CN118746360A - Energy dispersive X-ray fluorescence spectrometer and calibration method thereof - Google Patents
Energy dispersive X-ray fluorescence spectrometer and calibration method thereof Download PDFInfo
- Publication number
- CN118746360A CN118746360A CN202410784873.XA CN202410784873A CN118746360A CN 118746360 A CN118746360 A CN 118746360A CN 202410784873 A CN202410784873 A CN 202410784873A CN 118746360 A CN118746360 A CN 118746360A
- Authority
- CN
- China
- Prior art keywords
- data
- module
- spectrometer
- spectral signal
- spectral
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims abstract description 27
- 238000002149 energy-dispersive X-ray emission spectroscopy Methods 0.000 title claims description 15
- 238000001228 spectrum Methods 0.000 claims abstract description 51
- 238000012937 correction Methods 0.000 claims abstract description 29
- 230000007613 environmental effect Effects 0.000 claims abstract description 29
- 238000004458 analytical method Methods 0.000 claims abstract description 26
- 238000012544 monitoring process Methods 0.000 claims abstract description 22
- 230000008569 process Effects 0.000 claims abstract description 8
- 230000003595 spectral effect Effects 0.000 claims description 137
- 238000001514 detection method Methods 0.000 claims description 42
- 238000012545 processing Methods 0.000 claims description 24
- 238000007781 pre-processing Methods 0.000 claims description 11
- 230000004044 response Effects 0.000 claims description 10
- 230000003287 optical effect Effects 0.000 claims description 9
- 230000008859 change Effects 0.000 claims description 8
- 238000000695 excitation spectrum Methods 0.000 claims description 8
- 238000007405 data analysis Methods 0.000 claims description 4
- 230000002159 abnormal effect Effects 0.000 abstract description 3
- 239000006185 dispersion Substances 0.000 abstract description 2
- 238000004876 x-ray fluorescence Methods 0.000 abstract description 2
- 230000006870 function Effects 0.000 description 36
- 230000005856 abnormality Effects 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 238000012360 testing method Methods 0.000 description 4
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000011088 calibration curve Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 101001121408 Homo sapiens L-amino-acid oxidase Proteins 0.000 description 1
- 102100026388 L-amino-acid oxidase Human genes 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 229910052729 chemical element Inorganic materials 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000013211 curve analysis Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 239000011593 sulfur Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
- G01J3/4406—Fluorescence spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/443—Emission spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J2003/283—Investigating the spectrum computer-interfaced
- G01J2003/2843—Processing for eliminating interfering spectra
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J2003/2866—Markers; Calibrating of scan
- G01J2003/2876—Correcting linearity of signal
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/30—Accessories, mechanical or electrical features
- G01N2223/303—Accessories, mechanical or electrical features calibrating, standardising
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
Description
技术领域Technical Field
本发明涉及光谱仪技术领域,尤其涉及一种能量色散X射线荧光光谱仪及其校正方法。The present invention relates to the technical field of spectrometers, and in particular to an energy dispersion X-ray fluorescence spectrometer and a calibration method thereof.
背景技术Background Art
中能X射线光谱仪的能量范围为2至5keV,介于软X射线和硬X射线的能量范围之间。该能量段涵盖了磷、硫、硅等化学元素的吸收边,在生命科学、半导体等领域中发挥着重要的作用。近些年来,随着中能X射线光谱仪的发展,对其自动化监测与控制系统提出了较高需求。例如,光谱仪需要兼顾多种非标准科学设备的监控需求,如X射线源、X射线探测器、晶体分析器等;需要满足不同功能的科学使用需求,如X射线辐射防护、真空互联保护、光谱仪扫描等。此外,在实现其工业化程度的监控稳定性基础上,该系统还需要具备出色的科学拓展性,可以根据新的科学需求做出相应的功能拓展;The energy range of medium-energy X-ray spectrometers is 2 to 5 keV, which is between the energy ranges of soft X-rays and hard X-rays. This energy range covers the absorption edges of chemical elements such as phosphorus, sulfur, and silicon, and plays an important role in life sciences, semiconductors and other fields. In recent years, with the development of medium-energy X-ray spectrometers, higher demands have been placed on their automated monitoring and control systems. For example, spectrometers need to take into account the monitoring needs of a variety of non-standard scientific equipment, such as X-ray sources, X-ray detectors, crystal analyzers, etc.; they need to meet the scientific use needs of different functions, such as X-ray radiation protection, vacuum interconnection protection, spectrometer scanning, etc. In addition, on the basis of achieving the monitoring stability of its industrialization level, the system also needs to have excellent scientific scalability, and can make corresponding functional expansions according to new scientific needs;
现在光谱仪在运行中,光谱仪内工作的环境和光谱信号接受等一些因素会造成光谱仪检测不准确的问题,现在光谱仪设备出现异常的时候,无法通过自检进行确定。Now that the spectrometer is in operation, some factors such as the working environment and spectral signal reception inside the spectrometer will cause inaccurate detection of the spectrometer. Now when the spectrometer equipment has an abnormality, it cannot be determined through self-test.
发明内容Summary of the invention
有鉴于此,本发明的目的在于提供一种能量色散X射线荧光光谱仪及其校正方法,以解决现有技术中现在光谱仪在运行中,光谱仪内工作的环境和光谱信号接受一些因素会造成光谱仪检测不准确,以及光谱仪设备出现异常的时候,无法通过自检进行确定的问题。In view of this, the purpose of the present invention is to provide an energy dispersive X-ray fluorescence spectrometer and a correction method thereof, so as to solve the problem in the prior art that when the spectrometer is in operation, the working environment and spectral signals in the spectrometer are subject to some factors which may cause inaccurate spectrometer detection, and when the spectrometer equipment has an abnormality, it cannot be determined through self-test.
根据本发明实施例的第一方面,提供一种能量色散X射线荧光光谱仪,According to a first aspect of an embodiment of the present invention, there is provided an energy dispersive X-ray fluorescence spectrometer,
包括控制系统,所述控制系统包括数据模块和分析模块;comprising a control system, the control system comprising a data module and an analysis module;
所述数据模块包括获取模块和上传模块,所述获取模块具体为获取光谱仪运行数据,所述获取模块获取数据至少包括:环境数据、光谱信号和设备运行参数数据;所述获取模块至少包括:环境数据获取模块、光谱信号获取模块,设备运行参数数据获取模块;所述上传模块用于将获取模块获取的数据进行转化为相对应的数据电信号上传至分析模块;The data module includes an acquisition module and an upload module. The acquisition module is specifically used to acquire the spectrometer operation data. The data acquired by the acquisition module at least includes: environmental data, spectral signals and equipment operation parameter data; the acquisition module at least includes: an environmental data acquisition module, a spectral signal acquisition module, and an equipment operation parameter data acquisition module; the upload module is used to convert the data acquired by the acquisition module into corresponding data electrical signals and upload them to the analysis module;
所述环境数据获取模块包括温度检测模块和湿度检测模块;The environmental data acquisition module includes a temperature detection module and a humidity detection module;
所述温度检测模块用于采集光谱仪运行时的温度检测数据并将采集的温度检测数据上传至上传模块;The temperature detection module is used to collect temperature detection data when the spectrometer is running and upload the collected temperature detection data to the upload module;
所述湿度检测模块用于对光谱仪运行时的湿度进行检测并将采集的湿度检测数据上传至上传模块;The humidity detection module is used to detect the humidity when the spectrometer is running and upload the collected humidity detection data to the upload module;
所述设备运行参数数据获取模块用于采集设备运行数据,并将所述设备运行数据上传至所述上传模块;其中,所述设备运行数据,包括:对激发光谱、光学系统、检测器主要参与工作的设备数据;The device operation parameter data acquisition module is used to collect device operation data and upload the device operation data to the upload module; wherein the device operation data includes: device data mainly involved in the work of the excitation spectrum, optical system, and detector;
所述光谱信号获取模块,包括:光谱采集模块和光谱数据处理模块;The spectrum signal acquisition module includes: a spectrum acquisition module and a spectrum data processing module;
所述光谱采集模块用于对产生的光谱信号进行采集;所述光谱数据处理模块用于对采集的光谱信号进行处理并将处理后的光谱信号上传至所述分析模块中;The spectrum acquisition module is used to acquire the generated spectrum signals; the spectrum data processing module is used to process the acquired spectrum signals and upload the processed spectrum signals to the analysis module;
所述分析模块用于将接收的数据电信号进行数据分析,确定光谱仪是否正常运行,以及基于预设的光谱数据处理模块处理后的光谱信号进行分析,结合当前获取光谱信号的温度数据下,进行光谱信号修改,得到修正后的目标光谱信号。The analysis module is used to perform data analysis on the received data electrical signal to determine whether the spectrometer is operating normally, and to analyze the spectral signal processed by the preset spectral data processing module, and to modify the spectral signal in combination with the temperature data of the currently acquired spectral signal to obtain a corrected target spectral signal.
进一步地,所述分析模块,采用分布式计算架构,包括:基于Hadoop或Spark的分布式计算平台。Furthermore, the analysis module adopts a distributed computing architecture, including: a distributed computing platform based on Hadoop or Spark.
进一步地,所述光谱数据处理模块具体包括数据预处理单元和数据校正单元;Furthermore, the spectral data processing module specifically includes a data preprocessing unit and a data correction unit;
所述数据预处理单元用于将采集的光谱信号进行去背景、去噪操作,得到第一处理数据;The data preprocessing unit is used to perform background removal and noise removal operations on the collected spectral signal to obtain first processed data;
所述数据校正单元用于对仪器响应校正或对所述第一处理数据波长校正,以消除光谱数据中的波长偏移或非线性响应。The data correction unit is used to correct the instrument response or the wavelength of the first processed data to eliminate the wavelength shift or nonlinear response in the spectral data.
进一步地,所述控制系统还包括:Furthermore, the control system further comprises:
基于PLC和Python搭建的光谱仪监测与控制平台,通过所述基于PLC和Python的光谱仪监测与控制平台,对所述中能X射线光谱仪装置进行实时监测与控制。A spectrometer monitoring and control platform based on PLC and Python is used to monitor and control the medium-energy X-ray spectrometer device in real time.
根据本发明实施例的第二方面,提供一种能量色散X射线荧光光谱仪的矫正方法,应用于上述中任一项所述的一种能量色散X射线荧光光谱仪,其特征在于,所述方法包括:According to a second aspect of an embodiment of the present invention, a correction method for an energy dispersive X-ray fluorescence spectrometer is provided, which is applied to any one of the energy dispersive X-ray fluorescence spectrometers described above, and is characterized in that the method comprises:
获取光谱仪运行数据,所述光谱仪运行数据至少包括:环境数据、光谱信号和设备运行参数数据;所述环境数据,包括:光谱仪运行时的温度检测数据、光谱仪运行时的湿度检测数据;所述设备运行参数数据,包括:激发光谱、光学系统、检测器主要参与工作的设备数据;Acquire spectrometer operation data, the spectrometer operation data at least including: environmental data, spectral signals and equipment operation parameter data; the environmental data including: temperature detection data when the spectrometer is running, humidity detection data when the spectrometer is running; the equipment operation parameter data including: equipment data mainly involved in the work of the excitation spectrum, optical system and detector;
将所述光谱仪运行数据上传至预设的上传模块,并利用所述光谱仪运行时的温度检测数据、光谱仪运行时的湿度检测数据构建环境参数数据库;The operating data of the spectrometer is uploaded to a preset uploading module, and the temperature detection data when the spectrometer is running and the humidity detection data when the spectrometer is running are used to build an environmental parameter database;
利用所述环境参数数据库以及所述设备运行参数数据,构建拟合函数,利用所述拟合函数判断在不同条件下波峰拟合函数的变化趋势以及波谷拟合函数的变化趋势,以确定光谱仪的运行状态;其中,所述拟合函数,包括:波峰拟合函数和波谷拟合函数;Using the environmental parameter database and the equipment operation parameter data, a fitting function is constructed, and the fitting function is used to judge the change trend of the peak fitting function and the change trend of the trough fitting function under different conditions to determine the operating state of the spectrometer; wherein the fitting function includes: a peak fitting function and a trough fitting function;
对所述光谱信号进行预处理,将预处理后的光谱信号数据结合当前获取光谱信号的温度数据,进行光谱信号修改,得到修正后的目标光谱信号。The spectral signal is preprocessed, and the preprocessed spectral signal data is combined with the temperature data of the currently acquired spectral signal to modify the spectral signal to obtain a corrected target spectral signal.
进一步地,所述对所述光谱信号进行预处理,将预处理后的光谱信号数据结合当前获取光谱信号的温度数据,进行光谱信号修改,得到修正后的目标光谱信号,包括:Further, the spectral signal is preprocessed, and the preprocessed spectral signal data is combined with the temperature data of the currently acquired spectral signal to modify the spectral signal to obtain a corrected target spectral signal, including:
对所述光谱信号进行去背景、去噪处理,得到第一处理数据;Performing background removal and noise removal processing on the spectral signal to obtain first processed data;
对所述第一处理数据进行波长校正,得到第二处理数据;performing wavelength correction on the first processed data to obtain second processed data;
利用所述第二处理数据,基于当前获取光谱信号的温度数据下,利用预设温度补偿修正公式,对目标光谱信号进行修正处理,得到修正后的光谱像元位置;Using the second processed data, based on the temperature data of the currently acquired spectral signal, and using a preset temperature compensation correction formula, the target spectral signal is corrected to obtain a corrected spectral pixel position;
其中,所述温度补偿修正公式,如下式所示:The temperature compensation correction formula is as follows:
λ=f[s,Δs(T)] (1)λ=f[s,Δs(T)] (1)
其中,λ为修正后的目标光谱信号中的光谱像元位置,s为目标光谱信号中的光谱像元位置,T为检测温度,Δs=a0+a1*T+a2*T2+a3*T3+a4+T4,a0、a1、a2、a3、a4为预设标定系数;Wherein, λ is the spectral pixel position in the corrected target spectral signal, s is the spectral pixel position in the target spectral signal, T is the detected temperature, Δs=a 0 +a 1 *T+a 2 *T2+a 3 *T3+a 4 +T4, a 0 , a 1 , a 2 , a 3 , a 4 are preset calibration coefficients;
基于修正后的光谱像元位置得到修正后的目标光谱信号。A corrected target spectral signal is obtained based on the corrected spectral pixel position.
本发明的实施例提供的技术方案可以包括以下有益效果:The technical solution provided by the embodiments of the present invention may have the following beneficial effects:
可以理解的是,本发明提供的技术方案,包括:所述控制系统包括数据模块和分析模块;所述数据模块包括获取模块和上传模块,所述获取模块具体为获取光谱仪运行数据,所述获取模块获取数据至少包括:环境数据、光谱信号和设备运行参数数据;所述获取模块至少包括:环境数据获取模块、光谱信号获取模块,设备运行参数数据获取模块;所述上传模块用于将获取模块获取的数据进行转化为相对应的数据电信号上传至分析模块;所述环境数据获取模块包括温度检测模块和湿度检测模块;所述温度检测模块用于采集光谱仪运行时的温度检测数据并将采集的温度检测数据上传至上传模块;所述湿度检测模块用于对光谱仪运行时的湿度进行检测并将采集的湿度检测数据上传至上传模块;所述设备运行参数数据获取模块用于采集设备运行数据,并将所述设备运行数据上传至所述上传模块;其中,所述设备运行数据,包括:对激发光谱、光学系统、检测器主要参与工作的设备数据;所述光谱信号获取模块,包括:光谱采集模块和光谱数据处理模块;所述光谱采集模块用于对产生的光谱信号进行采集;所述光谱数据处理模块用于对采集的光谱信号进行处理并将处理后的光谱信号上传至所述分析模块中;所述分析模块用于将接收的数据电信号进行数据分析,确定光谱仪是否正常运行,以及基于预设的光谱数据处理模块处理后的光谱信号进行分析,结合当前获取光谱信号的温度数据下,进行光谱信号修改,得到修正后的目标光谱信号。可以理解的是,本发明提供的技术方案,可对运行过程中的光谱仪受到影响的环境和光谱信号进行诊断,判定光谱仪在不同的运行条件下是否存在异常,以实现进行运行监测的目的,同时可对光谱信号进行滤波和修正处理,使光谱数据的稳定性和可靠性得到进一步的提高,提高了光谱仪的精确度。It can be understood that the technical solution provided by the present invention includes: the control system includes a data module and an analysis module; the data module includes an acquisition module and an upload module, the acquisition module is specifically used to acquire the operating data of the spectrometer, and the data acquired by the acquisition module at least includes: environmental data, spectral signals and equipment operating parameter data; the acquisition module at least includes: an environmental data acquisition module, a spectral signal acquisition module, and an equipment operating parameter data acquisition module; the upload module is used to convert the data acquired by the acquisition module into corresponding data electrical signals and upload them to the analysis module; the environmental data acquisition module includes a temperature detection module and a humidity detection module; the temperature detection module is used to collect temperature detection data when the spectrometer is running and upload the collected temperature detection data to the upload module; the humidity detection module is used to detect the humidity when the spectrometer is running and upload the collected humidity detection data The data is uploaded to the upload module; the equipment operation parameter data acquisition module is used to collect equipment operation data and upload the equipment operation data to the upload module; wherein the equipment operation data includes: the equipment data mainly involved in the work of the excitation spectrum, the optical system, and the detector; the spectrum signal acquisition module includes: a spectrum acquisition module and a spectrum data processing module; the spectrum acquisition module is used to collect the generated spectrum signal; the spectrum data processing module is used to process the collected spectrum signal and upload the processed spectrum signal to the analysis module; the analysis module is used to perform data analysis on the received data electrical signal to determine whether the spectrometer is operating normally, and analyze the spectrum signal processed by the preset spectrum data processing module, and modify the spectrum signal under the temperature data of the current spectrum signal acquisition to obtain the corrected target spectrum signal. It can be understood that the technical solution provided by the present invention can diagnose the environment and spectrum signal affected by the spectrometer during operation, determine whether the spectrometer is abnormal under different operating conditions, so as to achieve the purpose of operation monitoring, and filter and correct the spectrum signal at the same time, so that the stability and reliability of the spectrum data are further improved, and the accuracy of the spectrometer is improved.
应当理解的是,以上的一般描述和后文的细节描述仅是示例性和解释性的,并不能限制本发明。It is to be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the invention.
附图说明BRIEF DESCRIPTION OF THE DRAWINGS
此处的附图被并入说明书中并构成本说明书的一部分,示出了符合本发明的实施例,并与说明书一起用于解释本发明的原理。The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.
图1是根据一示例性实施例示出的一种能量色散X射线荧光光谱仪的装置组成示意图;FIG1 is a schematic diagram showing the composition of an energy dispersive X-ray fluorescence spectrometer according to an exemplary embodiment;
图2是根据一示例性实施例示出的一种能量色散X射线荧光光谱仪的校正方法步骤流程图。FIG. 2 is a flowchart showing steps of a calibration method for an energy dispersive X-ray fluorescence spectrometer according to an exemplary embodiment.
具体实施方式DETAILED DESCRIPTION
这里将详细地对示例性实施例进行说明,其示例表示在附图中。下面的描述涉及附图时,除非另有表示,不同附图中的相同数字表示相同或相似的要素。以下示例性实施例中所描述的实施方式并不代表与本发明相一致的所有实施方式。相反,它们仅是与如所附权利要求书中所详述的、本发明的一些方面相一致的装置和方法的例子。Exemplary embodiments will be described in detail herein, examples of which are shown in the accompanying drawings. When the following description refers to the drawings, the same numbers in different drawings represent the same or similar elements unless otherwise indicated. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present invention. Instead, they are merely examples of devices and methods consistent with some aspects of the present invention as detailed in the appended claims.
实施例一Embodiment 1
请参阅图1,图1是根据一示例性实施例示出的一种能量色散X射线荧光光谱仪的装置组成示意图,包括:Please refer to FIG. 1 , which is a schematic diagram of a device composition of an energy dispersive X-ray fluorescence spectrometer according to an exemplary embodiment, including:
包括控制系统10,其特征在于,所述控制系统10包括数据模块21和分析模块20;It includes a control system 10, characterized in that the control system 10 includes a data module 21 and an analysis module 20;
所述数据模块21包括获取模块211和上传模块212,所述获取模块211具体为获取光谱仪运行数据,所述获取模块211获取数据至少包括:环境数据、光谱信号和设备运行参数数据;所述获取模块211至少包括:环境数据获取模块01获取模块211、光谱信号获取模块02获取模块211,设备运行参数数据获取模块03获取模块211;所述上传模块212用于将获取模块211获取的数据进行转化为相对应的数据电信号上传至分析模块20;The data module 21 includes an acquisition module 211 and an upload module 212. The acquisition module 211 is specifically used to acquire the spectrometer operation data. The data acquired by the acquisition module 211 at least includes: environmental data, spectral signals and equipment operation parameter data; the acquisition module 211 at least includes: environmental data acquisition module 01 acquisition module 211, spectral signal acquisition module 02 acquisition module 211, equipment operation parameter data acquisition module 03 acquisition module 211; the upload module 212 is used to convert the data acquired by the acquisition module 211 into corresponding data electrical signals and upload them to the analysis module 20;
所述环境数据获取模块01获取模块211包括温度检测模块011和湿度检测模块012;The environmental data acquisition module 01 acquisition module 211 includes a temperature detection module 011 and a humidity detection module 012;
所述温度检测模块011用于采集光谱仪运行时的温度检测数据并将采集的温度检测数据上传至上传模块212;The temperature detection module 011 is used to collect temperature detection data when the spectrometer is running and upload the collected temperature detection data to the upload module 212;
所述湿度检测模块012用于对光谱仪运行时的湿度进行检测并将采集的湿度检测数据上传至上传模块212;The humidity detection module 012 is used to detect the humidity when the spectrometer is running and upload the collected humidity detection data to the upload module 212;
所述设备运行参数数据获取模块03获取模块211用于采集设备运行数据,并将所述设备运行数据上传至所述上传模块212;其中,所述设备运行数据,包括:对激发光谱、光学系统、检测器主要参与工作的设备数据;The device operation parameter data acquisition module 03 acquisition module 211 is used to collect device operation data and upload the device operation data to the upload module 212; wherein the device operation data includes: device data mainly involved in the work of the excitation spectrum, optical system, and detector;
所述光谱信号获取模块02获取模块211,包括:光谱采集模块021和光谱数据处理模块022;The spectrum signal acquisition module 02 acquisition module 211 includes: a spectrum acquisition module 021 and a spectrum data processing module 022;
所述光谱采集模块021用于对产生的光谱信号进行采集;所述光谱数据处理模块022用于对采集的光谱信号进行处理并将处理后的光谱信号上传至所述分析模块20中;The spectrum acquisition module 021 is used to acquire the generated spectrum signal; the spectrum data processing module 022 is used to process the acquired spectrum signal and upload the processed spectrum signal to the analysis module 20;
所述分析模块20用于将接收的数据电信号进行数据分析,确定光谱仪是否正常运行,以及基于预设的光谱数据处理模块022处理后的光谱信号进行分析,结合当前获取光谱信号的温度数据下,进行光谱信号修改,得到修正后的目标光谱信号。The analysis module 20 is used to perform data analysis on the received data electrical signal to determine whether the spectrometer is operating normally, and to analyze the spectral signal processed by the preset spectral data processing module 022, and to modify the spectral signal in combination with the temperature data of the currently acquired spectral signal to obtain a corrected target spectral signal.
在一个实施例中,本发明中可对运行过程中的光谱仪受到影响的环境和光谱信号进行诊断,判定光谱仪在不同的运行条件下是否存在异常,以实现进行运行监测的目的,同时可对光谱信号进行滤波和修正处理,使光谱数据的稳定性和可靠性得到进一步的提高,提高了光谱仪的精确度。In one embodiment, the present invention can diagnose the environment and spectral signals affected by the spectrometer during operation, determine whether the spectrometer has abnormalities under different operating conditions, so as to achieve the purpose of operation monitoring, and at the same time filter and correct the spectral signals to further improve the stability and reliability of the spectral data, thereby improving the accuracy of the spectrometer.
进一步地,所述分析模块20,采用分布式计算架构,包括:基于Hadoop或Spark的分布式计算平台。Furthermore, the analysis module 20 adopts a distributed computing architecture, including: a distributed computing platform based on Hadoop or Spark.
进一步地,所述光谱数据处理模块022具体包括数据预处理单元和数据校正单元;Furthermore, the spectral data processing module 022 specifically includes a data preprocessing unit and a data correction unit;
所述数据预处理单元用于将采集的光谱信号进行去背景、去噪操作,得到第一处理数据;The data preprocessing unit is used to perform background removal and noise removal operations on the collected spectral signal to obtain first processed data;
所述数据校正单元用于对仪器响应校正或对所述第一处理数据波长校正,以消除光谱数据中的波长偏移或非线性响应。The data correction unit is used to correct the instrument response or the wavelength of the first processed data to eliminate the wavelength shift or nonlinear response in the spectral data.
进一步地,所述控制系统10还包括:Furthermore, the control system 10 further includes:
基于PLC和Python搭建的光谱仪监测与控制平台,通过所述基于PLC和Python的光谱仪监测与控制平台,对所述中能X射线光谱仪装置进行实时监测与控制。A spectrometer monitoring and control platform based on PLC and Python is used to monitor and control the medium-energy X-ray spectrometer device in real time.
在具体实施时,所述设备运行数据具体包括对激发光谱、光学系统、检测器等主要参与工作的设备数据进行采集,基于上述得出的环境数据下进行记录并通过上传模块212进行上传,上传的设备运行数据基于环境参数数据库通过分析模块20进行曲线分析,构建拟合函数,所述拟合函数包括波峰拟合函数以及波谷拟合函数,基于环境数据下采集的设备运行参数数据通过分析模块20进行定量分析,具体的,为了分析光谱仪是否正常工作,将光谱仪在不同条件下的设备运行参数进行比对,而设备运行参数通过两组函数进行表征,即为波峰拟合函数和波谷拟合函数,判断在不同条件下波峰拟合函数的变化趋势以及波谷拟合函数的变化趋势,如光谱仪在特定工作区间内,其稳定性更加,当超出上述工作区间,则其稳定性将会递减,如温度越高,其稳定性越差,若通过比较,发现上述波峰拟合函数和波谷拟合函数体现得到的稳定性反而更加稳定,则判定光谱仪存在异常,存在两组变量,即为样本变量以及环境条件变量,分析时,确定一组变量,去改变另一组变量,确定这种条件下,波峰拟合函数和波谷拟合函数的稳定性,从而进行判定,确定光谱仪是否正常运行;In the specific implementation, the equipment operation data specifically includes collecting the equipment data mainly involved in the work, such as the excitation spectrum, the optical system, and the detector, recording based on the environmental data obtained above and uploading through the uploading module 212, and the uploaded equipment operation data is subjected to curve analysis through the analysis module 20 based on the environmental parameter database to construct a fitting function, and the fitting function includes a peak fitting function and a trough fitting function, and the equipment operation parameter data collected based on the environmental data is quantitatively analyzed through the analysis module 20. Specifically, in order to analyze whether the spectrometer is working normally, the equipment operation parameters of the spectrometer under different conditions are compared, and the equipment operation parameters are characterized by two groups of functions, namely The peak fitting function and the trough fitting function are used to determine the changing trends of the peak fitting function and the trough fitting function under different conditions. For example, the stability of the spectrometer is better within a specific working range. When the working range is exceeded, the stability will decrease. For example, the higher the temperature, the worse the stability. If, by comparison, it is found that the stability obtained by the peak fitting function and the trough fitting function is more stable, then it is determined that the spectrometer is abnormal. There are two groups of variables, namely, sample variables and environmental condition variables. During analysis, one group of variables is determined to change the other group of variables to determine the stability of the peak fitting function and the trough fitting function under such conditions, so as to determine whether the spectrometer is operating normally.
所述光谱信号包括光谱采集模块021和光谱数据处理模块022,所述光谱采集模块021对产生的光谱信号进行采集,后通过光谱数据处理模块022进行处理,处理后光谱数据通过上传模块212进行到分析模块20内。The spectral signal includes a spectral acquisition module 021 and a spectral data processing module 022 . The spectral acquisition module 021 acquires the generated spectral signal, and then processes it through the spectral data processing module 022 . The processed spectral data is uploaded to the analysis module 20 through the upload module 212 .
所述光谱数据处理模块022具体包括数据预处理单元和数据校正单元;The spectral data processing module 022 specifically includes a data preprocessing unit and a data correction unit;
所述数据预处理单元将采集的光谱信号进行去背景、去噪等操作;去背景可以消除背景噪声和非采样物质的干扰;去噪则是对光谱信号进行平滑或降噪处理,以提高数据质量;The data preprocessing unit performs background removal and denoising operations on the collected spectral signals; background removal can eliminate background noise and interference from non-sampled substances; denoising is to smooth or reduce noise on the spectral signals to improve data quality;
所述数据校正单元进行仪器响应校正或波长校正,以消除光谱数据中的波长偏移或非线性响应;校正方法可以基于参考标准物质或校准曲线,将测量的光谱数据转换为准确可靠的结果;The data correction unit performs instrument response correction or wavelength correction to eliminate wavelength shift or nonlinear response in the spectral data; the correction method can convert the measured spectral data into accurate and reliable results based on reference standard substances or calibration curves;
将通过光谱数据处理模块022分析后等到后的精准数据通过分析模块20进行分析,基于当前获取光谱信号的温度数据下,进行光谱信号修改;The accurate data after being analyzed by the spectrum data processing module 022 is analyzed by the analysis module 20, and the spectrum signal is modified based on the temperature data of the currently acquired spectrum signal;
基于检测温度对目标光谱信号进行修正处理包括:将检测温度代入预设温度补偿修正公式即式(1)中,以对目标光谱信号进行修正处理;Correcting the target spectral signal based on the detected temperature includes: substituting the detected temperature into a preset temperature compensation correction formula, i.e., formula (1), to correct the target spectral signal;
λ=f[s,Δs(T)] (1)λ=f[s,Δs(T)] (1)
在式(1)中,λ为修正后的目标光谱信号中的光谱像元位置,s为目标光谱信号中的光谱像元位置,T为检测温度,Δs=a0+a1*T+a2*T2+a3*T3+a4+T4,a0、a1、a2、a3、a4为预设标定系数;目标光谱信号包括多个光谱像元位置,对每个光谱像元位置用上述公式进行修正得到修正后的光谱像元位置,基于修正后的光谱像元位置得到修正后的目标光谱信号。In formula (1), λ is the spectral pixel position in the corrected target spectral signal, s is the spectral pixel position in the target spectral signal, T is the detected temperature, Δs= a0 + a1 *T+ a2 *T2+ a3 *T3+ a4 +T4, a0 , a1 , a2 , a3 , a4 are preset calibration coefficients; the target spectral signal includes multiple spectral pixel positions, each spectral pixel position is corrected by the above formula to obtain a corrected spectral pixel position, and a corrected target spectral signal is obtained based on the corrected spectral pixel position.
所述控制系统10还包括基于PLC和Python搭建的光谱仪监测与控制平台,通过所述基于PLC和Python的光谱仪监测与控制平台,对所述中能X射线光谱仪装置进行实时监测与控制,所述中能X射线光谱仪装置的目标监控需求,利用Python的PyQt5库,设计光谱仪集成化监控图形界面;The control system 10 also includes a spectrometer monitoring and control platform based on PLC and Python, through which the medium-energy X-ray spectrometer device is monitored and controlled in real time. The target monitoring requirements of the medium-energy X-ray spectrometer device are met by designing a spectrometer integrated monitoring graphical interface using Python's PyQt5 library;
将通过监控电路测试的光谱仪监控程序以及光谱仪集成化监控图形界面应用于所述计算机设备,以获得所述光谱仪监测与控制平台。The spectrometer monitoring program and the spectrometer integrated monitoring graphical interface that have passed the monitoring circuit test are applied to the computer device to obtain the spectrometer monitoring and control platform.
在一个实施例中,本申请利用将光谱仪在不同条件下的设备运行参数进行比对,而设备运行参数通过两组函数进行表征,判断在不同条件下波峰拟合函数的变化趋势以及波谷拟合函数的变化趋势,判定光谱仪在不同的运行条件下是否存在异常,以实现进行运行监测的目的;同时可对光谱信号进行滤波和修正处理,使光谱数据的稳定性和可靠性得到进一步的提高,提高了光谱仪的精确度。In one embodiment, the present application compares the equipment operating parameters of the spectrometer under different conditions, and the equipment operating parameters are characterized by two sets of functions, to judge the changing trend of the peak fitting function and the changing trend of the trough fitting function under different conditions, to determine whether there is an abnormality in the spectrometer under different operating conditions, so as to achieve the purpose of operation monitoring; at the same time, the spectral signal can be filtered and corrected, so that the stability and reliability of the spectral data are further improved, and the accuracy of the spectrometer is improved.
显然,本领域的技术人员可以对本发明进行各种改动和变型而不脱离本发明的精神和范围。这样,倘若本发明的这些修改和变型属于本发明权利要求及其等同技术的范围之内,则本发明也意图包含这些改动和变型在内。Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include these modifications and variations.
请参阅图2,图2是根据一示例性实施例示出的一种能量色散X射线荧光光谱仪的校正方法步骤流程图,所述方法包括:Please refer to FIG. 2 , which is a flowchart of a calibration method for an energy dispersive X-ray fluorescence spectrometer according to an exemplary embodiment. The method includes:
S1.获取光谱仪运行数据,所述光谱仪运行数据至少包括:环境数据、光谱信号和设备运行参数数据;所述环境数据,包括:光谱仪运行时的温度检测数据、光谱仪运行时的湿度检测数据;所述设备运行参数数据,包括:激发光谱、光学系统、检测器主要参与工作的设备数据;S1. Obtain spectrometer operation data, the spectrometer operation data at least including: environmental data, spectral signal and equipment operation parameter data; the environmental data includes: temperature detection data when the spectrometer is running, humidity detection data when the spectrometer is running; the equipment operation parameter data includes: excitation spectrum, optical system, detector main equipment data;
S2.将所述光谱仪运行数据上传至预设的上传模块,并利用所述光谱仪运行时的温度检测数据、光谱仪运行时的湿度检测数据构建环境参数数据库;S2. Upload the spectrometer operation data to a preset upload module, and use the temperature detection data when the spectrometer is running and the humidity detection data when the spectrometer is running to build an environmental parameter database;
S3.利用所述环境参数数据库以及所述设备运行参数数据,构建拟合函数,利用所述拟合函数判断在不同条件下波峰拟合函数的变化趋势以及波谷拟合函数的变化趋势,以确定光谱仪的运行状态;其中,所述拟合函数,包括:波峰拟合函数和波谷拟合函数;S3. Using the environmental parameter database and the equipment operation parameter data, construct a fitting function, and use the fitting function to determine the change trend of the peak fitting function and the change trend of the trough fitting function under different conditions to determine the operating state of the spectrometer; wherein the fitting function includes: a peak fitting function and a trough fitting function;
S4.对所述光谱信号进行预处理,将预处理后的光谱信号数据结合当前获取光谱信号的温度数据,进行光谱信号修改,得到修正后的目标光谱信号。S4. Preprocess the spectral signal, combine the preprocessed spectral signal data with the temperature data of the currently acquired spectral signal, modify the spectral signal, and obtain a corrected target spectral signal.
在一个实施例中,所述对所述光谱信号进行预处理,将预处理后的光谱信号数据结合当前获取光谱信号的温度数据,进行光谱信号修改,得到修正后的目标光谱信号,包括:In one embodiment, the preprocessing of the spectral signal, combining the preprocessed spectral signal data with the temperature data of the currently acquired spectral signal, modifying the spectral signal, and obtaining a corrected target spectral signal includes:
对所述光谱信号进行去背景、去噪处理,得到第一处理数据;Performing background removal and noise removal processing on the spectral signal to obtain first processed data;
对所述第一处理数据进行波长校正,得到第二处理数据;performing wavelength correction on the first processed data to obtain second processed data;
利用所述第二处理数据,基于当前获取光谱信号的温度数据下,利用预设温度补偿修正公式,对目标光谱信号进行修正处理,得到修正后的光谱像元位置;Using the second processed data, based on the temperature data of the currently acquired spectral signal, and using a preset temperature compensation correction formula, the target spectral signal is corrected to obtain a corrected spectral pixel position;
其中,所述温度补偿修正公式,如下式所示:The temperature compensation correction formula is as follows:
λ=f[s,Δs(T)] (1)λ=f[s,Δs(T)] (1)
其中,λ为修正后的目标光谱信号中的光谱像元位置,s为目标光谱信号中的光谱像元位置,T为检测温度,Δs=a0+a1*T+a2*T2+a3*T3+a4+T4,a0、a1、a2、a3、a4为预设标定系数;Wherein, λ is the spectral pixel position in the corrected target spectral signal, s is the spectral pixel position in the target spectral signal, T is the detected temperature, Δs=a 0 +a 1 *T+a 2 *T2+a 3 *T3+a 4 +T4, a 0 , a 1 , a 2 , a 3 , a 4 are preset calibration coefficients;
基于修正后的光谱像元位置得到修正后的目标光谱信号。A corrected target spectral signal is obtained based on the corrected spectral pixel position.
在具体实施时,所述数据预处理单元将采集的光谱信号进行去背景、去噪等操作;去背景可以消除背景噪声和非采样物质的干扰;去噪则是对光谱信号进行平滑或降噪处理,以提高数据质量;In specific implementation, the data preprocessing unit performs background removal, denoising and other operations on the collected spectral signal; background removal can eliminate background noise and interference from non-sampled substances; denoising is to smooth or reduce noise on the spectral signal to improve data quality;
所述数据校正单元进行仪器响应校正或波长校正,以消除光谱数据中的波长偏移或非线性响应;校正方法可以基于参考标准物质或校准曲线,将测量的光谱数据转换为准确可靠的结果;The data correction unit performs instrument response correction or wavelength correction to eliminate wavelength shift or nonlinear response in the spectral data; the correction method can convert the measured spectral data into accurate and reliable results based on reference standard substances or calibration curves;
将通过光谱数据处理模块分析后等到后的精准数据通过分析模块进行分析,基于当前获取光谱信号的温度数据下,进行光谱信号修改;The accurate data after being analyzed by the spectrum data processing module is analyzed by the analysis module, and the spectrum signal is modified based on the temperature data of the currently acquired spectrum signal;
基于检测温度对目标光谱信号进行修正处理包括:将检测温度代入预设温度补偿修正公式即式(1)中,以对目标光谱信号进行修正处理;Correcting the target spectral signal based on the detected temperature includes: substituting the detected temperature into a preset temperature compensation correction formula, i.e., formula (1), to correct the target spectral signal;
其中,目标光谱信号包括多个光谱像元位置,对每个光谱像元位置用上述公式进行修正得到修正后的光谱像元位置,基于修正后的光谱像元位置得到修正后的目标光谱信号。The target spectral signal includes a plurality of spectral pixel positions, each spectral pixel position is corrected by using the above formula to obtain a corrected spectral pixel position, and a corrected target spectral signal is obtained based on the corrected spectral pixel position.
所述控制系统还包括基于PLC和Python搭建的光谱仪监测与控制平台,通过所述基于PLC和Python的光谱仪监测与控制平台,对所述中能X射线光谱仪装置进行实时监测与控制,所述中能X射线光谱仪装置的目标监控需求,利用Python的PyQt5库,设计光谱仪集成化监控图形界面;The control system also includes a spectrometer monitoring and control platform based on PLC and Python, through which the medium-energy X-ray spectrometer device is monitored and controlled in real time. The target monitoring requirements of the medium-energy X-ray spectrometer device are met by designing a spectrometer integrated monitoring graphical interface using Python's PyQt5 library;
将通过监控电路测试的光谱仪监控程序以及光谱仪集成化监控图形界面应用于所述计算机设备,以获得所述光谱仪监测与控制平台。The spectrometer monitoring program and the spectrometer integrated monitoring graphic interface that have passed the monitoring circuit test are applied to the computer device to obtain the spectrometer monitoring and control platform.
可以理解的是,上述各实施例中相同或相似部分可以相互参考,在一些实施例中未详细说明的内容可以参见其他实施例中相同或相似的内容。It can be understood that the same or similar parts of the above embodiments can be referenced to each other, and the contents not described in detail in some embodiments can refer to the same or similar contents in other embodiments.
需要说明的是,在本发明的描述中,术语“第一”、“第二”等仅用于描述目的,而不能理解为指示或暗示相对重要性。此外,在本发明的描述中,除非另有说明,“多个”的含义是指至少两个。It should be noted that, in the description of the present invention, the terms "first", "second", etc. are only used for descriptive purposes and cannot be understood as indicating or implying relative importance. In addition, in the description of the present invention, unless otherwise specified, the meaning of "plurality" refers to at least two.
流程图中或在此以其他方式描述的任何过程或方法描述可以被理解为,表示包括一个或更多个用于实现特定逻辑功能或过程的步骤的可执行指令的代码的模块、片段或部分,并且本发明的优选实施方式的范围包括另外的实现,其中可以不按所示出或讨论的顺序,包括根据所涉及的功能按基本同时的方式或按相反的顺序,来执行功能,这应被本发明的实施例所属技术领域的技术人员所理解。Any process or method description in a flowchart or otherwise described herein may be understood to represent a module, segment or portion of code that includes one or more executable instructions for implementing the steps of a specific logical function or process, and the scope of the preferred embodiments of the present invention includes alternative implementations in which functions may not be performed in the order shown or discussed, including performing functions in a substantially simultaneous manner or in the reverse order depending on the functions involved, which should be understood by those skilled in the art to which the embodiments of the present invention belong.
应当理解,本发明的各部分可以用硬件、软件、固件或它们的组合来实现。在上述实施方式中,多个步骤或方法可以用存储在存储器中且由合适的指令执行系统执行的软件或固件来实现。例如,如果用硬件来实现,和在另一实施方式中一样,可用本领域公知的下列技术中的任一项或他们的组合来实现:具有用于对数据信号实现逻辑功能的逻辑门电路的离散逻辑电路,具有合适的组合逻辑门电路的专用集成电路,可编程门阵列(PGA),现场可编程门阵列(FPGA)等。It should be understood that the various parts of the present invention can be implemented by hardware, software, firmware or a combination thereof. In the above-mentioned embodiments, a plurality of steps or methods can be implemented by software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented by hardware, as in another embodiment, it can be implemented by any one of the following technologies known in the art or a combination thereof: a discrete logic circuit having a logic gate circuit for implementing a logic function for a data signal, a dedicated integrated circuit having a suitable combination of logic gate circuits, a programmable gate array (PGA), a field programmable gate array (FPGA), etc.
本技术领域的普通技术人员可以理解实现上述实施例方法携带的全部或部分步骤是可以通过程序来指令相关的硬件完成,所述的程序可以存储于一种计算机可读存储介质中,该程序在执行时,包括方法实施例的步骤之一或其组合。A person skilled in the art may understand that all or part of the steps in the method for implementing the above-mentioned embodiment may be completed by instructing related hardware through a program, and the program may be stored in a computer-readable storage medium, which, when executed, includes one or a combination of the steps of the method embodiment.
此外,在本发明各个实施例中的各功能单元可以集成在一个处理模块中,也可以是各个单元单独物理存在,也可以两个或两个以上单元集成在一个模块中。上述集成的模块既可以采用硬件的形式实现,也可以采用软件功能模块的形式实现。所述集成的模块如果以软件功能模块的形式实现并作为独立的产品销售或使用时,也可以存储在一个计算机可读取存储介质中。In addition, each functional unit in each embodiment of the present invention may be integrated into a processing module, or each unit may exist physically separately, or two or more units may be integrated into one module. The above-mentioned integrated module may be implemented in the form of hardware or in the form of a software functional module. If the integrated module is implemented in the form of a software functional module and sold or used as an independent product, it may also be stored in a computer-readable storage medium.
上述提到的存储介质可以是只读存储器,磁盘或光盘等。The storage medium mentioned above can be a read-only memory, a magnetic disk or an optical disk, etc.
在本说明书的描述中,参考术语“一个实施例”、“一些实施例”、“示例”、“具体示例”、或“一些示例”等的描述意指结合该实施例或示例描述的具体特征、结构、材料或者特点包含于本发明的至少一个实施例或示例中。在本说明书中,对上述术语的示意性表述不一定指的是相同的实施例或示例。而且,描述的具体特征、结构、材料或者特点可以在任何的一个或多个实施例或示例中以合适的方式结合。In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.
尽管上面已经示出和描述了本发明的实施例,可以理解的是,上述实施例是示例性的,不能理解为对本发明的限制,本领域的普通技术人员在本发明的范围内可以对上述实施例进行变化、修改、替换和变型。Although the embodiments of the present invention have been shown and described above, it is to be understood that the above embodiments are exemplary and are not to be construed as limitations of the present invention. A person skilled in the art may change, modify, replace and vary the above embodiments within the scope of the present invention.
Claims (6)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202410784873.XA CN118746360A (en) | 2024-06-18 | 2024-06-18 | Energy dispersive X-ray fluorescence spectrometer and calibration method thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202410784873.XA CN118746360A (en) | 2024-06-18 | 2024-06-18 | Energy dispersive X-ray fluorescence spectrometer and calibration method thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN118746360A true CN118746360A (en) | 2024-10-08 |
Family
ID=92922609
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202410784873.XA Pending CN118746360A (en) | 2024-06-18 | 2024-06-18 | Energy dispersive X-ray fluorescence spectrometer and calibration method thereof |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN118746360A (en) |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20110312734A1 (en) * | 2010-06-17 | 2011-12-22 | Geneasys Pty Ltd | Test module with suspended electrochemiluminescent probes |
| CN116929549A (en) * | 2023-07-03 | 2023-10-24 | 重庆川仪自动化股份有限公司 | Spectrometer control system, method, electronic device and storage medium |
| CN117213631A (en) * | 2023-09-26 | 2023-12-12 | 无锡创想分析仪器有限公司 | Spectrometer operation monitoring method and system |
-
2024
- 2024-06-18 CN CN202410784873.XA patent/CN118746360A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20110312734A1 (en) * | 2010-06-17 | 2011-12-22 | Geneasys Pty Ltd | Test module with suspended electrochemiluminescent probes |
| CN116929549A (en) * | 2023-07-03 | 2023-10-24 | 重庆川仪自动化股份有限公司 | Spectrometer control system, method, electronic device and storage medium |
| CN117213631A (en) * | 2023-09-26 | 2023-12-12 | 无锡创想分析仪器有限公司 | Spectrometer operation monitoring method and system |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US7215801B2 (en) | Method, system and apparatus for processing radiographic images of scanned objects | |
| US6275559B1 (en) | Method and system for diagnosing faults in imaging scanners | |
| JP5194131B2 (en) | Component inspection method and apparatus using omnidirectional eddy current probe | |
| US20040252874A1 (en) | Radiation imaging method, radiation imaging apparatus, computer program and computer-readable recording medium | |
| US8705837B2 (en) | Method for inspection and detection of defects on surfaces of disc-shaped objects and computer system with a software product for carrying out the method | |
| US12399137B2 (en) | Computer-implemented method for monitoring the status of a device for investigating objects | |
| KR102755276B1 (en) | Self-referencing health monitoring system for multi-beam SEM tools | |
| US20240186106A1 (en) | On system self-diagnosis and self-calibration technique for charged particle beam systems | |
| JP5268253B2 (en) | Interactive threshold adjustment | |
| JP4874697B2 (en) | Electron probe X-ray analyzer and operation method thereof | |
| TW201909011A (en) | Regional analysis for formulation optimization and measurement | |
| WO2025255897A1 (en) | Coptis chinensis moisture content analysis method based on heterogeneous sensor data fusion | |
| CN118746360A (en) | Energy dispersive X-ray fluorescence spectrometer and calibration method thereof | |
| CN109541100B (en) | Multichannel wavelength signal drift processing method and device and multichannel detector | |
| JP7150638B2 (en) | Semiconductor defect inspection device and semiconductor defect inspection method | |
| US7191093B2 (en) | Computer tomography unit with a data recording system | |
| US6681361B1 (en) | Semiconductor device inspection apparatus and semiconductor device inspection method | |
| US20090137068A1 (en) | Method and Computer Program Product for Wafer Manufacturing Process Abnormalities Detection | |
| CN112819751B (en) | Data processing method and device for peptide chip detection results | |
| CN117330882A (en) | An automated testing method and system for filters | |
| CN112834752B (en) | Blood sugar standardized measurement system, method, terminal and medium suitable for large groups of people | |
| TWI433246B (en) | Smart defect review for semiconductor integrated | |
| CN115684129A (en) | Raman spectrum signal noise reduction processing method and device and Raman spectrometer | |
| JPH0545210A (en) | Rotor diagnostic device | |
| US10965385B1 (en) | Method of reducing a noise-induced signal drift and test instrument |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |