CN1951635A - Superfine grinding wheel for hard and crisp crystal substrate - Google Patents
Superfine grinding wheel for hard and crisp crystal substrate Download PDFInfo
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- 238000000227 grinding Methods 0.000 title claims abstract description 89
- 239000000758 substrate Substances 0.000 title claims abstract description 37
- 239000013078 crystal Substances 0.000 title claims abstract description 29
- 239000000945 filler Substances 0.000 claims abstract description 11
- 230000013011 mating Effects 0.000 claims abstract description 9
- 239000007800 oxidant agent Substances 0.000 claims abstract description 9
- 239000000463 material Substances 0.000 claims abstract description 7
- 239000011230 binding agent Substances 0.000 claims abstract description 5
- 229910000838 Al alloy Inorganic materials 0.000 claims abstract description 3
- 239000011148 porous material Substances 0.000 claims abstract description 3
- 238000000034 method Methods 0.000 claims description 10
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 claims description 8
- 239000000126 substance Substances 0.000 claims description 6
- VTYYLEPIZMXCLO-UHFFFAOYSA-L Calcium carbonate Chemical compound [Ca+2].[O-]C([O-])=O VTYYLEPIZMXCLO-UHFFFAOYSA-L 0.000 claims description 4
- UIIMBOGNXHQVGW-UHFFFAOYSA-M Sodium bicarbonate Chemical compound [Na+].OC([O-])=O UIIMBOGNXHQVGW-UHFFFAOYSA-M 0.000 claims description 4
- AYJRCSIUFZENHW-UHFFFAOYSA-L barium carbonate Chemical compound [Ba+2].[O-]C([O-])=O AYJRCSIUFZENHW-UHFFFAOYSA-L 0.000 claims description 4
- FPAFDBFIGPHWGO-UHFFFAOYSA-N dioxosilane;oxomagnesium;hydrate Chemical compound O.[Mg]=O.[Mg]=O.[Mg]=O.O=[Si]=O.O=[Si]=O.O=[Si]=O.O=[Si]=O FPAFDBFIGPHWGO-UHFFFAOYSA-N 0.000 claims description 4
- 230000001590 oxidative effect Effects 0.000 claims description 4
- BWHMMNNQKKPAPP-UHFFFAOYSA-L potassium carbonate Chemical compound [K+].[K+].[O-]C([O-])=O BWHMMNNQKKPAPP-UHFFFAOYSA-L 0.000 claims description 4
- 229910000029 sodium carbonate Inorganic materials 0.000 claims description 4
- PFUVRDFDKPNGAV-UHFFFAOYSA-N sodium peroxide Chemical group [Na+].[Na+].[O-][O-] PFUVRDFDKPNGAV-UHFFFAOYSA-N 0.000 claims description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 3
- 229910001651 emery Inorganic materials 0.000 claims description 3
- 239000002245 particle Substances 0.000 claims description 3
- 239000004343 Calcium peroxide Substances 0.000 claims description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 2
- 239000005708 Sodium hypochlorite Substances 0.000 claims description 2
- 239000002253 acid Substances 0.000 claims description 2
- 239000007767 bonding agent Substances 0.000 claims description 2
- 229910000019 calcium carbonate Inorganic materials 0.000 claims description 2
- LHJQIRIGXXHNLA-UHFFFAOYSA-N calcium peroxide Chemical compound [Ca+2].[O-][O-] LHJQIRIGXXHNLA-UHFFFAOYSA-N 0.000 claims description 2
- 235000019402 calcium peroxide Nutrition 0.000 claims description 2
- 229910000027 potassium carbonate Inorganic materials 0.000 claims description 2
- 239000012286 potassium permanganate Substances 0.000 claims description 2
- -1 salt compound Chemical class 0.000 claims description 2
- 229910000030 sodium bicarbonate Inorganic materials 0.000 claims description 2
- 235000017557 sodium bicarbonate Nutrition 0.000 claims description 2
- SUKJFIGYRHOWBL-UHFFFAOYSA-N sodium hypochlorite Chemical compound [Na+].Cl[O-] SUKJFIGYRHOWBL-UHFFFAOYSA-N 0.000 claims description 2
- 239000002585 base Substances 0.000 claims 4
- 150000001447 alkali salts Chemical class 0.000 claims 1
- 230000003993 interaction Effects 0.000 claims 1
- 229910052814 silicon oxide Inorganic materials 0.000 claims 1
- 239000003082 abrasive agent Substances 0.000 abstract description 4
- 230000003746 surface roughness Effects 0.000 abstract description 4
- 239000010410 layer Substances 0.000 description 15
- 238000005498 polishing Methods 0.000 description 6
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 4
- 239000002344 surface layer Substances 0.000 description 4
- 230000007797 corrosion Effects 0.000 description 3
- 238000005260 corrosion Methods 0.000 description 3
- 229910003460 diamond Inorganic materials 0.000 description 3
- 239000010432 diamond Substances 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 239000011159 matrix material Substances 0.000 description 3
- 239000006061 abrasive grain Substances 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000004615 ingredient Substances 0.000 description 2
- 235000012431 wafers Nutrition 0.000 description 2
- KXGFMDJXCMQABM-UHFFFAOYSA-N 2-methoxy-6-methylphenol Chemical compound [CH]OC1=CC=CC([CH])=C1O KXGFMDJXCMQABM-UHFFFAOYSA-N 0.000 description 1
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000002378 acidificating effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- CETPSERCERDGAM-UHFFFAOYSA-N ceric oxide Chemical compound O=[Ce]=O CETPSERCERDGAM-UHFFFAOYSA-N 0.000 description 1
- 229910000420 cerium oxide Inorganic materials 0.000 description 1
- 229910000422 cerium(IV) oxide Inorganic materials 0.000 description 1
- 230000002925 chemical effect Effects 0.000 description 1
- 238000003486 chemical etching Methods 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000007731 hot pressing Methods 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- BMMGVYCKOGBVEV-UHFFFAOYSA-N oxo(oxoceriooxy)cerium Chemical compound [Ce]=O.O=[Ce]=O BMMGVYCKOGBVEV-UHFFFAOYSA-N 0.000 description 1
- 239000005011 phenolic resin Substances 0.000 description 1
- 229920001568 phenolic resin Polymers 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 150000003839 salts Chemical class 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
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- Polishing Bodies And Polishing Tools (AREA)
Abstract
本发明一种硬脆晶体基片超精密磨削砂轮属于硬脆晶体基片超精密加工技术领域,涉及一种硬脆晶体基片的超精密磨削砂轮。超精密磨削砂轮由配合环、基体环、和磨削层制成,砂轮的磨削层由磨料、粘结剂、填充料和气孔组成,其中填充料由pH调节剂,氧化剂和助抛剂三部分组成。砂轮的基体环装配在配合环上,并由六个均布内六角螺栓紧固成一体,配合环和基体环的材料为锻造铝合金;砂轮磨削层热压或者粘结在基体环上。砂轮磨削去除率高;磨削表面粗糙度低;硬脆晶体基片无划痕、凹坑、微疵点、微裂纹、位错等表面/亚表面损伤;砂轮成本低。
The invention discloses an ultra-precision grinding wheel for hard and brittle crystal substrates, belonging to the technical field of ultra-precision processing of hard and brittle crystal substrates, and relates to an ultra-precision grinding wheel for hard and brittle crystal substrates. The ultra-precision grinding wheel is made of a mating ring, a base ring, and a grinding layer. The grinding layer of the grinding wheel is composed of abrasives, binders, fillers and pores, and the fillers are pH regulators, oxidants and throwing aids. It consists of three parts. The base ring of the grinding wheel is assembled on the mating ring, and is fastened into one body by six uniformly distributed hexagon socket bolts. The material of the mating ring and the base ring is forged aluminum alloy; the grinding layer of the grinding wheel is hot-pressed or bonded on the base ring. The grinding removal rate of the grinding wheel is high; the grinding surface roughness is low; the hard and brittle crystal substrate has no surface/subsurface damage such as scratches, pits, micro-defects, micro-cracks, and dislocations; the cost of the grinding wheel is low.
Description
技术领域technical field
本发明属于硬脆晶体基片超精密加工技术领域,涉及一种硬脆晶体基片的超精密磨削砂轮。The invention belongs to the technical field of ultra-precision processing of hard and brittle crystal substrates, and relates to an ultra-precision grinding wheel for hard and brittle crystal substrates.
背景技术Background technique
随着微电子和光电子技术的快速发展,对单晶硅、砷化镓、蓝宝石等硬脆晶体基片的加工要求越来越苛刻。一方面要求加工基片具有极高的平行度、平面度等几何精度;另一方面还要求有很高的表面/亚表面完整性,要求晶片表面粗糙度达到亚纳米级,表面/亚表面没有微划痕、微疵点、微裂纹、位错等缺陷和损伤。With the rapid development of microelectronics and optoelectronics technology, the processing requirements for hard and brittle crystal substrates such as single crystal silicon, gallium arsenide, and sapphire are becoming more and more stringent. On the one hand, the processed substrates are required to have extremely high geometric precision such as parallelism and flatness; Micro-scratches, micro-defects, micro-cracks, dislocations and other defects and damage.
目前,晶体基片加工工艺主要有研磨、磨削、化学腐蚀和化学机械抛光(CMP)等。通常,采用6~8μm的磨粒研磨后晶体基片表面粗糙度较高(Ra0.1~0.2μm),表面损伤层深度达8μm以上。腐蚀主要用于去除研磨加工表面层损伤,由于腐蚀率难以稳定控制,必然影响晶体基片的几何精度和表面质量。最终主要应用化学机械抛光(CMP)获得亚纳米级粗糙度的无损伤表面,但是,化学机械抛光存在面型精度难以控制、加工成本高、生产率低、基片难以清洗等缺点。采用细粒度的金刚石(磨粒尺寸6~8μm)砂轮超精密磨削的方法具有加工效率高、加工精度高、加工成本低、自动化程度高等显著优点,在硬脆晶体超精密加工中逐渐代替研磨和腐蚀工艺,被认为是最具发展潜力的加工技术。但是,采用细粒度的金刚石砂轮磨削同样会在晶体基片表面产生划痕、微裂纹和晶格扭曲、位错等损伤,损伤层深度达1~2μm。为了消除磨削损伤层,需要通过后续的CMP获得超光滑无损伤表面,这无疑会增加加工工时和成本。特别是在超薄晶体基片的超精密磨削加工(如硅片的背面磨削减薄)时,磨削表面层损伤很容易引起基片的碎裂。因此,减小和消除磨削表面层损伤是硬脆基片超精密磨削急需解决的关键问题。在硬脆基片的超精密磨削过程中,砂轮特性参数是影响磨削表面层损伤的主要因素。研究新型结构和配方的超精密磨削砂轮,是实现硬脆晶体基片低、无损伤的超精密、低成本磨削关键,对于推动超精密磨削技术在半导体、光电晶体等硬脆基片超精密加工领域的应用具有重要意义。At present, the processing technology of crystal substrate mainly includes lapping, grinding, chemical etching and chemical mechanical polishing (CMP). Generally, the surface roughness of the crystal substrate is relatively high (Ra0.1-0.2 μm) after grinding with 6-8 μm abrasive grains, and the depth of the surface damage layer is more than 8 μm. Corrosion is mainly used to remove the damage of the grinding surface layer. Since the corrosion rate is difficult to control stably, it will inevitably affect the geometric accuracy and surface quality of the crystal substrate. In the end, chemical mechanical polishing (CMP) is mainly used to obtain a non-damaged surface with sub-nanometer roughness. However, chemical mechanical polishing has disadvantages such as difficult control of surface accuracy, high processing cost, low productivity, and difficult substrate cleaning. The method of ultra-precision grinding with fine-grained diamond (grain size 6-8 μm) grinding wheel has significant advantages such as high processing efficiency, high processing accuracy, low processing cost, and high degree of automation. It gradually replaces grinding in ultra-precision processing of hard and brittle crystals. And corrosion process, is considered to be the most potential processing technology. However, the use of fine-grained diamond grinding wheels will also produce scratches, microcracks, lattice distortions, dislocations and other damage on the surface of the crystal substrate, and the depth of the damaged layer can reach 1-2 μm. In order to eliminate the grinding damage layer, it is necessary to obtain an ultra-smooth and damage-free surface through subsequent CMP, which will undoubtedly increase the processing time and cost. Especially in the ultra-precision grinding process of ultra-thin crystal substrates (such as the back grinding and thinning of silicon wafers), the damage of the grinding surface layer can easily cause the chipping of the substrate. Therefore, reducing and eliminating the damage of the grinding surface layer is an urgent problem to be solved in the ultra-precision grinding of hard and brittle substrates. In the ultra-precision grinding process of hard and brittle substrates, the characteristic parameters of the grinding wheel are the main factors affecting the damage of the grinding surface layer. The study of ultra-precision grinding wheels with new structures and formulas is the key to achieving ultra-precision and low-cost grinding of hard and brittle crystal substrates with low damage and no damage. The application in the field of ultra-precision machining is of great significance.
发明内容Contents of the invention
本发明的目的是针对利用现有的细粒度金刚石砂轮磨削硬脆晶体基片表面/亚表面损伤和缺陷,且成本高等问题,从而提供一种用于硬脆晶体基片磨削损伤层小、成本低的砂轮,使硬脆晶体基片无划痕、凹坑、微裂纹,减少基片磨削表面的碎裂,提高质量。The purpose of the present invention is to utilize existing fine-grained diamond grinding wheel to grind hard and brittle crystal substrate surface/subsurface damage and defect, and the problem such as high cost, thereby provides a kind of for hard and brittle crystal substrate grinding damage layer is small , The low-cost grinding wheel makes the hard and brittle crystal substrate free of scratches, pits, and micro-cracks, reduces the chipping of the grinding surface of the substrate, and improves the quality.
本发明采用的技术方案如下:一种硬脆晶体基片超精密磨削砂轮,砂轮的磨削层IV由磨料1、粘结剂2、填充料3和气孔4组成;超精密磨削砂轮由配合环I、基体环II和磨削层IV制成;砂轮的基体环II装配在配合环I上,并由六个均布内六角螺栓III紧固成一体,配合环I和基体环II的材料为锻造铝合金;砂轮磨削层IV热压或者粘结在基体环II上,磨料1的硬度比硬脆晶体基片硬度低或者相当,且能在磨削过程中与晶体基片表面产生物理化学作用,磨料1粒度选为1~3μm,材料选用二氧化铈、二氧化硅、碳酸钡或碳酸钙;砂轮的磨削层IV中的填充料3由PH调节剂,氧化剂和助抛剂三部分组成;磨削层IV中的成份按重量百分比分配为:磨料1重量占35~40%;填充料3中的PH调节剂重量占15~20%,氧化剂重量占5~10%和助抛剂重量占5~10%,其余为粘结剂2。The technical scheme adopted in the present invention is as follows: a kind of hard and brittle crystal substrate ultra-precision grinding wheel, the grinding layer IV of emery wheel is made up of abrasive material 1, binding agent 2, filling material 3 and air hole 4; Ultra-precision grinding wheel is made up of It is made of matching ring I, matrix ring II and grinding layer IV; the matrix ring II of the grinding wheel is assembled on the mating ring I, and is fastened into one body by six uniformly distributed hexagon socket head bolts III, and the mating ring I and matrix ring II The material is forged aluminum alloy; the grinding layer IV of the grinding wheel is hot-pressed or bonded on the base ring II, and the hardness of the abrasive material 1 is lower than or equivalent to that of the hard and brittle crystal substrate, and it can be produced with the surface of the crystal substrate during the grinding process. Physical and chemical effects, the particle size of the abrasive 1 is selected as 1-3 μm, and the material is selected from ceria, silicon dioxide, barium carbonate or calcium carbonate; the filler 3 in the grinding layer IV of the grinding wheel consists of a pH regulator, an oxidant and a throwing aid It consists of three parts; the ingredients in the grinding layer IV are distributed by weight percentage: the weight of the abrasive material 1 accounts for 35-40%; The throwing agent accounts for 5-10% by weight, and the rest is binder 2.
砂轮磨削层IV中的填充料3中的PH值调节剂,选用强酸弱碱盐或者强碱弱酸盐类化合物:碳酸钠、碳酸钾或碳酸氢钠;其中的氧化剂,选用过氧化纳、次氯酸钠、高锰酸钾或过氧化钙;其中的助抛剂,选用石墨粉或滑石粉。The PH value adjusting agent in the filler 3 in the grinding wheel grinding layer IV is selected from strong acid and weak base salts or strong base and weak salt compounds: sodium carbonate, potassium carbonate or sodium bicarbonate; the oxidant in it is selected from sodium peroxide and sodium hypochlorite , potassium permanganate or calcium peroxide; among them, graphite powder or talcum powder is used as the throwing aid.
本发明具有以下明显效果:砂轮磨削去除率高;磨削表面粗糙度低;硬脆晶体基片无划痕、凹坑、微疵点、微裂纹、位错等表面/亚表面损伤;砂轮成本低。The invention has the following obvious effects: the grinding removal rate of the grinding wheel is high; the grinding surface roughness is low; the hard and brittle crystal substrate has no surface/subsurface damage such as scratches, pits, micro-defects, micro-cracks, and dislocations; the cost of the grinding wheel Low.
附图说明Description of drawings
图1是砂轮剖视图,其中:I-配合环,II-基体环,III-内六角螺栓,IV-磨削层。图2是砂轮左视图,图3是磨削层成份示意图,其中:1-磨料,2-粘结剂,3-填充料,4-气孔Fig. 1 is a sectional view of the grinding wheel, wherein: I-cooperating ring, II-substrate ring, III-hexagon socket bolt, IV-grinding layer. Figure 2 is the left view of the grinding wheel, and Figure 3 is a schematic diagram of the composition of the grinding layer, in which: 1-abrasive, 2-bonding agent, 3-filler, 4-pore
具体实施方式Detailed ways
结合附图,详细说明本发明的具体实施。配置100g砂轮磨削层IV的配料:取重量为40g二氧化铈磨料,磨粒的粒径为3μm;称取重量为20g碳酸钠作为pH调节剂;称取重量为10g过氧化纳作为氧化剂;称取重量为10g滑石粉作为助抛剂;称取重量为20g酚醛树脂作为粘结剂;砂轮填充料3中的PH值调节剂,能够在磨削过程中提供酸性或者碱性加工环境,选用碳酸钠。砂轮填充料3中的氧化剂,能在磨削过程中氧化晶体基片表面,提高材料去除率,选用过氧化纳作为氧化剂。磨削过程中为增加砂轮的抛光性能,减小砂轮与晶体基片之间摩擦力,减小晶体基片表面划伤,促进超光滑表面的形成,选用了滑石粉为助抛剂。将以上配料均匀混合后,采用热压方式将磨削层IV热压到基体环II上,然后将基体II环装配到配合环I上,并采用六个均布内六角螺栓III将它们紧固装配成一体。然后进行砂轮的动平衡,在基体环II的端面进行调整,增重或者减重;砂轮磨削层IV磨损完后,仅需更换基体环II,而高精度、高成本基体环I可以重复使用。在基体环端面调整动平衡后,对单晶硅晶片作为样片进行磨削试验。The specific implementation of the present invention will be described in detail in conjunction with the accompanying drawings. Configure the batching of 100g emery wheel grinding layer IV: take weight and be 40g cerium oxide abrasive, the particle diameter of abrasive grain is 3 μm; Take weight and be 20g sodium carbonate as pH regulator; Take weight and be that 10g sodium peroxide is as oxidant; Weigh 10g of talcum powder as a throwing aid; weigh 20g of phenolic resin as a binder; the PH value regulator in the grinding wheel filler 3 can provide an acidic or alkaline processing environment during the grinding process. Sodium carbonate. The oxidizing agent in the grinding wheel filler 3 can oxidize the surface of the crystal substrate during the grinding process to improve the material removal rate, and sodium peroxide is selected as the oxidizing agent. In the grinding process, in order to increase the polishing performance of the grinding wheel, reduce the friction between the grinding wheel and the crystal substrate, reduce the surface scratches of the crystal substrate, and promote the formation of an ultra-smooth surface, talc powder is selected as the throwing aid. After mixing the above ingredients evenly, hot press the grinding layer IV onto the base ring II by means of hot pressing, then assemble the base ring II onto the mating ring I, and fasten them with six evenly distributed hexagon socket head bolts III Assembled into one. Then carry out the dynamic balance of the grinding wheel, and adjust the end face of the base ring II to increase or decrease the weight; after the grinding layer IV of the grinding wheel is worn out, only the base ring II needs to be replaced, while the high-precision, high-cost base ring I can be reused . After adjusting the dynamic balance on the end face of the base ring, the single crystal silicon wafer was used as a sample for grinding test.
磨削后单晶硅基片表面SEM观测未发现微划痕、凹坑、微疵点等表面损伤。采用三维表面轮廓仪测量表面粗糙值Ra均小于0.8nm。采用截面透射电镜检测亚表面没有发现微裂纹和位错,加工表面/亚表面质量优于现有的砂轮磨削,达到化学机械抛光加工效果。磨削单晶硅基片材料去除率1μm/min以上,高于化学机械抛光的去除率0.1~0.2μm/min。No surface damage such as micro-scratches, pits, and micro-defects was found in the SEM observation of the surface of the single-crystal silicon substrate after grinding. The surface roughness Ra measured by a three-dimensional surface profiler is less than 0.8nm. No micro-cracks and dislocations were found on the sub-surface detected by the cross-sectional transmission electron microscope, the quality of the processed surface/sub-surface is better than that of the existing grinding wheel grinding, and the chemical mechanical polishing processing effect is achieved. The material removal rate of grinding single crystal silicon substrate is more than 1 μm/min, which is higher than the removal rate of chemical mechanical polishing of 0.1-0.2 μm/min.
Claims (2)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CNB2006101342482A CN100429047C (en) | 2006-11-08 | 2006-11-08 | Superfine grinding wheel for hard and crisp crystal substrate |
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Cited By (4)
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CN102699826A (en) * | 2012-06-16 | 2012-10-03 | 大连理工大学 | Soft grinding material sand wheel with bonding agent solidified at normal temperature |
CN103949989A (en) * | 2014-05-05 | 2014-07-30 | 郑州磨料磨具磨削研究所有限公司 | Device and method for solidifying superhard-material grinding wheel abrasive block with substrate |
CN110125731A (en) * | 2018-02-08 | 2019-08-16 | 株式会社迪思科 | The method for grinding of retaining surface |
CN112548883A (en) * | 2020-12-02 | 2021-03-26 | 西安奕斯伟硅片技术有限公司 | Grinding wheel and grinding equipment |
Family Cites Families (4)
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SU1220766A1 (en) * | 1984-10-22 | 1986-03-30 | Всесоюзный научно-исследовательский и конструкторско-технологический институт природных алмазов и инструмента | Abravie wheel |
CN2073347U (en) * | 1990-06-24 | 1991-03-20 | 殷风高 | Partly adjustable diamond plane grinding wheel |
CN2199009Y (en) * | 1994-10-17 | 1995-05-31 | 高峻峰 | Combined abrasive wheel for diamond |
WO1999039875A1 (en) * | 1998-02-04 | 1999-08-12 | Unicorn Abrasives Limited | Grinding wheel |
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2006
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
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CN102699826A (en) * | 2012-06-16 | 2012-10-03 | 大连理工大学 | Soft grinding material sand wheel with bonding agent solidified at normal temperature |
CN103949989A (en) * | 2014-05-05 | 2014-07-30 | 郑州磨料磨具磨削研究所有限公司 | Device and method for solidifying superhard-material grinding wheel abrasive block with substrate |
CN103949989B (en) * | 2014-05-05 | 2016-06-01 | 郑州磨料磨具磨削研究所有限公司 | A kind of extra hard material grinding wheel abrasive material block and matrix consolidation device and method |
CN110125731A (en) * | 2018-02-08 | 2019-08-16 | 株式会社迪思科 | The method for grinding of retaining surface |
CN112548883A (en) * | 2020-12-02 | 2021-03-26 | 西安奕斯伟硅片技术有限公司 | Grinding wheel and grinding equipment |
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