CN202442978U - Long-distance material component analysis device - Google Patents

Abstract

A long-distance material composition analysis device, which is composed of an industrial X-ray emitter (1), a semiconductor detector (2), an amplifier (3), a multi-channel pulse analyzer (4), and a computer (5). The industrial X-ray emitter emits X-rays to the tested sample, and the secondary X-rays reflected by the tested sample are received by the semiconductor detector (2) to obtain a series of pulses whose amplitude is proportional to the photon energy, thereby obtaining the count rate with The distribution curve of photon energy change, that is, the X-ray energy spectrum, is corrected by the computer and then displayed. In this way, the component analysis of the tested sample material can be realized remotely. This device can realize long-distance material composition analysis, and can accurately analyze the material composition of the components in the narrow space of the equipment that cannot be in close contact; components to make accurate determinations. The utility model is suitable for long-distance material component analysis.

Description

Remote material composition analysis device

technical field

The utility model relates to a long-distance material composition analysis device, which belongs to the technical field of material analysis equipment.

Background technique

When the X-ray tube generates incident X-rays (primary X-rays) to excite the sample to be measured, each element in the excited sample will emit secondary X-rays, and the secondary X-rays emitted by different elements have specific energy characteristics. The detection system measures the energy and quantity of these emitted secondary X-rays. Then, the instrument software converts the information collected by the detection system into the types and contents of various elements in the sample. In recent years, the application range of X-ray fluorescence spectroscopy has been continuously expanded in various industries, and it has become a widely used in various fields such as metallurgy, geology, non-ferrous metals, building materials, commodity inspection, environmental protection, sanitation, etc. Most of the analytical elements can be analyzed by it. Analyze solid, powder, molten beads, liquid and other samples, and has the characteristics of fast analysis speed, wide measurement range and low interference.

Most of the spectroscopic analysis instruments on the market can only analyze close-range materials, and cannot accurately and effectively determine the components that cannot be in close contact with the equipment in the narrow space, and some toxic and harmful powders and liquids that cannot be in close contact. , the main reason is to excite the characteristic X-rays of material elements. During normal operation, about 0.2% of the power consumed by the X-ray tube is converted into X-ray radiation, and the rest is converted into heat energy. The greater the distance, the stronger the attenuation of X-rays. The secondary X-ray energy received by the semiconductor detector is insufficient for analysis. The device uses industrial X-ray emitters to emit X-rays with continuous strong energy, and realizes long-distance material composition detection through detectors, amplifiers, multi-channel pulse analyzers, and computer analysis.

Contents of the invention

The purpose of this utility model is that according to the existing spectrum analysis instrument, only close-distance materials can be analyzed, but components that cannot be close-contact in the narrow space of the equipment and some toxic and harmful powders, liquids and other materials that cannot be close-contact The problem that cannot be accurately and effectively determined, the utility model discloses a long-distance material composition analyzer device, which can accurately analyze the material composition of components that cannot be in close contact in the narrow space of the equipment; It can also accurately determine the composition of powders, liquids and other substances that are in contact with the distance.

The technical scheme of the utility model is that the utility model device is composed of an industrial X-ray transmitter 1, a semiconductor detector 2, an amplifier 3, a multi-channel pulse analyzer 4, and a computer 5; the semiconductor detector 2 is connected to the multi-channel pulse through the amplifier 3 The analyzer 4; the multi-channel pulse analyzer 4 is connected to the computer 5; the industrial X-ray transmitter emits X-rays to the tested sample, and the secondary X-ray reflected by the tested sample is received by the semiconductor detector 2.

Industrial X-ray emitter 1 is used to emit X-rays. Due to its high energy, the emitted X-rays can excite the elements in the tested sample to generate secondary X-rays, and the secondary X-rays formed by the reflection of each element on X-rays The energy of the ray is different from the pulse; the semiconductor detector is used to receive the secondary X-ray; the amplifier is used to amplify the signal received by the semiconductor detector; the multi-channel pulse analyzer counts the pulse according to the pulse amplitude for the amplified pulse signal The distribution curve of the count rate changing with the photon energy—the energy spectrum is obtained by counting; the computer is used to correct the energy spectrum.

Since the industrial X-ray emitter has enough energy, after the industrial X-ray emitter emits X-rays to the tested sample, it excites the elements in the tested sample to generate secondary X-rays, and the semiconductor detector receives the secondary X-rays, Obtain a series of pulses whose amplitude is proportional to the energy of the photon, amplified by the amplifier and then sent to the multi-channel pulse analyzer. The number of pulses is counted according to the pulse amplitude. The distribution curve of photon energy change, that is, the X-ray energy spectrum. The energy spectrum is corrected by computer and then displayed. In this way, the component analysis of the tested sample material can be realized remotely.

The beneficial effect of the utility model compared with the prior art is that the device can realize long-distance material composition analysis, and can accurately analyze the material composition of the components in the narrow space of the equipment that cannot be in close contact; It can also accurately determine the composition of powders, liquids and other substances that cannot be in close contact.

The utility model is suitable for long-distance material composition analysis.

Description of drawings

Fig. 1 is a schematic diagram of the structural layout of the utility model; among the figure, 1 is an industrial X-ray source; 2 is a semiconductor detector; 3 is an amplifier; 4 is a multi-channel pulse analyzer; 5 is a computer; 6 is a sample to be tested.

Detailed ways

The specific embodiment of the utility model is as shown in Figure 1.

The remote material composition analysis device of this embodiment is composed of an industrial X-ray emitter 1, a semiconductor detector 2, an amplifier 3, a multi-channel pulse analyzer 4, and a computer 5.

The industrial X-ray transmitter of the remote material composition analysis device in this embodiment emits X-rays to the tested sample, and the secondary X-rays reflected by the tested sample are received by the semiconductor detector 2 .

The industrial X-ray emitter generates enough energy to excite the elements in the tested sample to generate secondary X-rays. Through the semiconductor detector, a series of pulses whose amplitude is proportional to the photon energy are obtained, which are amplified by the amplifier and sent to multiple pulses. The analyzer counts the number of pulses according to the size of the pulse amplitude, and the pulse amplitude is scaled by the energy of X-photons, so as to obtain the distribution curve of the count rate with the change of photon energy, that is, the X-ray energy spectrum. The energy spectrum is corrected by computer and then displayed.

Claims (1)

1. a remote material composition analytical equipment is characterized in that, said device is by being made up of industrial X-ray transmitter (1), semiconductor detector (2), amplifier (3), multichannel analyzer (4), computing machine (5); Semiconductor detector (2) connects multichannel analyzer (4) through amplifier (3); Multichannel analyzer (4) connects computing machine (5); Industrial X-ray transmitter emission X ray is to seized sample, and the secondary x rays of seized sample reflection is received by semiconductor detector (2).

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