CN208192128U - A kind of MEMS euthermic chip integrating multiple Pt film resistor temperature sensors - Google Patents
A kind of MEMS euthermic chip integrating multiple Pt film resistor temperature sensors Download PDFInfo
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- 239000000758 substrate Substances 0.000 claims abstract description 54
- 238000010438 heat treatment Methods 0.000 claims abstract description 47
- 239000010409 thin film Substances 0.000 claims abstract description 30
- 229910052751 metal Inorganic materials 0.000 claims description 22
- 239000002184 metal Substances 0.000 claims description 22
- 229910021421 monocrystalline silicon Inorganic materials 0.000 claims description 18
- 239000011521 glass Substances 0.000 claims description 7
- 239000000463 material Substances 0.000 claims description 5
- 229910052697 platinum Inorganic materials 0.000 claims description 5
- 229910052804 chromium Inorganic materials 0.000 claims description 3
- 229910052782 aluminium Inorganic materials 0.000 claims 1
- 229910052737 gold Inorganic materials 0.000 claims 1
- 238000009529 body temperature measurement Methods 0.000 abstract description 5
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Substances [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 27
- 238000000034 method Methods 0.000 description 18
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 17
- 229910052710 silicon Inorganic materials 0.000 description 17
- 239000010703 silicon Substances 0.000 description 17
- 239000003571 electronic cigarette Substances 0.000 description 15
- 239000010408 film Substances 0.000 description 12
- 229920002120 photoresistant polymer Polymers 0.000 description 10
- 238000005530 etching Methods 0.000 description 9
- 238000000206 photolithography Methods 0.000 description 9
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 8
- 238000005516 engineering process Methods 0.000 description 7
- 239000007788 liquid Substances 0.000 description 7
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 6
- 238000002360 preparation method Methods 0.000 description 6
- 229910052581 Si3N4 Inorganic materials 0.000 description 5
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 5
- 239000000779 smoke Substances 0.000 description 5
- 239000010936 titanium Substances 0.000 description 5
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical group [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 3
- 238000000889 atomisation Methods 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical group F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 2
- 230000032683 aging Effects 0.000 description 2
- 238000000708 deep reactive-ion etching Methods 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 238000001312 dry etching Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000001459 lithography Methods 0.000 description 2
- 238000004518 low pressure chemical vapour deposition Methods 0.000 description 2
- 238000001755 magnetron sputter deposition Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000000149 penetrating effect Effects 0.000 description 2
- 238000001020 plasma etching Methods 0.000 description 2
- 239000011148 porous material Substances 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- 238000004528 spin coating Methods 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- WGTYBPLFGIVFAS-UHFFFAOYSA-M tetramethylammonium hydroxide Chemical compound [OH-].C[N+](C)(C)C WGTYBPLFGIVFAS-UHFFFAOYSA-M 0.000 description 2
- 229910000619 316 stainless steel Inorganic materials 0.000 description 1
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- 229910001200 Ferrotitanium Inorganic materials 0.000 description 1
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 239000000796 flavoring agent Substances 0.000 description 1
- 235000019634 flavors Nutrition 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229910021645 metal ion Inorganic materials 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 150000004706 metal oxides Chemical class 0.000 description 1
- 239000003921 oil Substances 0.000 description 1
- 238000013021 overheating Methods 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 238000001259 photo etching Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 210000002345 respiratory system Anatomy 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000031070 response to heat Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
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Abstract
本实用新型公开了一种集成多个Pt薄膜电阻温度传感器的MEMS发热芯片,包括:第一衬底(1‑1),其正面有凹型的微腔体(2);微腔体(2)内有贯穿第一衬底(1‑1)的微通孔(3);第二衬底(1‑2),其背面有垂直于其背面的微流道阵列(4),正面中心区域设有垂直于其正面的多孔结构(5),微流道阵列(4)与多孔结构(5)连通;其正面表面有多个Pt薄膜电阻温度传感器(6);第一衬底(1‑1)的正面与第二衬底(1‑2)的背面粘合在一起。本实用新型的发热芯片可以对发热芯片的温度进行实时测量,有效避免了温度测量不准确等问题。
The utility model discloses a MEMS heating chip integrating a plurality of Pt thin film resistance temperature sensors, comprising: a first substrate (1‑1), a concave microcavity (2) on the front; the microcavity (2) There are micro-through holes (3) through the first substrate (1-1) inside; the second substrate (1-2) has a micro-channel array (4) perpendicular to the back of the second substrate, and a central area of the front is set There is a porous structure (5) perpendicular to its front, and the microfluidic channel array (4) communicates with the porous structure (5); there are a plurality of Pt thin film resistance temperature sensors (6) on its front surface; the first substrate (1-1 ) is glued together with the back side of the second substrate (1-2). The heating chip of the utility model can measure the temperature of the heating chip in real time, effectively avoiding problems such as inaccurate temperature measurement.
Description
技术领域technical field
本实用新型涉及电子烟技术领域,特别涉及一种集成多个Pt薄膜电阻温度传感器的MEMS电子烟发热芯片。The utility model relates to the technical field of electronic cigarettes, in particular to a MEMS electronic cigarette heating chip integrating a plurality of Pt thin film resistance temperature sensors.
背景技术Background technique
多数市售电子烟采用发热丝为发热元件,在供电状态下,发热丝通过电热转化产生的高热量加热烟液使之雾化。由于发热丝本身的螺旋形结构及导油件在其上的缠绕方式,使得发热丝在工作时难免出现局部高温的现象。烟液成分、导油材质在电子烟过高的温度下会发生理化性质的变化,可能产生有害裂解产物;高温下,烟液中的一些香气成分会被破坏,影响吸味的丰富性;电子烟温度过高也会使雾化产生的烟气温度过高,可能对呼吸道造成损伤;在烟液供应不足的情况下,过高的温度还会烧焦雾化芯(糊芯),产生糊味,抽吸体验变差。Most commercially available e-cigarettes use a heating wire as a heating element. In the power supply state, the heating wire heats the e-liquid through the high heat generated by electrothermal conversion to atomize it. Due to the spiral structure of the heating wire itself and the way the oil guide is wound on it, it is inevitable that the heating wire will experience local high temperature during operation. E-liquid components and oil-conducting materials will change in physical and chemical properties when the temperature of the e-cigarette is too high, and harmful cracking products may be produced; at high temperatures, some aroma components in the e-liquid will be destroyed, affecting the richness of the flavor; Excessively high smoke temperature will also cause excessively high temperature of the smoke generated by atomization, which may cause damage to the respiratory tract; in the case of insufficient supply of liquid smoke, the excessively high temperature will also burn the atomizing core (fuzzy core), resulting in paste. taste, and the vaping experience becomes worse.
为了改善以上缺陷,近年来,在电子烟中出现了温控技术。该温控技术的基本原理是:电子烟温控芯片通过读取发热丝的电阻,来监控发热丝温度。发热丝本质上是电阻丝,当发热丝温度升高时,发热丝内部金属离子间的碰撞数随之增加,进而金属的电阻率会随温度变化,温度与阻值之间通过电阻温度系数相关联。具体而言,电子烟内置有发热丝阻值检测电路,允许用户根据自身喜好设置发热丝的最高温度。发热丝的基准电阻在室温下测定,以便确定与基准阻值相关的正确温度,然后,通过连续测定电子烟启动时的阻值并应用电阻-温度公式估算出电子烟的工作温度。通过温控芯片的特定算法,调节电池输出功率,使发热丝阻值不超过与用户设定温度相对应的计算值。目前常用的温控发热丝类型主要有镍 200、钛和316不锈钢丝等。该技术的优势是发热丝不会过热、不会干烧、也同时避免了烟液过高蒸发温度下产生的异味和有害物质,大幅提升电子烟的整体体验和使用安全性。In order to improve the above defects, in recent years, temperature control technology has appeared in electronic cigarettes. The basic principle of this temperature control technology is: the electronic cigarette temperature control chip monitors the temperature of the heating wire by reading the resistance of the heating wire. The heating wire is essentially a resistance wire. When the temperature of the heating wire rises, the number of collisions between metal ions inside the heating wire increases, and the resistivity of the metal changes with temperature. The temperature and resistance are related by the temperature coefficient of resistance. couplet. Specifically, the electronic cigarette has a built-in heating wire resistance detection circuit, which allows users to set the maximum temperature of the heating wire according to their own preferences. The reference resistance of the heating wire is measured at room temperature in order to determine the correct temperature related to the reference resistance value, and then, the operating temperature of the electronic cigarette is estimated by continuously measuring the resistance value when the electronic cigarette is started and applying the resistance-temperature formula. Through the specific algorithm of the temperature control chip, the output power of the battery is adjusted so that the resistance of the heating wire does not exceed the calculated value corresponding to the temperature set by the user. At present, the commonly used temperature control heating wire types mainly include nickel 200, titanium and 316 stainless steel wire. The advantage of this technology is that the heating wire will not be overheated or dry-burned, and it also avoids the odor and harmful substances produced by the high evaporation temperature of the e-liquid, which greatly improves the overall experience and safety of e-cigarettes.
目前,应用于电子烟的“温控”实际上是根据金属的电阻值变化换算出对应的温度从而实现所谓的“温控”,其最终还是依据发热丝的电阻变化来实现的。该温控方式不是通过温度传感器来检测温度,而是通过电子烟主机芯片计算发热丝的阻值变化来换算出温度信息,所以实际上目前电子烟的温控是以发热丝的阻值变化为依据的,并不是以实际温度来判断的,结果,温度的准确性直接与阻值的准确性相关,如果芯片检测到的初始阻值不准确,那根据电阻温度系数计算出来的温度就不会准确,如果基数错误,那整个计算结果也是错误的。另外,该温控方式依然存在以下问题:发热丝的电阻值只能反映整体的温度情况,当发生局部温度过高的时候,不能有效监测;其次在使用过程中,发热丝会因为高温老化、氧化等原因导致电阻的变化,会导致测温误差越来越大。At present, the "temperature control" applied to electronic cigarettes is actually based on the change of the resistance value of the metal to convert the corresponding temperature to realize the so-called "temperature control", which is finally realized based on the resistance change of the heating wire. This temperature control method does not use a temperature sensor to detect the temperature, but calculates the temperature information through the electronic cigarette host chip to calculate the change of the resistance of the heating wire. Therefore, in fact, the current temperature control of the electronic cigarette is based on the change of the resistance of the heating wire The basis is not judged by the actual temperature. As a result, the accuracy of the temperature is directly related to the accuracy of the resistance value. If the initial resistance value detected by the chip is not accurate, the temperature calculated according to the temperature coefficient of resistance will not be Exactly, if the base is wrong, the whole calculation is wrong. In addition, this temperature control method still has the following problems: the resistance value of the heating wire can only reflect the overall temperature situation, and when the local temperature is too high, it cannot be effectively monitored; secondly, during use, the heating wire will be aging due to high temperature, Oxidation and other reasons lead to changes in resistance, which will lead to larger and larger temperature measurement errors.
在众多测温方法中,电阻温度传感器(或电阻测温器,通常简称RTD)是最精确的方法之一,而薄膜电阻温度传感器相比传统RTD的优势是高灵敏度和快速热响应,这是因为其较小的尺寸减少了敏感元件和环境之间的热交换。金属铂 (Pt)因对热的良好响应、电阻率与温度之间的高度线性正相关以及在高温下的长期化学稳定性,而成为薄膜电阻温度传感器的首选材料。目前,多数Pt薄膜电阻温度传感器可采用COMS(互补金属氧化物半导体)工艺或MEMS(微机电系统)工艺在硅或金属衬底上制备。特别是在MEMS器件中采用Pt,可允许制造在温度升高时能对塑性变形有高度耐受性的结构。Among the many temperature measurement methods, the resistance temperature sensor (or resistance temperature detector, usually referred to as RTD) is one of the most accurate methods, and the advantage of the thin film resistance temperature sensor compared with the traditional RTD is high sensitivity and fast thermal response, which is Because of its smaller size reduces heat exchange between sensitive components and the environment. Platinum (Pt) metal is the material of choice for thin-film resistive temperature sensors due to its good response to heat, highly linear positive correlation between resistivity and temperature, and long-term chemical stability at high temperatures. At present, most Pt thin-film resistance temperature sensors can be prepared on silicon or metal substrates by CMOS (complementary metal oxide semiconductor) technology or MEMS (micro-electromechanical system) technology. The use of Pt in MEMS devices in particular allows the fabrication of structures that are highly resistant to plastic deformation at elevated temperatures.
实用新型内容Utility model content
本实用新型的目的在于解决现有电子烟温控技术存在的问题,采用先进的 MEMS加工技术,设计出集成温度传感器的MEMS电子烟发热芯片及其制造方法。通过集成温度传感器,实时准确地测量MEMS发热芯片的温度,并配合外部温度控制器,实现MEMS发热芯片的准确控制,使烟液均匀雾化。The purpose of the utility model is to solve the problems existing in the existing electronic cigarette temperature control technology, and adopt advanced MEMS processing technology to design a MEMS electronic cigarette heating chip with integrated temperature sensor and its manufacturing method. Through the integrated temperature sensor, the temperature of the MEMS heating chip can be accurately measured in real time, and with the external temperature controller, the accurate control of the MEMS heating chip can be realized, so that the smoke liquid can be evenly atomized.
本实用新型第一方面公开了一种集成多个Pt薄膜电阻温度传感器的MEMS 发热芯片,包括:The first aspect of the utility model discloses a MEMS heating chip integrating multiple Pt thin film resistance temperature sensors, including:
第一衬底(1-1),呈片状,其正面有凹型的微腔体(2);所述微腔体(2) 内有贯穿所述第一衬底(1-1)的微通孔(3);The first substrate (1-1) is in the shape of a sheet, and has a concave microcavity (2) on its front; the microcavity (2) has a microscopic cavity penetrating through the first substrate (1-1). through hole (3);
第二衬底(1-2),呈片状,其背面有垂直于其背面的微流道阵列(4),正面中心区域设有垂直于其正面的多孔结构(5),所述微流道阵列(4)与多孔结构 (5)连通;其正面表面有多个Pt薄膜电阻温度传感器(6);The second substrate (1-2), in sheet shape, has a microfluidic channel array (4) perpendicular to its backside on its back side, and a porous structure (5) perpendicular to its front side is provided in the front central area, and the microfluidic The channel array (4) communicates with the porous structure (5); there are multiple Pt thin film resistance temperature sensors (6) on its front surface;
所述第一衬底(1-1)的正面与所述第二衬底(1-2)的背面粘合在一起。The front side of the first substrate (1-1) is glued together with the back side of the second substrate (1-2).
优选地,所述微腔体(2)的深度为1毫米至5毫米;所述微通孔(3)的直径为500微米至1毫米。Preferably, the depth of the microcavity (2) is 1 mm to 5 mm; the diameter of the micro through hole (3) is 500 microns to 1 mm.
优选地,所述第二衬底(1-2)的正面有金属薄膜,所述金属薄膜的厚度为 200~500nm;所溅射的金属薄膜材料为Ti/Pt或Cr/Pt中的一种或几种。Preferably, there is a metal film on the front side of the second substrate (1-2), and the thickness of the metal film is 200-500nm; the sputtered metal film material is one of Ti/Pt or Cr/Pt or several.
优选地,所述微流道阵列(4)的微流道的直径为10微米至500微米,所述微流道的深度为所述第二衬底(1-2)高度的1/2~3/4。Preferably, the diameter of the micro-channels of the micro-channel array (4) is 10 microns to 500 microns, and the depth of the micro-channels is 1/2 to 1/2 of the height of the second substrate (1-2). 3/4.
优选地,所述多孔结构(5)的孔径为100纳米至1000纳米。Preferably, the pore diameter of the porous structure (5) is 100 nm to 1000 nm.
优选地,所述第一衬底为玻璃或高阻单晶硅制成,所述高阻单晶硅的电阻率大于10Ω·cm。Preferably, the first substrate is made of glass or high-resistance single-crystal silicon, and the resistivity of the high-resistance single-crystal silicon is greater than 10Ω·cm.
优选地,所述第二衬底为低阻单晶硅制成,所述低阻单晶硅的电阻率小于 0.01Ω·cm。Preferably, the second substrate is made of low-resistance single-crystal silicon, and the resistivity of the low-resistance single-crystal silicon is less than 0.01Ω·cm.
本实用新型第二发明公开了一种集成多个Pt薄膜电阻温度传感器的MEMS 发热芯片的制备方法,包括以下步骤:The second invention of the utility model discloses a method for preparing a MEMS heating chip integrating a plurality of Pt thin film resistance temperature sensors, comprising the following steps:
第一衬底(1-1)的制备:Preparation of the first substrate (1-1):
(1)在玻璃片或电阻率大于10Ω·cm的高阻单晶硅片的正面光刻形成微腔体图形,然后采用腐蚀溶液腐蚀出微腔体(2);(1) Photolithographically form a microcavity pattern on the front surface of a glass sheet or a high-resistance single crystal silicon wafer with a resistivity greater than 10Ω cm, and then use an etching solution to etch the microcavity (2);
(2)对步骤(1)所得到的玻璃片或高阻单晶硅片背面进行光刻,然后采用腐蚀溶液腐蚀出贯穿所述的玻璃片或高阻单晶硅片的微通孔(3);即得到所述的第一衬底(1-1);(2) photolithography is carried out to the back side of the glass sheet or the high-resistance monocrystalline silicon wafer obtained in step (1), and then adopt the etching solution to corrode the micro-vias (3 ); That is, obtain the first substrate (1-1);
第二衬底(1-2)的制备:Preparation of the second substrate (1-2):
(a)在电阻率小于0.01Ω·cm的低电阻率的硅片的背面光刻形成微流道阵列图形;(a) photoetching the back of a silicon wafer with a low resistivity of less than 0.01Ω·cm to form a microchannel array pattern;
(b)采用深反应离子刻蚀工艺对步骤(a)的低电阻率硅片的背面进行刻蚀,形成微流道阵列(4);(b) Etching the back side of the low-resistivity silicon wafer in step (a) by using a deep reactive ion etching process to form a microchannel array (4);
(c)采用低压化学气相沉积工艺对步骤(b)所得到的低电阻率硅片的正面沉积一层氮化硅;(c) using a low-pressure chemical vapor deposition process to deposit a layer of silicon nitride on the front side of the low-resistivity silicon wafer obtained in step (b);
(d)对步骤(c)所得到的低电阻率硅片的正面进行光刻,采用反应离子刻蚀工艺去除中部裸露的氮化硅层;(d) performing photolithography on the front side of the low-resistivity silicon wafer obtained in step (c), and removing the exposed silicon nitride layer in the middle by a reactive ion etching process;
(e)采用电化学腐蚀工艺对步骤(d)所得到的低电阻率硅片的正面腐蚀出多孔结构(5),使多孔结构与背面的微流道阵列连通;(e) using an electrochemical etching process to corrode a porous structure (5) on the front side of the low-resistivity silicon wafer obtained in step (d), so that the porous structure communicates with the microchannel array on the back;
(f)对步骤(e)所得到的低电阻率硅片在正面光刻,磁控溅射沉积形成金属薄膜;(f) photolithography on the front side of the low-resistivity silicon wafer obtained in step (e), and magnetron sputtering deposition to form a metal film;
(g)在步骤(f)所得到的溅射金属薄膜的硅片正面进行旋涂光刻胶光刻,形成温度传感器图形;(g) carrying out spin-coating photoresist photolithography on the front side of the silicon wafer of the sputtered metal thin film obtained in step (f), forming a temperature sensor pattern;
(h)采用干法蚀刻步骤(g)所暴露的金属薄膜,留下所需金属薄膜图形;(h) dry etching the metal film exposed in step (g), leaving the desired metal film pattern;
(i)用丙酮除去步骤(h)表面所残留的光刻胶,;(i) remove the remaining photoresist on the surface of step (h) with acetone;
(j)在(i)中除去光刻胶的硅片正面表面溅射氧化铝层;(j) sputtering an aluminum oxide layer on the front surface of the silicon wafer from which the photoresist was removed in (i);
(K)在(j)所述氧化铝层表面再次旋涂光刻胶光刻并采用干法蚀刻暴露的氧化铝层;(K) Spin-coat photoresist photolithography again on the surface of the aluminum oxide layer described in (j) and dry etch the exposed aluminum oxide layer;
(l)用丙酮除去(k)残留的光刻胶后,即为所述第二衬底(1-2)(l) After removing (k) residual photoresist with acetone, it is the second substrate (1-2)
集成多个Pt薄膜电阻温度传感器的MEMS发热芯片的制备:Preparation of MEMS heating chip integrating multiple Pt thin film resistance temperature sensors:
(甲)将所述第一衬底(1-1)的正面与所述第二衬底(1-2)的背面紧密接触,通过健合工艺粘合在一起;(A) The front side of the first substrate (1-1) is in close contact with the back side of the second substrate (1-2), and bonded together by bonding process;
(乙)采用划片机将步骤(甲)得到的芯片进行划片;(B) using a dicing machine to scribe the chip obtained in step (a);
(丙)将步骤(乙)得到的芯片划片的第二衬底正面用银浆料粘结导线后高温烧结后自然冷却至室温,即得到所述的集成多个Pt薄膜电阻温度传感器的 MEMS发热芯片。(c) The front side of the second substrate of the chip dicing obtained in step (b) is bonded to the wire with silver paste, then sintered at a high temperature, and then naturally cooled to room temperature to obtain the MEMS integrating multiple Pt thin film resistance temperature sensors. Heat chip.
优选地,步骤(1)或(2)所述的腐蚀液,其中玻璃片的腐蚀液为氢氟酸溶液,高阻单晶硅片的腐蚀液为氢氧化钾溶液或四甲基氢氧化铵溶液之一。Preferably, the etching solution described in step (1) or (2), wherein the etching solution for the glass sheet is hydrofluoric acid solution, and the etching solution for the high-resistance single crystal silicon wafer is potassium hydroxide solution or tetramethylammonium hydroxide One of the solutions.
优选地,步骤(f)所溅射的金属薄膜材料为Ti/Pt或Cr/Pt中的一种或几种。Preferably, the material of the metal thin film sputtered in step (f) is one or more of Ti/Pt or Cr/Pt.
优选地,步骤(丙)所述的高温为300~700℃,烧结时间为10~20分钟。Preferably, the high temperature in step (c) is 300-700° C., and the sintering time is 10-20 minutes.
本实用新型的有益结果:Beneficial results of the utility model:
(1)本实用新型采用集成多个Pt薄膜电阻温度传感器的MEMS发热芯片对电子烟发热芯片的温度进行实时测量,温度测量准确,传感器寿命长、工作可靠,有效避免了现有电子烟发热体温度测量不准确、发热体老化导致测温电阻不断变化等问题;可对芯片进行实时温度控制,一是避免过热;二是可根据用户需求进行温度调节,从而改变雾化量,烟液分散效果好,加热均匀,可以有效提高热利用率,改善雾化效果。(1) The utility model uses a MEMS heating chip integrated with multiple Pt thin film resistance temperature sensors to measure the temperature of the electronic cigarette heating chip in real time. The temperature measurement is accurate, the sensor has a long life and reliable operation, and effectively avoids the existing electronic cigarette heating element. Problems such as inaccurate temperature measurement and aging of the heating element lead to constant changes in the temperature measuring resistance; the chip can be controlled in real time to avoid overheating; the second is to adjust the temperature according to user needs, thereby changing the amount of atomization and the dispersion effect of smoke liquid Well, the heating is uniform, which can effectively increase the heat utilization rate and improve the atomization effect.
(2)本实用新型可以根据实际需要,设置多个铂电阻温度传感器,对芯片表面温度进行分布式测量,得到芯片不同区域的温度分布,可避免现有方法导致无法测量发热体局部温度的问题。(2) The utility model can set a plurality of platinum resistance temperature sensors according to actual needs, and carry out distributed measurement on the surface temperature of the chip to obtain the temperature distribution of different regions of the chip, which can avoid the problem that the existing method cannot measure the local temperature of the heating element .
附图说明Description of drawings
图1为本实用新型的集成多个Pt薄膜电阻温度传感器的MEMS发热芯片的侧面剖视图;Fig. 1 is the side sectional view of the MEMS heating chip integrating a plurality of Pt thin film resistance temperature sensors of the present utility model;
图2为本实用新型第一衬底侧面剖视图;Fig. 2 is a side sectional view of the first substrate of the present invention;
图3第二衬底侧面剖视图;Fig. 3 side sectional view of the second substrate;
图4第二衬底正面俯视图;Fig. 4 the front top view of the second substrate;
图5第二衬底背面俯视图。Fig. 5 is a top view of the back of the second substrate.
附图标记为:1-1、第一衬底;1-2、第二衬底;2、微腔体;3、微通孔;4、微流道陈列;5、多孔结构;6、Pt温度传感器;7、氮化硅层;8、Al2O3层。Reference numerals are: 1-1, first substrate; 1-2, second substrate; 2, microcavity; 3, micro-through hole; 4, micro-channel display; 5, porous structure; 6, Pt Temperature sensor; 7, silicon nitride layer; 8, Al 2 O 3 layer.
具体实施方式Detailed ways
本实用新型第一方面公开了一种集成多个Pt薄膜电阻温度传感器的MEMS 发热芯片,包括:The first aspect of the utility model discloses a MEMS heating chip integrating multiple Pt thin film resistance temperature sensors, including:
第一衬底(1-1),呈片状,其正面有凹型的微腔体(2);所述微腔体(2) 内有贯穿所述第一衬底(1-1)的微通孔(3);The first substrate (1-1) is in the shape of a sheet, and has a concave microcavity (2) on its front; the microcavity (2) has a microscopic cavity penetrating through the first substrate (1-1). through hole (3);
第二衬底(1-2),呈片状,其背面有垂直于其背面的微流道阵列(4),正面中心区域设有垂直于其正面的多孔结构(5),所述微流道阵列(4)与多孔结构 (5)连通;其正面表面有多个Pt薄膜电阻温度传感器(6);The second substrate (1-2), in sheet shape, has a microfluidic channel array (4) perpendicular to its backside on its back side, and a porous structure (5) perpendicular to its front side is provided in the front central area, and the microfluidic The channel array (4) communicates with the porous structure (5); there are multiple Pt thin film resistance temperature sensors (6) on its front surface;
所述第一衬底(1-1)的正面与所述第二衬底(1-2)的背面粘合在一起。The front side of the first substrate (1-1) is glued together with the back side of the second substrate (1-2).
所述微腔体(2)的深度为3毫米;所述微通孔(3)的直径为750微米。The depth of the microcavity (2) is 3 mm; the diameter of the micro through hole (3) is 750 microns.
所述第二衬底(1-2)的正面有金属薄膜,所述金属薄膜的厚度为350nm;所述金属薄膜的材料为Ti/Pt/Au。There is a metal film on the front side of the second substrate (1-2), and the thickness of the metal film is 350nm; the material of the metal film is Ti/Pt/Au.
所述微流道阵列(4)的微流道的直径为35微米,所述微流道的深度为所述第二衬底(1-2)高度的1/2。The diameter of the micro-channels of the micro-channel array (4) is 35 microns, and the depth of the micro-channels is 1/2 of the height of the second substrate (1-2).
所述多孔结构(5)的孔径为500纳米。The pore diameter of the porous structure (5) is 500 nanometers.
所述第一衬底为玻璃或高阻单晶硅制成,所述高阻单晶硅的电阻率为20 Ω·cm。The first substrate is made of glass or high-resistance single-crystal silicon, and the resistivity of the high-resistance single-crystal silicon is 20 Ω·cm.
所述第二衬底为低阻单晶硅制成,所述低阻单晶硅的电阻率为0.005Ω·cm。The second substrate is made of low-resistance single-crystal silicon, and the resistivity of the low-resistance single-crystal silicon is 0.005Ω·cm.
一种集成多个Pt薄膜电阻温度传感器的MEMS发热芯片的制备方法步骤为:A method for preparing a MEMS heating chip integrating a plurality of Pt thin film resistance temperature sensors is as follows:
第一衬底(1-1)的制备:Preparation of the first substrate (1-1):
(1)在电阻率为20Ω·cm的高阻单晶硅片的正面光刻形成微腔体图形,然后采用腐蚀液为氢氧化钾溶液腐蚀出微腔体(2);(1) Form microcavity figure by photolithography on the front side of the high-resistance monocrystalline silicon wafer with resistivity 20Ω·cm, then adopt corrosion solution as potassium hydroxide solution to corrode the microcavity (2);
(2)对步骤(1)所得到的高阻单晶硅片背面进行光刻,然后采用腐蚀液为氢氧化钾溶液腐蚀出贯穿所述的玻璃片或高阻单晶硅片的微通孔(3);即得到所述的第一衬底(1-1);(2) Photolithography is performed on the back of the high-resistance monocrystalline silicon wafer obtained in step (1), and then a potassium hydroxide solution is used to etch out the micro-through holes that run through the glass sheet or the high-resistance monocrystalline silicon wafer. (3); That is, obtain the first substrate (1-1);
第二衬底(1-2)的制备:Preparation of the second substrate (1-2):
(a)在电阻率为0.005Ω·cm的低电阻率的硅片的背面光刻形成微流道阵列图形;(a) photolithographically forming a microchannel array pattern on the back of a silicon wafer with a low resistivity of 0.005Ω·cm;
(b)采用深反应离子刻蚀工艺对步骤(a)的低电阻率硅片的背面进行刻蚀,形成微流道阵列(4);(b) Etching the back side of the low-resistivity silicon wafer in step (a) by using a deep reactive ion etching process to form a microchannel array (4);
(c)采用低压化学气相沉积工艺对步骤(b)所得到的低电阻率硅片的正面沉积一层氮化硅;(c) using a low-pressure chemical vapor deposition process to deposit a layer of silicon nitride on the front side of the low-resistivity silicon wafer obtained in step (b);
(d)对步骤(c)所得到的低电阻率硅片的正面进行光刻,采用反应离子刻蚀工艺去除中部裸露的氮化硅层;(d) performing photolithography on the front side of the low-resistivity silicon wafer obtained in step (c), and removing the exposed silicon nitride layer in the middle by a reactive ion etching process;
(e)采用电化学腐蚀工艺对步骤(d)所得到的低电阻率硅片的正面腐蚀出多孔结构(5),使多孔结构与背面的微流道阵列连通;(e) using an electrochemical etching process to corrode a porous structure (5) on the front side of the low-resistivity silicon wafer obtained in step (d), so that the porous structure communicates with the microchannel array on the back;
(f)对步骤(e)所得到的低电阻率硅片在正面光刻,磁控溅射沉积形成Ti/Pt 金属薄膜;(f) Lithography on the front side of the low-resistivity silicon wafer obtained in step (e), magnetron sputtering deposition to form a Ti/Pt metal film;
(g)在步骤(f)所得到的溅射有金属薄膜的硅片正面进行旋涂光刻胶光刻,形成温度传感器图形;(g) carry out spin-coating photoresist lithography on the front side of the silicon wafer sputtered with metal thin film obtained in step (f), to form a temperature sensor pattern;
(h)采用干法蚀刻步骤(g)所暴露的金属薄膜,留下所需的金属薄膜图形;(h) using dry etching step (g) exposed metal film, leaving the required metal film pattern;
(i)用丙酮除去步骤(h)表面所残留的光刻胶,;(i) remove the remaining photoresist on the surface of step (h) with acetone;
(j)在(i)中除去光刻胶的硅片正面表面溅射氧化铝层;(j) sputtering an aluminum oxide layer on the front surface of the silicon wafer from which the photoresist was removed in (i);
(K)在(j)所述氧化铝层表面再次旋涂光刻胶光刻并采用干法蚀刻暴露的氧化铝层;(K) Spin-coat photoresist photolithography again on the surface of the aluminum oxide layer described in (j) and dry etch the exposed aluminum oxide layer;
(l)用丙酮除去(k)残留的光刻胶后,即为所述第二衬底(1-2)(l) After removing (k) residual photoresist with acetone, it is the second substrate (1-2)
集成多个Pt薄膜电阻温度传感器的MEMS发热芯片的制备:Preparation of MEMS heating chip integrating multiple Pt thin film resistance temperature sensors:
(甲)将所述第一衬底(1-1)的正面与所述第二衬底(1-2)的背面紧密接触,通过健合工艺粘合在一起;(A) The front side of the first substrate (1-1) is in close contact with the back side of the second substrate (1-2), and bonded together by bonding process;
(乙)采用划片机将步骤(甲)得到的芯片进行划片;(B) using a dicing machine to scribe the chip obtained in step (a);
(丙)将步骤(乙)得到的芯片划片的第二衬底正面用银浆料粘结导线后 600℃烧结10分钟后自然冷却至室温,即得到所述的集成多个Pt薄膜电阻温度传感器的MEMS发热芯片。(c) Bond the front side of the second substrate of the chip obtained in step (b) with silver paste and sinter at 600°C for 10 minutes, then cool naturally to room temperature to obtain the integrated multiple Pt thin film resistance temperature The MEMS heating chip of the sensor.
Claims (5)
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN108158039A (en) * | 2018-01-03 | 2018-06-15 | 云南中烟工业有限责任公司 | A kind of MEMS euthermic chips and its manufacturing method for integrating multiple Pt temperature sensors |
| CN110430625A (en) * | 2019-06-10 | 2019-11-08 | 深圳桐源科技有限公司 | Aerosol generating system, heating module, temperature checking method and device |
| CN112345111A (en) * | 2020-09-28 | 2021-02-09 | 中国电子科技集团公司第二十九研究所 | High-power heat source chip and preparation method thereof |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108158039A (en) * | 2018-01-03 | 2018-06-15 | 云南中烟工业有限责任公司 | A kind of MEMS euthermic chips and its manufacturing method for integrating multiple Pt temperature sensors |
| CN110430625A (en) * | 2019-06-10 | 2019-11-08 | 深圳桐源科技有限公司 | Aerosol generating system, heating module, temperature checking method and device |
| CN112345111A (en) * | 2020-09-28 | 2021-02-09 | 中国电子科技集团公司第二十九研究所 | High-power heat source chip and preparation method thereof |
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