CN206283476U - A kind of test device of crystalline silicon component pressure test - Google Patents

Abstract

The utility model discloses a testing device for a pressure test of a crystalline silicon component, which comprises a pressure testing part, a bracket and a heavy object with a predetermined weight arranged on the top of the pressure testing part, and the pressure testing part passes through the A through hole is used for limiting the pressure testing component so that the pressure testing component moves in the vertical direction. The test device for the pressure test of the crystalline silicon component moves in the vertical direction by making the pressure test component pass through the through hole of the bracket, so that the phenomenon of test point movement caused by shaking from side to side when under pressure in the prior art does not appear, and the improvement is improved. To improve the stability of the test, at the same time, use a predetermined weight to press the pressure test part, so that the pressure test part can provide continuous and stable pressure output without being affected by external force, improve the accuracy of the test, reduce the difficulty of the test, and at the same time The test device for the pressure test of the crystalline silicon component has a simple structure and low manufacturing cost.

Description

A test device for pressure test of crystalline silicon components

technical field

The utility model relates to the technical field of photovoltaic component testing, in particular to a testing device for a pressure test of a crystalline silicon component.

Background technique

With the continuous maturity of photovoltaic industry technology, the photoelectric efficiency of photovoltaic cells has rapidly increased, resulting in a rapid decline in manufacturing costs, and crystalline silicon solar cells have gradually occupied a dominant position in the photovoltaic industry. In crystalline silicon solar cells, there are two factors restricting its application and promotion: power generation efficiency and service life. One of the tests for the service life of solar cells is the stress test of solar cell components, generally using the UL1703-2012 test standard.

In the UL1703-2012 standard test requirements, the photovoltaic module needs to use a manual pressure gauge to apply a force of 17.8 and 89N to the backplane surface for 1min, and the pressure of the manual pressure operation method cannot provide a stable pressure output. The pressure test part of the test component in UL1703-2012 only provides the test requirements, and does not specify the test method. Since the traditional pressure test method is basically realized by hand pressure, it is basically impossible to maintain a constant force of 17.8 and 89N by hand pressure. and test results have a great influence.

Another test method is to press a fixed weight of 17.8 and 89N on the top of the manometer, and carry out the test by hand-holding the manometer. This kind of test is not accurate enough, because the manometer also gives The pressure gauge has the gravity of a downward hand, and the hand pressure gauge cannot guarantee that the pressure gauge is at a 90° angle with the test surface, so the accuracy of this test method cannot be guaranteed.

Utility model content

The purpose of the utility model is to provide a test device for the pressure test of crystalline silicon components, which can provide accurate and constant pressure output without being affected by external force factors during the pressure test, and the test is quick and professional.

In order to solve the above technical problems, the embodiment of the utility model provides a test device for the pressure test of crystalline silicon components, including a pressure test component, a bracket and a weight of predetermined weight arranged on the top of the pressure test component, the pressure The test component passes through the through hole of the bracket, and the through hole is used to limit the pressure test component so that the pressure test component moves in the vertical direction.

Wherein, the weight of the predetermined weight is a weight of 17.8N-89N.

Wherein, it also includes a top tray arranged on the pressure testing part, and the weight is placed in the tray.

Wherein, the side of the pressure testing part is provided with a shoulder, which is used to limit the downward movement of the pressure testing part.

Wherein, it also includes an electronic display unit arranged on the side of the pressure testing component, which is used to display the pressure between the top contact end of the pressure testing component and the component under test.

Wherein, it also includes a pressure regulating part arranged on the bracket, and the end of the pressure regulating part is in contact with the bottom surface of the tray, so as to make a predetermined value between the pressure testing part and the tested component. pressure.

Wherein, the bracket is an engineering plastic bracket.

Wherein, the bracket has two legs, and the bottom of the legs is a circular support surface or a rectangular support surface.

Compared with the prior art, the test device for the pressure test of the crystalline silicon component provided by the embodiment of the utility model has the following advantages:

The test device for the pressure test of the crystalline silicon component provided by the embodiment of the present invention includes a pressure test component, a bracket and a weight of predetermined weight arranged on the top of the pressure test component, and the pressure test component passes through the A through hole is used for limiting the pressure testing component so that the pressure testing component moves in the vertical direction.

The test device for the pressure test of the crystalline silicon component moves the pressure test parts in the vertical direction through the through hole of the support, so that the phenomenon of test point movement caused by shaking from side to side when under pressure in the prior art does not occur, and the improvement is improved. This improves the stability of the test and makes the test process more professional. At the same time, a heavy object with a predetermined weight is used to press the pressure test part, so that the pressure test part can provide continuous and stable pressure output without being affected by external force, which improves the accuracy of the test and reduces the difficulty of the test. The test device for the pressure test of the crystalline silicon component has a simple structure and low manufacturing cost.

Description of drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the accompanying drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description These are some embodiments of the present utility model. Those skilled in the art can also obtain other drawings based on these drawings without any creative work.

Fig. 1 is a structural schematic diagram of a specific embodiment of a test device for a pressure test of a crystalline silicon component provided by an embodiment of the present invention.

detailed description

The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. example. Based on the embodiments of the present utility model, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of the present utility model.

Please refer to FIG. 1 . FIG. 1 is a structural schematic diagram of a specific embodiment of a test device for a pressure test of a crystalline silicon component provided by an embodiment of the present invention.

In a specific embodiment, the test device for the pressure test of the crystalline silicon module includes a pressure test part 20, a support 10 and a weight 30 with a predetermined weight of 17.8N or 89N arranged on the top of the pressure test part 20 , the pressure test component 20 passes through the through hole of the bracket 10, and the through hole is used to limit the pressure test component 20, so that the pressure test component 20 moves in the vertical direction, so that the test During the process, the weight 30 only exerts pressure in the vertical direction on the components, and there is no phenomenon of displacement of the test point, which improves the accuracy of the test.

It should be pointed out that in the present utility model, if the standard of the test side is different, the weight 30 can be replaced as required, and the weight of the weight 30 is generally 17.8N-89N.

Because during the test, in order to ensure the accuracy of the test, the accuracy of the weight itself of the weight 30 is high, and weights are generally used, and the weights are easily polluted during movement or contact with other objects, which reduces the accuracy of the test. In addition, the surface of the weight is relatively smooth, which is prone to slipping, causing the pressure at the contact point between the pressure test part 20 and the assembly to slip, reducing the accuracy of the test, and even the weight will slip from the surface of the pressure test part 20, both Failure to guarantee a normal testing process can also cause damage to the weights. Therefore, the test device for the pressure test of the crystalline silicon module further includes a tray 40 disposed on the top of the pressure test component 20 , and the weight 30 is placed in the tray 40 . By using the tray 40 to limit the weight 30, the testing process is safer and more reliable, and the pressure output is stable and continuous.

It should be pointed out that the utility model does not specifically limit the material, size and shape of the tray 40, it can be directly placed on the top surface of the pressure test part 20, or the tray 40 can be limited by setting a fixing frame. , the utility model does not specifically limit this.

Since the pressure test component 20 moves up and down through the through hole of the bracket 10, in order to avoid the pressure test component 20 from passing through the bracket 10 during the test, causing damage to the assembly or the pressure test component 20, the pressure test A shoulder is provided on the side of the component 20 for limiting the downward movement of the pressure testing component 20 . In this way, the pressure testing part 20 will only have a limited amount of displacement in the vertical direction, and the pressure testing part 20 will not directly touch the ground when the test is not performed.

It should be pointed out that there is no specific limitation on the waistcoat in the present invention, as long as the waistcoat cannot pass through the through hole of the bracket 10 at a predetermined height.

In this application model, the pressure testing part 20 can use a general pressure gauge, or just fix the pressure on a certain connection block.

The present application model does not specifically limit the pressure testing component 20 .

During the test, the general pressure test component 20 does not display the pressure value, or uses a pointer to indicate the pressure value, and the operator needs to read the reading, which is somewhat troublesome. In order to directly display the pressure value, the test device for the pressure test of the crystalline silicon component It also includes an electronic display unit arranged on the side of the pressure testing component 20 for displaying the pressure between the top contact end of the pressure testing component 20 and the component under test.

It should be pointed out that the utility model does not specifically limit the electronic display unit and its size and installation method.

Because in the testing process, the weight of the weight 30 on the top of the pressure testing part 20 is certain, at this moment the extrusion force to the assembly is certain, so only a kind of standard assembly can be tested, and the extrusion force between the assembly The pressure is not necessarily the required value. At this time, it is necessary to adjust the extrusion force between the components. The pressure testing part 20 also includes a pressure regulating part arranged on the bracket 10, and the pressure regulating part The end of the contact with the bottom surface of the tray 40 is used to generate a predetermined value of pressure between the pressure testing component 20 and the component under test. The position of the pressure testing component 20 in the vertical direction is adjusted by the pressure regulating component to obtain the required pressure value and improve the accuracy of the test.

The utility model does not specifically limit the pressure regulating part, which may be a bolt arranged in a through hole. Through the lifting of the bolt, the waistcoat of the pressure testing part 20 is raised or lowered, and the position of the pressure testing part 20 and the bracket 10 is adjusted. The relative position in the vertical direction adjusts the extrusion force between the pressure regulating part and the assembly.

Preferably, the bracket 10 is an engineering plastic bracket 10, which can not only have sufficient mechanical strength, but also reduce the weight of the bracket 10, which is convenient for transportation and carrying.

In the present invention, the function of the bracket 10 is to support the pressure test component 20 sideways, so that its movement direction is limited to the vertical direction, so as to improve the accuracy of the test.

In a specific manner, the support 10 has two legs, and the bottom of the legs is a circular support surface or a rectangular support surface, so that the support 10 will not shake during the test, and will not Like the tripod 10, it is difficult to ensure that the axis direction of the through hole is the vertical direction.

The present application model does not specifically limit the material, shape and size of the bracket 10 .

To sum up, the test device for the pressure test of the crystalline silicon component provided by the embodiment of the utility model, by making the pressure test component pass through the through hole of the bracket to move in the vertical direction, there will be no pressure test in the prior art. Shaking left and right will cause the test point to move, which improves the stability of the test and makes the test process more professional. At the same time, a heavy object with a predetermined weight is used to press the pressure test part, so that the pressure test part can provide continuous and stable pressure output without being affected by external force, which improves the accuracy of the test and reduces the difficulty of the test. The test device for the pressure test of the crystalline silicon component has a simple structure and low manufacturing cost.

The test device for the pressure test of the crystalline silicon component provided by the utility model has been introduced in detail above. In this paper, specific examples are used to illustrate the principle and implementation of the present utility model, and the descriptions of the above embodiments are only used to help understand the method and core idea of the present utility model. It should be pointed out that for those of ordinary skill in the art, without departing from the principle of the utility model, some improvements and modifications can also be made to the utility model, and these improvements and modifications also fall into the protection of the claims of the utility model. within range.

Claims (8)

1. a kind of test device of crystalline silicon component pressure test, it is characterised in that including pressure test component, support and setting In the weight of the predetermined weight on the top of the pressure test component, the pressure test component passes through the through hole of the support, The through hole is spacing for being carried out to the pressure test component so that the pressure test component is moved in vertical direction.

2. the test device of crystalline silicon component pressure test as claimed in claim 1, it is characterised in that the weight of the predetermined weight Thing is the weight of 17.8N~89N.

3. the test device of crystalline silicon component pressure test as claimed in claim 2, it is characterised in that also described including being arranged on The top pallet of pressure test component, the weight is placed in the pallet.

4. the test device of crystalline silicon component pressure test as claimed in claim 3, it is characterised in that the pressure test component Side be provided with sleeveless jacket, be defined for the amount of moving down to the pressure test component.

5. the test device of crystalline silicon component pressure test as claimed in claim 4, it is characterised in that also described including being arranged on The electronic display unit of pressure test component side, the top contact end for showing the pressure test component be subject to quilt Pressure between test suite.

6. the test device of crystalline silicon component pressure test as claimed in claim 5, it is characterised in that also described including being arranged on Pressure regulating part on support, the end of the pressure regulating part contacts with the bottom surface of the pallet, described for causing The pressure of predetermined value is produced between pressure test component and the tested component.

7. the test device of crystalline silicon component pressure test as claimed in claim 6, it is characterised in that the support is engineering plastic Material support.

8. the test device of crystalline silicon component pressure test as claimed in claim 7, it is characterised in that the support has two Supporting leg, the bottom of the supporting leg is circular support face or rectangular support face.