CN208188288U - A kind of test plate suitable for plurality of specifications crystal oscillator - Google Patents
A kind of test plate suitable for plurality of specifications crystal oscillator Download PDFInfo
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- CN208188288U CN208188288U CN201820897475.9U CN201820897475U CN208188288U CN 208188288 U CN208188288 U CN 208188288U CN 201820897475 U CN201820897475 U CN 201820897475U CN 208188288 U CN208188288 U CN 208188288U
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- 238000012360 testing method Methods 0.000 title claims abstract description 173
- 239000013078 crystal Substances 0.000 title claims abstract description 109
- 239000000758 substrate Substances 0.000 claims abstract description 26
- 230000005611 electricity Effects 0.000 claims description 12
- 230000006978 adaptation Effects 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 6
- 239000000203 mixture Substances 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000011257 shell material Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
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Abstract
The utility model discloses a kind of test plates suitable for plurality of specifications crystal oscillator, the two pieces of pcb boards fitted together including upper lower leaf, wherein one piece of pcb board positioned at upper layer is grafting indicator board, another piece of pcb board positioned at lower layer is grafting circuit board, the spring socket for being inserted into crystal oscillator pin is welded on the grafting circuit board, then corresponding with the spring socket on grafting indicator board to offer grafting through-hole, the depth of the grafting through-hole is greater than the height that the spring socket protrudes the grafting circuit board；Test pin groups are additionally provided at the back side of the grafting circuit board, the test plate is electrically connected by the pin groups with test substrate.The crystal oscillator of plurality of specifications size can be fixed by the test plate and power-on test, powered types also there are many, there are the advantages such as applied widely, easy for operation, cost of implementation is low.
Description
Technical field
The utility model belongs to crystal oscillator detection technique field, more particularly to a kind of test suitable for plurality of specifications crystal oscillator
Plate.
Background technique
Crystal oscillator is the abbreviation of crystal oscillator, refers to and cuts thin slice (referred to as by certain azimuth from one piece of quartz crystal
For chip), the crystal element of IC composition oscillating circuit is added inside encapsulation, which generally uses packed by metal casing, also have
It is encapsulated with glass shell, ceramics or plastics.Therefore, different crystal oscillators usually has a different specifications, including volume size specification,
Supply voltage specification etc..
It is in the prior art usually the crystalline substance to each dimensions when the crystal oscillator power-on test to different dimensions
Vibration provides a kind of corresponding test bench, then tests the crystal oscillator of this kind of specification, and this mode does not have versatility,
When needing to test the crystal oscillator of different dimensions, need repeatedly to change test jack, testing efficiency is not high.
For this reason, it may be necessary to provide a kind of test plate of crystal oscillator that can satisfy plurality of specifications size, plurality of specifications ruler is solved
Very little crystal oscillator shares the problem of unified test platform.
Utility model content
The utility model is mainly solving the technical problems that the crystal oscillator for providing a kind of pair of different specification size can be into
The test plate of the versatility of row test.
In order to solve the above technical problems, the technical solution adopted in the utility model, which is to provide one kind, is suitable for plurality of specifications crystalline substance
The test plate of vibration, the test plate includes two pieces of pcb boards that upper lower leaf fits together, wherein being located at one piece of upper layer
Pcb board is grafting indicator board, and another piece of pcb board positioned at lower layer is grafting circuit board, is welded on the grafting circuit board
It is then corresponding with the spring socket on grafting indicator board to offer grafting through-hole for being inserted into the spring socket of crystal oscillator pin, it is described to insert
The depth for connecting hole is greater than the height that the spring socket protrudes the grafting circuit board；It is also set at the back side of the grafting circuit board
Test pin groups are equipped with, the test plate is electrically connected by the test pin groups with test substrate.
In the utility model suitable for another embodiment of the test plate of plurality of specifications crystal oscillator, the grafting through-hole
Quantity, aperture and position are adapted with quantity, diameter and the position of the contact pin type pin of crystal oscillator bottom, on the grafting indicator board
It is additionally provided with the Warning Mark of grafting crystal oscillator pin.
In the utility model suitable for another embodiment of the test plate of plurality of specifications crystal oscillator, the test plate is suitable
At least 2 kinds of crystal oscillator type, each type of crystal oscillator corresponding grafting through-hole on the grafting indicator board is mutually indepedent,
And in the grafting indicator board there are many towards compact distribution, and different types of crystal oscillator is corresponding on the grafting circuit board
Feeder ear be electrically connected, oscillator signal output end is electrically connected and ground terminal is also electrically connected.
In the utility model suitable for another embodiment of the test plate of plurality of specifications crystal oscillator, the test pin groups
The including the first test pin groups, the second test pin groups of double 10 contact pin and double 4 contact pin with double 12 contact pin
Three test pin groups, three test pin groups layings triangular in shape on the grafting circuit board.
In the utility model suitable for another embodiment of the test plate of plurality of specifications crystal oscillator, the grafting through-hole is suitable
The crystal oscillator Dimension Types matched include: 4 needles, length × wide=12mm × 12mm；5 needles, length × wide=20mm × 12mm；5 needles, it is long × wide
=20mm × 20mm；5 needles, length × wide=25mm × 25mm；5 needles, length × wide=27mm × 36mm；5 needles, length × wide=51mm ×
41mm；5 needles, length × wide=51mm × 51mm.
In the utility model suitable for another embodiment of the test plate of plurality of specifications crystal oscillator, the aperture of spring socket is wrapped
Include 0.5mm, 0.8mm, and/or 1.0mm.
In the utility model suitable for another embodiment of the test plate of plurality of specifications crystal oscillator, the test plate is
The crystal oscillator of 12V power supply tests plate, and the first test pin groups include high voltage input contact pin, low-voltage input contact pin, electricity
Public contact pin, 12V voltage instruction contact pin are pressed, and high voltage input contact pin is electrically connected with the public contact pin of the voltage；It is described
Second test pin groups include the voltage output contact pin being electrically connected with the feeder ear of the crystal oscillator, to the line on the test substrate
Property power module carry out partial pressure control first partial pressure control contact pin and second partial pressure control contact pin, the voltage output contact pin with
12V voltage instruction contact pin electrical connection in the first test pin groups, first partial pressure control contact pin and second point
Voltage-controlled contact pin processed is hanging；The third test pin groups include enabling to the switch power module on the test substrate
The Switching Power Supply of control controls contact pin, the Switching Power Supply control contact pin ground connection.
In the utility model suitable for another embodiment of the test plate of plurality of specifications crystal oscillator, the test plate is
The crystal oscillator of 5V power supply tests plate, and the first test pin groups include high voltage input contact pin, low-voltage input contact pin, voltage
Public contact pin, 5V voltage indicate contact pin, and low-voltage input contact pin is electrically connected with the public contact pin of the voltage；Described second
Test pin groups include the voltage output contact pin being electrically connected with the feeder ear of the crystal oscillator, to the linear electricity on the test substrate
Source module carry out partial pressure control first partial pressure control contact pin and second partial pressure control contact pin, the voltage output contact pin with it is described
5V voltage instruction contact pin electrical connection in first test pin groups, the first partial pressure control contact pin is hanging, and described second
Partial pressure control contact pin ground connection；The third test pin groups include enabling to the switch power module on the test substrate
The Switching Power Supply control contact pin of control, the low pressure that low pressure selection is carried out to the switch power module select contact pin, the switch
Power supply controls contact pin ground connection, the low pressure selection contact pin ground connection.
In the utility model suitable for another embodiment of the test plate of plurality of specifications crystal oscillator, the test plate is
The crystal oscillator of 3.3V power supply tests plate, and the first test pin groups include high voltage input contact pin, low-voltage input contact pin, electricity
Public contact pin, 3.3V voltage instruction contact pin are pressed, and low-voltage input contact pin is electrically connected with the public contact pin of the voltage；It is described
Second test pin groups include the voltage output contact pin being electrically connected with the feeder ear of the crystal oscillator, to the line on the test substrate
Property power module carry out partial pressure control first partial pressure control contact pin and second partial pressure control contact pin, the voltage output contact pin with
3.3V voltage instruction contact pin electrical connection in the first test pin groups, the first partial pressure control contact pin ground connection, institute
It is hanging to state the second partial pressure control contact pin；Third test pin groups include to the switch power module on the test substrate into
Exercise the Switching Power Supply control contact pin that can control, the low pressure selection contact pin that low pressure selection is carried out to the switch power module, institute
Switching Power Supply control contact pin ground connection is stated, the low pressure selection contact pin is hanging.
In the utility model suitable for another embodiment of the test plate of plurality of specifications crystal oscillator, the test plate
It is provided on the grafting circuit board at least two location holes with the accurate grafting positioning of the test substrate.
The beneficial effects of the utility model are: the utility model discloses a kind of tests suitable for plurality of specifications crystal oscillator to insert
Plate, wherein one piece of pcb board for being located at upper layer is grafting indicator board, is located at including two pieces of pcb boards that upper lower leaf fits together
Another piece of pcb board of lower layer is grafting circuit board, and the spring for being inserted into crystal oscillator pin is welded on the grafting circuit board and is inserted
Hole, then corresponding with the spring socket on grafting indicator board to offer grafting through-hole, the depth of the grafting through-hole is greater than the spring
Jack protrudes the height of the grafting circuit board；Test pin groups, the survey are additionally provided at the back side of the grafting circuit board
Examination plate is electrically connected by the pin groups with test substrate.By the test plate can crystal oscillator to plurality of specifications size into
Row fixation and power-on test, powered types also there are many, it is excellent to have that applied widely, easy for operation, cost of implementation is low etc.
Gesture.
Detailed description of the invention
Fig. 1 is the one embodiment composition block diagram of test plate that the utility model is suitable for plurality of specifications crystal oscillator；
Fig. 2 is the schematic cross-section of embodiment illustrated in fig. 1；
Fig. 3 is grafting indicator board of the utility model suitable for test another embodiment of plate of plurality of specifications crystal oscillator
Schematic diagram；
Fig. 4 is grafting circuit board of the utility model suitable for test another embodiment of plate of plurality of specifications crystal oscillator
Schematic diagram.
Specific embodiment
For the ease of understanding the utility model, in the following with reference to the drawings and specific embodiments, the utility model is carried out more detailed
Thin explanation.The preferred embodiment of the utility model is given in attached drawing.But the utility model can be with many different
Form is realized, however it is not limited to this specification described embodiment.On the contrary, purpose of providing these embodiments is makes to this
The understanding of the disclosure of utility model is more thorough and comprehensive.
It should be noted that unless otherwise defined, all technical and scientific terms used in this specification with belong to
The normally understood meaning of those skilled in the art of the utility model is identical.In the used in the description of the utility model
Term be only for the purpose of describing specific embodiments be not intended to limitation the utility model.
With reference to the accompanying drawing, each embodiment of the utility model is described in detail.Fig. 1 is that the utility model is suitable for
The one embodiment composition schematic diagram of test plate of plurality of specifications crystal oscillator.As shown in Figure 1, the test plate includes upper lower leaf group
Two pieces of pcb boards being fitted together, for ease of description, Fig. 1 separate this two pieces of pcb boards, be both in actual use welding or
It fits together.Wherein one piece of pcb board positioned at upper layer is grafting indicator board 11, and another piece of pcb board positioned at lower layer is slotting
Circuit board 12 is connect, the spring socket 121 for being inserted into crystal oscillator pin to be measured, grafting instruction are welded on the grafting circuit board 12
It is then corresponding with the spring socket on plate to offer grafting through-hole 111.In conjunction with Fig. 2, the depth H 2 of the grafting through-hole 111 is greater than institute
State the height H1 that spring socket 121 protrudes the plate face of the grafting circuit board 12.It is additionally provided at the back side of the grafting circuit board
Pin groups 122 are tested, the test plate is electrically connected by the pin groups 122 with test substrate.In Fig. 1, the test is inserted
It is provided on the grafting circuit board 12 of plate at least two location holes with the accurate grafting positioning of the test substrate
123.By the pcb board of two pieces of superpositions of setting, and the depth of grafting through-hole is greater than the spring socket and protrudes the grafting circuit
The height of the plate face of plate, after the female type pin of crystal oscillator can be made to be inserted into spring socket, the bottom surface of crystal oscillator will not be with spring socket
Contact, due to spring socket conduction, and the bottom surface of crystal oscillator is encapsulated if it is metal material, then insertion each of spring socket can be made to draw
Foot connects short circuit by the metal material, and the upper surface of grafting indicator board is insulating layer, this set side of the present embodiment
Formula can be to avoid short circuit problem.In addition, the pin insertion spring socket of crystal oscillator has certain depth, to guarantee sufficiently electrical contact, insert
Connecting hole also has the function of that crystal oscillator pin is protected to be unlikely to excessive exposed.
Fig. 3 shows the schematic diagram of a grafting indicator board embodiment.As can be seen that being provided with multiple grafting on the plugboard
Through-hole, it is preferred that quantity, diameter and the position of the contact pin type pin of quantity, aperture and the position and crystal oscillator bottom of grafting through-hole
It is adapted, the Warning Mark of grafting crystal oscillator pin is additionally provided on the grafting indicator board.Preferably, in the same grafting circuit
The aperture of spring socket includes 0.5mm, 0.8mm, and/or 1.0mm on plate.In this way, the diameter of grafting through-hole is usually than spring socket
The more 0.2mm in aperture.
It is further preferred that at least 2 kinds of crystal oscillator type that the test plate is applicable in, each type of crystal oscillator is described
Corresponding grafting through-hole is mutually indepedent on grafting indicator board, and has multiple directions (including lateral, perpendicular in the grafting indicator board
To setting) and compact distribution.The crystalline substance of plurality of specifications size can thus be met as far as possible on the test limited area of plate
Vibration can be tested with grafting.
Preferably, for constant-temperature crystal oscillator and temperature compensating crystal oscillator, principal shape is rectangle or square, contact pin type pin
Quantity be generally 5 pins or 4 pins, such as when having 5 pins, wherein 3 pins are uniformly arranged on the crystal oscillator
One side, in addition both ends of 2 pins then corresponding another side that the crystal oscillator is set, the grafting indicator board
On installation Warning Mark is provided with to the corresponding grafting through-hole of 3 pins of the crystal oscillator.As in Fig. 3 in the centre of 3 pins
Pin is labeled with instruction crystal oscillator having a size of 51 × 41, and corresponding length and width are 51mm and 41mm respectively, and the two of this 3 pins
The pin at end is labeled with triangle respectively, and the appearance profile of the crystal oscillator is drawn with solid line and dotted line, these are all
As the Warning Mark 112 of instruction crystal oscillator grafting, it is possible thereby to indicate that crystal oscillator is correctly inserted into grafting through-hole by tester.
In addition, there are also pins to be labeled with instruction crystal oscillator having a size of 51 × 51, corresponding length and width are 51mm and 51mm respectively, it can be seen that
The direction of the setting of 5 pins of this specification crystal oscillator and the direction of the setting of 5 pins of previous specification crystal oscillator are different.And
These grafting through-holes distribution being arranged on entire grafting indicator board is compacter than comparatively dense, can make inserting in limited area in this way
Connect the crystal oscillator that sizes specification is set on indicator board.It is additionally shown in Fig. 3 on the quadrangle of grafting indicator board 11 and is provided with installation
Hole 113 can fit together grafting indicator board and grafting circuit board by mounting hole 113.
Preferably, the crystal oscillator Dimension Types of the grafting through-hole adaptation include: 4 needles, length × wide=12mm × 12mm；5 needles,
Length × wide=20mm × 12mm；5 needles, length × wide=20mm × 20mm；5 needles, length × wide=25mm × 25mm；5 needles, long × wide=
27mm×36mm；5 needles, length × wide=51mm × 41mm；5 needles, length × wide=51mm × 51mm.
In addition, though can be with the crystal oscillator of grafting plurality of specifications size on grafting indicator board, but all types of crystal oscillators exist
Corresponding feeder ear is electrically connected on the grafting circuit board, oscillator signal output end is electrically connected, and ground connection
End is also electrically connected.Unified power supply easily thus is carried out to the crystal oscillator of different size on removal circuit plate and is drawn
Oscillator signal out.
Fig. 4 shows the schematic diagram of grafting circuit board, inserts wherein being provided with three groups of tests at the back side of grafting circuit board 12
Needle group, the second test 1221 and of pin groups including the first test pin groups 1223, double 10 contact pin with double 12 contact pin
The third of double 4 contact pin tests pin groups 1222, three test pin groups layings triangular in shape on the grafting circuit board.This
Kind laying mode is conducive to that plate will be tested and test substrate carries out firm grafting.In addition, can find out spring socket 121 from Fig. 4 pages
There is different apertures, this is the reason different for the diameter of the corresponding pin of the crystal oscillator for adapting to different size, such as preceding institute
The aperture for stating spring socket includes 0.5mm, 0.8mm, and/or 1.0mm.
In conjunction with Fig. 1, tested described in Fig. 4 on the grafting circuit board 12 of plate be provided with for the test substrate
At least two location holes 123 of accurate grafting positioning.In practical applications, corresponding to be also equipped with respective counts on test substrate
The location hole of amount and position, in this way when the location hole 123 on grafting circuit board 12 is aligned with the location hole on test substrate, just
It can guarantee that three groups of test pin groups at 12 back side of grafting circuit board are corresponding with the test jack on test substrate and insert standard.
In addition, the utility model can provide the test plate of three kinds of powered types, i.e. 12V, 5V, 3.3V, so every kind
The test plate of powered types can patch the crystal oscillator of different specification size again, and the crystal oscillator that the present embodiment is applicable in has
More type class.
Preferably, when the test plate is the crystal oscillator test plate of 12V power supply, the first test pin groups include height
Voltage input contact pin, low-voltage input contact pin, the public contact pin of voltage, 12V voltage indicate contact pin, and the high voltage inputs contact pin
It is electrically connected with the public contact pin of the voltage；
The second test pin groups include the voltage output contact pin being electrically connected with the feeder ear of the crystal oscillator, to the survey
Linear power supply module on trial base carries out the first partial pressure control contact pin and the second partial pressure control contact pin of partial pressure control, the electricity
Pressure output contact pin is electrically connected with the 12V voltage instruction contact pin in the first test pin groups, the first partial pressure control
Contact pin and the second partial pressure control contact pin are hanging；
The third test pin groups include opening what the switch power module on the test substrate carried out making can control
Powered-down source controls contact pin, the Switching Power Supply control contact pin ground connection.
Preferably, the test plate is that the crystal oscillator of 5V power supply tests plate, and the first test pin groups include high electricity
Pressure input contact pin, low-voltage input contact pin, the public contact pin of voltage, 5V voltage indicate contact pin, and the low-voltage input contact pin with
The public contact pin electrical connection of voltage；
The second test pin groups include the voltage output contact pin being electrically connected with the feeder ear of the crystal oscillator, to the survey
Linear power supply module on trial base carries out the first partial pressure control contact pin and the second partial pressure control contact pin of partial pressure control, the electricity
Pressure output contact pin is electrically connected with the 5V voltage instruction contact pin in the first test pin groups, and the first partial pressure control is inserted
Needle is hanging, the second partial pressure control contact pin ground connection；
The third test pin groups include opening what the switch power module on the test substrate carried out making can control
Powered-down source control contact pin, the low pressure that low pressure selection is carried out to the switch power module select contact pin, the Switching Power Supply control
Contact pin ground connection, the low pressure selection contact pin ground connection.
Preferably, the test plate is that the crystal oscillator of 3.3V power supply tests plate, and the first test pin groups include height
Voltage input contact pin, low-voltage input contact pin, the public contact pin of voltage, 3.3V voltage indicate contact pin, and low-voltage input is inserted
Needle is electrically connected with the public contact pin of the voltage；
The second test pin groups include the voltage output contact pin being electrically connected with the feeder ear of the crystal oscillator, to the survey
Linear power supply module on trial base carries out the first partial pressure control contact pin and the second partial pressure control contact pin of partial pressure control, the electricity
Pressure output contact pin is electrically connected with the 3.3V voltage instruction contact pin in the first test pin groups, the first partial pressure control
Contact pin ground connection, the second partial pressure control contact pin are hanging；
The third test pin groups include opening what the switch power module on the test substrate carried out making can control
Powered-down source control contact pin, the low pressure that low pressure selection is carried out to the switch power module select contact pin, the Switching Power Supply control
Contact pin ground connection, the low pressure selection contact pin are hanging.
It can be seen that testing pin groups by the way that these are arranged, the test plate of different power voltage can be inserted by test
The connection relationship of needle group can realize the connection of some interface ends, thus in the test plate for replacing different powered types
When, it realizes and is docked with test the electrical of substrate naturally, without carrying out wire jumper setting again, greatly facilitate and operate with.
The utility model discloses a kind of test plates suitable for plurality of specifications crystal oscillator, including upper lower leaf to be assembled in one
The two pieces of pcb boards risen, wherein one piece of pcb board for being located at upper layer is grafting indicator board, another piece of pcb board positioned at lower layer is grafting
Circuit board, is welded with the spring socket for being inserted into crystal oscillator pin on the grafting circuit board, on grafting indicator board then with it is described
Spring socket is corresponding to offer grafting through-hole, and the depth of the grafting through-hole is greater than the spring socket and protrudes the grafting circuit board
Highly；Test pin groups are additionally provided at the back side of the grafting circuit board, the test plate is by the pin groups and surveys
Trial base electrical connection.The crystal oscillator of plurality of specifications size can be fixed by the test plate and power-on test, class of powering
Type also there are many, the advantages that have that applied widely, easy for operation, cost of implementation is low etc..
The above description is only the embodiments of the present invention, and therefore it does not limit the scope of the patent of the utility model, all
Equivalent structure transformation made based on the specification and figures of the utility model, it is relevant to be applied directly or indirectly in other
Technical field is included in the scope of patent protection of the utility model.
Claims (10)
1. a kind of test plate suitable for plurality of specifications crystal oscillator, which is characterized in that the test plate includes upper lower leaf group
Two pieces of pcb boards being fitted together, wherein one piece of pcb board for being located at upper layer is grafting indicator board, positioned at another piece of pcb board of lower layer
It is grafting circuit board, is welded with the spring socket for being inserted into crystal oscillator pin on the grafting circuit board, on grafting indicator board then
Corresponding with the spring socket to offer grafting through-hole, the depth of the grafting through-hole is greater than the spring socket and protrudes the grafting electricity
The height of road plate；Test pin groups are additionally provided at the back side of the grafting circuit board, the test plate passes through the test
Pin groups are electrically connected with test substrate.
2. the test plate according to claim 1 suitable for plurality of specifications crystal oscillator, which is characterized in that the grafting through-hole
Quantity, aperture and position be adapted with quantity, diameter and the position of the contact pin type pin of crystal oscillator bottom, the grafting indicator board
On be additionally provided with the Warning Mark of grafting crystal oscillator pin.
3. the test plate according to claim 2 suitable for plurality of specifications crystal oscillator, which is characterized in that the test plate
At least 2 kinds of applicable crystal oscillator type, each type of crystal oscillator corresponding grafting through-hole on the grafting indicator board is mutually only
It is vertical, and in the grafting indicator board, there are many directions and compact distribution, and different types of crystal oscillator is in the grafting circuit board
It is upper that corresponding feeder ear is electrically connected, oscillator signal output end is electrically connected and ground terminal is also connected electrically in one
It rises.
4. the test plate according to claim 3 suitable for plurality of specifications crystal oscillator, which is characterized in that the test contact pin
Group includes having the first test pin groups, the second test pin groups of double 10 contact pin and double 4 contact pin of double 12 contact pin
Third tests pin groups, three test pin groups layings triangular in shape on the grafting circuit board.
5. the test plate according to claim 4 suitable for plurality of specifications crystal oscillator, which is characterized in that the grafting through-hole
The crystal oscillator Dimension Types of adaptation include: 4 needles, length × wide=12mm × 12mm；5 needles, length × wide=20mm × 12mm；5 needles, long ×
Width=20mm × 20mm；5 needles, length × wide=25mm × 25mm；5 needles, length × wide=27mm × 36mm；5 needles, length × wide=51mm
×41mm；5 needles, length × wide=51mm × 51mm.
6. the test plate according to claim 4 suitable for plurality of specifications crystal oscillator, which is characterized in that the aperture of spring socket
Including 0.5mm, 0.8mm, and/or 1.0mm.
7. the test plate according to claim 6 suitable for plurality of specifications crystal oscillator, which is characterized in that the test plate
For 12V power supply crystal oscillator test plate, it is described first test pin groups include high voltage input contact pin, low-voltage input contact pin,
The public contact pin of voltage, 12V voltage indicate contact pin, and high voltage input contact pin is electrically connected with the public contact pin of the voltage；
The second test pin groups include the voltage output contact pin being electrically connected with the feeder ear of the crystal oscillator, to the test base
Linear power supply module on plate carries out the first partial pressure control contact pin of partial pressure control and the second partial pressure controls contact pin, and the voltage is defeated
Contact pin is electrically connected with the 12V voltage instruction contact pin in the first test pin groups out, the first partial pressure control contact pin
It is hanging with the second partial pressure control contact pin；
The third test pin groups include carrying out the switch for making can control electricity to the switch power module on the test substrate
Source controls contact pin, the Switching Power Supply control contact pin ground connection.
8. the test plate according to claim 6 suitable for plurality of specifications crystal oscillator, which is characterized in that the test plate
Plate is tested for the crystal oscillator of 5V power supply, the first test pin groups include high voltage input contact pin, low-voltage input contact pin, electricity
Public contact pin, 5V voltage instruction contact pin are pressed, and low-voltage input contact pin is electrically connected with the public contact pin of the voltage；
The second test pin groups include the voltage output contact pin being electrically connected with the feeder ear of the crystal oscillator, to the test base
Linear power supply module on plate carries out the first partial pressure control contact pin of partial pressure control and the second partial pressure controls contact pin, and the voltage is defeated
Contact pin is electrically connected with the 5V voltage instruction contact pin in the first test pin groups out, and the first partial pressure control contact pin is outstanding
Sky, the second partial pressure control contact pin ground connection；
The third test pin groups include carrying out the switch for making can control electricity to the switch power module on the test substrate
The low pressure selection contact pin that source controls contact pin, carries out low pressure selection to the switch power module, the Switching Power Supply control contact pin
Ground connection, the low pressure selection contact pin ground connection.
9. the test plate according to claim 6 suitable for plurality of specifications crystal oscillator, which is characterized in that the test plate
For 3.3V power supply crystal oscillator test plate, it is described first test pin groups include high voltage input contact pin, low-voltage input contact pin,
The public contact pin of voltage, 3.3V voltage indicate contact pin, and low-voltage input contact pin is electrically connected with the public contact pin of the voltage；
The second test pin groups include the voltage output contact pin being electrically connected with the feeder ear of the crystal oscillator, to the test base
Linear power supply module on plate carries out the first partial pressure control contact pin of partial pressure control and the second partial pressure controls contact pin, and the voltage is defeated
Contact pin is electrically connected with the 3.3V voltage instruction contact pin in the first test pin groups out, the first partial pressure control contact pin
Ground connection, the second partial pressure control contact pin are hanging；
The third test pin groups include carrying out the switch for making can control electricity to the switch power module on the test substrate
The low pressure selection contact pin that source controls contact pin, carries out low pressure selection to the switch power module, the Switching Power Supply control contact pin
Ground connection, the low pressure selection contact pin are hanging.
10. the test plate according to any one of claims 1 to 9 suitable for plurality of specifications crystal oscillator, which is characterized in that institute
It states and is provided on the grafting circuit board of test plate for determining at least two of the accurate grafting positioning of the test substrate
Position hole.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820897475.9U CN208188288U (en) | 2018-06-11 | 2018-06-11 | A kind of test plate suitable for plurality of specifications crystal oscillator |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201820897475.9U CN208188288U (en) | 2018-06-11 | 2018-06-11 | A kind of test plate suitable for plurality of specifications crystal oscillator |
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| CN208188288U true CN208188288U (en) | 2018-12-04 |
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| CN201820897475.9U Active CN208188288U (en) | 2018-06-11 | 2018-06-11 | A kind of test plate suitable for plurality of specifications crystal oscillator |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111693739A (en) * | 2020-05-20 | 2020-09-22 | 成都恒晶科技有限公司 | Soldering connection structure of crystal oscillator test tool seat |
| CN118884309A (en) * | 2024-07-08 | 2024-11-01 | 武汉云岭光电股份有限公司 | Test device and method for multifunctional pin device |
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2018
- 2018-06-11 CN CN201820897475.9U patent/CN208188288U/en active Active
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111693739A (en) * | 2020-05-20 | 2020-09-22 | 成都恒晶科技有限公司 | Soldering connection structure of crystal oscillator test tool seat |
| CN111693739B (en) * | 2020-05-20 | 2022-07-22 | 成都恒晶科技有限公司 | Solder joint structure of crystal oscillator test tool seat |
| CN118884309A (en) * | 2024-07-08 | 2024-11-01 | 武汉云岭光电股份有限公司 | Test device and method for multifunctional pin device |
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