CN119962463B

CN119962463B - Methods, devices, storage media, and electronic equipment for determining power grid modes

Info

Publication number: CN119962463B
Application number: CN202510031033.0A
Authority: CN
Inventors: 冯凯丽; 曾昭贵; 高旭; 周颖; 李贤佳
Original assignee: Shandong Yunhai Guochuang Cloud Computing Equipment Industry Innovation Center Co Ltd
Current assignee: Shandong Yunhai Guochuang Cloud Computing Equipment Industry Innovation Center Co Ltd
Priority date: 2025-01-08
Filing date: 2025-01-08
Publication date: 2026-01-09
Anticipated expiration: 2045-01-08
Also published as: CN119962463A

Abstract

This application provides a method, apparatus, storage medium, and electronic device for determining a power grid pattern, including: calculating a first cell density of one or more components within a first rectangular frame, wherein the first cell density indicates the proportion of all components within the first rectangular frame; if the first cell density is greater than a first preset value, expanding the size of the first rectangular frame to obtain a second rectangular frame, and recalculating a second cell density of the one or more components within the second rectangular frame; if the second cell density is less than the first preset value, determining the power grid pattern that needs to be added for the one or more components based on the degree to which the voltage drop exceeds a first threshold. This solves the problem in related technologies where it is impossible to determine the power grid pattern that needs to be added for one or more components based on the degree of voltage drop.

Description

Power grid mode determining method and device, storage medium and electronic equipment

Technical Field

The embodiment of the application relates to the technical field of communication, in particular to a method and a device for determining a power grid mode, a storage medium and electronic equipment.

Background

With the continuous evolution of the semiconductor technology, the resistance value of the integrated circuit is continuously increased, the power supply voltage is smaller and smaller, and the voltage drop effect is more and more obvious. In the related art, when a voltage drop occurs in an integrated circuit, a power grid pattern in which one or more components need to be added cannot be determined according to the degree of the voltage drop, where the one or more components are components in the integrated circuit whose voltage drop exceeds a first threshold, and the power grid pattern includes a design manner of a corresponding power grid.

No effective solution has been proposed for the problem in the related art that it is impossible to determine the power grid pattern that one or more components need to increase according to the degree of voltage drop.

Disclosure of Invention

The embodiment of the application provides a method and a device for determining a power grid mode, a storage medium and electronic equipment, which at least solve the problem that in the related art, the power grid mode which one or more components need to be added cannot be determined according to the voltage drop degree.

According to one embodiment of the application, a method for determining a grid pattern of a power supply, by an electronic design automation tool, analyzes a circuit of a first integrated circuit in which a voltage drop occurs to mirror-display the first integrated circuit in a target interface, and one or more components in the first integrated circuit for which the voltage drop exceeds a first threshold, identifies the position of the one or more components in the target interface by a first rectangular frame, wherein the first rectangular frame is to cover the one or more components to the maximum extent, and the rectangular frame is to cover a non-component area to the minimum extent, the method for determining comprises calculating a first cell density of the one or more components in the first rectangular frame, wherein the first cell density is used for indicating a duty ratio of all components in the first rectangular frame, expanding the size of the first rectangular frame to obtain a second rectangular frame when the first cell density is greater than a first preset value, recalculating the size of the first rectangular frame to obtain a second rectangular frame, and calculating a first cell density of the one or more components in the first rectangular frame when the first cell density is greater than the first preset value, and determining that the first cell density of the first cell density exceeds the first threshold.

In one exemplary embodiment, determining a power grid pattern to be added at the one or more components based on the extent to which the voltage drop exceeds the first threshold includes obtaining a magnitude of the voltage drop, determining, by the electronic design automation tool, a first power grid pattern including positive power sources arranged at a first density and negative power sources arranged at the first density if the voltage drop exceeds the first threshold and the voltage drop is less than a second threshold, determining, by the electronic design automation tool, a second power grid pattern including positive power sources arranged at a second density and negative power sources arranged at the second density if the voltage drop exceeds the second threshold and the voltage drop is less than a third threshold, and determining, by the electronic design automation tool, a third power grid pattern including positive power sources arranged at the third density and negative power sources arranged at the third density if the voltage drop exceeds the third threshold but does not reach a fourth threshold, wherein the third power grid pattern includes positive power sources arranged at the third density and the third power sources arranged at the third density greater than the third density.

In one exemplary embodiment, calculating a first cell density of the one or more components within the first rectangular frame includes obtaining a total area of the one or more components and an area of the first rectangular frame, and determining the first cell density based on a ratio of the total area of the one or more components to the area of the first rectangular frame.

In one exemplary embodiment, expanding the size of the first rectangular frame to obtain a second rectangular frame, and recalculating a second cell density of the one or more components within the second rectangular frame includes obtaining an area of the first rectangular frame, expanding the area of the first rectangular frame by a second preset value to obtain the second rectangular frame, and determining the second cell density according to a total area of the one or more components and the area of the second rectangular frame.

In an exemplary embodiment, after recalculating a second cell density of the one or more components within the second rectangular frame, the method further includes determining a magnitude relationship of the second cell density and the first preset value, obtaining an area of the first rectangular frame if the second cell density is greater than the first preset value, expanding the area of the first rectangular frame by a third preset value to obtain a third rectangular frame, recalculating a third cell density of the one or more components within the third rectangular frame, wherein the third preset value is greater than a second preset value, the second preset value is a difference value between the second rectangular frame and the first rectangular frame, and determining a power mode that the one or more components need to be increased according to a degree to which the voltage drop exceeds the first threshold value if the third cell density is less than the first preset value.

In an exemplary embodiment, after determining that the one or more components require an increased power grid pattern based on the extent to which the voltage drop exceeds the first threshold, the method further comprises obtaining a second integrated circuit after the power grid pattern has been increased, analyzing the second integrated circuit by the electronic design automation tool and mirroring the second integrated circuit in the target interface, determining that no voltage drop exists in the second integrated circuit if the one or more components are not displayed by the target interface, saving the second integrated circuit and the power grid pattern, directly obtaining the second integrated circuit and the power grid pattern if the same voltage drop occurs in the first integrated circuit, analyzing the power grid pattern if the target interface continues to display the one or more components to obtain an analysis result of the power grid pattern, determining that the density of the positive and negative power supply arrangements in the power grid pattern increases based on the analysis result, increasing the density of the positive and negative power supply arrangements, determining that the new power supply arrangements and the negative power supply arrangements are not displayed by the integrated circuit, automatically saving the second integrated circuit and the third integrated circuit if the new power grid pattern is not displayed by the target interface, determining that the third integrated circuit is not displayed by the third integrated circuit, the third integrated circuit and the new power grid pattern are directly acquired in the event that the voltage drop persists in the integrated circuit that added the power grid pattern.

In one exemplary embodiment, after determining that the one or more components require an increased power grid pattern based on the extent to which the voltage drop exceeds the first threshold, the method further includes integrating, by the electronic design automation tool, a power grid corresponding to the power grid pattern into a circuit in the first integrated circuit in which the voltage drop occurs.

According to another embodiment of the present application, there is provided a determining apparatus for determining a power grid pattern of the first component, including a first calculating module configured to calculate a first cell density of the one or more components in the first rectangular frame, where the first cell density is used to indicate a duty ratio of all components in the first rectangular frame, and a second calculating module configured to enlarge a size of the first rectangular frame to obtain a second rectangular frame when the first cell density is greater than a first preset value, and recalculate a second cell density of the one or more components in the second rectangular frame when the second cell density is less than the first preset value, and determine a power grid pattern that the one or more components need to be increased according to a degree to which the voltage drop exceeds the first threshold when the second cell density is less than the first preset value.

According to a further embodiment of the application, there is also provided a computer readable storage medium having stored therein a computer program, wherein the computer program is arranged to perform the steps of any of the method embodiments described above when run.

According to a further embodiment of the application there is also provided an electronic device comprising a memory having stored therein a computer program and a processor arranged to run the computer program to perform the steps of any of the method embodiments described above.

According to a further embodiment of the present application, there is also provided a computer program product comprising a computer program which, when executed by a processor, implements the steps of the above-described method embodiments.

According to the method and the device, the first unit density of one or more components in the first rectangular frame is calculated, namely the duty ratio of the one or more components in the first rectangular frame is increased, the size of the first rectangular frame is enlarged under the condition that the first unit density is larger than the first preset value, the second unit density of the one or more components in the enlarged first rectangular frame is recalculated, and the power grid mode which is needed to be increased by the one or more components is determined according to the degree that the voltage drop exceeds the first threshold under the condition that the second unit density is smaller than the first preset value. Accordingly, the problem in the related art that the power grid pattern that one or more components need to be added cannot be determined according to the degree of voltage drop can be solved.

Drawings

FIG. 1 is a block diagram of a hardware configuration of a method for determining a power grid pattern according to an embodiment of the present application;

FIG. 2 is a flow chart of a method of determining a power grid pattern according to an embodiment of the application;

FIG. 3 is a schematic diagram of voltage drops in a method of determining a power grid pattern according to an embodiment of the application;

FIG. 4 is a schematic diagram of power supply noise caused by voltage drops in a method of determining a power supply grid pattern according to an embodiment of the present application;

FIG. 5 is a schematic diagram of one or more components of a method of determining a power grid pattern having voltage drops exceeding a first threshold in accordance with an embodiment of the application;

FIG. 6 is a schematic diagram of a first rectangular box identifying the location of one or more components in a method of determining a power grid pattern in accordance with an embodiment of the application;

FIG. 7 is a schematic diagram of a power grid pattern of a method of determining a power grid pattern according to an embodiment of the application;

FIG. 8 is a schematic diagram of an enlarged first rectangular box in a method of determining a power grid pattern according to an embodiment of the application;

FIG. 9 is a flow chart of a method of determining a power grid pattern according to an embodiment of the application;

Fig. 10 is a block diagram of a power grid pattern determination apparatus according to an embodiment of the present application.

Detailed Description

Embodiments of the present application will be described in detail below with reference to the accompanying drawings in conjunction with the embodiments.

It should be noted that the terms "first," "second," and the like in the description and the claims of the present application and the above figures are used for distinguishing between similar objects and not necessarily for describing a particular sequential or chronological order.

The method embodiments provided in the embodiments of the present application may be implemented in an electronic design automation tool or similar computing device. Taking an example of running on an electronic design automation tool, fig. 1 is a block diagram of a hardware structure of a method for determining a grid pattern of a power supply according to an embodiment of the present application. As shown in fig. 1, the electronic design automation tool may include one or more processors 102 (only one is shown in fig. 1), which processor 102 may include, but is not limited to, a microprocessor, a processing device such as a programmable logic device FPGA, and a memory 104 for storing data, wherein the electronic design automation tool may further include a transmission device 106 for communication functions and an input-output device 108. It will be appreciated by those of ordinary skill in the art that the configuration shown in fig. 1 is merely illustrative and is not intended to limit the configuration of the electronic design automation tool described above. For example, the electronic design automation tool may also include more or fewer components than shown in FIG. 1, or have a different configuration than shown in FIG. 1.

The memory 104 may be used to store a computer program, for example, a software program of application software and a module, such as a computer program corresponding to a method for determining a power grid pattern in an embodiment of the present application, and the processor 102 executes the computer program stored in the memory 104 to perform various functional applications and data processing, that is, to implement the method for determining a power grid pattern. Memory 104 may include high-speed random access memory, and may also include non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some examples, the memory 104 may further include memory remotely located with respect to the processor 102, which may be connected to the electronic design automation tool through a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.

The transmission device 106 is used to receive or transmit data via a network. Specific examples of the network described above may include a wireless network provided by a communication provider of an electronic design automation tool. In one example, the transmission device 106 includes a network adapter (Network Interface Controller, simply referred to as a NIC) that can connect to other network devices through a base station to communicate with the internet. In one example, the transmission device 106 may be a Radio Frequency (RF) module, which is configured to communicate with the internet wirelessly.

In this embodiment, a method for determining a power grid pattern is provided, which is applied to the above-mentioned electronic design automation tool. Fig. 2 is a flowchart of a method of determining a power grid pattern according to an embodiment of the present application, as shown in fig. 2, the flowchart including the steps of:

step S202, calculating a first unit density of the one or more components in the first rectangular frame, wherein the first unit density is used for indicating the duty ratio of all components in the first rectangular frame;

step S204, expanding the size of the first rectangular frame to obtain a second rectangular frame under the condition that the first unit density is larger than a first preset value, and recalculating the second unit density of the one or more components in the second rectangular frame;

step S206, determining a power grid pattern that the one or more components need to be increased according to a degree to which the voltage drop exceeds the first threshold value, in a case that the second cell density is smaller than the first preset value.

Through the steps, the electronic design automation tool analyzes a circuit of a first integrated circuit with voltage drop to mirror-image the first integrated circuit in a target interface, one or more components with voltage drop exceeding a first threshold value in the first integrated circuit, the position of the one or more components is marked through a first rectangular frame in the target interface, the first rectangular frame is used for covering the one or more components to the maximum extent, meanwhile, the rectangular frame is used for covering a non-component area to the minimum extent, the determining method comprises the steps of calculating first unit density of the one or more components in the first rectangular frame, wherein the first unit density is used for indicating the proportion of all components in the first rectangular frame, expanding the size of the first rectangular frame to obtain a second rectangular frame when the first unit density is larger than a first preset value, recalculating the area of the one or more components in the second rectangular frame, and determining that the voltage drop density of the one or more components in the second rectangular frame is larger than the first preset value when the first unit density is smaller than the first preset value and the voltage drop density of the first grid is required to exceed the first threshold value. Accordingly, the problem in the related art that the power grid pattern that one or more components need to be added cannot be determined according to the degree of voltage drop can be solved.

Optionally, it is assumed that, in a case where the voltage drop exceeds the first threshold and the voltage drop is less than the second threshold, a first power grid corresponding to the first power grid mode is selected, where the first power grid includes a positive power supply and a negative power supply of 2×2. And under the condition that the voltage drop exceeds a second threshold value and the voltage drop is smaller than a third threshold value, selecting a second power grid corresponding to a second power grid mode, wherein the second power grid comprises a 3*3 positive power supply and a 3*3 negative power supply. And under the condition that the voltage drop exceeds a third threshold value and the voltage drop is smaller than a fourth threshold value, selecting a third power grid corresponding to a third power grid mode, wherein the third power grid comprises a 4*4 positive power supply and a 4*4 negative power supply. And under the condition that the voltage drop exceeds an Nth threshold value, selecting an Nth power grid corresponding to an Nth power grid mode, wherein the Nth power grid comprises a positive power supply and a negative power supply of (N+1) ×n+1, and N is a positive integer greater than three.

In this embodiment, by obtaining the magnitude of the voltage drop and determining the power grid pattern that one or more components that have voltage drop need to increase according to the extent to which the voltage drop exceeds the first threshold, in order to facilitate in an actual application scenario, the corresponding power grid pattern may be quickly determined according to the voltage drop.

After the total area of one or more components and the area of the first rectangular frame are obtained, according to the formula N-th cell density=100% of the total area of one or more components/the area of the N-th rectangular frame, and in the case where N is equal to 1, the first cell density in this embodiment may be obtained, where N is a positive integer.

In this embodiment, the duty ratio of the one or more components in the first rectangular frame is determined according to the total area of the one or more components, the area of the first rectangular frame, and a specific calculation formula. Through the calculation formula, after the total area of one or more components and the area of the Nth rectangular frame are determined, the corresponding Nth unit density can be obtained, so that the required Nth unit density can be determined quickly, and convenience is brought to subsequent operations.

Optionally, in the case that the first unit density is greater than the first preset value, it is indicated that there is not enough winding resource in one or more components to increase the power grid, the area of the first rectangular frame is obtained, the area of the first rectangular frame is expanded by 10% in equal proportion to obtain the area of the second rectangular frame, after determining the total area of one or more components and the area of the second rectangular frame, the second unit density is determined according to the formula that the nth unit density=the total area of one or more components/the area of the nth rectangular frame is 100%, and in the case that N is equal to 2.

In this embodiment, the area of the first rectangular frame is expanded by a second preset value in equal proportion to obtain a second rectangular frame, and then the second cell density can be determined according to the calculation formula of the total area of one or more components, the area of the second rectangular frame and the nth cell density, where N is equal to 2.

Optionally, in the case that the first unit density is greater than the first preset value, the area of the first rectangular frame is expanded by 10% in equal proportion, that is, the second preset value in the present embodiment, to obtain the area of the second rectangular frame, and the second unit density is determined according to the total area of one or more components and the area of the second rectangular frame. Under the condition that the second unit density is still greater than the first preset value, the fact that the one or more components are still arranged tightly is indicated that enough winding resources are not available for increasing the power grid, the area of the first rectangular frame is obtained again, the area of the first rectangular frame is enlarged by 20% in equal proportion, namely the third preset value in the embodiment is obtained, the area of the third rectangular frame is obtained, the third unit density of the one or more components in the third rectangular frame is recalculated until the third unit density is smaller than the first preset value, and the power grid mode which one or more components need to be increased is determined according to the degree that the voltage drop exceeds the first threshold value.

In this embodiment, in the case that the second cell density is greater than the first preset value, the area of the first rectangular frame is expanded by a third preset value in equal proportion to obtain a third rectangular frame, and the third cell density is recalculated until the third cell density is less than the first preset value, and then the power grid mode in which one or more components need to be increased is determined according to the degree to which the voltage drop exceeds the first threshold value. A method of continuing to enlarge an area of an N-th rectangular frame in the event that an N-th cell density is greater than a first preset value is provided.

Optionally, assuming that the voltage drop exceeds a first threshold and is smaller than a second threshold, selecting a first power grid corresponding to the first power grid mode, where the first power grid includes a positive power supply and a negative power supply of 2×2. The first power grid is integrated into a circuit in the first integrated circuit where a voltage drop occurs by an electronic design automation tool to obtain a second integrated circuit. Analysis of the second integrated circuit by the electronic design automation tool, if one or more components are not displayed in the target interface, means that the second integrated circuit with the addition of the first power grid has solved the voltage drop problem, i.e. no voltage drop exists in the second integrated circuit. If one or more components continue to be displayed in the target interface, the voltage drop still exists in the second integrated circuit, and a power grid corresponding to a power grid mode with a level higher than that of the current power grid mode is selected, namely a second power grid corresponding to the second power grid mode is selected, wherein the second power grid comprises a positive power supply and a negative power supply of 3*3. The second power grid is integrated into a circuit in the second integrated circuit where a voltage drop occurs by an electronic design automation tool to obtain a third integrated circuit. Analysis of the third integrated circuit by the electronic design automation tool, if one or more components are not displayed in the target interface, means that no voltage drop is present in the third integrated circuit of the second power grid is increased.

In this embodiment, the power grid corresponding to the determined power grid pattern is integrated into the first integrated circuit by the electronic design automation tool to obtain the second integrated circuit, and the second integrated circuit is analyzed by the electronic design automation tool to determine whether a voltage drop exists in the second integrated circuit continuously, and corresponding operations are performed according to different situations until no voltage drop exists in the integrated circuit. By the method in this embodiment it can be ensured that no voltage drop exists in the final integrated circuit.

In the above embodiments, details are given of determining that one or more components in the integrated circuit need an increased power grid pattern based on the extent to which the voltage drop exceeds the first threshold value in case of a voltage drop in the integrated circuit, and determining the actual physical significance of the voltage drop is also required before determining the power grid pattern.

Fig. 3 is a schematic diagram of voltage drop in the method for determining a grid pattern of a power supply according to an embodiment of the present application, as shown in fig. 3, specifically including the following:

voltage drop refers to a phenomenon in integrated circuits where voltages drop and rise across power and ground networks. Along with the continuous evolution of the semiconductor process, the width of the metal interconnection line is narrower, the resistance value is larger, the power supply voltage is smaller, and the voltage drop effect is obvious.

Embodiments of the present application demonstrate voltage drop phenomena in integrated circuits. In integrated circuits, metal interconnect networks are used to connect different circuit elements, such as transistors, resistors, capacitors, and the like. These metal interconnects can be seen as a network of a plurality of resistors r and inductors i connected in series and parallel. If a V1 voltage is applied at the power port and the current i passes through a network having a total resistance R (r+r+), the voltage V2 available at the other end of the network will be calculated by the following formula: v2=v1- (i) r+i r+i. This means that the available voltage V2 is the input voltage V1 minus the voltage drop due to the current i and the resistor R.

The voltage drop may cause some parts of the circuit to not obtain enough voltage to function properly. For example, if a standard cell or macro cell requires a minimum operating voltage to operate, it may not be able to achieve this due to voltage drop, thereby affecting the performance of the circuit.

The voltage drop is mainly divided into two types, one is a static voltage drop and the other is a dynamic voltage drop.

The static voltage drop is mainly caused by self-resistance voltage division of the metal wires of the power network. The current through the internal power supply connections causes a voltage drop in the power supply, so that the static voltage drop is mainly related to the structure and the connection details of the power supply network. If the resistivity of the wire is high or the amount of current through the power network is large, a large amount of voltage may be present in the power delivery network, which will result in the actual available voltage being lower than the applied voltage. Therefore, the static voltage drop mainly considers the resistance effect, and the influence of the resistance is analyzed.

Dynamic voltage drop is the voltage drop caused by current fluctuations when the power supply switches circuit switches. The phenomenon is generated at the trigger edge of the clock, the trigger edge jump of the clock not only causes a large number of transistor switches, but also causes the jump of the combinational logic circuit, so that a large current is often generated on the whole chip in a short time, the instantaneous large current causes a voltage drop phenomenon, and meanwhile, the more the number of transistors of the switch is, the more the dynamic voltage drop phenomenon is easily triggered.

After the actual physical meaning of the voltage drop is clarified, the impact of the voltage drop on the integrated circuit needs to be determined.

Fig. 4 is a schematic diagram of power supply noise caused by voltage drop in the method for determining a power grid pattern according to an embodiment of the present application, as shown in fig. 4, specifically including the following:

in designing an integrated circuit, standard cells in the circuit require a certain voltage to function properly. The operating speed of these standard cells is closely related to the voltage they receive. If the voltage received by the standard cell is lower than the voltage actually required, the delay of the standard cell increases. In high-speed electronic devices, the increase in delay of standard cells can negatively impact overall performance. If the delay becomes too long, the design may not work as intended and in the worst case, the design may not function at all. When the voltage drop is within the limit, only the delay of the standard cell increases, which affects the setup and hold times of the design.

In this embodiment, if a certain area of the integrated circuit has a large number of switching activities, such as a large number of transistors switching states at the same time, the current demand in that area increases suddenly. Such a sudden increase in current may lead to a sudden drop in the supply voltage, whereas if the current is pulled away from the ground, the voltage of the ground may suddenly rise. Whether the voltage drop of the supply voltage or the ground bounce effect is referred to as supply noise, this supply noise can affect the performance of the circuit.

The above embodiments introduce the effect of voltage drop on the integrated circuit and thus it is necessary to reduce the voltage drop in the integrated circuit before it is necessary to determine which components of the integrated circuit have voltage drops exceeding the first threshold.

FIG. 5 is a schematic diagram of one or more components of the method for determining a grid pattern of a power supply according to an embodiment of the present application, where the voltage drop exceeds a first threshold, as shown in FIG. 5, specifically includes the following:

The voltage drop is analyzed by an electronic design automation tool during back-end development, the voltage of each component in the integrated circuit is calculated during analysis, and the results are compared with design specifications. After the analysis is complete, the electronic design automation tool may display the results in color-coded, typically red, indicating the most severe component or components that have voltage drops exceeding the first threshold. In this embodiment, one or more components whose voltage drop exceeds a first threshold are determined based on the analysis results, and these one or more components exceeding the first threshold are simply marked with black dots to facilitate identification and subsequent analysis.

After specifying the occurrence of one or more components in the integrated circuit whose voltage drops exceed the first threshold, it is also necessary to identify the location of the one or more components in order to add a corresponding power grid to the one or more components.

FIG. 6 is a schematic diagram of a first rectangular box identifying the location of one or more components in a method for determining a power grid pattern according to an embodiment of the application, as shown in FIG. 6, and specifically includes the following:

One or more components that do not meet the first threshold in fig. 5 are identified to the greatest extent by the first rectangular box, in this embodiment, there are one or more components (a) and one or more components (b), and there are corresponding first rectangular boxes (a) and (b), according to the formula N-th cell density=total area of one or more components/area of N-th rectangular box×100%, where N is a positive integer. Setting N to 1, calculating a first cell density corresponding to the one or more components (a) in the first rectangular frame (a) and a first cell density corresponding to the one or more components (b) in the first rectangular frame (b), respectively. Comparing the first unit density with a first preset value, if the first unit density is smaller than the first preset value, as shown in (a) of the present embodiment, it is indicated that one or more components (a) have enough winding resources to increase the power grid, and determining the power grid pattern that one or more components (a) need to increase according to the extent to which the voltage drop exceeds the first threshold.

If the first unit density is greater than the first preset value, as shown in (b) in this embodiment, it is indicated that there are not enough winding resources in one or more components (b) to increase the power grid, and the first rectangular frame (b) needs to be enlarged to reduce the first unit density corresponding to one or more components (b) in the second rectangular frame (b), where the second rectangular frame (b) is a rectangular frame with the first rectangular frame (b) enlarged by a second preset value in equal proportion. And (3) recalculating the second unit density of the component area (b) in the second rectangular frame (b) according to the second rectangular frame (b), comparing the second unit density with the first preset value, if the second unit density is smaller than the first preset value, indicating that one or more components (b) have enough winding resources to increase the power grid, and determining the power grid mode which needs to be increased in one or more components (b) according to the degree that the voltage drop exceeds the first threshold value. If the second unit density is greater than the first preset value, it is indicated that there are not enough winding resources in the one or more components (b) to increase the power grid, and the second rectangular frame (b) needs to be continuously expanded to reduce the third unit density of the one or more components (b) in the third rectangular frame (b), where the third rectangular frame (b) is a rectangular frame with a third preset value expanded in equal proportion to the first rectangular identification frame (b). And (3) recalculating the N-th unit density of the one or more components (b) in the third rectangular frame (b) according to the third rectangular frame (b) until the N-th unit density is smaller than a first preset value, and determining a power grid mode which the one or more components (b) need to be increased according to the degree that the voltage drop exceeds a first threshold value, wherein N is a positive integer greater than three.

The above embodiment identifies the position of one or more components by the nth rectangular box and calculates the nth cell density, and after the nth cell density is less than the first preset value, determines the power grid pattern to which the one or more components need to be added according to the extent to which the voltage drop exceeds the first threshold, where N is a positive integer.

Fig. 7 is a schematic diagram of a power grid pattern of a method for determining a power grid pattern according to an embodiment of the present application, as shown in fig. 7, specifically including the following:

In the embodiment shown in fig. 6, when there are sufficient winding resources in the component area to increase the power grid, the power grid pattern that needs to be increased in the component area is determined based on the extent to which the voltage drop exceeds the first threshold. The specific determination method is as follows:

When the voltage drop exceeds the first threshold and is smaller than the second threshold, a first power grid corresponding to the first power grid mode of I in the embodiment is selected, where the first power grid includes a positive power source and a negative power source of 2×2.

When the voltage drop exceeds the second threshold and is smaller than the third threshold, a second power grid corresponding to the power grid mode in the embodiment II is selected, wherein the second power grid comprises a 3*3 positive power supply and a 3*3 negative power supply.

When the voltage drop exceeds the third threshold and is smaller than the fourth threshold, a third power grid corresponding to the power grid mode of III in this embodiment is selected, where the third power grid includes 4*4 positive power and negative power.

When the voltage drop exceeds the fourth threshold and is smaller than the fifth threshold, a fourth power grid corresponding to the power grid mode of IV in this embodiment is selected, where the fourth power grid includes 5*5 positive power and negative power.

When the voltage drop exceeds the Nth threshold, selecting an Nth power grid corresponding to the Nth power grid mode, wherein the Nth power grid comprises a positive power supply and a negative power supply of (N+1) ×n+1, and N is a positive integer greater than four.

And after the power grid is added in the first integrated circuit, the voltage drop is analyzed through an electronic design automation tool, and if the voltage drop problem does not exist in the first integrated circuit, the whole process is considered to be completed. If the voltage drop problem for the first integrated circuit is only improved and not completely solved, the level of the current power grid pattern is determined to replace the power grid pattern at a level higher than the level of the current power grid pattern until no voltage drop exists in the final integrated circuit. Optionally, when the current voltage drop exceeds the first threshold and is smaller than the second threshold, a first power grid corresponding to the first power grid mode of I in the embodiment is selected, where the first power grid includes a positive power source and a negative power source of 2×2. After analysis by the electronic design automation tool, when one or more components still exist in the target interface, selecting a second power grid corresponding to the second power grid mode in the embodiment II, where the second power grid includes 3*3 positive power and negative power, until no voltage drop exists in the final integrated circuit.

The above embodiments have clarified that the power grid pattern that one or more components need to be increased is determined according to the extent to which the voltage drop exceeds the first threshold after the nth cell density is less than the first preset value, however, a specific implementation method is also required that is clearly confirmed when the nth cell density is greater than the first preset value, where N is a positive integer.

Fig. 8 is a schematic diagram of expanding a first rectangular frame in a method for determining a power grid pattern according to an embodiment of the present application, as shown in fig. 8, specifically including the following:

in the case where the first cell density is greater than the first preset value, it is indicated that insufficient winding resources in one or more of the components may increase the power grid, and it is necessary to enlarge the first rectangular frame to reduce the second cell density of one or more of the components in a second rectangular frame, wherein the second rectangular frame is obtained by enlarging the area of the first rectangular frame by 10% in equal proportion. As shown in I in this embodiment, a second cell density of the one or more components in the second rectangular box is recalculated based on the second rectangular box and compared to the first preset value. If the second cell density is less than the first preset value, the position of one or more components in the second rectangular frame is adjusted by the electronic design automation tool so that there is sufficient space in one or more components to route the power grid and a determination is made as to the power grid pattern that needs to be increased in one or more components according to the embodiment shown in FIG. 7. If the second unit density is greater than the first preset value, the area of the first rectangular frame is enlarged by 20% in equal proportion to obtain a third rectangular frame, and the third unit density of one or more components in the third rectangular frame is recalculated according to the third rectangular frame until the third unit density is less than the first preset value, so that a power grid mode which needs to be increased in one or more components can be determined according to the embodiment shown in fig. 7, after the corresponding power grid is increased, the integrated circuit with the increased power grid mode is analyzed again through an electronic design automation tool until no voltage drop exists in the final integrated circuit.

Fig. 9 is a flowchart of a method for determining a power grid pattern according to an embodiment of the present application, as shown in fig. 9, specifically including the following:

in the case of a voltage drop in the integrated circuit, the voltage drop is analyzed by the electronic design automation tool S902.

Step S904, identifying a critical area with a first rectangular box based on the analysis result, which is equivalent to identifying one or more components in the integrated circuit having a voltage drop exceeding a first threshold with the first rectangular box.

Step S906, calculating a first unit density of the one or more components in the first rectangular frame, wherein the first unit density is a ratio of the one or more components in the first rectangular frame, and comparing the first unit density with a first preset value to determine whether there are enough winding resources in the one or more components to increase the power grid.

Step S908, in the case that the first unit density is greater than the first preset value, it means that there is not enough winding resource in one or more components to increase the power grid, at this time, the area of the first rectangular frame needs to be expanded by a second preset value in equal proportion to obtain a second rectangular frame, the electronic design automation tool adjusts the position of one or more components in the second rectangular frame, so that there is enough space in one or more components to enable the power grid to run, recalculate the second unit density of one or more components in the second rectangular frame, and compare the second unit density with the first preset value.

Step S910 determines that the one or more components require an increased power grid pattern based on the extent to which the voltage drop exceeds the first threshold in the event that the first/second density units are less than the preset value. The specific determination method is that when the voltage drop exceeds the first threshold and is smaller than the second threshold, a first power grid corresponding to the first power grid mode of I in the embodiment shown in fig. 5 is selected, where the first power grid includes a positive power supply and a negative power supply of 2×2. When the voltage drop exceeds the second threshold and is smaller than the third threshold, a second power grid corresponding to the second power grid mode of II in the embodiment shown in fig. 5 is selected, where the second power grid includes 3*3 positive power and negative power. When the voltage drop exceeds the third threshold and is smaller than the fourth threshold, a third power grid corresponding to the third power grid mode of III in the embodiment shown in fig. 5 is selected, where the third power grid includes 4*4 positive and negative power supplies. When the voltage drop exceeds the fourth threshold and is smaller than the fifth threshold, a fourth power grid corresponding to the fourth power grid mode of IV in the embodiment shown in fig. 5 is selected, where the fourth power grid includes 5*5 positive and negative power supplies. When the voltage drop exceeds an Nth threshold, selecting an Nth power grid corresponding to an Nth power grid mode, wherein the Nth power grid comprises a positive power supply and a negative power supply of (N+1) ×n+1, and N is a positive integer greater than four.

Step S912, analyzing, again by the electronic design automation tool, whether there is a voltage drop in the integrated circuit after the power grid has been increased.

If the voltage drop still exists in the integrated circuit after the power grid is added, determining the level of the currently selected power grid mode to replace the power grid mode with a level higher than the level of the currently selected power grid mode until the voltage drop problem is solved.

Step S916, if there is no voltage drop problem, the whole process is considered to be completed.

From the description of the above embodiments, it will be clear to a person skilled in the art that the method according to the above embodiments may be implemented by means of software plus the necessary general hardware platform, but of course also by means of hardware, but in many cases the former is a preferred embodiment. Based on such understanding, the technical solution of the present application may be embodied essentially or in a part contributing to the prior art in the form of a software product stored in a storage medium (e.g. ROM/RAM, magnetic disk, optical disk) comprising instructions for causing a terminal device (which may be a mobile phone, a computer, a server, or a network device, etc.) to perform the method according to the embodiments of the present application.

The embodiment also provides a device for determining a power grid mode, which is used for implementing the foregoing embodiments and preferred embodiments, and is not described in detail. As used below, the term "module" may be a combination of software and/or hardware that implements a predetermined function. While the system described in the following embodiments is preferably implemented in software, implementation in hardware, or a combination of software and hardware, is also possible and contemplated.

Fig. 10 is a block diagram of a power grid pattern determining apparatus according to an embodiment of the present application, as shown in fig. 10, the system includes:

A first calculation module 10 for calculating a first cell density of the one or more components within the first rectangular frame, wherein the first cell density is used to indicate a duty cycle of all components within the first rectangular frame;

a second calculation module 12, configured to enlarge the size of the first rectangular frame to obtain a second rectangular frame when the first unit density is greater than a first preset value, and recalculate a second unit density of the one or more components in the second rectangular frame;

A determining module 14 for determining a power grid pattern to be increased by the one or more components based on a degree to which the voltage drop exceeds the first threshold in the event that the second cell density is less than the first preset value.

In an embodiment of the application, a circuit of a first integrated circuit with voltage drop is analyzed through an electronic design automation tool to mirror display the first integrated circuit in a target interface, one or more components with voltage drop exceeding a first threshold value in the first integrated circuit, the position of the one or more components is marked through a first rectangular frame in the target interface, the first rectangular frame is used for covering the one or more components to the maximum extent, meanwhile, the rectangular frame is used for covering a non-component area to the minimum extent, the determining method comprises the steps of calculating first unit density of the one or more components in the first rectangular frame, wherein the first unit density is used for indicating the proportion of all components in the first rectangular frame, when the first unit density is larger than a first preset value, the size of the first rectangular frame is enlarged to obtain a second rectangular frame, the one or more components in the second rectangular frame are used for covering the non-component area to the minimum extent, and when the second unit density is larger than the first preset value, the voltage drop of the first unit density is increased according to the first unit density which is larger than the first preset value, and the power supply voltage drop is required to be increased according to the first power supply mode. By adopting the technical scheme, the problem that in the related art, the power grid mode which is added to one or more components can not be determined according to the voltage drop degree is solved.

In one exemplary embodiment, the determining module 14 is further configured to obtain a magnitude of the voltage drop, determine, by the electronic design automation tool, a first power grid pattern if the voltage drop exceeds the first threshold and the voltage drop is less than a second threshold, wherein the first power grid pattern comprises positive power sources arranged at a first density and negative power sources arranged at the first density, determine, by the electronic design automation tool, a second power grid pattern if the voltage drop exceeds the second threshold and the voltage drop is less than a third threshold, wherein the second power grid pattern comprises positive power sources arranged at a second density and negative power sources arranged at the second density, and determine, by the electronic design automation tool, a third power grid pattern if the voltage drop exceeds the third threshold but does not reach a fourth threshold, wherein the third power grid pattern comprises positive power sources arranged at a third density and negative power sources arranged at the third density, wherein the third density is greater than the second density and the third density is greater than the first density.

In an exemplary embodiment, the first calculating module 10 is further configured to obtain a total area of the one or more components and an area of the first rectangular frame, and determine the first unit density according to a ratio of the total area of the one or more components to the area of the first rectangular frame.

In an exemplary embodiment, the second calculating module 12 is further configured to obtain an area of the first rectangular frame, scale up the area of the first rectangular frame by a second preset value to obtain the second rectangular frame, and determine the second unit density according to the total area of the one or more components and the area of the second rectangular frame.

In an exemplary embodiment, the second calculating module 12 is further configured to determine a magnitude relation between the second cell density and the first preset value, obtain an area of the first rectangular frame when the second cell density is greater than the first preset value, expand the area of the first rectangular frame by a third preset value in equal proportion to obtain the third rectangular frame, and recalculate a third cell density of the one or more components in the third rectangular frame, where the third preset value is greater than a second preset value, the second preset value is a difference value between the second rectangular frame and the first rectangular frame, and determine a power grid mode that the one or more components need to be increased according to a degree that the voltage drop exceeds the first threshold when the third cell density is less than the first preset value.

In an exemplary embodiment, the determining module 14 is further configured to obtain a second integrated circuit after adding the power grid pattern, analyze the second integrated circuit by the electronic design automation tool and mirror display the second integrated circuit in the target interface, determine that no voltage drop exists in the second integrated circuit if the target interface does not display the one or more components, save the second integrated circuit and the power grid pattern, directly obtain the second integrated circuit and the power grid pattern if the same voltage drop occurs in the first integrated circuit, analyze the power grid pattern if the target interface continues to display the one or more components, determine a density of a positive power grid and a negative power grid arrangement in the power grid pattern based on the analysis result, increase a density of the positive power grid and the negative power grid arrangement to determine a new power grid pattern, automatically save a corresponding power supply of the new power grid pattern to the second integrated circuit if the same voltage drop occurs in the first integrated circuit, analyze the third integrated circuit if the target interface continues to display the target interface does not display the power grid pattern, analyze the power grid pattern if the third integrated circuit does not display the target interface, and store the third integrated circuit in the target interface, and directly acquiring the third integrated circuit and the new power grid pattern.

In an exemplary embodiment, the determining module 14 is further configured to integrate, by the electronic design automation tool, the power grid corresponding to the power grid pattern into a circuit in which a voltage drop occurs in the first integrated circuit.

It should be noted that each of the above modules may be implemented by software or hardware, and the latter may be implemented by, but not limited to, the above modules all being located in the same processor, or each of the above modules being located in different processors in any combination.

Embodiments of the present application also provide a computer readable storage medium having a computer program stored therein, wherein the computer program is arranged to perform the steps of any of the method embodiments described above when run.

Alternatively, in the present embodiment, the above-described storage medium may be configured to store program code for performing the steps of:

S1, calculating a first unit density of the one or more components in the first rectangular frame, wherein the first unit density is used for indicating the duty ratio of all components in the first rectangular frame;

S2, expanding the size of the first rectangular frame to obtain a second rectangular frame under the condition that the first unit density is larger than a first preset value, and recalculating the second unit density of the one or more components in the second rectangular frame;

And S3, determining a power grid mode which is required to be increased by the one or more components according to the degree that the voltage drop exceeds the first threshold value under the condition that the second unit density is smaller than the first preset value.

In an exemplary embodiment, the computer readable storage medium may include, but is not limited to, a U disk, a Read-Only Memory (ROM), a random access Memory (Random Access Memory, RAM), a removable hard disk, a magnetic disk, or an optical disk, etc. various media in which a computer program may be stored.

An embodiment of the application also provides an electronic device comprising a memory having stored therein a computer program and a processor arranged to run the computer program to perform the steps of any of the method embodiments described above.

Alternatively, in the present embodiment, the above-described processor may be configured to execute the following steps by a computer program:

Embodiments of the application also provide a computer program product comprising a computer program which, when executed by a processor, implements the steps of any of the method embodiments described above.

Alternatively, in the present embodiment, the above-described computer program may be configured to execute the following steps by the computer program:

Specific examples in this embodiment may refer to the examples described in the foregoing embodiments and the exemplary implementation, and this embodiment is not described herein.

It will be appreciated by those skilled in the art that the modules or steps of the application described above may be implemented in a general purpose computing device, they may be grouped together on a single computing device, or distributed across a network of computing devices, they may be implemented in program code executable by computing devices, such that they may be stored in storage devices for execution by computing devices, and in some cases, the steps shown or described may be performed in a different order than herein, or they may be individually fabricated as individual grouped together circuit modules, or a plurality of modules or steps in them may be fabricated as a single grouped together circuit module. Thus, the present application is not limited to any specific combination of hardware and software.

The above description is only of the preferred embodiments of the present application and is not intended to limit the present application, but various modifications and variations can be made to the present application by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the principle of the present application should be included in the protection scope of the present application.

Claims

1. A method of determining a grid pattern of a power supply, wherein circuitry of a first integrated circuit in which a voltage drop occurs is analyzed by an electronic design automation tool to mirror one or more components of the first integrated circuit in which the voltage drop exceeds a first threshold in a target interface, and wherein locations of the one or more components are identified at the target interface by a first rectangular box, wherein the first rectangular box is intended to cover the one or more components to a maximum extent while the rectangular box is intended to cover a non-component area to a minimum extent, the method comprising:

Calculating a first cell density of the one or more components within the first rectangular frame, wherein the first cell density is used to indicate a duty cycle of all components within the first rectangular frame;

Expanding the size of the first rectangular frame to obtain a second rectangular frame under the condition that the first unit density is larger than a first preset value, and recalculating a second unit density of the one or more components in the second rectangular frame;

in the event that the second cell density is less than the first preset value, determining that the one or more components require an increased power grid pattern based on the extent to which the voltage drop exceeds the first threshold.

2. The method of claim 1, wherein determining a power grid pattern to be increased at the one or more components based on the extent to which the voltage drop exceeds the first threshold comprises:

acquiring the voltage drop;

Determining, by the electronic design automation tool, a first power grid pattern if the voltage drop exceeds the first threshold and the voltage drop is less than a second threshold, wherein the first power grid pattern comprises positive power sources arranged at a first density and negative power sources arranged at the first density;

Determining, by the electronic design automation tool, a second power grid pattern if the voltage drop exceeds the second threshold and the voltage drop is less than a third threshold, wherein the second power grid pattern comprises positive power sources arranged at a second density and negative power sources arranged at the second density;

A third power grid pattern is determined by the electronic design automation tool if the voltage drop exceeds the third threshold but does not reach a fourth threshold, wherein the third power grid pattern includes positive power sources arranged at a third density and negative power sources arranged at the third density, wherein the third density is greater than the second density, and the second density is greater than the first density.

3. The method of claim 1, wherein calculating a first cell density of the one or more components within the first rectangular box comprises:

acquiring the total area of the one or more components and the area of the first rectangular frame;

The first cell density is determined from a ratio of a total area of the one or more components to an area of the first rectangular box.

4. The method of claim 1, wherein expanding the size of the first rectangular box to obtain a second rectangular box, recalculating a second cell density of the one or more components within the second rectangular box comprises:

acquiring the area of the first rectangular frame;

expanding the area of the first rectangular frame by a second preset value in equal proportion to obtain a second rectangular frame;

the second cell density is determined from the total area of the one or more components and the area of the second rectangular box.

5. The method of claim 1, wherein after recalculating the second cell density of the one or more components within the second rectangular box, the method further comprises:

determining the magnitude relation between the second unit density and the first preset value;

acquiring the area of the first rectangular frame under the condition that the second unit density is larger than the first preset value;

Expanding the area of the first rectangular frame by a third preset value in equal proportion to obtain a third rectangular frame, and recalculating the third unit density of the one or more components in the third rectangular frame, wherein the third preset value is larger than a second preset value, and the second preset value is the difference value between the second rectangular frame and the first rectangular frame;

In the event that the third cell density is less than the first preset value, determining that the one or more components require an increased power grid pattern based on the extent to which the voltage drop exceeds the first threshold.

6. The method of claim 1, wherein after determining that the one or more components require an increased power grid pattern based on the extent to which the voltage drop exceeds the first threshold, the method further comprises:

Acquiring a second integrated circuit added with the power grid mode;

Analyzing the second integrated circuit by the electronic design automation tool, and mirror-displaying the second integrated circuit in the target interface;

Determining that no voltage drop exists in the second integrated circuit under the condition that the target interface does not display the one or more components, storing the second integrated circuit and the power grid mode, and directly acquiring the second integrated circuit and the power grid mode under the condition that the same voltage drop occurs in the first integrated circuit;

analyzing the power grid pattern to obtain an analysis result of the power grid pattern under the condition that the target interface continues to display the one or more components, determining the density of positive power supply and negative power supply arrangements in the power grid pattern according to the analysis result, and increasing the density of the positive power supply and the negative power supply arrangements to determine a new power grid pattern;

integrating the power grid corresponding to the new power grid mode into the second integrated circuit to obtain a third integrated circuit;

analyzing the third integrated circuit by the electronic design automation tool, and mirror-displaying the third integrated circuit in the target interface;

And under the condition that the target interface does not display the one or more components, determining that no voltage drop exists in the third integrated circuit, storing the third integrated circuit and the new power grid mode, and under the condition that the voltage drop exists continuously in the integrated circuit with the added power grid mode, directly acquiring the third integrated circuit and the new power grid mode.

7. The method of claim 1, wherein after determining that the one or more components require an increased power grid pattern based on the extent to which the voltage drop exceeds the first threshold, the method further comprises:

And integrating the power grid corresponding to the power grid mode into a circuit with voltage drop in the first integrated circuit through the electronic design automation tool.

8. A power grid pattern determination apparatus, comprising:

A first calculation module for calculating a first cell density of one or more components within a first rectangular frame, wherein the first cell density is used to indicate a duty cycle of all components within the first rectangular frame;

A second calculation module, configured to enlarge a size of the first rectangular frame to obtain a second rectangular frame when the first unit density is greater than a first preset value, and recalculate a second unit density of the one or more components in the second rectangular frame;

a determining module for determining a power grid pattern to which the one or more components need to be added based on a degree to which the voltage drop exceeds a first threshold in the case where the second cell density is less than the first preset value.

9. A computer readable storage medium, characterized in that a computer program is stored in the computer readable storage medium, wherein the computer program, when being executed by a processor, implements the steps of the method according to any of the claims 1 to 7.

10. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the processor implements the steps of the method of any one of claims 1 to 7 when the computer program is executed.