CN120467538A - A method and system for separately calibrating channel coefficients used in radiosondes - Google Patents
A method and system for separately calibrating channel coefficients used in radiosondesInfo
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- CN120467538A CN120467538A CN202510675241.4A CN202510675241A CN120467538A CN 120467538 A CN120467538 A CN 120467538A CN 202510675241 A CN202510675241 A CN 202510675241A CN 120467538 A CN120467538 A CN 120467538A
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Abstract
The invention relates to a channel coefficient independent calibration method and system for a sonde, wherein the method comprises the steps of S1, sending an instruction to the sonde, S2, returning to S1 if the sonde does not respond, entering S3 if the sonde responds, S3, calibrating an actual ADC sampling value according to a known standard resistance value, obtaining a calibration result parameter, calculating a target resistance value according to the calibration result parameter, returning to S1, storing the calibration result parameter, S4, establishing a resistance-ADC mapping model according to the calibrated actual ADC sampling value and the target resistance value, and obtaining a resistance actual value corresponding to an ADC value according to the resistance-ADC mapping model. The invention can effectively improve the calibration precision.
Description
Technical Field
The invention relates to the technical field of sonde calibration, in particular to a method and a system for independently calibrating channel coefficients used by a sonde.
Background
The temperature measurement of the sonde generally adopts a platinum resistor, the resistance value of which changes along with the temperature, and the sonde is widely applied to the fields of atmosphere monitoring, industrial control, medical treatment, food processing and the like. The internal measuring circuit of the sonde generally adopts an ADC (analog-to-digital converter) to collect and cooperate with a resistor voltage division method, calculates the resistance value of the platinum resistor by measuring the voltage after voltage division, and then converts the resistance value into temperature according to the temperature-resistance value characteristic of the platinum resistor. However, due to the nonlinear characteristic of the resistor divider circuit, the relationship between the ADC value and the platinum resistance value is not strictly linear, and therefore, channel coefficient calibration is required to optimize measurement accuracy, so that the mapping relationship between the ADC value and the resistance value is more accurate.
The existing sonde channel coefficient calibration method mainly relies on manual operation, usually by manually switching different calibration resistors, and writing a plurality of calibration point data into the sonde after reading ADC measurement values by means of an upper computer, so as to perform linear calibration. However, the method has the following defects that firstly, the calibration process depends on manual operation, the calibration step is complicated, the efficiency is low, the mass production requirement is difficult to meet, secondly, because the manual resistance switching mode is limited, the selectable calibration points are fewer, the fitting precision is possibly insufficient, the measurement accuracy is affected, in addition, the reference resistance is possibly drifted due to the influence of the environmental temperature, and the calibration error is further increased. Therefore, a separate calibration method and system for the channel coefficient of the sonde are provided by those skilled in the art to solve the above-mentioned problems in the background art.
Disclosure of Invention
The invention aims to provide a method and a system for independently calibrating channel coefficients for a sonde, which effectively improve the calibration precision by adopting a multipoint calibration mode.
In order to achieve the above object, the present invention provides the following solutions:
a method for individually calibrating channel coefficients for use with a sonde, comprising:
S1, sending an instruction to a sonde;
S2, returning to S1 if the sonde does not respond, and entering S3 if the sonde responds;
S3, outputting a known standard resistance value to the sonde, calibrating an actual ADC sampling value according to the known standard resistance value, obtaining a calibration result parameter, calculating a target resistance value according to the calibration result parameter, and returning to S1 to store the calibration result parameter, wherein the calibration result parameter is a voltage offset factor, an estimated resistance, a proportion correction factor and an ADC offset;
s4, a resistor-ADC mapping model is established according to the calibrated actual ADC sampling value and the target resistance value, and the resistor actual value corresponding to the ADC value is obtained according to the resistor-ADC mapping model.
Optionally, in S3, calibrating the actual ADC sampling value according to the known standard resistance value includes:
Calculating a theoretical ADC value according to the known standard resistance value;
acquiring a voltage offset factor according to the theoretical ADC value;
Correcting the theoretical ADC value according to the voltage offset factor to obtain a corrected ADC value;
calculating an estimated resistance through an interpolation mode according to the corrected ADC value;
Calculating a proportion correction factor according to the estimated resistance;
Calculating ADC offset according to the proportion correction factor;
And calibrating the actual ADC sampling value according to the ADC offset to obtain a calibrated actual ADC sampling value.
Optionally, calculating the theoretical ADC value includes:
Wherein, the The theoretical ADC value of the known standard resistance R x, R pullup is the resistance of the section divider resistor, and R ref is the total value of the reference divider resistor.
Optionally, obtaining the voltage offset factor includes:
Wherein v adc is the voltage offset factor, The theoretical ADC values for the known standard resistance R 2、R3、R4, respectively.
Optionally, calculating the estimated resistance includes:
Wherein res a is the estimated resistance, AndThe ADC value is corrected for the known standard resistance R 2、R3.
Optionally, calculating the scale correction factor includes:
Wherein res k is a scale correction factor.
Optionally, calculating the ADC offset includes:
Where del adc is the ADC offset, R 1 is the known standard resistance R 1,R1 'and the uncalibrated measured resistance R 1'.
Optionally, calculating the target resistance value according to the calibration result parameter includes:
when the actual ADC sampling value is larger than a preset value, calculating a target resistance value:
when the actual ADC sampling value is not larger than the preset value, calculating a target resistance value:
Where ADC measured is the actual ADC sample value and res adj is the target resistance value.
The invention also provides a system for independently calibrating the channel coefficients used by the sonde, which comprises an upper computer control module, a response judging module, a resistance output module and a return module;
The upper computer control module is used for sending an instruction to the sonde;
The response judging module is used for retransmitting an instruction if the sonde does not respond, and entering the resistance value output module if the sonde responds;
The resistance output module is used for outputting a known standard resistance value to the sonde, calibrating an actual ADC sampling value according to the known standard resistance value, acquiring a calibration result parameter, calculating a target resistance value according to the calibration result parameter, establishing a resistance-ADC mapping model according to the calibrated actual ADC sampling value and the target resistance value, and acquiring a resistance actual value corresponding to the ADC value according to the resistance-ADC mapping model, wherein the calibration result parameter is a voltage offset factor, an estimated resistance, a proportion correction factor and an ADC offset;
and the feedback module is used for returning to the upper computer control module to store the calibration result parameters.
The multi-point calibration method has the beneficial effects that a multi-point calibration mode is adopted, the multi-point calibration method comprises a plurality of standard resistors, a resistor-ADC mapping relation is accurately constructed through a fitting formula, and algorithms such as a voltage offset factor (v adc), an estimated resistor (res a), a proportion correction factor (res k), an ADC offset (del adc) and the like are introduced, so that the calibration precision can be effectively improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings that are needed in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a flow chart of a method for individually calibrating channel coefficients for use with a sonde in accordance with an embodiment of the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
In order that the above-recited objects, features and advantages of the present invention will become more readily apparent, a more particular description of the invention will be rendered by reference to the appended drawings and appended detailed description.
Embodiment one:
As shown in fig. 1, the present embodiment provides a method for individually calibrating channel coefficients used by a sonde, including:
S1, sending an instruction to a sonde;
S2, returning to S1 if the sonde does not respond, and entering S3 if the sonde responds;
S3, outputting a known standard resistance value to the sonde, calibrating an actual ADC sampling value according to the known standard resistance value, obtaining a calibration result parameter, calculating a target resistance value according to the calibration result parameter, and returning to S1 to store the calibration result parameter, wherein the calibration result parameter is a voltage offset factor, an estimated resistance, a proportion correction factor and an ADC offset.
S4, a resistor-ADC mapping model is established according to the calibrated actual ADC sampling value and the target resistance value, and the resistor actual value corresponding to the ADC value is obtained according to the resistor-ADC mapping model.
Further, in S3, calibrating the actual ADC sampling value according to the known standard resistance value includes:
Calculating a theoretical ADC value according to the known standard resistance value;
acquiring a voltage offset factor according to a theoretical ADC value;
Correcting the theoretical ADC value according to the voltage offset factor to obtain a corrected ADC value;
calculating an estimated resistance through an interpolation mode according to the corrected ADC value;
calculating a proportion correction factor according to the estimated resistance;
Calculating ADC offset according to the proportion correction factor;
and calibrating the actual ADC sampling value according to the ADC offset to obtain the calibrated actual ADC sampling value.
Further, calculating the theoretical ADC value includes:
Wherein, the The theoretical ADC value of the known standard resistance R x, R pullup is the resistance of the section divider resistor, and R ref is the total value of the reference divider resistor.
Further, obtaining the voltage offset factor includes:
Wherein v adc is the voltage offset factor, The theoretical ADC values for the known standard resistance R 2、R3、R4, respectively.
Further, calculating the estimated resistance includes:
Wherein res a is the estimated resistance, AndThe ADC value corrected for the known standard resistance R 2、R3, and R 2 is the known standard resistance R 2,AD'＝AD+vadc.
Further, calculating the scale correction factor includes:
Wherein res k is a scale correction factor.
Further, calculating the ADC offset includes:
Where del adc is the ADC offset, R 1 is the known standard resistance R 1,R1 'and the uncalibrated measured resistance R 1'.
Further, calculating the target resistance value according to the calibration result parameter includes:
when the actual ADC sampling value is larger than a preset value, calculating a target resistance value:
when the actual ADC sampling value is not larger than the preset value, calculating a target resistance value:
Where ADC measured is the actual ADC sample value and res adj is the target resistance value.
The following further describes the method for calibrating the actual ADC sampling value in this embodiment, taking the actual calibration resistances 10K,100K,300K and 500K as examples:
step one, calculating a voltage offset factor v adc:
the theoretical ADC value is calculated through the actual values of three groups of precision resistors of 100kΩ, 300kΩ and 500kΩ:
The block voltage dividing resistor R pullup =150kΩ, and the reference voltage dividing resistor total value R ref＝172kΩ,Rx is an actual measurement value of each precision resistor.
Further, the following empirical offset correction expression is constructed:
Wherein v adc is the voltage offset factor,
AD 100、AD300、AD500 is the theoretical ADC value with known standard resistance values of 100kΩ, 300kΩ and 500kΩ respectively, the correction quantity has good numerical symmetry, the geometric meaning is that the ADC value of the middle point (300 kΩ) is more accurate in subsequent fitting due to the fact that the resistance error possibly deviates from a true nonlinear fitting curve and is corrected by v adc to enable the ADC value to be aligned with the curve trend.
Step two, calculating an estimated resistance res a:
After v adc is obtained, it is added to AD 100 and AD 300, respectively, to construct corrected ADC values AD '100 and AD' 300. Then, calculating the approximate estimated value of the resistor to be measured by interpolation:
wherein, AD ' 100 and AD ' 300 are ADC values after correction of known standard resistance values of 100kΩ and 300kΩ, and AD ' =AD+v adc.
This value provides an initial estimate of resistance for subsequent proportional corrections.
Step three, calculating a proportion correction factor res k:
Considering that the ADC-resistance response curve has nonlinearity, a proportion correction factor res k is further introduced, and the expression is as follows:
This step can be understood as linearly scaling the resistive response of the target point into the entire ADC dynamic range at the modified voltage level to construct a dynamic calibration factor for the nonlinear response.
Step four, calculating an ADC offset del adc:
And taking the precise resistance of 10k omega as a reference, and superposing v adc according to the difference between the theoretical ADC value and the back-estimated ADC value to finally obtain the ADC offset del adc required by the actual measured value.
The specific expression is as follows:
this value is directly used for calibration of the actual ADC sample value:
ADCcorrected＝ADCmeasured+deladc
Where ADC corrected is the calibrated ADC value and ADC measured is the actual ADC sample value.
And finally accurately restoring the target resistance through a voltage division back-push formula.
After calculating v adc、resa、resk、deladc four coefficients, the target resistance res adj can be back-deduced according to the four coefficients.
When the actual ADC sampling value is more than or equal to 37000, linear slope compensation is adopted:
When actually ADC sampling values, the basic compensation is used:
and establishing a resistance-ADC mapping model according to the calibrated actual ADC sampling value and the target resistance value, and acquiring a resistance actual value corresponding to the ADC value according to the resistance-ADC mapping model.
Embodiment two:
The independent channel coefficient calibration system for the sonde comprises an upper computer control module, a response judgment module, a resistance output module and a return module;
the upper computer control module is used for sending an instruction to the sonde;
the response judging module is used for retransmitting the instruction if the sonde does not respond, and entering the resistance value output module if the sonde responds;
the resistance output module is used for outputting a known standard resistance value to the sonde, calibrating an actual ADC sampling value according to the known standard resistance value, obtaining a calibration result parameter, calculating a target resistance value according to the calibration result parameter, establishing a resistance-ADC mapping model according to the calibrated actual ADC sampling value and the target resistance value, and obtaining a resistance actual value corresponding to the ADC value according to the resistance-ADC mapping model, wherein the calibration result parameter is a voltage offset factor, an estimated resistance, a proportion correction factor and an ADC offset;
And the feedback module is used for returning to the resistance output module if all the calibration points (10K, 100K,300K, 500K) are not completely output, acquiring the calibration result parameters if all the calibration points are completely output, and returning to the upper computer control module to store the calibration result parameters.
Specifically, the workflow of the system of this embodiment includes:
and in the starting stage, the calibration system is electrified or enters an initial state after receiving an external trigger signal.
And sending a query instruction, namely sending a standard query instruction to the sonde main control by the upper computer control module so as to establish communication connection and confirm the on-line state of the equipment.
Judging the response of the sonde, namely detecting whether the sonde responds normally or not by the system, retransmitting an instruction to enter a waiting cycle if the sonde does not respond normally, and entering the next step if the sonde responds normally.
And outputting calibration resistance values, namely sequentially outputting a plurality of known standard resistance values, such as 10kΩ,100 kΩ, 300kΩ, 500kΩ and the like, to the sonde by a system control end through a multi-path resistance switching module or a program preset value, and constructing an ADC mapping relation. The mapping relationship is an ADC value corresponding to an actual value of the resistor, for example, the theoretical ADC value mapped by the 12-bit ADC at the resistance of 10K is 54012, but the actual ADC mapped actually may be 54020, so that it is known that the corresponding resistor is 10K if the ADC value is 54020. The mapping relation between the ADC and the resistor after calibration is more accurate and real.
And waiting for the sonde to transmit a measured resistance value, namely finishing partial pressure sampling in the sonde, and sending the acquired original ADC value back to an upper computer or a calibration control module through a communication interface.
Judging whether the resistance value output is finished, wherein the system judges whether all the calibration points (10K, 100K,300K, 500K) are already output, if not, the system returns to continue to output the next standard resistance value until all the calibration points are finished.
After the system receives the ADC data corresponding to all the resistance points, the system calculates the complete resistance-ADC mapping model coefficient, namely v adc、resa、resk、deladc, by utilizing the multipoint fitting and error compensation algorithm (such as voltage offset calculation, linear estimation, proportion correction factor calculation and the like) provided by the invention, and writes the calibration result parameters into a sonde end or an upper computer for storage through a communication interface so as to be used for accurate correction of the follow-up measured data.
The above embodiments are merely illustrative of the preferred embodiments of the present invention, and the scope of the present invention is not limited thereto, but various modifications and improvements made by those skilled in the art to which the present invention pertains are made without departing from the spirit of the present invention, and all modifications and improvements fall within the scope of the present invention as defined in the appended claims.
Claims (9)
1. A method for individually calibrating channel coefficients for use with a sonde, comprising:
S1, sending an instruction to a sonde;
S2, returning to S1 if the sonde does not respond, and entering S3 if the sonde responds;
S3, outputting a known standard resistance value to the sonde, calibrating an actual ADC sampling value according to the known standard resistance value, obtaining a calibration result parameter, calculating a target resistance value according to the calibration result parameter, and returning to S1 to store the calibration result parameter, wherein the calibration result parameter is a voltage offset factor, an estimated resistance, a proportion correction factor and an ADC offset;
s4, a resistor-ADC mapping model is established according to the calibrated actual ADC sampling value and the target resistance value, and the resistor actual value corresponding to the ADC value is obtained according to the resistor-ADC mapping model.
2. The method for individually calibrating channel coefficients for a sonde according to claim 1, wherein in S3, calibrating the actual ADC sampling values according to the known standard resistance comprises:
Calculating a theoretical ADC value according to the known standard resistance value;
acquiring a voltage offset factor according to the theoretical ADC value;
Correcting the theoretical ADC value according to the voltage offset factor to obtain a corrected ADC value;
calculating an estimated resistance through an interpolation mode according to the corrected ADC value;
Calculating a proportion correction factor according to the estimated resistance;
Calculating ADC offset according to the proportion correction factor;
And calibrating the actual ADC sampling value according to the ADC offset to obtain a calibrated actual ADC sampling value.
3. A method of calibrating channel coefficients for use with a sonde according to claim 2, wherein calculating theoretical ADC values comprises:
Wherein, the The theoretical ADC value of the known standard resistance R x, R pullup is the resistance of the section divider resistor, and R ref is the total value of the reference divider resistor.
4. A method of calibrating channel coefficients for use with a sonde according to claim 3, wherein obtaining a voltage offset factor includes:
Wherein v adc is the voltage offset factor, The theoretical ADC values for the known standard resistance R 2、R3、R4, respectively.
5. The method of calibrating channel coefficients for use with a sonde of claim 4, wherein calculating an estimated resistance includes:
Wherein res a is the estimated resistance, AndThe ADC value is corrected for the known standard resistance R 2、R3.
6. The method of calibrating channel coefficients for use with a sonde of claim 5, wherein calculating the scale correction factor includes:
Wherein res k is a scale correction factor.
7. The method of independent calibration of channel coefficients for use with a sonde of claim 6, wherein calculating the ADC offset includes:
Where del adc is the ADC offset, R 1 is the known standard resistance R 1,R1 'and the uncalibrated measured resistance R 1'.
8. The method of claim 7, wherein calculating a target resistance value based on the calibration result parameters comprises:
when the actual ADC sampling value is larger than a preset value, calculating a target resistance value:
when the actual ADC sampling value is not larger than the preset value, calculating a target resistance value:
Where ADC measured is the actual ADC sample value and res adj is the target resistance value.
9. A channel coefficient independent calibration system for a sonde is characterized by comprising an upper computer control module, a response judging module, a resistance output module and a return module;
The upper computer control module is used for sending an instruction to the sonde;
The response judging module is used for retransmitting an instruction if the sonde does not respond, and entering the resistance value output module if the sonde responds;
The resistance output module is used for outputting a known standard resistance value to the sonde, calibrating an actual ADC sampling value according to the known standard resistance value, acquiring a calibration result parameter, calculating a target resistance value according to the calibration result parameter, establishing a resistance-ADC mapping model according to the calibrated actual ADC sampling value and the target resistance value, and acquiring a resistance actual value corresponding to the ADC value according to the resistance-ADC mapping model, wherein the calibration result parameter is a voltage offset factor, an estimated resistance, a proportion correction factor and an ADC offset;
and the feedback module is used for returning to the upper computer control module to store the calibration result parameters.
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