CN204424231U - Silicon slice corrosion hand basket - Google Patents
Silicon slice corrosion hand basket Download PDFInfo
- Publication number
- CN204424231U CN204424231U CN201520145689.7U CN201520145689U CN204424231U CN 204424231 U CN204424231 U CN 204424231U CN 201520145689 U CN201520145689 U CN 201520145689U CN 204424231 U CN204424231 U CN 204424231U
- Authority
- CN
- China
- Prior art keywords
- basket
- push plate
- base
- polytetrafluoroethylene
- plate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 22
- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 20
- 239000010703 silicon Substances 0.000 title claims abstract description 20
- 230000007797 corrosion Effects 0.000 title description 3
- 238000005260 corrosion Methods 0.000 title description 3
- 239000000758 substrate Substances 0.000 claims abstract description 8
- -1 polytetrafluoroethylene Polymers 0.000 claims abstract description 7
- 229920001343 polytetrafluoroethylene Polymers 0.000 claims abstract description 7
- 239000004810 polytetrafluoroethylene Substances 0.000 claims abstract description 7
- 238000005530 etching Methods 0.000 claims abstract description 6
- 239000007788 liquid Substances 0.000 claims description 4
- 239000000463 material Substances 0.000 claims 1
- 239000002253 acid Substances 0.000 abstract description 6
- 238000005554 pickling Methods 0.000 abstract description 6
- 235000012431 wafers Nutrition 0.000 description 13
- 230000007547 defect Effects 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- 208000027418 Wounds and injury Diseases 0.000 description 1
- 239000004063 acid-resistant material Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 208000014674 injury Diseases 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
Landscapes
- Silicon Compounds (AREA)
Abstract
一种硅片腐蚀提篮,包括材质为聚四氟乙烯的提篮基体,所述提篮基体两侧设有提手,其特殊之处是:所述提手的顶端与插槽的顶面之间的距离为30cm-50cm;在提篮基体上均设有多个开口朝上的插槽,所述插槽的前、后面敞开且内底面为内凹弧形,在所述提篮基体底部对应各插槽处分别设有通口;在所述提篮基体下面设置有材质为聚四氟乙烯的“L”型推板,“L”型推板的平板和立板分别贴合在提篮基体1的外底面和提篮基体1的前端面底部,在所述推板上设有分别与各豁口对应的挡板,所述挡板由通口向上引出,在所述推板的侧板上设有锁紧螺钉。优点是:操作安全,放入酸洗槽中不会造成酸液迸溅;强度高,使用寿命长。
A silicon wafer etching basket, comprising a basket substrate made of polytetrafluoroethylene, handles are provided on both sides of the basket substrate, and its special feature is: the gap between the top of the handle and the top surface of the slot The distance is 30cm-50cm; there are multiple slots with openings facing upwards on the base of the basket. The front and back of the slots are open and the inner bottom surface is concave arc-shaped. There are openings respectively; under the base body of the basket, there is an "L" type push plate made of polytetrafluoroethylene, and the flat plate and vertical plate of the "L" type push plate are attached to the outer bottom surface of the base body 1 of the basket respectively. and the bottom of the front end of the basket base 1, the push plate is provided with baffles corresponding to the gaps, the baffles are drawn upward from the opening, and locking screws are provided on the side plates of the push plate . The advantages are: safe operation, no acid splashing when put into the pickling tank; high strength and long service life.
Description
技术领域technical field
本实用新型涉及到大批量对硅片表面进行腐蚀时使用的一种硅片腐蚀提篮。The utility model relates to a silicon chip corrosion basket used when corroding the surface of silicon chips in large quantities.
背景技术Background technique
单晶硅在生长的过程中,会有一些其他杂质或者原子排列的不稳定性,使晶体排列出现差错,导致点缺陷和线缺陷的产生。对于这种点缺陷和线缺陷,需要借助显微镜、电镜等仪器进行观察。还可以利用硅原子表面的择优腐蚀方法,即将硅片水平放置在酸洗槽中,通过肉眼就能观察到有缺陷的部分(线状痕迹)。对于大直径的硅片因硅片直径大,拿取不方便,放入酸中硅片容易造成酸液的迸溅,对操作人员造成伤害。此外,硅片直径大,表面积也大,需要更多的酸才能把硅表面彻底处理,因此处理成本高。During the growth process of single crystal silicon, there will be some other impurities or the instability of atomic arrangement, which will cause errors in the crystal arrangement, resulting in the generation of point defects and line defects. For such point defects and line defects, it is necessary to observe with the aid of microscopes, electron microscopes and other instruments. It is also possible to use the preferential etching method on the surface of silicon atoms, that is, place the silicon wafer horizontally in the pickling tank, and the defective parts (linear traces) can be observed with the naked eye. For large-diameter silicon wafers, it is inconvenient to take because of the large diameter of the silicon wafers. Putting the silicon wafers into the acid will easily cause acid liquid to splash and cause injury to operators. In addition, the silicon wafer has a large diameter and a large surface area, requiring more acid to completely treat the silicon surface, so the processing cost is high.
发明内容Contents of the invention
本实用新型的目的是要解决现有技术存在的上述问题,提供一种硅片腐蚀提篮,在对硅片进行择优腐蚀时,操作安全,处理成本低。The purpose of the utility model is to solve the above-mentioned problems existing in the prior art, and provide a silicon wafer etching basket, which is safe in operation and low in processing cost when performing selective etching on silicon wafers.
本实用新型是这样实现的:The utility model is achieved in that:
一种硅片腐蚀提篮,包括材质为聚四氟乙烯的提篮基体,所述提篮基体两侧设有提手,其特殊之处是:所述提手的顶端与插槽的顶面之间的距离为30cm-50cm;在提篮基体上均设有多个开口朝上的插槽,所述插槽的前、后面敞开且内底面为内凹弧形,在所述提篮基体底部对应各插槽处分别设有通口;在所述提篮基体下面设置有材质为聚四氟乙烯的“L”型推板,“L”型推板的平板和立板分别贴合在提篮基体1的外底面和提篮基体1的前端面底部,在所述推板上设有分别与各豁口对应的挡板,所述挡板由对应的通口向上引出,在所述推板的立板上设有锁紧螺钉。A silicon wafer etching basket, comprising a basket substrate made of polytetrafluoroethylene, handles are provided on both sides of the basket substrate, and its special feature is: the gap between the top of the handle and the top surface of the slot The distance is 30cm-50cm; there are multiple slots with openings facing upwards on the base of the basket. The front and back of the slots are open and the inner bottom surface is concave arc-shaped. There are openings respectively; under the base body of the basket, there is an "L" type push plate made of polytetrafluoroethylene, and the flat plate and vertical plate of the "L" type push plate are attached to the outer bottom surface of the base body 1 of the basket respectively. and the bottom of the front end of the basket base 1, baffles respectively corresponding to the notches are provided on the push plate, and the baffles are drawn upward from the corresponding openings, and locks are provided on the vertical plate of the push plate. Tighten the screws.
在所述提篮基体上设有多个通液孔,增强酸洗液的流通性,提高酸洗效果。A plurality of liquid holes are arranged on the base of the basket to enhance the circulation of the pickling solution and improve the pickling effect.
本实用新型的优点是:The utility model has the advantages of:
1、由于在提篮基体两侧设有提手,能够确保操作安全。1. Since there are handles on both sides of the base of the basket, it can ensure safe operation.
2、由于硅片竖置在提篮的插槽内,插槽底面为内凹弧形,使硅片平稳放置,并且放入酸洗槽中不会造成酸液迸溅。2. Since the silicon wafer is vertically placed in the slot of the basket, the bottom surface of the slot is concave and arc-shaped, so that the silicon wafer can be placed stably, and the acid solution will not splash when it is placed in the pickling tank.
3、通过滑动推板调节挡板的横向位置,并通过锁紧螺钉将推板与提篮基体固定在一起,使硅片安放在相应的空间,防止硅片倾倒造成损坏。3. Adjust the lateral position of the baffle by sliding the push plate, and fix the push plate and the basket base together with the locking screws, so that the silicon wafers are placed in the corresponding space to prevent the silicon wafers from being damaged due to tipping.
4、采用抗酸腐蚀的材料,一体化设计,强度高,使用寿命长。4. Using acid-resistant materials, integrated design, high strength and long service life.
附图说明Description of drawings
图1是本实用新型的结构示意图。Fig. 1 is a structural representation of the utility model.
图中:1-提篮基体,2-提手,3-插槽,4-豁口,5-推板,6-挡板,7-锁紧螺钉,8-通液孔。In the figure: 1-basket base, 2-handle, 3-slot, 4-notch, 5-push plate, 6-baffle plate, 7-lock screw, 8-fluid hole.
具体实施方式Detailed ways
一种硅片腐蚀提篮,包括材质为聚四氟乙烯的提篮基体1,所述提篮基体1两侧设有提手2,所述提手2的顶端与插槽3的顶面之间的距离为30cm-50cm,本实施例为40cm,在提篮基体1上均设有多个开口朝上的插槽3,所述插槽3的前、后面敞开且内底面为内凹弧形,在所述提篮基体1底部对应各插槽3处分别设有通口4,在所述提篮基体1上设有多个通液孔8;在所述提篮基体1外底面设置有材质为聚四氟乙烯的“L”型推板5,“L”型推板5的平板和立板分别贴合在提篮基体1的外底面和提篮基体1的前端面底部,在所述推板5上设有分别与各豁口4对应的挡板6,所述挡板6与推板5为一体且由对应的通口4向上引出,在所述推板5的立板上设有锁紧螺钉7。A silicon chip corrosion basket, comprising a basket substrate 1 made of polytetrafluoroethylene, handles 2 are provided on both sides of the basket substrate 1, the distance between the top of the handle 2 and the top surface of the slot 3 It is 30cm-50cm, and the present embodiment is 40cm. A plurality of slots 3 with upward openings are arranged on the basket base 1. The front and back of the slots 3 are open and the inner bottom surface is concave arc-shaped. The bottom of the basket base 1 is provided with a port 4 corresponding to each slot 3, and a plurality of liquid holes 8 are provided on the base 1 of the basket; The "L"-shaped push plate 5, the flat plate and vertical plate of the "L"-shaped push plate 5 are attached to the outer bottom surface of the basket base 1 and the bottom of the front end of the basket base 1 respectively, and the push plate 5 is respectively provided with The baffle plate 6 corresponding to each notch 4 is integrated with the push plate 5 and drawn upward from the corresponding opening 4 , and a locking screw 7 is provided on the vertical plate of the push plate 5 .
操作时,将硅片进行分割后竖立放入插槽3内,然后滑动推板5使挡板6处于适宜位置,并拧紧锁紧螺钉7,再放入酸洗槽内,操作人员戴着防酸手套手提提手进行操作。During operation, divide the silicon wafer and put it upright into the slot 3, then slide the push plate 5 to make the baffle plate 6 in a suitable position, tighten the locking screw 7, and then put it into the pickling tank. Handle the handle with acid gloves.
Claims (2)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201520145689.7U CN204424231U (en) | 2015-03-14 | 2015-03-14 | Silicon slice corrosion hand basket |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN201520145689.7U CN204424231U (en) | 2015-03-14 | 2015-03-14 | Silicon slice corrosion hand basket |
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CN204424231U true CN204424231U (en) | 2015-06-24 |
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CN201520145689.7U Expired - Lifetime CN204424231U (en) | 2015-03-14 | 2015-03-14 | Silicon slice corrosion hand basket |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105304538A (en) * | 2015-11-24 | 2016-02-03 | 山东华光光电子有限公司 | 2-inch chip photoresist peeling basket |
CN107014813A (en) * | 2017-05-24 | 2017-08-04 | 东北大学 | A kind of steel continuous casting billet solidifies arborescent structure detection method |
CN107030078A (en) * | 2017-05-31 | 2017-08-11 | 镇江环太硅科技有限公司 | One kind is used to clean polycrystalline sheet material frock and its processing method |
CN110793986A (en) * | 2019-10-14 | 2020-02-14 | 中国电子科技集团公司第十一研究所 | Method for testing depth of damage layer of InSb wafer |
WO2023013378A1 (en) * | 2021-08-06 | 2023-02-09 | 株式会社トクヤマ | Cleaning basket |
-
2015
- 2015-03-14 CN CN201520145689.7U patent/CN204424231U/en not_active Expired - Lifetime
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN105304538A (en) * | 2015-11-24 | 2016-02-03 | 山东华光光电子有限公司 | 2-inch chip photoresist peeling basket |
CN107014813A (en) * | 2017-05-24 | 2017-08-04 | 东北大学 | A kind of steel continuous casting billet solidifies arborescent structure detection method |
CN107014813B (en) * | 2017-05-24 | 2019-07-19 | 东北大学 | A method for detecting solidified dendritic structure of steel continuous casting billet |
CN107030078A (en) * | 2017-05-31 | 2017-08-11 | 镇江环太硅科技有限公司 | One kind is used to clean polycrystalline sheet material frock and its processing method |
CN110793986A (en) * | 2019-10-14 | 2020-02-14 | 中国电子科技集团公司第十一研究所 | Method for testing depth of damage layer of InSb wafer |
WO2023013378A1 (en) * | 2021-08-06 | 2023-02-09 | 株式会社トクヤマ | Cleaning basket |
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Legal Events
Date | Code | Title | Description |
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CP01 | Change in the name or title of a patent holder |
Address after: 121016 No. 94 Jiefang West Road, Taihe District, Jinzhou, Liaoning Patentee after: JINZHOU THINKON SEMICONDUCTOR Co.,Ltd. Address before: 121016 No. 94 Jiefang West Road, Taihe District, Jinzhou, Liaoning Patentee before: THINKON SEMICONDUCTOR JINZHOU Corp. |
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CP01 | Change in the name or title of a patent holder | ||
CX01 | Expiry of patent term |
Granted publication date: 20150624 |
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CX01 | Expiry of patent term |