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CN200984700Y - Wafer Grinding Ring Construction - Google Patents

Wafer Grinding Ring Construction Download PDF

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Publication number
CN200984700Y
CN200984700Y CN 200620137443 CN200620137443U CN200984700Y CN 200984700 Y CN200984700 Y CN 200984700Y CN 200620137443 CN200620137443 CN 200620137443 CN 200620137443 U CN200620137443 U CN 200620137443U CN 200984700 Y CN200984700 Y CN 200984700Y
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grinding
ring
wafer
wafer grinding
plastic
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Expired - Fee Related
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CN 200620137443
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Chinese (zh)
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蔡宝珠
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Abstract

The utility model discloses a wafer grinding ring structure. The grinding ring is designed to solve the problems that the grinding surface of the plastic ring of the existing wafer grinding ring has overlarge leveling precision error, long-time workpiece-free front grinding operation needs to be carried out, the grinding working hour is delayed, and the cost is increased. Comprises a metal ring and a plastic ring which is attached and fixed on the first side surface of the metal ring; the second side of the metal ring is in a surface form which is smooth and has no turning marks after being ground. The wafer grinding ring structure can enable the grinding surface of the plastic ring to achieve better flattening precision, further greatly reduce the error value of the flattening precision of the grinding surface when the wafer grinding ring is used on a machine for the first time, greatly shorten the pre-grinding operation time without workpieces, and achieve better industrial utilization benefit and improvement on reducing the loss of grinding machinery, electric energy and personnel cost and prolonging the service life of the plastic ring of the wafer grinding ring.

Description

晶圆研磨环构造Wafer Grinding Ring Construction

技术领域technical field

本实用新型涉及一种晶圆研磨环构造,特别是指该金属环的表面施以研磨加工处理而呈现光滑无车痕表面型态的创新设计。The utility model relates to a wafer grinding ring structure, in particular to an innovative design in which the surface of the metal ring is subjected to grinding processing so as to present a smooth surface without car marks.

背景技术Background technique

现有晶圆研磨环制造上,是先分别制作一金属环以及一塑料环,再将该塑料环贴合固定于金属环的一侧面,其中该金属环仅通过精密车制加工成型,为增加其贴合面胶剂结合的牢固性,业内通常会于该金属环的贴合面再施以喷砂处理获得粗糙面效果,以提增胶剂的附着面积;上述现有晶圆研磨环的制造方法于实际应用上存在下述问题:In the manufacture of existing wafer grinding rings, a metal ring and a plastic ring are made separately first, and then the plastic ring is fitted and fixed on one side of the metal ring, wherein the metal ring is only formed by precision lathing, which is to increase For the firmness of the bonding of the adhesive on the bonding surface, the industry usually applies sandblasting to the bonding surface of the metal ring to obtain a rough surface effect, so as to increase the adhesion area of the bonding agent; the above-mentioned existing wafer grinding ring The manufacturing method has the following problems in practical application:

该金属环的贴合面施以喷砂处理后,其贴合面于微观下呈现不平整状态,再加上胶剂层在尚未硬化之前也为不稳定的构造型态,如此所产生的误差,使得该塑料环于完成贴合固定状态后,其预定的研磨面平整度将出现相当大的偏斜误差值,以目前业内制造的实际现况而言,该塑料环研磨面的误差值通常高达0.1-0.2mm;晶圆研磨环成品于上机之后,其塑料环的研磨面旋转时必须具备最佳的平整度方能符合预期的研磨精度及效果,但现有晶圆研磨环成品却如前所述存在过大的误差值,为修正此一误差值,目前的作法,是在晶圆研磨环初次上机使用时,先进行无工件的前置研磨作业,也就是使该晶圆研磨环的研磨面直接与工作平台进行接触磨耗,直至其研磨面被磨耗至平整状态后,才能进行实际工件的研磨作业;而该前置研磨作业若以前述研磨面的误差状态而言,一般必须耗用3-4小时才能完成,如此可想而知,显然造成研磨作业工时上的浪费,且研磨机械进行此项前置研磨作业将增加庞大的电能、机械耗损以及人事成本负担(须有操作人员看顾),不符合较佳的产业利用效益。After the bonding surface of the metal ring is sandblasted, the bonding surface is microscopically uneven, and the adhesive layer is also in an unstable structure before hardening, so the resulting error , so that after the plastic ring completes the bonding and fixing state, there will be a considerable deflection error value in the predetermined flatness of the grinding surface. According to the actual situation of manufacturing in the industry, the error value of the grinding surface of the plastic ring is usually As high as 0.1-0.2mm; after the finished wafer grinding ring is put on the machine, the grinding surface of the plastic ring must have the best flatness when rotating to meet the expected grinding accuracy and effect, but the existing finished wafer grinding ring is not As mentioned above, there is an excessive error value. In order to correct this error value, the current practice is to perform pre-grinding operations without workpieces when the wafer grinding ring is first used on the machine, that is, to make the wafer The grinding surface of the grinding ring is directly in contact with the working platform until the grinding surface is worn to a flat state before the actual workpiece grinding operation can be carried out; and if the pre-grinding operation is based on the error state of the aforementioned grinding surface, generally It must take 3-4 hours to complete, so it is conceivable that it will obviously cause a waste of working hours in the grinding operation, and the pre-grinding operation of the grinding machine will increase the huge electric energy, mechanical consumption and personnel cost burden (must have operator care), does not meet the best industrial utilization benefits.

再者,该晶圆研磨环也将因为前述因素所作的长时间前置研磨作业原因,使其在尚未进行实际工件研磨作业之前,即必须磨耗掉约0.2mm的塑料环厚度,这对于原本可利用研磨厚度即相当浅薄的塑料环而言(注:该塑料环可利用研磨厚度一般仅有3-5mm),如此显然更造成该塑料环磨耗加速、使用寿命缩短的问题及缺弊。Furthermore, the wafer lapping ring will also wear out about 0.2mm of the thickness of the plastic ring before the actual workpiece lapping operation due to the long-term pre-grinding operation due to the aforementioned factors. As far as the grinding thickness is quite shallow plastic ring (note: the plastic ring can use the grinding thickness is generally only 3-5mm), this will obviously cause the problems and disadvantages of accelerated wear and shortened service life of the plastic ring.

所以,针对上述现有晶圆研磨环所存在的问题及缺弊,如何研发出一种能够大幅提升晶圆研磨环成品精度,使其能够降低研磨加工成本的创新结构设计,有待相关业内技术人员再加以思索突破。Therefore, in view of the problems and disadvantages of the above-mentioned existing wafer grinding rings, how to develop an innovative structural design that can greatly improve the precision of the finished wafer grinding ring and reduce the cost of grinding processing remains to be solved by relevant technical personnel in the industry. Then think about the breakthrough.

实用新型内容Utility model content

为克服上述缺陷,本实用新型主要目的在于提供一种晶圆研磨环构造,对现有晶圆研磨环存在塑料环的研磨面平整精密度误差过大,须进行长时间的无工件前置研磨作业而造成研磨工时延宕以及成本提高问题加以解决。In order to overcome the above-mentioned defects, the main purpose of this utility model is to provide a wafer grinding ring structure. For the existing wafer grinding ring, there is a large error in the flatness and precision of the grinding surface of the plastic ring, and it is necessary to carry out long-term pre-grinding without workpieces. The problem of delay in grinding time and increase in cost caused by the operation is to be solved.

为达到上述目的,本实用新型的晶圆研磨环构造,其包括一金属环以及贴合固定于该金属环第一侧面的一塑料环;该金属环的第二侧面为经过研磨处理光滑无车痕的表面型态。In order to achieve the above object, the structure of the wafer grinding ring of the present utility model includes a metal ring and a plastic ring attached and fixed on the first side of the metal ring; the second side of the metal ring is smooth and car-free after grinding. surface pattern of scars.

采用上述晶圆研磨环构造,可使塑料环的研磨面达到较佳平整精密度,进以大幅降低晶圆研磨环初次上机使用时研磨面平整精密度的误差值,大幅缩短无工件的前置研磨作业时间,达到降低研磨机械的耗损、电能及人事成本,延长晶圆研磨环的塑料环使用寿命的较佳产业利用效益及进步性。The above-mentioned structure of the wafer grinding ring can make the grinding surface of the plastic ring achieve better flatness and precision, thereby greatly reducing the error value of the flatness precision of the grinding surface when the wafer grinding ring is first used on the machine, and greatly shortening the time without workpieces. The grinding operation time is set to reduce the consumption of grinding machinery, electric energy and personnel costs, and to prolong the service life of the plastic ring of the wafer grinding ring, which is the best industrial utilization benefit and progress.

附图说明Description of drawings

图1为本实用新型晶圆研磨环成品的正面角度立体图。Fig. 1 is a front perspective perspective view of the finished wafer grinding ring of the present invention.

图2为本实用新型晶圆研磨环成品的背面角度立体图。Fig. 2 is a perspective view of the back side of the finished wafer grinding ring of the present invention.

图3为本实用新型晶圆研磨环制造方法实施例的平面简示图。Fig. 3 is a schematic plan view of an embodiment of the manufacturing method of the wafer grinding ring of the present invention.

具体实施方式Detailed ways

请参阅图1、图2所示,本实用新型晶圆研磨环构造的较佳实施例,此等实施例仅供说明之用,在专利申请上并不受此结构的限制;本实用新型所述的晶圆研磨环A构造如图1、图2所示,其中该图1所示为晶圆研磨环A的正面角度立体图,图2所示则为晶圆研磨环A的背面角度立体图;该晶圆研磨环A包括一金属环10以及贴合固定于该金属环10第一侧面11的一塑料环20;而其有别于现有构造之处主要在于本实用新型的金属环10的第二侧面12为一种经过研磨加工处理、光滑而无车痕的表面型态。Please refer to Fig. 1 and shown in Fig. 2, the preferred embodiment of the structure of the wafer grinding ring of the present invention, these embodiments are for illustration purposes only, and are not limited by this structure on the patent application; The structure of the wafer grinding ring A described above is shown in Figure 1 and Figure 2, wherein Figure 1 shows a perspective view of the front angle of the wafer grinding ring A, and Figure 2 shows a perspective view of the rear angle of the wafer grinding ring A; The wafer grinding ring A includes a metal ring 10 and a plastic ring 20 that is attached and fixed on the first side 11 of the metal ring 10; and it is different from the existing structure mainly in the metal ring 10 of the present utility model. The second side 12 is a smooth surface without car marks after grinding.

至于该所述晶圆研磨环制造方法的部份虽非本案所欲保护界定,但为使本实用新型的功效得以显现,以下就其具体实施的步骤说明如下,包括:(请参照图1、图2、图3所示)As for the part of the described wafer grinding ring manufacturing method, although it is not intended to be protected and defined in this case, in order to make the effect of the present utility model manifest, the steps for its specific implementation are described as follows below, including: (please refer to Fig. 1, As shown in Figure 2 and Figure 3)

a、分别制作一金属环10以及一塑料环20;其中该金属环10为具有预定厚度及内、外径的一圆环体型态,可采用车削加工成型外观型态;该塑料环20则一般采用高分子塑料材料射出成型,以具备足够耐磨硬度,作为一研磨晶圆的接口;a. Make a metal ring 10 and a plastic ring 20 respectively; wherein the metal ring 10 is in the shape of a torus with a predetermined thickness and inner and outer diameters, and can be turned to shape the appearance; the plastic ring 20 is Generally, polymer plastic materials are used for injection molding to have sufficient wear-resistant hardness as an interface for grinding wafers;

b、将该塑料环20贴合固定于金属环10的第一侧面11;b. Attach and fix the plastic ring 20 to the first side 11 of the metal ring 10;

c、该塑料环20贴合固定于金属环10第一侧面11之后,再以塑料环20的研磨面21为基准面(如图3的L线所示)对该金属环10的第二侧面12施以研磨加工处理,以此,构成该金属环10的第二侧面12为一种经过研磨处理、光滑而无车痕(指车床的车刀所形成的刀痕)的表面型态;如此即制成一晶圆研磨环A成品。c. After the plastic ring 20 is pasted and fixed on the first side 11 of the metal ring 10, the second side of the metal ring 10 is then treated with the grinding surface 21 of the plastic ring 20 as a reference plane (as shown by line L in FIG. 3 ). 12 is subjected to a grinding process, so that the second side 12 constituting the metal ring 10 is a surface pattern that is ground, smooth and free of car marks (referring to the tool marks formed by the turning tool of the lathe); thus That is, a finished wafer grinding ring A is produced.

其中,该金属环10与塑料环20相贴合面可施以喷砂、涂胶手段达成贴合固定效果。Wherein, the mating surfaces of the metal ring 10 and the plastic ring 20 can be sandblasted and glued to achieve a fitting and fixing effect.

其中,该塑料环20可在进行金属环10第二侧面12研磨步骤之前或之后,于其研磨面21设制数个废物槽22,此所述废物槽22是贯穿塑料环20的内、外周缘,各废物槽22之间可呈等距间隔排列,其作用是用以向外摔出塑料环20进行研磨时所产生的废物。Wherein, this plastic ring 20 can be before or after the grinding step of the second side 12 of the metal ring 10, several waste grooves 22 can be set on its grinding surface 21, and the waste grooves 22 run through the inner and outer circumferences of the plastic ring 20 Edge, between each waste tank 22 can be arranged at equidistant intervals, its effect is to throw out the waste produced when the plastic ring 20 is grinded outwards.

本实用新型的有益效果如下:The beneficial effects of the utility model are as follows:

本实用新型的晶圆研磨环A主要通过该金属环10的第二侧面12设为一种经过研磨加工处理、光滑而无车痕的表面型态的创新独特设计,使其成品的研磨面21的平整精密度误差值可减降至1-2μm,因此,使得该晶圆研磨环A于初次上机使用时,进行无工件前置研磨作业所磨耗掉的塑料环20厚度可降至最少,让塑料环20原本可利用研磨厚度的不必要磨耗降至最低,进而确实达到延长晶圆研磨环使用寿命的实用进步性。The wafer grinding ring A of the present utility model mainly uses the innovative and unique design of the second side 12 of the metal ring 10 as a smooth surface without car marks after grinding, so that the finished grinding surface 21 The flat precision error value can be reduced to 1-2 μm, therefore, when the wafer grinding ring A is used on the machine for the first time, the thickness of the plastic ring 20 worn away by the non-workpiece pre-grinding operation can be reduced to the minimum. The unnecessary wear of the plastic ring 20 that can utilize the grinding thickness to a minimum, and then indeed achieve the practical progress of prolonging the service life of the wafer grinding ring.

上述实施例所述是用以具体说明本实用新型,文中虽透过特定的术语进行说明,但不能以此限定本实用新型的专利范围;熟悉此项技术领域的人士可在了解本实用新型的精神与原则后对其进行变更与修改而达到等效目的,而此等变更与修改,皆应涵盖于权利要求范围所界定范畴中。The description of above-mentioned embodiment is in order to illustrate the present utility model in detail, although the text is described through specific terminology, but can not limit the patent scope of the present utility model with this; The spirit and principles are then changed and modified to achieve equivalent purposes, and such changes and modifications should be included in the scope defined by the scope of the claims.

Claims (2)

1, a kind of cyrstal sphere grinding ring structure, it comprises that a becket and applying be fixed in a plastic hoop of this becket first side; It is characterized in that: second side of this becket is the surface morphology through the smooth no car trace of milled processed.
2, cyrstal sphere grinding ring structure according to claim 1, it is characterized in that: this plastic hoop is equipped with an above waste tank in its this side away from becket.
CN 200620137443 2006-10-17 2006-10-17 Wafer Grinding Ring Construction Expired - Fee Related CN200984700Y (en)

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Application Number Priority Date Filing Date Title
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107717639A (en) * 2017-11-09 2018-02-23 宁波江丰电子材料股份有限公司 Control the method for retaining ring flatness and retaining ring, the semiconductor fabrication system of production
CN108890517A (en) * 2018-09-12 2018-11-27 宁波江丰电子材料股份有限公司 Plastics welded type abrasive disk and grinding device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107717639A (en) * 2017-11-09 2018-02-23 宁波江丰电子材料股份有限公司 Control the method for retaining ring flatness and retaining ring, the semiconductor fabrication system of production
CN108890517A (en) * 2018-09-12 2018-11-27 宁波江丰电子材料股份有限公司 Plastics welded type abrasive disk and grinding device

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Granted publication date: 20071205

Termination date: 20101017