CN119124400A - Temperature detection circuit, temperature detection method, chip and battery manufacturing equipment - Google Patents
Temperature detection circuit, temperature detection method, chip and battery manufacturing equipment Download PDFInfo
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- CN119124400A CN119124400A CN202411230592.6A CN202411230592A CN119124400A CN 119124400 A CN119124400 A CN 119124400A CN 202411230592 A CN202411230592 A CN 202411230592A CN 119124400 A CN119124400 A CN 119124400A
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
- H01M10/00—Secondary cells; Manufacture thereof
- H01M10/42—Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
- H01M10/4285—Testing apparatus
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K13/00—Thermometers specially adapted for specific purposes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
- G01K15/005—Calibration
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/385—Arrangements for measuring battery or accumulator variables
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Abstract
本申请实施例提供一种温度检测电路、温度检测方法、芯片以及电池制造设备，温度检测电路包括：连接模拟开关阵列的校准电阻阵列，用于基于模拟开关阵列中与校准电阻中一校准电阻对应的模拟开关的闭合，将该校准电阻连通至电路；连接模拟开关阵列的温度传感器阵列，用于基于模拟开关阵列中与温度传感器阵列中一温度传感器对应的模拟开关的闭合，将温度检测通道对应的温度传感器连通至电路；连接模拟开关阵列的信号采集控制器，用于控制模拟开关阵列中对应模拟开关的闭合；基于对应校准电阻的校准电压，确定温度监测通道的温度检测系数；基于对应温度传感器的检测电压，确定该温度传感器所在温度检测通道中的待测对象的温度值。
The embodiments of the present application provide a temperature detection circuit, a temperature detection method, a chip and a battery manufacturing device. The temperature detection circuit includes: a calibration resistor array connected to an analog switch array, which is used to connect the calibration resistor to the circuit based on the closing of an analog switch corresponding to a calibration resistor in the analog switch array; a temperature sensor array connected to the analog switch array, which is used to connect the temperature sensor corresponding to the temperature detection channel to the circuit based on the closing of an analog switch corresponding to a temperature sensor in the temperature sensor array in the analog switch array; a signal acquisition controller connected to the analog switch array, which is used to control the closing of the corresponding analog switch in the analog switch array; determining the temperature detection coefficient of the temperature monitoring channel based on the calibration voltage of the corresponding calibration resistor; and determining the temperature value of the object to be measured in the temperature detection channel where the temperature sensor is located based on the detection voltage of the corresponding temperature sensor.
Description
Technical Field
The embodiment of the application relates to the technical field of power electronics, in particular to a temperature detection circuit, a temperature detection method, a chip and battery manufacturing equipment.
Background
In the process of charging and discharging the battery, the battery manufacturing equipment needs to monitor the temperature of the surface of the battery to be detected in time through the temperature detection circuit, and if the detected temperature reaches the set safety protection triggering condition, fire protection measures can be started in time, so that possible production safety accidents are avoided.
However, the temperature detection circuit in the existing battery manufacturing equipment does not support automatic calibration of the temperature detection coefficient, and as the power density requirement of the equipment increases, the number of detection channels of the temperature detection circuit gradually increases, so that the calibration efficiency of the temperature detection circuit decreases, and the temperature detection accuracy of the temperature detection circuit decreases.
Under the background, providing a temperature detection circuit to improve the calibration efficiency and the detection accuracy of the temperature becomes a technical problem to be solved by those skilled in the art.
Disclosure of Invention
In view of the above, the embodiments of the present application provide a temperature detection circuit, a temperature detection method, a chip and a battery manufacturing apparatus, so as to improve the calibration efficiency of the temperature detection circuit and the detection accuracy of the temperature.
In order to solve the problems, the embodiment of the application provides a temperature detection circuit, which comprises an analog switch array, a calibration resistor array, a temperature sensor array and a signal acquisition controller, wherein the analog switch array is connected with the calibration resistor array;
the calibration resistor array is connected with the analog switch array and is used for communicating the calibration resistor to a circuit based on the closing of an analog switch corresponding to one of the calibration resistors in the analog switch array so as to determine the temperature detection coefficient of the temperature detection channel, wherein the temperature detection coefficient indicates the change rate of the physical attribute of the temperature detection channel along with the change of temperature;
The temperature sensor array is connected with the analog switch array and is used for communicating the temperature sensor corresponding to the temperature detection channel into a circuit based on the closing of an analog switch corresponding to one temperature sensor in the temperature sensor array in the analog switch array so as to determine the temperature value of an object to be detected in the temperature detection channel;
The signal acquisition controller is connected with the analog switch array and used for controlling the closing of a corresponding analog switch in the analog switch array, determining a temperature detection coefficient of the temperature monitoring channel based on the calibration voltage of a corresponding calibration resistor in the calibration resistor array, and determining a temperature value of an object to be detected in the temperature detection channel where the temperature sensor is located based on the detection voltage of the corresponding temperature sensor in the temperature sensor array.
Optionally, the temperature detection circuit further comprises an operational amplifier;
The operational amplifier is connected with the analog switch array and is used for acquiring the calibration voltage of the corresponding calibration resistor in the calibration resistor array and converting the calibration voltage into a calibration voltage digital signal, and acquiring the detection voltage of the corresponding temperature sensor in the temperature sensor array and converting the detection voltage into a detection voltage digital signal;
the operational amplifier is connected with the signal acquisition controller and is used for sending the calibration voltage digital signal and the detection voltage digital signal to the signal acquisition controller so that the signal acquisition controller can determine the temperature detection coefficient of the temperature monitoring channel based on the calibration voltage of the corresponding calibration resistor in the calibration resistor array, and determine the temperature value of an object to be detected in the temperature detection channel where the temperature sensor is located based on the detection voltage of the corresponding temperature sensor in the temperature sensor array.
Optionally, the temperature detection circuit further comprises a constant current source device;
The constant current source device is connected with the analog switch array and is used for communicating the constant current source device into a circuit based on the closing of a corresponding analog switch in the analog switch array so as to provide constant current for the circuit.
Optionally, the analog switch array includes a first analog switch array, a second analog switch array, and a third analog switch array;
The constant current source device is connected with the analog switch array, specifically, the constant current source device is connected with the first analog switch array;
The calibration resistor array is connected with the analog switch array, specifically, the calibration resistor array is connected with the second analog switch array;
The temperature sensor array is connected with the analog switch array, specifically, the temperature sensor array is connected with the third analog switch array;
the operational amplifier is connected with the analog switch array, specifically, the operational amplifier is connected with the second analog switch array and the third analog switch array.
Optionally, a calibration resistor in the calibration resistor array includes a calibration pin, where the calibration pin is connected to a corresponding second analog switch in the second analog switch array, and the calibration pin is connected to a first node of a connection line of the second analog switch, and is connected to a corresponding first analog switch in the first analog switch array.
Optionally, a temperature sensor in the temperature sensor array includes a first pin and a second pin, the first pin is connected to a corresponding third first analog switch in the third analog switch array, the second pin is connected to a corresponding third second analog switch in the third analog switch array, and the first pin is connected to a second node of a connecting line of the third first analog switch, and is connected to a corresponding first analog switch in the first analog switch array.
Optionally, if a second analog switch of the second switch analog array corresponding to the calibration resistor is closed, a third analog switch of the third switch analog array corresponding to a temperature sensor for detecting an object to be detected in the temperature monitoring channel corresponding to the calibration resistor is opened, or
And if a third analog switch corresponding to the temperature sensor in the third switch analog array is closed, a second analog switch corresponding to the calibration resistor corresponding to the temperature monitoring channel corresponding to the temperature sensor in the second switch analog array is opened.
The embodiment of the application provides a temperature detection method which is applied to a temperature detection circuit, and comprises the following steps:
Acquiring a calibration voltage of a calibration resistor corresponding to a temperature detection channel, and determining a temperature detection coefficient of the temperature detection channel according to the calibration voltage;
And acquiring the detection voltage of the temperature sensor corresponding to the temperature detection channel, and determining the temperature value of the object to be detected in the temperature detection channel where the temperature sensor is positioned based on the temperature detection coefficient.
The embodiment of the application also provides a chip which comprises the temperature detection circuit.
The embodiment of the application also provides battery manufacturing equipment which comprises the chip.
Compared with the prior art, the technical scheme of the embodiment of the application has the following advantages:
The temperature detection circuit, the temperature detection method, the chip and the battery manufacturing equipment provided by the embodiment of the application comprise an analog switch array, a calibration resistor array, a temperature sensor array and a signal acquisition controller, wherein the calibration resistor array is connected with the analog switch array and used for connecting the calibration resistor to the circuit based on the closing of the analog switch corresponding to one calibration resistor in the analog switch array so as to determine the temperature detection coefficient of a temperature detection channel, the temperature detection coefficient indicates the change rate of the physical attribute of the temperature detection channel along with the change of the temperature, the temperature detection channel corresponds to the calibration resistor, the temperature sensor array is connected with the analog switch array and used for connecting the temperature sensor corresponding to the temperature sensor in the temperature detection channel to the circuit based on the closing of the analog switch corresponding to the temperature sensor in the analog switch array, the signal acquisition controller is connected with the analog switch to determine the temperature value of an object to be detected in the temperature detection channel, the signal acquisition controller is connected with the analog switch to control the analog switch so as to determine the temperature value of the object to be detected in the temperature detection channel, and the temperature acquisition controller is connected with the analog switch to the circuit based on the closing of the analog switch corresponding to the temperature sensor in the calibration resistor array, and the temperature sensor corresponding to the temperature sensor in the calibration resistor array based on the temperature value corresponding to the temperature sensor in the calibration resistor array.
Therefore, the embodiment of the application can determine the temperature detection coefficient of the corresponding temperature detection channel based on the corresponding connection of the analog switch array and the calibration resistor array, thereby realizing the automatic calibration of the temperature detection channel, improving the calibration efficiency of the temperature detection circuit, further determining the temperature value of the object to be detected by the temperature sensor corresponding to the calibrated temperature detection channel based on the connection of the temperature sensor array and the analog switch array, and realizing the improvement of the detection accuracy of the temperature.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings that are required to be used in the embodiments or the description of the prior art will be briefly described below, and it is obvious that the drawings in the following description are only embodiments of the present application, and that other drawings can be obtained according to the provided drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic diagram of a temperature detection circuit according to an embodiment of the present application;
FIG. 2 is a schematic flow chart of a temperature detection method according to an embodiment of the present application;
Fig. 3 is a schematic diagram of a current transmission path corresponding to a connection line of a temperature sensor according to an embodiment of the present application.
Detailed Description
The following description of the embodiments of the present application will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present application, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.
As described in the background art, the temperature detection circuit in the existing battery manufacturing apparatus does not support automatic calibration of the temperature detection coefficient, and with the increase of the power density requirement of the apparatus, the number of detection channels of the temperature detection circuit increases gradually, so that the calibration efficiency of the temperature detection circuit decreases, and the temperature detection accuracy of the temperature detection circuit decreases.
In view of the above, the embodiment of the application provides an improved temperature detection circuit scheme, based on the corresponding connection between the analog switch array and the calibration resistor array, the temperature detection coefficient of the corresponding temperature detection channel can be determined, so as to realize automatic calibration of the temperature detection channel, improve the calibration efficiency of the temperature detection circuit, further, based on the connection between the temperature sensor array and the analog switch array, determine the temperature value of the object to be detected by the temperature sensor corresponding to the calibrated temperature detection channel, and realize improvement of the detection accuracy of the temperature. .
Based on the foregoing ideas, fig. 1 schematically illustrates a structural schematic diagram of a temperature detection circuit provided in an embodiment of the present application. As shown in fig. 1, the temperature detection circuit includes an analog switch array (shown in the figure as a first analog switch array S1, a second analog switch array S2, and a third analog switch array S3), a calibration resistor array (RS 1, RS2, RSn), a temperature sensor array (RTD 1, RTD2, and RTDn), and a signal acquisition controller.
The calibration resistor array is connected with the analog switch array and is used for communicating the calibration resistor to a circuit based on the closing of an analog switch corresponding to one of the calibration resistors in the analog switch array so as to determine the temperature detection coefficient of the temperature detection channel.
It can be understood that, based on the closing of the analog switch corresponding to one of the calibration resistors in the analog switch array, the calibration resistor is connected to the circuit, so that a corresponding calibration voltage can be generated based on the calibration resistor, and the temperature detection coefficient of the temperature detection channel can be determined based on the relation between the voltage value and the resistance value. Wherein the temperature detection channel may be corresponding to the calibration resistor, and the temperature detection coefficient may indicate a rate of change of a physical property of the temperature detection channel with temperature change.
It should be noted that, in the embodiment of the present application, the analog switch array may correspond to the temperature detection channel, for example, the analog switch 1 corresponds to the temperature detection channel 1, the analog switch 2 corresponds to the temperature detection channel 2, so that when one calibration resistor in the calibration resistor array is connected to the circuit based on the closing of one analog switch in the analog switch array, the calibration resistor in the calibration resistor array may correspond to the temperature detection channel.
The temperature sensor array is connected with the analog switch array and is used for communicating the temperature sensor corresponding to the temperature detection channel into a circuit based on the closing of an analog switch corresponding to one temperature sensor in the temperature sensor array in the analog switch array, so that the temperature value of an object to be detected in the temperature detection channel can be determined.
The signal acquisition controller is connected with the analog switch array and used for controlling the closing of corresponding analog switches in the analog switch array. The signal acquisition controller may be a chip with an arithmetic capability, such as a CPU (central processing unit), so that the signal acquisition controller may determine a temperature detection coefficient of the temperature monitoring channel based on a calibration voltage of a corresponding calibration resistor in the calibration resistor array, and determine a temperature value of an object to be detected in the temperature detection channel where the temperature sensor is located based on a detection voltage of a corresponding temperature sensor in the temperature sensor array.
It should be noted that, in order to ensure that the calibration resistor in the calibration resistor array and the temperature sensor in the temperature sensor array are not damaged, one end of each device in the calibration resistor array and the temperature sensor array is grounded.
It can be seen that, according to the embodiment of the application, based on the corresponding connection between the analog switch array and the calibration resistor array, the temperature detection coefficient of the corresponding temperature detection channel can be determined, so that the automatic calibration of the temperature detection channel is realized, the calibration efficiency of the temperature detection circuit is improved, and further, based on the connection between the temperature sensor array and the analog switch array, the temperature value of the object to be detected by the temperature sensor corresponding to the calibrated temperature detection channel is determined, and the detection accuracy of the temperature is improved.
In some embodiments, to enable the signal acquisition controller to calculate the temperature detection coefficient and the temperature value, the temperature detection circuit of the embodiment of the present application may further include an operational amplifier. In a specific example, the operational amplifier circuit may be embodied as an AD converter, converting an analog signal into a digital signal.
The operational amplifier may be connected to the analog switch array, and configured to obtain a calibration voltage of a corresponding calibration resistor in the calibration resistor array, and convert the calibration voltage into a calibration voltage digital signal. And obtaining the detection voltage of the corresponding temperature sensor in the temperature sensor array, and converting the detection voltage into a detection voltage digital signal.
The operational amplifier can be connected with the signal acquisition controller and is used for sending the calibration voltage digital signal and the detection voltage digital signal to the signal acquisition controller so that the signal acquisition controller can determine the temperature detection coefficient of the temperature monitoring channel based on the calibration voltage of the corresponding calibration resistor in the calibration resistor array. And determining the temperature value of the object to be detected in the temperature detection channel where the temperature sensor is located based on the detection voltage of the corresponding temperature sensor in the temperature sensor array.
In some embodiments, the temperature detection circuit of the embodiments of the present application may further include a constant current source device. The constant current source device is connected with the analog switch array and is used for communicating the constant current source device into a circuit based on the closing of a corresponding analog switch in the analog switch array so as to provide constant current for the circuit.
In some embodiments, to achieve connection of different devices in a circuit, the analog switch array of an embodiment of the present application may include a first analog switch array S1, a second analog switch array S2, and a third analog switch array S3.
Wherein the constant current source device is connected to the analog switch array, specifically, the constant current source device is connected to the first analog switch array S1. For example, the constant current source device may be an analog switch in connection S1.
The calibration resistor array may be connected to the analog switch array, specifically, the calibration resistor array is connected to the second analog switch array S2. For example, RS1 in the calibration resistor array is connected to a corresponding analog switch in S2.
The connection of the temperature sensor array to the analog switch array may be specifically that the temperature sensor array is connected to the third analog switch array S3. For example, RTD1 in the temperature sensor array is connected to a corresponding analog switch in S3.
The operational amplifier connected to the analog switch array may specifically be that the operational amplifier is connected to the second analog switch array S2 and the third analog switch array S3. The second analog switch array S2 and the third analog switch array S3 are connected through an operational amplifier, and the obtained calibration voltage based on the calibration resistor connected to the corresponding analog switch may be transmitted to the operational amplifier, or the obtained detection voltage based on the temperature sensor connected to the corresponding analog switch may be transmitted to the operational amplifier.
In some embodiments, based on the correspondence between the calibration resistor and the temperature detection channel and the correspondence between the temperature detection channel and the analog switches, a calibration resistor in the calibration resistor array may include a calibration pin, where the calibration pin is connected to a corresponding second analog switch in the second analog switch array, and is connected to a first node T1 of a connection line of the second analog switch, and to a corresponding first analog switch in the first analog switch array.
In some embodiments, based on the correspondence between the temperature sensor and the temperature detection channel and the correspondence between the temperature detection channel and the analog switch, a temperature sensor in the temperature sensor array may include a first pin and a second pin, where the first pin is connected to a corresponding third analog switch in the third analog switch array, the second pin is connected to a corresponding third second analog switch in the third analog switch array, and the first pin is connected to a second node T2 of a connection line of the third analog switch, and is connected to a corresponding first analog switch in the first analog switch array.
Further in some embodiments, the calibration and temperature detection of the temperature detection channel in embodiments of the present application may be performed separately. As an optional implementation, if a second analog switch corresponding to the calibration resistor in the second switch analog array is closed, a third analog switch corresponding to a temperature sensor for detecting an object to be detected in the temperature monitoring channel corresponding to the calibration resistor in the third switch analog array is opened.
As another alternative implementation, if a third analog switch corresponding to the temperature sensor in the third switch analog array is closed, a second analog switch corresponding to the calibration resistor corresponding to the temperature monitoring channel corresponding to the temperature sensor in the second switch analog array is opened.
It should be noted that the number of analog switches in the second analog switch array and the third analog switch array in the embodiment of the application is the same, and each analog switch in the second analog switch array and the third analog switch array corresponds to a temperature detection channel, and the number of analog switches in the first analog switch array may be twice that of analog switches in the second analog switch array or the third analog switch array, and a part of the analog switches are used for connecting the constant current source device to the calibration resistor and a part of the analog switches are used for connecting the constant current source device to the temperature sensor. In addition, in order to realize accurate calibration of the temperature detection circuit, the calibration resistors connected to the second analog switch in the second analog switch array may be different calibration resistors corresponding to the same temperature detection channel.
It can be appreciated that based on the correspondence between the calibration resistor and the temperature detection channel, the calibration resistor can be connected to the corresponding temperature detection channel through the closing of the second analog switch array, so as to determine the temperature detection coefficient of the temperature detection channel, thereby eliminating the need to individually adjust the temperature detection channels one by one, improving the convenience of calibrating the temperature detection circuit, and effectively reducing the calibration cost of the temperature detection circuit, such as the time cost and labor cost of individually adjusting the temperature detection channels.
In some embodiments, the temperature detection circuit of the embodiment of the present application may further include an interface circuit, where the interface circuit is connected to the signal acquisition controller, and is configured to output a signal of the signal acquisition controller to an external device, so that the external device obtains corresponding data, such as information of a temperature value, and the like.
The temperature detection circuit comprises an analog switch array, a calibration resistor array, a temperature sensor array and a signal acquisition controller, wherein the calibration resistor array is connected with the analog switch array and used for communicating the calibration resistor to a circuit based on the closing of an analog switch corresponding to one calibration resistor in the analog switch array so as to determine the temperature detection coefficient of a temperature detection channel, the temperature detection coefficient indicates the change rate of the physical property of the temperature detection channel along with the change of temperature, the temperature detection channel corresponds to the calibration resistor, the temperature sensor array is connected with the analog switch array and used for communicating the temperature sensor corresponding to one temperature sensor in the temperature sensor array to the circuit based on the closing of the analog switch corresponding to the one temperature sensor in the analog switch array so as to determine the temperature value of an object to be detected in the temperature detection channel, and the signal acquisition controller is connected with the analog switch array and used for controlling the closing of the corresponding analog switch in the analog switch array and used for determining the temperature value of the object to be detected based on the voltage corresponding to the calibration resistor in the calibration resistor array.
Therefore, the embodiment of the application can determine the temperature detection coefficient of the corresponding temperature detection channel based on the corresponding connection of the analog switch array and the calibration resistor array, thereby realizing the automatic calibration of the temperature detection channel, improving the calibration efficiency of the temperature detection circuit, further determining the temperature value of the object to be detected by the temperature sensor corresponding to the calibrated temperature detection channel based on the connection of the temperature sensor array and the analog switch array, and realizing the improvement of the detection accuracy of the temperature.
For further understanding of the determination of the temperature value by the temperature detection circuit according to the present application, fig. 2 is a schematic flow chart schematically illustrating a temperature detection method according to an embodiment of the present application, where the temperature detection method may be applied to the temperature detection circuit described above, and may specifically be implemented by a signal acquisition controller of the temperature detection circuit. The content of the detection method described below may be referred to in correspondence with the content described above.
As shown in fig. 2, the temperature detection method may include the following steps.
Step S11, a calibration voltage of a calibration resistor corresponding to a temperature detection channel is obtained, and a temperature detection coefficient of the temperature detection channel is determined according to the calibration voltage.
In order to ensure the accuracy of the temperature detection coefficient, the number of the calibration voltages may be at least two, and the at least two calibration voltages may correspond to different calibration resistors respectively.
In an alternative example, the temperature detection coefficient of the temperature detection channel may be obtained by plotting a relationship graph based on at least two calibration voltages, wherein the temperature detection coefficient may be obtained by a slope of the plotted relationship graph.
With reference to the structure shown in fig. 1, as an alternative application example, the constant current source circuit can generate a stable current, the signal acquisition controller gates one analog switch in the analog switch array S1, applies the circuit in the circuit to the corresponding calibration resistor of the calibration resistor array, for example RS1, so as to generate a corresponding calibration voltage, amplifies the weak calibration voltage into a stronger calibration voltage signal through the operational amplifier, performs AD conversion, and then transmits the stronger calibration voltage signal to the signal acquisition controller, and the signal acquisition controller performs table look-up calculation to obtain a temperature value (for example, 0 ℃) corresponding to the voltage value and the resistance value. The table which is queried by the signal acquisition controller can be a record table of voltage-resistance-temperature values recorded in a corresponding program, and the table content can be obtained based on corresponding experimental data.
The steps are repeatedly executed, the constant current source circuit can generate a stable current, the signal acquisition controller gates one analog switch in the analog switch array S1, the circuit in the circuit is applied to a corresponding calibration resistor of the calibration resistor array, such as RS2, so as to generate a corresponding calibration voltage, the weak calibration voltage is amplified into a stronger calibration voltage signal through the operational amplifier and is subjected to AD conversion, and then the stronger calibration voltage signal is transmitted to the signal acquisition controller, and the signal acquisition controller performs table look-up calculation to obtain a corresponding voltage value and a temperature value (such as 100 ℃) of the resistance value.
Further, two calibration voltages corresponding to the two calibration resistors are obtained based on the steps, and the signal acquisition controller performs linear fitting processing based on the two calibration voltages to obtain a relationship graph, so that the slope of the relationship graph can be determined as a temperature detection coefficient.
Step S12, obtaining the detection voltage of the temperature sensor corresponding to the temperature detection channel, and determining the temperature value of the object to be detected in the temperature detection channel where the temperature sensor is located based on the temperature detection coefficient.
In the case that the temperature sensor in the embodiment of the application includes two pins, the temperature value of the object to be measured in the temperature detection channel where the temperature sensor is located may be determined by reading two-point detection voltages corresponding to the two pins based on a three-wire system mode.
With reference to the structure shown in fig. 1, as an alternative application example, when temperature detection is performed, the constant current source circuit may generate a stable current (i.e., a constant current source current), the signal acquisition controller gates one analog switch in the analog switch array S1, applies the constant current source current to a temperature sensor corresponding to the temperature detection channel, for example, RTD1, and then the signal acquisition controller gates one analog switch in the analog switch array S3, thereby generating a corresponding detection voltage, for example, U1. The signal acquisition controller gates one analog switch in the array of analog switches S3, which may be considered a second acquisition point corresponding to the same temperature sensor, to generate a corresponding detection voltage, e.g., U2. Further, two detection voltages corresponding to the same temperature detection channel, i.e., U1 and U2, can be acquired.
Further, the voltage difference value corresponding to U1 and U2 is determined according to the "three-wire system method" to eliminate the error, the resistance value corresponding to the voltage after the error is eliminated is determined, and the temperature value corresponding to the resistance value is determined. The three wires are understood to be three transmission lines corresponding to the temperature sensor, namely a connecting wire of two pins and a grounding wire of the temperature sensor. The embodiment of the application can eliminate the error of the detection voltage based on the modes of four-wire system, six-wire system and the like, and the embodiment of the application is not limited in the mode of eliminating the error, so long as the mode of eliminating the error of the detection voltage is satisfied.
To facilitate understanding of the above, fig. 3 schematically illustrates a schematic diagram of a current transmission path corresponding to a connection line of the temperature sensor. Wherein RT is a temperature sensor, rL1, rL2, rL3 are resistances of three lines of the temperature sensor, rl1=rl2=rl3, and a direction indicated by a dotted line is a flow direction of the current I.
When the resistance value of the temperature sensor is calculated, the resistance value can be obtained according to the following formula:
U1=I*(rL1+RT+rL3)=I*(2rL1+RT);
U2=I*rL3=I*rL1;
U1-2U2=I*RT;
RT=(U1-2U2)/I。
Based on the determined resistance value, a specification table of the resistance value-temperature value corresponding to the temperature sensor is queried, and a corresponding actual temperature value can be obtained. The temperature value is obtained after the influence of the line resistance of the temperature sensor is eliminated, and therefore the temperature detection circuit can effectively improve the sampling precision of the temperature detection circuit.
It can be seen that the temperature detection method provided by the embodiment of the application can realize automatic calibration of the temperature detection coefficient, improves the calibration efficiency of the temperature detection circuit, and further improves the temperature sampling precision based on the improvement of the calibration efficiency.
The embodiment of the application also provides a chip, which can comprise the temperature detection circuit.
The embodiment of the application also provides battery manufacturing equipment, which can comprise the chip.
The foregoing describes several embodiments of the present application, and the various alternatives presented by the various embodiments may be combined, cross-referenced, with each other without conflict, extending beyond what is possible embodiments, all of which are considered to be embodiments of the present application disclosed and disclosed.
Although the embodiments of the present application are disclosed above, the present application is not limited thereto. Various changes and modifications may be made by one skilled in the art without departing from the spirit and scope of the application, and the scope of the application should be assessed accordingly to that of the appended claims.
Claims (10)
1. The temperature detection circuit is characterized by comprising an analog switch array, a calibration resistor array, a temperature sensor array and a signal acquisition controller;
the calibration resistor array is connected with the analog switch array and is used for communicating the calibration resistor to a circuit based on the closing of an analog switch corresponding to one of the calibration resistors in the analog switch array so as to determine the temperature detection coefficient of the temperature detection channel, wherein the temperature detection coefficient indicates the change rate of the physical attribute of the temperature detection channel along with the change of temperature;
The temperature sensor array is connected with the analog switch array and is used for communicating the temperature sensor corresponding to the temperature detection channel into a circuit based on the closing of an analog switch corresponding to one temperature sensor in the temperature sensor array in the analog switch array so as to determine the temperature value of an object to be detected in the temperature detection channel;
The signal acquisition controller is connected with the analog switch array and used for controlling the closing of a corresponding analog switch in the analog switch array, determining a temperature detection coefficient of the temperature monitoring channel based on the calibration voltage of a corresponding calibration resistor in the calibration resistor array, and determining a temperature value of an object to be detected in the temperature detection channel where the temperature sensor is located based on the detection voltage of the corresponding temperature sensor in the temperature sensor array.
2. The temperature detection circuit of claim 1, wherein the temperature detection circuit further comprises an operational amplifier;
The operational amplifier is connected with the analog switch array and is used for acquiring the calibration voltage of the corresponding calibration resistor in the calibration resistor array and converting the calibration voltage into a calibration voltage digital signal, and acquiring the detection voltage of the corresponding temperature sensor in the temperature sensor array and converting the detection voltage into a detection voltage digital signal;
the operational amplifier is connected with the signal acquisition controller and is used for sending the calibration voltage digital signal and the detection voltage digital signal to the signal acquisition controller so that the signal acquisition controller can determine the temperature detection coefficient of the temperature monitoring channel based on the calibration voltage of the corresponding calibration resistor in the calibration resistor array, and determine the temperature value of an object to be detected in the temperature detection channel where the temperature sensor is located based on the detection voltage of the corresponding temperature sensor in the temperature sensor array.
3. The temperature detection circuit according to claim 2, further comprising a constant current source device;
The constant current source device is connected with the analog switch array and is used for communicating the constant current source device into a circuit based on the closing of a corresponding analog switch in the analog switch array so as to provide constant current for the circuit.
4. A temperature detection circuit according to claim 3, wherein the array of analog switches comprises a first array of analog switches, a second array of analog switches, and a third array of analog switches;
The constant current source device is connected with the analog switch array, specifically, the constant current source device is connected with the first analog switch array;
The calibration resistor array is connected with the analog switch array, specifically, the calibration resistor array is connected with the second analog switch array;
The temperature sensor array is connected with the analog switch array, specifically, the temperature sensor array is connected with the third analog switch array;
the operational amplifier is connected with the analog switch array, specifically, the operational amplifier is connected with the second analog switch array and the third analog switch array.
5. The temperature sensing circuit of claim 4, wherein a calibration resistor in the array of calibration resistors comprises a calibration pin connected to a corresponding second analog switch in the array of second analog switches and connected to a corresponding first analog switch in the array of first analog switches at a first node of a connection line of the second analog switches at the calibration pin.
6. The temperature sensing circuit of claim 4, wherein a temperature sensor in the array of temperature sensors includes a first pin and a second pin, the first pin is connected to a corresponding third analog switch in the array of third analog switches, the second pin is connected to a corresponding third second analog switch in the array of third analog switches, and the first pin is connected to a second node of a connection line of the third analog switch, and is connected to a corresponding first analog switch in the array of first analog switches.
7. The temperature detection circuit according to claim 5 or 6, wherein if a second analog switch of the second analog switch array corresponding to the calibration resistor is closed, a third analog switch of the third analog switch array corresponding to a temperature sensor for detecting an object to be measured in a temperature monitoring channel corresponding to the calibration resistor is opened, or
And if a third analog switch corresponding to the temperature sensor in the third switch analog array is closed, a second analog switch corresponding to the calibration resistor corresponding to the temperature monitoring channel corresponding to the temperature sensor in the second switch analog array is opened.
8. A temperature detection method, characterized by being applied to the temperature detection circuit according to any one of claims 1 to 7, the method comprising:
Acquiring a calibration voltage of a calibration resistor corresponding to a temperature detection channel, and determining a temperature detection coefficient of the temperature detection channel according to the calibration voltage;
And acquiring the detection voltage of the temperature sensor corresponding to the temperature detection channel, and determining the temperature value of the object to be detected in the temperature detection channel where the temperature sensor is positioned based on the temperature detection coefficient.
9. A chip comprising the temperature detection circuit of any one of claims 1 to 7.
10. A battery manufacturing apparatus comprising the chip of claim 9.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202411230592.6A CN119124400A (en) | 2024-09-04 | 2024-09-04 | Temperature detection circuit, temperature detection method, chip and battery manufacturing equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202411230592.6A CN119124400A (en) | 2024-09-04 | 2024-09-04 | Temperature detection circuit, temperature detection method, chip and battery manufacturing equipment |
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| CN119124400A true CN119124400A (en) | 2024-12-13 |
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| CN202411230592.6A Pending CN119124400A (en) | 2024-09-04 | 2024-09-04 | Temperature detection circuit, temperature detection method, chip and battery manufacturing equipment |
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