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CN207636684U - Multitask electronic apparatus xenon lamp mechanism for testing - Google Patents

Multitask electronic apparatus xenon lamp mechanism for testing Download PDF

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Publication number
CN207636684U
CN207636684U CN201721855009.6U CN201721855009U CN207636684U CN 207636684 U CN207636684 U CN 207636684U CN 201721855009 U CN201721855009 U CN 201721855009U CN 207636684 U CN207636684 U CN 207636684U
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China
Prior art keywords
temperature
test
xenon lamp
xenon
connecting rod
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CN201721855009.6U
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Chinese (zh)
Inventor
董宁
陈益思
黄庆
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Shanghai China Testing Technology Co ltd
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Centre Testing International Group Co ltd
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Abstract

The utility model discloses a kind of multitask electronic apparatus xenon lamp mechanism for testing, including:Test barrel, tested electrical and electronic component are fixed on puller system and are tested;Upper cover and pedestal;Xenon lamp component, xenon lamp component are set in test barrel, and xenon lamp component includes connecting rod and xenon source, small end is fixed on upper cover lower face, xenon source is set on connecting rod lower end surface, and xenon source is located at tested electrical and electronic component top, and connecting rod can be extended or be shunk with respect to upper cover;Control system includes temperature control unit and temperature sensing unit, temperature sensing unit is set in test barrel and at tested electrical and electronic component, and for detecting the temperature environment residing for tested electrical and electronic component, and detected temperature information is passed into temperature control unit, the temperature information control xenon source that temperature control unit is sent according to temperature sensing unit adjusts temperature.The utility model is a kind of multitask electronic apparatus xenon lamp mechanism for testing of adjustment test temperature of low cost, accurate.

Description

Multitask electronic apparatus xenon lamp mechanism for testing
Technical field
The utility model is related to automotive electronics component reliability testing field, more particularly to one kind are of low cost, accurate Adjust the multitask electronic apparatus xenon lamp mechanism for testing of test temperature.
Background technology
The reliability test of automotive electronics component refers to passing through to electronic component finished product, semi-finished product or simulation print Various method for evaluating reliability, such as reliability test, accelerated life test and Fast Evaluation, and use mathematical statistics work Tool and related simulation softwares evaluate its service life, crash rate or reliability credit rating.Meanwhile utilizing reliability screening skill Art evaluates whether product is qualified, rejects the defective work of initial failure.
With the continuous development of auto industry, the requirement to automotive electronics component reliability is continuously improved, automotive electronics Component is to development intelligent, highly integrated, that multifunction direction is swifter and more violent, increasingly to the reliability requirement of device It is high.By taking integrated circuit as an example, if continuing to use traditional reliability test method to evaluate product reliability, high for integrated level, The device products that production quantity is few, testing expenses are expensive generally feel there is prodigious difficulty.
For the electronic component that operating environment requirements are stringenter, when to its reliability test, it is desirable to test Temperature is accurately controlled, existing test equipment or undesirable for the control of temperature or cost is too high, is unfavorable for Reduce testing cost.
There is an urgent need for a kind of multitask electronic apparatus xenon lamp mechanism for testing of adjustment test temperature of low cost, accurate.
Utility model content
The purpose of this utility model is to provide a kind of multitask electronic apparatus xenon of adjustment test temperature of low cost, accurate Lamp test mechanism.
To achieve the goals above, technical solution provided by the utility model is:One multitask electronic apparatus xenon lamp is provided Mechanism for testing, including:
Several test barrels, test barrel hollow structure of upper end opening for lower end closed, the interior setting of the test barrel There are puller system, tested electrical and electronic component to be fixed on the puller system and tested;
Upper cover and pedestal, the upper end of each test barrel are covered with the upper cover, and each test cylinder Lower end is fixed on the pedestal, and the connecting terminal for being electrically connected with tested electronic component is additionally provided on the pedestal;
Xenon lamp component, the xenon lamp component are set in the test barrel, and the xenon lamp component includes connecting rod and xenon source, The small end is fixed on the upper cover lower face, and the xenon source is set on the connecting rod lower end surface, the xenon lamp Light source is located at place above tested electrical and electronic component, the connecting rod can the relatively described upper cover elongation or contraction, the xenon lamp Source can also control temperature in the test barrel other than doing burn-in test to tested electrical and electronic component;
Control system, the control system include temperature control unit and temperature sensing unit, the temperature sensing unit In the test barrel and at tested electrical and electronic component, and for detecting the temperature residing for tested electrical and electronic component Environment, and detected temperature information is passed into the temperature control unit, the temperature control unit is according to the temperature It spends the temperature information that sensing unit is sent and controls the xenon source adjusting temperature.
The xenon source centre has the loop configuration of a circular hole, and is fixed on the connecting rod lower end surface, runs through The upper surface and lower face of the connecting rod are equipped with straight slot along the length direction of the connecting rod, and spray tube, institute are equipped in the straight slot It states spray tube and is connected with nozzle, the nozzle is set at the circular hole of the xenon source centre.
It is additionally provided with high temperature resistant heat insulation layer between the connecting rod lower end surface and the xenon source.
The upper end of the connecting rod passes through the upper cover and is connected with stepper motor, the stepper motor and the control system It is electrically connected, the stepper motor is fixed on the upper lid, and the control system can drive described in the stepper motor driving The relatively described upper cover elongation of connecting rod is shunk.
In tubular construction, and the test barrel inner wall is provided with insulation construction layer to the test barrel.
The upper end that the upper cover corresponds to the test cylinder is provided with the first groove, the salable guarantor in upper end of the test barrel It is fixed on warmly in first groove.
The lower end that the pedestal corresponds to the test barrel is provided with the second groove, and the lower end heat preservation ground of the test barrel is fixed In in second groove.
Further include shell and display device, the display device is set to the outer wall of the shell, the test barrel, pedestal and Xenon lamp component is set in the shell, and the display device is connect with the temperature control unit, the temperature control unit Temperature information in the test barrel is sent to the display device to show.
Compared with prior art, due in the utility model multitask electronic apparatus xenon lamp mechanism for testing, due to comprising There are the test barrel, xenon lamp component, each tested electrical and electronic component is independently tested in a test barrel, and And in the xenon lamp component, the xenon source is set on the connecting rod lower end surface, and the xenon source can pass through the company Bar, which rises either to decline, reaches the xenon source far from or close to be tested electrical and electronic component, due to the shifting of the connecting rod Dynamic is that can do very accurate, 1/10 grade is can be as accurate as, when the xenon source is far from tested electronic apparatus member When part, the temperature of tested electrical and electronic component local environment can decline, otherwise the temperature of tested electrical and electronic component local environment It can rise, therefore by the movement of the connecting rod, achieve the effect that accurately control tested electrical and electronic component local environment temperature, And since each test barrel is independent, the temperature in each test barrel is individually controllable, therefore can be right Test or different types of electronic component under same type of electronic component progress different temperatures is under unified temperature It is tested, achievees the purpose that multitask, multi-temperature are carried out at the same time test.
By description below and in conjunction with attached drawing, the utility model will become more fully apparent, these attached drawings are for explaining this The embodiment of utility model.
Description of the drawings
Fig. 1 show the schematic diagram of one embodiment of the utility model multitask electronic apparatus xenon lamp mechanism for testing.
Fig. 2 is the schematic diagram of another embodiment of the utility model multitask electronic apparatus xenon lamp mechanism for testing.
Fig. 3 is the utility model temperature control system circuit theory module map.
Specific implementation mode
The embodiments of the present invention are described referring now to the drawings, similar element numbers represent similar member in attached drawing Part.As described above, as shown in Figure 1, 2, 3, the multitask electronic apparatus xenon lamp mechanism for testing that the utility model embodiment provides 100, purposes be automotive electronics component is tested, including:
Several test barrels 1, the hollow structure of upper end opening for lower end closed of the test barrel 1 are set in the test barrel 1 It is equipped with puller system, tested electrical and electronic component is fixed on the puller system and is tested;It should be noted that the drawing The pulling force size of power apparatus is adjustable, and it is big that tester can adjust the pulling force that tested electrical and electronic component is subject to according to actual demand It is small;
Upper cover 41 and pedestal 2, the upper end of each test barrel 1 are covered with the upper cover 41, and each test The lower end of cylinder 1 is fixed on the pedestal 2, is additionally provided on the pedestal 2 for being electrically connected with tested electronic component Connecting terminal 3;
Xenon lamp component 4, the xenon lamp component 4 are set in the test barrel 1, and the xenon lamp component 4 includes connecting rod 42 and xenon 41 lower face of the upper cover is fixed in lamp source 43,42 upper end of the connecting rod, and the xenon source 43 is set under the connecting rod 42 It holds on end face, the xenon source 43 is located at 10 top of tested electrical and electronic component, and the connecting rod 42 can the relatively described upper cover 41 elongations are shunk, and the xenon source 43 can control temperature in the test barrel 1.In fact, the xenon lamp When source 43 controls the temperature in the test barrel 1, the temperature in the test barrel 1 is not that everywhere is all identical, be From the xenon source 43 by far and being closely in change from high to low, this is the basic principle for creating the utility model.Moreover, by In the xenon source 43 itself the characteristics of, when increasing or reduce with power, temperature change is not linear, therefore In practical application, a bigger problem will be to the adjusting of the temperature of test, often occur what test temperature was difficult to adjust Problem.If test a tested electrical and electronic component 1, test temperature is set as 60 DEG C, it is desirable to pass through the xenon Test temperature is adjusted to 60 DEG C by lamp source 43, due to the volume of the test barrel 1 be do it is smaller, debugging temperature When spending, the heating power for adjusting the xenon source 43 is only relied only on, the temperature of the test barrel 1 can be theoretically heated to Target temperature, target temperature is 60 DEG C herein, however in actual mechanical process, it will it is extremely difficult, it often will appear reality Or border temperature is less than or is higher than this set temperature, and can only be carried out under 60 DEG C of test temperatures devious at one Test.But by the utility model, due to being provided with the xenon lamp component 4, then can easily, accurately by test temperature It fixes at 60 DEG C.Its operating procedure:The heating power of the xenon source 43 is set as 60 DEG C first, then passes through temperature The actual temperature of 10 local environment of tested electrical and electronic component is fed back to control system by sensing unit, and control system can will be tested The actual temperature of 10 local environment of electrical and electronic component is sent to display device;Control system is according to the temperature sensing unit institute The temperature detected is above or below 60 DEG C of setting, extends or shrink the connecting rod 42, allows the xenon source 43 Far from or close to tested electrical and electronic component 10.The test residing for tested electrical and electronic component 10 can so be accurately controlled Temperature, it is small to implement difficulty, easy to operate.And it should be noted that in order to improve the degree of automation of equipment, in connecting rod Upper setting stepper motor 6 directly controls stepper motor 6 by control system 5 and the connecting rod 42 is driven to carry out rising or falling fortune It is dynamic.
In one embodiment, as shown in Figure 1,43 centre of the xenon source has the loop configuration of a circular hole, and it is solid Due to 42 lower end surface of the connecting rod, set along the length direction of the connecting rod 42 through the upper surface of the connecting rod 42 and lower face There is straight slot 45, spray tube is equipped in the straight slot 45, the spray tube is connected with nozzle, and the nozzle is set to the xenon source At the circular hole of 43 centres.By the spray tube and nozzle, can select to spray tested electronic component 10 Experiment.In embodiment as shown in Figure 2, the area of the upper cover 41 and pedestal 2 can be done bigger, while installed multiple Test barrel 1 and xenon lamp component 4, and the temperature in each test barrel 1 is individually controllable, with the test in other test barrels 1 Situation is non-interference, so can carry out different test assignments respectively in each test barrel 1.
In embodiment as shown in Figure 2, the area of the upper cover 41 and pedestal 2 can be done bigger, installed simultaneously Multiple test barrels 1 and xenon lamp component 4, and the temperature in each test barrel 1 is individually controllable, the temperature with other test barrels 1 Degree is non-interference, so can carry out different test assignments respectively in each test barrel 1.
In one embodiment, as shown in Figure 1, being additionally provided between 42 lower end surface of the connecting rod and the xenon source 43 resistance to High temperature insulating layer 44.By the high temperature resistant heat insulation layer 44, it can prevent the heat that the xenon source 43 is sent out from passing through institute It states connecting rod 42 and passes out the external world, and cause energy loss, moreover it is possible to the heat being effectively prevented between the two adjacent test barrels 1 It mutually transmits, exerts an adverse impact, also ensure that the heating power of the xenon source 43 is stablized in addition so that tested member device Test temperature residing for part is in a stable state, it is ensured that the accuracy of test.
In one embodiment, as shown in figure 3, further including temperature control system 5, the temperature-controlling system 5 is controlled including temperature Unit 51 and temperature sensing unit 52, the temperature sensing unit 52 are set in the test barrel 1 and positioned at tested electronic apparatus At element 10, and passed for detecting the temperature environment residing for tested electrical and electronic component 10, and by detected temperature information The temperature control unit 51 is passed, the temperature control unit 51 is according to described in the transmission of the temperature sensing unit 52 Temperature information controls the xenon source 43 and adjusts temperature.
In one embodiment, in embodiment as shown in Figure 1, the upper end of the connecting rod 42 is connected across the upper cover 41 There are stepper motor 6, the stepper motor 6 to be electrically connected with the control system 5, the stepper motor 6 is fixed on the upper cover On 41, the control system 5 can drive the stepper motor 6 to drive the relatively described elongation of upper cover 41 of the connecting rod 42 or receive Contracting.
In one embodiment, the test barrel is in 1 tubular structure, and 1 inner wall of the test barrel is provided with insulation construction layer. The temperature held stationary in the test barrel 1 is enabled to by the insulation construction layer, helps to save electric energy, it in addition will be every Insulation construction layer is arranged in a 1 inner wall of the test barrel, and the heat for being conducive to be isolated two neighbouring test barrels 1 is transmitted, it is ensured that Ongoing test is smoothed out in each test barrel 1.
In one embodiment, as shown in Figure 1, the upper cover 41 corresponds to the upper end of the test cylinder 1, to be provided with first recessed The salable heat preservation ground in upper end of slot 411, the test barrel 1 is fixed in first groove 411.
In one embodiment, as shown in Figure 1, the lower end that the pedestal 2 corresponds to the test barrel 1 is provided with the second groove 21, the lower end heat preservation ground of the test barrel 1 is fixed in second groove 21.
In one embodiment, as shown in figure 3, further including shell (not showing on figure) and display device 50, the display device 50 are set to the outer wall of the shell, and the test barrel 1, pedestal 2 and xenon lamp component 4 are set in the shell, the display dress It sets 50 to connect with the temperature control unit 51, the temperature control unit 51 sends the temperature information in the test barrel 1 It is shown to the display device 50.In the present embodiment, the shell is not come out by example, and the shell adaptively wraps Overlay on the test barrel 1, pedestal 2 and xenon lamp component 4 outside, it is conveniently laying, carry and management, the display device be set to institute Outer shell outer wall is stated, operator can intuitively observe the test temperature residing for each tested electrical and electronic component.
It should be noted that controlling tested electrical and electronic component institute by controlling the heating power of the xenon source 43 The temperature environment at place, temperature control are coarse can not to realize smart control.And simultaneously due to the fever of the xenon source 43 It is not linear, increases or reduce the power of the xenon source 43, it is possible to create the bigger gap with target temperature, and And also it is not easy to adjust, it is also necessary to accurate processing is carried out to the structure of the test barrel 1, with the linear control of matching xenon lamp light source Temperature, implementing may be still less desirable, is so unfavorable for reducing the cost of equipment, improves the difficulty of popularization and application; However by adjusting the distance between the xenon source and tested electrical and electronic component 10, the tested electricity of accurate adjustment can be played Environment temperature residing for sub- electric elements 10, it is small to implement difficulty, and operation is easy, also relatively to the design requirement of equipment It is low, it is cheap, it is easy to promote and apply.
Compared with prior art, in conjunction with Fig. 1-3, due in the utility model multitask electronic apparatus xenon lamp mechanism for testing In 100, due to including the test barrel 1, pedestal 2 and xenon lamp component 4, each tested electrical and electronic component is independently at one It is tested in the test barrel 1, and in the xenon lamp component 4, the xenon source 43 is set to 42 lower end end of the connecting rod On face, the xenon source 43 can be risen by the connecting rod 42 either declines that reach the xenon source 43 separate or lean on Closely tested 10 purpose of electrical and electronic component can be as accurate as 1/ since the movement of the connecting rod 42 is can to do very accurate 10 grades are tested the temperature of electrical and electronic component local environment when the xenon source 43 is far from tested electrical and electronic component Degree can decline, otherwise the temperature of tested electrical and electronic component local environment can rise, therefore by the movement of the connecting rod 42, reach To the effect for accurately controlling tested electrical and electronic component local environment temperature, and due to each test barrel 1 be it is independent, Temperature in each test barrel 1 is individually controllable, therefore can be carried out to same type of tested electrical and electronic component Test or different types of tested electrical and electronic component under different temperatures are tested under unified temperature, reach more Business, multi-temperature are carried out at the same time the purpose of test.
It above disclosure is merely preferred embodiments of the utility model, certainly cannot be new to limit this practicality with this The interest field of type, therefore equivalent variations made according to the patent scope of the utility model still belong to the utility model and are covered Range.

Claims (8)

1. a kind of multitask electronic apparatus xenon lamp mechanism for testing, which is characterized in that including:
Several test barrels, test barrel hollow structure of upper end opening for lower end closed are provided with drawing in the test barrel Power apparatus, tested electrical and electronic component are fixed on the puller system and are tested;
Upper cover and pedestal, the upper end of each test barrel are covered with the upper cover, and the lower end of each test cylinder It is fixed on the pedestal, the connecting terminal for being electrically connected with tested electronic component is additionally provided on the pedestal;
Xenon lamp component, the xenon lamp component are set in the test barrel, and the xenon lamp component includes connecting rod and xenon source, described Small end is fixed on the upper cover lower face, and the xenon source is set on the connecting rod lower end surface, the xenon source Above tested electrical and electronic component, the connecting rod upper cover elongation or can be shunk relatively, and the xenon source removes Tested electrical and electronic component is done outside burn-in test, also temperature in the test barrel can be controlled;
Control system, the control system include temperature control unit and temperature sensing unit, and the temperature sensing unit is set to In the test barrel and at tested electrical and electronic component, and for detecting the temperature ring residing for tested electrical and electronic component Border, and detected temperature information is passed into the temperature control unit, the temperature control unit is according to the temperature The temperature information that sensing unit is sent controls the xenon source and adjusts temperature.
2. multitask electronic apparatus xenon lamp mechanism for testing as described in claim 1, which is characterized in that the xenon source center Locate the loop configuration with a circular hole, and be fixed on the connecting rod lower end surface, runs through the upper surface and lower face of the connecting rod It is equipped with straight slot along the length direction of the connecting rod, is equipped with spray tube in the straight slot, the spray tube is connected with nozzle, the spray Mouth is set at the circular hole of the xenon source centre.
3. multitask electronic apparatus xenon lamp mechanism for testing as described in claim 1, which is characterized in that the connecting rod lower end surface High temperature resistant heat insulation layer is additionally provided between the xenon source.
4. multitask electronic apparatus xenon lamp mechanism for testing as described in claim 1, which is characterized in that wear the upper end of the connecting rod It crosses the upper cover and is connected with stepper motor, the stepper motor is electrically connected with the control system, and the stepper motor is solid Due on the upper lid, the control system can drive the stepper motor drive the relatively described upper cover elongation of the connecting rod or It shrinks.
5. multitask electronic apparatus xenon lamp mechanism for testing as described in claim 1, which is characterized in that the test barrel is in a tubular form Structure, and the test barrel inner wall is provided with insulation construction layer.
6. multitask electronic apparatus xenon lamp mechanism for testing as described in claim 1, which is characterized in that described in the upper cover corresponds to The upper end of test cylinder is provided with the first groove, and the salable heat preservation ground in upper end of the test barrel is fixed on first groove It is interior.
7. multitask electronic apparatus xenon lamp mechanism for testing as described in claim 1, which is characterized in that described in the pedestal corresponds to The lower end of test barrel is provided with the second groove, and the lower end heat preservation ground of the test barrel is fixed in second groove.
8. multitask electronic apparatus xenon lamp mechanism for testing as claimed in claim 3, which is characterized in that further include shell and display Device, the display device are set to the outer wall of the shell, and the test barrel, pedestal and xenon lamp component are set to the shell Interior, the display device is connect with the temperature control unit, and the temperature control unit believes the temperature in the test barrel Breath is sent to the display device and is shown.
CN201721855009.6U 2017-12-26 2017-12-26 Multitask electronic apparatus xenon lamp mechanism for testing Active CN207636684U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201721855009.6U CN207636684U (en) 2017-12-26 2017-12-26 Multitask electronic apparatus xenon lamp mechanism for testing

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Application Number Priority Date Filing Date Title
CN201721855009.6U CN207636684U (en) 2017-12-26 2017-12-26 Multitask electronic apparatus xenon lamp mechanism for testing

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108051684A (en) * 2017-12-26 2018-05-18 华测检测认证集团股份有限公司 Multitask multi-temperature section is carried out at the same time automotive material aging test equipment

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108051684A (en) * 2017-12-26 2018-05-18 华测检测认证集团股份有限公司 Multitask multi-temperature section is carried out at the same time automotive material aging test equipment

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GR01 Patent grant
GR01 Patent grant
TR01 Transfer of patent right

Effective date of registration: 20200827

Address after: 201206 new Jinqiao Road, Pudong New Area, Shanghai 1996

Patentee after: Shanghai China Testing Technology Co.,Ltd.

Address before: 518101 C building, Hongwei Industrial Park, 70 District, Guangdong, Shenzhen, Baoan District

Patentee before: CENTRE TESTING INTERNATIONAL GROUP Co.,Ltd.

TR01 Transfer of patent right