CN207282518U - A kind of arc line shaped N electrode and light emitting diode (LED) chip with vertical structure - Google Patents
A kind of arc line shaped N electrode and light emitting diode (LED) chip with vertical structure Download PDFInfo
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- CN207282518U CN207282518U CN201720393121.6U CN201720393121U CN207282518U CN 207282518 U CN207282518 U CN 207282518U CN 201720393121 U CN201720393121 U CN 201720393121U CN 207282518 U CN207282518 U CN 207282518U
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Abstract
本实用新型公开了一种弧线形N电极,包括插指和焊盘;所述焊盘为长方形;所述插指由中心区域插指及边缘多边形插指组成;所述边缘多边形插指同时为左右对称、上下对称结构;所述中心区域插指由垂直插指和一根弧线形插指组成;所述中心区域插指和焊盘相连组成弧线形插指,所述弧线形插指位于边缘多边形插指内部,所述边缘多边形插指与焊盘顶部长边相连,与垂直插指或弧线形插指底部相连。本实用新型的弧线形N电极,很大程度上改善了传统米字型、十字型N电极电流分布不均,吸光严重的问题。本实用新型还公开了一种垂直结构LED芯片,包括所述的弧线形N电极,克服了横向结构LED芯片的电流拥挤的缺点,极大的改善了电流在芯片内传输的均匀性。
The utility model discloses an arc-shaped N electrode, which comprises an insertion finger and a welding pad; the welding pad is rectangular; the insertion finger is composed of a central area insertion finger and an edge polygon insertion finger; the edge polygon insertion finger is simultaneously It is a left-right symmetrical and up-and-down symmetrical structure; the central area insert finger is composed of a vertical insert finger and an arc-shaped insert finger; the central area insert finger is connected with a pad to form an arc-shaped insert finger, The insert fingers are located inside the edge polygon insert fingers, and the edge polygon insert fingers are connected to the long side of the top of the pad and connected to the bottom of the vertical or arc-shaped insert fingers. The arc-shaped N electrode of the utility model greatly improves the problems of uneven current distribution and serious light absorption of traditional rice-shaped and cross-shaped N electrodes. The utility model also discloses a vertical structure LED chip, including the arc-shaped N electrode, which overcomes the shortcoming of current crowding of the horizontal structure LED chip, and greatly improves the uniformity of current transmission in the chip.
Description
技术领域technical field
本实用新型涉及LED制造领域,特别涉及一种弧线形N电极及垂直结构LED芯片。The utility model relates to the field of LED manufacturing, in particular to an arc-shaped N electrode and a vertical LED chip.
背景技术Background technique
随着LED在照明领域的逐步应用,市场对白光LED光效的要求越来越高,GaN基垂直结构LED具有良好的散热能力,能够承受大电流注入,这样一个垂直结构LED芯片可以相当于几个正装结构芯片,折合成本只有正装结构的几分之一。因此,GaN基垂直结构LED是市场所向,是半导体照明发展的必然趋势。与传统的平面结构LED相比,垂直结构LED具有许多优点:垂直结构LED两个电极分别在LED的两侧,电流几乎全部垂直流过外延层,没有横向流动的电流,电流分布均匀,产生的热量减少;采用键合与剥离的方法将导热不好的蓝宝石衬底去除,换成导电性好并且具有高热导率的衬底,可有效地散热;n-GaN层为出光面,该层具有一定的厚度,便于制作表面微结构,以提高光提取效率。总之,与传统平面结构相比,垂直结构在出光、散热等方面具有明显的优势。With the gradual application of LEDs in the field of lighting, the market has higher and higher requirements for the light efficiency of white LEDs. GaN-based vertical structure LEDs have good heat dissipation capabilities and can withstand large current injections. Such a vertical structure LED chip can be equivalent to several The conversion cost is only a fraction of the formal structure chip. Therefore, GaN-based vertical structure LEDs are the direction of the market and an inevitable trend in the development of semiconductor lighting. Compared with the traditional planar structure LED, the vertical structure LED has many advantages: the two electrodes of the vertical structure LED are on both sides of the LED, the current almost all flows vertically through the epitaxial layer, there is no lateral flow of current, the current distribution is uniform, and the resulting The heat is reduced; the sapphire substrate with poor thermal conductivity is removed by bonding and stripping, and replaced with a substrate with good electrical conductivity and high thermal conductivity, which can effectively dissipate heat; the n-GaN layer is the light-emitting surface, which has A certain thickness is convenient for making surface microstructures to improve light extraction efficiency. In short, compared with the traditional planar structure, the vertical structure has obvious advantages in light extraction and heat dissipation.
随着半导体技术的高速发展,LED的内部量子效率能达到90%以上,而外部量子效率的提高并不显著,受到诸多因素的影响,如LED结构,电极形状,电极材料,电流扩展层厚度等,成为制约LED发光效率提高的主导因素。相对于其他提高LED亮度的方法(如高反射膜,衬底剥离,表面粗化等)而言,最易操作的是对芯片的电极形状进行优化,电极形状对光输出影响很大,如果电流扩散不充分、不均匀,会导致出光减少,通过合理设计电极的形状可以提高LED的发光效率。With the rapid development of semiconductor technology, the internal quantum efficiency of LED can reach more than 90%, while the improvement of external quantum efficiency is not significant, which is affected by many factors, such as LED structure, electrode shape, electrode material, current spreading layer thickness, etc. , has become the dominant factor restricting the improvement of LED luminous efficiency. Compared with other methods of improving LED brightness (such as high reflective film, substrate peeling, surface roughening, etc.), the easiest to operate is to optimize the electrode shape of the chip, which has a great influence on the light output. If the current Insufficient and uneven diffusion will lead to a decrease in light output, and the luminous efficiency of the LED can be improved by rationally designing the shape of the electrode.
理论上,在离电极越远的地方,电流越小,亮度越低。对于现有垂直电极结构技术,传统认为电极形状为“十”字形或“米”字形状的LED芯片的I-V性能最好。但“十”字形或“米”字形电极在芯片中心部分,由于电极比较集中,电流也相对比较集中,这样导致LED电流分布不够均匀,尤其是到台面的边缘部分,电流分布极不均匀,使得边缘部分的亮度很小。在中心圆形电极周围及插指附近,电流拥挤,在芯片边缘部分,电流小。电流趋势从中间到边缘越来越小,亮度也是越来越弱。In theory, the farther away from the electrode, the smaller the current and the lower the brightness. For the existing vertical electrode structure technology, it is traditionally believed that the I-V performance of LED chips with electrode shapes in the shape of "ten" or "m" is the best. However, the "ten" or "m"-shaped electrodes are in the center of the chip. Since the electrodes are relatively concentrated, the current is also relatively concentrated, which leads to uneven distribution of LED current, especially to the edge of the table. The current distribution is extremely uneven, making The brightness of the edge part is very small. Around the central circular electrode and near the fingers, the current is crowded, and at the edge of the chip, the current is small. The current trend is getting smaller and smaller from the middle to the edge, and the brightness is getting weaker and weaker.
一般在制作垂直结构LED时,通常使用金属银作为反射层,但是由于Ag的易扩散,会制作一层电流阻挡层(barrier)包裹住反射层,每一个芯片周围会有大概5μm~10μm区域没有反射层(如图1),在图1中,反射层20被电流阻挡层10包围,由于反射层20用于反射光线,而阻挡层10由于材料限制,反射光线极弱,导致该区域反射光线会有很大部分损失,而在蒸镀上一般的“十”字形或“米”字形N电极后,此区域电流分布也不均匀,对出光贡献也大大减小。Generally, when making vertical structure LEDs, metal silver is usually used as the reflective layer, but due to the easy diffusion of Ag, a current blocking layer (barrier) will be made to wrap the reflective layer, and there will be about 5 μm to 10 μm around each chip. Reflective layer (as shown in Figure 1), in Figure 1, the reflective layer 20 is surrounded by the current blocking layer 10, because the reflective layer 20 is used to reflect light, and the blocking layer 10 is extremely weak due to material limitations, causing this area to reflect light There will be a large part of the loss, and after the general "cross" or "m" shaped N electrode is evaporated, the current distribution in this area is not uniform, and the contribution to light emission is also greatly reduced.
实用新型内容Utility model content
为了克服现有技术的上述缺点与不足,本实用新型的目的在于提供一种弧线形N电极,很大程度上改善了传统米字型、十字型N电极电流分布不均,吸光严重的问题。In order to overcome the above-mentioned shortcomings and deficiencies of the prior art, the purpose of this utility model is to provide an arc-shaped N electrode, which greatly improves the problems of uneven current distribution and serious light absorption of traditional rice-shaped and cross-shaped N electrodes. .
本实用新型的另一目的在于提供一种垂直结构LED芯片,克服了横向结构LED芯片的电流拥挤的缺点,极大的改善了电流在芯片内传输的均匀性。Another object of the present invention is to provide a vertical structure LED chip, which overcomes the shortcoming of current crowding of the horizontal structure LED chip, and greatly improves the uniformity of current transmission in the chip.
本实用新型的目的通过以下技术方案实现:The purpose of this utility model is achieved through the following technical solutions:
一种弧线形N电极,包括插指和焊盘;所述焊盘为长方形;所述插指由中心区域插指及边缘多边形插指组成;An arc-shaped N electrode, including an insert finger and a pad; the pad is rectangular; the insert finger is composed of a central area insert finger and an edge polygon insert finger;
所述边缘多边形插指同时为左右对称结构、上下对称结构;The edge polygonal insert finger is a left-right symmetrical structure and an up-down symmetrical structure at the same time;
所述焊盘和中心区域插指位于边缘多边形插指内部,均为左右对称结构,对称轴为边缘多边形插指的左右对称轴;所述中心区域插指的顶端与焊盘相接,并与焊盘长边垂直,底端与边缘多边形插指相接;The pad and the central area finger are located inside the edge polygonal finger, and both have left-right symmetrical structures, and the axis of symmetry is the left-right axis of symmetry of the edge polygonal finger; the top of the central area finger is in contact with the pad, and The long side of the pad is vertical, and the bottom end is in contact with the edge polygonal finger;
所述中心区域插指包括弧线形插指和垂直插指;所述垂直插指位于边缘多边形插指的左右对称轴上。The central area fingers include arc-shaped fingers and vertical fingers; the vertical fingers are located on the left and right symmetry axes of the edge polygon fingers.
所述中心区域插指由两根垂直插指及一个圆环插指组成,所述圆环插指关于边缘多边形插指的左右对称轴对称;第一垂直插指连接圆环插指和焊盘;第二垂直插指连接圆环插指和边缘多边形插指。The center region insert finger is composed of two vertical insert fingers and a ring insert finger, and the ring insert finger is symmetrical about the left-right symmetry axis of the edge polygon insert finger; the first vertical insert finger connects the ring insert finger and the pad ; The second vertical finger connects the ring finger and the edge polygon finger.
所述圆环插指的半径范围是150um-250um。The radius range of the ring finger is 150um-250um.
所述中心区域插指由一根垂直插指及一条曲线插指组成;所述垂直插指连接曲线插指和焊盘;所述曲线插指与边缘多边形插指相接;所述曲线插指为一条开口向下的抛物线。The central region insert finger is composed of a vertical insert finger and a curved insert finger; the vertical insert finger is connected to the curved insert finger and the pad; the curved insert finger is connected to the edge polygon insert finger; the curved insert finger is a parabola opening downwards.
所述抛物线的方程是为y2=kx,其中,0.5<k<2。The equation of the parabola is y 2 =kx, where 0.5<k<2.
所述插指的宽度范围为4μm~11μm;所述焊盘的长边边长范围是50μm-100μm,短边边长范围是30um-80um。The width of the insert fingers ranges from 4 μm to 11 μm; the length of the long side of the pad ranges from 50 μm to 100 μm, and the length of the short side ranges from 30 μm to 80 μm.
一种垂直结构LED芯片,包括所述的弧线形N电极。A vertical structure LED chip, including the arc-shaped N electrode.
所述的垂直结构LED芯片,由下至上依次包括p电极层、反射层、电流阻挡层、外延层及弧线形N电极,所述电流阻挡层的形状与弧线形N电极的形状构成相似图形,所述流阻挡层的尺寸比弧线形N电极的尺寸大18%~25%;所述外延层由下至上依次包括P-GaN、量子阱和N-GaN。The vertical structure LED chip includes a p-electrode layer, a reflective layer, a current blocking layer, an epitaxial layer, and an arc-shaped N electrode from bottom to top, and the shape of the current blocking layer is similar to that of the arc-shaped N electrode. The size of the flow blocking layer is 18%-25% larger than the size of the arc-shaped N electrode; the epitaxial layer includes P-GaN, quantum well and N-GaN sequentially from bottom to top.
所述p电极层由下至上依次包括种子层、键合层、掺杂硅衬底层、防氧化层。The p-electrode layer sequentially includes a seed layer, a bonding layer, a doped silicon substrate layer, and an anti-oxidation layer from bottom to top.
所述电流阻挡层的制备方法如下:The preparation method of the current blocking layer is as follows:
利用PECVD在P-GaN表面先生长一层SiO2,再匀一层正性光刻胶,用正胶光刻板曝光与弧线形N电极图案垂直投影区域相对应部分的光刻胶,用BOE溶液洗掉曝光区的SiO2,以光刻胶为掩膜,使用ICP对曝光区域的GaN进行O2plasma表面轰击微处理,再使用全自动去胶机去除剩余光刻胶,再在处理过的表面进行反射镜,保护层等一系列金属层的生长,反射镜与P-GaN形成微处理过的区域形成肖特基接触,形成高势垒区,形成电流阻挡层。Use PECVD to first grow a layer of SiO 2 on the surface of P-GaN, and then evenly layer a layer of positive photoresist, use a positive photolithography plate to expose the photoresist corresponding to the vertical projection area of the arc-shaped N electrode pattern, and use BOE The solution washes away the SiO 2 in the exposed area, uses the photoresist as a mask, and uses ICP to perform O 2 plasma surface bombardment micro-treatment on the GaN in the exposed area, and then uses a fully automatic stripper to remove the remaining photoresist. A series of metal layers such as mirror and protective layer are grown on the surface of the mirror, and the mirror and P-GaN form a micro-processed area to form a Schottky contact, form a high barrier area, and form a current blocking layer.
与现有技术相比,本实用新型具有以下优点和有益效果:Compared with the prior art, the utility model has the following advantages and beneficial effects:
(1)本实用新型的弧线形N电极,很大程度上改善了传统米字型、十字型N电极电流分布不均,吸光严重的问题。弧线形中心区域简化了米字型和十字型图案的复杂性,电极中心区域的主要部分置于边缘,改善了电极的吸光问题;同时边缘多边形插指解决了十字型或米字型电极边缘部分电流较弱,分布较少的问题。(1) The arc-shaped N electrode of the utility model greatly improves the problems of uneven current distribution and serious light absorption of traditional rice-shaped and cross-shaped N electrodes. The arc-shaped central area simplifies the complexity of the P-shaped and cross-shaped patterns, and the main part of the central area of the electrode is placed on the edge, which improves the light absorption problem of the electrode; at the same time, the polygonal insert fingers on the edge solve the problem of cross-shaped or P-shaped electrode edges Part of the current is weaker and less problematic to distribute.
(2)本实用新型的垂直结构LED芯片克服了横向结构LED芯片的电流拥挤的缺点,极大的改善了电流在芯片内传输的均匀性。(2) The vertical structure LED chip of the present invention overcomes the shortcoming of current crowding of the horizontal structure LED chip, and greatly improves the uniformity of current transmission in the chip.
(3)本实用新型利用ICP刻蚀p型GaN部分区域接触形成肖特势垒高阻区,进而形成电流阻挡层的方法。在与N电极对应的垂直投影区域形成电流阻挡层的方法,代替了直接在N电极下方沉积SiO2作为电流阻挡层的方法,使电流更加充分的利用,更加充分的扩散到整个芯片。(3) The utility model utilizes the method of ICP etching a part of p-type GaN to contact to form a high-resistance region of Schott barrier, and then to form a current blocking layer. The method of forming a current blocking layer in the vertical projection area corresponding to the N electrode replaces the method of depositing SiO2 directly under the N electrode as a current blocking layer, so that the current can be more fully utilized and more fully diffused to the entire chip.
(4)本实用新型采用金属电极保护层替代SiO2防止Ag反射镜的扩散和氧化,并且反射光的能力大为增强,减小保护层对Ag反射镜反射效率的影响。(4) The utility model adopts a metal electrode protective layer to replace SiO 2 to prevent the diffusion and oxidation of the Ag reflector, and the ability to reflect light is greatly enhanced, reducing the influence of the protective layer on the reflection efficiency of the Ag reflector.
附图说明Description of drawings
图1为现有技术中P电极层包围反射层的结构示意图。FIG. 1 is a schematic structural diagram of a reflective layer surrounded by a P electrode layer in the prior art.
图2为本实用新型的实施例1的弧线形N电极的示意图。FIG. 2 is a schematic diagram of an arc-shaped N electrode in Embodiment 1 of the present invention.
图3为本实用新型的实施例1垂直结构LED芯片的截面示意图。3 is a schematic cross-sectional view of a vertical structure LED chip according to Embodiment 1 of the present invention.
图4为本实用新型的实施例2的弧线形N电极的示意图。FIG. 4 is a schematic diagram of an arc-shaped N electrode in Embodiment 2 of the present invention.
具体实施方式Detailed ways
下面结合实施例,对本实用新型作进一步地详细说明,但本实用新型的实施方式不限于此。The utility model will be described in further detail below in conjunction with the examples, but the implementation of the utility model is not limited thereto.
实施例1Example 1
如图2所示,本实施例的弧线形N电极,包括插指和焊盘11;所述焊盘为长方形;所述插指由中心区域插指及边缘多边形插指12组成;所述边缘多边形插指12为正方形;所述焊盘和中心区域插指位于边缘多边形插指内部,均为左右对称结构,对称轴为边缘多边形插指的左右对称轴;所述中心区域插指的顶端与焊盘相接,并与焊盘长边垂直,底端与边缘多边形插指相接。As shown in Figure 2, the arc-shaped N electrode of this embodiment includes an insertion finger and a pad 11; the pad is rectangular; the insertion finger is composed of a central area insertion finger and an edge polygonal insertion finger 12; The edge polygonal finger 12 is a square; the pad and the center region finger are located inside the edge polygon finger, both of which are left-right symmetrical structures, and the axis of symmetry is the left-right axis of symmetry of the edge polygon finger; the top of the center region finger It is in contact with the pad, and is perpendicular to the long side of the pad, and the bottom end is in contact with the edge polygonal finger.
所述中心区域插指由第一垂直插指13、第二垂直插指15和一根圆环形插指14组成。所述圆环插指关于边缘多边形插指的左右对称轴对称;第一垂直插、第二垂直插位于边缘多边形插指的左右对称轴上;第一垂直插指连接圆环插指和焊盘;第二垂直插指连接圆环插指和边缘多边形插指。The central area fingers are composed of a first vertical finger 13 , a second vertical finger 15 and a ring-shaped finger 14 . The circular ring finger is symmetrical about the left-right symmetry axis of the edge polygon finger; the first vertical plug and the second vertical finger are located on the left-right symmetry axis of the edge polygon finger; the first vertical finger connects the ring finger and the pad ; The second vertical finger connects the ring finger and the edge polygon finger.
本实施例的插指的宽度范围可为4μm~11μm;所述焊盘的长边边长范围是50μm-100μm,短边边长范围是30um-80um;所述圆环形插指的半径范围是150um-250um;所述N电极的材质为Al、Ti、Au、Ni或类似金属的一种或多种。The width range of the insert finger in this embodiment may be 4 μm to 11 μm; the length of the long side of the pad is 50 μm-100 μm, and the length of the short side is 30 um-80 um; the radius range of the circular insert finger 150um-250um; the material of the N electrode is one or more of Al, Ti, Au, Ni or similar metals.
如图3所示,本实施例的垂直结构LED芯片,由下至上依次包括p电极保护层100、反射层110、电流阻挡层120、外延层130及弧线形N电极140,所述电流阻挡层120的形状与弧线形N电极140的形状构成相似图形,所述流阻挡层120的尺寸比弧线形N电极140的尺寸大18%~25%。其中,所述外延层由下至上依次包括P-GaN131、量子阱132和N-GaN133。所述p电极保护层由下至上依次包括种子层、键合层、掺杂硅衬底层、防氧化层。As shown in Figure 3, the LED chip with a vertical structure in this embodiment includes a p-electrode protective layer 100, a reflective layer 110, a current blocking layer 120, an epitaxial layer 130, and an arc-shaped N electrode 140 from bottom to top. The shape of the layer 120 is similar to that of the arc-shaped N-electrode 140 , and the size of the flow-blocking layer 120 is 18%-25% larger than that of the arc-shaped N-electrode 140 . Wherein, the epitaxial layer includes P-GaN 131 , quantum well 132 and N-GaN 133 sequentially from bottom to top. The p-electrode protection layer sequentially includes a seed layer, a bonding layer, a doped silicon substrate layer, and an anti-oxidation layer from bottom to top.
本实施例的电流阻挡层的制备方法如下:The preparation method of the current blocking layer of the present embodiment is as follows:
利用PECVD在P-GaN表面先生长一层SiO2,再匀一层正性光刻胶,用正胶光刻板曝光与弧线形N电极图案垂直投影区域相对应部分的光刻胶,用BOE溶液洗掉曝光区的SiO2,以光刻胶为掩膜,使用ICP对曝光区域的GaN进行O2plasma表面轰击微处理,再使用全自动去胶机去除剩余光刻胶,再在处理过的表面进行反射镜,保护层等一系列金属层的生长,反射镜与P-GaN形成微处理过的区域形成肖特基接触,形成高势垒区,形成电流阻挡层。Use PECVD to first grow a layer of SiO 2 on the surface of P-GaN, and then evenly layer a layer of positive photoresist, use a positive photoresist plate to expose the photoresist corresponding to the vertical projection area of the arc-shaped N electrode pattern, and use BOE The solution washes away the SiO 2 in the exposed area, uses the photoresist as a mask, and uses ICP to perform O 2 plasma surface bombardment micro-treatment on the GaN in the exposed area, and then uses a fully automatic stripper to remove the remaining photoresist. A series of metal layers such as mirror and protective layer are grown on the surface of the mirror, and the mirror and P-GaN form a micro-processed area to form a Schottky contact, form a high barrier area, and form a current blocking layer.
在本实施例中,边缘多边形插指能够使电流在N-GaN面分布的更加均匀,提高发光和发热,增加LED芯片的发光效率,此外,由于圆环形插指形成在反光较强的电极保护层的正上方,不会降低较多的反射镜的反射效率。In this embodiment, the polygonal edge fingers can make the current distribution on the N-GaN surface more uniform, improve light emission and heat generation, and increase the luminous efficiency of the LED chip. Directly above the protective layer will not reduce the reflection efficiency of more mirrors.
实施例2Example 2
如图4所示,本实施例的弧线形N电极,包括插指和焊盘11;所述焊盘为长方形;所述插指由中心区域插指及边缘多边形插指12组成;所述边缘多边形插指12为正方形;所述焊盘和中心区域插指位于边缘多边形插指内部,均为左右对称结构,对称轴为边缘多边形插指的左右对称轴;所述中心区域插指的顶端与焊盘相接,并与焊盘长边垂直,底端与边缘多边形插指相接。As shown in Figure 4, the arc-shaped N electrode of this embodiment includes an insertion finger and a pad 11; the pad is rectangular; the insertion finger is composed of a central area insertion finger and an edge polygonal insertion finger 12; The edge polygonal finger 12 is a square; the pad and the center region finger are located inside the edge polygon finger, both of which are left-right symmetrical structures, and the axis of symmetry is the left-right axis of symmetry of the edge polygon finger; the top of the center region finger It is in contact with the pad, and is perpendicular to the long side of the pad, and the bottom end is in contact with the edge polygonal finger.
所述中心区域插指由一根垂直插指23和一根抛物线插指24组成。所述垂直插指位于边缘多边形插指的左右对称轴上,所述垂直插指连接抛物线插指插指和焊盘;所述抛物线插指与边缘多边形插指相接。The central area finger is composed of a vertical finger 23 and a parabolic finger 24 . The vertical fingers are located on the left and right symmetry axes of the edge polygon fingers, and the vertical fingers are connected to the parabolic fingers and the pads; the parabolic fingers are connected to the edge polygon fingers.
本实施例的插指的宽度范围可为4μm~11μm;所述焊盘的长边边长范围是50μm-100μm,短边边长范围是30um-80um;所述酒杯形插指的图形是曲线是抛物线y2=kx(0.5<k<2);所述N电极的材质为Al、Ti、Au、Ni或类似金属的一种或多种。The width of the insert finger in this embodiment can range from 4 μm to 11 μm; the length of the long side of the pad ranges from 50 μm to 100 μm, and the length of the short side ranges from 30 um to 80 um; the graph of the wine glass-shaped insert finger is a curve is a parabola y 2 =kx (0.5<k<2); the material of the N electrode is one or more of Al, Ti, Au, Ni or similar metals.
本实施例的垂直结构LED芯片,由下至上依次包括p电极保护层、反射层、电流阻挡层、外延层及弧线形N电极,所述电流阻挡层的形状与酒杯形N电极的形状构成相似图形,所述流阻挡层的尺寸比酒杯形N电极的尺寸大18%~25%。其中,所述外延层由下至上依次包括P-GaN、量子阱和N-GaN。所述p电极保护层由下至上依次包括种子层、键合层、掺杂硅衬底层、防氧化层。The vertical structure LED chip of this embodiment comprises a p-electrode protective layer, a reflective layer, a current blocking layer, an epitaxial layer, and an arc-shaped N electrode from bottom to top, and the shape of the current blocking layer is formed by the shape of the wine glass-shaped N electrode. Similar to the figure, the size of the flow blocking layer is 18%-25% larger than that of the wine glass-shaped N-electrode. Wherein, the epitaxial layer includes P-GaN, quantum well and N-GaN sequentially from bottom to top. The p-electrode protection layer sequentially includes a seed layer, a bonding layer, a doped silicon substrate layer, and an anti-oxidation layer from bottom to top.
本实施例的电流阻挡层的制备方法如下:The preparation method of the current blocking layer of the present embodiment is as follows:
利用PECVD在P-GaN表面先生长一层SiO2,再匀一层正性光刻胶,用正胶光刻板曝光与弧线形N电极图案垂直投影区域相对应部分的光刻胶,用BOE溶液洗掉曝光区的SiO2,以光刻胶为掩膜,使用ICP对曝光区域的GaN进行O2plasma表面轰击微处理,再使用全自动去胶机去除剩余光刻胶,再在处理过的表面进行反射镜,保护层等一系列金属层的生长,反射镜与P-GaN形成微处理过的区域形成肖特基接触,形成高势垒区,形成电流阻挡层。Use PECVD to first grow a layer of SiO 2 on the surface of P-GaN, and then evenly layer a layer of positive photoresist, use a positive photolithography plate to expose the photoresist corresponding to the vertical projection area of the arc-shaped N electrode pattern, and use BOE The solution washes away the SiO 2 in the exposed area, uses the photoresist as a mask, and uses ICP to perform O 2 plasma surface bombardment micro-treatment on the GaN in the exposed area, and then uses a fully automatic stripper to remove the remaining photoresist. A series of metal layers such as mirror and protective layer are grown on the surface of the mirror, and the mirror and P-GaN form a micro-processed area to form a Schottky contact, form a high barrier area, and form a current blocking layer.
在本实施例中,边缘多边形插指能够使电流在N-GaN面分布的更加均匀,提高发光和发热,增加LED芯片的发光效率,此外,由于抛物线插指形成在反光较强的电极保护层的正上方,不会降低较多的反射镜的反射效率。In this embodiment, the polygonal edge fingers can make the current distribution more uniform on the N-GaN surface, improve light emission and heat generation, and increase the luminous efficiency of the LED chip. In addition, since the parabolic finger is formed on the electrode protection layer with strong reflection directly above, without degrading the reflection efficiency of more mirrors.
上述实施例为本实用新型较佳的实施方式,但本实用新型的实施方式并不受所述实施例的限制,其他的任何未背离本实用新型的精神实质与原理下所作的改变、修饰、替代、组合、简化,均应为等效的置换方式,都包含在本实用新型的保护范围之内。The above-mentioned embodiment is a preferred implementation mode of the present utility model, but the implementation mode of the present utility model is not limited by the described embodiment, and any other changes, modifications, modifications, Substitution, combination, and simplification should all be equivalent replacement methods, and are all included in the protection scope of the present utility model.
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| CN111081831A (en) * | 2019-11-20 | 2020-04-28 | 华南师范大学 | Multi-electrode-based illumination communication device and preparation method thereof |
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| CN106972090A (en) * | 2017-04-14 | 2017-07-21 | 华南理工大学 | A kind of arc line shaped N electrode and light emitting diode (LED) chip with vertical structure |
| CN111081831A (en) * | 2019-11-20 | 2020-04-28 | 华南师范大学 | Multi-electrode-based illumination communication device and preparation method thereof |
| CN111081831B (en) * | 2019-11-20 | 2021-03-23 | 华南师范大学 | Multi-electrode-based lighting communication device and preparation method thereof |
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