and analyzing the deformation and fracture mechanism of the material microstructure, the intragranular , Grain boundary, Luan crystal, dislocation, and second phase mechanical properties are observed and studied.
Description
技术领域technical field
本实用新型涉及一种材料显微组织力学性能表征实验装置,属于材料性能测试领域。The utility model relates to an experimental device for characterizing mechanical properties of material microstructures, which belongs to the field of material performance testing.
背景技术Background technique
金相显微分析是重要的材料分析基础手段,通过金相分析可获得金属及合金组织大小、形态、分布、数量和性质的一种方法,同时可获得晶粒、夹杂物以及相变产物等特征组织。近年来随着计算机技术的发展,通过对二维金相试样磨面或薄膜的金相显微组织图谱的测量和计算可确定金属微观组织的三维空间形貌,建立金属材料成分、组织和性能间的关系。Metallographic microscopic analysis is an important basic method of material analysis. Through metallographic analysis, it is a method to obtain the size, shape, distribution, quantity and properties of metal and alloy structures. At the same time, it can obtain characteristic structures such as grains, inclusions and phase transformation products. . In recent years, with the development of computer technology, the three-dimensional spatial morphology of metal microstructure can be determined by measuring and calculating the metallographic microstructure map of two-dimensional metallographic samples or thin films, and the relationship between the composition, structure and performance of metal materials can be established. Relationship.
目前金相显微技术无论是样品制备技术,金相显微镜的分辨率,图像分析能力均得到较大的发展,且针对不同材料体系的分析检验方法也不断完善和深入,涉及金属材料生产、应用和科研,金相显微分析技术已成为评定金属材料内在质量的一种常规检验方法,也是分析材料缺陷机理和辅助工艺改善的必要手段。At present, metallographic microscopy technology has been greatly developed in terms of sample preparation technology, metallographic microscope resolution, and image analysis capabilities, and the analysis and inspection methods for different material systems have also been continuously improved and deepened, involving the production, application and scientific research of metal materials. , Metallographic microanalysis technology has become a routine inspection method to evaluate the intrinsic quality of metal materials, and it is also a necessary means to analyze the mechanism of material defects and improve the auxiliary process.
但目前的金相显微分析技术仅限于对样品的静态观察,定性描述金属材料的显微组织特征或采用与各种标准图片比较的方法评定显微组织、晶粒度、非金属夹杂物及第二相质点等,这种方法精确性不高,评定时带有很大的主观性,且对工况条件下的样品只能事后取样分析,过程中的显微组织变化无法观测。传统研究方法是针对不同变形特点,以起始态和终了态作为边界条件建立有限元模拟模型,以此研究材料晶粒塑性变形机理,网格划分精度极大影响到模拟结果,往往不能反映真实变形情况。鉴于此,如何获得变形过程中材料微观结构信息,特别是晶粒晶界协调变形特点、断裂机制特征,仍然缺乏有效的技术方法,是目前未解决的关键且重要科学技术问题之一,面临重要的技术需求。However, the current metallographic microanalysis technology is limited to the static observation of the sample, qualitatively describes the microstructure characteristics of metal materials or evaluates the microstructure, grain size, non-metallic inclusions and the second by comparing with various standard pictures. Phase particles, etc., this method is not accurate, and the evaluation is highly subjective, and the samples under working conditions can only be sampled and analyzed afterwards, and the microstructural changes in the process cannot be observed. The traditional research method is to establish a finite element simulation model with the initial state and final state as the boundary conditions for different deformation characteristics, so as to study the plastic deformation mechanism of material grains. The accuracy of mesh division greatly affects the simulation results, and often cannot reflect the real Deformation situation. In view of this, how to obtain the microstructure information of the material during the deformation process, especially the coordinated deformation characteristics of the grain boundaries and the characteristics of the fracture mechanism, still lacks effective technical methods. technical needs.
发明内容Contents of the invention
本实用新型的目的在于提供一种高通量显微组织力学性能表征实验装置,应用高速摄相技术、图像传输技术、计算机图像处理技术、数据库等现代数据分析、处理技术,将传统金相分析技术与材料力学性能测试结合在一起,清晰完整的获得材料受力变形过程中各因素变化规律及相互影响关系,具有较强的表征能力。The purpose of this utility model is to provide a high-throughput experimental device for the characterization of microstructural mechanical properties, which uses modern data analysis and processing technologies such as high-speed camera technology, image transmission technology, computer image processing technology, and databases to convert traditional metallographic analysis The combination of technology and material mechanical performance testing can clearly and completely obtain the change law and mutual influence relationship of various factors in the process of material stress and deformation, and has strong characterization ability.
具体通过以下方式实现:一种显微组织力学性能表征实验装置,包括底座5、拉伸装置、显微测试系统、十字滑台、低温测试系统、高温测试系统、控制计算机49、上位机60,底座5上设有十字滑台,十字滑台上设有拉伸支架8,拉伸装置安装在拉伸支架8上,显微测试系统位于试样33的正上方;控制计算机49通过数据接口48与上位机60连接;Specifically, it is realized in the following ways: an experimental device for characterization of microstructure mechanical properties, including a base 5, a tensile device, a microscopic testing system, a cross slide, a low-temperature testing system, a high-temperature testing system, a control computer 49, and a host computer 60, The base 5 is provided with a cross slide, and the cross slide is provided with a stretching support 8, the stretching device is installed on the stretch support 8, and the microscopic testing system is located directly above the sample 33; the control computer 49 passes through the data interface 48 Connect with host computer 60;
所述拉伸装置包括拉伸电机6、拉伸减速器7、前导轨9、丝杠10、拉伸台11、拉力传感器支架12、拉力传感器13、右夹头25、试样支架28、位移传感器36、直线轴承37、左夹头38、试样拉头39、后导轨40;拉伸台11、试样拉头39、试样支架28从左到右依次置于拉伸支架8上,前导轨9和后导轨40分别位于拉伸支架8的两侧,前导轨9和后导轨40一端固定在拉伸支架8上,另一端固定在试样支架28上,试样支架28固定在拉伸支架8上;拉伸台11、试样拉头39的两侧均设有直线轴承37,拉伸台11和试样拉头39通过两侧的直线轴承37依次穿过前导轨9和后导轨40;拉伸减速器7固定在拉伸支架8上,拉伸电机6与拉伸减速器7的输入端连接,拉伸减速器7的输出端与丝杠10连接,丝杠10与拉伸台11连接,拉伸台11上安装有拉力传感器支架12,拉力传感器支架12上安装拉力传感器13,拉力传感器13的另一端与试样拉头39连接;试样拉头39上固定有左夹头38,与左夹头38对应的位置设有右夹头25,右夹头25固定在试样支架28上,试样33通过左夹头38与右夹头25分别固定于试样拉头39及试样支架28上,试样拉头39上设有位移传感器36;位移传感器36和拉力传感器13分别与控制计算机49连接,拉伸电机6通过拉伸电机控制器44与控制计算机49连接;The stretching device includes a stretching motor 6, a stretching reducer 7, a front guide rail 9, a lead screw 10, a stretching table 11, a tension sensor support 12, a tension sensor 13, a right chuck 25, a sample support 28, a displacement Sensor 36, linear bearing 37, left chuck 38, sample puller 39, rear guide rail 40; stretching table 11, sample puller 39, sample support 28 are placed on the stretching support 8 in sequence from left to right, The front guide rail 9 and the rear guide rail 40 are respectively located on both sides of the tensile support 8, and one end of the front guide rail 9 and the rear guide rail 40 is fixed on the tensile support 8, and the other end is fixed on the sample support 28, and the sample support 28 is fixed on the tensile support 8. On the extension bracket 8; both sides of the stretching platform 11 and the sample slider 39 are provided with linear bearings 37, and the stretching platform 11 and the sample slider 39 pass through the front guide rail 9 and the rear rail 9 in turn through the linear bearings 37 on both sides. Guide rail 40; stretching reducer 7 is fixed on the stretching bracket 8, stretching motor 6 is connected with the input end of stretching reducer 7, the output end of stretching reducer 7 is connected with leading screw 10, leading screw 10 is connected with pulling Stretching platform 11 is connected, tension sensor support 12 is installed on the stretching platform 11, tension sensor 13 is installed on the tension sensor support 12, and the other end of tension sensor 13 is connected with sample slider 39; Collet 38, the position corresponding to left collet 38 is provided with right collet 25, and right collet 25 is fixed on the sample holder 28, and sample 33 is respectively fixed on the sample puller by left collet 38 and right collet 25. On the head 39 and the sample support 28, the sample pulling head 39 is provided with a displacement sensor 36; the displacement sensor 36 and the tension sensor 13 are respectively connected to the control computer 49, and the stretching motor 6 is connected to the control computer 49 through the stretching motor controller 44. connect;
低温测试系统包括制冷喷口42和铂电阻41,制冷喷口42和铂电阻41位于试样33的下方,制冷喷口42通过管道与制冷阀52连接,制冷阀52与制冷控制器53连接,制冷控制器53与控制计算机49连接;铂电阻41与温度变送器Ⅰ50连接,温度变送器Ⅰ50与控制计算机49连接;The low-temperature testing system comprises a cooling spout 42 and a platinum resistor 41, the cooling spout 42 and the platinum resistor 41 are located below the sample 33, the cooling spout 42 is connected to a cooling valve 52 through a pipeline, the cooling valve 52 is connected to a cooling controller 53, and the cooling controller 53 is connected with the control computer 49; the platinum resistor 41 is connected with the temperature transmitter I50, and the temperature transmitter I50 is connected with the control computer 49;
高温测试系统包括电源连接端Ⅰ55、电源连接端Ⅱ56、高温热电偶43,试样拉头39和试样支架28分别通过电源连接端Ⅰ55和电源连接端Ⅱ56与加热电源控制器57连接,加热电源控制器57与控制计算机49连接;试样33下方设有高温热电偶43,高温热电偶43与温度变送器Ⅱ51连接,温度变送器Ⅱ51与控制计算机49连接,控制计算机49通过数据接口48与上位机60连接。The high temperature test system includes power connection terminal I55, power connection terminal II56, high temperature thermocouple 43, sample puller 39 and sample holder 28 are respectively connected to heating power supply controller 57 through power supply connection terminal I55 and power supply connection terminal II56, heating power supply The controller 57 is connected to the control computer 49; a high temperature thermocouple 43 is arranged under the sample 33, the high temperature thermocouple 43 is connected to the temperature transmitter II 51, the temperature transmitter II 51 is connected to the control computer 49, and the control computer 49 is connected to the data interface 48 Connect with host computer 60.
优选的,本实用新型所述显微测试系统包括显微镜光源14、孔径光栏15、滤色片16、显微镜底座17、显微镜光路系统18、显微镜连杆19、显微镜调焦电机20、显微镜减速器21、高速照相机22、显微镜23、物镜34,显微镜底座17固定在底座5上,显微镜底座17侧安装滤色片16,滤色片16连接孔径光栏15,孔径光栏15连接显微镜光源14;显微镜光路系统18固定在显微镜底座17上,显微镜光路系统18一侧设有显微镜连杆19,显微镜连杆19连接显微镜23,显微镜23上面安装高速照相机22,显微镜23下面安装物镜34;显微镜光路系统18上端安装显微镜减速器21、显微镜减速器21连接显微镜调焦电机20;高速照相机22的图像通道与图像传送器54连接,图像传送器54与上位机60连接,高速照相机22的拍摄控制接口与控制计算机49连接,显微镜调焦电机20显微镜调焦电机控制器45与控制计算机49连接。Preferably, the microscopic test system described in the present utility model includes a microscope light source 14, an aperture stop 15, a color filter 16, a microscope base 17, a microscope optical path system 18, a microscope connecting rod 19, a microscope focusing motor 20, and a microscope reducer 21. A high-speed camera 22, a microscope 23, an objective lens 34, a microscope base 17 is fixed on the base 5, a color filter 16 is installed on the side of the microscope base 17, the color filter 16 is connected to the aperture stop 15, and the aperture stop 15 is connected to the microscope light source 14; The microscope optical path system 18 is fixed on the microscope base 17, and one side of the microscope optical path system 18 is provided with a microscope connecting rod 19, and the microscope connecting rod 19 is connected to the microscope 23, a high-speed camera 22 is installed on the microscope 23, and an objective lens 34 is installed below the microscope 23; the microscope optical path system The microscope reducer 21 is installed on the 18 upper end, and the microscope reducer 21 is connected to the microscope focusing motor 20; the image channel of the high-speed camera 22 is connected with the image transmitter 54, and the image transmitter 54 is connected with the upper computer 60, and the shooting control interface of the high-speed camera 22 is connected with the The control computer 49 is connected, and the microscope focus motor controller 45 of the microscope focus motor 20 is connected with the control computer 49.
优选的,在试样支架28与前导轨9、后导轨40结合部位设有绝缘套30,前导轨9、后导轨40均通过导轨固定螺栓26固定,试样支架28与拉伸支架8之间有绝缘片29。Preferably, an insulating sleeve 30 is provided at the junction of the sample holder 28 and the front guide rail 9 and the rear guide rail 40, the front guide rail 9 and the rear guide rail 40 are all fixed by the guide rail fixing bolts 26, and between the sample holder 28 and the tensile support 8 An insulating sheet 29 is arranged.
优选的,本实用新型所述装置还包括箱体1,箱体1固定在底座5上,拉伸装置、显微测试系统均置于箱体1内部;箱体1设有拉伸观察窗2与密闭盖4,密闭盖4上设有试样观察窗3,试样观察窗3位于试样33的正上方,拉伸观察窗2位于拉伸台11的上方,关闭密闭盖4后底座5、箱体1、密闭盖4构成密闭环境;箱体1上设有气体输入口58,气体输入口58处设有电磁阀59,电磁阀59与控制计算机49连接。Preferably, the device described in the utility model also includes a box body 1, the box body 1 is fixed on the base 5, and the stretching device and the microscopic testing system are all placed inside the box body 1; the box body 1 is provided with a stretching observation window 2 With the airtight cover 4, the airtight cover 4 is provided with a sample observation window 3, the sample observation window 3 is located directly above the sample 33, the stretch observation window 2 is located above the stretching table 11, and the base 5 is closed after the airtight cover 4 , casing 1, airtight cover 4 constitute airtight environment; Casing body 1 is provided with gas input port 58, and gas input port 58 place is provided with solenoid valve 59, and solenoid valve 59 is connected with control computer 49.
优选的,本实用新型所述十字滑台包括X轴导轨35、Y轴导轨31、X轴电机27、Y轴电机32,Y轴导轨31位于X轴导轨35上,X轴导轨35位于底座5上;X轴导轨35一端通过减速机与X轴电机27连接,Y轴导轨31的一端通过减速机与Y轴电机32连接,X轴电机27、Y轴电机32分别通过X轴电机控制器46、Y轴电机控制器47与控制计算机49连接,控制计算机49通过数据接口48与上位机60连接。Preferably, the cross slide table described in the utility model includes an X-axis guide rail 35, a Y-axis guide rail 31, an X-axis motor 27, and a Y-axis motor 32. The Y-axis guide rail 31 is located on the X-axis guide rail 35, and the X-axis guide rail 35 is located on the base 5. Top; one end of the X-axis guide rail 35 is connected to the X-axis motor 27 through a reducer, one end of the Y-axis guide rail 31 is connected to the Y-axis motor 32 through a reducer, and the X-axis motor 27 and the Y-axis motor 32 are respectively connected through the X-axis motor controller 46 , The Y-axis motor controller 47 is connected with the control computer 49 , and the control computer 49 is connected with the upper computer 60 through the data interface 48 .
本实用新型的工作过程:在程序控制下拉伸电机控制器44控制拉伸电机6转动,转动输入拉伸减速器7减速后带动丝杠10转动,丝杠10转动经拉伸台11内螺母转换为拉伸台11沿前导轨9与后导轨40的直线运动;从而在拉伸电机6带动下试样拉头39与试样支架28产生相对位移试样33被拉伸;试样所受拉力由拉力传感器13检测并传送到控制计算机49,控制计算机49通过数据接口48上传到上位机60存储分析;试样变形量由安装于试样拉头39及试样支架28之间的位移传感器36检测并传送到控制计算机49、控制计算机49通过数据接口48上传到上位机60存储分析;控制计算机49依据程序控制拉伸电机6通过拉伸装置对试样进行拉伸,为此本装置可进行恒应力、恒应变、周期应力、周期应变等应力加载实验方式。The working process of the present utility model: under the control of the program, the stretching motor controller 44 controls the stretching motor 6 to rotate, and after the rotation is input to the stretching reducer 7 to decelerate, the lead screw 10 is driven to rotate, and the lead screw 10 rotates through the inner nut of the stretching table 11 Converted to the linear movement of the stretching table 11 along the front guide rail 9 and the rear guide rail 40; thus, driven by the stretching motor 6, the relative displacement of the sample slider 39 and the sample holder 28 is generated; the sample 33 is stretched; The tension is detected by the tension sensor 13 and transmitted to the control computer 49, and the control computer 49 is uploaded to the upper computer 60 for storage and analysis through the data interface 48; 36 is detected and transmitted to the control computer 49, and the control computer 49 is uploaded to the upper computer 60 for storage and analysis through the data interface 48; the control computer 49 controls the stretching motor 6 to stretch the sample through the stretching device according to the program, for which this device can Perform stress loading experiments such as constant stress, constant strain, cyclic stress, and cyclic strain.
本实用新型的有益效果:The beneficial effects of the utility model:
(1)本实用新型所述装置实现不同材料体系在不同温度、环境气氛、应力状态下的应力—应变特性的微观组织观察,获得材料金相显微组织的连续变化图谱,其微观组织与材料应力—应变曲线一一对应。(1) The device described in the utility model realizes the microstructure observation of the stress-strain characteristics of different material systems under different temperatures, ambient atmospheres, and stress states, and obtains a continuous change map of the metallographic microstructure of the material, and its microstructure and material stress- The strain curves correspond one-to-one.
(2)本实用新型所述装置所获得数据通过图像分析系统分析处理,条件有利于直观、准确、全面、快速分析金属微观组织在受力状态下的变化规律,进而结合材料力学理论、腐蚀理论和有限元模拟方法研究材料的性能、微观结构与在工况条件下的联系,因此具有很高的实用推广价值和重大的科学研究价值。(2) The data obtained by the device described in the utility model is analyzed and processed by the image analysis system, and the conditions are conducive to intuitive, accurate, comprehensive and rapid analysis of the change law of the metal microstructure under stress, and then combined with the theory of material mechanics and corrosion theory And finite element simulation method to study the relationship between material performance, microstructure and working conditions, so it has high practical promotion value and great scientific research value.
(3)本实用新型所述装置的应用必将导致传统材料力学研究方法由顺序迭代法更新为并行处理,以实验数据的量变引发材料力学性能研究的质变。(3) The application of the device described in this utility model will inevitably lead to the update of the traditional material mechanics research method from the sequential iterative method to parallel processing, and the quantitative change of the experimental data will lead to a qualitative change in the research of the mechanical properties of the material.
附图说明Description of drawings
图1为本实用新型所述实验装置的外观结构示意图Ⅰ;Fig. 1 is the appearance structural representation I of experimental device described in the utility model;
图2为本实用新型所述实验装置的外观结构示意图Ⅱ;Fig. 2 is the appearance structure schematic diagram II of the experimental device described in the utility model;
图3为本实用新型所述实验装置的主体结构示意图Ⅰ;Fig. 3 is the main structure schematic diagram I of the experimental device described in the utility model;
图4为本实用新型所述实验装置的主体结构示意图Ⅱ;Fig. 4 is the main structure schematic diagram II of the experimental device described in the utility model;
图5为本实用新型所述实验装置的系统构成示意图;Fig. 5 is the system composition schematic diagram of experimental device described in the utility model;
图6为本实用新型所述实验装置的拉力传感器、试样加热结构示意图。Fig. 6 is a schematic diagram of the tension sensor and sample heating structure of the experimental device of the present invention.
图7为本实用新型所述实验装置的拉力传感器示意图;Fig. 7 is the schematic diagram of the tension sensor of the experimental device described in the utility model;
图8为本实用新型所述实验装置的测温、冷却装置构成示意图;Fig. 8 is a schematic diagram of the composition of the temperature measuring and cooling device of the experimental device described in the utility model;
图9为本实用新型所述实验装置的实施例的金相图。Fig. 9 is a metallographic diagram of an embodiment of the experimental device of the present invention.
图中:1-箱体;2-拉伸观察窗;3-试样观察窗;4-密闭盖;5-底座;6-拉伸电机;7-拉伸减速器;8-拉伸支架;9-前导轨;10-丝杠;11-拉伸台;12-拉力传感器支架;13-拉力传感器;14-显微镜光源;15-孔径光栏;16-滤色片;17-显微镜底座;18-显微镜光路系统;19-显微镜连杆;20-显微镜调焦电机;21-显微镜减速器;22-高速照相机;23-显微镜;24-试样固定螺栓;25-右夹头;26-导轨固定螺栓;27-X轴电机;28-试样支架;29-绝缘片;30-绝缘套;31-Y轴导轨;32-Y轴电机;33-试样;34-物镜;35-X轴导轨;36-位移传感器;37-直线轴承;38-左夹头;39-试样拉头;40-后导轨;41-铂电阻;42-制冷喷口;43-高温热电偶;44-拉伸电机控制器;45-显微镜调焦电机控制器;46-X轴电机控制器;47-Y轴电机控制器;48-数据接口;49-控制计算机;50-温度变送器Ⅰ;51-温度变送器Ⅱ;52-制冷阀;53-制冷控制器;54-图像传送器;55-电源连接端Ⅰ;56-电源连接端Ⅱ;57-加热电源控制器;58-气体输入口;59-电磁阀;60-上位机。In the figure: 1-box; 2-stretching observation window; 3-sample observation window; 4-closed cover; 5-base; 6-stretching motor; 7-stretching reducer; 8-stretching bracket; 9-front guide rail; 10-screw; 11-stretch table; 12-tension sensor bracket; 13-tension sensor; 14-microscope light source; 15-aperture diaphragm; 16-color filter; 17-microscope base; 18 -microscope optical path system; 19-microscope connecting rod; 20-microscope focus motor; 21-microscope reducer; 22-high-speed camera; 23-microscope; 24-sample fixing bolt; 25-right chuck; Bolt; 27-X-axis motor; 28-sample holder; 29-insulation sheet; 30-insulation sleeve; 31-Y-axis guide rail; 32-Y-axis motor; 33-sample; 34-objective lens; 35-X-axis guide rail ;36-displacement sensor; 37-linear bearing; 38-left chuck; 39-sample puller; 40-rear guide rail; 41-platinum resistance; Controller; 45-microscope focus motor controller; 46-X-axis motor controller; 47-Y-axis motor controller; 48-data interface; 49-control computer; 50-temperature transmitter Ⅰ; 51-temperature variable 52-Refrigeration valve; 53-Refrigeration controller; 54-Image transmitter; 55-Power connection Ⅰ; 56-Power connection Ⅱ; 57-Heating power controller; 58-Gas input port; 59- Solenoid valve; 60-upper computer.
具体实施方式Detailed ways
下面结合附图和具体实施例对本实用新型作进一步详细说明,但本实用新型的保护范围并不限于所述内容。The utility model will be described in further detail below in conjunction with the accompanying drawings and specific embodiments, but the protection scope of the utility model is not limited to the content described.
实施例1Example 1
一种显微组织力学性能表征实验装置(如图1~8所示),包括底座5、拉伸装置、显微测试系统、十字滑台、低温测试系统、高温测试系统、控制计算机49、上位机60,底座5上设有十字滑台,十字滑台设有拉伸支架8,拉伸装置安装在拉伸支架8上,显微测试系统位于试样33的正上方;控制计算机49通过数据接口48与上位机60连接;An experimental device for characterization of mechanical properties of microstructure (as shown in Figures 1 to 8), comprising a base 5, a tensile device, a microscopic testing system, a cross slide, a low temperature testing system, a high temperature testing system, a control computer 49, an upper machine 60, the base 5 is provided with a cross slide, the cross slide is provided with a stretching bracket 8, the stretching device is installed on the stretching bracket 8, and the microscopic testing system is located directly above the sample 33; the control computer 49 passes the data Interface 48 is connected with host computer 60;
所述拉伸装置包括拉伸电机6、拉伸减速器7、前导轨9、丝杠10、拉伸台11、拉力传感器支架12、拉力传感器13、试样支架28、位移传感器36、直线轴承37、左夹头38、试样拉头39、后导轨40;拉伸台11、试样拉头39、试样支架28从左到右依次置于拉伸支架8上,前导轨9和后导轨40分别位于拉伸支架8的两侧,前导轨9和后导轨40一端固定在拉伸支架8上,另一端固定在试样支架28上,试样支架28固定在拉伸支架8上;拉伸台11、试样拉头39的两侧均设有直线轴承37,拉伸台11和试样拉头39通过两侧的直线轴承37依次穿过前导轨9和后导轨40;拉伸减速器7固定在拉伸支架8上,拉伸电机6与拉伸减速器7的输入端连接,拉伸减速器7的输出端与丝杠10连接,丝杠10与拉伸台11连接,拉伸台11上安装有拉力传感器支架12,拉力传感器支架12上安装拉力传感器13,拉力传感器13的另一端与试样拉头39连接;试样拉头39上固定有左夹头38,与左夹头38对应的位置设有右夹头25,右夹头25固定在试样支架28上,试样33通过左夹头38与右夹头25分别固定于试样拉头39及试样支架28上(试样33与左夹头38、右夹头25之间通过二颗固定螺栓24紧固连接,使其在实验过程中不发生滑动),试样拉头39上设有位移传感器36;位移传感器36和拉力传感器13分别与控制计算机49连接,拉伸电机6通过拉伸电机控制器44与控制计算机49连接。The stretching device includes a stretching motor 6, a stretching reducer 7, a front guide rail 9, a screw 10, a stretching table 11, a tension sensor support 12, a tension sensor 13, a sample support 28, a displacement sensor 36, a linear bearing 37. Left chuck 38, sample puller 39, rear guide rail 40; stretching table 11, sample puller 39, sample support 28 are placed on the stretching support 8 in sequence from left to right, front guide rail 9 and rear The guide rails 40 are respectively located on both sides of the tensile support 8, one end of the front guide rail 9 and the rear guide rail 40 are fixed on the tensile support 8, the other end is fixed on the sample support 28, and the sample support 28 is fixed on the tensile support 8; Both sides of the stretching table 11 and the sample puller 39 are provided with linear bearings 37, and the stretching table 11 and the sample puller 39 pass through the front guide rail 9 and the rear guide rail 40 sequentially through the linear bearings 37 on both sides; The speed reducer 7 is fixed on the stretching bracket 8, the stretching motor 6 is connected with the input end of the stretch speed reducer 7, the output end of the stretch speed reducer 7 is connected with the leading screw 10, and the leading screw 10 is connected with the stretching table 11, A tension sensor support 12 is installed on the stretching table 11, and a tension sensor 13 is installed on the tension sensor support 12, and the other end of the tension sensor 13 is connected with the sample pulling head 39; the left chuck 38 is fixed on the sample pulling head 39, and The position corresponding to the left chuck 38 is provided with a right chuck 25, and the right chuck 25 is fixed on the sample holder 28, and the sample 33 is respectively fixed on the sample slider 39 and the sample by the left chuck 38 and the right chuck 25. On the bracket 28 (the sample 33 is fastened to the left chuck 38 and the right chuck 25 through two fixing bolts 24 so that it does not slip during the experiment), the sample slider 39 is provided with a displacement sensor 36; the displacement sensor 36 and the tension sensor 13 are respectively connected to the control computer 49, and the stretching motor 6 is connected to the control computer 49 through the stretching motor controller 44.
本实施例所述位移传感器36测量实验过程中试样变形量,位移传感器36输出信号接入控制计算机49,控制计算机49通过数据接口48将位移信号上传到上位机60;位移传感器36测量范围20毫米,测量精度万分之一毫米。Displacement sensor 36 described in this embodiment measures the amount of sample deformation in the experimental process, and the output signal of displacement sensor 36 is connected to control computer 49, and control computer 49 uploads the displacement signal to host computer 60 through data interface 48; displacement sensor 36 measurement range 20 mm, the measurement accuracy is one ten-thousandth of a millimeter.
本实施例所述拉力传感器13用于测量施加于试样的拉力,传感器13输出信号接入控制计算机49、控制计算机49通过数据接口48上传致上位机60;更换不同量程拉力传感器后,拉力测量范围10—5000N,精度0.1%。The tensile sensor 13 described in this embodiment is used to measure the tensile force applied to the sample. The output signal of the sensor 13 is connected to the control computer 49, and the control computer 49 is sent to the host computer 60 through the data interface 48; Range 10-5000N, accuracy 0.1%.
在程序控制下拉伸电机控制器44控制拉伸电机6转动,转动输入伸减速器7减速后带动丝杠10转动,丝杠10转动经拉伸台11内螺母转换为拉伸台11沿前导轨9与后导轨40的直线运动;在拉伸电机6带动下试样拉头39与试样支架28产生相对位移试样33被拉伸;试样所受拉力由拉力传感器13检测并传送到控制计算机49、控制计算机49通过数据接口48上传到上位机60存储分析;试样变形量由安装于试样拉头39及试样支架28之间的位移传感器36检测并传送到控制计算机49、控制计算机49通过数据接口48上传到上位机60存储分析。Under program control, the stretching motor controller 44 controls the stretching motor 6 to rotate, and the rotation is input to the extension reducer 7 to drive the lead screw 10 to rotate after being decelerated. The linear motion of the guide rail 9 and the rear guide rail 40; driven by the stretching motor 6, the relative displacement of the sample slider 39 and the sample holder 28 is generated; the sample 33 is stretched; the tensile force on the sample is detected by the tension sensor 13 and transmitted to the The control computer 49 and the control computer 49 are uploaded to the upper computer 60 for storage and analysis through the data interface 48; The control computer 49 uploads to the upper computer 60 through the data interface 48 for storage and analysis.
本实施例所述低温测试系统包括制冷喷口42和铂电阻41,制冷喷口42和铂电阻41位于试样33的下方,制冷喷口42通过管道与制冷阀52连接,制冷阀52与制冷控制器53连接,制冷控制器53与控制计算机49连接;铂电阻41与温度变送器Ⅰ50连接,温度变送器Ⅰ50与控制计算机49连接。The low-temperature test system described in this embodiment includes a cooling nozzle 42 and a platinum resistor 41, the cooling nozzle 42 and the platinum resistor 41 are located below the sample 33, the cooling nozzle 42 is connected to the refrigeration valve 52 through a pipeline, and the refrigeration valve 52 is connected to the refrigeration controller 53 Connection, the refrigeration controller 53 is connected with the control computer 49; the platinum resistor 41 is connected with the temperature transmitter I50, and the temperature transmitter I50 is connected with the control computer 49.
使用过程中:制冷阀52输入端连接制冷剂容器常用制冷剂为液氮或干冰干冰或液氮,制冷阀52由制冷控制器53控制,铂电阻41将温度信号传送至温度变送器Ⅱ51、温度变送器Ⅱ51输出信号传送到控制计算机49、控制计算机49依据实验所设定温度值控制制冷控制器53,制冷控制器53控制制冷阀52开启状态从而改变制冷喷口42制冷剂输出量控制试样33温度;控制计算机49通过数据接口48连接上位机60获取实验温度值并上传试样33温度数据;从而实现试样测试温度控制,控制温度范围-196°C—RT。During use: the input end of the refrigeration valve 52 is connected to the refrigerant container. The commonly used refrigerant is liquid nitrogen or dry ice dry ice or liquid nitrogen. The refrigeration valve 52 is controlled by the refrigeration controller 53, and the platinum resistor 41 transmits the temperature signal to the temperature transmitter II 51, The output signal of the temperature transmitter II51 is transmitted to the control computer 49, and the control computer 49 controls the refrigeration controller 53 according to the set temperature value of the experiment, and the refrigeration controller 53 controls the opening state of the refrigeration valve 52 to change the refrigerant output of the refrigeration nozzle 42. The temperature of the sample 33; the control computer 49 is connected to the upper computer 60 through the data interface 48 to obtain the experimental temperature value and upload the temperature data of the sample 33; thereby realizing the temperature control of the sample test, the control temperature range is -196 ° C-RT.
本实施例所述高温测试系统包括电源连接端Ⅰ55、电源连接端Ⅱ56、高温热电偶43,试样拉头39和试样支架28分别通过电源连接端Ⅰ55和电源连接端Ⅱ56与加热电源控制器57连接,加热电源控制器57与控制计算机49连接;试样33下方设有高温热电偶43,高温热电偶43与温度变送器Ⅱ51连接,温度变送器Ⅱ51与控制计算机49连接,控制计算机49通过数据接口48与上位机60连接。The high-temperature testing system described in this embodiment includes a power connection terminal I55, a power connection terminal II56, and a high-temperature thermocouple 43. The sample puller 39 and the sample support 28 communicate with the heating power supply controller through the power supply connection terminal I55 and the power supply connection terminal II56 respectively. 57 connection, the heating power controller 57 is connected with the control computer 49; a high temperature thermocouple 43 is arranged under the sample 33, the high temperature thermocouple 43 is connected with the temperature transmitter II 51, the temperature transmitter II 51 is connected with the control computer 49, and the control computer 49 is connected with the host computer 60 through the data interface 48.
使用过程中:加热电源控制器57输出电压后在试样33上形成电流,试样33在电流的作用下自身发热,在试样33下方安装有高温热电偶43、高温热电偶43将温度信号传送致温度变送器Ⅰ50、温度变送器Ⅰ50输出信号传送到控制计算机49、控制计算机49依据实验所设定温度值输出调节信号到加热电源控制器57调节输入试样33电流大小,从而实现对试样33加热温度的控制;控制计算机49通过数据接口48连接上位机60获取实验温度值并上传试样33温度数据。During use: the heating power supply controller 57 outputs a voltage to form a current on the sample 33, and the sample 33 generates heat by itself under the action of the current, and a high-temperature thermocouple 43 and a high-temperature thermocouple 43 are installed below the sample 33 to transmit the temperature signal Send the temperature transmitter I50, the output signal of the temperature transmitter I50 is sent to the control computer 49, and the control computer 49 outputs the adjustment signal to the heating power controller 57 according to the temperature value set in the experiment to adjust the current of the input sample 33, so as to realize Control of the heating temperature of the sample 33; the control computer 49 is connected to the host computer 60 through the data interface 48 to obtain the experimental temperature value and upload the temperature data of the sample 33.
所有现有的显微测试系统均可以用于本实用新型,作为本实用新型的第二个优选实施例,本实施例所述显微测试系统包括显微镜光源14、孔径光栏15、滤色片16、显微镜底座17、显微镜光路系统18、显微镜连杆19、显微镜调焦电机20、显微镜减速器21、高速照相机22、显微镜23、物镜34,显微镜底座17固定在底座5上,显微镜底座17侧安装滤色片16,滤色片16连接孔径光栏15,孔径光栏15连接显微镜光源14;显微镜光路系统18固定在显微镜底座17上,显微镜光路系统18一侧设有显微镜连杆19,显微镜连杆19连接显微镜23,显微镜23上面安装高速照相机22,显微镜23下面安装物镜34;显微镜光路系统18上端安装显微镜减速器21、显微镜减速器21连接显微镜调焦电机20;高速照相机22的图像通道与图像传送器54连接,图像传送器54与上位机60连接,高速照相机22的拍摄控制接口与控制计算机49连接,显微镜调焦电机20显微镜调焦电机控制器45与控制计算机49连接。高速照相机22获得样品图像后将图像信号通过图像传送器54传送至上位机60,高速照相机22控制信号由控制计算机49控制,控制计算机49通过数据接口48与上位机60连接通讯获得相应的拍摄控制指令。All existing microscopic testing systems can be used for the present utility model, and as the second preferred embodiment of the present utility model, the microscopic testing system described in this embodiment comprises microscope light source 14, aperture stop 15, color filter 16. Microscope base 17, microscope optical path system 18, microscope connecting rod 19, microscope focus motor 20, microscope reducer 21, high-speed camera 22, microscope 23, objective lens 34, microscope base 17 is fixed on base 5, microscope base 17 side Color filter 16 is installed, and color filter 16 connects aperture diaphragm 15, and aperture diaphragm 15 connects microscope light source 14; Microscope optical path system 18 is fixed on the microscope base 17, and microscope optical path system 18 side is provided with microscope connecting rod 19, and microscope Connecting rod 19 connects microscope 23, and high-speed camera 22 is installed above microscope 23, and objective lens 34 is installed below microscope 23; It is connected with the image transmitter 54, the image transmitter 54 is connected with the host computer 60, the shooting control interface of the high-speed camera 22 is connected with the control computer 49, and the microscope focus motor controller 45 of the microscope focus motor 20 is connected with the control computer 49. After the high-speed camera 22 obtains the sample image, the image signal is transmitted to the host computer 60 through the image transmitter 54. The control signal of the high-speed camera 22 is controlled by the control computer 49, and the control computer 49 communicates with the host computer 60 through the data interface 48 to obtain corresponding shooting control. instruction.
显微镜光路系统18通过反射镜将摄照光源反射至物镜23后照射于试样33,显微镜调焦电机20带动显微镜减速器21转动,显微镜减速器21内有螺杆与螺母,在螺杆与螺母作用下显微镜减速器21带动显微镜光路系统18沿显微镜减速器21轴方向移动,从而调整目镜23与试样之间距离,从而完成样品对焦过程;改变显微镜调焦电机20转速可实现对焦过程的粗调与细调过程,显微镜调焦电机20转速范围为0.0028—500转/min。The microscope optical path system 18 reflects the light source to the objective lens 23 through the reflector and then irradiates the sample 33. The microscope focus motor 20 drives the microscope reducer 21 to rotate. There are screws and nuts in the microscope reducer 21. Under the action of the screw and the nut The microscope reducer 21 drives the microscope optical path system 18 to move along the axis of the microscope reducer 21, thereby adjusting the distance between the eyepiece 23 and the sample, thereby completing the sample focusing process; changing the speed of the microscope focusing motor 20 can realize the coarse adjustment and adjustment of the focusing process. During the fine adjustment process, the rotating speed range of the microscope focusing motor 20 is 0.0028-500 rpm.
作为本实用新型的第三个优选实施例:在试样支架28与前导轨9、后导轨40结合部位设有绝缘套30,前导轨9、后导轨40均通过导轨固定螺栓26固定,试样支架28与拉伸支架8之间有绝缘片29。As the third preferred embodiment of the present utility model: an insulating sleeve 30 is provided at the junction of the sample holder 28 and the front guide rail 9 and the rear guide rail 40, and the front guide rail 9 and the rear guide rail 40 are all fixed by guide rail fixing bolts 26, and the sample An insulating sheet 29 is arranged between the support 28 and the tension support 8 .
作为本实用新型的第四个优选实施例:所述装置还包括箱体1,箱体1固定在底座5上,拉伸装置、显微测试系统均置于箱体1内部;箱体1设有拉伸观察窗2与密闭盖4,密闭盖4上设有试样观察窗3,试样观察窗3位于试样33的正上方,拉伸观察窗2位于拉伸台11的上方,关闭密闭盖4后底座5、箱体1、密闭盖4构成密闭环境;箱体1上设有气体输入口58,气体输入口58处设有电磁阀59,电磁阀59与控制计算机49连接。电磁阀59受控制计算机49控制,电磁阀59气体输入端接气源,依据实验条件的不同可实现真空环境、氧化气氛、还原气氛、惰性气氛、混合气氛环境下显微组织拍摄。As the fourth preferred embodiment of the present utility model: the device also includes a box body 1, the box body 1 is fixed on the base 5, and the stretching device and the microscopic testing system are all placed inside the box body 1; There are stretching observation window 2 and airtight cover 4, and the airtight cover 4 is provided with sample observation window 3, and sample observation window 3 is positioned at the top of sample 33, and stretching observation window 2 is positioned at the top of stretching platform 11, closes Airtight cover 4 rear base 5, casing 1, airtight cover 4 constitute airtight environment; Casing body 1 is provided with gas input port 58, and gas input port 58 place is provided with solenoid valve 59, and solenoid valve 59 is connected with control computer 49. The solenoid valve 59 is controlled by the control computer 49, and the gas input terminal of the solenoid valve 59 is connected to the gas source. According to different experimental conditions, microstructure photography can be realized in a vacuum environment, an oxidizing atmosphere, a reducing atmosphere, an inert atmosphere, or a mixed atmosphere.
所有现有的十字滑台均可以用于本实用新型,作为本实用新型的第五个优选实施例,本实施例所述十字滑台包括X轴导轨35、Y轴导轨31、X轴电机27、Y轴电机32,Y轴导轨31位于X轴导轨35上,X轴导轨35位于底座5上;X轴导轨35一端通过减速机与X轴电机27连接,Y轴导轨31的一端通过减速机与Y轴电机32连接,X轴电机27、Y轴电机32分别通过X轴电机控制器46、Y轴电机控制器47与控制计算机49连接,控制计算机49通过数据接口48与上位机60连接;移动距离X轴:0—40mm、Y轴:0—5mm。All existing cross slides can be used in this utility model, as the fifth preferred embodiment of the present utility model, the cross slide described in this embodiment includes X-axis guide rail 35, Y-axis guide rail 31, X-axis motor 27 1. The Y-axis motor 32, the Y-axis guide rail 31 is located on the X-axis guide rail 35, and the X-axis guide rail 35 is located on the base 5; one end of the X-axis guide rail 35 is connected to the X-axis motor 27 through a reducer, and one end of the Y-axis guide rail 31 is passed through a reducer Connected with the Y-axis motor 32, the X-axis motor 27 and the Y-axis motor 32 are respectively connected to the control computer 49 through the X-axis motor controller 46 and the Y-axis motor controller 47, and the control computer 49 is connected to the upper computer 60 through the data interface 48; Moving distance X-axis: 0-40mm, Y-axis: 0-5mm.
Y轴电机32在Y轴电机控制器47驱动下带动螺杆转动,螺杆在螺母作用下带动Y轴滑块沿Y轴导轨31移动,在X轴电机控制器46驱动下带动螺杆转动、螺杆在螺母作用下带动支架8块沿X轴导轨35移动,从而实现支架8上固定试样的X、Y方向移动,保证拉在显微拍摄过程中对拍摄部分的连续拍摄,避免了由于试样变形导致的观察区域离开拍摄视场导致实验失败。The Y-axis motor 32 drives the screw to rotate under the drive of the Y-axis motor controller 47, and the screw drives the Y-axis slide block to move along the Y-axis guide rail 31 under the action of the nut, and drives the screw to rotate under the drive of the X-axis motor controller 46, and the screw moves on the nut. Under the action, the 8 brackets are driven to move along the X-axis guide rail 35, thereby realizing the movement of the fixed sample on the bracket 8 in the X and Y directions, ensuring continuous shooting of the shooting part during the microscopic shooting process, and avoiding the deformation of the sample caused by the deformation of the sample. The observation area leaves the shooting field of view, which leads to the failure of the experiment.
具体使用场景Specific usage scenarios
本实施例所述高速照相机选用德国PCO公司FR800 长时间高速图像记录系统,拍照速度: 800帧/秒,图像:640x480像素,图像存储软件:FR800配套软件;实验材料为黄铜H60,样品长80mm,宽10mm,厚0.5mm, 以半圆缺口获得应力集中区域,于真空下650℃退火10小时,在对应的观察区进行抛光腐蚀,金相显微镜放大倍数200倍,在上位机调焦得到清晰图像;在室温条件下,氢气还原环境中,以0.01 mm/秒的拉伸速率进行拉伸,相机自动摄影频率为800帧/秒,直至样品断裂。获得6000张高像素金相组织图片,同时获得金相组织图片相对应的样品应力—应变值曲线及裂纹扩展路径与特点,如图9所示。The high-speed camera described in this embodiment selects the FR800 long-time high-speed image recording system of the German PCO company, the photographing speed: 800 frames per second, the image: 640x480 pixels, the image storage software: FR800 supporting software; the experimental material is brass H60, and the sample length is 80mm , 10mm wide, 0.5mm thick, the stress concentration area is obtained with a semicircular notch, annealed at 650°C for 10 hours under vacuum, polished and etched in the corresponding observation area, the magnification of the metallographic microscope is 200 times, and a clear image is obtained by focusing on the host computer ; At room temperature, in a hydrogen-reducing environment, stretch at a stretching rate of 0.01 mm/s, and the camera's automatic photography frequency is 800 frames/s until the sample breaks. Obtain 6000 high-resolution metallographic structure pictures, and obtain the corresponding sample stress-strain value curve and crack propagation path and characteristics corresponding to the metallographic structure pictures, as shown in Figure 9.
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Cited By (4)
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CN108489812A (en) * | 2018-04-26 | 2018-09-04 | 昆明理工大学 | A kind of material microstructure mechanical property characterization experimental provision |
CN110672413A (en) * | 2019-09-30 | 2020-01-10 | 山东大学 | Apparatus and method for testing micro-strain-resistance response under tension and compression |
CN111521489A (en) * | 2020-06-02 | 2020-08-11 | 深圳特斯麦特仪器设备有限公司 | Special testing machine for precisely testing anti-breaking force of micro drill bit |
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CN108489812A (en) * | 2018-04-26 | 2018-09-04 | 昆明理工大学 | A kind of material microstructure mechanical property characterization experimental provision |
CN108489812B (en) * | 2018-04-26 | 2024-09-06 | 昆明理工大学 | Material microstructure mechanical property characterization experimental device |
CN110672413A (en) * | 2019-09-30 | 2020-01-10 | 山东大学 | Apparatus and method for testing micro-strain-resistance response under tension and compression |
CN111521489A (en) * | 2020-06-02 | 2020-08-11 | 深圳特斯麦特仪器设备有限公司 | Special testing machine for precisely testing anti-breaking force of micro drill bit |
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