CN203813098U - Probe-type conductive terminal - Google Patents
Probe-type conductive terminal Download PDFInfo
- Publication number
- CN203813098U CN203813098U CN201420061523.2U CN201420061523U CN203813098U CN 203813098 U CN203813098 U CN 203813098U CN 201420061523 U CN201420061523 U CN 201420061523U CN 203813098 U CN203813098 U CN 203813098U
- Authority
- CN
- China
- Prior art keywords
- probe
- host cavity
- conducting terminal
- type conducting
- contact site
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
- H01R13/2421—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means using coil springs
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- Measuring Leads Or Probes (AREA)
Abstract
The utility model provides a probe-type conductive terminal applicable to a connector. The terminal comprises a probe, an elastic element and a terminal body with a hollow structure which forms a holding chamber through one end of the terminal body. The probe is slidably telescopic and is held in the holding chamber. One end of the probe extends out of the holding chamber to form an extending end comprising a contact portion for pushing contact with an external electronic component. The contact portion deviates from the center line of the probe, and the elastic element is held in the holding chamber and connected between the inner wall of the holding chamber and the probe. When the external electronic component is pushed against the contact portion to drive the probe to make telescopic slides inside the holding chamber, a pushing force applied to the contact portion generates a moment with respect to the center line of the probe so as to make the probe butt against a side wall of the holding chamber, thereby ensuring the probe and the terminal body are in good contact with good contact resistance, and thus the conductivity and the service life are both improved.
Description
Technical field
The utility model relates to a kind of conducting terminal, relates in particular to a kind of probe-type conducting terminal.
Background technology
Probe type terminal is a kind of core component in precision connector in the fields such as mobile phone, communication, automobile, medical treatment, Aero-Space that is applied to, by this probe type terminal, go to realize the electric connection between precision connector and exterior electrical components, thus the normal function of performance precision connector.
As everyone knows, probe type terminal generally includes probe, terminal body and spring, probe is placed in terminal body, spring closes in terminal body and contacts between probe and terminal body, make probe can do with respect to terminal body the slip of elastic telescopic, thereby meet probe and the conflict of exterior electrical components elasticity and realize the object being electrically connected.Particularly, the electrical signal transfer at exterior electrical components place to the process at probe type terminal place is, the signal of telecommunication at exterior electrical components place by probe after minute two parts transmit, a part is to be delivered to terminal body place by spring, and another part is to be delivered to terminal body place by probe and terminal body inwall; Because exterior electrical components is the center of pushing tow probe, therefore can make the sidewall of probe and terminal body have discontiguous state when pushing tow probe is done telescopic slide in terminal body, thereby have influence on the reliability of the sidewall contact of probe and terminal body, and then cause the bad of contact resistance, correspondingly reduce conductive capability, and shortened normal useful life.
Therefore, be badly in need of wanting a kind of probe-type conducting terminal that can improve useful life to overcome above-mentioned defect.
Utility model content
The purpose of this utility model is to provide a kind of can guarantee that contact resistance is well to increase conductive capability and to improve the probe-type conducting terminal in useful life.
For realizing above-mentioned object, the utility model provides a kind of probe-type conducting terminal, is applicable on connector, and wherein, probe-type conducting terminal of the present utility model comprises the terminal body of probe, flexible member and hollow structure.Described hollow structure forms the host cavity that runs through described terminal body one end, described probe is in the described host cavity of being contained in of Slidable telescopic, and the outer external part that forms of described host cavity is stretched out in one end of described probe, described external part has a contact site for the contact of exterior electrical components pushing tow, and described contact site departs from the centerline of described probe; Described flexible member is contained in described host cavity and is connected between the inwall and described probe of described host cavity; When exterior electrical components makes described probe do flexible slip in described host cavity by contact site described in pushing tow, act on jacking force on described contact site and produce with respect to the moment of the centerline of described probe and make the sidewall of described probe and described host cavity inconsistent.
Preferably, the end of described external part is incline structure along the flexible direction of described probe, and described contact site is formed on described incline structure.
Preferably, described contact site is formed at the highest point of described incline structure.
Preferably, the inclined plane of described incline structure is a plane.
Preferably, described inclined plane and be 10 degree to 85 degree perpendicular to the angular range between the plane of the center line of described probe.
Preferably, the sidewall of described host cavity extends a stop part towards described probe place, described probe is contained in one end in described host cavity and towards the side-walls of described host cavity, extends one and be subject to stopper, described stop part with described in be subject to coordinating of stopper and stop that described probe skids off described host cavity completely.
Preferably, described probe is hollow-core construction, described hollow-core construction runs through described probe and is contained in the one end in described host cavity and forms a socket chamber, described socket chamber and described host cavity connect, described flexible member is contained in described host cavity and described socket chamber, and described flexible member contacts on the inwall of described socket chamber and host cavity.
Preferably, described probe and terminal body are all column construction.
Preferably, described terminal body comprises the first cylindrical portion, the second cylindrical portion and the first conus portion that concentric arranges, described the second cylindrical portion is fixed in described the first cylindrical portion, described the first conus portion is fixed in described the second cylindrical portion, and described host cavity runs through described the first conus portion and the second cylindrical portion.
Preferably, described stop part is positioned on described the first conus portion.
Compared with prior art, because the contact site of the external part of probe of the present utility model departs from the centerline of probe, when therefore externally electronic component makes probe do flexible slip in host cavity by pushing tow contact site, the jacking force that acts on contact site produces the moment with respect to the centerline of probe, this moment is ordered about probe and is had the trend that the sidewall relative to host cavity rotates, thereby make the sidewall of probe and host cavity inconsistent, thereby guarantee the good contact of probe and terminal body, and then guarantee the good of contact resistance, to increase conductive capability and to improve useful life.
Accompanying drawing explanation
Fig. 1 is the perspective view of probe-type conducting terminal of the present utility model.
Fig. 2 is the stereo decomposing structure chart of the probe-type conducting terminal shown in Fig. 1.
Fig. 3 is the internal structure schematic diagram of the probe-type conducting terminal shown in Fig. 1.
Embodiment
In order to describe technology contents of the present utility model, structural feature in detail, below in conjunction with execution mode and coordinate accompanying drawing to be described further.
Refer to Fig. 1 to Fig. 3, probe-type conducting terminal 100 of the present utility model is applicable on connector, more excellent is to be applicable on precision connector to guarantee the connection precision of precision connector, wherein, probe-type conducting terminal 100 of the present utility model comprises the terminal body 30 of probe 10, flexible member 20 and hollow structure.Be preferably, terminal body 30 is column construction so that the processing of terminal body 30, but not as limit, and the hollow structure of terminal body 30 forms the host cavity 31 of penetrating terminal body 30 one end (as the top of the terminal body 30 in Fig. 1), host cavity 31 is more excellent is that a columniform cavity is so that the processing of host cavity 31, certainly, host cavity 31 can also be the cavity of other shape, but not as limit.Probe 10 is being contained in host cavity 31 of Slidable telescopic, be preferably, probe 10 is column construction so that the processing of probe 10, and one end of probe 10 (as the top of Fig. 1 middle probe 10) stretches out the outer formation one external part 10a of host cavity 31, external part 10a has a contact site 11 for the contact of exterior electrical components pushing tow, and this contact site 11 departs from the centre line L place (as shown in Figure 3) of probe 10.Flexible member 20 is contained in host cavity 31, and flexible member 20 is connected between the inwall and probe 10 of host cavity 31.Particularly, in the present embodiment, probe 10 is hollow-core construction, and hollow-core construction penetration probe 10 is contained in the one end in host cavity 31 and forms a socket chamber 15, and socket chamber 15 is more excellent also cylindrical and connect with host cavity 31; And flexible member 20 is to contact on the inwall of socket chamber 15 and host cavity 31, preferably, flexible member 20 is chosen as a spring to simplify the structure of flexible member 20.
When exterior electrical components pushing tow contact site 11, and while making probe 10 do flexible slip in host cavity 31, the jacking force F acting on contact site 11 produces the moment with respect to the centre line L place of probe 10, this moment makes probe 10 produce the trend of rotating relative to terminal body 30, thereby make probe 10 inconsistent with the sidewall of host cavity 31, to guarantee that contact resistance is good.More specifically, as follows:
Compared with the superior, the end of external part 10a is incline structure 13 along the flexible direction (as the above-below direction of Fig. 1 middle probe 10) of probe 10, contact site 11 is formed on incline structure 13, more easily make contact site 11 depart from the centre line L place of probe 10, be preferably, contact site 11 is formed at the highest point of incline structure 13, so that contact site 11 departs from the centre line L place of probe 10 to greatest extent, to improve further the conflict effect of probe 10 and terminal body 30, to guarantee the formedness of contact resistance; Particularly, the inclined plane 131 of incline structure 13 is a plane, so that the formation of incline structure 13 processing, be preferably, inclined plane 131 and be 10 degree to 85 degree perpendicular to the angle α scope between the plane P of the centre line L of probe 10, optimum angle α scope is 15 degree to 60 degree, may be selected to be 15 degree, 20 degree, 25 degree, 40 degree, 50 degree or 60 degree.
Simultaneously, the sidewall of host cavity 31 extends a stop part 32 towards probe 10 places, the more excellent cirque structure that is of stop part 32, probe 10 is contained in one end in host cavity 31 and towards the side-walls of host cavity 31, extends one and be subject to stopper 14, is subject to the more excellent cirque structure that is also of stopper 14; When stop part 32 is when being subject to the coordinating of stopper 14, can stop that probe 10 skids off host cavity 31 completely, thereby make probe 10 in host cavity 31, do reliable telescopic slide, improve further the matching relationship between probe 10 and terminal body 30.
Moreover, terminal body 30 comprises the first cylindrical portion 30a that concentric arranges, the second cylindrical portion 30b and the first conus portion 30c, the second cylindrical portion 30b is fixed on the first cylindrical portion 30a, the first conus portion 30c is fixed on the second cylindrical portion 30b, host cavity 31 runs through the first conus portion 30c and the second cylindrical portion 30b, so that terminal body 30 is assemblied on connector, be preferably, stop part 32 is positioned on the first conus portion 30c, to increase probe 10, in host cavity 31, do the scope of activities of telescopic slide, thereby the electrical butt of the electronic component of adaptation and different size specification.
Compared with prior art, because the contact site 11 of the external part 10a of probe 10 of the present utility model departs from the centerline of probe 10, when therefore externally electronic component makes probe 10 do flexible slip in host cavity 31 by pushing tow contact site 11, the jacking force F that acts on contact site 11 produces the moment with respect to the centre line L place of probe, this moment is ordered about probe 10 and is had the trend that the sidewall relative to host cavity 31 rotates, thereby make probe 10 inconsistent with the sidewall of host cavity 31, thereby guarantee the good contact of probe 10 and terminal body 30, and then guarantee the good of contact resistance, to increase conductive capability and to improve useful life.
Above disclosed is only preferred embodiments of the present utility model, certainly can not limit with this interest field of the utility model, and the equivalent variations of therefore doing according to the utility model claim, still belongs to the scope that the utility model is contained.
Claims (10)
1. a probe-type conducting terminal, be applicable on connector, it is characterized in that, described probe-type conducting terminal comprises probe, the terminal body of flexible member and hollow structure, described hollow structure forms the host cavity that runs through described terminal body one end, described probe is in the described host cavity of being contained in of Slidable telescopic, and the outer external part that forms of described host cavity is stretched out in one end of described probe, described external part has a contact site for the contact of exterior electrical components pushing tow, described contact site departs from the centerline of described probe, described flexible member is contained in described host cavity and is connected between the inwall and described probe of described host cavity, when exterior electrical components makes described probe do flexible slip in described host cavity by contact site described in pushing tow, act on jacking force on described contact site and produce with respect to the moment of the centerline of described probe and make the sidewall of described probe and described host cavity inconsistent.
2. probe-type conducting terminal as claimed in claim 1, is characterized in that, the end of described external part is incline structure along the flexible direction of described probe, and described contact site is formed on described incline structure.
3. probe-type conducting terminal as claimed in claim 2, is characterized in that, described contact site is formed at the highest point of described incline structure.
4. probe-type conducting terminal as claimed in claim 2, is characterized in that, the inclined plane of described incline structure is a plane.
5. probe-type conducting terminal as claimed in claim 4, is characterized in that, described inclined plane and be 10 degree to 85 degree perpendicular to the angular range between the plane of the center line of described probe.
6. the probe-type conducting terminal as described in claim 1 to 5 any one, it is characterized in that, the sidewall of described host cavity extends a stop part towards described probe place, described probe is contained in one end in described host cavity and towards the side-walls of described host cavity, extends one and be subject to stopper, described stop part with described in be subject to coordinating of stopper and stop that described probe skids off described host cavity completely.
7. probe-type conducting terminal as claimed in claim 6, it is characterized in that, described probe is hollow-core construction, described hollow-core construction runs through described probe and is contained in the one end in described host cavity and forms a socket chamber, described socket chamber and described host cavity connect, described flexible member is contained in described host cavity and described socket chamber, and described flexible member contacts on the inwall of described socket chamber and host cavity.
8. probe-type conducting terminal as claimed in claim 6, is characterized in that, described probe and terminal body are all column construction.
9. probe-type conducting terminal as claimed in claim 8, it is characterized in that, described terminal body comprises the first cylindrical portion, the second cylindrical portion and the first conus portion that concentric arranges, described the second cylindrical portion is fixed in described the first cylindrical portion, described the first conus portion is fixed in described the second cylindrical portion, and described host cavity runs through described the first conus portion and the second cylindrical portion.
10. probe-type conducting terminal as claimed in claim 9, is characterized in that, described stop part is positioned on described the first conus portion.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420061523.2U CN203813098U (en) | 2014-02-11 | 2014-02-11 | Probe-type conductive terminal |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420061523.2U CN203813098U (en) | 2014-02-11 | 2014-02-11 | Probe-type conductive terminal |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203813098U true CN203813098U (en) | 2014-09-03 |
Family
ID=51451811
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420061523.2U Expired - Lifetime CN203813098U (en) | 2014-02-11 | 2014-02-11 | Probe-type conductive terminal |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203813098U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104466484A (en) * | 2014-12-26 | 2015-03-25 | 廖芳 | Novel pogo pin |
| CN113039442A (en) * | 2018-11-19 | 2021-06-25 | 株式会社村田制作所 | Probe head |
| CN114256666A (en) * | 2020-09-24 | 2022-03-29 | 上海莫仕连接器有限公司 | Probe type connector |
-
2014
- 2014-02-11 CN CN201420061523.2U patent/CN203813098U/en not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104466484A (en) * | 2014-12-26 | 2015-03-25 | 廖芳 | Novel pogo pin |
| CN113039442A (en) * | 2018-11-19 | 2021-06-25 | 株式会社村田制作所 | Probe head |
| CN114256666A (en) * | 2020-09-24 | 2022-03-29 | 上海莫仕连接器有限公司 | Probe type connector |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address | ||
| CP03 | Change of name, title or address |
Address after: 518000 Guangdong city of Shenzhen province Baoan District Fuyong Tong Mei Road No. 1 Building 1 Patentee after: SHEN ZHEN TOP-LINK TECHNOLOGIES Co.,Ltd. Address before: 1 No. 518103 Guangdong city of Shenzhen province Baoan District Fuyong Tong Mei Road Patentee before: Shenzhen Top-Link Electronics Co.,Ltd. |
|
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20140903 |