CN119290936A - Backscatter detection device, imaging method, equipment and storage medium - Google Patents
Backscatter detection device, imaging method, equipment and storage medium Download PDFInfo
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Abstract
The embodiment of the application provides a back scattering detection device, an imaging method, imaging equipment and a storage medium. The method comprises the steps of adopting a cold cathode X-ray source to work in a pulse mode, modulating pulse rays into fan-shaped ray beams through a front collimator assembly, solving the contradiction between scanning speed and image quality, restraining the receiving range of a back scattering detector assembly to back scattering photons through a collimation channel formed by the back scattering collimator assembly, further enabling the back scattering detector assembly to receive target back scattering photons passing through the collimation channel, generating back scattering electric signals based on the target back scattering photons, transmitting the back scattering electric signals to a processor, and generating a back scattering image of an object to be detected based on the back scattering electric signals by the processor. The influence of shake or movement of the detection device on single-frame back scattering data is avoided, and instant scanning and high-quality dynamic imaging are realized.
Description
Technical Field
The present application relates to the field of X-ray detection technologies, and in particular, to a backscatter detection apparatus, an imaging method, an imaging apparatus, and a storage medium.
Background
The core of the back-scattering imaging technology, which is an advanced nondestructive testing technology, is to construct an internal structural image of an object by capturing and analyzing photons scattered from the inside of the object to be tested. This technology has demonstrated great potential for use in a variety of fields, such as materials science, security inspection, and the like. However, in practical applications, backscatter imaging techniques face a number of challenges.
Currently, a hot cathode X-ray source is often used as a radiation source for a backscatter detection device. The thermal cathode X-ray source is stable in beam current but consumes a large amount of power and has a time delay from turning on the device to outputting a stable beam current, which is disadvantageous for the need for on-the-fly scanning and dynamic imaging.
Disclosure of Invention
The embodiment of the application provides a back scattering detection device, an imaging method, equipment and a storage medium, which are used for solving the problem of how to realize high-efficiency instant scanning and dynamic imaging.
In a first aspect, an embodiment of the present application provides a backscatter detection device, including a cold cathode X-ray source assembly, a front collimator assembly, a backscatter detector assembly, a backscatter collimator assembly, and a processor;
The cold cathode X-ray source assembly is used for emitting pulse rays;
The front collimator assembly is used for modulating the pulse rays into fan-shaped ray beams, and the fan-shaped ray beams are used for scanning an object to be detected and generating back scattering photons corresponding to the object to be detected after being scattered by the object to be detected;
the back-scatter collimator assembly is configured to form a collimation channel to constrain a range of reception of the back-scattered photons by the back-scatter detector assembly;
The backscatter detector assembly is configured to receive target backscattered photons through the collimation channel and generate a backscatter electrical signal based on the target backscattered photons;
the processor is used for receiving the back-scattered electrical signals and generating back-scattered images of the detected object based on the back-scattered electrical signals.
In a second aspect, an embodiment of the present application provides a backscatter imaging method, applied to a processor in a backscatter detection device, where the backscatter detection device includes a cold cathode X-ray source assembly for emitting pulsed radiation, a front collimator assembly for modulating the pulsed radiation into a fan beam, a backscatter detector assembly, a backscatter collimator assembly, and the processor, and the method includes:
The method comprises the steps of acquiring a back-scattered electric signal of an object to be detected, wherein the back-scattered electric signal is acquired by a back-scattered detector assembly after back-scattered photons of the object to be detected are screened by a back-scattered collimator assembly, and the back-scattered photons are scattered by the object to be detected in the process of scanning the object to be detected by a fan-shaped ray beam;
generating a back-scattered image of the object to be inspected based on the back-scattered electrical signals;
Wherein the fan-shaped ray beam is obtained by modulating pulse rays emitted by the cold cathode X-ray source assembly by the front collimator assembly.
In a third aspect, an embodiment of the present application provides a processor, including a storage unit, a processing unit, and a communication unit;
the storage unit stores computer execution instructions;
The processing unit executes computer-executable instructions stored by the storage unit such that the processing unit performs the above second aspect and/or the various possible implementations of the second aspect.
In a fourth aspect, embodiments of the present application provide a computer-readable storage medium having stored therein computer-executable instructions which, when executed by a processor, are adapted to carry out the above second aspect and/or the various possible implementations of the second aspect.
In a fifth aspect, embodiments of the present application provide a computer program product comprising a computer program which, when executed by a processor, implements the above second aspect and/or the various possible implementations of the second aspect.
The back scattering detection device, the imaging method, the imaging equipment and the storage medium provided by the embodiment of the application adopt a cold cathode X-ray source to work in a pulse mode, pulse rays are modulated into fan-shaped ray beams through the front collimator assembly, the contradiction between scanning speed and image quality is solved, a collimation channel formed by the back scattering collimator assembly is used for restraining the receiving range of back scattering photons of the back scattering detector assembly, the back scattering detector assembly further receives target back scattering photons passing through the collimation channel, back scattering electric signals are generated based on the target back scattering photons and transmitted to the processor, and the processor generates back scattering images of the detected object based on the back scattering electric signals. The influence of shake or motion of a detection device on single-frame back scattering data is avoided, and instant scanning and high-quality dynamic imaging are realized.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the application and together with the description, serve to explain the principles of the application.
FIG. 1 is a schematic diagram of a back scattering detection device according to the present application;
FIG. 2 is a schematic flow chart of a back-scattering imaging method according to the present application;
FIG. 3 is a schematic diagram showing a back-scattering imaging method according to the second embodiment of the present application;
FIG. 4 is a flowchart of a back-scattering imaging method according to the present application;
FIG. 5 is a schematic diagram showing the influence of the posture change parameters on the visible light visual image;
FIG. 6 is a flow chart of a back-scattering imaging method according to the present application;
FIG. 7 is a flowchart of a back-scattering imaging method according to the present application;
FIG. 8 is a schematic diagram of a matrix grid of back-scattered images;
fig. 9 is a schematic structural diagram of a processor provided by the present application.
Specific embodiments of the present application have been shown by way of the above drawings and will be described in more detail below. The drawings and the written description are not intended to limit the scope of the inventive concepts in any way, but rather to illustrate the inventive concepts to those skilled in the art by reference to the specific embodiments.
Detailed Description
Reference will now be made in detail to exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numbers in different drawings refer to the same or similar elements, unless otherwise indicated. The implementations described in the following exemplary examples do not represent all implementations consistent with the application. Rather, they are merely examples of apparatus and methods consistent with aspects of the application as detailed in the accompanying claims.
First, the terms involved in the present application will be explained:
a back-scattering imaging technique refers to an imaging technique for acquiring the internal structure of an object to be inspected by detecting back-scattered photons from the object to be inspected and the spatial distribution thereof;
The hot cathode X-ray source is based on the thermionic emission principle. When a material having a high melting point and boiling point (such as tungsten) is used as the cathode, the cathode may be heated to a high temperature. With heating, the increased energy enables electrons to be released from the cathode (e.g., tungsten filament) by thermionic emission. These electrons are accelerated by the electric field to form a high-speed electron beam. Bremsstrahlung radiation occurs when an electron beam impinges on a metal target (e.g., a tungsten target), producing X-rays;
The cold cathode X-ray source adopts a carbon nanostructure electron source, and the electron beam is extracted by applying positive voltage. The electron beams are focused and then converged, and bombard the anode target surface at a high speed, so that X-rays are generated. Compared with the traditional hot cathode X-ray tube, the cold cathode ray does not need to be heated;
The core of the back-scattering imaging technology, which is an advanced nondestructive testing technology, is to construct an internal structural image of an object by capturing and analyzing photons scattered from the inside of the object to be tested. This technology has demonstrated great potential for use in a variety of fields, such as materials science, security inspection, and the like. However, in practical applications, particularly in the field of handheld devices, backscatter imaging techniques face a number of challenges.
The commonly adopted scanning mode of the back scattering imaging technology is flying spot scanning, namely, a ray bundle is modulated into a pen-shaped ray bundle by a collimator, an object to be detected is scanned point by point, and two-dimensional scanning is realized by matching with translational motion, so that a complete back scattering image is obtained. In practical operation, the switching speed of flying spot scanning and the speed of translational movement need to be coordinated with each other, otherwise, missing or repeated scanning points appear, imaging effect is affected, the effect is more prominent in handheld equipment which cannot guarantee stability, and compared with line scanning and surface scanning, the scanning speed and imaging efficiency of flying spot scanning are lower, and the time spent is longer.
Currently, the backscatter detection device mostly adopts a hot cathode X-ray source, and has the advantage of stable beam current. However, since electrons are generated by heating the cathode wire, a large power consumption is required, and it takes a while for the tungsten wire to be heated and to reach a stable temperature state, there is a time delay from the start-up of the device to the output of a stable beam current.
In view of the above problems, the present application provides a backscatter detection apparatus, an imaging method, an imaging apparatus, and a storage medium, which not only ensures the instant scanning of the detection apparatus, but also improves the quality of dynamic imaging. Specifically, in the back-scattering detection device, due to space and weight limitations, the power of the hot cathode X-ray source is small, only small current or voltage can be maintained in the detection work, when an object with large thickness or large density is detected, the image quality is reduced, an image reflecting the internal information of the object may not be obtained, if a high-quality image is obtained by reducing the scanning speed, the scanning time is increased, and in consideration of the fact that the handheld detection device is difficult to maintain a stable moving state for a long time in the detection process of handheld equipment of a worker, the image shake and other interference caused by the scanning time are considered, the high-quality image may still not be obtained, and similar to the handheld detection device, the mobile back-scattering imaging devices such as a mobile back-scattering scanning vehicle and a back-scattering scanning robot all have the problem of back-scattering image blurring caused by shake of the mobile device, such as shake of the worker, shake of the clamping device and the mobile device, shake of a moving plane of the equipment, and the like. In consideration of the problems, the inventor researches whether a fan-shaped ray beam and a linear array detector can be adopted to realize the imaging mode of line scanning so as to solve the contradiction between scanning speed and image quality, and adopts a cold cathode X-ray source to work in a pulse mode, so that the extremely short pulse duration can solve the problems of image blurring and distortion caused by various factors such as shaking in scanning, can realize instant scanning and can improve the quality of dynamic imaging, and can adopt a ray source with a larger tube voltage range so that a back scattering detection device is suitable for the requirements of different penetration capacities in various occasions.
The following describes the technical scheme of the present application and how the technical scheme of the present application solves the above technical problems in detail with specific embodiments. The following embodiments may be combined with each other, and the same or similar concepts or processes may not be described in detail in some embodiments. Embodiments of the present application will be described below with reference to the accompanying drawings.
FIG. 1 is a schematic diagram of a back-scatter detection apparatus according to the present application, as shown in FIG. 1, which includes a cold cathode X-ray source assembly-1, a front collimator assembly-2, a back-scatter detector assembly, a back-scatter collimator assembly, and a controller. The cold cathode X-ray source assembly-1 emits pulse rays, which can be of a single focus structure or a distributed multi-focus structure, the front collimator assembly-2 modulates and collimates the pulse rays into a fan-shaped ray beam and shields initial rays in other directions, the back scattering detector assembly comprises a linear array detector-3 and a linear array detector-4 which are respectively positioned at two sides of the fan-shaped ray beam and simultaneously receive back scattering photons from an object to be detected, and the back scattering collimator assembly comprises a back scattering collimator-5 and a back scattering collimator-6, and forms a plurality of collimation channels to restrict the receiving range of the back scattering detector to the back scattering photons, such as a side-plane diagram of the linear array detector-4 and the back scattering collimator-6 on the right side of fig. 1, the fan-shaped ray beam irradiates the object to be detected to generate the back scattering photons, and only the back scattering photons passing through the blank part channels of the back scattering collimator-6 strike the linear array detector-4 to be detected by the linear array detector-4. After the linear array detector-3 and the linear array detector-4 detect the back-scattered photons, the back-scattered photons can be converted into back-scattered electrical signals and then sent to the processor, the processor can generate back-scattered image data based on the received back-scattered electrical signals, and after the detected object is completely scanned, the processor splices and processes the back-scattered image data to obtain a back-scattered image corresponding to the detected object. The staff can realize the detection of the internal structure of the detected object and the hidden objects according to the information of the back scattering image.
Optionally, the back-scattering detection device may further include a visible light vision component-8, working synchronously with the X-ray imaging, that is, the visible light vision component scans the object to be detected simultaneously with the X-ray (herein, "simultaneously", may be understood that the visible light vision component also performs image acquisition on the object to be detected in the process of scanning and detecting the object to be detected by using the X-ray), for acquiring the posture change of the device relative to the object to be detected at each X-ray imaging moment, thereby assisting in completing registration of the X-ray imaging data at adjacent moments, and solving the problem of shake of the back-scattering image. It should be noted that, in order to ensure that the visible light vision module-8 and the cold cathode X-ray source module operate synchronously, the emission time of the pulse radiation should be less than or equal to the exposure time of the visible light vision module-8, so as to acquire the back-scattered image data and the visible light vision image at the same time.
Alternatively, the visible light vision module-8 may be disposed at any position where image acquisition of the object to be inspected is possible. For example, the visible light vision assembly-8 may be located within the detection channel and on the scanning surface of the radiation beam.
Correspondingly, after receiving the visible light visual image scanned by the visible light visual assembly-8, the processor determines the posture change parameter of the back scattering detection device relative to the detected object based on the preset reference visual image and the visible light visual image, and further corrects the back scattering image based on the posture change parameter to obtain a corrected back scattering image. The visible light image is utilized to realize jitter parameter analysis, and the back scattering image is subjected to jitter correction, so that the problem of image blurring caused by equipment jitter or motion is well solved.
Further alternatively, the visible light visual image and the back-scattered image involved in correction may be acquired at the same time to ensure the correction effect.
Optionally, the reference visual image may be a visual image of visible light acquired at any sampling time, or may be a first visual image of visible light acquired at the beginning of scanning, or may be a visual image of visible light acquired in advance before the beginning of scanning. The selection of the reference visual image is not particularly limited in the embodiment of the application.
In one possible implementation, the backscatter detection device further includes a pulsed high voltage power supply control assembly-9. The pulse high-voltage power supply control component-9 controls the generation and closing of the pulse high voltage applied by the grid electrode of the cold cathode, and can adjust the period and the duty ratio of the pulse high voltage according to the needs, thereby controlling the generation of the pulse X-ray beam.
The period of the pulse high voltage refers to the length of time required for the pulse signal to repeatedly appear from the beginning. In one period, the pulse signal undergoes a change from a low level to a high level and back to the low level. This periodic variation is one of the fundamental features of the pulse signal.
In the pulse high-voltage power supply control module-9, the period is adjustable as required. By adjusting the period, the frequency of emission of the pulsed X-ray beam, i.e. the number of emissions of the pulsed X-ray beam per unit time, can be controlled.
The duty cycle of the pulsed high voltage refers to the proportion of the high level signal that is present during one pulse period. Specifically, the ratio of the high level duration to the entire cycle time in the pulse signal. The duty cycle is typically expressed as a percentage and the calculation formula is duty cycle= (high level duration/cycle time) ×100%.
In the pulsed high voltage power supply control assembly-9, the duty cycle is also adjustable as desired. By adjusting the duty cycle, the duration of the pulsed X-ray beam, i.e. the length of time each pulsed X-ray beam is emitted, can be controlled.
For example, the cold cathode X-ray source assembly-1 is of a single focus structure, and pulse periods and duty ratios can be adjusted according to the requirements of detection scenes, moving speeds or imaging speeds by controlling and emitting pulse rays through the pulse high voltage power supply control assembly-9. When the moving speed is slower, a longer pulse period can be adopted to obtain better image quality, when a thicker object needs to be detected, the duty ratio can be increased to obtain more initial X photons and better image quality, and when a thinner object is detected, the duty ratio can be reduced to reduce the image blurring problem caused by factors such as hand shake and movement.
It should be noted that, in one pulse period, an X-ray beam is emitted once, and a series of back-scattered image data is obtained. In this case, the duration of the pulsed radiation emitted by the radiation source in a single pulse period is very short, the pulse radiation duration being determined by the duty cycle. Since the duration of the pulsed radiation is extremely short, it is considered that the detection device is relatively stationary in an extremely short time, that is, the backscattered image data obtained in each sampling time is not disturbed by factors such as personnel shake or movement of the detection device, and there is no problem of image blurring caused thereby.
In another possible implementation, the backscatter detection device may also include a low energy filter assembly-7. The low energy filter assembly-7 absorbs the lower energy X-photons in the fan beam, thereby reducing the specific gravity of the components of the X-ray beam that contribute less to the backscatter imaging, and reducing the radiation dose to the scan area. Wherein the assembly is a replaceable assembly for easy removal and replacement at different source operating voltages.
Alternatively, the filter-enabling assembly-7 may be disposed at the rear side of the front collimator assembly-2, at any position parallel to the front collimator assembly-2
It should be noted that the direction in which the backscatter detecting device scans the object to be inspected is a direction perpendicular to the plane in which the fan-shaped ray beam is located.
Fig. 2 is a schematic flow chart of a backscatter imaging method according to the present application, as shown in fig. 2, where the method is applied to a processor of a backscatter detection device, and the backscatter detection device includes a cold cathode X-ray source assembly for emitting pulsed radiation, a pre-collimator assembly for modulating the pulsed radiation into a fan-shaped beam, a backscatter detector assembly, a backscatter collimator assembly, and a processor. The method specifically comprises the following steps:
S201, acquiring a back-scattered electrical signal of the detected object.
S202, generating a back scattering image of the detected object based on the back scattering electric signal.
The back scattering electric signal is obtained by screening back scattering photons of the detected object through a back scattering collimator assembly, and the back scattering photons are scattered by the detected object in the scanning process of the fan-shaped ray beam on the detected object.
After the object to be detected is scattered, the formed scattered photons can reach the back scattering detector assembly through a collimation channel formed by the back scattering collimator assembly, and then the back scattering detector assembly converts the scattered photons into back scattering electric signals to be transmitted to the processor.
After receiving the back-scattered electrical signals, the processor converts all the back-scattered electrical signals into back-scattered image data, and the back-scattered image data are spliced.
The specific implementation manner of each component of the backscatter detection device in the embodiment of the present application is the same as that of each component in the foregoing embodiment, and will not be described herein.
It should be noted that the collimation channel is a key component in the back-scattering collimator assembly-5 and the back-scattering collimator assembly-6, and is responsible for spatially confining and guiding the back-scattered photons from the object to be detected. Only target backscattered photons of a specific direction and energy can be received by the linear array detector-3 and the linear array detector-4 through the collimation channel, which helps to reduce background noise and interference and improve imaging quality.
The backscatter detector assemblies receive the backscattered photons and convert them into electrical signals. The converted electrical signal is usually very weak and thus requires amplification. Optionally, the amplified electric signal also needs to undergo processing steps such as filtering, digitizing and the like to remove noise and interference, thereby improving the signal-to-noise ratio and reliability of the signal.
The processor integrates the electrical signals into digital image data to obtain a back-scattered image of the inspected object, which contains information such as the internal structure of the inspected object.
The back scattering imaging method provided by the embodiment of the application acquires the back scattering electric signal of the detected object, wherein the back scattering electric signal is obtained by the back scattering photon of the detected object after being screened by the back scattering collimator assembly, the back scattering photon is formed by scattering the detected object in the scanning process of the detected object by the fan-shaped ray bundle, and the back scattering image of the detected object is generated based on the back scattering electric signal, wherein the fan-shaped ray bundle is obtained by modulating the pulse rays emitted by the cold cathode X-ray source assembly by the front collimator assembly. The method adopts a cold cathode X-ray source component to emit pulse rays, modulates, filters and collimates the rays through a series of components, and finally generates a back scattering image of the detected object. The method has the advantages of realizing higher image acquisition efficiency, solving the problem that the scanning speed in the back scattering detection device is inconsistent with the image quality, avoiding the influence of shake or movement of the detection device on single-frame back scattering data, and realizing instant scanning and high-quality dynamic imaging.
Fig. 3 is a second schematic flow chart of the back-scattering imaging method provided by the present application, as shown in fig. 3, on the basis of the foregoing embodiment, the back-scattering detection apparatus further includes a visible light vision component, and the method further includes:
S301, obtaining a visible light visual image of the detected object.
S302, determining the posture change parameters of the detected object based on a preset reference visual image and a preset visible light visual image. In this step, after receiving the visible light visual image scanned by the visible light visual component-8, the processor may determine, based on the visible light visual image, a posture change parameter of the backscatter detection device with respect to the object to be detected in order to avoid occurrence of image distortion.
Specifically, for visible light visual image data at each moment in a visible light visual image, image registration is performed on the visible light visual image data based on a reference visual image to obtain registration parameters corresponding to the visible light visual image data, and the registration parameters corresponding to the visible light visual image data are converted according to preset structural parameters corresponding to a back scattering detection device to obtain posture change parameters of the back scattering image data corresponding to the moment in which the visible light visual image data is located.
And S303, correcting the back scattering image based on the posture change parameters to obtain a corrected back scattering image.
In this step, after the posture change parameters of the backscatter image data corresponding to each time are obtained, the processor stores the posture change parameters, and after the scanning of the object to be detected is completed, the processor corrects the backscatter image data at each time in the backscatter image based on the posture change parameters at each time, thereby obtaining a corrected backscatter image.
Specifically, for each moment, the processor corrects the corresponding back-scattered image data based on the posture change parameter corresponding to the moment until the back-scattered image data of each moment in the back-scattered image is corrected, and a corrected back-scattered image is obtained.
Optionally, the reference visual image may be a visual image of visible light adopted at any sampling time, or may be a first visual image of visible light acquired at the beginning of scanning, or may be a visual image of visible light acquired in advance before the beginning of scanning. The selection of the reference visual image is not particularly limited in the embodiment of the application.
According to the back scattering imaging method provided by the embodiment of the application, the visible light visual image of the detected object is obtained, the posture change parameter is determined based on the preset reference visual image and the visible light visual image, and the back scattering image is corrected based on the posture change parameter, so that the corrected back scattering image is obtained. The back scattering imaging system is combined with the visible light vision system, the visible light image is utilized to realize jitter parameter analysis, and the back scattering image is subjected to jitter correction, so that the problem of image blurring caused by jitter or movement of the detection device is well solved.
Fig. 4 is a flow chart III of the back-scattering imaging method provided by the present application, as shown in fig. 4, based on the foregoing embodiment, step S303 specifically includes:
S401, aiming at visible light visual image data of each moment in the visible light visual image, performing image registration on the visible light visual image data based on the reference visual image to obtain registration parameters corresponding to the visible light visual image data.
In this step, in order to solve the problems of image distortion and blurring caused by factors such as shake or motion of the detection device, an image registration algorithm is used to analyze the visible light visual image data at each moment, so as to obtain registration parameters.
In particular, to improve image quality, noise and distortion are reduced, providing a high quality input for subsequent registration steps. The method can also be used for preprocessing the visible light visual image data at each moment, such as graying, converting the visible light visual image data into a gray image if the image is colorful, wherein the gray image is smaller in calculation amount during processing and does not affect the accuracy of registration, denoising, removing noise in the image by using a filter (such as a Gaussian filter, a median filter and the like), enhancing the contrast of the image by using a histogram equalization method, a contrast stretching method and the like, enabling the characteristics to be more obvious, and further extracting key points or characteristics for registration from the image data. For example, keypoint detection, the use of algorithms (e.g., SIFT, SURF, ORB, etc.) to detect keypoints in images, which are typically small-changing, easily-identifiable portions of the image. And generating a feature descriptor for each key point, wherein the descriptor is used for finding a match between the reference image and the image to be registered and finding a corresponding relation of the feature points between the reference image and the image to be registered. For example, violent matching, namely searching the nearest characteristic points in the reference image for the characteristic points in each image to be registered for matching, FLANN matching, namely using a quick nearest neighbor search library (FLANN) for matching, screening matching, namely removing wrong matching points by using a RANSAC algorithm or other methods, and only retaining reliable matching pairs. From the matched feature points, a transformation model, e.g., affine transformation, non-rigid transformation, etc., from the image to be registered to the reference image is estimated. The transformation model is applied to transform the image to be registered to a position aligned with the reference image. The value of each pixel in the transformed image is calculated using interpolation methods (e.g., bilinear interpolation, bicubic interpolation, etc.), and multiple images are combined into one, and image fusion techniques such as weighted averaging, multi-resolution fusion, etc. may be used. And outputting transformation parameters obtained in the registration process, namely registration parameters.
S402, according to preset structural parameters corresponding to the back scattering detection device, converting registration parameters corresponding to the visible light visual image data to obtain posture change parameters of the back scattering image data corresponding to the moment of the visible light visual image data.
In this step, after the registration parameters are obtained, for the detection device with a fixed structure, the posture change parameters of the visible light vision component-8 and the back scattering imaging system which are installed on the same device relative to the detected object can be obtained by converting the structural parameters.
In particular, the registration parameters of the visible light visual image data are analyzed, which generally describe the relative transformations between the images, such as:
translation vector-describing the movement of the image in x, y, z directions.
Rotation matrix, describing the rotation of the image around x, y, z axis.
And the registration parameters of the visible light visual image are converted into posture change parameters of the back scattering image data, so that coordinate transformation is needed. For example:
the coordinate system definition defines two coordinate systems, one being the coordinate system of the visible light vision component-8 and the other being the coordinate system of the backscatter detector component.
Coordinate transformation, namely transforming points in the visible light image into a coordinate system of the back scattering detector by utilizing structural parameters.
And calculating attitude parameters, namely calculating attitude change parameters of the back scattering image data according to the converted coordinates. This typically involves matrix operations on the transformed coordinates to obtain a rotation matrix and translation vector.
The method includes the steps of taking a large-view visible light visual image as a reference image before scanning starts, simultaneously obtaining a visible light visual image and a row of back scattering images in each subsequent sampling time, analyzing registration parameters of each visible light visual image and the reference image by adopting an image registration algorithm, and obtaining posture change parameters of a detection device, wherein the posture change parameters comprise translation and rotation angles along X, Y, Z axes, and fig. 5 is a schematic diagram of influence of the posture change parameters on the visible light visual image. The effect of each pose change on the back-scattered image data is shown in fig. 5, where only one column of back-scattered image data is acquired by the back-scattered detector per sample time. The posture change of the detection device can be converted into a coordinate system taking the single-column center to be detected as an origin and taking the plane to be detected as a y-z plane through the coordinate system, and the translation and the rotation of the detection device along the X, Y, Z axis can be expressed as a combination of the translation and the rotation of the detection device relative to the X, Y, Z axis of the single-column center to be detected.
According to the back scattering imaging method provided by the embodiment of the application, for the visible light visual image data at each moment in the visible light visual image, based on the reference visual image, the visible light visual image data is subjected to image registration to obtain the registration parameters corresponding to the visible light visual image data, and the registration parameters corresponding to the visible light visual image data are converted according to the preset structural parameters corresponding to the back scattering detection device to obtain the posture change parameters of the back scattering image data corresponding to the moment in which the visible light visual image data is located. According to the method, image registration is carried out on the image data of each moment in the visible light visual image, and the posture change parameters of the back scattering image data are obtained through conversion according to the image registration, so that the image registration precision, the posture change parameter acquisition accuracy, the image correction effect, the detection efficiency, the automation degree, the adaptability and the flexibility and the system robustness can be remarkably improved.
Fig. 6 is a flow chart of a back-scattering imaging method provided by the present application, as shown in fig. 6, on the basis of the foregoing embodiment, step S303 specifically includes:
and S601, correcting the corresponding back scattering image data of the time based on the posture change parameters corresponding to the time for each time.
S602, correcting the back-scattered image data until each moment in the back-scattered image, and obtaining a corrected back-scattered image.
After the object to be detected is scanned, correcting each back scattering image data in the back scattering image according to the posture change parameters corresponding to each moment until the whole back scattering image is corrected, and further obtaining a corrected back scattering image.
According to the back-scattering imaging method provided by the embodiment of the application, for each moment, the corresponding back-scattering image data is corrected based on the posture change parameters corresponding to the moment until the back-scattering image data of each moment in the back-scattering image is corrected, and a corrected back-scattering image is obtained. By correcting the back scattering image data according to the posture change parameters at each moment, the image quality and accuracy, the detection precision and reliability, the detection efficiency and automation degree, the adaptability and flexibility and the system robustness can be obviously improved, so that the problems of image distortion and blurring caused by factors such as shake or motion of a detection device are solved.
Fig. 7 is a flowchart fifth of the back-scattering imaging method provided by the present application, as shown in fig. 7, on the basis of the foregoing embodiment, step S601 specifically includes:
and S701, correcting the corresponding backscattering image data according to the displacement change of at least one coordinate axis indicated by the displacement change parameter by a displacement correction formula corresponding to at least one coordinate axis aiming at each moment when the corresponding posture change parameter comprises the displacement change parameter.
And/or the number of the groups of groups,
And S702, correcting the corresponding backscattering image data according to the rotation change of at least one coordinate axis indicated by the angle change parameter through a rotation correction formula corresponding to the at least one coordinate axis when the corresponding posture change parameter at the moment comprises the angle change parameter.
The posture change parameter may include a displacement change parameter, an angle change parameter, or both, and the back-scattered image data is corrected based on the posture change parameter type.
The method includes the steps of correcting time-corresponding back-scattered image data based on a preset X-axis correction formula if a displacement change parameter indicates X-axis displacement change, correcting time-corresponding back-scattered image data based on a preset Y-axis correction formula if a displacement change parameter indicates Y-axis displacement change, and correcting time-corresponding back-scattered image data based on a preset Z-axis correction formula if a displacement change parameter indicates Z-axis displacement change.
According to the foregoing embodiment, the displacement variation parameter may include any one or more of XYZ displacement variation parameters, and then the displacement variation parameter of each axis is checked, so as to correct the back-scattered image data according to a corresponding correction formula.
Illustratively, the detection device translates along the X-axis relative to the origin such that the pose causes a scaling of the backscatter imaging field of view with the center of the backscatter imaging field of view unchanged. Image scaling factor caused by translation along X-axis through analysis of visible light visual imagesThe actual imaging field of view of each backscatter detectorBecome an ideal imaging field of viewA kind of electronic deviceDoubling, namely:
The imaging field of view is unchanged; the imaging field of view is enlarged; the imaging field of view is reduced. For the ith pixel, its coordinates in the original image are
The coordinates mapped into the actual imaging are:
The corresponding pixel values are:
The detection device translates along the Y axis relative to the origin, and the posture can cause the translation along the Y axis of the back scattering imaging center, so that the range of the back scattering imaging visual field is unchanged. Obtaining distance translated along Y-axis by analysis of visible light visual images Coordinates in the original imageThe coordinates mapped into the actual image are:
The corresponding pixel values are:
the detection device translates along the Z axis relative to the origin, and the posture can cause the translation along the Z axis of the back scattering imaging center, so that the range of the back scattering imaging visual field is unchanged. Obtaining distance translated along Z-axis by analysis of visible light visual images Coordinates in the original imageThe coordinates mapped into the actual image are:
The corresponding pixel values are:
The method comprises the steps of correcting back-scattered image data corresponding to time based on a preset X-axis rotation correction formula if an angle change parameter indicates X-axis rotation change, correcting the back-scattered image data corresponding to time based on a preset Y-axis rotation correction formula if the angle change parameter indicates Y-axis rotation change, and correcting the back-scattered image data corresponding to time based on a preset Z-axis rotation correction formula if the angle change parameter indicates Z-axis rotation change.
According to the foregoing embodiment, it is known that the angle change parameter may include any one or more of XYZ angle change parameters, and then the angle change parameter of each axis is checked, so as to correct the back-scattered image data according to the corresponding correction formula.
Illustratively, the detection device rotates about the X-axis relative to the origin such that the pose causes rotation of the backscatter imaging field of view, the center of the backscatter imaging field of view being unchanged. Acquisition of the angle of rotation along the X-axis by analysis of visible light visual imagesThe actual imaging field of view of each backscatter detector is unchanged, butThe change occurs:
Coordinates in the original image The coordinates mapped into the actual image are:
The corresponding pixel values are:
The detection device rotates along the Y axis relative to the origin, and the gesture can cause the enlargement of the back scattering imaging visual field, and the center of the back scattering imaging visual field is unchanged. Acquisition of rotation angle along Y-axis by analysis of visible light visual image The resulting back-scattered imaging field of view is then magnified by a factor ofThe back scattering imaging data can be corrected by adopting an interpolation algorithm, and the algorithm and the detection device are translated along the X axis along the same direction relative to the origin;
The corresponding pixel value is
The detection device rotates along the Z axis relative to the origin, and the gesture causes a scaling of the backscatter imaging field of view, the center of which translates along the Y axis.
The corresponding pixel values are:
According to the back scattering imaging method provided by the embodiment of the application, aiming at each moment, the posture change parameters corresponding to the moment comprise displacement change parameters, the corresponding back scattering image data is corrected according to the displacement change of at least one coordinate axis indicated by the displacement change parameters through a displacement correction formula corresponding to the at least one coordinate axis, and/or the posture change parameters corresponding to the moment comprise angle change parameters, and the corresponding back scattering image data is corrected according to the rotation change of the at least one coordinate axis indicated by the angle change parameters through a rotation correction formula corresponding to the at least one coordinate axis. According to the method, the attitude change parameters at each moment are comprehensively considered, and the back scattering image data is corrected frame by frame according to the attitude change parameters, so that the image quality and accuracy, the detection accuracy and reliability, the detection efficiency and user experience, and the adaptability and robustness of the system can be remarkably improved, and the problems of image distortion and blurring caused by the shake or movement of a detection device and the like are solved.
Illustratively, fig. 8 is a schematic diagram of a back-scattered image matrix grid, as shown in fig. 8, with an uncorrected back-scattered image matrix grid on the left and a back-scattered image matrix grid corrected based on any of the correction methods in the various embodiments described above on the right. Based on the corrected back-scattered image matrix grid, the final corrected back-scattered image is obtained by a mode which is not limited to two-dimensional interpolation.
Alternatively, the hot cathode X-ray source may be adapted for use in the method provided by any of the embodiments of the present application in solving or optimizing the problems of rising edge delays and the like.
Similar to hand-held equipment, the trackless mobile back-scattering imaging devices such as a mobile back-scattering scanning vehicle and a back-scattering scanning robot have the problem of back-scattering image blurring caused by shaking of the mobile device, such as shaking of a worker, shaking of the holding device and the mobile device, shaking of the imaging device caused by uneven moving plane of the equipment and the like, which are potential influencing factors, so that the protection scope of the application comprises, but is not limited to, the hand-held back-scattering detection device, and also can be the mobile back-scattering detection device, wherein the mobile back-scattering detection device can comprise the back-scattering scanning detection vehicle or the back-scattering detection robot and the like.
Fig. 9 is a schematic structural diagram of a processor provided by the present application. As shown in fig. 9, the processor 900 provided in this embodiment includes at least one processing unit 901 and a storage unit 902. Optionally, the processor 900 further comprises a communication component 903. The processing unit 901, the storage unit 902, and the communication unit 903 are connected via a bus 04.
In a specific implementation, at least one processing unit 901 executes computer-executable instructions stored by the storage unit 902, so that the at least one processing unit 901 performs the above-described method.
The specific implementation process of the processing unit 901 may refer to the above-mentioned method embodiment, and its implementation principle and technical effects are similar, and this embodiment will not be described herein.
In the above embodiment, it should be understood that the processing unit may be a central processing unit (english: central Processing Unit, abbreviated as CPU), and may also be other general purpose processors, digital signal processors (english: DIGITAL SIGNAL Processor, abbreviated as DSP), application specific integrated circuits (english: application SPECIFIC INTEGRATED Circuit, abbreviated as ASIC), and the like. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like. The steps of a method disclosed in connection with the present invention may be embodied directly in a hardware processor for execution, or in a combination of hardware and software modules in a processor for execution.
The Memory unit may include a high-speed Memory (Random Access Memory, RAM) and may also include a Non-volatile Memory (NVM), such as at least one disk Memory.
The bus may be an industry standard architecture (Industry Standard Architecture, ISA) bus, an external device interconnect (PERIPHERAL COMPONENT, PCI) bus, or an extended industry standard architecture (Extended Industry Standard Architecture, EISA) bus, among others. The buses may be divided into address buses, data buses, control buses, etc. For ease of illustration, the buses in the drawings of the present application are not limited to only one bus or to one type of bus.
The application also provides a computer program product comprising a computer program which, when executed by a processor, implements the method described above.
The application also provides a computer readable storage medium, wherein computer executable instructions are stored in the computer readable storage medium, and when the processing unit executes the computer executable instructions, the method is realized.
The above-described readable storage medium may be implemented by any type or combination of volatile or non-volatile memory devices, such as Static Random Access Memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic or optical disk. A readable storage medium can be any available medium that can be accessed by a general purpose or special purpose computer.
An exemplary readable storage medium is coupled to the processor such the processor can read information from, and write information to, the readable storage medium. In the alternative, the readable storage medium may be integral to the processor. The processor and the readable storage medium may reside in an Application SPECIFIC INTEGRATED Circuits (ASIC). The processor and the readable storage medium may reside as discrete components in a device.
The division of units is merely a logical function division, and there may be another division manner in actual implementation, for example, a plurality of units or components may be combined or may be integrated into another system, or some features may be omitted or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed with each other may be an indirect coupling or communication connection via some interfaces, devices or units, which may be in electrical, mechanical or other form.
The units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place, or may be distributed over a plurality of network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
In addition, each functional unit in the embodiments of the present invention may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit.
The functions, if implemented in the form of software functional units and sold or used as a stand-alone product, may be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention may be embodied essentially or in a part contributing to the prior art or in a part of the technical solution in the form of a software product stored in a storage medium, comprising several instructions for causing a computer device (which may be a personal computer, a server, a network device, etc.) to perform all or part of the steps of the method of the embodiments of the present invention. The storage medium includes a U disk, a removable hard disk, a Read-Only Memory (ROM), a random access Memory (RAM, random Access Memory), a magnetic disk, an optical disk, or other various media capable of storing program codes.
Those of ordinary skill in the art will appreciate that all or a portion of the steps of implementing the various method embodiments described above may be implemented by hardware associated with program instructions. The foregoing program may be stored in a computer readable storage medium. The program, when executed, performs the steps comprising the method embodiments described above, and the storage medium described above includes various media capable of storing program code, such as ROM, RAM, magnetic or optical disk.
Finally, it should be noted that other embodiments of the invention will be apparent to those skilled in the art from consideration of the specification and practice of the invention disclosed herein. This invention is intended to cover any adaptations, uses, or adaptations of the invention following, in general, the principles of the invention and including such departures from the present disclosure as come within known or customary practice within the art to which the invention pertains and as may be applied to the precise construction hereinbefore set forth and shown in the drawings and as follows in the scope of the appended claims. The scope of the invention is limited only by the appended claims.
Claims (16)
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