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CN204424227U - A kind of wafer surface metal-stripping system - Google Patents

A kind of wafer surface metal-stripping system Download PDF

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Publication number
CN204424227U
CN204424227U CN201520114206.7U CN201520114206U CN204424227U CN 204424227 U CN204424227 U CN 204424227U CN 201520114206 U CN201520114206 U CN 201520114206U CN 204424227 U CN204424227 U CN 204424227U
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wafer
wafer surface
stripping
surface metal
metal
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魏家举
程亚亚
杨硕
张维
付华兴
王笃祥
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Tianjin Sanan Optoelectronics Co Ltd
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Tianjin Sanan Optoelectronics Co Ltd
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Abstract

一种晶片表面金属剥离系统,用以剥离晶片表面的金属,该系统由工作区和上下片区组成,其特征在于:所述工作区由接触式剥离装置、高压去除装置、机械手,所述接触式剥离装置,由进膜卷、下压重块、载台、导轨、出膜卷组成;所述高压去除装置,由高压流体管路、吹气管路、旋转载台、晶片固定装置、回收装置组成。所述上下片区包含至少一个载片框。采用本实用新型提供的系统,能实现全自动作业,提高了金属剥离效率,减少了人力消耗。

A wafer surface metal stripping system, used to strip the metal on the wafer surface, the system consists of a working area and an upper and lower sheet area, characterized in that: the working area is composed of a contact stripping device, a high pressure removal device, a manipulator, the contact type The peeling device is composed of a film inlet roll, a pressing weight, a stage, a guide rail, and a film exit roll; the high-pressure removal device is composed of a high-pressure fluid pipeline, an air blowing pipeline, a rotary stage, a wafer fixing device, and a recovery device . The upper and lower slide areas include at least one slide frame. The system provided by the utility model can realize fully automatic operation, improve the metal stripping efficiency, and reduce manpower consumption.

Description

一种晶片表面金属剥离系统A wafer surface metal stripping system

技术领域 technical field

本实用新型涉及一种晶片表面金属剥离系统,特别是涉及一种分层次、自动将LED晶片的Metal金属层及光刻胶剥离下来的系统。 The utility model relates to a chip surface metal peeling system, in particular to a system for automatically peeling off the Metal metal layer and photoresist of an LED chip in layers.

背景技术 Background technique

现有半导体LED晶片Metal金属层和光刻胶剥离,大都采用人工作业方式进行Metal金属层和光刻胶剥离:具体为采用白膜剥离Metal金属层,而这种剥离方式不能完全剥离回收贵金属,在后续贵金属回收提炼会存在损失;此外Metal金属层剥离后进行光刻胶剥离作业,采用SF-M15去光阻液浸泡方式去除晶片表面的胶,然后使用纯水冲洗干净;此部分Metal金属层难以回收,造成贵金属损失。 The metal metal layer and photoresist stripping of existing semiconductor LED wafers are mostly carried out by manual operation: specifically, white film is used to peel off the metal metal layer, and this stripping method cannot completely strip and recover precious metals , there will be losses in the subsequent recovery and refining of precious metals; in addition, the photoresist stripping operation is carried out after the Metal metal layer is stripped, and the glue on the surface of the wafer is removed by soaking in SF-M15 photoresist solution, and then rinsed with pure water; this part of the Metal metal Layers are difficult to recover, resulting in loss of precious metals.

发明内容 Contents of the invention

本实用新型所要解决的问题是,提供一种能够自动化作业、贵金属高回收率的晶片表面金属剥离系统,实现使用者便捷高效操作金属层及光刻胶剥离的目的。 The problem to be solved by the utility model is to provide a wafer surface metal stripping system capable of automatic operation and high recovery rate of precious metals, so as to realize the purpose of convenient and efficient operation of metal layer and photoresist stripping for users.

为解决以上技术问题,本实用新型提供了一种能够自动上下片,分层次剥离的系统,初步剥离晶片表面金属层、进一步剥离金属层与光刻胶。其特征在于:该系统由上下片区、工作区和机械手组成;所述上下片区设有承载载片盘的载片框,载片盘有至少一个第一晶片槽;所述工作区包含接触式剥离装置、高压去除装置;所述接触式剥离装置,通过接触晶片表面,提供大于金属与晶片之间粘附力的粘性吸力,初步实现金属从晶片表面剥离;所述冲洗去除装置,通过高压流体对晶片表面进行冲击,进一步实现金属剥离及光刻胶剥离;所述上下片区与工作区通过机械手,实现晶片传递,连续作业。 In order to solve the above technical problems, the utility model provides a system capable of automatic loading and unloading and layered peeling, which initially peels off the metal layer on the wafer surface, and further peels off the metal layer and photoresist. It is characterized in that: the system is composed of an upper and lower film area, a working area and a manipulator; the upper and lower film area is provided with a film loading frame carrying a slide tray, and the slide tray has at least one first wafer slot; the work area includes a contact stripping device, high-pressure removal device; the contact stripping device, by contacting the wafer surface, provides a viscous suction force greater than the adhesion between the metal and the wafer, and initially realizes the peeling of the metal from the wafer surface; the flushing removal device, through the high-pressure fluid The surface of the wafer is impacted to further realize metal peeling and photoresist peeling; the upper and lower wafer areas and the working area are passed through the manipulator to realize wafer transfer and continuous operation.

优选的,所述粘性吸力由白膜提供,利用白膜粘性将金属剥离。 Preferably, the viscous suction is provided by the white film, and the metal is peeled off by utilizing the viscosity of the white film.

优选的,所述接触式剥离装置包括进膜卷、下压重块、载台、导轨、出膜卷。所述进膜卷提供白膜,出膜卷回收旧膜,通过旧膜回收贵重金属。 Preferably, the contact stripping device includes a film inlet roll, a pressing weight, a carrier, a guide rail, and a film outlet roll. The film inlet roll provides white film, the film output roll recycles old film, and precious metals are recovered through the old film.

优选的,所述冲洗去除装置的高压流体,优选为SF-M15去胶液,其主要成分为NMP、MEA、DMSO的混合液。 Preferably, the high-pressure fluid of the flushing removal device is preferably SF-M15 degumming solution whose main component is a mixed solution of NMP, MEA and DMSO.

优选的,所述冲洗去除装置,由程序控制载台相对喷洒头角度、转速,高压流体冲击速度,从而通过调整程序,提高金属剥离效率。 Preferably, the flushing removal device is programmed to control the angle of the stage relative to the sprinkler head, the rotation speed, and the impact velocity of the high-pressure fluid, so that the metal stripping efficiency can be improved by adjusting the program.

优选的,所述过滤网,具有细密小孔,从而保证使用后的溶液通过,同时留下金属碎屑,提高金属回收率,降低生产成本。 Preferably, the filter screen has fine and dense pores, so as to ensure the passage of the used solution while leaving metal debris, improve the metal recovery rate, and reduce production costs.

优选的,所述机械手工作面有等于单个载片盘的晶片数量的吸盘,通过吸盘抓取晶片,实现晶片传递。 Preferably, the working surface of the manipulator has suction cups equal to the number of wafers in a single loading tray, and the wafers are grasped by the suction cups to realize wafer transfer.

本实用新型的有益效果包括但不限于: The beneficial effects of the utility model include but not limited to:

采用本实用新型的晶片表面金属剥离系统,解决了背景技术中的问题,藉由本实用新型的多层次金属剥离,提高了金属剥离的效率,只需将晶片置于在载片框内即可自行完成金属剥离,节省人力,并且由于所带回收装置,提高金属及溶液回收率,减少生产成本。 The chip surface metal stripping system of the utility model solves the problems in the background technology, and the multi-layer metal stripping of the utility model improves the efficiency of the metal stripping, and only needs to place the wafer in the slide frame to automatically Complete metal stripping, save manpower, and improve the recovery rate of metal and solution due to the recovery device, and reduce production costs.

附图说明 Description of drawings

图1为本实用新型之实施例的系统原位示意图。 FIG. 1 is a schematic diagram of the system in situ of an embodiment of the present invention.

图2为本实用新型之实施例的上下片区示意图。 Fig. 2 is a schematic diagram of the upper and lower areas of the embodiment of the utility model.

图3为本实用新型之实施例的载片框位置示意图。 Fig. 3 is a schematic diagram of the position of the slide frame of the embodiment of the present invention.

图4为本实用新型之实施例的接触式剥离装置示意图。 FIG. 4 is a schematic diagram of a contact peeling device according to an embodiment of the present invention.

图5为本实用新型之实施例的冲洗去除装置示意图。 Fig. 5 is a schematic diagram of a flushing removal device according to an embodiment of the present invention.

图6为本实用新型之实施例的机械手示意图。 Fig. 6 is a schematic diagram of a manipulator according to an embodiment of the present invention.

图7为本实用新型之实施例的带金属层的晶片。 FIG. 7 is a wafer with a metal layer according to an embodiment of the present invention.

图8为本实用新型之实施例的金属层剥离后的晶片。 FIG. 8 is a wafer after peeling off the metal layer according to the embodiment of the present invention.

图9为本实用新型之实施例的完成金属层及光刻胶剥离后的晶片。 FIG. 9 is a wafer after the metal layer and the photoresist are peeled off according to the embodiment of the present invention.

附图标示:1:晶片表面金属剥离系统;2:上下片区;21:载片框;22:载片盘;23:第一晶片槽;31:定位柱;32:定位孔;4:接触式剥离装置;41:进膜卷;42:下压重块;43:导轨;44:载台;45:出膜卷;46:第二晶片槽;47:白膜;5:冲洗去除装置;51:高压流体管路;52:旋转载台;53:回收装置;54:过滤网;55:旋转铰链;56:旋转轴;6:机械手;61:机械臂;62:吸盘;63:主轴;71:金属层;72:光刻胶;73:P电极;74:N电极;75:衬底。 Drawings: 1: Wafer surface metal peeling system; 2: Upper and lower film areas; 21: Carrier frame; 22: Carrier tray; 23: First wafer slot; 31: Positioning column; 32: Positioning hole; 4: Contact type Stripping device; 41: Film inlet roll; 42: Down weight block; 43: Guide rail; 44: Carrier; 45: Film output roll; 46: Second wafer tank; 47: White film; 5: Washing removal device; 51 : High-pressure fluid pipeline; 52: Rotary carrier; 53: Recovery device; 54: Filter screen; 55: Rotary hinge; 56: Rotary shaft; 6: Manipulator; 61: Mechanical arm; 62: Suction cup; 63: Main shaft; 71 : metal layer; 72: photoresist; 73: P electrode; 74: N electrode; 75: substrate.

具体实施方式 Detailed ways

现在结合附图和优选实施例对本实用新型作进一步详细的说明。这些附图均为简化的示意图,仅以示意图方式说明本实用新型的基本机构,因此其仅显示与本实用新型有关的构成。显然,所描述的实施例仅仅是本实用新型一部分实施例,而不是全部的实施例,基于本实用新型中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本实用新型保护的范围。需要说明的是,文中的表示方位的词“上”“下”仅用于详细说明本实施例,不限定本实用新型的内容。 Now in conjunction with accompanying drawing and preferred embodiment the utility model is described in further detail. These drawings are all simplified schematic diagrams, which only illustrate the basic mechanism of the utility model in a schematic way, so they only show the configurations related to the utility model. Apparently, the described embodiments are only some embodiments of the present utility model, rather than all embodiments. Based on the embodiments of the present utility model, those skilled in the art can obtain all other Embodiments all belong to the protection scope of the utility model. It should be noted that the words "up" and "down" indicating orientation in the text are only used to describe this embodiment in detail, and do not limit the content of the present utility model.

实施例 Example

如图1所示,本实施例提供一种晶片表面金属剥离系统1,该系统包括上下片区2、接触式剥离装置4、冲洗去除装置5、以及机械手6。 As shown in FIG. 1 , this embodiment provides a wafer surface metal stripping system 1 , which includes an upper and lower wafer area 2 , a contact stripping device 4 , a rinse removal device 5 , and a manipulator 6 .

如图2所示,上下片区2包括一个载片框21,载片框21上可满载两盘载片盘22,每个载片盘22结构一致,载片盘22与载片框21由如图3所示成三角方位的定位柱31与定位孔32契合进行定位,载片盘22上表面包括3个第一晶片槽23,由每个第一晶片槽23承载一个如图7所示的包含衬底75的晶片。 As shown in Figure 2, the upper and lower film area 2 includes a slide frame 21, two slide trays 22 can be fully loaded on the slide frame 21, each slide tray 22 has the same structure, and the slide tray 22 and the slide frame 21 are composed of As shown in Figure 3, the positioning column 31 in a triangular orientation fits with the positioning hole 32 for positioning, and the upper surface of the carrier tray 22 includes three first wafer grooves 23, and each first wafer groove 23 carries a wafer as shown in Figure 7. Wafer comprising substrate 75 .

如图4所示,接触式剥离装置4上安装有进膜卷41、下压重块42、导轨43、载台44、出膜卷45;如图5所示,冲洗去除装置5包括高压流体管路51、旋转载台52、回收装置53、过滤网54、旋转铰链55、旋转轴56。 As shown in Figure 4, the film inlet roll 41, the lower pressure weight 42, the guide rail 43, the stage 44, and the film roll 45 are installed on the contact stripping device 4; A pipeline 51 , a rotary carrier 52 , a recovery device 53 , a filter 54 , a rotary hinge 55 , and a rotary shaft 56 .

通过图6的机械臂61连接的吸盘62随主轴63旋转、上下运动,实现取片、下片。 The suction cup 62 connected by the mechanical arm 61 of FIG. 6 rotates with the main shaft 63 and moves up and down to realize taking and unloading the film.

1)作业时,操作员将晶片置于载片盘22后,通过机械手6的吸盘62利用吸真空取片,一次将载片盘22上的3个晶片从上下片区2,运送至接触式剥离装置4中载台44上的第二晶片槽46,第二晶片槽46表面包含细孔,细孔与真空泵相连接,开启第二晶片槽46的吸真空设置,固定晶片。 1) During operation, after the operator puts the wafer on the loading tray 22, the suction cup 62 of the manipulator 6 uses vacuum to pick up the wafers, and transports three wafers on the loading tray 22 from the upper and lower wafer areas 2 to the contact stripping at a time. The second wafer groove 46 on the stage 44 in the device 4, the surface of the second wafer groove 46 includes pores, the pores are connected with a vacuum pump, and the vacuum suction setting of the second wafer groove 46 is opened to fix the wafer.

2)载台44通过导轨43在气缸的带动下,从图1的原位运动至下压重块42及进膜卷41提供的白膜下方,下压重块42在气缸带动下竖直向下运动,将白膜与晶片表面金属层71接触,下压重块42上升,载台44退回原位,白膜连同部分金属剥离。 2) The stage 44 is driven by the cylinder through the guide rail 43, and moves from the original position in Fig. 1 to the bottom of the white film provided by the pressing weight 42 and the film feeding roll 41, and the pressing weight 42 is driven vertically by the cylinder. The downward movement brings the white film into contact with the metal layer 71 on the wafer surface, the pressing weight 42 rises, the stage 44 returns to its original position, and the white film and part of the metal are peeled off.

3)机械手6将载台44上的晶片,运送至冲洗去除装置5的旋转载台52上。冲洗去除装置5通过高压流体管路51,由程序控制旋转载台52下方旋转铰链55及旋转轴56运动,使得旋转载台52与高压流体的角度、相对位置在工作过程中不断改变,依次进行三轮冲洗,第一轮纯水管路多角度冲击晶片,利用纯水冲击力对金属层71进行剥离,剥离后效果如图8所示;第二轮去光阻液管路通过高压流体管路51使用SF-M15去光阻液对光刻胶72和残余金属进行剥离,SF-M15的主要成分为NMP、MEA、DMSO的混合液;第三轮通过纯水管路先纯水冲洗后,通过氮气管路吹氮气对晶片进行吹干,处理后晶片的P电极73和N电极74裸露出来。剥离后的金属被高压流体带入回收装置53,由过滤网54过滤,实现金属与废液分离。 3) The robot arm 6 transports the wafer on the stage 44 to the rotary stage 52 of the rinse removal device 5 . The flushing removal device 5 passes through the high-pressure fluid pipeline 51, and the program controls the movement of the rotary hinge 55 and the rotary shaft 56 under the rotary platform 52, so that the angle and relative position between the rotary platform 52 and the high-pressure fluid are continuously changed during the working process, and the steps are carried out in sequence. Three rounds of rinsing, the first round of pure water pipeline impacts the wafer from multiple angles, and the metal layer 71 is peeled off by using the impact force of pure water, and the effect after stripping is shown in Figure 8; Lu 51 uses SF-M15 photoresist stripper to strip photoresist 72 and residual metal. The main component of SF-M15 is a mixture of NMP, MEA, and DMSO; The wafer is dried by blowing nitrogen through the nitrogen pipeline, and the P electrode 73 and the N electrode 74 of the wafer are exposed after processing. The stripped metal is brought into the recovery device 53 by the high-pressure fluid, and filtered by the filter screen 54 to realize the separation of the metal and the waste liquid.

4)通过机械手6,将如图8所示剥离完成的晶片运送回上下片区2的载片盘22上。随后机械手6再从上下片区2取待加工的晶片运送至接触式剥离装置4的载台44上。至此,晶片表面金属剥离系统1实现循环式高效去除晶片表面金属。操作员通过更换载片盘22上的晶片,保证循环运作,定期更换出膜卷45和过滤网54,实现金属回收。 4) Through the manipulator 6, transport the peeled wafer as shown in FIG. 8 back to the loading tray 22 in the upper and lower area 2 . Then the manipulator 6 takes the wafer to be processed from the upper and lower wafer areas 2 and transports it to the stage 44 of the contact stripping device 4 . So far, the wafer surface metal stripping system 1 realizes circular and efficient removal of wafer surface metal. The operator ensures circular operation by replacing the wafers on the loading tray 22, and regularly replaces the film roll 45 and the filter screen 54 to realize metal recovery.

Claims (10)

1. a wafer surface metal-stripping system, comprise upper and lower section, service area and manipulator, it is characterized in that: described service area comprises contact stripping off device, rinses removal device, get sheet, bottom sheet by manipulator, the wafer of upper and lower section delivered to successively contact stripping off device and rinse operation on removal device.
2. wafer surface metal-stripping system according to claim 1, is characterized in that: described upper and lower section is provided with the slide glass frame of carrying slide glass dish, and slide glass dish is at least provided with first wafer slots, for placing wafer.
3. wafer surface metal-stripping system according to claim 1, is characterized in that: described contact stripping off device comprises into film volume, lower saddle weight, microscope carrier, guide rail, membrane volume, by contact wafer surface, provides viscosity suction to wafer surface.
4. wafer surface metal-stripping system according to claim 3, it is characterized in that: described microscope carrier comprises second wafer slots the same number of with the first wafer slots on slide glass dish, second wafer slots surface is provided with pore, and pore is connected with vacuum pump, carries out absorption fix wafer; Wafer is being delivered to below tunica albuginea by guide rail by microscope carrier, provides pressure by lower saddle weight to tunica albuginea and wafer, thus carries out contact stripping metal.
5. wafer surface metal-stripping system according to claim 1, is characterized in that: described flushing removal device, uses high-pressure fluid to impact wafer surface.
6. wafer surface metal-stripping system according to claim 1, is characterized in that: described flushing removal device comprises high-pressure liquid line, rotates microscope carrier and retracting device.
7. wafer surface metal-stripping system according to claim 6, is characterized in that: described high-pressure liquid line comprises pure water pipeline, removing photoresistance liquid pipeline and nitrogen pipeline.
8. wafer surface metal-stripping system according to claim 6, is characterized in that: the height of described rotation microscope carrier is controlled by the liftable rotating shaft be positioned at below it; Described rotation microscope carrier is controlled by the rotary gemel be positioned at below described rotation microscope carrier relative to the angle of high-pressure fluid line way outlet.
9. wafer surface metal-stripping system according to claim 6, is characterized in that: described retracting device comprises screen pack and devil liquor recovery pipe.
10. wafer surface metal-stripping system according to claim 1, is characterized in that: described robot work face is provided with sucker, captures wafer by sucker.
CN201520114206.7U 2015-02-17 2015-02-17 A kind of wafer surface metal-stripping system Expired - Lifetime CN204424227U (en)

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CN106409717A (en) * 2015-07-27 2017-02-15 沈阳芯源微电子设备有限公司 Wafer metal-stripping and photoresist-stripping cleaning device
CN107017318A (en) * 2015-09-25 2017-08-04 晶元光电股份有限公司 Metal recovery equipment and method for recovering metal on surface of wafer by using metal recovery equipment
CN107469456A (en) * 2016-06-07 2017-12-15 沈阳芯源微电子设备有限公司 A kind of metal recovery system for tearing golden degumming process
CN108987537A (en) * 2017-06-01 2018-12-11 山东浪潮华光光电子股份有限公司 A kind of processing method of the more gold abnormalities of LED wafer
CN109212918A (en) * 2018-09-04 2019-01-15 宁波润华全芯微电子设备有限公司 A kind of surface metal and photoresist removal device
CN109560020A (en) * 2018-09-27 2019-04-02 厦门市三安集成电路有限公司 A kind of structures and methods using NMP steam removing chip metal film
CN110739242A (en) * 2018-07-19 2020-01-31 沈阳芯源微电子设备股份有限公司 wafer photoresist and antifog gas overflow device in metal stripping process
CN112687591A (en) * 2021-01-29 2021-04-20 合肥新汇成微电子有限公司 Automatic film removing machine for wafer

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106409717A (en) * 2015-07-27 2017-02-15 沈阳芯源微电子设备有限公司 Wafer metal-stripping and photoresist-stripping cleaning device
CN107017318A (en) * 2015-09-25 2017-08-04 晶元光电股份有限公司 Metal recovery equipment and method for recovering metal on surface of wafer by using metal recovery equipment
CN107017318B (en) * 2015-09-25 2020-03-06 晶元光电股份有限公司 Metal recovery equipment and method for recovering wafer surface metal by using metal recovery equipment
CN107469456A (en) * 2016-06-07 2017-12-15 沈阳芯源微电子设备有限公司 A kind of metal recovery system for tearing golden degumming process
CN108987537A (en) * 2017-06-01 2018-12-11 山东浪潮华光光电子股份有限公司 A kind of processing method of the more gold abnormalities of LED wafer
CN108987537B (en) * 2017-06-01 2020-08-14 山东浪潮华光光电子股份有限公司 Processing method for LED wafer multi-gold abnormity
CN110739242A (en) * 2018-07-19 2020-01-31 沈阳芯源微电子设备股份有限公司 wafer photoresist and antifog gas overflow device in metal stripping process
CN109212918A (en) * 2018-09-04 2019-01-15 宁波润华全芯微电子设备有限公司 A kind of surface metal and photoresist removal device
CN109560020A (en) * 2018-09-27 2019-04-02 厦门市三安集成电路有限公司 A kind of structures and methods using NMP steam removing chip metal film
CN112687591A (en) * 2021-01-29 2021-04-20 合肥新汇成微电子有限公司 Automatic film removing machine for wafer
CN112687591B (en) * 2021-01-29 2024-07-02 合肥新汇成微电子股份有限公司 Automatic film removing machine for wafer

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