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CN203289399U - CMOS delaying over-temperature protection circuit - Google Patents

CMOS delaying over-temperature protection circuit Download PDF

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Publication number
CN203289399U
CN203289399U CN201320141722XU CN201320141722U CN203289399U CN 203289399 U CN203289399 U CN 203289399U CN 201320141722X U CN201320141722X U CN 201320141722XU CN 201320141722 U CN201320141722 U CN 201320141722U CN 203289399 U CN203289399 U CN 203289399U
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nmos pass
transistor
pass transistor
drain terminal
pmos
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施朝霞
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Zhejiang University of Technology ZJUT
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Zhejiang University of Technology ZJUT
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Abstract

The utility model discloses a CMOS delaying over-temperature protection circuit comprising a core over-temperature control circuit 1 constituted by a PNP transistor Q0, a resistor R2, a resistor R3, a resistor R4, and a PMOS switch tube M11. The PMOS switch tube M11 grid voltage can be used to output the voltage Vout to a protection circuit, and the PMOS switch tube M11 is parallely connected with the resistor R4, in addition, one end of the above mentioned parallel connection is connected with the power supply voltage, and the other end of the parallel connection is connected with one end of the resistor R3. The other end of the resistor R3 is connected with a base electrode of a PNP transistor, and an emitter electrode of the PNP transistor Q0 is connected with the power supply voltage. A collector electrode of the PNP transistor Q0 is connected with one end of the resistor R2, and the other end of the resistor R2 is connected with a ground voltage.

Description

CMOS迟滞过温保护电路CMOS hysteresis over temperature protection circuit

技术领域 technical field

本实用新型涉及实现的具有迟滞特性的过温保护电路,适合集成在电源管理芯片等局部功耗较大、结温较高对芯片性能较大影响的电路中进行迟滞过温保护。  The utility model relates to an realized over-temperature protection circuit with hysteresis characteristics, which is suitable for hysteresis over-temperature protection integrated in power management chips and other circuits with large local power consumption and high junction temperature that greatly affects chip performance. the

背景技术 Background technique

随着集成电路技术的广泛应用及集成度不断增加,集成电路芯片的功耗不断提高,使芯片局部温升过快,影响芯片电路的性能,甚至对芯片产生永久性的损害。  With the wide application of integrated circuit technology and the continuous increase of integration, the power consumption of integrated circuit chips continues to increase, causing the local temperature of the chip to rise too fast, affecting the performance of the chip circuit, and even causing permanent damage to the chip. the

为了保护芯片免受高温的损坏,一方面可以采用低电源电压和低功耗电路设计技术,另一方面是在芯片内部设置温度传感器,进行过温保护。当芯片温度超过一定值就关断芯片电路主要功耗器件的工作,让芯片降温,避免烧坏芯片。  In order to protect the chip from high temperature damage, on the one hand, low power supply voltage and low power consumption circuit design technology can be used, on the other hand, a temperature sensor is installed inside the chip for over-temperature protection. When the chip temperature exceeds a certain value, the work of the main power consumption devices of the chip circuit is turned off, so as to cool down the chip and avoid burning the chip. the

传统过热保护电路分两个部分实现,第一部分是先用温度传感器检测芯片的内部温度,把温度信号转变成电信号,第二部分是通过比较器与将检测到的电信号与参考信号进行比较,如果超过参考值就输出相反的电压信号,使后续电路停止正常工作。过热保护电路中迟滞电路的作用是改变比较器的翻转阈值电压,从而防止功率器件在翻转点频繁开启和关断,提高工作的可靠性,对温度工作的迟滞特性一般是通过施密特触发器实现。  The traditional overheat protection circuit is realized in two parts. The first part is to use the temperature sensor to detect the internal temperature of the chip and convert the temperature signal into an electrical signal. The second part is to compare the detected electrical signal with the reference signal through a comparator. , if it exceeds the reference value, it will output the opposite voltage signal, so that the subsequent circuit will stop working normally. The function of the hysteresis circuit in the overheat protection circuit is to change the flipping threshold voltage of the comparator, thereby preventing the power device from being turned on and off frequently at the flipping point, and improving the reliability of the work. The hysteresis characteristic of the temperature work is generally through the Schmitt trigger accomplish. the

发明内容 Contents of the invention

为了克服现有的过温保护电路结构复杂、元器件数目较多的不足, 本实用新型提供一种电路结构简单、无需比较器和施密特触发器、元器件数目较少的能用CMOS工艺集成的迟滞过温保护电路。  In order to overcome the shortcomings of the existing over-temperature protection circuit with complex structure and large number of components, the utility model provides an available CMOS technology with simple circuit structure, no need for comparators and Schmitt triggers, and a small number of components. Integrated hysteretic over-temperature protection circuit. the

本实用新型解决其技术问题所采用的技术方案是:  The technical scheme that the utility model solves its technical problem adopts is:

一种CMOS迟滞过温保护电路,包括由PNP晶体管Q0、电阻R2、电阻R3、电阻R4和PMOS开关管M11组成的核心过温控制电路1,PMOS开关管M11栅电压为保护电路输出电压Vout,所述PMOS开关管M11与电阻R4并联,并联的一端接电源电压,并联的另一端与所述电阻R3一端相连,所述电阻R3的另一端与PNP晶体管的基极相连,所述PNP晶体管Q0的发射极与电源电压相连,所述PNP晶体管Q0的集电极与所述电阻R2的一端相连,所述电阻R2的另一端与地电压相连。  A CMOS hysteresis over-temperature protection circuit, comprising a core over-temperature control circuit 1 composed of a PNP transistor Q0, a resistor R2, a resistor R3, a resistor R4, and a PMOS switch tube M11, the gate voltage of the PMOS switch tube M11 being the output voltage Vout of the protection circuit, The PMOS switch tube M11 is connected in parallel with the resistor R4, one end of the parallel connection is connected to the power supply voltage, the other end of the parallel connection is connected to one end of the resistor R3, the other end of the resistor R3 is connected to the base of the PNP transistor, and the PNP transistor Q0 The emitter of the PNP transistor Q0 is connected to the power supply voltage, the collector of the PNP transistor Q0 is connected to one end of the resistor R2, and the other end of the resistor R2 is connected to the ground voltage. the

作为优选的一种方案:所述迟滞过温保护电路还包括共源共栅恒流产生共源共栅恒流产生支路2,由电阻R1,NMOS晶体管M1,NMOS晶体管M2,NMOS晶体管M3,NMOS晶体管M4,NMOS晶体管M5和NMOS晶体管M6组成。所述电阻R1的一端与电源相连,所述电阻R1的另一端与NMOS晶体管M1的漏端相连,所述NMOS晶体管M1的漏端、栅端并联,并与所述NMOS晶体管M2和所述NMOS晶体管M5的栅端相连,所述NMOS晶体管M1的源端与所述NMOS晶体管M3的漏端相连,所述NMOS晶体管M3的漏端、栅端并联,并与所述NMOS晶体管M4和所述NMOS晶体管M6的栅端相连,所述NMOS晶体管M2的漏端与电源相连,所述NMOS晶体管M2的源端与所述NMOS晶体管M4的漏端相连,所述NMOS晶体管M5的源端与所述NMOS晶体管M6的漏端相连,所述NMOS晶体管M3、 M4、M6的源端分别接地,所述NMOS晶体管M5的漏端作为共源共栅恒流产生支路2的输出端与所述PNP晶体管Q0的基极相连。  As a preferred solution: the hysteresis over-temperature protection circuit also includes cascode constant current generation cascode constant current generation branch 2, composed of resistor R1, NMOS transistor M1, NMOS transistor M2, NMOS transistor M3, NMOS transistor M4, NMOS transistor M5 and NMOS transistor M6 are composed. One end of the resistor R1 is connected to the power supply, the other end of the resistor R1 is connected to the drain end of the NMOS transistor M1, the drain end and the gate end of the NMOS transistor M1 are connected in parallel, and are connected to the NMOS transistor M2 and the NMOS transistor M1 The gate terminal of the transistor M5 is connected, the source terminal of the NMOS transistor M1 is connected to the drain terminal of the NMOS transistor M3, the drain terminal and the gate terminal of the NMOS transistor M3 are connected in parallel, and are connected with the NMOS transistor M4 and the NMOS transistor M4. The gate terminal of the transistor M6 is connected, the drain terminal of the NMOS transistor M2 is connected to the power supply, the source terminal of the NMOS transistor M2 is connected to the drain terminal of the NMOS transistor M4, and the source terminal of the NMOS transistor M5 is connected to the NMOS transistor M5 The drain terminals of the transistor M6 are connected, the source terminals of the NMOS transistors M3, M4, and M6 are respectively grounded, and the drain terminals of the NMOS transistor M5 are used as the output terminal of the cascode constant current generation branch 2 and the PNP transistor Q0 connected to the base. the

作为优选的另一种方案:所述迟滞过温保护电路还包括一个输出信号电平控制支路3,由PMOS晶体管M7,PMOS晶体管M9,NMOS晶体管M8和NMOS晶体管M10组成,所述PMOS晶体管M7、NMOS晶体管M8的栅端相连,并与PNP晶体管的集电极相连,所述PMOS晶体管M7的漏端与所述PMOS开关管M11的漏端相连,所述PMOS晶体管M7的漏端与所述NMOS晶体管M8的漏端相连,并与所述PMOS晶体管M9和所述NMOS晶体管M10的栅端并连,所述NMOS晶体管M8的源端接地,所述PMOS晶体管M9的源端与电源相连,所述PMOS晶体管M9的漏端与所述NMOS晶体管M10的漏端相连,并与所述PMOS开关管M11的栅端相连,形成Vout输出端,所述NMOS晶体管的源端接地。  As another preferred solution: the hysteresis over-temperature protection circuit also includes an output signal level control branch 3, which is composed of a PMOS transistor M7, a PMOS transistor M9, an NMOS transistor M8 and an NMOS transistor M10, and the PMOS transistor M7 , the gate of the NMOS transistor M8 is connected to the collector of the PNP transistor, the drain of the PMOS transistor M7 is connected to the drain of the PMOS switch M11, the drain of the PMOS transistor M7 is connected to the NMOS The drain terminal of the transistor M8 is connected and connected in parallel with the gate terminals of the PMOS transistor M9 and the NMOS transistor M10, the source terminal of the NMOS transistor M8 is grounded, the source terminal of the PMOS transistor M9 is connected to a power supply, and the The drain terminal of the PMOS transistor M9 is connected to the drain terminal of the NMOS transistor M10 and connected to the gate terminal of the PMOS switch M11 to form a Vout output terminal, and the source terminal of the NMOS transistor is grounded. the

本实用新型的技术构思为:将晶体管BE结阈值电压的温度特性和MOS管开关特性应用于过温保护电路中,使它们成为新的迟滞过温保护电路(如图1所示)。迟滞过温控制电路主要由双极型晶体管Q0,电阻R2、R3、R4和PMOS开关MOS管M11组成,通过控制所述PMOS开关管M11的闭合和断开起到迟滞过温保护的功能。其特征如下:Q0为过温保护主回路中的温度敏感器件,它的基极和集电极分别与电阻R2、R3的一端相连,通过电阻R3、R4组成晶体管Q0的BE结偏置电路,根据芯片温度变化,BE结的阈值电压变化,根据BE结偏置电压和阈值电压的大小决定晶体管Q0的导通和关断,从而改变电阻R2上输出电压VR2的高低电平控制。需特别说明的是,适用于双极型过温保护电路的晶体管Q0为PNP型晶体管。  The technical concept of the utility model is: apply the temperature characteristics of the transistor BE junction threshold voltage and the switching characteristics of the MOS tube to the over-temperature protection circuit, making them a new hysteresis over-temperature protection circuit (as shown in Figure 1). The hysteresis over-temperature control circuit is mainly composed of a bipolar transistor Q0, resistors R2, R3, R4 and a PMOS switch MOS transistor M11, which functions as a hysteresis over-temperature protection by controlling the closing and opening of the PMOS switch M11. Its characteristics are as follows: Q0 is a temperature-sensitive device in the main circuit of over-temperature protection. Its base and collector are connected to one end of resistors R2 and R3 respectively, and the BE junction bias circuit of transistor Q0 is composed of resistors R3 and R4. According to Chip temperature changes, the threshold voltage of the BE junction changes, and the transistor Q0 is turned on and off according to the BE junction bias voltage and threshold voltage, thereby changing the high and low level control of the output voltage VR2 on the resistor R2. It should be noted that the transistor Q0 suitable for the bipolar over-temperature protection circuit is a PNP transistor. the

为了获得过温保护电路的迟滞特性,在电路输出端与过温保护回路之间增加一电压反馈支路,输出端电压的高低电平控制PMOS管M11的导通和截止,改变Q0的BE结的偏置电压的大小,提供两个不同的阈值电压,从而实现过温保护电路的迟滞特性。为了获得理想的输出高低电平,在电阻R2输出与电路输出之间加了两级反相缓冲电路,由MOS管M7、M8、M9、M10组成(如图1所示)。为了获得稳定的偏置电流I0,采用cascode级联结构提高输出电路来增加电流的稳定性,由MOS管M1、M2、M3、M4、M5、M6和电阻R1组成(如图1所示)。  In order to obtain the hysteresis characteristics of the over-temperature protection circuit, a voltage feedback branch is added between the output terminal of the circuit and the over-temperature protection circuit. The high and low levels of the output terminal voltage control the on and off of the PMOS transistor M11, changing the BE junction of Q0 The size of the bias voltage provides two different threshold voltages, thereby realizing the hysteresis characteristic of the over-temperature protection circuit. In order to obtain the ideal output high and low levels, a two-stage inverting buffer circuit is added between the output of the resistor R2 and the circuit output, consisting of MOS transistors M7, M8, M9, and M10 (as shown in Figure 1). In order to obtain a stable bias current I0, the cascode cascade structure is used to improve the output circuit to increase the stability of the current, which is composed of MOS transistors M1, M2, M3, M4, M5, M6 and resistor R1 (as shown in Figure 1). the

本实用新型的有益效果主要表现在:本实用新型提出的CMOS过温保护电路具有迟滞过温保护功能,电路结构简单,元器件数目较少,不需要比较器和施密特触发器等功能电路,芯片温度超过T2后,电路输出高电平关断信号,芯片温度降到T1后,电路输出低电平开通信号,迟滞范围T2-T1,且芯片关断、开启温度根据电路设计参数可调。非常适合集成在电源管理、LED驱动等芯片中。  The beneficial effects of the utility model are mainly manifested in: the CMOS over-temperature protection circuit proposed by the utility model has a hysteresis over-temperature protection function, the circuit structure is simple, the number of components is small, and functional circuits such as comparators and Schmitt triggers are not required , when the chip temperature exceeds T 2 , the circuit outputs a high-level turn-off signal, and when the chip temperature drops to T 1 , the circuit outputs a low-level turn-on signal, with a hysteresis range of T 2 -T 1 , and the chip turn-off and turn-on temperatures are determined according to the circuit Design parameters are adjustable. It is very suitable for integration in power management, LED driver and other chips.

附图说明 Description of drawings

图1是CMOS迟滞过温保护电路原理图  Figure 1 is a schematic diagram of the CMOS hysteresis over-temperature protection circuit

图2是CMOS迟滞过温保护电路仿真曲线  Figure 2 is the simulation curve of the CMOS hysteresis over-temperature protection circuit

具体实施方式 Detailed ways

下面结合附图对本实用新型作进一步描述。  Below in conjunction with accompanying drawing, the utility model is further described. the

实施例  Example

参照图1,一种双极晶体管型迟滞过温保护电路,包括由PNP晶体管Q0、电阻R2、电阻R3、电阻R4和PMOS开关管M11组成的核心过温控制电路1,PMOS开关管M11栅电压为保护电路输出电压 Vout,所述PMOS开关管M11与电阻R4并联,并联的一端接电源电压,并联的另一端与所述电阻R3一端相连,所述电阻R3的另一端与PNP晶体管的基极相连,所述PNP晶体管的发射极与电源电压相连,所述PNP晶体管的集电极与所述电阻R2的一端相连,所述电阻R2的另一端与地电压相连。所述迟滞过温保护电路还包括共源共栅恒流产生共源共栅恒流产生支路2,如图1所示,由电阻R1,NMOS晶体管M1,NMOS晶体管M2,NMOS晶体管M3,NMOS晶体管M4,NMOS晶体管M5和NMOS晶体管M6组成。所述电阻R1的一端与电源相连,所述电阻R1的另一端与NMOS晶体管M1的漏端相连,所述NMOS晶体管M1的漏端、栅端并联,并与所述NMOS晶体管M2和所述NMOS晶体管M5的栅端相连,所述NMOS晶体管M1的源端与所述NMOS晶体管M3的漏端相连,所述NMOS晶体管M3的漏端、栅端并联,并与所述NMOS晶体管M4和所述NMOS晶体管M6的栅端相连,所述NMOS晶体管M2的漏端与电源相连,所述NMOS晶体管M2的源端与所述NMOS晶体管M4的漏端相连,所述NMOS晶体管M5的源端与所述NMOS晶体管M6的漏端相连,所述NMOS晶体管M3、M4、M6的源端分别接地,所述NMOS晶体管M5的漏端作为共源共栅恒流产生支路2的输出端与所述PNP晶体管的基极相连。  Referring to Fig. 1, a bipolar transistor type hysteresis over-temperature protection circuit includes a core over-temperature control circuit 1 composed of a PNP transistor Q0, a resistor R2, a resistor R3, a resistor R4 and a PMOS switch tube M11, and the gate voltage of the PMOS switch tube M11 is In order to protect the output voltage Vout of the circuit, the PMOS switch tube M11 is connected in parallel with the resistor R4, one end of the parallel connection is connected to the power supply voltage, the other end of the parallel connection is connected to one end of the resistor R3, and the other end of the resistor R3 is connected to the base of the PNP transistor The emitter of the PNP transistor is connected to the power supply voltage, the collector of the PNP transistor is connected to one end of the resistor R2, and the other end of the resistor R2 is connected to the ground voltage. The hysteresis over-temperature protection circuit also includes cascode constant current generation cascode constant current generation branch 2, as shown in Figure 1, composed of resistor R1, NMOS transistor M1, NMOS transistor M2, NMOS transistor M3, NMOS Transistor M4, NMOS transistor M5 and NMOS transistor M6 are composed. One end of the resistor R1 is connected to the power supply, the other end of the resistor R1 is connected to the drain end of the NMOS transistor M1, the drain end and the gate end of the NMOS transistor M1 are connected in parallel, and are connected to the NMOS transistor M2 and the NMOS transistor M1 The gate terminal of the transistor M5 is connected, the source terminal of the NMOS transistor M1 is connected to the drain terminal of the NMOS transistor M3, the drain terminal and the gate terminal of the NMOS transistor M3 are connected in parallel, and are connected with the NMOS transistor M4 and the NMOS transistor M4. The gate terminal of the transistor M6 is connected, the drain terminal of the NMOS transistor M2 is connected to the power supply, the source terminal of the NMOS transistor M2 is connected to the drain terminal of the NMOS transistor M4, and the source terminal of the NMOS transistor M5 is connected to the NMOS transistor M5 The drain ends of the transistor M6 are connected, the source ends of the NMOS transistors M3, M4, and M6 are respectively grounded, and the drain ends of the NMOS transistor M5 are used as the output end of the cascode constant current generation branch 2 and the output end of the PNP transistor connected to the base. the

所述迟滞过温保护电路还包括一个输出信号电平控制支路3,由PMOS晶体管M7,PMOS晶体管M9,NMOS晶体管M8和NMOS晶体管M10组成,所述PMOS晶体管M7、NMOS晶体管M8的栅端相连,并与PNP晶体管的集电极相连,所述PMOS晶体管M7的漏端与所述PMOS开关管M11的漏端相连,所述PMOS晶体管M7的漏 端与所述NMOS晶体管M8的漏端相连,并与所述PMOS晶体管M9和所述NMOS晶体管M10的栅端并连,所述NMOS晶体管M8的源端接地,所述PMOS晶体管M9的源端与电源相连,所述PMOS晶体管M9的漏端与所述NMOS晶体管M10的漏端相连,并与所述PMOS开关管M11的栅端相连,形成Vout输出端,所述NMOS晶体管的源端接地。  The hysteresis over-temperature protection circuit also includes an output signal level control branch 3, which is composed of a PMOS transistor M7, a PMOS transistor M9, an NMOS transistor M8 and an NMOS transistor M10, and the gate terminals of the PMOS transistor M7 and the NMOS transistor M8 are connected to each other. , and connected to the collector of the PNP transistor, the drain of the PMOS transistor M7 is connected to the drain of the PMOS switch M11, the drain of the PMOS transistor M7 is connected to the drain of the NMOS transistor M8, and The gate terminals of the PMOS transistor M9 and the NMOS transistor M10 are connected in parallel, the source terminal of the NMOS transistor M8 is grounded, the source terminal of the PMOS transistor M9 is connected to a power supply, and the drain terminal of the PMOS transistor M9 is connected to the The drain terminal of the NMOS transistor M10 is connected to the gate terminal of the PMOS switch M11 to form a Vout output terminal, and the source terminal of the NMOS transistor is grounded. the

图2所示为实施例1CMOS迟滞过温保护电路的典型工作波形图。其电路工作原理具体如下:  FIG. 2 is a typical working waveform diagram of the CMOS hysteresis over-temperature protection circuit in Embodiment 1. The working principle of the circuit is as follows:

(1)温度上升阶段:电路上电时,芯片工作温度为常温条件,PNP晶体管Q0截止,电阻R2输出电压VR2为低电平,输出电压Vout为低电平,此时对芯片核心功耗电路不起控制作用;PMOS晶体管M11导通,将电阻R4短路,晶体管Q0的BE结电压降为I0×R3,芯片温度较低时,该电压降不足以使晶体管Q0导通。随着芯片温度上升,晶体管Q0BE结的导通压降线性下降,本实施例中,BE结在T2=150℃时的导通压降为0.55V,电路设计参数使得I0×R3=0.55V,则晶体管在T2=150℃时候导通,产生发射极电流,电阻R2上电压降VR2变为高电平,输出电压Vout产生从低电平到高电平的跳跃,关断芯片核心功耗电路。同时关断PMOS晶体管M11,晶体管Q0BE结上的压降变为为I0×(R3+R4)。  (1) Temperature rise stage: when the circuit is powered on, the chip operating temperature is at room temperature, the PNP transistor Q0 is cut off, the output voltage VR2 of the resistor R2 is low, and the output voltage Vout is low. At this time, the core power consumption circuit of the chip It does not play a control role; the PMOS transistor M11 is turned on, and the resistor R4 is short-circuited, and the BE junction voltage of the transistor Q0 drops to I0×R3. When the chip temperature is low, the voltage drop is not enough to make the transistor Q0 turn on. As the temperature of the chip rises, the turn-on voltage drop of the transistor Q0BE junction decreases linearly. In this embodiment, the turn-on voltage drop of the BE junction at T2=150°C is 0.55V, and the circuit design parameters make I0×R3=0.55V, Then the transistor is turned on at T2=150°C, generating emitter current, the voltage drop VR2 on the resistor R2 becomes high level, the output voltage Vout jumps from low level to high level, and the core power consumption circuit of the chip is turned off . At the same time, the PMOS transistor M11 is turned off, and the voltage drop on the transistor Q0BE junction becomes I0×(R3+R4). the

(2)温度下降阶段:芯片上核心功耗电路关断后,芯片温度慢慢下降,晶体管Q0BE结的导通压降上升,当芯片温度降到T1时,晶体管Q0BE结的导通压降上升为I0×(R3+R4)时,晶体管Q0关断,电阻R2上电压降VR2从高电平变为低电平,输出电压Vout 从高电平变为低电平,PMOS晶体管M11导通,晶体管Q0BE结的压降为I0×R3。本实施例中,BE结在T2=130℃时的导通压降为0.58V,设计电路参数使得I0×(R3+R4)=0.58V。  (2) Temperature drop stage: After the core power consumption circuit on the chip is turned off, the chip temperature drops slowly, and the conduction voltage drop of the transistor Q0BE junction rises. When the chip temperature drops to T 1 , the conduction voltage drop of the transistor Q0BE junction When rising to I0×(R3+R4), the transistor Q0 is turned off, the voltage drop VR2 on the resistor R2 changes from high level to low level, the output voltage Vout changes from high level to low level, and the PMOS transistor M11 is turned on , The voltage drop across the transistor Q0BE junction is I0×R3. In this embodiment, the conduction voltage drop of the BE junction at T 2 =130°C is 0.58V, and the circuit parameters are designed so that I0×(R3+R4)=0.58V.

(3)随着芯片工作温度在T2和T1范围内变动,设计的过温保护电路输出高电平或者低电平,且有T2-T1的迟滞范围,芯片温度保护区间可以通过电路设计中的电流I0、电阻R3,R4的参数值进行调整。  (3) As the operating temperature of the chip changes within the range of T 2 and T 1 , the designed over-temperature protection circuit outputs high level or low level, and there is a hysteresis range of T 2 -T 1 , the chip temperature protection interval can pass The parameter values of current I0, resistors R3 and R4 in the circuit design are adjusted.

Claims (3)

1.CMOS sluggish thermal-shutdown circuit, it is characterized in that: comprise by PNP transistor Q0, resistance R 2, resistance R 3, the core that resistance R 4 and PMOS switching tube M11 form is crossed temperature control circuit (1), PMOS switching tube M11 gate voltage is protective circuit output voltage V out, described PMOS switching tube M11 is in parallel with resistance R 4, a termination power voltage in parallel, the other end in parallel is connected with described resistance R 3 one ends, the other end of described resistance R 3 is connected with the transistorized base stage of PNP, the emitter of described PNP transistor Q0 is connected with supply voltage, the collector electrode of described PNP transistor Q0 is connected with an end of described resistance R 2, the other end of described resistance R 2 is connected with ground voltage.
2. the sluggish thermal-shutdown circuit of CMOS as claimed in claim 1, it is characterized in that: described sluggish thermal-shutdown circuit also comprises that the cascade constant current produces branch road (2), by resistance R 1, nmos pass transistor M1, nmos pass transistor M2, nmos pass transistor M3, nmos pass transistor M4, nmos pass transistor M5 and nmos pass transistor M6 form, one end of described resistance R 1 is connected with power supply, the other end of described resistance R 1 is connected with the drain terminal of nmos pass transistor M1, the drain terminal of described nmos pass transistor M1, the grid end is in parallel, and with the grid end of described nmos pass transistor M2 and described nmos pass transistor M5, be connected, the source of described nmos pass transistor M1 is connected with the drain terminal of described nmos pass transistor M3, the drain terminal of described nmos pass transistor M3, the grid end is in parallel, and with the grid end of described nmos pass transistor M4 and described nmos pass transistor M6, be connected, the drain terminal of described nmos pass transistor M2 is connected with power supply, the source of described nmos pass transistor M2 is connected with the drain terminal of described nmos pass transistor M4, the source of described nmos pass transistor M5 is connected with the drain terminal of described nmos pass transistor M6, described nmos pass transistor M3, M4, the source of M6 is ground connection respectively, the drain terminal of described nmos pass transistor M5 is connected with the base stage of described PNP transistor Q0 as the output that the cascade constant current produces branch road (2).
3. the sluggish thermal-shutdown circuit of CMOS as claimed in claim 2, it is characterized in that: described sluggish thermal-shutdown circuit also comprises an output signal level control branch road (3), by PMOS transistor M7, PMOS transistor M9, nmos pass transistor M8 and nmos pass transistor M10 form, described PMOS transistor M7, the grid end of nmos pass transistor M8 is connected, and with the transistorized collector electrode of PNP, be connected, the drain terminal of described PMOS transistor M7 is connected with the drain terminal of described PMOS switching tube M11, the drain terminal of described PMOS transistor M7 is connected with the drain terminal of described nmos pass transistor M8, and with the grid end of described PMOS transistor M9 and described nmos pass transistor M10 and connect, the source ground connection of described nmos pass transistor M8, the source of described PMOS transistor M9 is connected with power supply, the drain terminal of described PMOS transistor M9 is connected with the drain terminal of described nmos pass transistor M10, and with the grid end of described PMOS switching tube M11, be connected, form the Vout output, the source ground connection of described nmos pass transistor.
CN201320141722XU 2013-03-26 2013-03-26 CMOS delaying over-temperature protection circuit Expired - Lifetime CN203289399U (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103199846A (en) * 2013-03-26 2013-07-10 浙江工业大学 Complementary metal-oxide-semiconductor transistor (CMOS) delaying over-temperature protective circuit

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103199846A (en) * 2013-03-26 2013-07-10 浙江工业大学 Complementary metal-oxide-semiconductor transistor (CMOS) delaying over-temperature protective circuit
CN103199846B (en) * 2013-03-26 2016-02-24 浙江工业大学 The sluggish thermal-shutdown circuit of CMOS

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