CN207336676U - Inspection apparatus for determining the quality of conductive patterns - Google Patents

Abstract

An inspection apparatus for determining whether a conductive pattern is good or bad, the conductive pattern having a plurality of parallel patterns, and each of the parallel patterns having a first end and a second end, the inspection apparatus comprising: a power supply sensor receiving a direct current voltage from a direct current power source, the power supply sensor being coupled to a specific one of the parallel patterns and providing a direct current check signal to the first end of the specific parallel pattern; a charge amplifier; and a power receiving sensor coupled to the second end of the specific parallel pattern, the power receiving sensor being electrically connected to the charge amplifier and outputting a reception waveform to the charge amplifier to indicate whether the specific parallel pattern is good or bad, the inspection apparatus determining whether the conductive pattern is good or bad based on whether the specific parallel pattern is good or bad.

Description

Inspection equipment for judging the quality of conductive patterns

technical field

The utility model relates to an inspection device for judging the quality of a conductive pattern, in particular to an inspection device for judging the quality of a conductive pattern of a glass substrate for a liquid crystal display.

Background technique

After forming a conductive pattern on a glass substrate such as a liquid crystal display, it is necessary to check whether it is good or not. That is to say, the conduction or disconnection of the plurality of parallel striped patterns (or the plurality of mutually non-conductive sub-patterns) included in the conductive pattern needs to be detected one by one by inspection equipment.

The above-mentioned inspection equipment is important in fields with conductive patterns such as liquid crystal displays, and how to make it more sophisticated is a problem worth pondering.

Therefore, the applicant of the utility model considered the idea of improving the utility model in view of the deficiency of the conventional technology, and finally completed the "inspection equipment for judging whether the conductive pattern is good or bad" of the utility model.

Utility model content

The main purpose of the present invention is to provide an inspection device for judging whether a conductive pattern is good or not, so as to improve the reliability of the inspection device and reduce the related production and manufacturing costs of the inspection device with a simpler configuration.

Another main purpose of the present utility model is to provide an inspection device for judging whether a conductive pattern is good or bad, wherein the conductive pattern has a plurality of parallel patterns, and each of the parallel patterns has a first end, a midpoint, and a second end. Two terminals, the inspection device includes: a DC power supply, which provides a DC voltage; a power supply sensor, which receives the DC voltage, is coupled to a specific parallel pattern among the plurality of parallel patterns, and is connected to all of the specific parallel patterns. There is a preset first distance between the first ends, and an applied waveform is provided to the first ends, wherein a first capacitance value is formed between the power supply sensor and the first end due to the DC voltage, and The midpoint of the specific parallel pattern and the ground are charged to have a second capacitance value due to the first capacitance value; a charge amplifier; and a charged sensor, which is electrically connected to the charge amplifier and coupled to the The second end of the specific parallel pattern has a preset second distance from the second end, and the second end has a third capacitance value due to the second capacitance value, and the output receives waveform to the charge amplifier, wherein the charge amplifier indicates whether the specific parallel pattern is good or bad based on the received waveform, and the inspection device determines whether the conductive pattern is good or bad based on the good or bad of the specific parallel pattern Bad.

Another main purpose of the present utility model is to provide an inspection device for judging the quality of a conductive pattern, wherein the conductive pattern has a plurality of parallel patterns, and each of the parallel patterns has a first end and a second end , the inspection device includes: a power supply sensor, which receives a DC voltage from a DC power source, is coupled to a specific parallel pattern among the plurality of parallel patterns and provides a DC inspection signal to the first end of the specific parallel pattern; a charge amplifier; and a powered sensor, which is coupled to the second end of the specific parallel pattern, electrically connected to the charge amplifier, and outputs a receiving waveform to the charge amplifier to indicate whether the specific parallel pattern is good or bad , and the inspection device judges whether the conductive pattern is good or bad based on the good or bad of the specific parallel pattern.

The next main purpose of the present utility model is to provide an inspection device for judging whether a conductive pattern is good or bad, wherein the conductive pattern has a plurality of sub-patterns that are not conductive to each other, and each of the sub-patterns has a first end and a second end, the inspection device includes: a power supply sensor, which receives a DC voltage from a DC power supply, is coupled to a specific sub-pattern among the plurality of sub-patterns and provides a DC inspection signal to all of the specific sub-patterns the first end; a charge amplifier; and a powered sensor, which is coupled to the second end of the specific sub-pattern, electrically connected to the charge amplifier, and outputs a receiving waveform to the charge amplifier to indicate the specific The quality of the sub-pattern, and the inspection device judges the quality of the conductive pattern based on the quality of the specific sub-pattern.

In order to make the above-mentioned purpose, features and advantages of the present invention more comprehensible, preferred embodiments are specifically cited below, together with the accompanying drawings.

Description of drawings

FIG. 1 is a schematic diagram showing a plurality of parallel patterns of conductive patterns sequentially detected one by one by an inspection device according to a preferred embodiment conceived by the present invention.

FIG. 2 is a schematic view showing that the inspection apparatus coupled to a specific parallel pattern of the detected conductive pattern using a preferred embodiment of the present invention concept.

FIG. 3 is a circuit diagram corresponding to the equivalent circuit of FIG. 2 .

FIG. 4A is a schematic circuit diagram showing that the inspection device of the preferred embodiment conceived by the present invention is coupled to a specific parallel pattern of the detected conductive pattern and the two ends of the specific parallel pattern are connected to each other.

FIG. 4B is a schematic circuit diagram showing that the inspection device of the preferred embodiment conceived by the present invention is coupled to a specific parallel pattern of the detected conductive pattern and the two ends of the specific parallel pattern are disconnected from each other.

Detailed ways

The idea of this utility model is to propose an inspection device, by providing a direct current inspection signal (with an applied waveform) to one end of one of a plurality of parallel stripe patterns (Pattern) provided on a glass substrate such as a liquid crystal display, At the other end corresponding to the specific parallel stripe pattern, analyze whether the specific parallel stripe pattern is on or off according to the detected signal (with the received waveform), thereby judging whether the conductive pattern is good or bad.

FIG. 1 is a schematic diagram showing a plurality of parallel patterns of conductive patterns sequentially detected one by one by an inspection device according to a preferred embodiment conceived by the present invention. As shown in Fig. 1, the inspection equipment includes a power supply sensor 11 and a power receiving sensor 12, and the inspection equipment detects whether the left and right ends of each parallel pattern 21 of the conductive pattern 2 are connected to each other one by one in the direction indicated by the arrow. conduction or has an open circuit.

FIG. 2 is a schematic view showing that the inspection device of the preferred embodiment of the present invention is coupled to a specific parallel pattern of the detected conductive pattern. In FIG. 2 , an inspection device 1 includes a DC power supply 10 , a power supply sensor 11 , a power reception sensor 12 , and a charge amplifier 13 .

As shown in FIG. 2, in the inspection apparatus 1 for judging whether the conductive pattern is good or bad, the conductive pattern (see the conductive pattern 2 shown in FIG. 1) has a plurality of parallel patterns 21, and each parallel pattern 21 has a first end , the midpoint, and the second end. The DC power supply 10 of the inspection device 1 supplies a DC voltage, which is received by the supply sensor 11 . The power supply sensor 11 is coupled to a specific parallel pattern 21 among the plurality of parallel patterns, has a preset first distance from the first end of the specific parallel pattern 21 and provides an applied waveform (which is a DC inspection signal) to the first end. Wherein, a first capacitance value is formed between the power supply sensor 11 and the first end due to a DC voltage (there is a first equivalent capacitance C1 between the power supply sensor 11 and the first end), and the midpoint of the specific parallel pattern is connected to the ground due to the first capacitance C1. A capacitance value is charged to have a second capacitance value (a second equivalent capacitance C2 exists between the midpoint of the specific parallel pattern and the ground). The powered sensor 12 is electrically connected to the charge amplifier 13 and coupled to the second end of the specific parallel pattern 21. There is a preset second distance between the powered sensor 12 and the second end, and there is a second capacitance between the powered sensor 12 and the second end. It has a third capacitance value (a third equivalent capacitance C3 between the powered sensor 12 and the second terminal) and outputs the received waveform to the charge amplifier 13 . The charge amplifier 13 can indicate whether the specific parallel pattern 21 is good or bad based on the received waveform, and the inspection device 1 determines whether the conductive pattern 2 is good or bad based on the good or bad of the specific parallel pattern 21 . That is to say, when it is found that all the first ends of the plurality of parallel patterns 21 are connected to the corresponding second ends through one by one inspection, then the conductive pattern 2 is normal (or good). . And when at least one of the parallel patterns 21 has an open circuit between the first end and the corresponding second end, the conductive pattern is abnormal (or broken).

FIG. 3 is a circuit diagram corresponding to the equivalent circuit of FIG. 2 . 3 shows that there is a first equivalent capacitance C1 between the DC power supply 10 and the specific parallel pattern 21, a second equivalent capacitance C2 between the specific parallel pattern 21 and the ground, and a third capacitance C2 between the specific parallel pattern 21 and the charge amplifier 13. Equivalent capacitance C3.

FIG. 4A is a schematic circuit diagram showing that the inspection device of the preferred embodiment conceived by the present invention is coupled to a specific parallel pattern of the detected conductive pattern and the two ends of the specific parallel pattern are connected to each other. As mentioned above, each specific parallel pattern 21 is a pattern in a plurality of parallel striped patterns (in different preferred embodiments, it can also be one of a plurality of mutually non-conductive sub-patterns), The conductive pattern 2 is disposed, for example, on a glass substrate included in a liquid crystal display. The power supply sensor 11 provides an applied waveform to the specific parallel pattern 21 , and the power receiving sensor 12 receives the reception waveform from the specific parallel pattern 21 .

The applied waveform shown in FIG. 4A is a step function waveform with a potential greater than zero, and the received waveform shown in FIG. 4A has a rising edge and a rise time greater than zero. When the received waveform has a rising edge and a rising time greater than zero, the first end and the second end of the specific parallel pattern 21 are normally connected.

FIG. 4B is a schematic circuit diagram showing that the inspection device of the preferred embodiment conceived by the present invention is coupled to a specific parallel pattern of the detected conductive pattern and the two ends of the specific parallel pattern are disconnected from each other. Likewise, the power supply sensor 11 provides an applied waveform to the specific parallel pattern 21 , and the power receiving sensor 12 receives the reception waveform from the specific parallel pattern 21 .

The applied waveform shown in FIG. 4B is also a waveform shown by a step function with a potential greater than zero, and the received waveform shown in FIG. 4B is a zero state response. When the received waveform is a zero-state response (which has a zero potential), it can be known that there is an open circuit between the first end and the second end of the specific parallel pattern 21 .

Example:

1. An inspection device for judging whether a conductive pattern is good or bad, wherein the conductive pattern has a plurality of parallel patterns, and each of the parallel patterns has a first end, a midpoint, and a second end,

The inspection equipment includes:

a DC power supply that provides a DC voltage;

A power supply sensor, which receives the DC voltage, is coupled to a specific parallel pattern among the plurality of parallel patterns, and there is a preset first distance between the power supply sensor and the first end of the specific parallel pattern, and providing an applied waveform to the first end, wherein a first capacitance value is formed between the power supply sensor and the first end due to the DC voltage, and the midpoint of the specific parallel pattern is connected to ground due to the first capacitance value is charged to have a second capacitance value;

charge amplifier; and

A powered sensor, which is electrically connected to the charge amplifier and coupled to the second end of the specific parallel pattern, has a preset second distance between the powered sensor and the second end, and is connected to the charged amplifier. The second terminal has a third capacitance value due to the second capacitance value, and outputs a received waveform to the charge amplifier, wherein the charge amplifier indicates whether the specific parallel pattern is good or bad based on the received waveform , and the inspection device judges whether the conductive pattern is good or bad based on the good or bad of the specific parallel pattern.

2. The inspection device according to embodiment 1, wherein each of the parallel patterns is a pattern of parallel stripes, the conductive pattern is arranged on a glass substrate included in the liquid crystal display, and the applied waveform is greater than The waveform shown by the step function of the potential of zero, when the received waveform is a zero state response, there is an open circuit between the first end and the second end of the specific parallel pattern, and when the received waveform has When the rising edge and the rising time are greater than zero, the first end and the second end of the specific parallel pattern are normally connected.

3. The inspection device according to embodiment 1 or 2, further comprising a first equivalent capacitance, a second equivalent capacitance and a third equivalent capacitance, wherein the first equivalent capacitance has the first capacitance value and electrically connected between the power supply sensor and the first end of the specific parallel pattern, the second equivalent capacitor has the second capacitance value and is electrically connected to the center of the specific parallel pattern Between the point and the ground, the third equivalent capacitor has the third capacitance value and is electrically connected between the powered sensor and the second end of the specific parallel pattern.

4. The inspection device according to any one of the above embodiments, wherein when the first end of at least one of the parallel patterns and the corresponding second end are disconnected, then the The above conductive pattern is abnormal.

5. The inspection device according to any one of the above embodiments, wherein when all the first ends of the plurality of parallel patterns are connected to the corresponding second ends, the conductive Patterns are normal.

6. The inspection device according to any one of the above embodiments, wherein each of the plurality of parallel patterns is sequentially inspected to see if they are normal.

7. An inspection device for judging whether a conductive pattern is good or bad, wherein the conductive pattern has a plurality of parallel patterns, and each of the parallel patterns has a first end and a second end,

The inspection equipment includes:

a powered sensor, which receives a DC voltage from a DC power source, is coupled to a specific parallel pattern among the plurality of parallel patterns and provides a DC check signal to the first end of the specific parallel pattern;

charge amplifier; and

A powered sensor, coupled to the second end of the specific parallel pattern, electrically connected to the charge amplifier, and outputs a receiving waveform to the charge amplifier to indicate whether the specific parallel pattern is good or bad, and the The inspection device judges whether the conductive pattern is good or bad based on the good or bad of the specific parallel pattern.

8. The inspection device according to embodiment 7, wherein each of the parallel patterns further includes a midpoint, the DC inspection signal is a signal represented by a step function having a potential greater than zero, and the power supply sensor and the There is a preset first distance between the first ends of the specific parallel patterns, a first capacitance value is formed between the power supply sensor and the first ends of the specific parallel patterns, and the specific parallel patterns The midpoint and the ground are charged to have a second capacitance value due to the first capacitance value, there is a preset second distance between the charged sensor and the second end of the specific parallel pattern, and the There is a third capacitance value between the powered sensor and the second end of the specific parallel pattern due to the second capacitance value.

9. The inspection device according to embodiment 7 or 8, wherein, when the first ends of all the plurality of parallel patterns are connected to the corresponding second ends, the conductive pattern is normal.

10. The inspection device according to any one of the above embodiments, wherein when the first end of at least one of the parallel patterns and the corresponding second end are disconnected, then the The above conductive pattern is abnormal.

11. An inspection device for judging whether a conductive pattern is good or bad, wherein the conductive pattern has a plurality of sub-patterns that are not electrically conductive to each other, and each of the sub-patterns has a first end and a second end,

The inspection equipment includes:

a power sensor receiving a DC voltage from a DC power source, coupled to a specific sub-pattern among the plurality of sub-patterns and providing a DC check signal to the first end of the specific sub-pattern;

charge amplifier; and

a powered sensor, coupled to the second end of the specific sub-pattern, electrically connected to the charge amplifier, and outputs a received waveform to the charge amplifier to indicate whether the specific sub-pattern is good or bad, and the The inspection device judges whether the conductive pattern is good or bad based on the good or bad of the specific sub-pattern.

To sum up, the utility model provides an inspection device for judging whether a conductive pattern is good or bad, which improves the reliability of the inspection device and reduces the related production and manufacturing costs of the inspection device with a simpler configuration.

Finally, various modifications and improvements made by those skilled in the art based on the above-mentioned embodiments are included in the protection scope of the claims of the present application.

Claims (11)

1. An inspection device for judging whether a conductive pattern is good or bad, characterized in that, The conductive pattern has a plurality of parallel patterns, and each of the parallel patterns has a first end, a midpoint, and a second end, The inspection equipment includes: a DC power supply that provides a DC voltage; A power supply sensor, which receives the DC voltage, is coupled to a specific parallel pattern among the plurality of parallel patterns, and there is a preset first distance between the power supply sensor and the first end of the specific parallel pattern, and providing an applied waveform to the first end, wherein a first capacitance value is formed between the power supply sensor and the first end due to the DC voltage, and the midpoint of the specific parallel pattern is connected to ground due to the first capacitance value is charged to have a second capacitance value; charge amplifier; and A powered sensor, which is electrically connected to the charge amplifier and coupled to the second end of the specific parallel pattern, there is a preset second distance between the powered sensor and the second end, and the powered sensor having a third capacitance value between the electrical sensor and the second terminal due to the second capacitance value and outputting a received waveform to the charge amplifier, wherein the charge amplifier indicates the specific parallel pattern based on the received waveform is good or bad, and the inspection device determines whether the conductive pattern is good or bad based on the good or bad of the specific parallel pattern. 2. Inspection apparatus according to claim 1, characterized in that, Each of the parallel patterns is a pattern of parallel strips, The conductive pattern is arranged on the glass substrate included in the liquid crystal display, The applied waveform is a waveform shown by a step function having a potential greater than zero, When the received waveform is a zero-state response, there is an open circuit between the first end and the second end of the specific parallel pattern, and when the received waveform has a rising edge and a rise time greater than zero, the The first end and the second end of the specific parallel pattern are in normal communication. 3. Inspection apparatus according to claim 1, characterized in that, The inspection device also includes a first equivalent capacitor, a second equivalent capacitor, and a third equivalent capacitor, The first equivalent capacitance has the first capacitance value and is electrically connected between the power supply sensor and the first end of the specific parallel pattern, The second equivalent capacitance has the second capacitance value and is electrically connected between the midpoint of the specific parallel pattern and the ground, The third equivalent capacitor has the third capacitance value and is electrically connected between the powered sensor and the second end of the specific parallel pattern. 4. Inspection apparatus according to claim 3, characterized in that, When the first end and the corresponding second end of at least one of the parallel patterns is disconnected, the conductive pattern is abnormal. 5. Inspection apparatus according to claim 3, characterized in that, When all the first ends of the plurality of parallel patterns are connected to the corresponding second ends, the conductive pattern is normal. 6. Inspection apparatus according to claim 3, characterized in that, Each of the plurality of parallel patterns is sequentially checked whether it is normal. 7. An inspection device for judging whether a conductive pattern is good or bad, characterized in that, The conductive pattern has a plurality of parallel patterns, and each of the parallel patterns has a first end and a second end, The inspection equipment includes: a power supply sensor, which receives a DC voltage from a DC power source, is coupled to a specific parallel pattern among the plurality of parallel patterns and provides a DC check signal to the first end of the specific parallel pattern; charge amplifier; and a powered sensor coupled to the second end of the specific parallel pattern, the powered sensor is electrically connected to the charge amplifier, and outputs a receiving waveform to the charge amplifier to indicate the specific parallel pattern bad, and the inspection device determines whether the conductive pattern is good or bad based on the good or bad of the specific parallel pattern. 8. Inspection apparatus according to claim 7, characterized in that, Each of said parallel patterns also includes a midpoint, The DC check signal has a signal shown by a step function of a potential greater than zero, There is a preset first distance between the power supply sensor and the first end of the specific parallel pattern, and a first capacitance value is formed between the power supply sensor and the first end of the specific parallel pattern, the midpoint of the specific parallel pattern and ground are charged to have a second capacitance value due to the first capacitance value, There is a preset second distance between the powered sensor and the second end of the specific parallel pattern, and the distance between the powered sensor and the second end of the specific parallel pattern is due to the second The capacitance value has a third capacitance value. 9. Inspection apparatus according to claim 8, characterized in that, When the first ends of all the parallel patterns are connected to the corresponding second ends, the conductive patterns are normal. 10. Inspection apparatus according to claim 9, characterized in that, When the first end and the corresponding second end of at least one of the parallel patterns is disconnected, the conductive pattern is abnormal. 11. An inspection device for judging whether a conductive pattern is good or bad, characterized in that, The conductive pattern has a plurality of sub-patterns that are not conductive to each other, and each of the sub-patterns has a first end and a second end, The inspection equipment includes: a power supply sensor, which receives a DC voltage from a DC power source, the power supply sensor is coupled to a specific sub-pattern among the plurality of sub-patterns and provides a DC check signal to the first end of the specific sub-pattern; charge amplifier; and a powered sensor coupled to the second end of the specific sub-pattern, the powered sensor is electrically connected to the charge amplifier, and outputs a received waveform to the charge amplifier to indicate the quality of the specific sub-pattern bad, the inspection device judges whether the conductive pattern is good or bad based on the good or bad of the specific sub-pattern.