CN201689153U - Power module tester - Google Patents
Power module tester Download PDFInfo
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- CN201689153U CN201689153U CN 200920259941 CN200920259941U CN201689153U CN 201689153 U CN201689153 U CN 201689153U CN 200920259941 CN200920259941 CN 200920259941 CN 200920259941 U CN200920259941 U CN 200920259941U CN 201689153 U CN201689153 U CN 201689153U
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- 238000012360 testing method Methods 0.000 claims abstract description 43
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- 230000015572 biosynthetic process Effects 0.000 claims description 3
- 238000002360 preparation method Methods 0.000 claims description 3
- 239000000411 inducer Substances 0.000 abstract 3
- 239000003990 capacitor Substances 0.000 abstract 2
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- 238000010586 diagram Methods 0.000 description 9
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- 230000001939 inductive effect Effects 0.000 description 3
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- 238000011982 device technology Methods 0.000 description 2
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- 239000004065 semiconductor Substances 0.000 description 2
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- 230000005764 inhibitory process Effects 0.000 description 1
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Abstract
The utility model relates to a power module tester, which comprises an oscillograph, a multimeter, a current probe, an inducer, a pulse generator, a drive module, a high-voltage power supply and a low-voltage power supply, the low-voltage power supply supplies power to the pulse generator and the drive module, the high-voltage power supply charges a capacitor of an IGBT power module to be tested, the oscillograph acquires voltage and current waves of the IGBT power module, the inducer is connected between the C pole and the E pole of the IGBT power module through the current probe, the current waves are transmitted to the oscillograph via the current probe, and the multimeter monitors the input voltage of the IGBT power module. The power module tester utilizes the electricity in the charged capacitor to test the power module, and utilizes the impeding effect of the load of the inducer on the change of current to test the freewheeling capability of diodes in the IGBT power module. The utility model not only can decrease the capacity of the needed power supply, thus reducing the cost, but also can increase the coverage rate of testing.
Description
Technical field
The utility model relates to a kind of power module test device that is applied to the power semiconductor field, especially a kind of copped wave proving installation that is applied to IGBT power model performance parameter test, this device also can be used for the test of other similar power model performance parameters of power semiconductor field.
Background technology
Unsteady flow product module kind is many at present, method of testing is various, traditional method of testing adopts lasting copped wave test method to come power device is tested, the method adopts ohmic load, in the copped wave process of the test, power supply need continue to continue to give the driving circuit of tested switching device that the continuous impulse signal is provided to supporting the electric capacity charging by control module, come the driving switch break-over of device to turn-off with this, thus a series of Key Performance Indicators such as detector switch device cut-off voltage and conducting electric current.The method needs continued power, so required power supply capacity is bigger, the cost of buying power supply is higher.The pulse that control module provides is continuous fixed pulse width, can't regulate, and compatibility is poor, and ohmic load is because no energy-storage function.Cause the test speed of product slow like this; testing efficiency is not high; in production in enormous quantities; can't meet speed requirement cheaply soon; and this type of method of testing do not examine the afterflow ability of switching device fly-wheel diode, and the conveyance capacity and the overcurrent protection function of switching device lacked examination.
(the Insulated Gate Bipolar Transistor of IGBT in the past; insulated gate bipolar transistor) the lasting copped wave test unit of power model use has certain limitation; examine as afterflow ability not, the conveyance capacity and the overcurrent protection function of switching device also lacked examination the switching device fly-wheel diode.Because this proving installation needs long-time engaged test platform power source loads, reduced test efficiency, and required power is bigger in addition, pull-up resistor such as is inconvenient to regulate at shortcoming.Cause the test site very flexible, and the experimentation cost expense is higher.
The utility model content
The purpose of this utility model be at existing power module test device and method of testing examination device performance not comprehensively, shortcomings such as high, the very flexible of testing cost, a kind of test coverage height, testing cost is low and dirigibility is high power module test device are provided.
According to the utility model, above-mentioned technical matters realizes by following technical proposals:
A kind of power module test device, comprise oscillograph, multimeter, current probe, inductance, pulse producer, driver module, high-voltage power supply, low-tension supply, low-tension supply provides power supply for pulse producer and driver module, and high-voltage power supply is the electric capacity charging in the tested IGBT power model, and oscillograph is to the voltage of IGBT power model, current waveform is gathered, inductance is connected between the C utmost point (collector) and the E utmost point (emitter) of IGBT power model by current probe, and current waveform is sent on the oscillograph by current probe, and multimeter is monitored the input voltage of IGBT power model.
As further embodiment, pulse producer further comprises pulse shaping circuit, power circuit and reset circuit, power circuit provides power supply for feedback circuit and pulse shaping circuit, and reset circuit is that the trigger in feedback circuit and the pulse shaping circuit carries out zero clearing and resets.
As further embodiment, pulse producer further comprises feedback circuit, and feedback circuit links to each other with pulse shaping circuit, and is unusual when the appearance of IGBT power model, sends the locking pulse signal, and the locking pulse signal turn-offs the power component in the IGBT power model.
As further embodiment, the locking pulse signal is sent into d type flip flop and is produced the formation that a high level signal comes the locking pulse signal through photoelectric coupler isolation.
As further embodiment, pulse producer further comprises d type flip flop and monostalbe trigger, pulse producer is manually given d type flip flop one pulse signal, and the low pulse signal that d type flip flop produces produces pulse waveform for two monostalbe triggers that can heavily trigger again.
As further embodiment, reset circuit further comprises electrify restoration circuit and manual reset circuit, electrify restoration circuit carries out zero clearing to d type flip flop and monostalbe trigger and resets, and manual reset circuit is that d type flip flop carries out zero clearing and resets, and carries out the preparation that produces next pulse.
By using the described apparatus and method of this kind embodiment, can reduce the capacity of required power supply greatly, save cost, improved in the test process to device performance investigate comprehensive.Applicable to the power device of different model, the inductive load self-control can reduce testing cost, and dirigibility is higher.
Description of drawings
Fig. 1 is the structure composition frame chart of the power module test device of a kind of embodiment of the utility model;
Fig. 2 is the circuit theory diagrams of the power module test device pulse producer power circuit part of a kind of embodiment of the utility model;
Fig. 3 is the circuit theory diagrams of the power module test device pulse producer electrify restoration circuit part of a kind of embodiment of the utility model;
Fig. 4 is the circuit theory diagrams of the power module test device pulse producer manual reset circuit part of a kind of embodiment of the utility model;
Fig. 5 is the circuit theory diagrams of the power module test device pulse producer pulse shaping circuit circuit part of a kind of embodiment of the utility model;
Fig. 6 is the circuit theory diagrams of the power module test device pulse producer feedback circuit part of a kind of embodiment of the utility model;
Fig. 7 is the structure composition frame chart of the power module test device pulse producer part of a kind of embodiment of the utility model;
Wherein: 1-IGBT power model, 2-oscillograph, 3-multimeter, 4-current probe, the 5-inductance, 6-pulse producer, 7-driver module, the 8-high-voltage power supply, 9-electric capacity, 10-low-tension supply, the 11-feedback circuit, 12-pulse shaping circuit, 13-power circuit, the 14-reset circuit, the last tube power device of IGBT1-, tube power device under the IGBT2-, the IC3-D trigger, IC4, IC5-monostalbe trigger, PC2-photoelectrical coupler.
Embodiment:
Accompanying drawing has provided specific embodiment of the utility model, below will the utility model will be further described by drawings and Examples.
As a kind of preferred implementation of this power module test device, power module test device as shown in Figure 1 comprises:
Oscillograph 2, multimeter 3, current probe 4, inductance 5, pulse producer 6, driver module 7, high-voltage power supply 8, low-tension supply 10, the pulse that pulse producer 6 produces variable-width, through the break-make of driver module 7 amplification power controlling switching device IGBT, with control IGBT power model 1 output voltage and electric current, to reach the purpose of examination power device performance.Low-tension supply 10 provides 5V power supply for pulse producer 6, for driver module 7 provide 5V, ± the 15V power supply.High-voltage power supply 8 is used for electric capacity 9 chargings to tested IGBT power model 1.Inductance 5 is connected in series between the C utmost point and the E utmost point of IGBT power model 1 by current probe 4.Voltage, the current waveform of 2 pairs of IGBT power models 1 of oscillograph are gathered, and current waveform is sent on the oscillograph 2 by current probe 4.The input voltage of 3 pairs of IGBT power models 1 of multimeter is monitored.The size of load inductance 5 should be selected according to the performance parameter of examination power device.
Tested IGBT power model 1 as shown in fig. 1 comprises IGBT1 and IGBT2, promptly goes up tube power device and following tube power device.It changes control signal the pulse of variable-width into by pulse producer 6, and with the break-make of the power switch component in this pulse control IGBT power model 1, with control module output voltage and electric current, to reach the purpose of examination power device performance.All desk-top instruments all adopt accuracy class, and the very high instrument of stability guarantees the reliability and the precision of whole device to the full extent.
To shown in Figure 7, the pulse producer 6 to the power module test device describes in detail below as Fig. 2.Pulse producer part-structure composition frame chart as shown in Figure 7, pulse producer 6 comprises: feedback circuit 11, pulse shaping circuit 12, power circuit 13 and reset circuit 14.Wherein:
Shown in the circuit theory diagrams of Fig. 2 pulse producer power circuit part, power circuit 13 comprises two power modules, i.e. 5V power module and 15V power module.Provide input by exchanging 220v/50HZ for two power modules, a power module output 5V/1A DC voltage is for chip provides working power; Another module output 15V/1A DC voltage is for waveform output changes into required operating voltage.
Shown in the circuit theory diagrams of Fig. 3 and Fig. 4 pulse producer reset circuit part, the reset circuit 14 of pulse producer 6 comprises electrify restoration circuit and manual reset circuit, and the zero clearing that reset circuit is mainly finished circuit resets.Electrify restoration circuit as shown in Figure 3 mainly is IC3D trigger (74LS74) and IC4, IC5 monostalbe trigger (74LS123) to be carried out zero clearing reset.Manual reset circuit as shown in Figure 4 is mainly the IC3D trigger to carry out zero clearing and resets, and carries out the preparation that produces next pulse.
Shown in the pulse shaping circuit circuit theory diagrams partly of Fig. 5 pulse producer, pulse producer 6 is by the manual IC3D trigger CLK (3) of giving end one pulse signal, and a low pulse signal of generation is given IC4 two monostalbe triggers (74LS123) generation required pulse waveforms that can heavily trigger again.The monostalbe trigger ultimate principle that this pair can heavily trigger is to utilize the function that time-delay characteristics detect charging/discharging voltage that discharges and recharges of resistance, electric capacity, realizes regularly or time-delay, only needs spirit on demand
Living changes resistance, capacitance size, just can obtain timing or delay pulse output in the certain hour scope.Logical symbol and the menu of two monostable 74LS123 that can heavily trigger are as follows, and its RC COM (7,15) and CTC end (6,14) connect resistance and electric capacity regularly, i.e. decision triggers the single pulse width that back Q end produces.CLR (3,11) is the low level return-to-zero, is high level when not doing return-to-zero.TRA (1,9) is that negative edge triggers input end, triggers with negative pulse by A, and the time spent does not keep high level.TRB (2,10) is that rising edge triggers input end, triggers with positive pulse by B, and the time spent does not put low.Q (5,13) and Qbar (4,12) export positive and negative timing or time-delay monopulse respectively.
Shown in the circuit theory diagrams of Fig. 6 pulse producer feedback circuit part, when IGBT power model 1 occurs unusually, when sending the FO signal, isolate through optocoupler PC2, send into d type flip flop IC3 and produce the formation that a high level signal comes the locking pulse signal.
As a kind of preferred implementation of this power module test method, electric weight in the electric capacity of the utility model utilization charging back carries out the copped wave test, reduce the capacity of required power supply greatly, saved the cost of proving installation, the inductive load self-control can reduce testing cost, and dirigibility is higher, inductance value can wish that current value calculates (wherein t is the power device ON time, the load voltage when V is switching) according to formula L=V * t/.The characteristic of utilizing inductive load variable-current to be had inhibition is examined the afterflow ability of diode, has improved test coverage.
Power module test device method of operating described in the utility model may further comprise the steps:
1, according to the structure composition frame chart of Fig. 1 power module test device, high-voltage power supply 8, tested IGBT power model 1, oscillograph 2, multimeter 3, current probe 4, inductance 5, driver module 7, pulse producer 6, low-tension supply 10 are connected;
2, examination IGBT1, load inductance 5 adopts (B) mode to connect the N point, examination IGBT2, load inductance 5 adopts (A) mode to connect the P point;
3, provide 5V power supply by low-tension supply 10 for pulse producer 6, for driver module 7 provide 5V and ± the 15V power supply;
4, be electric capacity 9 charging in the tested IGBT power model 1 by high-voltage power supply 8, and monitor with multimeter 3, be charged to certain voltage value after, the output of disconnection high-voltage power supply 8;
5, produce pulse by pulse producer 6,, gather by voltage, the current waveform of 2 pairs of tested IGBT power models of oscillograph through device for power switching IGBT1 in the tested IGBT power model 1 of driver module 7 amplification controls and the break-make of IGBT2;
6, voltage, the current waveform of the tested IGBT power model 1 that collects according to oscillograph 2 are analyzed, and whether satisfy the device technology parameter request to confirm the IGBT power model.
The utility model is determined the pwm value of load inductance value and control signal at first according to technical parameters such as the rated operational voltage of examining the IGBT power model, electric currents.Pulse producer satisfies different capacity device technology parameter request by regulating pulsewidth, possesses flexible characteristic with respect to fixing pulse width generator.Pulse signal generator is realized that by simple hardware circuit it is low to possess cost again with respect to signal generator, safeguards characteristic of simple.The pulsewidth of control signal is set by the potentiometer of regulating impulse generator, and pulse producer is the equipment that the gate pole of power device provides required control signal.Be power device switch performance on the checking unsteady flow product module, need respectively the gate pole of the upper and lower tube power device on the same brachium pontis to be provided the pulse of two different pulse widths (adjustable), the C utmost point (collector) was opened at present the magnitude of voltage of managing (upward pipe) the power device C utmost point and E interpolar VRS, VD2 with magnitude of voltage and second pulse of E (emitter) interpolar Δ VDM, VD1 when (managing down) first pulse-off of power device upward managed in measurement and record.VDM: turn-off peak voltage; VD1: shutoff voltage; VRS: oppositely recover crest voltage; VD2: reverse recovery voltage.
Though described embodiment of the present utility model in conjunction with the accompanying drawings, those of ordinary skill in the art can make various distortion or modification within the scope of the appended claims.
Claims (6)
1. power module test device, it is characterized in that: comprise oscillograph (2), multimeter (3), current probe (4), inductance (5), pulse producer (6), driver module (7), high-voltage power supply (8), low-tension supply (10), low-tension supply (10) provides power supply for pulse producer (6) and driver module (7), high-voltage power supply (8) is electric capacity (9) charging of tested IGBT power model (1), and oscillograph (2) is gathered the voltage and current waveform of IGBT power model (1), and inductance (5) is connected between the C utmost point and the E utmost point of IGBT power model (1) by current probe (4), current waveform is sent on the oscillograph (2) by current probe (4), and multimeter (3) is monitored the input voltage of IGBT power model (1).
2. a kind of power module test device according to claim 1, it is characterized in that: described pulse producer (6) comprises pulse shaping circuit (12), power circuit (13) and reset circuit (14), power circuit (13) is for feedback circuit (11) and pulse shaping circuit (12) provide power supply, and reset circuit (14) resets for the trigger in feedback circuit (11) and the pulse shaping circuit (12) carries out zero clearing.
3. a kind of power module test device according to claim 2, it is characterized in that: described pulse producer (6) comprises feedback circuit (11), feedback circuit (11) links to each other with pulse shaping circuit (12), when IGBT power model (1) occurs unusual, send the locking pulse signal, the locking pulse signal turn-offs the power component in the IGBT power model (1).
4. a kind of power module test device according to claim 3 is characterized in that: described locking pulse signal is isolated through photoelectrical coupler (PC2), sends into d type flip flop (IC3) and produces the formation that a high level signal comes the locking pulse signal.
5. according to claim 2 or 3 or 4 described a kind of power module test devices, it is characterized in that: described pulse producer (6) comprises d type flip flop and monostalbe trigger, pulse producer (6) is manually given d type flip flop one pulse signal, and the low pulse signal that d type flip flop produces produces pulse waveform for two monostalbe triggers that can heavily trigger again.
6. a kind of power module test device according to claim 5, it is characterized in that: described reset circuit (14) comprises electrify restoration circuit and manual reset circuit, electrify restoration circuit carries out zero clearing to d type flip flop and monostalbe trigger and resets, manual reset circuit is that d type flip flop carries out zero clearing and resets, and carries out the preparation that produces next pulse.
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| CN 200920259941 CN201689153U (en) | 2009-12-30 | 2009-12-30 | Power module tester |
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| CN 200920259941 CN201689153U (en) | 2009-12-30 | 2009-12-30 | Power module tester |
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Cited By (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101762778B (en) * | 2009-12-30 | 2012-10-10 | 株洲南车时代电气股份有限公司 | Power module test system and test method thereof |
| CN103018600A (en) * | 2012-12-06 | 2013-04-03 | 首都师范大学 | Online judging method for degradation state of power module |
| CN103105554A (en) * | 2013-01-29 | 2013-05-15 | 上海电气集团股份有限公司 | Test circuit and method of two-electrical-level converter switching performance based on double pulses |
| CN105277865A (en) * | 2014-06-19 | 2016-01-27 | 富士电机株式会社 | Semiconductor test device |
| CN105445608A (en) * | 2015-11-30 | 2016-03-30 | 深圳市英威腾电气股份有限公司 | SIC MOSFET over-current short-circuit detection circuit and detection protection system |
| CN106597245A (en) * | 2016-11-04 | 2017-04-26 | 山东科技大学 | IGBT fault monitoring device and method |
| CN108279591A (en) * | 2017-12-20 | 2018-07-13 | 北京控制工程研究所 | A kind of general output method of emulation platform digital quantity |
| CN108919082A (en) * | 2018-05-30 | 2018-11-30 | 北京铁道工程机电技术研究所股份有限公司 | A kind of device of cut-off current that testing semiconductor devices |
| CN109270378A (en) * | 2018-10-10 | 2019-01-25 | 国电南瑞科技股份有限公司 | Portable H-bridge automatic test device |
| CN112540279A (en) * | 2020-12-04 | 2021-03-23 | 荣信汇科电气股份有限公司 | Crimping formula IGBT module current conversion testing arrangement |
| CN114325062A (en) * | 2022-03-10 | 2022-04-12 | 杭州飞仕得科技有限公司 | Current testing method of power module |
| CN115656770A (en) * | 2022-10-19 | 2023-01-31 | 杭州国磊半导体设备有限公司 | Method and device for testing power driving chip, computer equipment and storage medium |
| CN118897180A (en) * | 2024-08-30 | 2024-11-05 | 重庆云潼科技有限公司 | A method, device and equipment for detecting overcurrent capability of a power chip |
-
2009
- 2009-12-30 CN CN 200920259941 patent/CN201689153U/en not_active Expired - Lifetime
Cited By (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101762778B (en) * | 2009-12-30 | 2012-10-10 | 株洲南车时代电气股份有限公司 | Power module test system and test method thereof |
| CN103018600A (en) * | 2012-12-06 | 2013-04-03 | 首都师范大学 | Online judging method for degradation state of power module |
| CN103018600B (en) * | 2012-12-06 | 2016-08-10 | 首都师范大学 | The online determination methods of degradation state of power module |
| CN103105554A (en) * | 2013-01-29 | 2013-05-15 | 上海电气集团股份有限公司 | Test circuit and method of two-electrical-level converter switching performance based on double pulses |
| CN105277865A (en) * | 2014-06-19 | 2016-01-27 | 富士电机株式会社 | Semiconductor test device |
| CN105277865B (en) * | 2014-06-19 | 2018-09-07 | 富士电机株式会社 | Semiconductor test instruments |
| CN105445608A (en) * | 2015-11-30 | 2016-03-30 | 深圳市英威腾电气股份有限公司 | SIC MOSFET over-current short-circuit detection circuit and detection protection system |
| CN105445608B (en) * | 2015-11-30 | 2018-06-12 | 深圳市英威腾光伏科技有限公司 | SIC MOSFET overcurrents short-circuit detecting circuits and detection protection system |
| CN106597245B (en) * | 2016-11-04 | 2019-01-18 | 山东科技大学 | A kind of monitoring device and method of IGBT failure |
| CN106597245A (en) * | 2016-11-04 | 2017-04-26 | 山东科技大学 | IGBT fault monitoring device and method |
| CN108279591A (en) * | 2017-12-20 | 2018-07-13 | 北京控制工程研究所 | A kind of general output method of emulation platform digital quantity |
| CN108919082A (en) * | 2018-05-30 | 2018-11-30 | 北京铁道工程机电技术研究所股份有限公司 | A kind of device of cut-off current that testing semiconductor devices |
| CN109270378A (en) * | 2018-10-10 | 2019-01-25 | 国电南瑞科技股份有限公司 | Portable H-bridge automatic test device |
| CN112540279A (en) * | 2020-12-04 | 2021-03-23 | 荣信汇科电气股份有限公司 | Crimping formula IGBT module current conversion testing arrangement |
| CN112540279B (en) * | 2020-12-04 | 2022-08-16 | 荣信汇科电气股份有限公司 | Crimping formula IGBT module current conversion testing arrangement |
| CN114325062A (en) * | 2022-03-10 | 2022-04-12 | 杭州飞仕得科技有限公司 | Current testing method of power module |
| CN114325062B (en) * | 2022-03-10 | 2022-06-10 | 杭州飞仕得科技有限公司 | Current testing method of power module |
| CN115656770A (en) * | 2022-10-19 | 2023-01-31 | 杭州国磊半导体设备有限公司 | Method and device for testing power driving chip, computer equipment and storage medium |
| CN115656770B (en) * | 2022-10-19 | 2023-09-01 | 杭州国磊半导体设备有限公司 | Power supply driving chip testing method and device, computer equipment and storage medium |
| CN118897180A (en) * | 2024-08-30 | 2024-11-05 | 重庆云潼科技有限公司 | A method, device and equipment for detecting overcurrent capability of a power chip |
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Granted publication date: 20101229 Effective date of abandoning: 20091230 |
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| RGAV | Abandon patent right to avoid regrant |