CN118817121B - Parameter correction system for secondary measurement equipment - Google Patents
Parameter correction system for secondary measurement equipment Download PDFInfo
- Publication number
- CN118817121B CN118817121B CN202411313216.3A CN202411313216A CN118817121B CN 118817121 B CN118817121 B CN 118817121B CN 202411313216 A CN202411313216 A CN 202411313216A CN 118817121 B CN118817121 B CN 118817121B
- Authority
- CN
- China
- Prior art keywords
- correction
- theoretical
- values
- component
- parameter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000005259 measurement Methods 0.000 title claims abstract description 166
- 238000012937 correction Methods 0.000 title claims abstract description 125
- 238000000034 method Methods 0.000 claims description 18
- 230000005284 excitation Effects 0.000 claims description 14
- 238000013461 design Methods 0.000 claims description 4
- 238000009529 body temperature measurement Methods 0.000 abstract description 8
- 238000010923 batch production Methods 0.000 abstract description 3
- 238000004519 manufacturing process Methods 0.000 abstract description 3
- 238000012795 verification Methods 0.000 abstract description 3
- 230000000712 assembly Effects 0.000 description 6
- 238000000429 assembly Methods 0.000 description 6
- 230000008569 process Effects 0.000 description 6
- 238000004891 communication Methods 0.000 description 4
- 230000009471 action Effects 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000000750 progressive effect Effects 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K15/00—Testing or calibrating of thermometers
- G01K15/005—Calibration
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Current Or Voltage (AREA)
Abstract
The invention discloses a parameter correction system of secondary measurement equipment, which relates to the technical field of temperature measurement equipment, and can automatically realize calculation and writing of relevant correction parameters of the secondary measurement equipment through control of a main control component, realize correction of the thermal resistance temperature measurement equipment in a full range, and ensure that the correction precision can reach +/-0.3 ℃. Meanwhile, the simultaneous correction of multiple measuring channels can be realized; the time for calibrating the equipment measurement channels in mass production is reduced, and the actual verification proves that the calibration time of each channel is reduced by at least 75%; the efficiency of batch production debugging is improved. In addition, the device can be used for multi-channel isolated thermal resistance temperature measuring equipment, and can also be compatible for correcting non-isolated thermal resistance temperature measuring equipment.
Description
Technical Field
The invention relates to the technical field of temperature measurement equipment, in particular to a parameter correction system of secondary measurement equipment.
Background
In the reactor control system, the measurement system plays an eye role, monitors the running state of each link in the system, and a large number of position points related to temperature monitoring are included, so that accurate temperature measurement is beneficial to timely and accurate control operation of the control system. The thermal resistor is a temperature measuring sensor which is used in a large amount, and meanwhile, the output signal of the thermal resistor sensor is converted into the original measured temperature after being acquired by secondary measuring equipment.
A large number of thermal resistance sensors are used in a measurement system, and as each thermal resistance sensor is independently distributed, measurement equipment is often designed to be in a multi-channel acquisition mode. The analog signal transmitted by the thermal resistance sensor can be superimposed with common mode interference brought by external environment after long-distance transmission, certain deviation exists after the signal is acquired by the secondary measurement equipment, and the error existing in the acquisition of the small micro analog signal by the secondary measurement equipment is significant for ensuring that the measurement system obtains an accurate thermal resistance temperature signal, reducing the misoperation rate of the control system and correcting the acquisition precision of the thermal resistance sensor signal measurement equipment (namely the secondary measurement equipment, which is referred to as secondary measurement equipment in the follow-up process).
In practical use, the thermal resistance sensor needs to receive an excitation signal of the secondary measurement device and transmit a voltage signal to the secondary measurement device.
In the measurement system in the prior art, the temperature signal acquisition of the thermal resistor is roughly classified into the following cases:
1. the number of temperature signal measurement points in the measurement equipment is small, the temperature measurement interval is fixed, and the signal measurement channels can be corrected one by personnel.
2. The calibration is performed in an approximately linear manner in a larger interval, and only a measurement with a larger error range (about + -3 ℃ and the like) can be satisfied.
3. The system has low requirements on the measurement accuracy of the temperature signal (such as wider requirements on the measurement accuracy of +/-5 ℃ and the like), and can be ensured by design without calibration.
For the correction of the secondary measuring device, the prior art has the following disadvantages:
the calibration of the acquisition voltage is generally only carried out, the calibration depth is insufficient, and the requirements in a precise temperature measurement system cannot be met. The channel-by-channel calibration is performed manually, which involves repeated wiring, source signal input, collected data reading, calibration parameter calculation, calibration parameter writing and the like; when the number of channels is large, the above work needs to be repeated, especially, the collected data (the original data needed by correction) needs to be recorded manually, and the calculation of the calibration parameters is performed, so that the efficiency is low, a lot of time is required, and errors are easy to occur. In addition, the thermal resistance temperature signal is nonlinear, and is in a curve form in the whole signal interval, and the approximate linear calibration mode can only have a certain effect in a local interval.
Disclosure of Invention
In view of the above, the present invention provides a secondary measurement device parameter correction system for overcoming or at least partially solving the above problems. The method is used for batch automatic calibration of the measurement channel of the secondary measurement device of the thermal resistance sensor signal in the reactor measurement system. So as to realize the rapid and efficient calibration of a large number of thermal resistance signal acquisition channels in the secondary measurement equipment.
The invention provides the following scheme:
A secondary measurement device parameter correction system comprising:
The device comprises a measuring assembly, a main control assembly and a calculating and displaying assembly; the main control component is respectively connected with the measuring component and the calculating and displaying component; the measuring assembly is connected with secondary measuring equipment;
the main control component is used for executing the following operations:
Generating a plurality of theoretical current values and a plurality of theoretical voltage values, and transmitting the plurality of theoretical current values and the plurality of theoretical voltage values to the secondary measurement equipment through the measurement assembly, so that the secondary measurement equipment receives the plurality of theoretical current values and the plurality of theoretical voltage values and then generates a plurality of acquired current values and a plurality of acquired voltage values;
Receiving the plurality of collected current values and the plurality of collected voltage values obtained by the measuring component, and sending the plurality of collected current values and the plurality of collected voltage values to the calculating and displaying component so that the calculating and displaying component calculates and obtains a current correction parameter according to the plurality of theoretical current values and the plurality of collected current values, and calculates and obtains a voltage correction parameter according to the theoretical voltage values and the plurality of collected voltage values;
Writing the received current correction parameters and the received voltage correction parameters into the secondary measurement equipment through the measurement assembly so that the secondary measurement equipment converts a plurality of theoretical current values and a plurality of theoretical voltage values according to the current correction parameters and the voltage correction parameters to obtain a plurality of output temperature values;
receiving the plurality of output temperature values obtained by the measuring component and sending the plurality of output temperature values to the calculating and displaying component so that the calculating and displaying component calculates and obtains temperature correction parameters according to the plurality of output temperature values and the plurality of theoretical temperature values; the theoretical temperature values are obtained by conversion according to the theoretical current values and the theoretical voltage values;
And writing the received temperature correction parameters into the secondary measurement equipment through the measurement assembly to realize parameter correction.
Preferably: configuring the number of points of output excitation signals and the number of points of received voltage signals of the secondary measurement equipment; and determining the number of the theoretical current values according to the number of the output excitation signal points, and determining the number of the theoretical voltage values according to the number of the received voltage signal points.
Preferably: the current correction parameter, the voltage correction parameter and the temperature correction parameter are all obtained by calculating in a curve fitting mode by adopting a least square method.
Preferably: the fitted curve of the curve fitting mode is represented by the following formula:
Wherein: The value of the theoretical data is represented, Representing the output data value of the secondary measuring device,Representing the parameter to be corrected.
Preferably: the measurement component includes an AI/AO interface and a Uart interface.
Preferably: the measuring assembly comprises a plurality of groups, the measuring assemblies are all connected with the main control assembly, and each group of measuring assemblies is used for being connected with one set of secondary measuring equipment.
Preferably: the AI/AO interfaces inside each set of the measurement components are of a common ground design for non-isolated measurement channel correction of the secondary measurement device.
Preferably: the measurement assemblies of each group are isolated from each other so as to be used for isolated measurement channel correction of the secondary measurement equipment.
According to the specific embodiment provided by the invention, the invention discloses the following technical effects:
According to the parameter correction system for the secondary measurement equipment, provided by the embodiment of the invention, the calculation and writing of the relevant correction parameters of the secondary measurement equipment can be automatically realized through the control of the main control component, the correction of the thermal resistance temperature measurement equipment in a full range can be realized, and the correction precision can reach +/-0.3 ℃. Meanwhile, the simultaneous correction of multiple measuring channels can be realized; the time for calibrating the equipment measurement channels in mass production is reduced, and the actual verification proves that the calibration time of each channel is reduced by at least 75%; the efficiency of batch production debugging is improved. In addition, the device can be used for multi-channel isolated thermal resistance temperature measuring equipment, and can also be compatible for correcting non-isolated thermal resistance temperature measuring equipment.
Of course, it is not necessary for any one product to practice the invention to achieve all of the advantages set forth above at the same time.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings that are required to be used in the embodiments will be briefly described below. It is evident that the drawings in the following description are only some embodiments of the present invention and that other drawings may be obtained from these drawings by those of ordinary skill in the art without inventive effort.
FIG. 1 is a connection block diagram of a parameter correction system for a secondary measurement device according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a system according to an embodiment of the present invention;
FIG. 3 is a schematic illustration of closed-loop automation control provided by an embodiment of the present invention;
Fig. 4 is a flowchart of correction parameter calculation according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. It will be apparent that the described embodiments are only some, but not all, embodiments of the invention. All other embodiments, which are derived by a person skilled in the art based on the embodiments of the invention, fall within the scope of protection of the invention.
Referring to fig. 1, a parameter correction system for a secondary measurement device according to an embodiment of the present invention, as shown in fig. 1, may include:
The device comprises a measuring assembly, a main control assembly and a calculating and displaying assembly; the main control component is respectively connected with the measuring component and the calculating and displaying component; the measuring assembly is connected with secondary measuring equipment;
the main control component is used for executing the following operations:
Generating a plurality of theoretical current values and a plurality of theoretical voltage values, and transmitting the plurality of theoretical current values and the plurality of theoretical voltage values to the secondary measurement equipment through the measurement assembly, so that the secondary measurement equipment receives the plurality of theoretical current values and the plurality of theoretical voltage values and then generates a plurality of acquired current values and a plurality of acquired voltage values;
Receiving the plurality of collected current values and the plurality of collected voltage values obtained by the measuring component, and sending the plurality of collected current values and the plurality of collected voltage values to the calculating and displaying component so that the calculating and displaying component calculates and obtains a current correction parameter according to the plurality of theoretical current values and the plurality of collected current values, and calculates and obtains a voltage correction parameter according to the theoretical voltage values and the plurality of collected voltage values;
Writing the received current correction parameters and the received voltage correction parameters into the secondary measurement equipment through the measurement assembly so that the secondary measurement equipment converts a plurality of theoretical current values and a plurality of theoretical voltage values according to the current correction parameters and the voltage correction parameters to obtain a plurality of output temperature values;
receiving the plurality of output temperature values obtained by the measuring component and sending the plurality of output temperature values to the calculating and displaying component so that the calculating and displaying component calculates and obtains temperature correction parameters according to the plurality of output temperature values and the plurality of theoretical temperature values; the theoretical temperature values are obtained by conversion according to the theoretical current values and the theoretical voltage values;
And writing the received temperature correction parameters into the secondary measurement equipment through the measurement assembly to realize parameter correction.
According to the parameter correction system for the secondary measurement equipment, the main control component is used for communicating with the measurement component and the calculation and display component, generated theoretical data are sent to the secondary measurement equipment through the measurement component, corresponding collected data can be generated after the secondary measurement equipment receives the theoretical data value, and if the parameters of the secondary measurement equipment are accurate and do not need correction, the collected data value generated after the secondary measurement equipment receives the theoretical data value can be consistent with the theoretical data value. However, since the parameters of the secondary measurement device are usually inaccurate to correct, the acquired data value generated by each secondary measurement device has a certain error from the theoretical data value.
Therefore, in the system provided by the invention, the plurality of acquired data values generated by the secondary measurement equipment are acquired through the measurement component and then sent to the calculation and display component through the main control equipment, the calculation and display component finishes calculation of the correction coefficient according to the error relation between the plurality of acquired data values and the theoretical data values, the correction coefficient is acquired, and finally the corrected coefficient can be written into the secondary measurement equipment through the main control component and the measurement component, so that parameter correction of the secondary measurement equipment is finished.
The automatic control of the parameter correction of the secondary measurement equipment can be realized through the main control component, the whole logic can be automatically completed from the output of the set initial data, the return of the measurement data, the calculation of the correction parameter and the issuing and writing of the correction parameter, and the whole process does not need to be manually participated.
It can be understood that in the process of correcting parameters of the secondary measurement device, the system provided by the invention needs to ensure that the acquisition current required by the excitation signal can be accurately received when the secondary measurement device is actually used, so that the parameters related to the control of the reception current of the secondary measurement device need to be corrected. Then, since the secondary measurement device needs to receive the voltage signal sent by the thermal resistance sensor when in actual use, correction is needed for the relevant parameters of the voltage signal received by the secondary measurement device. Finally, as the secondary measurement device outputs a temperature value when in actual use, after the correction of the current-related parameter and the voltage-related parameter is completed, the parameter related to the output temperature value of the secondary measurement device needs to be corrected.
After the three-level correction, final parameter correction of the secondary measurement equipment can be completed, common-mode interference caused by superposition of external environments in signals can be eliminated when the secondary measurement equipment is in actual use, deviation is reduced after the secondary measurement equipment collects the signals, errors of the secondary measurement equipment on small micro analog signal collection are eliminated, an accurate thermal resistance temperature signal is ensured to be obtained by a measurement system, the malfunction rate of a control system is reduced, and the collection precision of the thermal resistance sensor signal measurement equipment (secondary measurement equipment) is improved.
It can be understood that when the system provided by the embodiment of the invention performs parameter correction, a plurality of theoretical current values and theoretical voltage values need to be generated, and in order to determine the number of the theoretical current values and the theoretical voltage values, the embodiment of the invention can also provide the number of output excitation signal points and the number of received voltage signal points for configuring the secondary measurement device; and determining the number of the theoretical current values according to the number of the output excitation signal points, and determining the number of the theoretical voltage values according to the number of the received voltage signal points. The main control component end can configure the number of points of the output excitation signal and the number of points of the received voltage signal, the configuration mode can be automatically configured according to a preset rule, or the configuration information manually input by a user can be received, and the corresponding configuration can be carried out according to the configuration information.
The correction of each parameter by the system provided by the embodiment of the invention can be any method capable of correcting the relevant parameter in the prior art. For example, in one implementation manner, the embodiment of the present invention may provide that the current correction parameter, the voltage correction parameter, and the temperature correction parameter are all obtained by performing curve fitting by using a least square method.
In particular implementation, as shown in fig. 4, a fitted curve of the manner in which the embodiment of the present invention may provide the curve fitting is represented by the following formula:
Wherein: The value of the theoretical data is represented, ，Representing the output data value of the secondary measuring device,，Representing the parameter to be corrected.May be a theoretical current value, a theoretical voltage value, a theoretical current value,The temperature value may be a collected current value, a collected voltage value, or an output temperature value.
The measuring assembly provided by the embodiment of the invention is mainly used for bearing the task of data transmission, the data of the main control assembly end can be transmitted to the secondary measuring equipment through uplink communication, and the data output by the secondary measuring equipment can be transmitted to the main control through downlink communication. In a specific implementation, the embodiment of the present invention may provide that the measurement component includes an AI/AO interface and a Uart interface.
In order to realize the correction of multiple sets of secondary measurement equipment at the same time, the embodiment of the invention can provide that the measurement assembly comprises a plurality of groups, the plurality of measurement assemblies are connected with the main control assembly, and each group of measurement assemblies is used for being connected with one set of secondary measurement equipment.
Further, the AI/AO interfaces inside each set of the measurement components are designed in a common ground manner so as to be used for non-isolated measurement channel correction of the secondary measurement device. The measurement assemblies of each group are isolated from each other so as to be used for isolated measurement channel correction of the secondary measurement equipment.
The parameter correction system for secondary measurement equipment provided by the embodiment of the invention is described in detail below by taking the setting of a plurality of groups of measurement components as an example.
As shown in fig. 1, the system comprises a configurable number of measuring components, a main control component, and a calculating and displaying component; each group of measuring components is provided with the same number of measuring interfaces, and is designed into 8 AI acquisition interfaces and 1 AO output port. The main control assembly is connected with each measuring assembly through an RS485 bus, and is connected with the computer display assembly through an LVDS interface, wherein Uart refers to a universal asynchronous receiver-transmitter.
The AI/AO interface in each group of measurement assembly adopts the common-ground design, can be used for the non-isolated measurement channel correction of the secondary measurement equipment; the measurement components are isolated from each other and can be used for isolated measurement channel correction of secondary measurement equipment;
the AI interface of the measuring assembly is mainly used for collecting the excitation signal (mu A level current) of the secondary measuring equipment, and the AO interface is used for outputting the voltage signal (mV level voltage).
The Uart interface of the measuring assembly is used for being interconnected with the Uart interface of the secondary measuring device to acquire initial output excitation current and acquired voltage information of the secondary measuring device.
The Uart interface of the measurement assembly is also used to write correction parameters of the secondary measurement device into the secondary measurement device.
The main control component is mainly used for realizing automatic control, and the whole logic is written from setting initial data output, measuring data return, correction parameter calculation and correction parameter issuing;
The main control component is also used for communicating with the calculation and display component, transmitting various data acquired by the measurement component to the calculation and display component, completing calculation of correction coefficients and acquiring the correction coefficients;
The main control component is also used for communicating with each measuring component to finish issuing correction parameters and receiving original measurement data;
And the calculating and displaying component (DCM component) is used for completing the calculation and display of the correction parameters.
The measuring components can be expanded according to the needs, the specific number of the measuring components is not limited by the embodiment of the invention, and the system composition is shown in fig. 2.
When the system is used, MC is a main control component, and uplink communication is mainly used for receiving data acquired by the measuring component and transmitting the data to the DCM component, and correction parameters are calculated according to output data set by the main control component and the data acquired by the stoping component; and the downlink communication is used for transmitting the correction parameters and the correction writing commands to each measuring component and writing the correction parameters and the correction writing commands into the secondary measuring equipment through the Uart interface of the measuring component.
The closed loop automation control correction principle is as follows, referring to fig. 3, PMC in fig. 3 represents a power management unit, CH1 to CH8 represent channels 1 to 8.
Performing 1-level correction, namely performing point configuration on output excitation signals of the secondary measurement equipment at the main control component, generating theoretical current values with corresponding numbers according to the points, and sequentially transmitting all the theoretical current values to the secondary measurement equipment after acquisition by the measurement component; after receiving a theoretical current value, the secondary measuring equipment can generate an acquisition current value, all generated acquisition current values are sequentially acquired by the measuring assembly and then sent to the main control assembly, and all the acquisition current values and all the theoretical current values received by the main control assembly are sent to the calculating and displaying assembly.
The calculating and displaying component obtains the coefficient of the formula according to a set curve fitting formula for realizing the correction of the current value related parameter through an internal program, namely the current correction parameter; the main control component receives the current correction parameters and writes the current correction parameters into secondary measurement equipment through the measurement component, and the subsequent secondary measurement equipment adopts the current parameters to collect and generate current for exciting signals of the thermal resistance sensor.
2-Stage correction, namely performing received voltage signal point number configuration of the secondary measurement equipment at the main control component, and sequentially transmitting all theoretical voltage values to the secondary measurement equipment after acquisition by the measurement component according to the theoretical voltage values of the received voltage signal point numbers; after receiving a theoretical voltage value, the secondary measurement equipment generates an acquisition voltage value, all generated acquisition voltage values are sequentially acquired by the measurement assembly and then sent to the main control assembly, and all the acquisition voltage values and all the theoretical voltage values received by the main control assembly are sent to the calculation and display assembly.
The calculation and display assembly calculates the coefficient of the formula according to a set curve fitting formula for realizing the correction of the voltage value related parameters through an internal program, namely the voltage correction parameters; the main control component receives the voltage correction parameter and writes the voltage correction parameter into secondary measurement equipment through the measurement component, and the subsequent secondary measurement equipment acquires a voltage signal returned by the thermal resistance sensor by adopting the voltage parameter.
And 3-stage correction, wherein the secondary measurement equipment converts a plurality of theoretical current values and a plurality of theoretical voltage values into a plurality of corresponding output temperature values according to the 1-stage correction parameters and the 2-stage correction parameters. All the generated output temperature values are sequentially collected by the measuring component and then sent to the main control component, and all the output temperature values received by the main control component are sent to the calculating and displaying component.
And the calculating and displaying component converts the preset theoretical current values and theoretical voltage values to obtain corresponding theoretical temperature values, and compares the theoretical temperature values with the output temperature values uploaded by the secondary measuring equipment to obtain a 3-level correction parameter, namely a temperature correction parameter. The main control component writes the 3-level correction parameters into the secondary measurement equipment through the measurement component to finish final correction.
The secondary measuring equipment after finishing the final parameter correction can be connected to a temperature measuring system, and the corrected current correction parameters can ensure to acquire accurate excitation signals sent by a controller and are used for realizing excitation of the thermal resistance sensor. The accurate output voltage of the thermal resistance sensor can be ensured to be obtained by adopting the voltage correction parameters obtained after correction. The temperature correction parameters obtained after correction are adopted, so that the accuracy of the output temperature value of the secondary measurement equipment can be ensured.
In a word, the parameter correction system of the secondary measurement equipment provided by the invention can automatically realize the calculation and writing of the relevant correction parameters of the secondary measurement equipment through the control of the main control component, and can realize the correction of the thermal resistance temperature measurement equipment in a full range, wherein the correction precision can reach +/-0.3 ℃. Meanwhile, the simultaneous correction of multiple measuring channels can be realized; the time for calibrating the equipment measurement channels in mass production is reduced, and the actual verification proves that the calibration time of each channel is reduced by at least 75%; the efficiency of batch production debugging is improved. In addition, the device can be used for multi-channel isolated thermal resistance temperature measuring equipment, and can also be compatible for correcting non-isolated thermal resistance temperature measuring equipment.
It is noted that relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
From the above description of embodiments, it will be apparent to those skilled in the art that the present invention may be implemented in software plus a necessary general hardware platform. Based on such understanding, the technical solution of the present invention may be embodied essentially or in a part contributing to the prior art in the form of a software product, which may be stored in a storage medium, such as a ROM/RAM, a magnetic disk, an optical disk, etc., including several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the method described in the embodiments or some parts of the embodiments of the present invention.
In this specification, each embodiment is described in a progressive manner, and identical and similar parts of each embodiment are all referred to each other, and each embodiment mainly describes differences from other embodiments. In particular, for a system or system embodiment, since it is substantially similar to a method embodiment, the description is relatively simple, with reference to the description of the method embodiment being made in part. The systems and system embodiments described above are merely illustrative, wherein the elements illustrated as separate elements may or may not be physically separate, and the elements shown as elements may or may not be physical elements, may be located in one place, or may be distributed over a plurality of network elements. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment. Those of ordinary skill in the art will understand and implement the present invention without undue burden.
The foregoing description is only of the preferred embodiments of the present invention and is not intended to limit the scope of the present invention. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention are included in the protection scope of the present invention.
Claims (8)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202411313216.3A CN118817121B (en) | 2024-09-20 | 2024-09-20 | Parameter correction system for secondary measurement equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202411313216.3A CN118817121B (en) | 2024-09-20 | 2024-09-20 | Parameter correction system for secondary measurement equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN118817121A CN118817121A (en) | 2024-10-22 |
| CN118817121B true CN118817121B (en) | 2024-11-19 |
Family
ID=93077221
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202411313216.3A Active CN118817121B (en) | 2024-09-20 | 2024-09-20 | Parameter correction system for secondary measurement equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN118817121B (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CH685021A5 (en) * | 1993-05-05 | 1995-02-28 | Landis & Gyr Business Support | A method for adjusting a sensor-type-specific characteristic function of a resistance temperature sensor and apparatus for performing the method. |
| CN102735370A (en) * | 2012-06-27 | 2012-10-17 | 中国计量学院 | Remote calibration system and method for industrial thermal resistance |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005043143A (en) * | 2003-07-25 | 2005-02-17 | Sharp Corp | Internal temperature measuring method for electro-optic element, temperature measuring instrument, and display device using the measuring method |
| WO2015084410A1 (en) * | 2013-12-06 | 2015-06-11 | Intel Corporation | Method and apparatus for calibrating a sensor |
| CN103940533B (en) * | 2014-02-14 | 2016-08-24 | 湖北汽车工业学院 | ECTS investigating method and TT&C system thereof |
| JP6631880B2 (en) * | 2015-03-24 | 2020-01-15 | 株式会社ソフトエナジーコントロールズ | Inspection apparatus for power storage device and its calibration system |
| CN110954246B (en) * | 2019-02-27 | 2021-05-28 | 南京瑞贻电子科技有限公司 | Time domain calibration method for dynamic temperature measurement |
| CN211477455U (en) * | 2019-12-06 | 2020-09-11 | 广东省清远市质量计量监督检测所 | Switching system for secondary instrument for calibrating temperature |
| DE102020216148A1 (en) * | 2020-12-17 | 2022-06-23 | Robert Bosch Gesellschaft mit beschränkter Haftung | Method for calibrating a device for determining the temperature of a rotor of an electrical machine |
| CN215114937U (en) * | 2021-06-07 | 2021-12-10 | 大冶特殊钢有限公司 | Device for batch calibration of secondary instruments |
| CN113627427B (en) * | 2021-08-04 | 2023-09-22 | 中国兵器装备集团自动化研究所有限公司 | Instrument reading method and system based on image detection technology |
| CN115166492B (en) * | 2022-09-02 | 2022-12-20 | 珠海妙存科技有限公司 | Chip parameter acquisition circuit |
| CN118111593A (en) * | 2024-04-02 | 2024-05-31 | 山东磐然仪器集团有限公司 | Thermal instrument calibration system and two-way temperature control method thereof |
-
2024
- 2024-09-20 CN CN202411313216.3A patent/CN118817121B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CH685021A5 (en) * | 1993-05-05 | 1995-02-28 | Landis & Gyr Business Support | A method for adjusting a sensor-type-specific characteristic function of a resistance temperature sensor and apparatus for performing the method. |
| CN102735370A (en) * | 2012-06-27 | 2012-10-17 | 中国计量学院 | Remote calibration system and method for industrial thermal resistance |
Also Published As
| Publication number | Publication date |
|---|---|
| CN118817121A (en) | 2024-10-22 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN102353481B (en) | Method and device for complementing temperature and pressure of pressure sensor based on two-dimensional orthogonal function | |
| CN104075744B (en) | A kind of remote-measuring equipment automatization calibration system | |
| EP1192614A1 (en) | Measuring transducer having a corrected output signal | |
| CN102025364B (en) | Analog quantity input circuit using digital isolation and conditioning technology | |
| CN109245832A (en) | Test method, system and the test equipment of bluetooth mould group | |
| CN109507625A (en) | The automatic calibrating method and terminal device of battery simulator | |
| CN111398726B (en) | Method, system and equipment for testing charging and discharging response time of energy storage frequency modulation system | |
| CN111830350B (en) | Energy consumption metering method and device and electric appliance | |
| CN103995526B (en) | Power-supply controller of electric analog quantity parameter calibration system and method based on CAN | |
| CN118817121B (en) | Parameter correction system for secondary measurement equipment | |
| CN202748470U (en) | Multi-channel automatic data calibrating instrument for industrial measurement system | |
| CN115113125A (en) | Correction system of multichannel arbitrary waveform generator | |
| CN114139382A (en) | Calibration method, system and storage medium of analog quantity basic module | |
| CN110702157A (en) | Electronic instrument calibration system, electronic instrument calibration method and related product | |
| CN211653115U (en) | Automatic calibration system for digital current sensor | |
| CN219495288U (en) | Remote calibration system for humiture environment test equipment | |
| CN114295280B (en) | Pressure signal scanning measurement system | |
| CN203909609U (en) | Power supply controller analog quantity parameter calibration system base on CAN bus | |
| CN210166454U (en) | Electrical measurement and calibration device of comprehensive protection measurement and control device | |
| CN110634279B (en) | Non-contact self-learning severe environment temperature collector based on AVR single chip microcomputer | |
| CN114355014A (en) | Transformer substation secondary equipment adaptive to climate environment change and use method | |
| CN205352438U (en) | Low -cost electron measurement system of high accuracy | |
| CN107561355A (en) | A kind of temperature compensation system and method for peak power probe | |
| CN104038224A (en) | Calibration method and calibration system with high precision for analog quantity signals of servo driver | |
| CN111060222A (en) | Automatic sending device and method for measuring channel resistance value of temperature transmitter |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |