CN205765541U - A kind of magneto-rheological fluid dynamic pressure composite polishing device - Google Patents
A kind of magneto-rheological fluid dynamic pressure composite polishing device Download PDFInfo
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- CN205765541U CN205765541U CN201620484360.8U CN201620484360U CN205765541U CN 205765541 U CN205765541 U CN 205765541U CN 201620484360 U CN201620484360 U CN 201620484360U CN 205765541 U CN205765541 U CN 205765541U
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- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Abstract
本实用新型公开了一种磁流变流体动压复合抛光装置,包括抛光盘、第一转轴、抛光液、第二转轴、工件盘、磁性体和待抛光件,所述抛光盘的上表面沿圆周方向设有多个楔形结构,所述楔形结构包括销轴和楔块,所述销轴固定安装于所述抛光盘的上表面,所述楔块可摆动安装于所述销轴上,所述抛光液覆盖于所述抛光盘和楔块的上表面上。在抛光盘与待抛光件在发生相对运动时,楔块可绕各自销轴微量摆动,随抛光盘旋转方向和载荷而自动调节倾斜度,使得抛光液能稳定地从待抛光件与楔块之间的间隙较大地方流向间隙较小的地方而形成流体动压膜,从而在金刚石磨料和流体动压膜的双重作用下均匀快速去除抛光工件表面材料,实现快速抛光和提升抛光效果的有益效果。
The utility model discloses a magnetorheological fluid dynamic pressure composite polishing device, which comprises a polishing disk, a first rotating shaft, a polishing liquid, a second rotating shaft, a workpiece disk, a magnetic body and a piece to be polished. The upper surface of the polishing disk is along the A plurality of wedge-shaped structures are provided in the circumferential direction, and the wedge-shaped structures include a pin shaft and a wedge block. The pin shaft is fixedly mounted on the upper surface of the polishing disc, and the wedge block is oscillably mounted on the pin shaft. The polishing liquid is covered on the upper surface of the polishing disc and the wedge. When the polishing disc and the workpiece to be polished are in relative motion, the wedges can swing slightly around their respective pins, and the inclination can be automatically adjusted according to the rotation direction and load of the polishing disc, so that the polishing liquid can flow stably from between the workpiece to be polished and the wedge. The fluid dynamic pressure film is formed from the place with a large gap between them to the place with a small gap, so that under the double action of diamond abrasive and hydrodynamic pressure film, the surface material of the polished workpiece can be removed evenly and quickly, and the beneficial effect of rapid polishing and improved polishing effect can be realized. .
Description
技术领域technical field
本实用新型涉及一种抛光装置,尤其是指一种磁流变流体动压复合抛光装置。The utility model relates to a polishing device, in particular to a magneto-rheological fluid dynamic pressure composite polishing device.
背景技术Background technique
随着信息电子化的社会发展,半导体材料作为高性能微电子元器件应用愈发广泛,如单晶硅、氧化铝、钛酸锶和单晶碳化硅等电子陶瓷材料的需求越来越大。一般半导体晶片制造要经过切片、研磨、抛光等工序,要达到良好的使用性能,其表面精度需要达到超光滑程度,面型精度也有较高要求,以LED外延蓝宝石衬底为例,一般要求总厚度偏差小于10μm、表面总平整度小于10μm、表面粗糙度小于0.05μm。因此半导体材料的制造越来越依赖研磨抛光技术来满足其生产要求。With the development of electronic information society, semiconductor materials are widely used as high-performance microelectronic components, such as single crystal silicon, aluminum oxide, strontium titanate and single crystal silicon carbide and other electronic ceramic materials are in increasing demand. Generally, the manufacture of semiconductor wafers needs to go through slicing, grinding, polishing and other processes. To achieve good performance, the surface accuracy needs to be ultra-smooth, and the surface accuracy also has high requirements. Taking LED epitaxial sapphire substrates as an example, the general requirements are generally The thickness deviation is less than 10 μm, the overall surface flatness is less than 10 μm, and the surface roughness is less than 0.05 μm. Therefore, the manufacture of semiconductor materials increasingly relies on grinding and polishing technology to meet its production requirements.
现有国内外对半导体晶片的加工方法主要以下四种:1、沿用传统单晶Si、Ge等晶片加工中的传统机械研磨抛光加工方法;2、以机械去除和化学去除结合使用的CMP加工方法;3、以激光、超声和等粒子等特种加工方式进行加工;4、以基于磁流变液在磁场下的流变特性的磁流变加工。其中,作为磁流变加工方法的现有游离磨料研磨抛光加工方法在抛光加光的过程中,游离磨料微粒在研磨盘与工件之间的运动速度、轨迹、滞留时间无法进行有效和准确的控制,在抛光盘与工件及界面之间的游离态磨料只有较大尺寸的磨料产生加工作用,由于相对运动的作用相当部分较小尺寸的磨粒尚未与工件表面产生干涉作用即脱离研磨盘与工件界面,造成加工精度和加工效率低下。例如,专利200610132495.9提到的集群磁流变抛光方法能很好地对单晶碳化硅进行抛光,并获得纳米级的光滑表面,但由于采用外加磁场强弱来控制磁流变工作液的流变特性,难以控制抛光过程形成的柔性小磨头的分布均匀性,以致经磁流变抛光的半导体基片厚度偏差、表面平整度和表面质量难以控制。At present, there are four main processing methods for semiconductor wafers at home and abroad: 1. The traditional mechanical grinding and polishing processing method in the processing of traditional single crystal Si, Ge and other wafers; 2. The CMP processing method combined with mechanical removal and chemical removal ; 3. Processing by special processing methods such as laser, ultrasonic and other particles; 4. Using magnetorheological processing based on the rheological properties of magnetorheological fluid under a magnetic field. Among them, the existing free abrasive grinding and polishing processing method as a magnetorheological processing method cannot effectively and accurately control the moving speed, trajectory, and residence time of free abrasive particles between the grinding disc and the workpiece during the polishing process. , the free abrasives between the polishing disc and the workpiece and the interface only have larger-sized abrasives for processing, and due to the relative motion, a considerable part of the smaller-sized abrasives have not yet interfered with the surface of the workpiece, that is, they are separated from the interface between the grinding disc and the workpiece , resulting in low processing accuracy and processing efficiency. For example, the cluster magnetorheological polishing method mentioned in patent 200610132495.9 can polish single crystal silicon carbide well and obtain a smooth surface at the nanometer level, but due to the use of an external magnetic field to control the rheology of the magnetorheological working fluid Characteristics, it is difficult to control the distribution uniformity of the small flexible grinding heads formed in the polishing process, so that the thickness deviation, surface flatness and surface quality of the magnetorheologically polished semiconductor substrate are difficult to control.
实用新型内容Utility model content
本实用新型的目的在于解决现有游离磨料研磨抛光加工方法存在的加工精度控制困难而造成加工准确性和效率低的问题,提供一种抛光均匀、加工效率高和使用方便的磁流变流体动压复合抛光装置。The purpose of the utility model is to solve the problem of low processing accuracy and efficiency caused by the difficulty in controlling the processing precision existing in the existing free abrasive grinding and polishing processing method, and to provide a magnetorheological fluid flow device with uniform polishing, high processing efficiency and convenient use. Press compound polishing device.
本实用新型的目的可采用以下技术方案来达到:The purpose of this utility model can adopt following technical scheme to reach:
一种磁流变流体动压复合抛光装置,包括抛光盘、第一转轴、抛光液、第二转轴、工件盘和待抛光件,所述第一转轴和第二转轴相互平行,且所述第二转轴向第一转轴方向水平滑动,所述磁性体设于所述抛光盘的下方,所述抛光盘固定安装于所述第一转轴上,所述工件盘和待抛光件设于所述抛光盘的上方,所述工件盘固定安装于所述第二转轴上,所述待抛光件固定安装于所述工件盘的下底面,且待抛光件的下底面与所述抛光盘的上表面相接触;所述抛光盘的上表面沿圆周方向设有多个楔形结构,所述楔形结构包括销轴和楔块,所述销轴固定安装于所述抛光盘的上表面,所述楔块可摆动安装于所述销轴上,所述抛光液覆盖于所述抛光盘和楔块的上表面上。A magneto-rheological fluid dynamic pressure composite polishing device, including a polishing disc, a first rotating shaft, a polishing liquid, a second rotating shaft, a workpiece disc and a piece to be polished, the first rotating shaft and the second rotating shaft are parallel to each other, and the first rotating shaft The two rotating shafts slide horizontally in the direction of the first rotating shaft, the magnetic body is arranged under the polishing disc, the polishing disc is fixedly installed on the first rotating shaft, the workpiece disc and the workpiece to be polished are arranged on the Above the polishing disc, the workpiece disc is fixedly mounted on the second rotating shaft, the workpiece to be polished is fixedly mounted on the lower bottom surface of the workpiece disc, and the lower bottom surface of the workpiece to be polished is connected to the upper surface of the polishing disc contact; the upper surface of the polishing disc is provided with a plurality of wedge-shaped structures along the circumferential direction, and the wedge-shaped structures include pins and wedges, and the pins are fixedly installed on the upper surface of the polishing disc, and the wedges It can be swingably installed on the pin shaft, and the polishing liquid covers the upper surfaces of the polishing disc and the wedge.
进一步地,所述抛光盘的上方设有喷管,所述抛光液通过喷管流到所述抛光盘的上表面上。Further, a nozzle is provided above the polishing disc, and the polishing solution flows onto the upper surface of the polishing disc through the nozzle.
作为一种优选的方案,所述待抛光件为半导体晶片。As a preferred solution, the piece to be polished is a semiconductor wafer.
进一步地,所述磁性体的端面磁场强度不小于2000Gs。Further, the end surface magnetic field strength of the magnetic body is not less than 2000Gs.
进一步地,所述磁性体设为多个,且磁极相互交错排列设置。Further, there are multiple magnetic bodies, and the magnetic poles are arranged in a staggered arrangement.
进一步地,所述待抛光件粘贴到所述工件盘的下底面。Further, the piece to be polished is pasted on the lower bottom surface of the workpiece disk.
作为一种优选的,所述楔块与所述抛光盘之间的倾斜夹角为0~15度。As a preferred embodiment, the inclination angle between the wedge and the polishing disc is 0-15 degrees.
实施本实用新型,具有如下有益效果:Implementing the utility model has the following beneficial effects:
1、本实用新型在抛光加工的过程中,工作液覆盖于抛光盘上表面的楔形结构上,在抛光过程中抛光盘与待抛光件在发生相对运动时,抛光液从待抛光件与楔块间隙较大地方流向间隙较小的地方而形成流体动压膜,在金刚石磨料和流体动压膜的双重作用下均匀快速去除待抛光工件表面材料,大大提高了抛光加工的均匀性和效率,实现快速抛光和提升抛光效果的目的。1. During the polishing process of the utility model, the working liquid covers the wedge-shaped structure on the upper surface of the polishing disc. When the polishing disc and the workpiece to be polished are in relative motion during the polishing process, the polishing liquid flows from the workpiece to be polished and the wedge. The fluid dynamic pressure film is formed from the place with a large gap to the place with a small gap. Under the double action of diamond abrasive and hydrodynamic pressure film, the surface material of the workpiece to be polished is removed evenly and quickly, which greatly improves the uniformity and efficiency of the polishing process. The purpose of fast polishing and improving the polishing effect.
2、本实用新型在抛光过程中抛光盘与待抛光件在发生相对运动时,楔块可绕各自销轴微量摆动,随抛光盘旋转方向和载荷而自动调节倾斜度,以适应抛光盘的速度和载荷的需要,使得抛光液能稳定地从待抛光件与楔块之间的间隙较大地方流向间隙较小的地方而形成流体动压膜,从而在金刚石磨料和流体动压膜的双重作用下均匀快速去除抛光工件表面材料,大大提高了抛光加工的均匀性和效率,实现快速抛光和提升抛光效果的目的。2. In the polishing process of the utility model, when the polishing disc and the workpiece to be polished are in relative motion, the wedges can swing slightly around their respective pins, and the inclination can be automatically adjusted according to the rotation direction and load of the polishing disc to adapt to the speed of the polishing disc. And load requirements, so that the polishing liquid can stably flow from the place where the gap between the workpiece and the wedge is larger to the place where the gap is smaller to form a hydrodynamic pressure film, so that the dual effects of diamond abrasive and hydrodynamic pressure film The surface material of the polished workpiece can be removed uniformly and quickly, which greatly improves the uniformity and efficiency of the polishing process, and achieves the purpose of rapid polishing and improving the polishing effect.
附图说明Description of drawings
为了更清楚地说明本实用新型实施例或现有技术中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍,显而易见地,下面描述中的附图仅仅是本实用新型的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。In order to more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the following will briefly introduce the accompanying drawings that need to be used in the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description These are only some embodiments of the utility model, and those skilled in the art can also obtain other drawings based on these drawings without creative work.
图1是本实用新型磁流变流体动压复合抛光装置的结构示意图;Fig. 1 is a schematic structural view of a magnetorheological fluid dynamic pressure composite polishing device of the present invention;
图2是图1的抛光盘的结构示意图;Fig. 2 is the structural representation of the polishing disk of Fig. 1;
图3是本实用新型磁流变流体动压复合抛光装置的待抛光件的工作状态结构图。Fig. 3 is a structural diagram of the working state of the workpiece to be polished in the magnetorheological fluid dynamic pressure composite polishing device of the present invention.
具体实施方式detailed description
下面将结合本实用新型实施例中的附图,对本实用新型实施例中的技术方案进行清楚、完整地描述,显然,所描述的实施例仅仅是本实用新型一部分实施例,而不是全部的实施例。基于本实用新型中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本实用新型保护的范围。The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. example. Based on the embodiments of the present utility model, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of the present utility model.
实施例Example
参照图1和至图3,本实施例涉及一种磁流变流体动压复合抛光装置,包括抛光盘1、第一转轴2、抛光液3、第二转轴4、工件盘5、待抛光件6和磁性体7,所述第一转轴2和第二转轴4相互平行,且所述第二转轴4向第一转轴2方向水平滑动,所述磁性体7设于所述抛光盘1的下方,所述抛光盘1固定安装于所述第一转轴2上,所述工件盘5和待抛光件6设于所述抛光盘1的上方,所述工件盘5固定安装于所述第二转轴4上,所述待抛光件6固定安装于所述工件盘5的下底面,且待抛光件6的下底面与所述抛光盘1的上表面相接触;所述抛光盘1的上表面沿圆周方向设有多个楔形结构,所述楔形结构包括销轴81和楔块82,所述销轴81固定安装于所述抛光盘1的上表面,所述楔块82可摆动安装于所述销轴81上,所述抛光液3覆盖于所述抛光盘1和楔块82的上表面上。所述待抛光件6为半导体晶片,例如蓝宝石基片,所述抛光液3的制作方法:在油基或水基载液中加入重量百分比为2~20%且平均粒径为1~50μm的磨料、重量百分比为1~10的甘油或油酸等稳定剂、重量百分比1~10%的防锈剂和重量百分比15~40%且平均粒径为1~50μm的羰基铁粉;最优选的,所述抛光液3由去离子水、浓度为15%且平均粒径为3μm的金刚石磨料、浓度为30%且平均粒径为5μm的羰基铁粉、浓度为10%的甘油和浓度为2%的防锈剂组成。在抛光过程中抛光盘1与待抛光件6在发生相对运动时,楔块82可绕销轴81微量摆动,随抛光盘1旋转方向和载荷而自动调节倾斜度,以适应抛光盘1的速度和载荷的需要,使得抛光液3能稳定地从待抛光件6与楔块82之间的间隙较大地方流向间隙较小的地方而形成流体动压膜,从而在金刚石磨料和流体动压膜的双重作用下均匀快速去除待抛光工件6表面材料,大大提高了抛光加工的均匀性和效率,实现快速抛光和提升抛光效果的目的。Referring to Fig. 1 and to Fig. 3, the present embodiment relates to a magneto-rheological fluid dynamic pressure composite polishing device, including a polishing disc 1, a first rotating shaft 2, a polishing liquid 3, a second rotating shaft 4, a workpiece disc 5, and a workpiece to be polished 6 and a magnetic body 7, the first rotating shaft 2 and the second rotating shaft 4 are parallel to each other, and the second rotating shaft 4 slides horizontally in the direction of the first rotating shaft 2, and the magnetic body 7 is arranged under the polishing disc 1 , the polishing disc 1 is fixedly mounted on the first rotating shaft 2, the workpiece disc 5 and the workpiece 6 to be polished are arranged above the polishing disc 1, and the workpiece disc 5 is fixedly mounted on the second rotating shaft 4, the workpiece 6 to be polished is fixedly mounted on the lower surface of the workpiece disc 5, and the lower surface of the workpiece 6 to be polished is in contact with the upper surface of the polishing disc 1; the upper surface of the polishing disc 1 is along the A plurality of wedge-shaped structures are provided in the circumferential direction, and the wedge-shaped structures include a pin shaft 81 and a wedge block 82, the pin shaft 81 is fixedly mounted on the upper surface of the polishing disc 1, and the wedge block 82 is swingably mounted on the On the pin 81 , the polishing liquid 3 covers the upper surface of the polishing disc 1 and the wedge 82 . The workpiece 6 to be polished is a semiconductor wafer, such as a sapphire substrate. The preparation method of the polishing liquid 3 is to add 2 to 20% by weight and an average particle size of 1 to 50 μm in an oil-based or water-based carrier liquid. Abrasives, stabilizers such as glycerin or oleic acid with a weight percentage of 1 to 10, antirust agents with a weight percentage of 1 to 10%, and carbonyl iron powder with a weight percentage of 15 to 40% and an average particle size of 1 to 50 μm; the most preferred , the polishing liquid 3 is composed of deionized water, a concentration of 15% and a diamond abrasive with an average particle diameter of 3 μm, a concentration of 30% and an average particle diameter of carbonyl iron powder of 5 μm, a concentration of 10% glycerin and a concentration of 2 % of rust inhibitor composition. During the polishing process, when the polishing disc 1 and the workpiece 6 are in relative motion, the wedge 82 can slightly swing around the pin shaft 81, and automatically adjust the inclination according to the rotation direction and load of the polishing disc 1 to adapt to the speed of the polishing disc 1 and load requirements, so that the polishing liquid 3 can stably flow from the place where the gap between the workpiece 6 to be polished and the wedge 82 is larger to the place where the gap is smaller to form a fluid dynamic pressure film, thereby forming a hydrodynamic pressure film between the diamond abrasive and the hydrodynamic pressure film Under the double action of the machine, the material on the surface of the workpiece to be polished can be removed evenly and quickly, which greatly improves the uniformity and efficiency of the polishing process, and realizes the purpose of fast polishing and improving the polishing effect.
所述抛光液3中的羰基铁粉在磁性体的磁场力作用下被吸附到抛光盘1的上表面而形成磨头结构,在抛光过程中抛光盘1与待抛光件6在发生相对运动时,抛光液3从待抛光件6与楔块82之间间隙较大地方流向间隙较小的地方而形成流体动压膜,在磨头结构和流体动压膜的双重作用下均匀快速去除待抛光工件6表面材料,大大提高了抛光加工的均匀性和效率,实现快速抛光和提升抛光效果的目的。The carbonyl iron powder in the polishing liquid 3 is adsorbed to the upper surface of the polishing disc 1 under the action of the magnetic field force of the magnetic body to form a grinding head structure. During the polishing process, the polishing disc 1 and the workpiece 6 to be polished are in relative motion , the polishing liquid 3 flows from the place where the gap between the workpiece 6 to be polished and the wedge 82 is larger to the place where the gap is smaller to form a hydrodynamic film, and under the double action of the grinding head structure and the hydrodynamic film, it can be removed evenly and quickly. The surface material of the workpiece 6 greatly improves the uniformity and efficiency of the polishing process, and realizes the purpose of fast polishing and improving the polishing effect.
所述的楔块82的倾斜高度不超过1.5mm,其倾角为0°至15°,所述平台11的宽度为1.5~3mm。该楔块82使得抛光液3能储存在楔块82的上表面和抛光盘1的上表面上,在抛光过程中抛光盘1与待抛光件6在发生相对运动时,抛光液3从待抛光件6与楔块82之间间隙较大地方流向间隙较小的地方而形成流体动压膜,提高抛光的均匀性和效率。The inclination height of the wedge 82 is no more than 1.5 mm, the inclination angle thereof is 0° to 15°, and the width of the platform 11 is 1.5 to 3 mm. The wedge 82 enables the polishing liquid 3 to be stored on the upper surface of the wedge 82 and the upper surface of the polishing disc 1. During the polishing process, the polishing disc 1 and the workpiece 6 to be polished are in relative motion, and the polishing liquid 3 is removed from the polishing disc 1. The fluid dynamic pressure film is formed by flowing from the place with a larger gap between the piece 6 and the wedge 82 to the place with a smaller gap, so as to improve the uniformity and efficiency of polishing.
所述抛光盘1的上方设有喷管9,所述抛光液3通过喷管9流到所述抛光盘1的上表面上;所述抛光液3喷洒到抛光盘1上的速度为每分钟70~90毫升,保证了抛光液3的供应量,以保证抛光加工的质量。The top of the polishing disc 1 is provided with a nozzle 9, and the polishing liquid 3 flows onto the upper surface of the polishing disc 1 through the nozzle 9; the speed at which the polishing liquid 3 is sprayed onto the polishing disc 1 is 70-90 milliliters ensures the supply of polishing liquid 3 to ensure the quality of polishing.
所述待抛光件6粘贴到所述工件盘5的下底面,可快速实现待抛光件6的安装和拆卸,进一步提高加工的效率。The workpiece 6 to be polished is pasted to the lower bottom surface of the workpiece plate 5, so that the installation and disassembly of the workpiece 6 to be polished can be quickly realized, and the processing efficiency is further improved.
以上所揭露的仅为本实用新型一种较佳实施例而已,当然不能以此来限定本实用新型之权利范围,因此依本实用新型权利要求所作的等同变化,仍属本实用新型所涵盖的范围。What is disclosed above is only a preferred embodiment of the utility model, and of course it cannot limit the scope of rights of the utility model. Therefore, the equivalent changes made according to the claims of the utility model are still covered by the utility model. scope.
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