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CN201413130Y - A measuring device for straightness and its position based on the principle of double-frequency interference - Google Patents

A measuring device for straightness and its position based on the principle of double-frequency interference Download PDF

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CN201413130Y
CN201413130Y CN2009201232655U CN200920123265U CN201413130Y CN 201413130 Y CN201413130 Y CN 201413130Y CN 2009201232655 U CN2009201232655 U CN 2009201232655U CN 200920123265 U CN200920123265 U CN 200920123265U CN 201413130 Y CN201413130 Y CN 201413130Y
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frequency
light
measurement
measuring
reflected
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陈本永
张恩政
严利平
杨涛
周砚江
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Zhejiang Sci Tech University ZSTU
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Zhejiang Sci Tech University ZSTU
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Abstract

本实用新型公开了一种基于双频干涉原理的直线度及其位置的测量装置。它包括输出正交线偏振光的激光器,普通分光镜,消偏振分光棱镜,偏振分光棱镜,渥拉斯顿棱镜,三个检偏器,三个光电探测器和由直角棱镜组成的测量反射镜。本实用新型利用光学器件的偏振特性和分光特性组成了基于外差干涉原理的双光路测量结构,通过测量双光路的光程差实现了直线度及其位置的同时测量,具有纳米级的直线度及其位置的测量精度。本实用新型主要适用于超精密加工技术、微光机电系统、集成电路芯片制造技术等领域所涉及的精密工作台的运动位移测量、精密导轨的直线度检测等。

Figure 200920123265

The utility model discloses a measuring device for straightness and its position based on the principle of double-frequency interference. It includes a laser that outputs orthogonal linearly polarized light, an ordinary beamsplitter, a depolarizing beamsplitter, a polarizing beamsplitter, a Wollaston prism, three analyzers, three photodetectors and a measuring mirror composed of right-angle prisms . The utility model utilizes the polarization characteristics and spectroscopic characteristics of optical devices to form a dual optical path measurement structure based on the principle of heterodyne interference, and realizes the simultaneous measurement of straightness and its position by measuring the optical path difference of the two optical paths, and has nanometer-level straightness and its location measurement accuracy. The utility model is mainly applicable to the movement displacement measurement of the precision workbench, the straightness detection of the precision guide rail and the like involved in the fields of ultra-precision processing technology, micro-optical electromechanical system, integrated circuit chip manufacturing technology and the like.

Figure 200920123265

Description

A kind of based on the linearity of double frequency principle of interference and the measurement mechanism of position thereof
Technical field
It is the measurement mechanism of feature that the utility model relates in to adopt optical means, especially relates to a kind of based on the linearity of double frequency principle of interference and the measurement mechanism of position thereof.
Background technology
Make a general survey of the measuring method of domestic and international linearity, according to having or not linear datum, the measuring method of linearity roughly can be divided into two classes: the first kind is the measuring method of no linear datum, the main error separation method that adopts, and the approach difference of obtaining according to information, no linear datum mensuration can be divided into reverse method again, dislocation method and many gauge heads method, error separation method is practical reliable, be applicable to online or off-line measurement, one-shot measurement can obtain multinomial measuring error, but this method is subjected to influence of various factors, and it is improper to select as the measurement mechanism structural parameters, the gauge head interval error, transducer calibration errors etc. descend accuracy of measurement.Second class is the measuring method that linear datum is arranged, this method adopts certain linear datum, and detect the straightness error of measured surface with this benchmark, mainly contain: light gap method, pitch method, dial gauge method, three-dimensional method, optical flat interferometric method, method of laser alignment, laser holographic method and double-frequency laser interference method etc.More than in these measuring methods, have the advantage of nanoscale high measurement accuracy based on the verticality measuring method of double-frequency laser interference, but it only is the independent measurement that has realized linearity, have the technical matters of the particular location that does not provide tested linearity.
Summary of the invention
It is a kind of based on the linearity of double frequency principle of interference and the measurement mechanism of position thereof that the purpose of this utility model is to provide.Adopt the laser heterodyne interference principle, both realized the straight line degree measurement of nano-precision, realized that again the nano-grade displacement of tested linearity position is measured, solved the simultaneously-measured technical matters of high-precision linearity of nanoscale and position thereof.
The technical scheme that its technical matters that solves the utility model adopts is:
Light source is that the laser beam that transverse zeeman effect He-Ne two-frequency laser sends is divided into two bundles through common spectroscope, first folded light beam is incident to first analyzer, received conduct with reference to signal by first photodetector, first transmitted light beam is divided into second folded light beam and second transmitted light beam once more through the depolarization Amici prism, second folded light beam incides polarization splitting prism, second transmitted light beam after the wollaston prism transmission with f 1And f 2The light of two frequencies is divided into the two-way measuring beam, and the measurement catoptron that directive is made up of right-angle prism is measured catoptron and is positioned on the measurand, measures catoptron and when mobile, produce and contain Doppler frequency difference ± Δ f on measurand 1With ± Δ f 2Two measuring beam f 1± Δ f 1And f 2± Δ f 2, another point to wollaston prism after measuring mirror reflects merges into a branch of light, and through directive polarization splitting prism behind the wollaston prism, wherein, frequency is f once more 1± Δ f 1The transmittance polarization splitting prism and second folded light beam in be f through the frequency of polarization splitting prism reflection 2Light form first via measuring beam, frequency is f 2± Δ f 2Light frequency through the polarization splitting prism transmission in the polarization splitting prism reflection back and second folded light beam be f 1Light form the second drive test amount light beam; First via measuring beam is incident to second analyzer, the pairwise orthogonal linearly polarized light angle at 45 of shake the thoroughly direction and the first via measuring beam of analyzer, the linearly polarized light of pairwise orthogonal is decomposed on the same direction of shaking, form beat frequency, received formation first via measuring-signal by second photodetector, its frequency is f 1-f 2± Δ f 1The second drive test amount light beam incident the 3rd analyzer, the pairwise orthogonal linearly polarized light angle at 45 of shake the thoroughly direction and the second drive test amount light beam of analyzer, the linearly polarized light of pairwise orthogonal is decomposed on the same direction of shaking, form beat frequency, received the formation second drive test amount signal by the 3rd photodetector, its frequency is f 1-f 2± Δ f 2, first via measuring-signal, the second drive test amount signal and reference signal process and display linearity that obtains measuring and position thereof through follow-up data acquisition and machine calculation machine.
The beneficial effect that the utlity model has is:
(1) based on the measuring method of the linearity of double frequency principle of interference and position thereof when measuring linearity, can locate the absolute position of linearity, measure when having realized linearity and position thereof, this greatly facilitates the application in the reality.
(2) this measuring method has adopted the laser heterodyne interference method, has the nanoscale measuring accuracy.
(3) adopt light channel structure altogether, help eliminating Effect of Environmental.
(4) light channel structure is simple, and is easy to use.
The utility model mainly is applicable to the moving displacement measurement of the precision stage that fields such as Ultraprecision Machining, Micro-Opto-Electro-Mechanical Systems, integrated circuit (IC) chip manufacturing technology are related, the linearity detection of precise guide rail etc.
Description of drawings
Fig. 1 is based on the index path of the measurement mechanism of the linearity of double frequency principle of interference and position thereof.
Fig. 2 is based on the synoptic diagram of the measuring method of the linearity of double frequency principle of interference and position thereof.
Among the figure: 1, two-frequency laser, 2, common spectroscope, 3, first analyzer, 4, first photodetector, 5, depolarization Amici prism, 6, wollaston prism, 7, measure catoptron, 8, polarization splitting prism, 9, second analyzer, 10, second photodetector, the 11, the 3rd analyzer, 12, the 3rd photodetector, 13, measurand.
Embodiment
The utility model is described in further detail below in conjunction with drawings and Examples.
Based on the measuring method of the linearity of double frequency principle of interference and position thereof as shown in Figure 1: light source is a transverse zeeman effect He-Ne two-frequency laser 1, and the centre wavelength of this laser instrument is 632.8nm, two different frequency f of output 1And f 2Orhtogonal linear polarizaiton light, its frequency difference is 1.9MHz.The laser beam that laser instrument 1 sends is through common
Spectroscope 2 is divided into two bundles, wherein folded light beam is incident to first analyzer 3, because shake the thoroughly direction and the pairwise orthogonal linearly polarized light angle at 45 of analyzer, the linearly polarized light of pairwise orthogonal can be decomposed on the same direction of shaking, form beat frequency, received conduct with reference to signal by first photodetector 4, its frequency is f 1-f 2, transmitted light beam is divided into second folded light beam and second transmitted light beam once more through depolarization Amici prism 5, second folded light beam incide polarization splitting prism 8, the second transmitted light beams after wollaston prism 6 transmissions with f 1And f 2The light of two frequencies is divided into the two-way of certain angle measuring beam, and the measurement catoptron 7 that directive is made up of right-angle prism is measured catoptron and is positioned on the measurand 13, measures catoptron after moving on the measurand, produces and contains Doppler frequency difference ± Δ f 1With ± Δ f 2Two measuring beam f 1± Δ f 1And f 2± Δ f 2, another point to wollaston prism 6 after measuring catoptron 7 reflections merges into a branch of light, sees through wollaston prism 6 back directive polarization splitting prisms 8 once more, and wherein, frequency is f 1± Δ f 1Transmittance polarization splitting prism 8 and second folded light beam in be f through the frequency of polarization splitting prism 8 reflection 2Light form first via measuring beam, frequency is f 2± Δ f 2Light frequency through polarization splitting prism 8 transmissions in the polarization splitting prism 8 reflection back and second folded light beam be f 1Light form the second drive test amount light beam; First via measuring beam is incident to second analyzer 9, the pairwise orthogonal linearly polarized light angle at 45 of shake the thoroughly direction and the first via measuring beam of analyzer, the linearly polarized light of pairwise orthogonal can be decomposed on the same direction of shaking, form beat frequency, received formation first via measuring-signal by second photodetector 10, its frequency is f 1-f 2± Δ f 1The second drive test amount light beam incident the 3rd analyzer 11, the pairwise orthogonal linearly polarized light angle at 45 of shake the thoroughly direction and the second drive test amount light beam of analyzer, the linearly polarized light of pairwise orthogonal can be decomposed on the same direction of shaking, form beat frequency, received the formation second drive test amount signal by the 3rd photodetector 12, its frequency is f 1-f 2± Δ f 2, first via measuring-signal, the second drive test amount signal and reference signal process and display linearity that obtains measuring and position thereof through follow-up data acquisition and machine calculation machine.
The hardware circuit data acquisition system (DAS) that specifically is the fpga chip EP2C20Q240 through producing based on altera corp is connected to the computer system that is used for data processing and demonstration.
As shown in Figure 1, the stain in the light path and vertically short-term represent the linearly polarized light of two different frequencies of polarization direction quadrature, and the top has the stain of triangle and the vertical short-term representative that has a triangle contains the orhtogonal linear polarizaiton light of Doppler frequency difference information.
In conjunction with shown in Figure 2, the linearity of this method and the measurement of position thereof are implemented as follows:
During measurement, establishing and measure catoptron 7 and move to measured position 2 by initial position 1, is v along the speed of measuring basis axis direction, according to Doppler effect and shown in Figure 2 getting:
f 1 ′ = f 1 ( 1 ± 2 v cos θ 2 c )
f 2 ′ = f 2 ( 1 ± 2 v cos θ 2 c )
In the formula: f 1, f 2Be two frequencies of two-frequency laser output orthogonal linearly polarized light, f ' 1, f 2' for containing two frequencies of Doppler frequency difference, c is a light speed in a vacuum, θ is the beam splitting angle of wollaston prism.
Speed is that v just gets when measuring catoptron 7 with the laser instrument move toward one another, and to be that v gets negative for speed during opposing motion.The measuring beam f that causes by Doppler effect 1And f 2Frequency change be:
Δf 1 = f 1 ′ - f 1 = ± 2 v cos θ 2 c f 1 = ± v cos θ 2 1 2 c f 1 = ± v cos θ 2 λ 1 2
Δf 2 = f 2 ′ - f 2 = μ 2 v cos θ 2 c f 2 = μ v cos θ 2 1 2 c f 2 = μ v cos θ 2 λ 2 2
In the formula: λ 1, λ 2Be the optical maser wavelength of two frequencies.
If measuring catoptron 7 displacements is that S, time are t, (frequency is f by reference signal 1-f 2) and first via measuring-signal (frequency is f 1-f 2± Δ f 1) ask difference frequency can get Δ f 1, (frequency is f by reference signal 1-f 2) and the second drive test amount signal (frequency is f 1-f 2± Δ f 2) ask difference frequency can get Δ f 2, then the light path (displacement) of Dui Ying two light paths is changed to:
L 1 = ∫ 0 t v cos θ 2 dt = λ 1 2 ∫ 0 t Δ f 1 dt
L 2 = ∫ 0 t v cos θ 2 dt = λ 2 2 ∫ 0 t Δ f 2 dt
The optical path difference of two light paths is:
ΔL=L 2-L 1
According to geometric relationship shown in Figure 2, the linearity value that can obtain measurand is:
Δh = ΔL 2 sin θ 2 = L 2 - L 1 2 sin θ 2 - - - ( 1 )
In the formula: when Δ h when negative, measure catoptron 7 and upwards depart from datum axis; When Δ h is timing, measure catoptron 7 downward biases from datum axis.
The pairing position of this linearity is:
S = L 1 + ΔL 2 cos θ 2 = L 1 + L 2 2 cos θ 2 - - - ( 2 )
In summary, can obtain the linearity and the position thereof of measurand by formula (1) and formula (2).
As shown in Figure 2, dotted line is not represented to measure when catoptron produces the linearity deviation and is positioned on the datum axis.

Claims (1)

1、一种基于双频干涉原理的直线度及其位置的测量装置,其特征在于:光源为横向塞曼效应He-Ne双频激光器(1)发出的激光束经普通分光镜(2)分成两束,第一反射光束入射至第一检偏器(3),被第一光电探测器(4)接收作为参考信号,第一透射光束经消偏振分光棱镜(5)再次分为第二反射光束和第二透射光束,第二反射光束入射到偏振分光棱镜(8),第二透射光束经渥拉斯顿棱镜(6)透射后将f1和f2两个频率的光分成两路测量光束,射向由直角棱镜组成的测量反射镜(7),测量反射镜放置于被测对象(13)上,测量反射镜在被测对象上移动时,产生含有多普勒频差±Δf1和±Δf2的两测量光束f1±Δf1和f2±Δf2,经测量反射镜(7)反射后至渥拉斯顿棱镜(6)的另一点汇合成一束光,再次透过渥拉斯顿棱镜(6)后射向偏振分光棱镜(8),其中,频率为f1±Δf1的光透射偏振分光棱镜(8)与第二反射光束中经偏振分光棱镜(8)反射的频率为f2的光形成第一路测量光束,频率为f2±Δf2的光经偏振分光棱镜(8)反射后与第二反射光束中经偏振分光棱镜(8)透射的频率为f1的光形成第二路测量光束;第一路测量光束入射至第二检偏器(9),检偏器的透振方向与第一路测量光束的两正交线偏振光成45°角,将两正交的线偏振光分解到同一透振方向上,形成拍频,被第二光电探测器(10)接收形成第一路测量信号,其频率为f1-f2±Δf1;第二路测量光束入射第三检偏器(11),检偏器的透振方向与第二路测量光束的两正交线偏振光成45°角,将两正交的线偏振光分解到同一透振方向上,形成拍频,被第三光电探测器(12)接收形成第二路测量信号,其频率为f1-f2±Δf2,第一路测量信号、第二路测量信号和参考信号经后续的数据采集和机算机进行处理和显示,得到测量的直线度及其位置。1. A measuring device for straightness and its position based on the principle of dual-frequency interference, characterized in that: the light source is a transverse Zeeman effect He-Ne dual-frequency laser (1), and the laser beam sent by the common beam splitter (2) is divided into Two beams, the first reflected beam is incident on the first analyzer (3), received by the first photodetector (4) as a reference signal, the first transmitted beam is divided into the second reflected beam by the depolarizing beam splitter prism (5) light beam and the second transmitted light beam, the second reflected light beam is incident on the polarizing beam splitter prism (8), the second transmitted light beam is transmitted through the Wollaston prism (6), and the light of two frequencies f1 and f2 is divided into two paths for measurement The light beam shoots to the measuring mirror (7) composed of rectangular prisms. The measuring mirror is placed on the measured object (13). When the measuring mirror moves on the measured object, it generates a Doppler frequency difference ±Δf 1 The two measuring beams f 1 ±Δf 1 and f 2 ±Δf 2 of ±Δf 2 are reflected by the measuring mirror (7) and merged into another point of the Wollaston prism (6) to form a beam of light, which passes through the The Wollaston prism (6) is directed to the polarizing beam splitter (8), wherein the frequency is f 1 ± Δf 1 light transmission polarizing beam splitting prism (8) and reflected by the polarizing beam splitting prism (8) in the second reflected light beam The light with frequency f2 forms the first measurement beam, and the light with frequency f2 ± Δf2 is reflected by the polarization beam splitter (8) and the second reflected beam is transmitted by the polarization beam splitter (8) with frequency f The light of 1 forms the second measurement beam; the first measurement beam is incident on the second analyzer (9), and the polarization direction of the analyzer forms an angle of 45° with the two orthogonal linear polarizations of the first measurement beam , decompose the two orthogonal linearly polarized lights into the same vibration transmission direction to form a beat frequency, which is received by the second photodetector (10) to form the first measurement signal, whose frequency is f 1 -f 2 ±Δf 1 ; The second measurement beam is incident on the third analyzer (11), and the transmission direction of the analyzer forms an angle of 45° with the two orthogonal linear polarizations of the second measurement beam, and the two orthogonal linear polarizations are decomposed into In the same through-vibration direction, a beat frequency is formed, which is received by the third photodetector (12) to form a second measurement signal whose frequency is f 1 -f 2 ±Δf 2 , the first measurement signal and the second measurement signal And the reference signal is processed and displayed by subsequent data acquisition and computer, and the measured straightness and its position are obtained.
CN2009201232655U 2009-06-22 2009-06-22 A measuring device for straightness and its position based on the principle of double-frequency interference Expired - Fee Related CN201413130Y (en)

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102901447A (en) * 2012-10-10 2013-01-30 华中科技大学 Real-time measuring device for motion straightness of worktable
CN103499385A (en) * 2013-09-25 2014-01-08 北京理工大学 Novel high-precision double-frequency simultaneous measurement laser heterodyne interference phase vibration measuring light path
WO2014071807A1 (en) * 2012-11-09 2014-05-15 清华大学 Heterodyne grating interferometer displacement measurement system
CN104748702A (en) * 2015-03-26 2015-07-01 北京工业大学 Rapid measuring and error compensation method for linearity error of linear guide rail
CN109631805A (en) * 2018-12-21 2019-04-16 浙江理工大学 Wollaston prism mobile laser interferes straightness and displacement simultaneous measuring apparatus

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102901447A (en) * 2012-10-10 2013-01-30 华中科技大学 Real-time measuring device for motion straightness of worktable
WO2014071807A1 (en) * 2012-11-09 2014-05-15 清华大学 Heterodyne grating interferometer displacement measurement system
US9879979B2 (en) 2012-11-09 2018-01-30 Tsinghua University Heterodyne grating interferometer displacement measurement system
CN103499385A (en) * 2013-09-25 2014-01-08 北京理工大学 Novel high-precision double-frequency simultaneous measurement laser heterodyne interference phase vibration measuring light path
CN103499385B (en) * 2013-09-25 2016-04-13 北京理工大学 A kind of high precision double frequency measures laser heterodyne interference phase place vibration measuring light path simultaneously
CN104748702A (en) * 2015-03-26 2015-07-01 北京工业大学 Rapid measuring and error compensation method for linearity error of linear guide rail
CN109631805A (en) * 2018-12-21 2019-04-16 浙江理工大学 Wollaston prism mobile laser interferes straightness and displacement simultaneous measuring apparatus
CN109631805B (en) * 2018-12-21 2020-08-04 浙江理工大学 Wollaston prism movable laser interference straightness and displacement simultaneous measurement device

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